CN106033024B - Optical instrument low temperature environment test box - Google Patents

Optical instrument low temperature environment test box Download PDF

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Publication number
CN106033024B
CN106033024B CN201510117445.2A CN201510117445A CN106033024B CN 106033024 B CN106033024 B CN 106033024B CN 201510117445 A CN201510117445 A CN 201510117445A CN 106033024 B CN106033024 B CN 106033024B
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China
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cavity
layer cavity
upper layer
layer
lower layer
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CN201510117445.2A
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CN106033024A (en
Inventor
芮鹏飞
陈继
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Northwest Institute of Eco Environment and Resources of CAS
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Cold and Arid Regions Environmental and Engineering Research Institute of CAS
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Abstract

The present invention relates to a kind of optical instrument low temperature environment test box, the test box include vacuum double-layer glass be made and it is interior set upper layer cavity, middle layer cavity, lower layer's cavity cabinet and be located at the single-chip microcontroller that the top of the box is connected with power supply.It is equipped with partition between upper layer cavity and middle layer cavity, between middle layer cavity and lower layer's cavity, which is equipped with symmetrical venthole;Upper layer cavity is directly connected with lower layer cavity by air circulating umbilical;The side of upper layer cavity is equipped with the fan of translator;Upper layer cavity and the partition of middle layer cavity joint are equipped with refrigerating fluid circulation pipe, the external refrigeration machine of refrigerating fluid circulation pipe;The side of lower layer's cavity is equipped with temperature sensor;Single-chip microcontroller is connected with fan, temperature sensor respectively, and external connection keyboard and liquid crystal display.The present invention is at low cost, easy to operate, and the low-temperature test environment not limited by spatial dimension can be provided for optical instrument to be measured.

Description

Optical instrument low temperature environment test box
Technical field
The present invention relates to technical field of optical instrument more particularly to optical instrument low temperature environment test boxs.
Background technique
Low temperature detection is a basic test project of instrument.The biggish optical instrument in space is measured for part, if Simulated environment is detected using low temperature, traditionally greenhouse is limited the requirement for being often unable to satisfy test, such as long distance laser by place Positioning or distance-measuring equipment etc., and large-scale low temperature test room is built and its operates in economic indicator often without feasible Property.Therefore, it needs a kind of to put into small and the equipment of low-temperature test environment can be provided for optical instrument.
Summary of the invention
Technical problem to be solved by the invention is to provide a kind of optical instrument low temperature environment surveys at low cost, easy to operate Try case.
To solve the above problems, optical instrument low temperature environment test box of the present invention, it is characterised in that: the test box Be made including vacuum double-layer glass and it is interior set upper layer cavity, middle layer cavity, lower layer's cavity cabinet and be located at the top of the box The single-chip microcontroller being connected with power supply;Between the upper layer cavity and the middle layer cavity, the middle layer cavity and lower layer's cavity Between be equipped with partition, the partition be equipped with symmetrical venthole;The upper layer cavity by air circulating umbilical directly with Lower layer's cavity is connected;The side of the upper layer cavity is equipped with the fan of translator;The upper layer cavity and the middle layer chamber The partition of body joint is equipped with refrigerating fluid circulation pipe, the external refrigeration machine of refrigerating fluid circulation pipe;The side of lower layer's cavity Equipped with temperature sensor;The single-chip microcontroller is connected with the fan, the temperature sensor respectively, and external connection keyboard and liquid crystal Display screen.
Compared with the prior art, the present invention has the following advantages:
1, since the cabinet in the present invention is that vacuum double-layer glass is made and interior sets upper layer cavity, middle layer cavity, lower layer's chamber Therefore body solves the problems, such as that optical instrument carries out big-bang testing, while dual-layer vacuum glass in small range low temperature environment With thermal insulation benefits, the intensity of heat exchange inside and outside cabinet is greatly lowered, additionally it is possible to frosting inside and outside glass be avoided to make pairwise testing The influence of optical path.
2, the side of cavity at the middle and upper levels of the invention is equipped with the fan of translator, and upper layer cavity and middle layer cavity joint Partition is equipped with refrigerating fluid circulation pipe, therefore, is reached by fan air-supply and air and refrigerating fluid circulation pipe in cabinet is allowed to carry out heat The purpose of air circulation between exchange and three layers.
3, in the present invention therefore the side of lower layer's cavity can be used for the measurement of the temperature inside the box equipped with temperature sensor.
4, the present invention is equipped with partition between cavity and middle layer cavity, between middle layer cavity and lower layer's cavity at the middle and upper levels, should Partition is equipped with symmetrical venthole, and therefore, the steady air current of middle layer air circulation is symmetrical, can effectively reduce because of air stream Dynamic asymmetric and caused to optical instrument measurement influence.
5, the present invention use single-chip microcontroller control fan work to adjust heat exchange to reach temperature controlled effect, warm in real time Degree, setting temperature and control range are shown by LCD.Compared with the test space of Conventional cryogenic room, the present invention can be to be measured Optical instrument provides the low-temperature test environment not limited by spatial dimension.
6, the present invention is at low cost, easy to operate.
Detailed description of the invention
Specific embodiments of the present invention will be described in further detail with reference to the accompanying drawing.
Fig. 1 is the structural diagram of the present invention.
In figure: 1-upper layer 2-middle layer of cavity 3-lower layer of cavity cavity 4-cabinet, 5-refrigeration machine, 6-refrigerating fluid Circulation pipe 7-fan, 8-air circulating umbilical, 9-temperature sensor, 10-venthole.
Specific embodiment
As shown in Figure 1, optical instrument low temperature environment test box, which includes that vacuum double-layer glass is made and interior sets Layer cavity 1, middle layer cavity 2, lower layer's cavity 3 cabinet 4 and be located at the single-chip microcontroller that the top of cabinet 4 is connected with power supply.
It is equipped with partition between upper layer cavity 1 and middle layer cavity 2, between middle layer cavity 2 and lower layer's cavity 3, on the partition Equipped with symmetrical venthole 10;Upper layer cavity 1 is directly connected with lower layer cavity 3 by air circulating umbilical 8;Upper layer cavity 1 Side be equipped with translator fan 7;Upper layer cavity 1 and the partition of 2 joint of middle layer cavity are equipped with refrigerating fluid circulation pipe 6, The external refrigeration machine 5 of refrigerating fluid circulation pipe 6;The side of lower layer's cavity 3 is equipped with temperature sensor 9;Single-chip microcontroller respectively with fan 7, Temperature sensor 9 is connected, and external connection keyboard and liquid crystal display.
In use, being passed through power supply, the present invention enters operating status.Setting control temperature and control model are inputted by keyboard It encloses, temperature is setting control temperature, and range is setting control allowed band, for example sets control -25.5 DEG C of ranges of temperature as 0.5 DEG C, control the temperature inside the box is sought between -26 DEG C to -25 DEG C.The temperature inside the box and setting temperature measured by temperature sensor 9 Degree and range are compared, and test temperature just stops motor operating lower than -26 DEG C and stops refrigeration, and test temperature is higher than -25 DEG C Just control motor again operation start freeze, just by temperature control between -25 DEG C to -26 DEG C, when do not change control temperature and Range and stop refrigeration when can by keyboard motor control switch close motor complete.Liquid crystal display include Current Temperatures, Current control temperature, range and motor switch state.

Claims (1)

1. optical instrument low temperature environment test box, it is characterised in that: the test box includes that vacuum double-layer glass is made and interior sets Layer cavity (1), middle layer cavity (2), lower layer's cavity (3) cabinet (4) and be located at the list that is connected with power supply of the cabinet (4) top Piece machine;Between the upper layer cavity (1) and the middle layer cavity (2), the middle layer cavity (2) and lower layer's cavity (3) it Between be equipped with partition, the partition be equipped with symmetrical venthole (10);The upper layer cavity (1) passes through air circulating umbilical (8) directly it is connected with lower layer's cavity (3);The side of the upper layer cavity (1) is equipped with the fan (7) of translator;On described Layer cavity (1) and the partition of middle layer cavity (2) joint are equipped with refrigerating fluid circulation pipe (6), the refrigerating fluid circulation pipe (6) External refrigeration machine (5);The side of lower layer's cavity (3) is equipped with temperature sensor (9);The single-chip microcontroller respectively with the fan (7), the temperature sensor (9) is connected, and external connection keyboard and liquid crystal display.
CN201510117445.2A 2015-03-17 2015-03-17 Optical instrument low temperature environment test box Active CN106033024B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510117445.2A CN106033024B (en) 2015-03-17 2015-03-17 Optical instrument low temperature environment test box

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510117445.2A CN106033024B (en) 2015-03-17 2015-03-17 Optical instrument low temperature environment test box

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CN106033024A CN106033024A (en) 2016-10-19
CN106033024B true CN106033024B (en) 2019-03-29

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2723019Y (en) * 2004-09-06 2005-09-07 杭州凯德空分设备有限公司 Large volume high and low temperature environment test device
CN102879278A (en) * 2012-09-14 2013-01-16 清华大学 High-low temperature dynamic cold-hot circulation thermodynamic test system

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003294797A (en) * 2002-04-05 2003-10-15 Orion Mach Co Ltd Environment testing device
JP2003294799A (en) * 2002-04-05 2003-10-15 Orion Mach Co Ltd Environment testing device
CN201034899Y (en) * 2007-03-27 2008-03-12 顾韻 High accelerating temperature changing test box
CN101963626B (en) * 2010-10-15 2012-01-25 上海科泰电源股份有限公司 Extremely low-temperature environmental test shelter
CN102156492B (en) * 2010-12-23 2013-01-09 北京航空航天大学 Temperature control system for large-space laboratory
CN202366718U (en) * 2011-12-06 2012-08-08 天津市热处理研究所有限公司 Large detachable low-temperature experimental platform
CN202606177U (en) * 2012-04-09 2012-12-19 中国人民解放军军事交通学院 Low-temperature test chamber
CN203355744U (en) * 2013-07-09 2013-12-25 广州国技试验仪器有限公司 Test box provided with independent heating channel and refrigerating channel
CN204612897U (en) * 2015-03-17 2015-09-02 中国科学院寒区旱区环境与工程研究所 Optical instrument low temperature environment test box

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2723019Y (en) * 2004-09-06 2005-09-07 杭州凯德空分设备有限公司 Large volume high and low temperature environment test device
CN102879278A (en) * 2012-09-14 2013-01-16 清华大学 High-low temperature dynamic cold-hot circulation thermodynamic test system

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Effective date of registration: 20200820

Address after: 730000 No.318, Donggang West Road, Chengguan District, Lanzhou City, Gansu Province

Patentee after: NORTHWEST INSTITUTE OF ECO-ENVIRONMENT AND RESOURCES, CAS

Address before: Chengguan District of Gansu city of Lanzhou province Donggang West Road 730000 No. 320

Patentee before: Institute of environment and Engineering in cold and dry areas, Chinese Academy of Sciences