CN105988065B - A kind of Orbital detection device of satellite deep layer medium charge and discharge - Google Patents
A kind of Orbital detection device of satellite deep layer medium charge and discharge Download PDFInfo
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- CN105988065B CN105988065B CN201510044167.2A CN201510044167A CN105988065B CN 105988065 B CN105988065 B CN 105988065B CN 201510044167 A CN201510044167 A CN 201510044167A CN 105988065 B CN105988065 B CN 105988065B
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Abstract
A kind of Orbital detection device of satellite deep layer medium charge and discharge, it include: casing, ungrounded conductor testpieces, plating media testpieces, band shields coaxial testpieces, the coaxial testpieces of unmasked, test device barricade, load resistance and electronics, the wherein ungrounded conductor testpieces, plating media testpieces, the ungrounded conductor that the electronic system of analog satellite is included is respectively used to the coaxial testpieces of shielding and the coaxial testpieces of unmasked, printed circuit board and various wire sleeves, the ungrounded conductor testpieces is formed and the two-sided plating metal in plate dielectric, and its one side is connected by load resistance with casing, and it is connected by conducting wire with electronics.
Description
Technical field
The present invention relates to satellite protection field more particularly to a kind of satellite deep layer medium charge and discharges for middle high orbit satellite
The Orbital detection device of electricity.
Background technique
Inside (deep layer) medium or earth-free conductor of satellite will form similar due to the effect by Energetic particle
It accumulates, can be made in inside satellite medium in the satellite Deep media charging namely space charged particle of the electrostatic charging on ground
At the charge accumulated of media interior to form the big electricity between non-uniform electric field or medium and ambient enviroment in media interior
Potential difference.It is more than threshold value when the electric field strength of media interior is more than potential difference between material threshold or medium and ambient enviroment,
It will cause Discharge Phenomena between inside satellite medium different piece, the i.e. static discharge such as ground.Static discharge can be released
Current impulse, electromagnetic pulse and thermal pulse are released, current impulse and electromagnetic pulse all can directly or indirectly be coupled into satellite electricity
Sub- system, interference even injury safety satellite.Therefore, it is necessary to carry out the test of satellite deep layer medium charge and discharge, for obtaining
The degree of danger of satellite deep layer medium charge and discharge, to provide foundation for the in-orbit management of satellite and fault diagnosis.
The charge and discharge of satellite deep layer medium can be tested using several method, such as: measurement Space Particle spectroscopy,
Space Particle discharge method, measuring medium charging potential method and measurement static discharge method etc. are measured, satellite can be correspondingly obtained
The feature of deep layer medium charge and discharge, but current method all lacks the charge-discharge characteristics of the different medium for inside satellite
Measurement, it is therefore desirable to develop the test that a kind of corresponding test device is used to carry out satellite in orbit deep layer medium charge and discharge.
Summary of the invention
It is an object of the present invention to above-mentioned present in the Orbital detection of the charge and discharge of present satellites deep layer medium to solve
Problem, the present invention provides a kind of Orbital detection device of satellite deep layer medium charge and discharge, for satellite due to by space high energy grain
It can make inside satellite medium electrostatic charging, the satellite of especially middle high orbit, since space environment changes after son effect charging
It is fierce and occur that interior media electrostatic charging, electric discharge phenomena frequently.The present invention using four class testpieces come analog satellite other
Conducting wire and printed circuit board in electronic system by irradiation situation, pass through the discharge current arteries and veins of measurement satellite deep layer medium
Punching, to provide due to medium discharge feature caused by Deep media charging in satellite, this method is particularly suitable for middle height
The satellite of track.
The Orbital detection device of a kind of satellite deep layer medium charge and discharge according to the present invention, comprising: casing, ungrounded conductor
Testpieces, plating media testpieces, band shield coaxial testpieces, the coaxial testpieces of unmasked, test device barricade, load electricity
Resistance and electronics, wherein the ungrounded conductor testpieces, plating media testpieces, band shield coaxial testpieces and non-screen
It covers coaxial testpieces and is respectively used to ungrounded conductor, printed circuit board and various conducting wires that the electronic system of analog satellite is included
Set, the ungrounded conductor testpieces is formed and the two-sided plating metal in plate dielectric, and it passes through load on one side
Resistance is connected with casing, and is connected by conducting wire with electronics；The plating media testpieces is situated between by insulating in plate
The one side plating metal of matter and formed, which is connected by load resistance with casing, and passes through conducting wire and electronics
It is connected；It is the concentric conductor component that surface has metallic shield that the band, which shields coaxial testpieces, and core wire passes through load resistance
It is connected with casing, and is connected by conducting wire with electronics；The coaxial testpieces of unmasked is surface without metallic shield
Concentric conductor component, core wire is connected by load resistance with casing, and is passed through conducting wire and be connected with electronics；The survey
Trial assembly is set barricade and is mounted on casing, is shielded for analog satellite electronic system, can be simulated by adjusting its thickness
Satellite deep layer medium charge and discharge threat degree in satellite at different location.
According to one embodiment of present invention, the material of the plating media testpieces in test device can be each in satellite
The material of class substrate for printed circuit board or wire sleeve.
According to one embodiment of present invention, the resistance value of load resistance is greater than or equal to 1 Ω and is less than 1G Ω, to avoid survey
It is excessive to measure electric current, while avoiding current signal too small.
According to one embodiment of present invention, the thickness of test device barricade is not more than 5mm, to avoid due to blocking too
It is thick and cannot achieve test, and be metal plate, to avoid test device barricade charges and makes the interference of pairwise testing.
According to one embodiment of present invention, test device is mounted within satellite covering, test device barricade and illiteracy
Shelter is free of between skin, is not had shelter except the corresponding satellite covering of test device, is reduced survey to avoid due to blocking
Try effect.
According to one embodiment of present invention, test device also includes satellite interface circuit, for carrying out with satellite bus
Data communication.
The advantages of satellite deep layer medium discharge Orbital detection device of the invention, is: may be implemented to satellite deep layer medium
The test of charge and discharge, while avoiding proposing satellite platform part excessive require to reduce application range.
There is satellite deep layer medium discharge Orbital detection device of the invention simple opposed configuration, clear principle, installation to want
Seek low feature.It may be mounted on all kinds of satellites of middle high orbit, for testing satellite deep layer medium discharge.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of satellite deep layer medium charge and discharge Orbital detection device of the invention.
Fig. 2 be Fig. 1 along A-A to sectional view.
Fig. 3 is the sectional view along B-B direction of Fig. 1.
Fig. 4 is the functional block diagram according to the electronics of the test device of one embodiment of the present of invention.
Appended drawing reference
1, casing 2, ungrounded conductor testpieces 3, plating media testpieces
4, band shields coaxial testpieces 5, the coaxial testpieces 6 of unmasked, test device barricade
7, load resistance 8, electronics
Specific embodiment
Satellite deep layer medium charge and discharge Orbital detection device of the present invention is carried out with reference to the accompanying drawings and examples
It is described in detail.
Fig. 1 is the structural schematic diagram of satellite deep layer medium charge and discharge Orbital detection device of the invention.Fig. 2 is the edge of Fig. 1
A-A to sectional view.Fig. 3 is the sectional view along B-B direction of Fig. 1.To solve the problems, such as that prior art, the present invention provide
A kind of satellite deep layer medium charge and discharge Orbital detection device, comprising: casing 1, ungrounded conductor testpieces 2, plating media test
Part 3, band shield coaxial testpieces 4, the coaxial testpieces 5 of unmasked, test device barricade 6, load resistance 7 and electronics
8.Ungrounded conductor testpieces 2 is in the two-sided gold-plated metal elements of plate dielectric, and single side passes through load resistance 7 and 1 phase of casing
Even, and by conducting wire it is connected with electronics 8；The plating media testpieces 3 is in plate dielectric single side plating metal
Building, plating metal face are connected by load resistance 7 with casing 1, and are connected by conducting wire with electronics 8；Band shielding is coaxial
Testpieces 4 is to have metallic shield concentric conductor component, and core is connected by load resistance 7 with casing 1, and pass through conducting wire and
Electronics 8 are connected；The coaxial testpieces 5 of unmasked is concentric conductor component of the surface without metallic shield, and core passes through negative
It carries resistance 7 to be connected with casing 1, and is connected by conducting wire with electronics 8.
Preferably, the material of the plating media testpieces of test device of the invention is all kinds of printed circuit board bases in satellite
The material of material or wire sleeve, it is preferable that can be FR-4, TEFLON etc..
Preferably, test device of the invention is mounted within satellite covering, between test device barricade and covering not
Containing shelter, there is no shelter except the corresponding satellite covering of test device, reduce test effect to avoid due to blocking.
Preferably, the thickness of the test device barricade of test device of the invention is not more than 5mm, to avoid due to blocking
It is too thick and realize test, and be metal plate, the interference of pairwise testing is made to avoid the electrification of test device barricade.Fig. 1's
In embodiment, test device barricade 6 with a thickness of 0.5mm, using aluminum alloy materials, for absorbing energy less than 350keV electricity
Son and energy are less than the proton of 8.7MeV；And thickness error range is less than 0.1mm, causes to avoid big due to thickness error
Errors of analytical results is excessive.
Preferably, the load resistance resistance value in test device of the invention is greater than or equal to 1 Ω and is less than 1G Ω, to avoid
It is excessive to measure electric current, while avoiding current signal too small.In the embodiment that Fig. 2 and 3 is shown, the resistance value of load resistance 7 is 50
Ω。
Optionally, this test device also includes satellite interface circuit, for carrying out data communication with satellite bus.
Fig. 4 is the functional block diagram according to the electronics of the test device of one embodiment of the present of invention.Such as Fig. 4 institute
Show, the ungrounded conductor testpieces 2 of test device, plating media testpieces 3, band shield coaxial testpieces 4, coaxial without shielding
Totally four class testpieces are connected with bleeder circuit testpieces 5 respectively, first by the electric current of static discharge in satellite deep layer medium negative
It carries the voltage pulse that resistance both ends are evoked to be divided, in order to which voltage is processed into the telecommunications that electronic device can be handled
Within the scope of number, then amplify and with peak protect circuit be connected progress signal peak holding.By peak protect treated letter
Number it is connected with gating circuit, gating circuit gates later signal for successively carrying out gated acquisition to different sensors signal
It is provided to AD circuit, the signal after A/D is converted is provided to data processing circuit again, data processing circuit treated signal warp
Satellite interface circuit sends the electronic system of satellite to, and data processing circuit is also used to control gating circuit and AD circuit simultaneously here
Provide the information such as gating time.
It should be noted last that the above examples are only used to illustrate the technical scheme of the present invention and are not limiting.Although ginseng
It is described the invention in detail according to embodiment, those skilled in the art should understand that, to technical side of the invention
Case is modified or replaced equivalently, and without departure from the spirit and scope of technical solution of the present invention, should all be covered in the present invention
Scope of the claims in.
Claims (9)
1. a kind of Orbital detection device of satellite deep layer medium charge and discharge, comprising: casing, ungrounded conductor testpieces, plate are situated between
Matter testpieces, band shield coaxial testpieces, the coaxial testpieces of unmasked, test device barricade, load resistance and the electronics department of the Chinese Academy of Sciences
Point, wherein the ungrounded conductor testpieces, plating media testpieces, band shield coaxial testpieces and the coaxial testpieces of unmasked
It is respectively used to ungrounded conductor, printed circuit board and various wire sleeves that the electronic system of analog satellite is included, it is described non-to connect
Earthed conductor testpieces is formed and the two-sided plating metal in plate dielectric, and its one side passes through load resistance and casing phase
Even, and by conducting wire it is connected with electronics；The plating media testpieces is gold-plated by the one side in plate dielectric
Belong to and formed, which is connected by load resistance with casing, and is connected by conducting wire with electronics；The band screen
Covering coaxial testpieces is the concentric conductor component that surface has metallic shield, and core wire is connected by load resistance with casing, and
It is connected by conducting wire with electronics；The coaxial testpieces of unmasked is concentric conductor structure of the surface without metallic shield
Part, core wire are connected by load resistance with casing, and are connected by conducting wire with electronics；The test device barricade
It is mounted on casing, is shielded for analog satellite electronic system, it can be with positions different in analog satellite by adjusting its thickness
Set the satellite deep layer medium charge and discharge threat degree at place.
2. test device according to claim 1, which is characterized in that the material of plating media testpieces therein is satellite
The material of interior all kinds of substrate for printed circuit board or wire sleeve.
3. test device according to claim 2, which is characterized in that the material of plating media testpieces therein is FR-
4、TEFLON。
4. test device according to claim 1, which is characterized in that the resistance value of load resistance therein is greater than or equal to 1
Ω and be less than 1G Ω.
5. test device according to claim 1, which is characterized in that the thickness of test device barricade therein is not more than
5mm, and be metal plate.
6. test device according to claim 5, which is characterized in that test device barricade with a thickness of 0.5mm, and its
Material is aluminium alloy.
7. test device according to claim 5, which is characterized in that the thickness error range of test device barricade is less than
0.1mm。
8. test device according to claim 1, which is characterized in that test device is mounted within satellite covering, test
Shelter is free of between device barricade and covering, does not have shelter except the corresponding satellite covering of test device.
9. test device according to claim 1, which is characterized in that the test device also includes output interface circuit,
For carrying out data communication with satellite bus.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510044167.2A CN105988065B (en) | 2015-01-28 | 2015-01-28 | A kind of Orbital detection device of satellite deep layer medium charge and discharge |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510044167.2A CN105988065B (en) | 2015-01-28 | 2015-01-28 | A kind of Orbital detection device of satellite deep layer medium charge and discharge |
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| Publication Number | Publication Date |
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| CN105988065A CN105988065A (en) | 2016-10-05 |
| CN105988065B true CN105988065B (en) | 2019-05-03 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201510044167.2A Expired - Fee Related CN105988065B (en) | 2015-01-28 | 2015-01-28 | A kind of Orbital detection device of satellite deep layer medium charge and discharge |
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Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108072795A (en) * | 2016-11-16 | 2018-05-25 | 北京天工科仪空间技术有限公司 | A kind of electric Field Calculation method of the satellite deep layer charging assessment based on finite difference |
Citations (4)
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|---|---|---|---|---|
| CN102508127A (en) * | 2011-10-20 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for monitoring internal discharge of materials for ground simulation satellite |
| CN102508125A (en) * | 2011-10-19 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Method for indicating whether deep dielectric discharge of satellite is dangerous or not by utilizing in-orbit data |
| CN103454315A (en) * | 2013-09-16 | 2013-12-18 | 中国科学院空间科学与应用研究中心 | Device and method for measuring deep dielectric charging characteristic parameter of spacecraft dielectric material |
| CN103698666A (en) * | 2013-11-28 | 2014-04-02 | 兰州空间技术物理研究所 | On-orbit monitoring device for electrostatic discharge pulse of spacecraft |
-
2015
- 2015-01-28 CN CN201510044167.2A patent/CN105988065B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102508125A (en) * | 2011-10-19 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Method for indicating whether deep dielectric discharge of satellite is dangerous or not by utilizing in-orbit data |
| CN102508127A (en) * | 2011-10-20 | 2012-06-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Device and method for monitoring internal discharge of materials for ground simulation satellite |
| CN103454315A (en) * | 2013-09-16 | 2013-12-18 | 中国科学院空间科学与应用研究中心 | Device and method for measuring deep dielectric charging characteristic parameter of spacecraft dielectric material |
| CN103698666A (en) * | 2013-11-28 | 2014-04-02 | 兰州空间技术物理研究所 | On-orbit monitoring device for electrostatic discharge pulse of spacecraft |
Non-Patent Citations (1)
| Title |
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| 地球同步轨道航天器深层充放电探测研究;杨垂柏;《中国博士学位论文全文数据库 工程科技II辑》;20081015;C031-5 * |
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Address after: 100190 No. two south of Zhongguancun, Haidian District, Beijing 1 Applicant after: NATIONAL SPACE SCIENCE CENTER, CAS Address before: 100190 No. two south of Zhongguancun, Haidian District, Beijing 1 Applicant before: Space Science & Applied Research Centre, Chinese Academy of Sciences |
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Granted publication date: 20190503 Termination date: 20210128 |