CN106154067A - A kind of tantalum capacitor noise measuring system - Google Patents
A kind of tantalum capacitor noise measuring system Download PDFInfo
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- CN106154067A CN106154067A CN201510136345.4A CN201510136345A CN106154067A CN 106154067 A CN106154067 A CN 106154067A CN 201510136345 A CN201510136345 A CN 201510136345A CN 106154067 A CN106154067 A CN 106154067A
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- noise
- measuring system
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- tantalum capacitor
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Abstract
The invention provides a kind of tantalum capacitor noise measuring system, including acquisition of signal part, signal amplifying part is divided and signal conversion part divides；Described probe portion is connected by the input of the preamplifier divided with signal amplifying part by noise pick up after series-connected cell and testing capacitor series connection, the outfan of preamplifier is connected with the input of main amplifier by low pass filter, main amplifier is by the A/D input of output resistance Rout output noise signal to micro-control unit MCU, by the input of RS232/485 interface transmission to host computer after A/D changes.The present invention, by utilizing the software on host computer to carry out signal analysis, obtains the frequency spectrum of noise, is analyzed for technical staff and compares, and this noise measuring system is cheap, convenient test, is suitable for tantalum capacitor volume production and uses.
Description
Technical field
The present invention relates to electronic devices and components noise testing technical field, be specifically related to a kind of tantalum electric capacity
Device noise measuring system.
Background technology
Electronic devices and components low frequency noise measurement and analyzing the reliability of components and parts and life appraisal
Have very important significance.The especially electronic component of MIS structure, by analyzing its
Low frequency noise spectral feature can determine whether its coating mass level, then enters the reliability of device
Row assessment, made prediction to the life-span.
Solid electrolyte Ta capacitor belongs to the electronic devices and components of MIS structure, the most also has
High reliability, long-life feature.Test and analysis by low-frequency noise can be to tantalum capacitors
Reliability judge, rejecting the relatively low tantalum capacitor of reliability, this wants for high reliability
The circuit application asked is significant.
Traditional noise measuring system is expensive, and test program is complicated and be not tantalum capacitor
Test do special optimization, be not suitable for tantalum capacitor volume production use.
Summary of the invention
For solving above-mentioned technical problem, the invention provides a kind of tantalum capacitor noise testing system
System, this tantalum capacitor noise measuring system by carrying out the test of low-frequency noise to testing capacitor
And analysis, the problem solving tantalum capacitor reliability difficult judgment.
The present invention is achieved by the following technical programs.
The present invention provide a kind of tantalum capacitor noise measuring system, including acquisition of signal part,
Signal amplifying part is divided and is divided with signal conversion part；Described probe portion is by series-connected cell and testing capacitance
The input of the preamplifier divided by noise pick up and signal amplifying part after device series connection is even
Connecing, the outfan of preamplifier is connected with the input of main amplifier by low pass filter,
Main amplifier is by the A/D of output resistance Rout output noise signal to micro-control unit MCU
Input, by the input of RS232/485 interface transmission to host computer after A/D changes,
The software on host computer is utilized to carry out signal analysis.
Described preamplifier is by 4 ultra-low noise JFET imported operational amplifiers parallel connections
Become.
Described low pass filter is RC filter circuit.
Described main amplifier is formed in parallel by two ultra-low noise amplifiers.
Described micro-control unit MCU is the embedded microcontroller with 24 A/D translation functions
Chip.
Described noise pick up includes coupling capacitor Cs, and coupling capacitor Cs is metallized polyimide
Polypropylene film capacitor.
A ultra-low noise amplifier in described main amplifier is with direct current zeroing function
Ultra-low noise amplifier.
The beneficial effects of the present invention is: make series-connected cell output certain straight by battery clamp
Stream voltage, is selected the electric capacity that need to test, then is obtained by noise pick up by capacitor fixture
The low-frequency noise of capacitor also inputs to preamplifier and carries out signal amplification, the letter then amplified
Number through low pass filter, unwanted high-frequency signal is filtered, then obtain foot through main amplifier
Reach the low-frequency noise signal of intensity and send the A/D input of MCU to, after A/D changes
The noise signal of telecommunication is converted to digital signal, is inputted to host computer by the transmission of RS232/452 interface
End, utilizes the software of host computer to carry out signal analysis, obtains the frequency spectrum of noise, for technical staff
Being analyzed and compare, this noise measuring system is cheap, convenient test, is suitable for tantalum electric capacity
Tolerance is produced and is used.
Accompanying drawing explanation
Fig. 1 is the structural representation of the present invention；
Fig. 2 is the circuit diagram that in Fig. 1, acquisition of signal part and signal amplifying part are divided.
Detailed description of the invention
Technical scheme is described further below, but claimed scope is not limited to
In described.
A kind of tantalum capacitor noise measuring system as depicted in figs. 1 and 2, including acquisition of signal portion
Divide, signal amplifying part is divided and signal conversion part divides；Described probe portion is by series-connected cell and to be measured
The input of the preamplifier divided by noise pick up and signal amplifying part after capacitor series connection
End connects, and the outfan of preamplifier is connected by the input of low pass filter with main amplifier
Connecing, main amplifier passes through output resistance Rout output noise signal to micro-control unit MCU's
A/D input, described micro-control unit MCU is embedded with 24 A/D translation functions
Microcontroller chip.By defeated to host computer of RS232/485 interface transmission after A/D changes
Enter end, utilize the software of host computer to carry out signal analysis, obtain the frequency spectrum of noise, for technology people
Member is analyzed and compares.
Described preamplifier is by 4 ultra-low noise JFET imported operational amplifiers parallel connections
Become.
Described low pass filter is RC filter circuit.
Described main amplifier is formed in parallel by two ultra-low noise amplifiers.In described main amplifier
A ultra-low noise amplifier be the ultra-low noise amplifier with direct current zeroing function.
Described noise pick up includes coupling capacitor Cs, and coupling capacitor Cs is that capacity is enough
The most low-loss big metalizing polypropylene thin film capacitor, can by noise signal without distortion
It is transferred to preamplifier.
Testing capacitor is Ct1To Ctn, before every testing capacitance, have selection switch S1To Sn.Test
Front first by single-ended switch S1To SnAll Guan Bi, Simultaneous Switching SwGuan Bi, makes testing capacitor
Fully polarization.During test, disconnect switch Sw, and disconnect single-ended switch S1To SnIn be not required to survey
The switch of the testing capacitance of examination, only retains the switch Guan Bi of a testing capacitance.Testing capacitance
Low-frequency noise will be detected by R1 and with faint AC signal form input to coupling electric capacity Cs,
Noise signal is transferred to preamplifier without distortion, and noise is carried out tentatively by preamplifier
Input to the low-pass amplifier being made up of R3, C1 after amplification, input to main amplifier the most again.
Main amplifier is two ultra-low noise amplifiers carrying out positive negative sense amplification respectively, and noise signal obtains
Export on output resistance Rout after fully amplifying, output resistance Rout output noise
Signal is to the A/D input of micro-control unit MCU, and described micro-control unit MCU is band
There is the embedded microcontroller chip of 24 A/D translation functions.Pass through after A/D changes
The transmission of RS232/485 interface, to the input of host computer, utilizes the software on host computer to carry out letter
Number analyze, obtain the frequency spectrum of noise, be analyzed for technical staff and compare.
Claims (7)
1. a tantalum capacitor noise measuring system, amplifies including acquisition of signal part, signal
Part and signal conversion part divide, it is characterised in that: described probe portion is by series-connected cell and to be measured
The input of the preamplifier divided by noise pick up and signal amplifying part after capacitor series connection
End connects, and the outfan of preamplifier is connected by the input of low pass filter with main amplifier
Connecing, main amplifier passes through output resistance Rout output noise signal to micro-control unit MCU's
A/D input, by the input of RS232/485 interface transmission to host computer after A/D changes
End, utilizes the software on host computer to carry out signal analysis.
2. tantalum capacitor noise measuring system as claimed in claim 1, it is characterised in that: institute
State preamplifier to be formed in parallel by 4 imported operational amplifiers of ultra-low noise JFET.
3. tantalum capacitor noise measuring system as claimed in claim 1, it is characterised in that: institute
Stating low pass filter is RC filter circuit.
4. tantalum capacitor noise measuring system as claimed in claim 1, it is characterised in that: institute
State main amplifier to be formed in parallel by two ultra-low noise amplifiers.
5. tantalum capacitor noise measuring system as claimed in claim 1, it is characterised in that: institute
Stating micro-control unit MCU is the embedded microcontroller chip with 24 A/D translation functions.
6. tantalum capacitor noise measuring system as claimed in claim 1, it is characterised in that: institute
Stating noise pick up and include coupling capacitor Cs, coupling capacitor Cs is that metallized polypropylene is thin
Membrane capacitance.
7. tantalum capacitor noise measuring system as claimed in claim 4, it is characterised in that: institute
The ultra-low noise amplifier stated in main amplifier is the super-low noise with direct current zeroing function
Acoustic amplifier.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510136345.4A CN106154067A (en) | 2015-03-26 | 2015-03-26 | A kind of tantalum capacitor noise measuring system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510136345.4A CN106154067A (en) | 2015-03-26 | 2015-03-26 | A kind of tantalum capacitor noise measuring system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106154067A true CN106154067A (en) | 2016-11-23 |
Family
ID=57340524
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510136345.4A Pending CN106154067A (en) | 2015-03-26 | 2015-03-26 | A kind of tantalum capacitor noise measuring system |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1194921A (en) * | 1997-09-17 | 1999-04-09 | Hitachi Ltd | Method for controlling noise detecting circuit and noise detecting circuit |
| CN101358875A (en) * | 2008-09-25 | 2009-02-04 | 国网武汉高压研究院 | Method for measuring capacitor noise by multi-frequency power implantation and apparatus thereof |
| CN203069684U (en) * | 2013-03-07 | 2013-07-17 | 南方电网科学研究院有限责任公司 | Multi harmonic frequency simultaneous loading circuit for capacitor unit noise testing |
| CN103954852A (en) * | 2014-05-19 | 2014-07-30 | 西安电子科技大学 | Low-frequency noise testing method of high-voltage high-capacity capacitor |
| CN204214962U (en) * | 2014-09-23 | 2015-03-18 | 深圳市航嘉驰源电气股份有限公司 | A kind of charger common-mode noise test circuit and proving installation |
-
2015
- 2015-03-26 CN CN201510136345.4A patent/CN106154067A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1194921A (en) * | 1997-09-17 | 1999-04-09 | Hitachi Ltd | Method for controlling noise detecting circuit and noise detecting circuit |
| CN101358875A (en) * | 2008-09-25 | 2009-02-04 | 国网武汉高压研究院 | Method for measuring capacitor noise by multi-frequency power implantation and apparatus thereof |
| CN203069684U (en) * | 2013-03-07 | 2013-07-17 | 南方电网科学研究院有限责任公司 | Multi harmonic frequency simultaneous loading circuit for capacitor unit noise testing |
| CN103954852A (en) * | 2014-05-19 | 2014-07-30 | 西安电子科技大学 | Low-frequency noise testing method of high-voltage high-capacity capacitor |
| CN204214962U (en) * | 2014-09-23 | 2015-03-18 | 深圳市航嘉驰源电气股份有限公司 | A kind of charger common-mode noise test circuit and proving installation |
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Application publication date: 20161123 |
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| RJ01 | Rejection of invention patent application after publication |