CN106032976B - The three fringe projection phase developing methods based on wavelength selection - Google Patents
The three fringe projection phase developing methods based on wavelength selection Download PDFInfo
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Abstract
The three fringe projection phase developing methods disclosed by the invention based on wavelength selection, one group of designed stripe pattern is projected to testee using projector, and the bar graph to deform through testee surface modulation is shot by camera simultaneously, the wrapped phase figure being distributed in is obtained from deforming stripe figure, carry out phase unwrapping operation again so that phase recovery at consecutive variations absolute phase values, it is put forward for the first time that selector bar ripple is long and design parameter of the non-frequency as striped to be projected, and the mode for establishing look-up table to the simple computation of inequality carries out phase unwrapping operation to phase diagram, calculation amount is small and speed is fast, with stronger anti-interference and degree of precision, the three frequency heterodyne phase deployment algorithms used by existing most 3-D measuring apparatus that compare are more efficient, more precisely.
Description
Technical field
The present invention relates to measuring three-dimensional morphology technical field, especially a kind of three fringe projection phases based on wavelength selection
Method of deploying.
Background technique
Locating for the mankind and world that can directly perceive is three-dimensional, however existing passes through contactless acquisition object shape
The tool of looks, such as camera, video camera can only reappear object in a two-dimensional manner, inevitably will cause acquisition object
The loss of body topographical information.For the more accurate topographical information for obtaining object, quantitatively the pattern of object is described,
Must the three-dimensional appearance to object accurately measured.With modern scientific research deeply and commercial production levels it is continuous
It improves, the demand that people accurately measure object dimensional pattern is increasingly strong.
Non-contact optical measurement method is had been to be concerned by more and more people with the advantages that easy to operate, real-time, precision is high.
And the measuring three-dimensional morphology technology wherein based on digital stripe projection is its Typical Representative, has been widely used in three-dimensional biography
The numerous areas such as sense, machine vision, industrial monitoring, mechanical engineering are projected using digital stripe and carry out three-dimensional object surface pattern
The method of measurement has received widespread attention.It utilize Computer Design set of number striations, by projection device project by
Survey body surface on, then with camera by these modulated by body surface after cause deformation stripe pattern record, benefit
These deformation patterns are analyzed and processed with computer, the final three-dimensional data for obtaining body surface.This non-contacting survey
The relatively traditional measurement method of amount technology has apparent advantage, with the measurement method phase for commonly needing to contact testee
Than this method is not influenced by body surface material and appearance curved surface, directly can not be contacted or is easy particularly suitable for certain
The topography measurement of the object (such as artifact etc.) of abrasion.It is worth noting that, from the wrapped phase figure that deforming stripe obtains, it must
Phase unwrapping operation need be carried out so that phase recovery is likely at consecutive variations in conjunction with calibrating parameters acquisition body surface
Three-dimensional data.
Present primary phase method of deploying is based on multifrequency heterodyne principle, its phase unwrapping process relies primarily on not
The phase main value of same frequency raster image.The researcher of Xi'an Communications University proposes the phase using two frequency projection stripeds
Position expansion technique, the reference that low and medium frequency striped is unfolded as high-frequency fringe phase, measurement accuracy is higher, calculates simply,
It is accurate that this technology has played low frequency fringes phase diagram large scale, the accurate advantage of high frequency fringes phase diagram details, has certain
Value.
In order to further increase measuring speed, it is bigger that the researcher of Kentucky, United States university gives two frequency phase-differences
The measurement result of striped, and propose the method for obtaining accurate high and low frequency stripe information using demodulation algorithm.In two frequencies
In rate fringe phase expansion technique, if two frequency phase-differences are excessive, it will be highly susceptible to the influence of noise and distortion and go out
Mistake, the researcher of iowa,usa university propose the method for increasing intermediate frequency striped between high-frequency and low frequency striped
To carry out accurate phase unwrapping.Although this method can obtain accurate fine phase unwrapping as a result, but having used excessive
Image carry out phase unwrapping, it is inefficient, be unable to satisfy requirement of the striped topography to real-time.Also it is based on
The a plurality of line projection algorithm of frequency selection, this method set up the special pass between wrapped phase and striped order by analysis
System, can correctly recover corresponding absolute phase, acquire required for substantially reducing while guaranteeing measurement accuracy
Amount of images, but this method, which constrains larger and phase unwrapping process to stripe design, to be needed to carry out section using unifrequency striped
It divides, process is relative complex.
Summary of the invention
In order to solve the above technical problem, the present invention provides the three fringe projection phase unwrapping sides based on wavelength selection
Method, the three frequency heterodyne phase deployment algorithms used by existing most 3-D measuring apparatus that compare are more efficient, more accurate.
To achieve the goals above, the technical scheme adopted by the invention is that:
The three fringe projection phase developing methods based on wavelength selection, using striped wavelength as design projected fringe picture
Parameter, the projected fringe picture are the raster images that one group of light intensity is in Sine distribution, which is projected fringe each week
Number of pixels contained by phase projects one group of designed striped picture to testee using projector, and simultaneously by camera
It shoots through testee surface modulation and the bar graph that deformation occurs, obtains and be distributed in-π to π from deforming stripe figure
Wrapped phase figure, then phase unwrapping operation is carried out so that absolute phase values of the phase recovery at consecutive variations, specific phase exhibition
Opening step includes:
Step 1: suitable three striped wavelength (λ is selected according to projector resolution ratio R1,λ2,λ3) after, it is differed by solving
Formula creates look-up table.The gauge outfit of the look-up table of foundation includes: m1、m2、m3、m2λ2-m1λ1、m3λ3-m1λ1、m3λ3-m2λ2, wherein
m1,m2,m3For striped order needed for three absolute phases of recovery;
Above-mentioned inequality is as follows:
0≤m1< R/ λ1, 0≤m2<R/λ2, 0≤m3<R/λ3,
Wherein λ1,λ2,λ3For the wavelength of projected fringe, m1,m2,m3For restore three absolute phases needed for striped order,
φ1, φ2, φ3For wrapped phase figure;
Step 2: by with these three wavelength fringe projection to object under test on and take pictures, obtained by fringe analysis technology
Take wrapped phase figure φ1, φ2, φ3;
Step 3: needed for establishing wrapped phase figure according to the wrapped phase figure and look-up table of acquisition and carry out phase unwrapping
One-to-one relationship between striped order;Calculate [λ1φ1-λ2φ2]/2π,[λ1φ1-λ3φ3]/2π,[λ2φ2-λ3φ3]/2π
Value, i.e. m2λ2-m1λ1、m3λ3-m1λ1、m3λ3-m2λ2Value and round, sought in the look-up table that step 1 is established
Numerical value and its immediate a line are looked for, the m of colleague is recorded1,m2,m3Value;
Step 4: according to the calculation formula of absolute phase:
Wherein Φ1, Φ2, Φ3For absolute phase to be restored, the φ that will be acquired1, φ2, φ3Value and obtained m1,m2,
m3Value substitutes into above-mentioned formula and carries out phase unwrapping, restores the absolute phase of projected fringe.
Existing phase developing method is usually to select frequency as the parameter of design projected fringe, and frequency refers to throwing here
Contained striped number on shadow picture requires that frequency is integer in these algorithms, and this is not easy to meet in many occasions,
Select wavelength as design parameter in the present invention, wavelength here refers to number of pixels contained by projected fringe each period, must
It is so integer, the striped number on projection image is not necessarily to be integer at this time, will reduce the limitation to stripe design, it is easier to realize
Phase unwrapping.
In above-mentioned phase developing method, so-called suitable striped wavelength must satisfy following requirement, i.e., selected item
The long product of ripple is greater than or equal to the resolution ratio of projector divided by its common divisor:
R≤λ1λ2λ3/(k2k1k2k3),
Wherein, R is the resolution ratio of measuring three-dimensional morphology equipment projector, λ1,λ2,λ3Respectively three kinds of projected fringe are not
Co-wavelength, k are (λ1,λ2,λ3) common divisor, k1,k2,k3Respectively (λ1,λ2)、(λ1,λ3)、(λ2,λ3) pact after the k that divides out
Number.
The basis that this phase developing method is able to achieve is striped necessary to establishing wrapped phase figure and progress phase unwrapping
One-to-one relationship between order, this relationship depend on the rational design of projected fringe.Pass through theory analysis and experiment opinion
Card only just can guarantee when the resolution ratio of projector is less than or equal to selected striped wavelength product divided by its common divisor.
In above-mentioned phase developing method, when carrying out phase unwrapping operation, the picture number of required projection and shooting is minimum
9 width can be reduced to, the every projection of projector is primary, and camera shooting is primary, and it is preferable can to guarantee that phase unwrapping has simultaneously
Precision and noise immunity, project when measuring three-dimensional morphology and the reduction of shooting picture is very for certain real-time measurements dynamic measurements
It is necessary.
Beneficial effects of the present invention: the purpose of the present invention is improve the effect of the measuring three-dimensional morphology projected based on digital stripe
Rate is put forward for the first time that selector bar ripple is long and design parameter of the non-frequency as striped to be projected, and passes through the simple meter of inequality
The mode for establishing look-up table is calculated to phase diagram progress phase unwrapping operation, calculation amount is small and speed is fast, has stronger anti-interference
Property and degree of precision, the three frequency heterodyne phase deployment algorithms used by existing most 3-D measuring apparatus that compare are more efficient,
More precisely.
Detailed description of the invention
A specific embodiment of the invention is described further with reference to the accompanying drawing.
Fig. 1 is the flow chart that the present invention is applied to three dimensional shape measurement system;
Fig. 2 is wrapped phase figure acquired in the embodiment of the present invention;
Fig. 3 is the schematic diagram in the embodiment of the present invention after phase unwrapping;
Fig. 4 is the three-dimensional figure being calculated in the embodiment of the present invention.
Specific embodiment
Referring to Fig. 1, the three fringe projection phase developing methods provided by the invention based on wavelength selection, the three-dimensional shaped of use
Looks measuring system is made of a camera and a projector, using striped wavelength as the parameter of design projected fringe picture,
When measurement, one group of light intensity is projected to testee using projector and is in the stripe pattern of Sine distribution, and is clapped simultaneously by camera
The bar graph deformed through testee surface modulation is taken the photograph, the package phase being distributed in-π to π is obtained from deforming stripe figure
Bitmap, then phase unwrapping operation is carried out so that phase recovery is at the absolute phase values of consecutive variations, finally basis is demarcated in advance
System parameter combination absolute phase calculates the three-dimensional data on testee surface.
Existing phase developing method is usually to select frequency as the parameter of design projected fringe, and frequency here refers to
Contained striped number on projection image requires that frequency is integer in these algorithms, and is not easy to meet in many occasions,
And select wavelength as design parameter in the present invention, wavelength here refers to number of pixels contained by projected fringe each period,
It is necessarily integer, and the striped number on projection image is not necessarily to be integer at this time, will reduce the limitation to stripe design, it is easier to
Realize phase unwrapping.The present invention from select wavelength as design projected fringe parameter, how to select suitable striped wavelength and
How relationship one-to-one between wrapped phase figure and striped order is realized by way of creating look-up table in terms of three
Design scheme solves technical problem.
A kind of preferred embodiment is wherein enumerated to be described in detail:
One, three satisfactory striped wavelength (λ are selected1,λ2,λ3), and look-up table as described below is established, such as when
(λ1,λ2,λ3)=(90,72,54), when R=1024, wherein y is pixel coordinate, establish following look-up table:
Two, by with these three wavelength fringe projection to object under test on and take pictures, obtained by fringe analysis technology
Wrapped phase figure φ1, φ2, φ3, as shown in Fig. 2;
Three, [λ is calculated1φ1-λ2φ2]/2π,[λ1φ1-λ3φ3]/2π,[λ2φ2-λ3φ3The value of the π of]/2, i.e. calculating m2λ2-
m1λ1、m3λ3-m1λ1、m3λ3-m2λ2Value and round, in the look-up table that the first step is established find numerical value and its
Immediate a line records the m of colleague1,m2,m3Value;
Four, according to the calculation formula of absolute phase:
By the φ of calculating1, φ2, φ3Value and obtained m1,m2,m3Value carries out phase unwrapping, as shown in Fig. 3;
Five, in conjunction with the calibrating parameters of three dimensional shape measurement system and more than the absolute phase that finds out, determinand can be recovered
The three-dimensional appearance of body, as shown in Fig. 4.
In above-mentioned phase developing method, in order to select suitable striped wavelength, it is desirable that selected striped wavelength multiplies
Product is divided by the resolution ratio needed after its common divisor more than or equal to projector:
R≤λ1λ2λ3/(k2k1k2k3),
Wherein, R is the resolution ratio of measuring three-dimensional morphology equipment projector, λ1,λ2,λ3Respectively three kinds of projected fringe are not
Co-wavelength, k are (λ1,λ2,λ3) common divisor, k1,k2,k3Respectively (λ1,λ2)、(λ1,λ3)、(λ2,λ3) pact after the k that divides out
Number.
The basis that this phase developing method is able to achieve is striped necessary to establishing wrapped phase figure and progress phase unwrapping
One-to-one relationship between order, this relationship depend on the rational design of projected fringe.Pass through theory analysis and experiment opinion
Card only just can guarantee when the resolution ratio of projector is less than or equal to selected striped wavelength product divided by its common divisor.
Preferably, when carrying out phase unwrapping operation, the picture number of required projection and shooting can at least reduce to 9 width, described
The every projection of projector is primary, and camera shooting is primary, can guarantee that phase unwrapping has preferable precision and a noise immunity simultaneously, and three
It is projected when tieing up topography measurement and the reduction of shooting picture is very important for certain real-time measurement dynamic measurements.
The three fringe projection phase developing methods based on wavelength selection can be widely applied to various based on digital light projection
Measuring three-dimensional morphology equipment in, the equipment that especially has higher requirements to precision and noise immunity, it is therefore an objective to improve based on number
The efficiency of the measuring three-dimensional morphology of fringe projection.It is put forward for the first time that selector bar ripple is long and design of the non-frequency as striped to be projected
Parameter, and phase unwrapping operation, calculation amount are carried out to phase diagram in such a way that the simple computation to inequality establishes look-up table
Small and speed is fast, has stronger anti-interference and degree of precision, compares used by existing most 3-D measuring apparatus
Three frequency heterodyne phase deployment algorithms are more efficient, more accurate.
The above, only presently preferred embodiments of the present invention, the invention is not limited to above embodiment, as long as
It reaches technical effect of the invention with identical means, all should belong to protection scope of the present invention.
Claims (3)
1. the three fringe projection phase developing methods based on wavelength selection, it is characterised in that: projected using striped wavelength as design
The parameter of striped picture, the projected fringe picture are the raster images that one group of light intensity is in Sine distribution, which is projection
Number of pixels contained by striped each period, using projector to testee one group of designed striped picture of projection, and by
Camera is shot through testee surface modulation and the bar graph that deformation occurs simultaneously, is obtained from deforming stripe figure and is distributed in-π
To the wrapped phase figure between π, then carry out phase unwrapping operation so that phase recovery at consecutive variations absolute phase values, specifically
Phase unwrapping step include:
Step 1: suitable three striped wavelength (λ is selected according to projector resolution ratio R1,λ2,λ3) after, by solving inequality wound
Look-up table is built, the gauge outfit of the look-up table of foundation includes: m1、m2、m3、m2λ2-m1λ1、m3λ3-m1λ1、m3λ3-m2λ2, wherein m1,m2,
m3For striped order needed for three absolute phases of recovery;
Above-mentioned inequality is as follows:
0≤m1<R/λ1, 0≤m2<R/λ2, 0≤m3<R/λ3,
Wherein λ1,λ2,λ3For the wavelength of projected fringe, m1,m2,m3For striped order needed for three absolute phases of recovery, φ1,
φ2, φ3For wrapped phase figure;
Step 2: by with these three wavelength fringe projection to object under test on and take pictures, pass through fringe analysis technology obtain packet
Wrap up in phase diagram φ1, φ2, φ3;
Step 3: striped needed for establishing wrapped phase figure according to the wrapped phase figure and look-up table of acquisition and carry out phase unwrapping
One-to-one relationship between order;Calculate [λ1φ1-λ2φ2]/2π,[λ1φ1-λ3φ3]/2π,[λ2φ2-λ3φ3The π's of]/2
Value, i.e. m2λ2-m1λ1、m3λ3-m1λ1、m3λ3-m2λ2Value and round, found in the look-up table that step 1 is established
Numerical value and its immediate a line, record the m of colleague1,m2,m3Value;
Step 4: according to the calculation formula of absolute phase:
Wherein Φ1, Φ2, Φ3For absolute phase to be restored, the φ that will be acquired1, φ2, φ3Value and obtained m1,m2,m3Value
It substitutes into above-mentioned formula and carries out phase unwrapping, restore the absolute phase of projected fringe.
2. the three fringe projection phase developing methods according to claim 1 based on wavelength selection, it is characterised in that: by institute
The product of the striped wavelength of selection is greater than or equal to the resolution ratio of projector divided by its common divisor:
R≤λ1λ2λ3/(k2k1k2k3),
Wherein, R is the resolution ratio of measuring three-dimensional morphology equipment projector, λ1,λ2,λ3Respectively three kinds of different waves of projected fringe
Long, k is (λ1,λ2,λ3) common divisor, k1,k2,k3Respectively (λ1,λ2)、(λ1,λ3)、(λ2,λ3) common divisor after the k that divides out.
3. the three fringe projection phase developing methods according to claim 1 based on wavelength selection, it is characterised in that: into
The picture number of required projection and shooting can at least reduce to 9 width when the operation of row phase unwrapping, and the every projection of projector is primary, photograph
Camera shooting is primary.
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