CN106197659A - A kind of light intensity detecting system of novel framework - Google Patents

A kind of light intensity detecting system of novel framework Download PDF

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Publication number
CN106197659A
CN106197659A CN201610531383.4A CN201610531383A CN106197659A CN 106197659 A CN106197659 A CN 106197659A CN 201610531383 A CN201610531383 A CN 201610531383A CN 106197659 A CN106197659 A CN 106197659A
Authority
CN
China
Prior art keywords
light intensity
detecting system
module
novel framework
intensity detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610531383.4A
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Chinese (zh)
Inventor
孙祝兵
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to CN201610531383.4A priority Critical patent/CN106197659A/en
Publication of CN106197659A publication Critical patent/CN106197659A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • G01J2001/4252Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's

Abstract

A kind of light intensity detecting system of novel framework, including host module, intensity collection module, from machine core controller and display module;System host application C# programming language realizes program to programmable power supply, PLC, the control of light intensity plate and data receiver, process, and carries out light intensity demarcation and secondary calibration, it is achieved data show in polar coordinate, rectangular coordinate and data list;Present system uses master-slave mode light intensity detecting system test result accurate, can be widely applied to the detection field of light source and illumination.

Description

A kind of light intensity detecting system of novel framework
Technical field
The invention belongs to detection technique field.It is specifically related to the light intensity detecting system of a kind of novel framework.
Background technology
LED, as 21 century green illumination new light sources, has the advantages such as brightness height, life-span length, energy-conserving and environment-protective;The most domestic Form 7 National Semiconductor illuminating engineering industrialization bases, become big producing country and the big export country of world's electric lighting, as Semiconductor lighting product is detected the importance become during testing laboratory builds by what.
Light intensity is a base attribute of light source, and it considers sense of vision factor and the optical characteristics of people, is also light source simultaneously Attribute;Light source intensity detection is one of project of photoelectricity enterprise primary study;In the situation that China's Pressure on Energy is increasingly severe Under, accelerate the development of new light sources industry, promote energy-saving and emission-reduction, ensure the quality of new light sources product, be the certainty of sustainable development Select.
Summary of the invention
Technical problem: the problem existed for above-mentioned prior art, the present invention provides the light intensity of a kind of novel framework to examine Examining system.
Technical scheme: the present invention relates to the light intensity detecting system of a kind of novel framework, including host module, intensity collection Module, from machine core controller and display module;System host application C# programming language realizes program to programmable power supply, PLC, light The control of strong plate and data receiver, process, and carry out light intensity demarcation and secondary calibration, it is achieved data are at polar coordinate, rectangular coordinate Show with in data list.
The light intensity detecting system of a kind of novel framework, is characterized in that:
Described intensity collection module is made up of signal conditioning circuit, A/D converter, MCU, reset circuit and PSU power module.
The described STM32F107 chip from the employing of machine core controller with ARM CortexM3 as kernel.
The method have the advantages that
1, present system uses master-slave mode light intensity detecting system test result accurate, can be widely applied to light source and illumination Detection field.
2, the data received are done the form that optimization processes and is converted to needs, the curve of sample test by present system Show in polar coordinate, rectangular coordinate and data list respectively, it is simple to data analysis.
Accompanying drawing explanation
Fig. 1 is present system overall structure block diagram.
Fig. 2 is intensity collection circuit block diagram in the present invention.
Fig. 3 is flow chart of data processing figure in the present invention.
Detailed description of the invention
Below in conjunction with the accompanying drawings and embodiment further illustrates technical scheme.
As it is shown in figure 1, the light intensity detecting system of a kind of novel framework, including host module, intensity collection module, from machine Core controller and display module;System host application C# programming language realizes program to programmable power supply, PLC, the control of light intensity plate System and data receiver, process, and carry out light intensity demarcation and secondary calibration, it is achieved data arrange in polar coordinate, rectangular coordinate and data Table shows.
As in figure 2 it is shown, described intensity collection module is by signal conditioning circuit, A/D converter, MCU, reset circuit and PSU Power module forms;Analog to digital conversion circuit uses AD7356 chip, due to the operating characteristic of analog digital conversion, it may appear that aliasing is existing As, and AD7356 chip itself carries frequency overlapped-resistable filter, the beneficially design of circuit;Additionally, built-in defeated of converter chip Enter clamping protective circuit and can withstand up to ± the voltage of 16.5V, be that there is single electricity of filter function in high input impedance and sheet Source, therefore need not additional bipolar power supply and drives operational amplifier.
The as it is shown on figure 3, during energising of light intensity plate, have dark current and noise etc. to disturb signal in circuit, if the environment of test Not being completely black dark condition, the external world also there will be interference signal, and interference signal is filtered, and needs to carry out including dark current and making an uproar The background detection of sound;The condition of background detection should keep consistent with the condition of conventional sense, but light source should be at closed mode, will The background signal read preserves to configuration file;The signal subtracting background signal that conventionally test reads obtains the light intensity of light source Signal, the light intensity signal at this moment obtained is relative value, there is certain functional relationship with actual light intensity values, it is therefore desirable to by light The data of strong plate measurement standard lamp, then mate with the truthful data of standard lamp, calculate light intensity calibration coefficient, utilize light intensity Calibration coefficient demarcates the light intensity value of light source to be measured.

Claims (2)

1. the light intensity detecting system of a novel framework, it is characterised in that: include host module, intensity collection module, from machine Core controller and display module;System host application C# programming language realizes program to programmable power supply, PLC, the control of light intensity plate System and data receiver, process, and carry out light intensity demarcation and secondary calibration, it is achieved data arrange in polar coordinate, rectangular coordinate and data Table shows.
The light intensity detecting system of a kind of novel framework, is characterized in that:
Described intensity collection module is made up of signal conditioning circuit, A/D converter, MCU, reset circuit and PSU power module;
The described STM32F107 chip from the employing of machine core controller with ARM CortexM3 as kernel.
CN201610531383.4A 2016-07-07 2016-07-07 A kind of light intensity detecting system of novel framework Pending CN106197659A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610531383.4A CN106197659A (en) 2016-07-07 2016-07-07 A kind of light intensity detecting system of novel framework

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610531383.4A CN106197659A (en) 2016-07-07 2016-07-07 A kind of light intensity detecting system of novel framework

Publications (1)

Publication Number Publication Date
CN106197659A true CN106197659A (en) 2016-12-07

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610531383.4A Pending CN106197659A (en) 2016-07-07 2016-07-07 A kind of light intensity detecting system of novel framework

Country Status (1)

Country Link
CN (1) CN106197659A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114884576A (en) * 2021-02-05 2022-08-09 青岛海信宽带多媒体技术有限公司 Optical module
CN114884576B (en) * 2021-02-05 2024-05-10 青岛海信宽带多媒体技术有限公司 Optical module

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114884576A (en) * 2021-02-05 2022-08-09 青岛海信宽带多媒体技术有限公司 Optical module
CN114884576B (en) * 2021-02-05 2024-05-10 青岛海信宽带多媒体技术有限公司 Optical module

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PB01 Publication
WD01 Invention patent application deemed withdrawn after publication
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20161207