CN106130815A - Board level test method and device - Google Patents
Board level test method and device Download PDFInfo
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- CN106130815A CN106130815A CN201610423603.1A CN201610423603A CN106130815A CN 106130815 A CN106130815 A CN 106130815A CN 201610423603 A CN201610423603 A CN 201610423603A CN 106130815 A CN106130815 A CN 106130815A
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- 238000012360 testing method Methods 0.000 claims abstract description 212
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- 235000013399 edible fruits Nutrition 0.000 claims description 2
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- 230000000694 effects Effects 0.000 description 4
- 235000008434 ginseng Nutrition 0.000 description 4
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/08—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters
- H04L43/0805—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters by checking availability
- H04L43/0817—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters by checking availability by checking functioning
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/50—Testing arrangements
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Abstract
The embodiment of the present invention is a kind of method about board level test, and described method includes: when receiving the system kernel startup notice that mainboard sends, send the test instruction of test target components and parts to described mainboard；When receiving described target element device in preset duration and performing the service data that described test instruction generates, determine that described target element device connects according to described service data the most normal.The embodiment of the invention also discloses a kind of board level test device.Compared with prior art, the technical scheme of the embodiment of the present invention, after the system kernel of device systems starts, just mainboard can be carried out board level test, need not wait until that device systems starts completely, it is thus possible to by the start time of board level test in advance, and then the testing time can be shortened, and testing efficiency can be improved.
Description
Technical field
The present embodiments relate to technical field of measurement and test, in particular, relate to a kind of board level test method and device.
Background technology
" brain " that mainboard runs as equipment, is the processor of load bearing equipment, hard disk, memorizer and external equipment interface
Deng main circuit board, wherein, on mainboard, each funtion part is welded to form by different circuit components respectively.Due to equipment
Run and depend on each functional module that mainboard is provided, therefore, in order to ensure that equipment can be properly functioning, in correlation technique,
After mainboard completes, before coming into operation, generally the connection of main on-board circuitry components and parts is tested, relevant
Technology is referred to as board level test.
As a example by the mainboard of android equipment is tested, generally, technical staff pre-set test APP (Application,
Application program), after mainboard completes, call test APP, and trigger mainboard by the difference in functionality of testing results APP
Each functional module such that it is able to by the operation conditions of each functional module on mainboard, determine functional module interlock circuit
The connection of components and parts is the most normal, reaches the purpose of board level test.
In research and practice process, inventor finds that above-mentioned correlation technique at least there is problems in that
Owing to the operation of APP depends on the properly functioning of Android system, and Android system is positioned at Android device
The superiors of device systems, therefore, are calling and before testing results APP, it is necessary first to start the equipment of Android device completely
System, after treating that device systems starts completely, can call test APP, thus the time causing test to need is long, test effect
Rate is low.
Summary of the invention
Embodiments provide a kind of board level test method and device, it is possible to solve the correlation technique testing time long,
The problem that testing efficiency is low.
First aspect, embodiments provides a kind of board level test method, and the method includes:
When receiving the system kernel startup notice that mainboard sends, send the survey of test target components and parts to described mainboard
Examination instruction；
When receiving described target element device in preset duration and performing the service data that described test instruction generates, according to
It is the most normal that described service data determines that described target element device connects.
Preferably, after the test instruction sending test target components and parts to described mainboard, according to described operation number
Before determining that described target element device connects the most normally, described method also includes:
Judge whether to receive described service data according to predetermined interval duration；
When not receiving described service data, the accumulative total duration not receiving described service data；
Judge that whether described total duration is more than or equal to described preset duration；
If described target element device more than or equal to described preset duration, is defined as connecting different by described total duration
Often；
If described total duration less than described preset duration, repeats and described judges whether to connect according to predetermined interval duration
Receive the step of described service data.
Preferably, described according to described service data determine described target element device connect the most normally include:
When described service data is the error code that described target element device execution described test instruction obtains, by described
Target element device is defined as connecting extremely.
Preferably, described according to described service data determine described target element device connect the most normally include:
When described service data is the end value that described target element device execution described test instruction obtains, it is judged that described
End value is the most identical with standard value；
If described end value is identical with described standard value, it is defined as described target element device connecting normally；
If described end value differs with described standard value, it is defined as described target element device connecting extremely.
Preferably, described according to described service data determine described target element device connect the most normally include:
When described service data is the end value that described target element device execution described test instruction obtains, it is judged that described
Whether end value is in critical field；
If described end value is not in described critical field, it is defined as described target element device connecting extremely；
If described end value is in described critical field, the maximum in described critical field is used to deduct described knot
Fruit is worth to the first difference, determines the normal level parameter of described target element device according to described first difference；Or, use institute
State end value to deduct the minima in described critical field and obtain the second difference, determine described target element according to described second difference
The normal level parameter of device.
Second aspect, embodiments provides a kind of board level test device, and described device includes:
Sending module, for when receiving the system kernel startup notice that mainboard sends, sending test to described mainboard
The test instruction of target element device；
First determines module, performs described test instruction generation for receiving described target element device in preset duration
Service data time, according to described service data determine described target element device connect the most normal.
Preferably, also include: the first judge module, for judging whether to receive described operation according to predetermined interval duration
Data；
Computing module, for when not receiving described service data, accumulative when not receiving described service data total
Long；
Second judge module, is used for judging that whether the calculated total duration of described computing module is more than or equal to described
Preset duration；
Second determines module, for judging that obtaining total duration presets more than or equal to described at described second judge module
During duration, it is defined as described target element device connecting extremely；
Described first judge module, be additionally operable to described second judge module judge obtain total duration less than described default time
Time long, judge whether to receive described service data according to predetermined interval duration.
Preferably, described first determines that module includes: first determines unit, wherein,
Described first determines unit, and being used in described service data is that the described test of execution of described target element device instructs
During the error code arrived, it is defined as described target element device connecting extremely.
Preferably, described first determines that module also includes: the first judging unit and second determines unit, wherein,
Described first judging unit, being used in described service data is that the described test of execution of described target element device instructs
During the end value arrived, it is judged that described end value is the most identical with standard value；
Described second determines unit, for when described end value is identical with described standard value, by described target element device
It is defined as connecting normally；It is additionally operable to, when described end value differs with described standard value, be defined as by described target element device
Connect abnormal.
Preferably, described first determines that module also includes: the second judging unit, the 3rd determine unit, computing unit and
Four determine unit, wherein,
Described second judging unit, being used in described service data is that the described test of execution of described target element device instructs
During the end value arrived, it is judged that whether described end value is in critical field；
Described 3rd determines unit, for when described end value is not in described critical field, by described target element
Device is defined as connecting extremely；
Described computing unit, for when described end value is in described critical field, uses in described critical field
Maximum deduct described end value and obtain the first difference；
Described 4th determines unit, for determining the normal level ginseng of described target element device according to described first difference
Number；
Described computing unit, is additionally operable to, when described end value is in described critical field, use described end value to subtract
The minima in described critical field is gone to obtain the second difference；
Described 4th determines unit, is additionally operable to determine the normal level ginseng of described target element device according to described second difference
Number.
The third aspect, embodiments provides a kind of board level test device, and described device includes: processor and storage
Device, wherein,
Described memorizer internal memory contains the operation information that described processor is able to carry out；
Described processor reads the operation information in described memorizer and is used for realizing following methods:
When receiving the system kernel startup notice that mainboard sends, send the survey of test target components and parts to described mainboard
Examination instruction；
When receiving described target element device in preset duration and performing the service data that described test instruction generates, according to
It is the most normal that described service data determines that described target element device connects.
Compared with prior art, the technical scheme that the present embodiment provides has the following advantages and feature:
In the scheme that the embodiment of the present invention provides, in order to solve correlation technique testing time length, low the asking of testing efficiency
Topic, when receiving the system kernel startup notice that mainboard sends, testing service device just sends test target components and parts to mainboard
Test instruction, and receive in preset duration target element device run described test instruction generate service data time, root
Determine that according to service data the connection of target element device is the most normal.That is, the technical scheme of the embodiment of the present invention, at device systems
After system kernel starts, just mainboard can be carried out board level test, need not wait until that device systems starts completely such that it is able to by plate
The start time of level test in advance, and then can shorten the testing time, and can improve testing efficiency.
Accompanying drawing explanation
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, below will be to institute in embodiment
The accompanying drawing used is needed to be briefly described, it should be apparent that, the accompanying drawing in describing below is only some enforcements of the present invention
Example, for those of ordinary skill in the art, on the premise of not paying creative work, it is also possible to obtains according to these accompanying drawings
Obtain other accompanying drawing.
The method flow diagram of the board level test method that Fig. 1 provides for the embodiment of the present invention.
The method flow diagram of the another kind of board level test method that Fig. 2 provides for the embodiment of the present invention.
The mutual schematic diagram of board level test information that Fig. 3 provides for the embodiment of the present invention.
The schematic diagram of the board level test device that Fig. 4 provides for the embodiment of the present invention.
The schematic diagram of the another kind of board level test device that Fig. 5 provides for the embodiment of the present invention.
Detailed description of the invention
Wherein, owing to, before carrying out board level test, the circuit components connection status on mainboard is uncertain, and equipment system
The startup of system and operation depend on the properly functioning of circuit components, therefore, in the feelings that circuit components connection status is unstable
Under condition, the level that device systems is started is the highest, and existing unstable factor is the most, and device systems itself is to board level test
Test result impact the biggest, and then cause the accuracy of test result poor.And the technical scheme of the embodiment of the present invention is also
Can solve the problem that above-mentioned technical problem.
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Whole description, it is clear that described embodiment is only a part of embodiment of the present invention rather than whole embodiments.Based on
Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under not making creative work premise
Embodiment, broadly falls into the scope of protection of the invention.
The method flow diagram of the board level test method that Fig. 1 provides for the embodiment of the present invention.Board level test method shown in Fig. 1
Need not wait until that device systems starts completely, mainboard can be tested such that it is able to shorten the testing time, improve test effect
Rate.The method comprises the following steps.
Step S101, when receive mainboard send system kernel start notice time, to described mainboard send test target
The test instruction of components and parts.
It should be noted that the device systems of android equipment starts includes three phases: the first stage,
Bootloader (bootload), i.e. initiating hardware equipment, set up memory headroom mapping graph, for follow-up phase startup prepare
Correct running environment, is the bottom of system；Second stage, kernel (system kernel), the i.e. core of device operating system
Part；Phase III, Android system.Wherein, kernel layer includes the core operation module of device operating system, when
After kernel layer starts completely, device systems just can perform corresponding function according to operational order.Based on this, the present invention implements
The technical scheme of example can carry out board level test to mainboard after kernel starts.
Concrete, in the technical scheme of the embodiment of the present invention, it is provided with testing service device, when test, testing service device
The communication interface of mainboard can be connected, to carry out information mutual with mainboard.Refer to what Fig. 3, Fig. 3 provided for the embodiment of the present invention
The mutual schematic diagram of board level test information, in the present embodiment, mainboard is internally provided with notification module, in device systems start-up course
In, when last module of kernel completes to start, trigger notice module, thus send kernel to testing service device and open
Dynamic announcement information, in order to testing service device starts test to mainboard.
Wherein, in the present embodiment, test instruction refers to, triggers the operational order of device target function；Target element device is
Refer to, the execution hardware on the mainboard corresponding to objective function.It should be noted that target element device can be multiple circuit elements devices
Part, the embodiment of the present invention is without limitation.Owing to board level test is to connect main on-board circuitry components and parts to survey the most normally
Examination, and on mainboard, each circuit components is carried out the hardware of systemic-function, and the corresponding different execution hardware of difference in functionality.
So, in the present embodiment, testing service device receive mainboard send kernel start announcement information after, as it is shown on figure 3,
Test instruction is sent, by the test corresponding objective function of instruction triggers, and then to make mainboard pass through performance objective to mainboard
Corresponding target element device is tested by function.
It should be noted that test instruction is operational order, such as, click instructs.Test instruction is pre-by technical staff
First arranging and store testing service device, in the present embodiment, testing service device is receiving the system kernel startup that mainboard sends
After notice, can send test instruction one by one to mainboard, so that mainboard performs corresponding function by target electric appliance element, it is right to complete
The test of target electric appliance element.Concrete, test instruction can be stored in form by testing service device, and by pointer one by one
Test to be sent is selected to instruct.
From the description of the present embodiment, due to the different corresponding different target element devices of test instruction, therefore, we
The circuit components of mainboard can be tested by case respectively, and not only test process is more flexible, and adjusts in correlation technique
Compare by the mode of test APP, it is possible to circuit components is tested more targetedly, and then improve the accurate of test result
Degree.
Additionally, due to the startup of kernel also depends on the properly functioning of hardware, therefore, after mainboard powers on,
Kernel is likely to be due to hardware deficiency and cannot start, thus the kernel causing testing service device cannot receive mainboard transmission opens
Dynamic announcement information, and then cannot be carried out further testing.Therefore, when mainboard powers on, testing service device can receive mainboard
The announcement information that powers on, and starting timing, if not receiving the kernel that mainboard sends in certain time to start notice, then will
The circuit components of this mainboard is defined as connecting extremely.Such as, in a preferred exemplary of the present invention, testing service device is connecing
After receiving the notice that powers on of mainboard, if not receiving the announcement information of the kernel startup that mainboard sends in 15s, the most permissible
It is defined as the circuit components of this mainboard connecting extremely.
Step S102, when receive in preset duration described target element device perform described test instruction generate operation number
According to time, according to described service data determine described target element device connect the most normal.
According to foregoing description, mainboard, after receiving test instruction, performs corresponding behaviour according to the content of test instruction
Make, it is possible to generating run data in preset duration.Owing to service data can react the connection state of target element device, because of
This, refer to Fig. 3, and service data, after generating run data, is sent to testing service device by mainboard, and testing service device can root
Determine that target element device connects according to service data the most abnormal.
Wherein, preset duration can perform the conventional time-out duration of this test instruction previously according to equipment and set, such as,
In one preferred exemplary of the present invention, preset duration can be 20s.
It should be noted that when target element device connects abnormal, mainboard cannot normally perform survey by target element device
Examination instruction, causes the service data obtained different from correct service data, therefore, in the present embodiment, and can in testing service device
To prestore every kind of correct service data corresponding to test instruction, after receiving the service data that target element device sends,
Testing service device can contrast received service data and corresponding correct service data, such that it is able to according to the relation of the two
Determine the connection state of target element device.Additionally, the service data that mainboard performs obtained by different tests instructs also differs,
Generally, service data can be two class data: performs the end value that test instruction obtains, and performs the result that test instruction obtains
Conditional code.The service data of corresponding above two type is described in detail respectively below.
When service data is conditional code, testing service device with the content of reading state code, and can determine whether mistake
Conditional code, if error status code, then explanation target element device fails normally to perform test instruction, further illustrates target element
Device connects abnormal, therefore, it can be defined as target element device connecting extremely；If during correct status code, target being described
Components and parts normally perform test instruction, and target element device connects normal, then target element device can be defined as connection normal.
Such as, testing instruction is " click " instruction, and in the present embodiment, the function being somebody's turn to do " click " instruction correspondence triggering is
" send " function, if target element device normally performs " click " instruction, then, " transmission " function will be successfully triggered, generation
Service data can be to trigger " transmission " successfully conditional code, and testing service device " sends " successful conditional code receiving triggering
After, can be defined as target element device connecting normally.If target element device cannot normally perform " click " instruction, then without
Method triggers " transmission " function, and the service data of generation is then error code, for example, it may be, error code 303, testing service
Target element device, after receiving error status code 303, can be defined as connecting extremely by device.
In another embodiment, when service data is end value, owing to normally performing test under different operating scene
Standard data type obtained by instruction can include two kinds, standard value and critical field, and therefore, the present embodiment is based respectively on
State two kinds of standard data type to be described.
When the normal service data performing test instruction correspondence is standard value, in the end value receiving target element device
After, testing service device may determine that end value is the most identical with respective standard value, if end value is identical with respective standard value, says
Bright test instruction is performed normally, and is defined as target element device connecting normally；If end value differs with respective standard value,
Illustrate that test instruction is not performed normally, be defined as target element device connecting extremely.
Such as, when testing instruction and being " acquisition current time ", the related objective components and parts on mainboard are calculated currently
Time, and the calculated time is sent to testing service device.Assume that in testing service device, the standard time of storage is 9:30,
If the time received is 9:30, illustrate that target element device calculates correct, can be defined as target element device connecting normally；
If the time received is not 9:30, target element device mistake in computation is described, can be defined as target element device connecting different
Often.
When the normal service data performing test instruction correspondence is critical field, in the result receiving target element device
After value, testing service device may determine that whether end value is in critical field, if end value is in critical field, and explanation
Test instruction is performed normally, and is defined as target element device connecting normally；If end value is not in critical field, explanation
Test instruction is not performed normally, and is defined as target element device connecting extremely.
Such as, when testing instruction and being " transmission message ", respective objects components and parts start meter when performing " transmission " function
Time, and timing is stopped when sending successfully, thus obtain sending duration, and this transmission duration is sent to testing service device.False
If in the present embodiment, the critical field sending duration is recorded as 0.5s～3s, if the transmission duration that testing service device receives
For 1.5s, then it is assumed that send duration and be in normal range, can will determine as connecting normally；If testing service device receives
Transmission time a length of 3.5s, then it is assumed that send duration exceed normal range, can will determine as connect exception.
It should be noted that for the ease of record test result, the technical scheme of the embodiment of the present invention, can be, but not limited to
Use mark to represent connect normal and connect abnormal.Such as, in a preferred exemplary of the present invention, it is possible to use parameter 0 and 1
Representing, parameter 0 represents that connection is abnormal, and parameter 1 expression connects normal.
Additionally, further, when the service data that normal execution test instruction is corresponding is critical field, although end value
When being in critical field, the connection of target element device is normal, but, if end value is bigger than normal or less than normal, mesh may be represented
There is potential risk in the connection of mark components and parts.Therefore, in the present embodiment, it is also possible to preset normal level parameter, work as result
When value is in critical field, obtain the first difference, according to first by using the maximum in critical field to deduct end value
Difference determines the normal level parameter of target element device；Or, use end value to deduct the minima in critical field and obtain the
Two differences, determine the normal level parameter of target element device according to the second difference.Wherein it is desired to explanation, can be according to behaviour
Make the demand of scene, pre-set normal level parameter and the first difference or the corresponding relation of the second difference, and according to first
Difference or the size of the second difference, the normal level parameter of record object components and parts.
Such as, as a example by above-mentioned transmission duration, it is assumed that the normal level parameter area preset is 0.2～0.9, wherein, number
It is worth the biggest, represents that normal degree is the biggest.Owing to the present embodiment is to send duration, generally send duration the shortest, represent closer to
Perfect condition, therefore, what testing service device was received sends the duration minima closer to critical field, and normal level parameter is more
Greatly.It is to say, in the present embodiment, the first difference is the biggest or the second difference is the least, and normal level parameter is the biggest, such as, institute
The transmission duration received is 0.8s, then normal level parameter could be arranged to 0.9；And the first difference is the least or the second difference more
Greatly, normal level parameter is the least, and such as, the transmission duration received is 2.5s, then normal level parameter could be arranged to 0.3.
Certainly, above-described embodiment is only a preferred exemplary of the present invention, the technical scheme of the embodiment of the present invention, normal etc.
Level parameter and the first difference and/or the corresponding relation of the second difference, can be arranged according to the demand of application scenarios.Such as, mark is worked as
What quasi-scope was limited is the frequency of data process, and in this scenario, frequency is the highest closer to perfect condition, then,
In the present embodiment, the first difference is the least or the second difference is the biggest, and corresponding normal level parameter is the biggest；First difference the biggest or
Person's the second difference is the least, and corresponding normal level parameter is the least.Concrete, the embodiment of the present invention is without limitation.
From the description of the present embodiment, the board level test method described in this programme, after main board system kernel starts, just
Mainboard can be carried out board level test, need not wait until that device systems starts completely such that it is able to by the start time of board level test
In advance, and then the testing time can be shortened, and testing efficiency can be improved.
On the basis of above-described embodiment, in order to enable those skilled in the art more clearly and detailedly to understand we
Case, the embodiment of the present invention additionally provides another embodiment.Refer to the another kind that Fig. 2, Fig. 2 provide for the embodiment of the present invention
The method flow diagram of board level test method.
It should be noted that the additional notes that the present embodiment is to above-described embodiment, so content identical with Fig. 1 in Fig. 2
Can be found in description corresponding to Fig. 1, here is omitted for the present embodiment.Relative to the embodiment shown in Fig. 1, the enforcement shown in Fig. 2
Example is after step slol, further comprising the steps of:
Step S103, judges whether to receive described service data according to predetermined interval duration, when receiving in preset duration
When performing the service data of described test instruction generation to described target element device, perform step S102；Described when not receiving
During service data, perform step S104.
Wherein, in view of the execution of test instruction depends on the properly functioning of target element device, and cannot be true under current scene
Whether the components and parts that set the goal can be properly functioning, and therefore, in the present embodiment, testing service device is sending test instruction to mainboard
After, can detect whether have received the service data of target element device according to certain interval duration such that it is able to determine mesh
Mark components and parts perform whether the time of test instruction has exceeded overtime duration, and then whether normal can connect for target element device
More comprehensively criterion is provided.
It should be noted that in the present embodiment, predetermined interval duration can normally perform the normal of test instruction according to mainboard
Rule duration sets, and such as, generally performs the time a length of 0.2s needed for the function that this test instruction is corresponding, can be by the present embodiment
The interval duration preset is set as 0.2s.
Step S104, the accumulative total duration not receiving described service data.
Wherein, perform the duration of test instruction for the ease of record object components and parts, and provide for follow-up test process
Reference data, when not receiving the service data of target element device, the accumulative total duration not receiving service data.
Step S105, it is judged that whether described total duration is more than or equal to described preset duration, when described total duration is more than
Or during equal to described preset duration, perform step S106；When described total duration is less than described preset duration, perform step
S103。
Owing in the present embodiment, can target element device properly functioning and uncertain, accordingly, it is possible to there is target element device
The situation that time-out does not responds, therefore, for being smoothed out of other test events, whether testing service device may determine that total duration
Reaching time-out duration, if total duration is not up to time-out duration, and testing service device have received service data, then according to operation
Data determine that the connection of target element device is the most normal, concrete, see the description of above-described embodiment；If total duration is not up to
Time-out duration, but testing service device does not receives service data yet, then continue to detect whether to receive service data, until
Service data is have received in time-out duration, or, total duration is up to or over time-out duration.
Wherein, description based on above-described embodiment, the embodiment of the present invention is provided with preset duration, and this preset duration can
To perform the conventional time-out duration setting of this test instruction previously according to equipment, i.e. the preset duration in the embodiment of the present invention is i.e.
The overtime duration of test instruction is performed for target element device.
Step S106, is defined as described target element device connecting extremely.
Wherein, based on foregoing description, when testing service device does not receives total duration of service data, up to or over
Preset duration, then it is believed that target element device cannot normally perform test instruction, be defined as target element device connecting extremely.
As can be seen here, the technical scheme of the present embodiment, testing service device can detect mesh after sending test instruction
Total duration of mark components and parts response test instruction, when total duration reaches time-out duration, this target element device is really different for connecting
Often, more comprehensively data foundation can not only be provided for test, and testing efficiency can be improved.
Further, for the ease of technical staff's maintenance to mainboard, when test, can will connect abnormal target element
Device emphasis indicates, such as, in the present embodiment, the common Song typeface can be used to indicate by connecting normal target element device, and
Connect abnormal target element device, it is possible to use the Song typeface red, overstriking indicates, and for normal level parameter less than certain value
Target element device, it is possible to use yellow, overstriking the Song typeface indicate.Concrete, can arrange flexibly, the embodiment of the present invention is to this
Do not limit.
To sum up, the board level test method that the embodiment of the present invention provides, in order to solve correlation technique testing time length, test effect
The problem that rate is low, when receiving the system kernel startup notice that mainboard sends, testing service device just sends test mesh to mainboard
The test instruction of mark components and parts, and in preset duration, receive the operation number that target element device operation described test instruction generates
According to time, determine that according to service data the connection of target element device is the most normal.That is, the technical scheme of the embodiment of the present invention, is setting
After the system kernel of standby system starts, just mainboard can be carried out board level test, need not wait until that device systems starts completely, thus
By the start time of board level test in advance, and then can shorten the testing time, and testing efficiency can be improved.
Corresponding with above-mentioned implementation method, the embodiment of the present invention additionally provides a kind of board level test device.Refer to figure
The schematic diagram of 4, Fig. 4 board level test devices provided for the embodiment of the present invention.This device includes that sending module 11 and first determines
Module 12, wherein: sending module 11, for when receiving the system kernel startup notice that mainboard sends, sending out to described mainboard
The test sending test target components and parts instructs；First determines module 12, for receiving described target element device in preset duration
When part performs the service data that described test instruction generates, determine whether described target element device connects according to described service data
Normally.
Additionally, described device also includes: the first judge module, for judging whether to receive institute according to predetermined interval duration
State service data.
Computing module, for when not receiving described service data, accumulative when not receiving described service data total
Long.
Second judge module, is used for judging that whether the calculated total duration of described computing module is more than or equal to described
Preset duration.
Second determines module, for judging that obtaining total duration presets more than or equal to described at described second judge module
During duration, it is defined as described target element device connecting extremely.
Described first judge module, be additionally operable to described second judge module judge obtain total duration less than described default time
Time long, judge whether to receive described service data according to predetermined interval duration.
Needing explanation, in a specific embodiment, first determines that module 12 includes: first determines unit, wherein, and institute
State first and determine unit, test, for being that the execution of described target element device is described in described service data, the mistake generation that instruction obtains
During code, it is defined as described target element device connecting extremely.
In another embodiment, first determines that module 12 includes: the first judging unit and second determines unit, wherein,
Described first judging unit, tests, for being that the execution of described target element device is described in described service data, the result that instruction obtains
During value, it is judged that described end value is the most identical with standard value.
Described second determines unit, for when described end value is identical with described standard value, by described target element device
It is defined as connecting normally；It is additionally operable to, when described end value differs with described standard value, be defined as by described target element device
Connect abnormal.
Additionally, in another embodiment, first determines that module 12 can also include: the second judging unit, the 3rd determine
Unit, computing unit and the 4th determine unit, wherein,
Described second judging unit, being used in described service data is that the described test of execution of described target element device instructs
During the end value arrived, it is judged that whether described end value is in critical field.
Described 3rd determines unit, for when described end value is not in described critical field, by described target element
Device is defined as connecting extremely.
Described computing unit, for when described end value is in described critical field, uses in described critical field
Maximum deduct described end value and obtain the first difference.
Described 4th determines unit, for determining the normal level ginseng of described target element device according to described first difference
Number.
Described computing unit, is additionally operable to, when described end value is in described critical field, use described end value to subtract
The minima in described critical field is gone to obtain the second difference.
Described 4th determines unit, is additionally operable to determine the normal level ginseng of described target element device according to described second difference
Number.
About the device in above-described embodiment, wherein modules and unit perform the concrete mode of operation relevant
The embodiment of the method is described in detail, explanation will be not set forth in detail herein.
As can be seen here, in the scheme that the embodiment of the present invention provides, in order to solve correlation technique testing time length, test effect
The problem that rate is low, the technical scheme of the embodiment of the present invention, after the system kernel of device systems starts, just mainboard can be carried out
Board level test, need not wait until that device systems starts completely such that it is able to by the start time of board level test in advance, and then can contract
The short testing time, and testing efficiency can be improved.
Based on foregoing description, the embodiment of the present invention additionally provides a kind of board level test device, sees Fig. 5, real for the present invention
Execute the schematic diagram of the another kind of board level test device that example provides.This device includes: processor 21 and memorizer 22, wherein,
Memorizer 22 internal memory contains the operation information that described processor is able to carry out.
Processor 21 reads the operation information in memorizer 22 and is used for realizing following methods:
When receiving the system kernel startup notice that mainboard sends, send the survey of test target components and parts to described mainboard
Examination instruction.
When receiving described target element device in preset duration and performing the service data that described test instruction generates, according to
It is the most normal that described service data determines that described target element device connects.
Summary understands, in the scheme that the embodiment of the present invention provides, in order to solve correlation technique testing time length, survey
Trying inefficient problem, when receiving the system kernel startup notice that mainboard sends, testing service device just sends to mainboard and surveys
The test instruction of examination target element device, and in preset duration, receive the fortune that target element device operation described test instruction generates
During row data, determine that according to service data the connection of target element device is the most normal.That is, the technical scheme of the embodiment of the present invention,
After the system kernel of device systems starts, just mainboard can be carried out board level test, need not wait until that device systems starts completely,
It is thus possible to by the start time of board level test in advance, and then the testing time can be shortened, and testing efficiency can be improved.
The above, the only detailed description of the invention of the present invention, but protection scope of the present invention is not limited thereto, and any
Those familiar with the art, in the technical scope that the invention discloses, can readily occur in change or replace, should contain
Cover within protection scope of the present invention.Therefore, protection scope of the present invention should described be as the criterion with scope of the claims.
Claims (11)
1. a board level test method, it is characterised in that described method includes:
When receiving the system kernel startup notice that mainboard sends, the test sending test target components and parts to described mainboard refers to
Order；
When receiving described target element device in preset duration and performing the service data that described test instruction generates, according to described
It is the most normal that service data determines that described target element device connects.
Board level test method the most according to claim 1, it is characterised in that sending test target unit device to described mainboard
After the test instruction of part, before determining that according to described service data described target element device connects the most normally, described side
Method also includes:
Judge whether to receive described service data according to predetermined interval duration；
When not receiving described service data, the accumulative total duration not receiving described service data；
Judge that whether described total duration is more than or equal to described preset duration；
If described total duration is more than or equal to described preset duration, it is defined as described target element device connecting extremely；
If described total duration less than described preset duration, repeats and described judges whether to receive according to predetermined interval duration
The step of described service data.
Board level test method the most according to claim 1, it is characterised in that described determine according to described service data described
Target element device connects and the most normally includes:
When described service data is the error code that described target element device execution described test instruction obtains, by described target
Components and parts are defined as connecting extremely.
Board level test method the most according to claim 1, it is characterised in that described determine according to described service data described
Target element device connects and the most normally includes:
When described service data is the end value that described target element device execution described test instruction obtains, it is judged that described result
It is worth the most identical with standard value；
If described end value is identical with described standard value, it is defined as described target element device connecting normally；
If described end value differs with described standard value, it is defined as described target element device connecting extremely.
Board level test method the most according to claim 1, it is characterised in that described determine according to described service data described
Target element device connects and the most normally includes:
When described service data is the end value that described target element device execution described test instruction obtains, it is judged that described result
Whether value is in critical field；
If described end value is not in described critical field, it is defined as described target element device connecting extremely；
If described end value is in described critical field, the maximum in described critical field is used to deduct described end value
Obtain the first difference, determine the normal level parameter of described target element device according to described first difference；Or, use described knot
Fruit value deducts the minima in described critical field and obtains the second difference, determines described target element device according to described second difference
Normal level parameter.
6. a board level test device, it is characterised in that described device includes:
Sending module, for when receiving the system kernel startup notice that mainboard sends, sending test target to described mainboard
The test instruction of components and parts；
First determines module, performs, for receiving described target element device in preset duration, the fortune that described test instruction generates
During row data, determine that described target element device connects according to described service data the most normal.
Board level test device the most according to claim 6, it is characterised in that also include:
First judge module, for judging whether to receive described service data according to predetermined interval duration；
Computing module, for when not receiving described service data, adds up not receive total duration of described service data；
Second judge module, is used for judging whether the calculated total duration of described computing module is preset more than or equal to described
Duration；
Second determines module, for judging to obtain total duration more than or equal to described preset duration at described second judge module
Time, it is defined as described target element device connecting extremely；
Described first judge module, is additionally operable to judge to obtain total duration less than described preset duration at described second judge module
Time, judge whether to receive described service data according to predetermined interval duration.
Board level test device the most according to claim 6, it is characterised in that described first determines that module includes: first is true
Cell, wherein,
Described first determines unit, and being used in described service data is that described target element device execution described test instruction obtains
During error code, it is defined as described target element device connecting extremely.
Board level test device the most according to claim 6, it is characterised in that described first determines that module also includes: first
Judging unit and second determines unit, wherein,
Described first judging unit, being used in described service data is that described target element device execution described test instruction obtains
During end value, it is judged that described end value is the most identical with standard value；
Described second determines unit, for when described end value is identical with described standard value, is determined by described target element device
Normal for connecting；It is additionally operable to, when described end value differs with described standard value, be defined as described target element device connecting
Abnormal.
Board level test device the most according to claim 6, it is characterised in that described first determines that module also includes: second
Judging unit, the 3rd determine that unit, computing unit and the 4th determine unit, wherein,
Described second judging unit, being used in described service data is that described target element device execution described test instruction obtains
During end value, it is judged that whether described end value is in critical field；
Described 3rd determines unit, for when described end value is not in described critical field, by described target element device
It is defined as connecting extremely；
Described computing unit, for when described end value is in described critical field, uses in described critical field
Big value deducts described end value and obtains the first difference；
Described 4th determines unit, for determining the normal level parameter of described target element device according to described first difference；
Described computing unit, is additionally operable to, when described end value is in described critical field, use described end value to deduct institute
State the minima in critical field and obtain the second difference；
Described 4th determines unit, is additionally operable to determine the normal level parameter of described target element device according to described second difference.
11. 1 kinds of board level test devices, it is characterised in that described device includes: processor and memorizer, wherein,
Described memorizer internal memory contains the operation information that described processor is able to carry out；
Described processor reads the operation information in described memorizer and is used for realizing following methods:
When receiving the system kernel startup notice that mainboard sends, the test sending test target components and parts to described mainboard refers to
Order；
When receiving described target element device in preset duration and performing the service data that described test instruction generates, according to described
It is the most normal that service data determines that described target element device connects.
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