CN106199338A - A kind of discrimination method of short trouble type voltage sag source - Google Patents

A kind of discrimination method of short trouble type voltage sag source Download PDF

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CN106199338A
CN106199338A CN201610574711.9A CN201610574711A CN106199338A CN 106199338 A CN106199338 A CN 106199338A CN 201610574711 A CN201610574711 A CN 201610574711A CN 106199338 A CN106199338 A CN 106199338A
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顾伟
邱海峰
王旭冲
储佳伟
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Southeast University
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    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
    • G01R31/086—Locating faults in cables, transmission lines, or networks according to type of conductors in power transmission or distribution networks, i.e. with interconnected conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract

本发明公开了一种短路故障型电压暂降源的辨识方法，包括：步骤10）采集短路故障型电压暂降样本数据，对所述样本数据进行数据预处理后，形成匹配库数据；步骤20）获取实测的短路故障型电压暂降波形数据，经过标准化处理后，作为待匹配数据；步骤30）计算动态时间弯曲距离：对匹配库数据和待匹配数据进行归一化，计算归一化后的待匹配数据与匹配库数据的动态时间弯曲距离；步骤40）识别短路故障类型：依据动态时间弯曲距离大小，判定实测的电压暂降的短路类型及短路相别，实现电压暂降源的辨识。该方法能够对短路故障引起的电压暂降进行准确辨识，适用于工程实际。

The invention discloses a method for identifying a short-circuit fault-type voltage sag source, comprising: step 10) collecting sample data of a short-circuit fault-type voltage sag, and performing data preprocessing on the sample data to form matching database data; step 20 ) Obtain the measured short-circuit fault-type voltage sag waveform data, after standardized processing, as the data to be matched; Step 30) Calculate the dynamic time bending distance: normalize the matching database data and the data to be matched, and calculate the normalized The dynamic time warping distance between the data to be matched and the matching database data; Step 40) Identify the short-circuit fault type: determine the short-circuit type and short-circuit phase of the measured voltage sag according to the size of the dynamic time warping distance, and realize the identification of the source of the voltage sag . This method can accurately identify the voltage sag caused by the short-circuit fault, and is suitable for engineering practice.

Description

一种短路故障型电压暂降源的辨识方法An identification method of short circuit fault type voltage sag source

技术领域technical field

本发明属于电能质量监控与分析技术领域，具体来说，涉及一种短路故障型电压暂降源的辨识方法。The invention belongs to the technical field of power quality monitoring and analysis, and specifically relates to a method for identifying a short-circuit fault-type voltage sag source.

背景技术Background technique

随着电网的不断建设和发展，各类工业电力用户接入电网。这些用户采用了先进的自动化、智能化、数字化的电压暂降敏感设备，如PLC、变频器、总线、接触器、继电器、控制器等，对供电电压质量提出了非常高的要求。一旦这些设备因电压暂降停止工作，整套设备或流水线都会受到影响，给企业带来了巨大的损失。生产企业普遍认为电压暂降已经上升为最重要的电能质量问题，是现代工业用电负荷正常安全工作的主要干扰，各方面均已予以重点关注。With the continuous construction and development of the power grid, various industrial power users are connected to the power grid. These users have adopted advanced automated, intelligent, and digital voltage sag-sensitive equipment, such as PLCs, frequency converters, buses, contactors, relays, controllers, etc., which put forward very high requirements for the quality of power supply voltage. Once these devices stop working due to voltage sag, the entire set of equipment or assembly line will be affected, causing huge losses to the enterprise. Manufacturers generally believe that voltage sag has become the most important power quality problem, and it is the main interference to the normal and safe operation of modern industrial power loads, and all aspects have paid special attention to it.

电压暂降已经成为亟需解决的电能质量问题。目前电压暂降治理措施主要包括提高设备的耐受能力、减少电压暂降源的产生、抑制扰动源的传播和配置电压暂降补偿装置。而准确辨识电压暂降源是治理电压暂降的前提。电压暂降源的识别有助于选择合理的治理措施，同时可为电力供应部门和用户之间的协调纠纷提供依据。Voltage sag has become a power quality problem that needs to be solved urgently. The current voltage sag control measures mainly include improving the tolerance of equipment, reducing the generation of voltage sag sources, suppressing the propagation of disturbance sources, and configuring voltage sag compensation devices. Accurately identifying the source of voltage sags is a prerequisite for controlling voltage sags. The identification of voltage sag source is helpful to choose reasonable control measures, and can also provide a basis for coordination disputes between power supply departments and users.

电压暂降源的辨识是指根据检测到的电压暂降数据特征识别其产生原因。国内外已经对电压暂降源的辨识方法开展了大量研究，并获得众多成果，主要有小波变换、S变换、向量机等方法。电力系统中的大部分的电压暂降由短路故障所引起，电压暂降经过不同类型变压器传播后暂降类型也可能发生改变。上述辨识方法只能够有效区分感应电动机启动、变压器空载激磁和短路故障这三种原因引起的电压暂降，但对短路故障引起的电压暂降无法进一步辨识出系统中具体的短路故障类型及短路相，这大大限制了方法在实际工程中的应用。The identification of the voltage sag source refers to identifying the cause of the voltage sag according to the characteristics of the detected voltage sag data. A lot of research has been carried out on the identification method of voltage sag source at home and abroad, and many achievements have been obtained, mainly including wavelet transform, S transform, vector machine and other methods. Most of the voltage sags in the power system are caused by short-circuit faults, and the sag type may also change after the voltage sag propagates through different types of transformers. The above identification method can only effectively distinguish the voltage sag caused by the three causes of induction motor start-up, transformer no-load excitation and short-circuit fault, but the specific short-circuit fault type and short-circuit fault in the system cannot be further identified for the voltage sag caused by the short-circuit fault. However, this greatly limits the application of the method in practical engineering.

发明内容Contents of the invention

技术问题：本发明所要解决的技术问题是：提供一种短路故障型电压暂降源的辨识方法，该方法能够对短路故障引起的电压暂降进行准确辨识，适用于工程实际，为工程人员定位电压暂降源、分析电压暂降传播机理和选择电压暂降治理措施提供有效帮助。Technical problem: The technical problem to be solved by the present invention is to provide a method for identifying the source of voltage sags caused by short-circuit faults. Provide effective help for the source of voltage sag, analyze the propagation mechanism of voltage sag, and select the control measures of voltage sag.

技术方案：为解决上述技术问题，本发明实施例采用一种短路故障型电压暂降源辨识方法，该方法包括以下步骤：Technical solution: In order to solve the above technical problems, the embodiment of the present invention adopts a short-circuit fault-type voltage sag source identification method, which includes the following steps:

步骤10)采集短路故障型电压暂降样本数据，对所述样本数据进行数据预处理后，形成匹配库数据；Step 10) collecting short-circuit fault-type voltage sag sample data, and performing data preprocessing on the sample data to form matching database data;

步骤20)获取实测的短路故障型电压暂降波形数据，经过标准化处理后，作为待匹配数据；Step 20) Obtain the measured short-circuit fault-type voltage sag waveform data, and use it as data to be matched after standardized processing;

步骤30)计算动态时间弯曲距离：对匹配库数据和待匹配数据进行归一化，计算归一化后的待匹配数据与匹配库数据的动态时间弯曲距离；Step 30) Calculate the dynamic time warping distance: normalize the matching database data and the data to be matched, and calculate the dynamic time warping distance between the normalized data to be matched and the matching database data;

步骤40)识别短路故障类型：依据动态时间弯曲距离大小，判定实测的电压暂降的短路类型及短路相别，实现电压暂降源的辨识。Step 40) Identifying the short-circuit fault type: According to the size of the dynamic time bending distance, determine the short-circuit type and short-circuit phase of the measured voltage sag, and realize the identification of the source of the voltage sag.

作为优选例，所述的步骤10)具体包括：As a preferred example, described step 10) specifically includes:

步骤101)采集历史数据中短路故障型电压暂降样本数据，所述样本数据包括abc相接地短路、ab相接地短路和a相接地短路三种短路故障引起的电压暂降ABC相数据，每组样本数据按下式排列成数据序列：Step 101) collecting sample data of short-circuit fault type voltage sag in the historical data, the sample data includes ABC phase data of voltage sag caused by three short-circuit faults of abc phase-to-ground short-circuit, ab-phase-to-ground short-circuit and a-phase-to-ground short-circuit fault , each set of sample data is arranged into a data sequence according to the following formula:

UA(1),UB(1),UC(1)U A (1), U B (1), U C (1)

UA(2),UB(2),UC(2)U A (2), U B (2), U C (2)

UA(M),UB(M),UC(M)U A (M), U B (M), U C (M)

式中，UA(1)表示第1组样本数据中的A相电压，UB(1)表示第1组样本数据中的B相电压,UC(1)表示第1组样本数据中的C相电压，UA(2)表示第2组样本数据中的A相电压，UB(2)表示第2组样本数据中的B相电压,UC(2)表示第2组样本数据中的C相电压，UA(M)表示第M组样本数据中的A相电压，UB(M)表示第M组样本数据中的B相电压,UC(M)表示第M组样本数据中的C相电压，M表示样本的数量；In the formula, U A (1) represents the voltage of phase A in the first group of sample data, U B (1) represents the voltage of phase B in the first group of sample data, and U C (1) represents the voltage of phase B in the first group of sample data. Phase C voltage, U A (2) represents the voltage of phase A in the second group of sample data, U B (2) represents the voltage of phase B in the second group of sample data, and U C (2) represents the voltage of phase B in the second group of sample data U A (M) represents the phase A voltage in the M-th group of sample data, U B (M) represents the B-phase voltage in the M-th group of sample data, U C (M) represents the M-th group of sample data The phase C voltage in , M represents the number of samples;

步骤102)对步骤101)采集的数据序列进行数据预处理，每组数据序列排列成1行，对于ab相接地短路调整数据相序作为bc、ca相接地短路的样本数据，对于a相接地短路，调整数据相序作为b、c相接地短路的样本数据，形成7行3M列的匹配库数据，匹配库数据形式如下：Step 102) Perform data preprocessing on the data sequence collected in step 101), arrange each group of data sequences into one row, adjust the data phase sequence for phase ab to ground short circuit as the sample data of phase bc and ca to ground short circuit, for phase a Ground short circuit, adjust the data phase sequence as the sample data of phase b and c ground short circuit, and form matching database data with 7 rows and 3M columns. The matching database data format is as follows:

UA(1),UA(2)…UA(M),UB(1),UB(2)…UB(M),UC(1),UC(2)…UC(M)}①U A (1), U A (2)… U A (M), U B (1), U B (2)… U B (M), U C (1), U C (2)… U C (M)}①

式中，①为abc相接地短路的匹配库数据；②为ab相接地短路的匹配库数据；③为a相接地短路的匹配库数据；第一行为abc相接地短路，第二行为ab相接地短路，第三行为bc相接地短路，第四行为ca相接地短路，第五行为a相接地短路，第六行为b相接地短路，第七行为c相接地短路。In the formula, ① is the matching database data of abc phase-ground short circuit; ② is the matching database data of ab phase ground short circuit; ③ is the matching database data of a phase ground short circuit; Behavior ab phase ground short circuit, third line bc phase ground short circuit, fourth line ca phase ground short circuit, fifth line a phase ground short circuit, sixth line b phase ground short circuit, seventh line c phase ground short circuit short circuit.

作为优选例，所述的步骤20)包括：获取公共连接点处实测的电压暂降波形数据，形式如下：As a preferred example, the step 20) includes: obtaining the measured voltage sag waveform data at the common connection point, in the following form:

Uu ‾‾ AA (( 11 )) ,, Uu ‾‾ BB (( 11 )) ,, Uu ‾‾ CC (( 11 )) Uu ‾‾ AA (( 22 )) ,, Uu ‾‾ BB (( 22 )) ,, Uu ‾‾ CC (( 22 )) .. .. .. Uu ‾‾ AA (( NN )) ,, Uu ‾‾ BB (( NN )) ,, Uu ‾‾ CC (( NN ))

式中，表示实测数据中第1组数据的A相电压，表示实测数据中第1组数据的B相电压，表示实测数据中第1组数据的C相电压，表示实测数据中第2组数据的A相电压，表示实测数据中第2组数据的B相电压，表示实测数据中第2组数据的C相电压，表示实测数据中第N组数据的A相电压，表示实测数据中第N组数据的B相电压，表示实测数据中第N组数据的C相电压；In the formula, Indicates the phase A voltage of the first group of data in the measured data, Indicates the B-phase voltage of the first group of data in the measured data, Indicates the C-phase voltage of the first group of data in the measured data, Indicates the phase A voltage of the second group of data in the measured data, Indicates the B-phase voltage of the second group of data in the measured data, Indicates the C-phase voltage of the second group of data in the measured data, Indicates the phase A voltage of the Nth group of data in the measured data, Indicates the B-phase voltage of the Nth group of data in the measured data, Indicates the C-phase voltage of the Nth group of data in the measured data;

对获取的实测电压暂降波形数据进行标准化处理，将数据排成1行3N列的待匹配数据，形式如下：Standardize the obtained measured voltage sag waveform data, and arrange the data into 1 row and 3N columns of data to be matched, in the form as follows:

Uu ‾‾ AA (( 11 )) ,, Uu ‾‾ AA (( 22 )) ...... Uu ‾‾ AA (( NN )) ,, Uu ‾‾ BB (( 11 )) ,, Uu ‾‾ BB (( 22 )) ...... Uu ‾‾ BB (( NN )) ,, Uu ‾‾ CC (( 11 )) ,, Uu ‾‾ CC (( 22 )) ...... Uu ‾‾ CC (( NN )) ..

作为优选例，所述的步骤30)包括：As a preferred example, the step 30) includes:

步骤301)对每行匹配库数据和待匹配数据进行归一化处理，分别归算到区间[-1，1]内，归一化函数为：Step 301) Perform normalization processing on each row of matching database data and data to be matched, and respectively reduce them to the interval [-1, 1]. The normalization function is:

Uu ′′ (( pp )) == 22 Uu (( pp )) -- Uu mm ii nno -- Uu mm aa xx Uu mm aa xx -- Uu mm ii nno ,, (( pp == 11 ,, 22 ,, 33 ...... ,, 33 Mm ))

Uu ‾‾ ′′ (( qq )) == 22 Uu ‾‾ (( qq )) -- Uu ‾‾ mm ii nno -- Uu ‾‾ mm aa xx Uu ‾‾ maxmax -- Uu ‾‾ minmin ,, (( qq == 11 ,, 22 ,, 33 ...... ,, 33 NN ))

式中，U表示归一化之前的匹配库数据一行序列，表示归一化之前的待匹配数据的一行序列；Umax表示U的最大值，表示的最大值；Umin表示U的最小值，表示的最小值；U'表示归一化后匹配库数据一行序列，表示归一化后的待匹配数据的一行序列；In the formula, U represents a row sequence of matching library data before normalization, Represents a row sequence of data to be matched before normalization; U max represents the maximum value of U, express The maximum value; U min represents the minimum value of U, express The minimum value of ; U' represents a sequence of matching library data after normalization, A row sequence representing the normalized data to be matched;

步骤302)计算归一化后的待匹配数据与归一化后的匹配库数据之间的动态时间弯曲距离：Step 302) Calculating the dynamic time warping distance between the normalized data to be matched and the normalized matching library data:

首先，利用U'和构造一个3M行3N列的距离矩阵A，即为：First, using U' and Construct a distance matrix A with 3M rows and 3N columns, which is:

式中，A中元素表示归一化后的待匹配数据与匹配库数据U′的对齐距离；In the formula, the elements in A Indicates the normalized data to be matched Alignment distance with matching library data U′;

U'和的动态时间弯曲距离为：U' and The dynamic time warping distance of for:

DD. TT WW (( Uu ′′ ,, Uu ‾‾ ′′ )) == DD. (( 33 Mm ,, 33 NN )) DD. (( 00 ,, 00 )) == 00 DD. (( 00 ,, ∞∞ )) == 00 DD. (( ∞∞ ,, 00 )) == 00 DD. (( ii ,, jj )) == aa ii jj ++ mm ii nno {{ DD. (( ii -- 11 ,, jj -- 11 )) ,, DD. (( ii -- 11 ,, jj )) ,, DD. (( ii ,, jj -- 11 )) }} 11 ≤≤ ii ≤≤ 33 Mm ,, 11 ≤≤ jj ≤≤ 33 NN

式中，D(i,j)表示aij与其前段的最小动态时间弯曲距离之和；aij表示A中元素d(xi,xj)；∞表示标号为1到3M或1到3N的任意数值；In the formula, D(i,j) represents the sum of the minimum dynamic time warping distance of a ij and its predecessor; a ij represents the element d( xi ,x j ) in A; any value;

步骤303)匹配库数据下移一行，重复步骤302)，直至计算完待匹配数据与所有行匹配库数据的动态时间弯曲距离，得到7个动态时间弯曲距离。Step 303) The matching database data is moved down one row, and step 302) is repeated until the dynamic time warping distances between the data to be matched and all rows of matching database data are calculated, and 7 dynamic time warping distances are obtained.

作为优选例，所述的步骤40)包括：将7个动态时间弯曲距离最小的一行匹配库数据作为与待匹配数据匹配度最高的数据，待匹配数据与匹配库数据中该行数据属于同一类型电压暂降。As a preferred example, the step 40) includes: taking the seven rows of matching library data with the smallest dynamic time warping distance as the data with the highest matching degree with the data to be matched, and the data to be matched and the row of data in the matching library data belong to the same type Voltage sag.

有益效果：与现有技术相比，本发明实施例具有以下有益效果：该方法能够准确辨识出短路故障型电压暂降源的类型及短路相别。传统的辨识方法只能够有效区分感应电动机启动、变压器空载激磁和短路故障这三种原因引起的电压暂降，但对短路故障引起的电压暂降无法进一步辨识出系统中具体的短路故障类型及短路相别。本实施例的方法能够利用工程中实测的电压暂降数据进行分析辨识，方法简单有效，易于工程应用。Beneficial effects: Compared with the prior art, the embodiments of the present invention have the following beneficial effects: the method can accurately identify the type of short-circuit fault-type voltage sag source and the short-circuit phase. The traditional identification method can only effectively distinguish the voltage sag caused by the three causes of induction motor start-up, transformer no-load excitation and short-circuit fault, but the voltage sag caused by short-circuit fault cannot further identify the specific short-circuit fault type and Short circuit. The method of this embodiment can use the voltage sag data actually measured in the project for analysis and identification, the method is simple and effective, and easy for engineering application.

附图说明Description of drawings

图1为本发明实施例的流程图。Fig. 1 is a flowchart of an embodiment of the present invention.

图2(a)为本发明实施例中abc相接地短路时采集的电压暂降样本数据波形图。Fig. 2(a) is a waveform diagram of sample data of voltage sag collected when phase abc is short-circuited to ground in the embodiment of the present invention.

图2(b)为本发明实施例中ab相接地短路时采集的电压暂降样本数据波形图。Fig. 2(b) is a waveform diagram of sample data of voltage sag collected when phase ab is short-circuited to ground in the embodiment of the present invention.

图2(c)为本发明实施例中a相接地短路时采集的电压暂降样本数据波形图。Fig. 2(c) is a waveform diagram of sample data of voltage sag collected when phase a is short-circuited to ground in the embodiment of the present invention.

图3为本发明实施例中电压暂降实测数据波形图。FIG. 3 is a waveform diagram of measured data of a voltage sag in an embodiment of the present invention.

具体实施方式detailed description

下面结合实例和附图，对本发明实施例的技术方案做进一步的说明。The technical solutions of the embodiments of the present invention will be further described below in combination with examples and accompanying drawings.

如图1所示，本发明实施例提供一种短路故障型电压暂降源的辨识方法，包括以下步骤：As shown in Figure 1, an embodiment of the present invention provides a method for identifying a short-circuit fault-type voltage sag source, including the following steps:

步骤10)采集短路故障型电压暂降样本数据，对所述样本数据进行数据预处理后，形成匹配库数据；Step 10) collecting short-circuit fault-type voltage sag sample data, and performing data preprocessing on the sample data to form matching database data;

步骤20)获取实测的短路故障型电压暂降波形数据，经过标准化处理后，Step 20) Obtain the measured short-circuit fault type voltage sag waveform data, after standardized processing,

作为待匹配数据；as the data to be matched;

步骤30)计算动态时间弯曲距离：对匹配库数据和待匹配数据进行归一化，计算归一化后的待匹配数据与匹配库数据的动态时间弯曲距离；Step 30) Calculate the dynamic time warping distance: normalize the matching database data and the data to be matched, and calculate the dynamic time warping distance between the normalized data to be matched and the matching database data;

步骤40)识别短路故障类型：依据动态时间弯曲距离大小，判定实测的电压暂降的短路类型及短路相别，实现电压暂降源的辨识。Step 40) Identifying the short-circuit fault type: According to the size of the dynamic time bending distance, determine the short-circuit type and short-circuit phase of the measured voltage sag, and realize the identification of the source of the voltage sag.

在上述实施例中，所述的步骤10)具体包括：In the above embodiment, the step 10) specifically includes:

步骤101)采集历史数据中短路故障型电压暂降样本数据，所述样本数据包括abc相接地短路、ab相接地短路和a相接地短路三种短路故障引起的电压暂降ABC相数据，每组样本数据按下式排列成数据序列：Step 101) collecting sample data of short-circuit fault type voltage sag in the historical data, the sample data includes ABC phase data of voltage sag caused by three short-circuit faults of abc phase-to-ground short-circuit, ab-phase-to-ground short-circuit and a-phase-to-ground short-circuit fault , each set of sample data is arranged into a data sequence according to the following formula:

UA(1),UB(1),UC(1)U A (1), U B (1), U C (1)

UA(2),UB(2),UC(2)U A (2), U B (2), U C (2)

UA(M),UB(M),UC(M)U A (M), U B (M), U C (M)

式中，UA(1)表示第1组样本数据中的A相电压，UB(1)表示第1组样本数据中的B相电压,UC(1)表示第1组样本数据中的C相电压，UA(2)表示第2组样本数据中的A相电压，UB(2)表示第2组样本数据中的B相电压,UC(2)表示第2组样本数据中的C相电压，UA(M)表示第M组样本数据中的A相电压，UB(M)表示第M组样本数据中的B相电压,UC(M)表示第M组样本数据中的C相电压，M表示样本的数量；In the formula, U A (1) represents the voltage of phase A in the first group of sample data, U B (1) represents the voltage of phase B in the first group of sample data, and U C (1) represents the voltage of phase B in the first group of sample data. Phase C voltage, U A (2) represents the voltage of phase A in the second group of sample data, U B (2) represents the voltage of phase B in the second group of sample data, and U C (2) represents the voltage of phase B in the second group of sample data U A (M) represents the phase A voltage in the M-th group of sample data, U B (M) represents the B-phase voltage in the M-th group of sample data, U C (M) represents the M-th group of sample data The phase C voltage in , M represents the number of samples;

步骤102)对步骤101)采集的数据序列进行数据预处理，每组数据序列排列成1行，对于ab相接地短路调整数据相序作为bc、ca相接地短路的样本数据，对于a相接地短路，调整数据相序作为b、c相接地短路的样本数据，形成7行3M列的匹配库数据，匹配库数据形式如下：Step 102) Perform data preprocessing on the data sequence collected in step 101), arrange each group of data sequences into one row, adjust the data phase sequence for phase ab to ground short circuit as the sample data of phase bc and ca to ground short circuit, for phase a Ground short circuit, adjust the data phase sequence as the sample data of phase b and c ground short circuit, and form matching database data with 7 rows and 3M columns. The matching database data format is as follows:

UA(1),UA(2)…UA(M),UB(1),UB(2)…UB(M),UC(1),UC(2)…UC(M)}①U A (1), U A (2)… U A (M), U B (1), U B (2)… U B (M), U C (1), U C (2)… U C (M)}①

式中，①为abc相接地短路的匹配库数据；②为ab相接地短路的匹配库数据；③为a相接地短路的匹配库数据；第一行为abc相接地短路，第二行为ab相接地短路，第三行为bc相接地短路，第四行为ca相接地短路，第五行为a相接地短路，第六行为b相接地短路，第七行为c相接地短路。In the formula, ① is the matching database data of abc phase-ground short circuit; ② is the matching database data of ab phase ground short circuit; ③ is the matching database data of a phase ground short circuit; Behavior ab phase ground short circuit, third line bc phase ground short circuit, fourth line ca phase ground short circuit, fifth line a phase ground short circuit, sixth line b phase ground short circuit, seventh line c phase ground short circuit short circuit.

在上述实施例中，所述的步骤20)具体包括：获取公共连接点(对应英文全称Pointof Common Coupling；文中简称为PCC点)处实测的电压暂降波形数据，形式如下：In the above embodiment, the step 20) specifically includes: obtaining the measured voltage sag waveform data at the common connection point (corresponding to the English full name Pointof Common Coupling; abbreviated as PCC point in the text), in the following form:

Uu ‾‾ AA (( 11 )) ,, Uu ‾‾ BB (( 11 )) ,, Uu ‾‾ CC (( 11 )) Uu ‾‾ AA (( 22 )) ,, Uu ‾‾ BB (( 22 )) ,, Uu ‾‾ CC (( 22 )) .. .. .. Uu ‾‾ AA (( NN )) ,, Uu ‾‾ BB (( NN )) ,, Uu ‾‾ CC (( NN ))

式中，表示实测数据中第1组数据的A相电压，表示实测数据中第1组数据的B相电压，表示实测数据中第1组数据的C相电压，表示实测数据中第2组数据的A相电压，表示实测数据中第2组数据的B相电压，表示实测数据中第2组数据的C相电压，表示实测数据中第N组数据的A相电压，表示实测数据中第N组数据的B相电压，表示实测数据中第N组数据的C相电压；In the formula, Indicates the phase A voltage of the first group of data in the measured data, Indicates the B-phase voltage of the first group of data in the measured data, Indicates the C-phase voltage of the first group of data in the measured data, Indicates the phase A voltage of the second group of data in the measured data, Indicates the B-phase voltage of the second group of data in the measured data, Indicates the C-phase voltage of the second group of data in the measured data, Indicates the phase A voltage of the Nth group of data in the measured data, Indicates the B-phase voltage of the Nth group of data in the measured data, Indicates the C-phase voltage of the Nth group of data in the measured data;

对获取的实测电压暂降波形数据进行标准化处理，将数据排成1行3N列的待匹配数据，形式如下：Standardize the obtained measured voltage sag waveform data, and arrange the data into 1 row and 3N columns of data to be matched, in the form as follows:

Uu ‾‾ AA (( 11 )) ,, Uu ‾‾ AA (( 22 )) ...... Uu ‾‾ AA (( NN )) ,, Uu ‾‾ BB (( 11 )) ,, Uu ‾‾ BB (( 22 )) ...... Uu ‾‾ BB (( NN )) ,, Uu ‾‾ CC (( 11 )) ,, Uu ‾‾ CC (( 22 )) ...... Uu ‾‾ CC (( NN )) ..

在上述实施例中，所述的步骤30)具体包括：In the above embodiment, the step 30) specifically includes:

步骤301)对每行匹配库数据和待匹配数据进行归一化处理，分别归算到区间[-1，1]内，归一化函数为：Step 301) Perform normalization processing on each row of matching database data and data to be matched, and respectively reduce them to the interval [-1, 1]. The normalization function is:

Uu ′′ (( pp )) == 22 Uu (( pp )) -- Uu mm ii nno -- Uu mm aa xx Uu mm aa xx -- Uu mm ii nno ,, (( pp == 11 ,, 22 ,, 33 ...... ,, 33 Mm ))

Uu ‾‾ ′′ (( qq )) == 22 Uu ‾‾ (( qq )) -- Uu ‾‾ mm ii nno -- Uu ‾‾ mm aa xx Uu ‾‾ maxmax -- Uu ‾‾ minmin ,, (( qq == 11 ,, 22 ,, 33 ...... ,, 33 NN ))

式中，U表示归一化之前的匹配库数据一行序列，表示归一化之前的待匹配数据的一行序列；Umax表示U的最大值，表示的最大值；Umin表示U的最小值，表示的最小值；U'表示归一化后匹配库数据一行序列，表示归一化后的待匹配数据的一行序列；In the formula, U represents a row sequence of matching library data before normalization, Represents a row sequence of data to be matched before normalization; U max represents the maximum value of U, express The maximum value; U min represents the minimum value of U, express The minimum value of ; U' represents a sequence of matching library data after normalization, A row sequence representing the normalized data to be matched;

步骤302)计算归一化后的待匹配数据与归一化后的匹配库数据之间的动态时间弯曲距离：Step 302) Calculate the dynamic time warping distance between the normalized data to be matched and the normalized matching library data:

首先，利用U'和构造一个3M行3N列的距离矩阵A，即为：First, using U' and Construct a distance matrix A with 3M rows and 3N columns, which is:

式中，A中元素表示归一化后的待匹配数据与匹配库数据U′的对齐距离；In the formula, the elements in A Indicates the normalized data to be matched Alignment distance with matching library data U′;

U'和的动态时间弯曲距离为：U' and The dynamic time warping distance of for:

DD. TT WW (( Uu ′′ ,, Uu ‾‾ ′′ )) == DD. (( 33 Mm ,, 33 NN )) DD. (( 00 ,, 00 )) == 00 DD. (( 00 ,, ∞∞ )) == 00 DD. (( ∞∞ ,, 00 )) == 00 DD. (( ii ,, jj )) == aa ii jj ++ mm ii nno {{ DD. (( ii -- 11 ,, jj -- 11 )) ,, DD. (( ii -- 11 ,, jj )) ,, DD. (( ii ,, jj -- 11 )) }} 11 ≤≤ ii ≤≤ 33 Mm ,, 11 ≤≤ jj ≤≤ 33 NN

式中，D(i,j)表示aij与其前段的最小动态时间弯曲距离之和；aij表示A中元素d(xi,xj)；∞表示标号为1到3M或1到3N的任意数值；In the formula, D(i,j) represents the sum of the minimum dynamic time warping distance of a ij and its predecessor; a ij represents the element d( xi ,x j ) in A; any value;

步骤303)匹配库数据下移一行，重复步骤302)，直至计算完待匹配数据与所有行匹配库数据的动态时间弯曲距离，得到7个动态时间弯曲距离。Step 303) The matching database data is moved down one row, and step 302) is repeated until the dynamic time warping distances between the data to be matched and all rows of matching database data are calculated, and 7 dynamic time warping distances are obtained.

在上述实施例中，所述的步骤40)具体包括：将7个动态时间弯曲距离最小的一行匹配库数据作为与待匹配数据匹配度最高的数据，待匹配数据与匹配库数据中该行数据属于同一类型电压暂降。辨识结果如下：In the above-mentioned embodiment, the step 40) specifically includes: taking a line of matching library data with the smallest dynamic time warping distance as the data with the highest matching degree with the data to be matched, and the data to be matched and the line of data in the matching library data Belong to the same type of voltage sag. The identification results are as follows:

本发明实施例的辨识方法，利用动态时间弯曲距离衡量实测的电压暂降数据与匹配库数据的相似度，寻找出匹配库中与待匹配数据最相似的波形数据，进而判定实测的电压暂降的类型及短路相别。现有技术中，电压暂降源的辨识主要集中在区分感应电动机启动、变压器空载激磁和短路故障这三种原因引起的电压暂降，而电力系统中短路故障是电压暂降的主要原因，因此需要进一步辨识出系统中具体的短路故障类型及短路相别。本实施例方法能够对短路故障引起的电压暂降进行准确辨识，适用于工程实际，为工程人员定位电压暂降源、分析电压暂降传播机理和选择电压暂降治理措施提供有效帮助。The identification method of the embodiment of the present invention uses the dynamic time warping distance to measure the similarity between the measured voltage sag data and the data in the matching database, finds out the waveform data in the matching database that is most similar to the data to be matched, and then determines the measured voltage sag The type and short circuit are different. In the prior art, the identification of the source of the voltage sag mainly focuses on distinguishing the voltage sag caused by three reasons: induction motor start-up, transformer no-load excitation and short-circuit fault, and the short-circuit fault in the power system is the main cause of the voltage sag. Therefore, it is necessary to further identify the specific short-circuit fault type and short-circuit difference in the system. The method in this embodiment can accurately identify voltage sags caused by short-circuit faults, is applicable to engineering practice, and provides effective help for engineering personnel to locate voltage sag sources, analyze voltage sag propagation mechanisms, and select voltage sag control measures.

下面例举一具体实施例。A specific embodiment is given below.

以某个10kV母线为例，在母线下的380V用户侧设置电压测量装置进行电压暂降数据采集。仿真中依次设置abc相接地短路、ab相接地短路和a相接地短路形成电压暂降样本波形，短路时长为100ms；设置bc相接地短路形成电压暂降实测波形，短路时长为50ms；数据采样频率为10kHz。Taking a 10kV busbar as an example, a voltage measuring device is installed on the 380V user side under the busbar to collect voltage sag data. In the simulation, set abc phase to ground short circuit, ab phase to ground short circuit and a phase to ground short circuit in sequence to form a sample waveform of voltage sag, and the short circuit duration is 100ms; set bc phase to ground short circuit to form a voltage sag measured waveform, and the short circuit duration is 50ms ; Data sampling frequency is 10kHz.

执行本发明实施例的辨识方法，包括以下步骤：Executing the identification method of the embodiment of the present invention includes the following steps:

步骤10)采集短路故障型电压暂降样本数据，包括abc相接地短路、ab相接地短路和a相接地短路3种短路故障引起的电压暂降ABC相数据，经过预处理形成7行3000列的匹配库数据。本实例采集的电压暂降样本数据如图2所示，图中横坐标表示采样点数，纵坐标表示电压幅值的标幺值。图2(a)为abc相接地短路时采集的电压暂降样本数据图；图2(b)为ab相接地短路时采集的电压暂降样本数据图；图2(c)为a相接地短路时采集的电压暂降样本数据图。Step 10) Collect short-circuit fault-type voltage sag sample data, including ABC phase data of voltage sag caused by three short-circuit faults of abc phase-to-ground short-circuit, ab-phase-to-ground short-circuit and a-phase-to-ground short-circuit, and form 7 rows after preprocessing 3000 columns of matching database data. The sample data of the voltage sag collected in this example is shown in Figure 2. The abscissa in the figure indicates the number of sampling points, and the ordinate indicates the per-unit value of the voltage amplitude. Figure 2(a) is a sample data diagram of voltage sag collected when phase abc is short-circuited to ground; Figure 2(b) is a sample data diagram of voltage sag collected when phase ab is short-circuited to ground; Figure 2(c) is a sample data diagram of phase a Sample data plot of voltage sag collected during a short circuit to ground.

步骤20)获取PCC点的实测的电压暂降波形数据，标准化后形成1行3000列的待匹配数据。本实例获取的实测电压暂降波形数据如图3所示，图中横坐标表示采样点数，纵坐标表示电压幅值的标幺值。Step 20) Obtain the measured voltage sag waveform data at the PCC point, and form data to be matched with 1 row and 3000 columns after normalization. The measured voltage sag waveform data obtained in this example is shown in Figure 3. The abscissa in the figure indicates the number of sampling points, and the ordinate indicates the per-unit value of the voltage amplitude.

步骤30)计算归一化后待匹配数据与匹配库数据每一行的DTW距离，共计得到7个DTW距离，计算结果如表1所示。Step 30) Calculate the DTW distance between the data to be matched after normalization and each row of the matching database data, and obtain 7 DTW distances in total. The calculation results are shown in Table 1.

表1 DTW距离计算结果Table 1 DTW distance calculation results

编号Numbering 11 22 33 44 55 66 77 DTW距离DTW distance 653.11653.11 1411.701411.70 5.175.17 756.86756.86 1330.301330.30 579.38579.38 167.16167.16

步骤40)待匹配数据与匹配库数据的第3行数据匹配度最高，两者属于同一类型电压暂降，故辨识结果为实测的电压暂降是由bc相接地短路故障引起的。本实施的辨识结果与实际情况一致，辨识结果准确。Step 40) The data to be matched and the data in the third row of the matching database have the highest matching degree, and both belong to the same type of voltage sag, so the identification result shows that the measured voltage sag is caused by the short-circuit fault of phase bc to ground. The identification result of this implementation is consistent with the actual situation, and the identification result is accurate.

以上显示和描述了本发明的基本原理、主要特征和优点。本领域的技术人员应该了解，本发明不受上述具体实施例的限制，上述具体实施例和说明书中的描述只是为了进一步说明本发明的原理，在不脱离本发明精神和范围的前提下，本发明还会有各种变化和改进，这些变化和改进都落入要求保护的本发明范围内。本发明要求保护的范围由权利要求书及其等效物界定。The basic principles, main features and advantages of the present invention have been shown and described above. Those skilled in the art should understand that the present invention is not limited by the above-mentioned specific examples. The descriptions in the above-mentioned specific examples and the description are only to further illustrate the principle of the present invention. Without departing from the spirit and scope of the present invention, the present invention The invention also has various changes and improvements, and these changes and improvements all fall within the scope of the claimed invention. The protection scope of the present invention is defined by the claims and their equivalents.

Claims (5)

1. the discrimination method of a short trouble type voltage sag source, it is characterised in that the method comprises the following steps:
Step 10) gather short trouble type voltage dip sample data, after described sample data is carried out data prediction, formed Coupling database data；
Step 20) obtain the short trouble type voltage dip Wave data surveyed, after standardization, as number to be matched According to；
Step 30) calculate dynamic time warping distance: coupling database data and data to be matched are normalized, calculate normalization After data to be matched and the dynamic time warping distance mating database data；
Step 40) identify short trouble type: according to dynamic time warping distance size, it is determined that the short circuit of the voltage dip of actual measurement Type and short circuit are separate, it is achieved the identification of voltage sag source.
The discrimination method of short trouble type voltage sag source the most according to claim 1, it is characterised in that described step 10) specifically include:
Step 101) gather short circuit failed-type voltage dip sample data in historical data, described sample data includes that abc connects The voltage dip ABC phase data that ground short circuit, ab phase ground short circuit and three kinds of short troubles of a phase ground short circuit cause, often organizes sample Data are arranged in data sequence as the following formula:
U A ( 1 ) , U B ( 1 ) , U C ( 1 ) U A ( 2 ) , U B ( 2 ) , U C ( 2 ) · · · U A ( M ) , U B ( M ) , U C ( M )
In formula, UA(1) the A phase voltage in the 1st group of sample data, U are representedB(1) the B phase voltage in the 1st group of sample data is represented, UC(1) the C phase voltage in the 1st group of sample data, U are representedA(2) the A phase voltage in the 2nd group of sample data, U are representedB(2) represent B phase voltage in 2nd group of sample data, UC(2) the C phase voltage in the 2nd group of sample data, U are representedA(M) M group sample is represented A phase voltage in data, UB(M) the B phase voltage in M group sample data, U are representedC(M) C in M group sample data is represented Phase voltage, M represents the quantity of sample；
Step 102) to step 101) data sequence that gathers carries out data prediction, often group data sequence is arranged in 1 row, for Ab phase ground short circuit adjusts the data phase sequence sample data as bc, ca phase ground short circuit, for a phase ground short circuit, adjusts number According to phase sequence as the sample data of b, c phase ground short circuit, forming the coupling database data of 7 row 3M row, coupling database data form is as follows:
UA(1),UA(2)…UA(M),UB(1),UB(2)…UB(M),UC(1),UC(2)…UC(M)}①
In formula, it 1. it is the coupling database data of abc phase ground short circuit；2. it is the coupling database data of ab phase ground short circuit；3. connect for a The coupling database data of ground short circuit；First behavior abc phase ground short circuit, the second behavior ab phase ground short circuit, the third line is that bc connects Ground short circuit, fourth line is ca phase ground short circuit, and fifth line is a phase ground short circuit, the 6th behavior b phase ground short circuit, the 7th behavior c Phase ground short circuit.
The discrimination method of short trouble type voltage sag source the most according to claim 2, it is characterised in that described step 20) including: obtaining the voltage dip Wave data of actual measurement at points of common connection, form is as follows:
U ‾ A ( 1 ) , U ‾ B ( 1 ) , U ‾ C ( 1 ) U ‾ A ( 2 ) , U ‾ B ( 2 ) , U ‾ C ( 2 ) . . . U ‾ A ( N ) , U ‾ B ( N ) , U ‾ C ( N )
In formula,Represent the A phase voltage of the 1st group of data in measured data,Represent the 1st group of data in measured data B phase voltage,Represent the C phase voltage of the 1st group of data in measured data,Represent the 2nd group of data in measured data A phase voltage,Represent the B phase voltage of the 2nd group of data in measured data,Represent the 2nd group of data in measured data C phase voltage,Represent the A phase voltage of N group data in measured data,Represent N group data in measured data B phase voltage,Represent the C phase voltage of N group data in measured data；
It is standardized processing to the actual measurement voltage dip Wave data obtained, data is lined up the data to be matched of 1 row 3N row, Form is as follows:
U ‾ A ( 1 ) , U ‾ A ( 2 ) ... U ‾ A ( N ) , U ‾ B ( 1 ) , U ‾ B ( 2 ) ... U ‾ B ( N ) , U ‾ C ( 1 ) , U ‾ C ( 2 ) ... U ‾ C ( N ) .
The discrimination method of short trouble type voltage sag source the most according to claim 3, it is characterised in that described step 30) including:
Step 301) often row coupling database data and data to be matched are normalized, reduction is to interval [-1,1] respectively In, normalized function is:
U ′ ( p ) = 2 U ( p ) - U m i n - U m a x U m a x - U m i n , ( p = 1 , 2 , 3 ... , 3 M )
U ‾ ′ ( q ) = 2 U ‾ ( q ) - U ‾ m i n - U ‾ m a x U ‾ max - U ‾ min , ( q = 1 , 2 , 3 ... , 3 N )
In formula, U represents the coupling database data a line sequence before normalization,One of data to be matched before expression normalization Line order arranges；UmaxRepresent the maximum of U,RepresentMaximum；UminRepresent the minima of U,RepresentMinimum Value；U' mates database data a line sequence after representing normalization,Represent a line sequence of the data to be matched after normalization；
Step 302) calculate the data to be matched after normalization and the dynamic time warping mated between database data after normalization Distance:
First, utilize U' andConstruct the distance matrix A of 3M row 3N row, be:
In formula, element in ARepresent the data to be matched after normalizationWith mate database data The alignment distance of U '；
U' andDynamic time warping distanceFor:
D T W ( U ′ , U ‾ ′ ) = D ( 3 M , 3 N ) D ( 0 , 0 ) = 0 D ( 0 , ∞ ) = 0 D ( ∞ , 0 ) = 0 D ( i , j ) = a i j + m i n { D ( i - 1 , j - 1 ) , D ( i - 1 , j ) , D ( i , j - 1 ) } 1 ≤ i ≤ 3 M , 1 ≤ j ≤ 3 N
In formula, (i j) represents a to DijMinimum dynamic time warping distance sum with its leading portion；aijRepresent element d (x in Ai, xj)；∞ represents any number being numbered 1 to 3M or 1 to 3N；
Step 303) coupling database data line down, repeat step 302), mate until having calculated data to be matched with all row The dynamic time warping distance of database data, obtains 7 dynamic time warping distances.
The discrimination method of short trouble type voltage sag source the most according to claim 4, it is characterised in that described step 40) including: using a line coupling database data minimum for 7 dynamic time warping distances as the highest with Data Matching degree to be matched Data, data to be matched belong to same type voltage dip with mating the row data in database data.
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CN107436396A (en) * 2017-09-05 2017-12-05 南方电网科学研究院有限责任公司 Power grid weak link identification method considering voltage sag
CN107436396B (en) * 2017-09-05 2019-08-02 南方电网科学研究院有限责任公司 Power grid weak link identification method considering voltage sag
CN108181547A (en) * 2017-12-20 2018-06-19 珠海许继电气有限公司 A kind of dynamic time warping distance fault section location method based on Time Series Compression
CN108181547B (en) * 2017-12-20 2020-05-12 珠海许继电气有限公司 Dynamic Time Warped Distance Fault Location Method Based on Time Series Compression
CN108614188A (en) * 2018-04-25 2018-10-02 广州供电局有限公司 Voltage dip kind identification method and device
CN108562820A (en) * 2018-05-04 2018-09-21 国网甘肃省电力公司电力科学研究院 Single-phase ground fault line selecting method of small-electric current grounding system and device
CN108414896A (en) * 2018-06-04 2018-08-17 西南交通大学 A kind of electric network failure diagnosis method
CN108414896B (en) * 2018-06-04 2020-06-12 西南交通大学 Power grid fault diagnosis method
CN108896875A (en) * 2018-07-16 2018-11-27 国网福建晋江市供电有限公司 A kind of fault line selection method for single-phase-to-ground fault and device
CN108896875B (en) * 2018-07-16 2020-06-16 国网福建晋江市供电有限公司 A single-phase ground fault line selection method and device
CN110363130A (en) * 2019-07-08 2019-10-22 国网四川省电力公司电力科学研究院 Voltage sag source identification method and identification device based on variational mode decomposition
CN110363130B (en) * 2019-07-08 2023-01-13 国网四川省电力公司电力科学研究院 Voltage sag source identification method and identification device based on variational modal decomposition

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