CN106019122B - 基于测点距离的飞针测试机运动的控制方法及装置 - Google Patents
基于测点距离的飞针测试机运动的控制方法及装置 Download PDFInfo
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- CN106019122B CN106019122B CN201610318780.3A CN201610318780A CN106019122B CN 106019122 B CN106019122 B CN 106019122B CN 201610318780 A CN201610318780 A CN 201610318780A CN 106019122 B CN106019122 B CN 106019122B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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- Length Measuring Devices With Unspecified Measuring Means (AREA)
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CN201610318780.3A CN106019122B (zh) | 2016-05-13 | 2016-05-13 | 基于测点距离的飞针测试机运动的控制方法及装置 |
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CN201610318780.3A CN106019122B (zh) | 2016-05-13 | 2016-05-13 | 基于测点距离的飞针测试机运动的控制方法及装置 |
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CN106019122A CN106019122A (zh) | 2016-10-12 |
CN106019122B true CN106019122B (zh) | 2019-06-14 |
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CN109143020B (zh) * | 2017-06-28 | 2020-10-16 | 深圳市大族数控科技有限公司 | 一种pcb板测试方法、装置及测试设备 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4922583B2 (ja) * | 2005-08-15 | 2012-04-25 | 株式会社アルバック | 表面形状測定用触針式段差計の摩擦力補正方法 |
CN103185725A (zh) * | 2012-12-12 | 2013-07-03 | 捷创科技股份有限公司 | Led晶圆多晶粒检测方法及装置 |
CN103822603A (zh) * | 2007-02-22 | 2014-05-28 | 瑞尼斯豪公司 | 校准方法和设备 |
CN104181448A (zh) * | 2014-08-13 | 2014-12-03 | 华进半导体封装先导技术研发中心有限公司 | 一种硅通孔转接板晶圆测试系统和硅通孔转接板晶圆测试方法 |
Family Cites Families (1)
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JP3391617B2 (ja) * | 1995-12-26 | 2003-03-31 | 日置電機株式会社 | X−y方式インサーキットテスタのタイミングベルト駆動によるプロービング方法 |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4922583B2 (ja) * | 2005-08-15 | 2012-04-25 | 株式会社アルバック | 表面形状測定用触針式段差計の摩擦力補正方法 |
CN103822603A (zh) * | 2007-02-22 | 2014-05-28 | 瑞尼斯豪公司 | 校准方法和设备 |
CN103185725A (zh) * | 2012-12-12 | 2013-07-03 | 捷创科技股份有限公司 | Led晶圆多晶粒检测方法及装置 |
CN104181448A (zh) * | 2014-08-13 | 2014-12-03 | 华进半导体封装先导技术研发中心有限公司 | 一种硅通孔转接板晶圆测试系统和硅通孔转接板晶圆测试方法 |
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Address after: 518000 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee after: Shenzhen Han's CNC Technology Co.,Ltd. Address before: 518000 5 / F, 1 / 2 / F, 14 / F, 17 / F, No.3 Factory building, antuoshan hi tech Industrial Park, Xinsha Road, Shajing street, Bao'an District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN HAN'S CNC SCIENCE AND TECHNOLOGY Co.,Ltd. |
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