CN106032976B - The three fringe projection phase developing methods based on wavelength selection - Google Patents

The three fringe projection phase developing methods based on wavelength selection Download PDF

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CN106032976B
CN106032976B CN201510125180.0A CN201510125180A CN106032976B CN 106032976 B CN106032976 B CN 106032976B CN 201510125180 A CN201510125180 A CN 201510125180A CN 106032976 B CN106032976 B CN 106032976B
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phase
striped
fringe
wavelength
projection
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CN106032976A (en
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龙佳乐
张建民
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Wuyi University
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Abstract

The three fringe projection phase developing methods disclosed by the invention based on wavelength selection, one group of designed stripe pattern is projected to testee using projector, and the bar graph to deform through testee surface modulation is shot by camera simultaneously, the wrapped phase figure being distributed in is obtained from deforming stripe figure, carry out phase unwrapping operation again so that phase recovery at consecutive variations absolute phase values, it is put forward for the first time that selector bar ripple is long and design parameter of the non-frequency as striped to be projected, and the mode for establishing look-up table to the simple computation of inequality carries out phase unwrapping operation to phase diagram, calculation amount is small and speed is fast, with stronger anti-interference and degree of precision, the three frequency heterodyne phase deployment algorithms used by existing most 3-D measuring apparatus that compare are more efficient, more precisely.

Description

The three fringe projection phase developing methods based on wavelength selection
Technical field
The present invention relates to measuring three-dimensional morphology technical field, especially a kind of three fringe projection phases based on wavelength selection Method of deploying.
Background technique
Locating for the mankind and world that can directly perceive is three-dimensional, however existing passes through contactless acquisition object shape The tool of looks, such as camera, video camera can only reappear object in a two-dimensional manner, inevitably will cause acquisition object The loss of body topographical information.For the more accurate topographical information for obtaining object, quantitatively the pattern of object is described, Must the three-dimensional appearance to object accurately measured.With modern scientific research deeply and commercial production levels it is continuous It improves, the demand that people accurately measure object dimensional pattern is increasingly strong.
Non-contact optical measurement method is had been to be concerned by more and more people with the advantages that easy to operate, real-time, precision is high. And the measuring three-dimensional morphology technology wherein based on digital stripe projection is its Typical Representative, has been widely used in three-dimensional biography The numerous areas such as sense, machine vision, industrial monitoring, mechanical engineering are projected using digital stripe and carry out three-dimensional object surface pattern The method of measurement has received widespread attention.It utilize Computer Design set of number striations, by projection device project by Survey body surface on, then with camera by these modulated by body surface after cause deformation stripe pattern record, benefit These deformation patterns are analyzed and processed with computer, the final three-dimensional data for obtaining body surface.This non-contacting survey The relatively traditional measurement method of amount technology has apparent advantage, with the measurement method phase for commonly needing to contact testee Than this method is not influenced by body surface material and appearance curved surface, directly can not be contacted or is easy particularly suitable for certain The topography measurement of the object (such as artifact etc.) of abrasion.It is worth noting that, from the wrapped phase figure that deforming stripe obtains, it must Phase unwrapping operation need be carried out so that phase recovery is likely at consecutive variations in conjunction with calibrating parameters acquisition body surface Three-dimensional data.
Present primary phase method of deploying is based on multifrequency heterodyne principle, its phase unwrapping process relies primarily on not The phase main value of same frequency raster image.The researcher of Xi'an Communications University proposes the phase using two frequency projection stripeds Position expansion technique, the reference that low and medium frequency striped is unfolded as high-frequency fringe phase, measurement accuracy is higher, calculates simply, It is accurate that this technology has played low frequency fringes phase diagram large scale, the accurate advantage of high frequency fringes phase diagram details, has certain Value.
In order to further increase measuring speed, it is bigger that the researcher of Kentucky, United States university gives two frequency phase-differences The measurement result of striped, and propose the method for obtaining accurate high and low frequency stripe information using demodulation algorithm.In two frequencies In rate fringe phase expansion technique, if two frequency phase-differences are excessive, it will be highly susceptible to the influence of noise and distortion and go out Mistake, the researcher of iowa,usa university propose the method for increasing intermediate frequency striped between high-frequency and low frequency striped To carry out accurate phase unwrapping.Although this method can obtain accurate fine phase unwrapping as a result, but having used excessive Image carry out phase unwrapping, it is inefficient, be unable to satisfy requirement of the striped topography to real-time.Also it is based on The a plurality of line projection algorithm of frequency selection, this method set up the special pass between wrapped phase and striped order by analysis System, can correctly recover corresponding absolute phase, acquire required for substantially reducing while guaranteeing measurement accuracy Amount of images, but this method, which constrains larger and phase unwrapping process to stripe design, to be needed to carry out section using unifrequency striped It divides, process is relative complex.
Summary of the invention
In order to solve the above technical problem, the present invention provides the three fringe projection phase unwrapping sides based on wavelength selection Method, the three frequency heterodyne phase deployment algorithms used by existing most 3-D measuring apparatus that compare are more efficient, more accurate.
To achieve the goals above, the technical scheme adopted by the invention is that:
The three fringe projection phase developing methods based on wavelength selection, using striped wavelength as design projected fringe picture Parameter, the projected fringe picture are the raster images that one group of light intensity is in Sine distribution, which is projected fringe each week Number of pixels contained by phase projects one group of designed striped picture to testee using projector, and simultaneously by camera It shoots through testee surface modulation and the bar graph that deformation occurs, obtains and be distributed in-π to π from deforming stripe figure Wrapped phase figure, then phase unwrapping operation is carried out so that absolute phase values of the phase recovery at consecutive variations, specific phase exhibition Opening step includes:
Step 1: suitable three striped wavelength (λ is selected according to projector resolution ratio R123) after, it is differed by solving Formula creates look-up table.The gauge outfit of the look-up table of foundation includes: m1、m2、m3、m2λ2-m1λ1、m3λ3-m1λ1、m3λ3-m2λ2, wherein m1,m2,m3For striped order needed for three absolute phases of recovery;
Above-mentioned inequality is as follows:
0≤m1< R/ λ1, 0≤m2<R/λ2, 0≤m3<R/λ3,
Wherein λ123For the wavelength of projected fringe, m1,m2,m3For restore three absolute phases needed for striped order, φ1, φ2, φ3For wrapped phase figure;
Step 2: by with these three wavelength fringe projection to object under test on and take pictures, obtained by fringe analysis technology Take wrapped phase figure φ1, φ2, φ3
Step 3: needed for establishing wrapped phase figure according to the wrapped phase figure and look-up table of acquisition and carry out phase unwrapping One-to-one relationship between striped order;Calculate [λ1φ12φ2]/2π,[λ1φ13φ3]/2π,[λ2φ23φ3]/2π Value, i.e. m2λ2-m1λ1、m3λ3-m1λ1、m3λ3-m2λ2Value and round, sought in the look-up table that step 1 is established Numerical value and its immediate a line are looked for, the m of colleague is recorded1,m2,m3Value;
Step 4: according to the calculation formula of absolute phase:
Wherein Φ1, Φ2, Φ3For absolute phase to be restored, the φ that will be acquired1, φ2, φ3Value and obtained m1,m2, m3Value substitutes into above-mentioned formula and carries out phase unwrapping, restores the absolute phase of projected fringe.
Existing phase developing method is usually to select frequency as the parameter of design projected fringe, and frequency refers to throwing here Contained striped number on shadow picture requires that frequency is integer in these algorithms, and this is not easy to meet in many occasions, Select wavelength as design parameter in the present invention, wavelength here refers to number of pixels contained by projected fringe each period, must It is so integer, the striped number on projection image is not necessarily to be integer at this time, will reduce the limitation to stripe design, it is easier to realize Phase unwrapping.
In above-mentioned phase developing method, so-called suitable striped wavelength must satisfy following requirement, i.e., selected item The long product of ripple is greater than or equal to the resolution ratio of projector divided by its common divisor:
R≤λ1λ2λ3/(k2k1k2k3),
Wherein, R is the resolution ratio of measuring three-dimensional morphology equipment projector, λ123Respectively three kinds of projected fringe are not Co-wavelength, k are (λ123) common divisor, k1,k2,k3Respectively (λ12)、(λ13)、(λ23) pact after the k that divides out Number.
The basis that this phase developing method is able to achieve is striped necessary to establishing wrapped phase figure and progress phase unwrapping One-to-one relationship between order, this relationship depend on the rational design of projected fringe.Pass through theory analysis and experiment opinion Card only just can guarantee when the resolution ratio of projector is less than or equal to selected striped wavelength product divided by its common divisor.
In above-mentioned phase developing method, when carrying out phase unwrapping operation, the picture number of required projection and shooting is minimum 9 width can be reduced to, the every projection of projector is primary, and camera shooting is primary, and it is preferable can to guarantee that phase unwrapping has simultaneously Precision and noise immunity, project when measuring three-dimensional morphology and the reduction of shooting picture is very for certain real-time measurements dynamic measurements It is necessary.
Beneficial effects of the present invention: the purpose of the present invention is improve the effect of the measuring three-dimensional morphology projected based on digital stripe Rate is put forward for the first time that selector bar ripple is long and design parameter of the non-frequency as striped to be projected, and passes through the simple meter of inequality The mode for establishing look-up table is calculated to phase diagram progress phase unwrapping operation, calculation amount is small and speed is fast, has stronger anti-interference Property and degree of precision, the three frequency heterodyne phase deployment algorithms used by existing most 3-D measuring apparatus that compare are more efficient, More precisely.
Detailed description of the invention
A specific embodiment of the invention is described further with reference to the accompanying drawing.
Fig. 1 is the flow chart that the present invention is applied to three dimensional shape measurement system;
Fig. 2 is wrapped phase figure acquired in the embodiment of the present invention;
Fig. 3 is the schematic diagram in the embodiment of the present invention after phase unwrapping;
Fig. 4 is the three-dimensional figure being calculated in the embodiment of the present invention.
Specific embodiment
Referring to Fig. 1, the three fringe projection phase developing methods provided by the invention based on wavelength selection, the three-dimensional shaped of use Looks measuring system is made of a camera and a projector, using striped wavelength as the parameter of design projected fringe picture, When measurement, one group of light intensity is projected to testee using projector and is in the stripe pattern of Sine distribution, and is clapped simultaneously by camera The bar graph deformed through testee surface modulation is taken the photograph, the package phase being distributed in-π to π is obtained from deforming stripe figure Bitmap, then phase unwrapping operation is carried out so that phase recovery is at the absolute phase values of consecutive variations, finally basis is demarcated in advance System parameter combination absolute phase calculates the three-dimensional data on testee surface.
Existing phase developing method is usually to select frequency as the parameter of design projected fringe, and frequency here refers to Contained striped number on projection image requires that frequency is integer in these algorithms, and is not easy to meet in many occasions, And select wavelength as design parameter in the present invention, wavelength here refers to number of pixels contained by projected fringe each period, It is necessarily integer, and the striped number on projection image is not necessarily to be integer at this time, will reduce the limitation to stripe design, it is easier to Realize phase unwrapping.The present invention from select wavelength as design projected fringe parameter, how to select suitable striped wavelength and How relationship one-to-one between wrapped phase figure and striped order is realized by way of creating look-up table in terms of three Design scheme solves technical problem.
A kind of preferred embodiment is wherein enumerated to be described in detail:
One, three satisfactory striped wavelength (λ are selected123), and look-up table as described below is established, such as when (λ123)=(90,72,54), when R=1024, wherein y is pixel coordinate, establish following look-up table:
Two, by with these three wavelength fringe projection to object under test on and take pictures, obtained by fringe analysis technology Wrapped phase figure φ1, φ2, φ3, as shown in Fig. 2;
Three, [λ is calculated1φ12φ2]/2π,[λ1φ13φ3]/2π,[λ2φ23φ3The value of the π of]/2, i.e. calculating m2λ2- m1λ1、m3λ3-m1λ1、m3λ3-m2λ2Value and round, in the look-up table that the first step is established find numerical value and its Immediate a line records the m of colleague1,m2,m3Value;
Four, according to the calculation formula of absolute phase:
By the φ of calculating1, φ2, φ3Value and obtained m1,m2,m3Value carries out phase unwrapping, as shown in Fig. 3;
Five, in conjunction with the calibrating parameters of three dimensional shape measurement system and more than the absolute phase that finds out, determinand can be recovered The three-dimensional appearance of body, as shown in Fig. 4.
In above-mentioned phase developing method, in order to select suitable striped wavelength, it is desirable that selected striped wavelength multiplies Product is divided by the resolution ratio needed after its common divisor more than or equal to projector:
R≤λ1λ2λ3/(k2k1k2k3),
Wherein, R is the resolution ratio of measuring three-dimensional morphology equipment projector, λ123Respectively three kinds of projected fringe are not Co-wavelength, k are (λ123) common divisor, k1,k2,k3Respectively (λ12)、(λ13)、(λ23) pact after the k that divides out Number.
The basis that this phase developing method is able to achieve is striped necessary to establishing wrapped phase figure and progress phase unwrapping One-to-one relationship between order, this relationship depend on the rational design of projected fringe.Pass through theory analysis and experiment opinion Card only just can guarantee when the resolution ratio of projector is less than or equal to selected striped wavelength product divided by its common divisor.
Preferably, when carrying out phase unwrapping operation, the picture number of required projection and shooting can at least reduce to 9 width, described The every projection of projector is primary, and camera shooting is primary, can guarantee that phase unwrapping has preferable precision and a noise immunity simultaneously, and three It is projected when tieing up topography measurement and the reduction of shooting picture is very important for certain real-time measurement dynamic measurements.
The three fringe projection phase developing methods based on wavelength selection can be widely applied to various based on digital light projection Measuring three-dimensional morphology equipment in, the equipment that especially has higher requirements to precision and noise immunity, it is therefore an objective to improve based on number The efficiency of the measuring three-dimensional morphology of fringe projection.It is put forward for the first time that selector bar ripple is long and design of the non-frequency as striped to be projected Parameter, and phase unwrapping operation, calculation amount are carried out to phase diagram in such a way that the simple computation to inequality establishes look-up table Small and speed is fast, has stronger anti-interference and degree of precision, compares used by existing most 3-D measuring apparatus Three frequency heterodyne phase deployment algorithms are more efficient, more accurate.
The above, only presently preferred embodiments of the present invention, the invention is not limited to above embodiment, as long as It reaches technical effect of the invention with identical means, all should belong to protection scope of the present invention.

Claims (3)

1. the three fringe projection phase developing methods based on wavelength selection, it is characterised in that: projected using striped wavelength as design The parameter of striped picture, the projected fringe picture are the raster images that one group of light intensity is in Sine distribution, which is projection Number of pixels contained by striped each period, using projector to testee one group of designed striped picture of projection, and by Camera is shot through testee surface modulation and the bar graph that deformation occurs simultaneously, is obtained from deforming stripe figure and is distributed in-π To the wrapped phase figure between π, then carry out phase unwrapping operation so that phase recovery at consecutive variations absolute phase values, specifically Phase unwrapping step include:
Step 1: suitable three striped wavelength (λ is selected according to projector resolution ratio R123) after, by solving inequality wound Look-up table is built, the gauge outfit of the look-up table of foundation includes: m1、m2、m3、m2λ2-m1λ1、m3λ3-m1λ1、m3λ3-m2λ2, wherein m1,m2, m3For striped order needed for three absolute phases of recovery;
Above-mentioned inequality is as follows:
0≤m1<R/λ1, 0≤m2<R/λ2, 0≤m3<R/λ3,
Wherein λ123For the wavelength of projected fringe, m1,m2,m3For striped order needed for three absolute phases of recovery, φ1, φ2, φ3For wrapped phase figure;
Step 2: by with these three wavelength fringe projection to object under test on and take pictures, pass through fringe analysis technology obtain packet Wrap up in phase diagram φ1, φ2, φ3
Step 3: striped needed for establishing wrapped phase figure according to the wrapped phase figure and look-up table of acquisition and carry out phase unwrapping One-to-one relationship between order;Calculate [λ1φ12φ2]/2π,[λ1φ13φ3]/2π,[λ2φ23φ3The π's of]/2 Value, i.e. m2λ2-m1λ1、m3λ3-m1λ1、m3λ3-m2λ2Value and round, found in the look-up table that step 1 is established Numerical value and its immediate a line, record the m of colleague1,m2,m3Value;
Step 4: according to the calculation formula of absolute phase:
Wherein Φ1, Φ2, Φ3For absolute phase to be restored, the φ that will be acquired1, φ2, φ3Value and obtained m1,m2,m3Value It substitutes into above-mentioned formula and carries out phase unwrapping, restore the absolute phase of projected fringe.
2. the three fringe projection phase developing methods according to claim 1 based on wavelength selection, it is characterised in that: by institute The product of the striped wavelength of selection is greater than or equal to the resolution ratio of projector divided by its common divisor:
R≤λ1λ2λ3/(k2k1k2k3),
Wherein, R is the resolution ratio of measuring three-dimensional morphology equipment projector, λ123Respectively three kinds of different waves of projected fringe Long, k is (λ123) common divisor, k1,k2,k3Respectively (λ12)、(λ13)、(λ23) common divisor after the k that divides out.
3. the three fringe projection phase developing methods according to claim 1 based on wavelength selection, it is characterised in that: into The picture number of required projection and shooting can at least reduce to 9 width when the operation of row phase unwrapping, and the every projection of projector is primary, photograph Camera shooting is primary.
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Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109211140B (en) * 2018-08-07 2020-12-08 广东奥普特科技股份有限公司 Structured light phase unwrapping method based on mathematical analysis
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CN110006365B (en) * 2019-04-15 2020-06-02 四川大学 Phase unwrapping method and device based on two-dimensional lookup table and electronic equipment
CN110942438B (en) * 2019-12-05 2023-05-02 五邑大学 Absolute phase noise removing method and device based on fringe projection
CN111161169B (en) * 2019-12-20 2023-06-13 五邑大学 Absolute phase noise removing method and device based on Hough transform and storage medium
CN111207697B (en) * 2020-01-17 2021-07-02 四川大学 Phase and modulation acquisition method and device based on lookup table and electronic equipment
WO2021139759A1 (en) * 2020-01-08 2021-07-15 四川大学 Grouping look-up table based high-frequency phase decoding method and apparatus and electronic device
CN111241317B (en) * 2020-01-08 2022-03-11 四川大学 Phase and modulation information acquisition method based on multiple two-dimensional lookup tables
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CN113743579B (en) * 2021-07-26 2024-03-01 东莞理工学院 Three-wavelength phase unwrapping method, system, equipment and medium based on deep learning

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101813461A (en) * 2010-04-07 2010-08-25 河北工业大学 Absolute phase measurement method based on composite color fringe projection
CN102322822A (en) * 2011-08-08 2012-01-18 西安交通大学 Three-dimensional measurement method for triple-frequency color fringe projection
CN103759673A (en) * 2014-01-21 2014-04-30 南京理工大学 Time phase unwrapping method based on double frequency three-gray-scale sinusoidal grating fringe projection
CN104215200A (en) * 2013-04-30 2014-12-17 埃梅斯服务有限责任公司 Device and method for the simultaneous three-dimensional measurement of surfaces with several wavelengths
CN104330052A (en) * 2014-11-21 2015-02-04 天津工业大学 Heterodyne three-frequency unequal range phase displacement solution phase method

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003042734A (en) * 2001-07-31 2003-02-13 Ricoh Co Ltd Method and apparatus for measurement of surface shape

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101813461A (en) * 2010-04-07 2010-08-25 河北工业大学 Absolute phase measurement method based on composite color fringe projection
CN102322822A (en) * 2011-08-08 2012-01-18 西安交通大学 Three-dimensional measurement method for triple-frequency color fringe projection
CN104215200A (en) * 2013-04-30 2014-12-17 埃梅斯服务有限责任公司 Device and method for the simultaneous three-dimensional measurement of surfaces with several wavelengths
CN103759673A (en) * 2014-01-21 2014-04-30 南京理工大学 Time phase unwrapping method based on double frequency three-gray-scale sinusoidal grating fringe projection
CN104330052A (en) * 2014-11-21 2015-02-04 天津工业大学 Heterodyne three-frequency unequal range phase displacement solution phase method

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Absolute phase map recovery of two fringe patterns with flexible selection of fringe wavelengths;Jiale Long;《Applied Optics》;20140320;第53卷(第9期);第1794-1800页第1-5节 *
基于数字条纹投影的三维形貌测量技术研究与实现;龙佳乐等;《现代电子技术》;20131201;第36卷(第23期);第99-102页 *

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