CN106199338B - A kind of discrimination method of short trouble type voltage sag source - Google Patents
A kind of discrimination method of short trouble type voltage sag source Download PDFInfo
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R31/08—Locating faults in cables, transmission lines, or networks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Abstract
The invention discloses a kind of discrimination methods of short trouble type voltage sag source, including：Step 10）Short trouble type voltage dip sample data is acquired, after carrying out data prediction to the sample data, forms matching library data；Step 20）The short trouble type voltage dip Wave data for obtaining actual measurement, after standardization, as data to be matched；Step 30）Calculate dynamic time warping distance：Matching library data and data to be matched are normalized, the dynamic time warping distance of the data to be matched and matching library data after normalization is calculated；Step 40）Identify short trouble type：According to dynamic time warping distance size, judges that the short-circuit-type of the voltage dip of actual measurement and short circuit are separate, realize the identification of voltage sag source.This method can carry out accurate recognition to voltage dip caused by short trouble, and it is practical to be suitable for engineering.
Description
Technical field
The invention belongs to electric energy quality monitorings and analysis technical field, it particularly relates to a kind of short trouble type voltage
The temporarily discrimination method in drop source.
Background technology
With the continuous construction and development of power grid, all types of industries power consumer accesses power grid.These users use advanced
Automate, be intelligent, digitized voltage dip sensitive equipment, such as PLC, frequency converter, bus, contactor, relay, control
Device etc. proposes very high requirement to supply voltage quality.Once these equipment are because voltage dip is stopped, complete equipment
Or assembly line can all be affected, and huge loss is brought to enterprise.Manufacturing enterprise generally believes that voltage dip has risen
It is the main interference of the normal trouble free service of modern industry power load for most important power quality problem, various aspects have been given
To pay close attention to.
Voltage dip has become the power quality problem of urgent need to resolve.Voltage dip control measures include mainly carrying at present
The tolerance of high equipment, the generation for reducing voltage sag source, the propagation in disturbance suppression source and configuration voltage sag compensation device.
And accurate recognition voltage sag source is the premise for administering voltage dip.The identification of voltage sag source helps to select reasonably to administer
Measure, while foundation can be provided for the coordination dispute between supply of electric power department and user.
The identification of voltage sag source refers to identifying its producing cause according to the voltage dip data characteristics detected.Both at home and abroad
Numerous studies have been carried out to the discrimination method of voltage sag source, and have obtained numerous achievements, mainly have wavelet transformation, S-transformation,
The methods of vector machine.For most voltage dip in electric system caused by short trouble, voltage dip passes through inhomogeneity
Type transformer temporarily drops type it can also happen that changing after propagating.Above-mentioned discrimination method, which is merely able to effectively to distinguish induction conductivity, to be opened
Voltage dip caused by dynamic, no-load transformer is excitatory and short trouble these three reasons, but it is temporary to voltage caused by short trouble
Drop can not further pick out specific short trouble type and short-circuit phase in system, and which greatly limits methods in Practical Project
In application.
Invention content
Technical problem：The technical problem to be solved by the present invention is to：A kind of distinguishing for short trouble type voltage sag source is provided
Knowledge method, this method can carry out accurate recognition to voltage dip caused by short trouble, be suitable for engineering reality, be engineering people
Member's positioning voltage temporarily drops source, analysis voltage and temporarily drops the mechanism of transmission and selection voltage dip control measures offer effectively help.
Technical solution：In order to solve the above technical problems, the embodiment of the present invention uses a kind of short trouble type voltage sag source
Discrimination method, this approach includes the following steps：
Step 10) acquires short trouble type voltage dip sample data, after carrying out data prediction to the sample data,
Form matching library data；
Step 20) obtains the short trouble type voltage dip Wave data of actual measurement, after standardization, as waiting for
With data；
Step 30) calculates dynamic time warping distance：Matching library data and data to be matched are normalized, calculating is returned
The dynamic time warping distance of data to be matched and matching library data after one change；
Step 40) identifies short trouble type：According to dynamic time warping distance size, the voltage dip of actual measurement is judged
Short-circuit-type and short circuit are separate, realize the identification of voltage sag source.
As preference, the step 10) specifically includes：
Step 101) acquires short trouble type voltage dip sample data in historical data, and the sample data includes abc
Voltage dip ABC phase datas caused by three kinds of phase ground short circuit, ab phases ground short circuit and a phases ground short circuit short troubles, every group
Sample data is arranged in data sequence as the following formula：
UA(1),UB(1),UC(1)
UA(2),UB(2),UC(2)
UA(M),UB(M),UC(M)
In formula, UA(1) the A phase voltages in the 1st group of sample data, U are indicatedB(1) the B phase electricity in the 1st group of sample data is indicated
Pressure, UC(1) the C phase voltages in the 1st group of sample data, U are indicatedA(2) the A phase voltages in the 2nd group of sample data, U are indicatedB(2) table
Show the B phase voltages in the 2nd group of sample data, UC(2) the C phase voltages in the 2nd group of sample data, U are indicatedA(M) M group samples are indicated
A phase voltages in notebook data, UB(M) the B phase voltages in M group sample datas, U are indicatedC(M) it indicates in M group sample datas
C phase voltages, M indicate the quantity of sample；
Step 102) carries out data prediction to the data sequence that step 101) acquires, and every group of data sequence is arranged in 1 row,
Sample data for ab phase ground short circuits adjustment data phase sequence as bc, ca phase ground short circuit adjusts a phase ground short circuits
Sample data of the entire data phase sequence as b, c phase ground short circuit forms the matching library data of 7 row 3M row, matching library data mode
It is as follows：
UA(1),UA(2)…UA(M),UB(1),UB(2)…UB(M),UC(1),UC(2)…UC(M)}①
It is 1. the matching library data of abc phase ground short circuits in formula；2. for the matching library data of ab phase ground short circuits；3. being a
The matching library data of phase ground short circuit；First behavior abc phase ground short circuits, the second behavior ab phase ground short circuits, third behavior bc
Phase ground short circuit, fourth line be ca phase ground short circuits, fifth line be a phase ground short circuits, the 6th behavior b phase ground short circuits, the 7th
Behavior c phase ground short circuits.
As preference, the step 20) includes：The voltage dip Wave data surveyed at points of common connection is obtained,
Form is as follows：
In formula,Indicate the A phase voltages of the 1st group of data in measured data,Indicate the 1st group of number in measured data
According to B phase voltages,Indicate the C phase voltages of the 1st group of data in measured data,Indicate the 2nd group of number in measured data
According to A phase voltages,Indicate the B phase voltages of the 2nd group of data in measured data,Indicate the 2nd group of number in measured data
According to C phase voltages,Indicate the A phase voltages of N group data in measured data,Indicate N groups in measured data
The B phase voltages of data,Indicate the C phase voltages of N group data in measured data；
Wave data is temporarily dropped to the measurement voltage of acquisition to be standardized, and data are lined up into the to be matched of 1 row 3N row
Data, form are as follows：
As preference, the step 30) includes：
Every row matching library data and data to be matched are normalized in step 301), difference reduction to section [- 1,
1] in, normalized function is：
In formula, U indicates matching library data a line sequence before normalization,Indicate the data to be matched before normalization
A line sequence；UmaxIndicate the maximum value of U,It indicatesMaximum value；UminIndicate the minimum value of U,It indicates's
Minimum value；U' indicates matching library data a line sequence after normalization,Indicate a line sequence of the data to be matched after normalization；
Step 302) calculates the dynamic time between the data to be matched after normalization and the matching library data after normalization
Deflection distance：
First, using U' andThe distance matrix A of one 3M rows 3N row of construction, as：
In formula, element in AIndicate the data to be matched after normalizationWith matching library
The alignment distance of data U '；
U' andDynamic time warping distanceFor：
In formula, D (i, j) indicates aijThe sum of with the minimum dynamic time warping distance of its leading portion；aijIndicate element d in A
(xi,xj)；∞ indicates to arrive any number of 3N to 3M or 1 marked as 1；
Step 303) matching library data line down repeats step 302), until data to be matched and all rows have been calculated
The dynamic time warping distance of matching library data obtains 7 dynamic time warping distances.
As preference, the step 40) includes：By a line matching library number of 7 dynamic time warping distance minimums
According to as with the highest data of Data Matching degree to be matched, the row data belong to same class in data to be matched and matching library data
Type voltage dip.
Advantageous effect：Compared with prior art, the embodiment of the present invention has the advantages that：This method can be distinguished accurately
Know the type for short trouble type voltage sag source and short circuit is separate.Traditional discrimination method is merely able to effectively distinguish induction electric
Voltage dip caused by machine starts, no-load transformer is excitatory and short trouble these three reasons, but to electric caused by short trouble
It is separate that the temporary drop of pressure can not further pick out specific short trouble type and short circuit in system.The method of the present embodiment being capable of profit
Analysis identification is carried out with the voltage dip data surveyed in engineering, method is simple and effective, is easy to engineer application.
Description of the drawings
Fig. 1 is the flow chart of the embodiment of the present invention.
The voltage dip sample data oscillogram that Fig. 2 (a) is acquired when being abc phase ground short circuits in the embodiment of the present invention.
The voltage dip sample data oscillogram that Fig. 2 (b) is acquired when being ab phase ground short circuits in the embodiment of the present invention.
The voltage dip sample data oscillogram that Fig. 2 (c) is acquired when being a phase ground short circuits in the embodiment of the present invention.
Fig. 3 is voltage dip measured data oscillogram in the embodiment of the present invention.
Specific implementation mode
With reference to example and attached drawing, the technical solution of the embodiment of the present invention is described further.
As shown in Figure 1, the embodiment of the present invention provides a kind of discrimination method of short trouble type voltage sag source, including it is following
Step：
Step 10) acquires short trouble type voltage dip sample data, after carrying out data prediction to the sample data,
Form matching library data；
Step 20) obtains the short trouble type voltage dip Wave data of actual measurement, after standardization,
As data to be matched；
Step 30) calculates dynamic time warping distance：Matching library data and data to be matched are normalized, calculating is returned
The dynamic time warping distance of data to be matched and matching library data after one change；
Step 40) identifies short trouble type：According to dynamic time warping distance size, the voltage dip of actual measurement is judged
Short-circuit-type and short circuit are separate, realize the identification of voltage sag source.
In the above-described embodiments, the step 10) specifically includes：
Step 101) acquires short trouble type voltage dip sample data in historical data, and the sample data includes abc
Voltage dip ABC phase datas caused by three kinds of phase ground short circuit, ab phases ground short circuit and a phases ground short circuit short troubles, every group
Sample data is arranged in data sequence as the following formula：
UA(1),UB(1),UC(1)
UA(2),UB(2),UC(2)
UA(M),UB(M),UC(M)
In formula, UA(1) the A phase voltages in the 1st group of sample data, U are indicatedB(1) the B phase electricity in the 1st group of sample data is indicated
Pressure, UC(1) the C phase voltages in the 1st group of sample data, U are indicatedA(2) the A phase voltages in the 2nd group of sample data, U are indicatedB(2) table
Show the B phase voltages in the 2nd group of sample data, UC(2) the C phase voltages in the 2nd group of sample data, U are indicatedA(M) M group samples are indicated
A phase voltages in notebook data, UB(M) the B phase voltages in M group sample datas, U are indicatedC(M) it indicates in M group sample datas
C phase voltages, M indicate the quantity of sample；
Step 102) carries out data prediction to the data sequence that step 101) acquires, and every group of data sequence is arranged in 1 row,
Sample data for ab phase ground short circuits adjustment data phase sequence as bc, ca phase ground short circuit adjusts a phase ground short circuits
Sample data of the entire data phase sequence as b, c phase ground short circuit forms the matching library data of 7 row 3M row, matching library data mode
It is as follows：
UA(1),UA(2)…UA(M),UB(1),UB(2)…UB(M),UC(1),UC(2)…UC(M)}①
It is 1. the matching library data of abc phase ground short circuits in formula；2. for the matching library data of ab phase ground short circuits；3. being a
The matching library data of phase ground short circuit；First behavior abc phase ground short circuits, the second behavior ab phase ground short circuits, third behavior bc
Phase ground short circuit, fourth line be ca phase ground short circuits, fifth line be a phase ground short circuits, the 6th behavior b phase ground short circuits, the 7th
Behavior c phase ground short circuits.
In the above-described embodiments, the step 20) specifically includes：Obtain points of common connection (corresponding full name in English Point
of Common Coupling；PCC points are referred to as in text) at the voltage dip Wave data surveyed, form is as follows：
In formula,Indicate the A phase voltages of the 1st group of data in measured data,Indicate the 1st group of number in measured data
According to B phase voltages,Indicate the C phase voltages of the 1st group of data in measured data,Indicate the 2nd group of number in measured data
According to A phase voltages,Indicate the B phase voltages of the 2nd group of data in measured data,Indicate the 2nd group of number in measured data
According to C phase voltages,Indicate the A phase voltages of N group data in measured data,Indicate N groups in measured data
The B phase voltages of data,Indicate the C phase voltages of N group data in measured data；
Wave data is temporarily dropped to the measurement voltage of acquisition to be standardized, and data are lined up into the to be matched of 1 row 3N row
Data, form are as follows：
In the above-described embodiments, the step 30) specifically includes：
Every row matching library data and data to be matched are normalized in step 301), difference reduction to section [- 1,
1] in, normalized function is：
In formula, U indicates matching library data a line sequence before normalization,Indicate the data to be matched before normalization
A line sequence；UmaxIndicate the maximum value of U,It indicatesMaximum value；UminIndicate the minimum value of U,It indicates's
Minimum value；U' indicates matching library data a line sequence after normalization,Indicate a line sequence of the data to be matched after normalization；
Step 302) calculates the dynamic time between the data to be matched after normalization and the matching library data after normalization
Deflection distance：
First, using U' andThe distance matrix A of one 3M rows 3N row of construction, as：
In formula, element in AIndicate the data to be matched after normalizationWith matching library
The alignment distance of data U '；
U' andDynamic time warping distanceFor：
In formula, D (i, j) indicates aijThe sum of with the minimum dynamic time warping distance of its leading portion；aijIndicate element d in A
(xi,xj)；∞ indicates to arrive any number of 3N to 3M or 1 marked as 1；
Step 303) matching library data line down repeats step 302), until data to be matched and all rows have been calculated
The dynamic time warping distance of matching library data obtains 7 dynamic time warping distances.
In the above-described embodiments, the step 40) specifically includes：By a line of 7 dynamic time warping distance minimums
Matching library data are as with the highest data of Data Matching degree to be matched, the row data category in data to be matched and matching library data
In same type voltage dip.Identification result is as follows：
The discrimination method of the embodiment of the present invention, using dynamic time warping distance weigh actual measurement voltage dip data with
Similarity with library data searches out Wave data most like with data to be matched in matching library, and then judges the electricity of actual measurement
Press the type temporarily dropped and short circuit separate.In the prior art, the identification of voltage sag source is concentrated mainly on differentiation induction conductivity and opens
Voltage dip caused by dynamic, no-load transformer is excitatory and short trouble these three reasons, and short trouble is electricity in electric system
The main reason for pressure temporarily drops, it is therefore desirable to it is separate further to pick out specific short trouble type and short circuit in system.This reality
Accurate recognition can be carried out to voltage dip caused by short trouble by applying a method, be suitable for engineering reality, fixed for engineering staff
The mechanism of transmission temporarily drops in position voltage sag source, analysis voltage and selection voltage dip control measures are provided and effectively helped.
A specific embodiment is enumerated below.
By taking some 10kV busbar as an example, the 380V user sides setting voltage measuring apparatus under busbar carries out voltage dip number
According to acquisition.Abc phases ground short circuit, ab phases ground short circuit and a phase ground short circuits are set gradually in emulation forms voltage dip sample
Waveform, a length of 100ms when short-circuit；Bc phase ground short circuits are set and form voltage dip measured waveform, a length of 50ms when short-circuit；Data
Sample frequency is 10kHz.
The discrimination method for executing the embodiment of the present invention, includes the following steps：
Step 10) acquires short trouble type voltage dip sample data, including abc phases ground short circuit, ab phase ground short circuits
With voltage dip ABC phase datas caused by 3 kinds of short troubles of a phases ground short circuit, the matching of 7 rows 3000 row is formed by pretreatment
Library data.The voltage dip sample data of this example acquisition is as shown in Fig. 2, abscissa indicates sampling number, ordinate table in figure
Show the perunit value of voltage magnitude.The voltage dip sample data figure that Fig. 2 (a) is acquired when being abc phase ground short circuits；Fig. 2 (b) is ab
The voltage dip sample data figure acquired when phase ground short circuit；The voltage dip sample that Fig. 2 (c) is acquired when being a phase ground short circuits
Datagram.
Step 20) obtains the voltage dip Wave data of the actual measurement of PCC points, and waiting for for 1 row 3000 row is formed after standardization
With data.The measurement voltage of this case-based system temporarily drops Wave data as shown in figure 3, abscissa indicates sampling number, vertical seat in figure
Mark indicates the perunit value of voltage magnitude.
Step 30) calculates DTW distance of the data to be matched with matching library data per a line after normalization, total to obtain 7
DTW distances, result of calculation are as shown in table 1.
1 DTW of table is apart from result of calculation
| Number | 1 | 2 | 3 | 4 | 5 | 6 | 7 |
| DTW distances | 653.11 | 1411.70 | 5.17 | 756.86 | 1330.30 | 579.38 | 167.16 |
3rd row data matching degree highest of step 40) data to be matched and matching library data, the two belong to same type electricity
Pressure temporarily drops, therefore the voltage dip that identification result is actual measurement is caused by bc phase ground short circuit failures.The identification result of this implementation
Consistent with actual conditions, identification result is accurate.
The basic principles, main features and advantages of the invention have been shown and described above.Those skilled in the art should
Understand, the present invention do not limited by above-mentioned specific embodiment, the description in above-mentioned specific embodiment and specification be intended merely into
One step illustrates the principle of the present invention, without departing from the spirit and scope of the present invention, the present invention also have various change and
It improves, these changes and improvements all fall within the protetion scope of the claimed invention.The scope of protection of present invention is wanted by right
Ask book and its equivalent thereof.
Claims (4)
1. a kind of discrimination method of short trouble type voltage sag source, which is characterized in that this approach includes the following steps：
Step 10) acquires short trouble type voltage dip sample data, after carrying out data prediction to the sample data, is formed
Matching library data；The step 10) specifically includes：
Step 101) acquires short trouble type voltage dip sample data in historical data, and the sample data includes that abc connects
Voltage dip ABC phase datas caused by three kinds of ground short circuit, ab phases ground short circuit and a phases ground short circuit short troubles, every group of sample
Data are arranged in data sequence as the following formula：
UA(1),UB(1),UC(1)
UA(2),UB(2),UC(2)
UA(M),UB(M),UC(M)
In formula, UA(1) the A phase voltages in the 1st group of sample data, U are indicatedB(1) the B phase voltages in the 1st group of sample data are indicated,
UC(1) the C phase voltages in the 1st group of sample data, U are indicatedA(2) the A phase voltages in the 2nd group of sample data, U are indicatedB(2) it indicates
B phase voltages in 2nd group of sample data, UC(2) the C phase voltages in the 2nd group of sample data, U are indicatedA(M) M group samples are indicated
A phase voltages in data, UB(M) the B phase voltages in M group sample datas, U are indicatedC(M) C in M group sample datas is indicated
Phase voltage, M indicate the quantity of sample；
Step 102) carries out data prediction to the data sequence that step 101) acquires, and every group of data sequence is arranged in 1 row, for
Ab phase ground short circuits adjust sample data of the data phase sequence as bc, ca phase ground short circuit, for a phase ground short circuits, adjust number
Sample data according to phase sequence as b, c phase ground short circuit, forms the matching library data of 7 row 3M row, and matching library data mode is as follows：
UA(1),UA(2)…UA(M),UB(1),UB(2)…UB(M),UC(1),UC(2)…UC(M)}①
It is 1. the matching library data of three-phase ground short circuit in formula；2. for the matching library data of two-phase grounding fault；3. being connect to be single-phase
The matching library data of ground short circuit；
Step 20) obtains the short trouble type voltage dip Wave data of actual measurement, after standardization, as number to be matched
According to；
Step 30) calculates dynamic time warping distance：Matching library data and data to be matched are normalized, normalization is calculated
The dynamic time warping distance of data to be matched and matching library data afterwards；
Step 40) identifies short trouble type：According to dynamic time warping distance size, the short circuit of the voltage dip of actual measurement is judged
Type and short circuit are separate, realize the identification of voltage sag source.
2. the discrimination method of short trouble type voltage sag source according to claim 1, which is characterized in that the step
20) include：The voltage dip Wave data surveyed at points of common connection is obtained, form is as follows：
In formula,Indicate the A phase voltages of the 1st group of data in measured data,Indicate the B of the 1st group of data in measured data
Phase voltage,Indicate the C phase voltages of the 1st group of data in measured data,Indicate the A of the 2nd group of data in measured data
Phase voltage,Indicate the B phase voltages of the 2nd group of data in measured data,Indicate the C of the 2nd group of data in measured data
Phase voltage,Indicate the A phase voltages of N group data in measured data,Indicate N group data in measured data
B phase voltages,Indicate the C phase voltages of N group data in measured data；
Wave data is temporarily dropped to the measurement voltage of acquisition to be standardized, and data are lined up to the data to be matched of 1 row 3N row,
Form is as follows：
3. the discrimination method of short trouble type voltage sag source according to claim 2, which is characterized in that the step
30) include：
Every row matching library data and data to be matched are normalized in step 301), respectively reduction to section [- 1,1]
Interior, normalized function is：
In formula, U indicates matching library data a line sequence before normalization,Indicate one of the data to be matched before normalization
Row sequence；UmaxIndicate the maximum value of U,It indicatesMaximum value；UminIndicate the minimum value of U,It indicatesMinimum
Value；U' indicates matching library data a line sequence after normalization,Indicate a line sequence of the data to be matched after normalization；
Step 302) calculates the dynamic time warping between the data to be matched after normalization and the matching library data after normalization
Distance：
First, using U' andThe distance matrix A of one 3M rows 3N row of construction, as：
In formula, element in AIndicate the data to be matched after normalizationWith matching library data
The alignment distance of U '；
U' andDynamic time warping distanceFor：
In formula, D (i, j) indicates aijThe sum of with the minimum dynamic time warping distance of its leading portion；aijIndicate element d (x in Ai,
xj)；∞ indicates to arrive any number of 3N to 3M or 1 marked as 1；
Step 303) matching library data line down repeats step 302), is matched with all rows until data to be matched have been calculated
The dynamic time warping distance of library data obtains 7 dynamic time warping distances.
4. the discrimination method of short trouble type voltage sag source according to claim 3, which is characterized in that the step
40) include：Using a line matching library data of 7 dynamic time warping distance minimums as highest with Data Matching degree to be matched
Data, data to be matched belong to same type voltage dip with the row data in matching library data.
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| CN107436396B (en) * | 2017-09-05 | 2019-08-02 | 南方电网科学研究院有限责任公司 | A kind of discrimination method for the electrical network weak link considering voltage dip |
| CN108181547B (en) * | 2017-12-20 | 2020-05-12 | 珠海许继电气有限公司 | Dynamic time bending distance fault section positioning method based on time sequence compression |
| CN108614188B (en) * | 2018-04-25 | 2020-08-14 | 广州供电局有限公司 | Voltage sag type identification method and device |
| CN108562820B (en) * | 2018-05-04 | 2020-06-02 | 国网甘肃省电力公司电力科学研究院 | Single-phase earth fault line selection method and device for small current grounding system |
| CN108414896B (en) * | 2018-06-04 | 2020-06-12 | 西南交通大学 | Power grid fault diagnosis method |
| CN108896875B (en) * | 2018-07-16 | 2020-06-16 | 国网福建晋江市供电有限公司 | Single-phase earth fault line selection method and device |
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| CN102608493A (en) * | 2011-01-25 | 2012-07-25 | 华北电力科学研究院有限责任公司 | Method and device for positioning voltage sag source |
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| CN101572411A (en) * | 2009-06-10 | 2009-11-04 | 天津市电力公司 | Voltage sag source identification method based on Mamdani fuzzy reasoning |
| CN102072983A (en) * | 2010-11-22 | 2011-05-25 | 华北电力大学（保定） | Method for judging voltage sag reason |
| CN102608493A (en) * | 2011-01-25 | 2012-07-25 | 华北电力科学研究院有限责任公司 | Method and device for positioning voltage sag source |
| CN102435912A (en) * | 2011-10-13 | 2012-05-02 | 华北电力大学（保定） | Method for positioning fault disturbance point in power grid |
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