CN105988047A - Test device of electronic module - Google Patents
Test device of electronic module Download PDFInfo
- Publication number
- CN105988047A CN105988047A CN201510085392.0A CN201510085392A CN105988047A CN 105988047 A CN105988047 A CN 105988047A CN 201510085392 A CN201510085392 A CN 201510085392A CN 105988047 A CN105988047 A CN 105988047A
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- Prior art keywords
- keeper
- electronic module
- face
- test device
- supporter
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- Measuring Leads Or Probes (AREA)
Abstract
The invention relates to a test device of an electronic module. The test device comprises a supporting body (32), a probe (34), a first positioning component (36) and a second positioning component (38); the supporting body comprises a test end surface (322), a first mounting end surface (324) arranged at one side of the supporting body, and a second mounting end surface (326) arranged at the other side of the supporting body; the probe is corresponding to a contact point; the probe can be inserted into a test hole along a test direction and contacts with the contact point; the first positioning component can be rotationally arranged on the first mounting end surface and can be clamped in the test hole; and the second positioning component can be rotationally arranged on the second mounting end surface and can be clamped in the test hole. With the test device of the electronic module adopted, sufficient contact between the probe and the contact point in the circuit board of the electronic module can be ensured.
Description
Technical field
The present invention relates to a kind of test device, particularly relate to a kind of test device of contact functional test in electronic module.
Background technology
The circuit board of electronic module is usually provided with the contact for functional test.After electronic module completes to assemble, outside it
Shell is provided with instrument connection.Probe for electronic module functional test, it is possible to be inserted in the shell of electronic module by instrument connection,
And with the contact on circuit board, thus complete the functional test of electronic module.
In the test of electronic module, probe likely misplaces with the contact of circuit board or is not fully contacted, thus cannot
Obtain the functional test results of electronic module.
Summary of the invention
It is an object of the invention to provide the test device of a kind of electronic module, to ensure the probe circuit board with electronic module touches
Being fully contacted of point.
The invention provides the test device of a kind of electronic module, wherein electronic module includes a shell and a circuit board.
Shell is provided with an instrument connection.Circuit board package is in shell, and it includes a contact for electronic module functional test,
And electronic module has a measurement direction, on measurement direction, instrument connection aligns with contact.Test device includes one
Supporter, a probe, first keeper and second keeper.Supporter include one test end face, one
Individual the first installation end face being arranged at supporter side and a second installation end face being arranged at supporter opposite side.Probe
Corresponding with contact, it can insert instrument connection and contact along measurement direction.First keeper can be arranged rotationally
Installing end face in first, it can be connected in instrument connection.Second keeper can be rotatably arranged in the second installation end face, it
Instrument connection can be connected in.
In another schematic embodiment of the test device of electronic module, test device includes first elastic component
With second elastic component.One end of first elastic component is resisted against the first installation end face, and its other end is resisted against the first keeper.
One end of second elastic component is resisted against the second installation end face, and its other end is resisted against the second keeper.
In the another kind of schematically embodiment of the test device of electronic module, test device includes first connecting pin
Axle and one second connection bearing pin.First connects bearing pin is arranged at the first location end face, and the fixing end of the first keeper can connect
It is connected to the first connection bearing pin, and the free end of the first keeper can connect bearing pin with first and rotate relative to supporter for axle.
Second connects bearing pin is arranged at the and positions end face, and the fixing end of the second keeper can be connected to the second connection bearing pin, and the
The free end of two keepers can connect bearing pin with second and rotate relative to supporter for axle.
In another schematic embodiment of the test device of electronic module, the first keeper has first snap fit
With first operating surface.First snap fit is arranged at the free end of the first keeper, and it can be connected in instrument connection.First behaviour
It is arranged between the free end of the first keeper and fixing end as face, promotes the first operating surface can make the first bullet towards supporter
Property part produce elastic force to drive the first snap fit away from supporter.Second keeper has second snap fit and one second behaviour
Make face.Second snap fit is arranged at the free end of the second keeper, and it can be connected in instrument connection.Second operating surface is arranged at
Between free end and the fixing end of two keepers, promote the second operating surface that the second elastic component can be made to produce elasticity towards supporter
Power is to drive the second snap fit away from supporter.
In another schematic embodiment of the test device of electronic module, the first elastic component and the second elastic component are pressure
Spring.
Accompanying drawing explanation
The present invention is only schematically illustrated and explains by the following drawings, not delimit the scope of the invention.
Fig. 1 shows the partial structurtes schematic diagram of electronic module.
Fig. 2 is for illustrating the structural representation of test a kind of exemplary embodiment of device of electronic module.
Fig. 3 shows the structural representation after the test device assembling of electronic module in Fig. 2.
Fig. 4 to Fig. 6 is for illustrating the installation process of the test device of electronic module.
Label declaration
10 shells
12 instrument connections
20 circuit boards
22 contacts
30 test devices
31 first elastic components
32 supporters
33 second elastic components
322 test end faces
324 first install end face
326 second install end face
34 probes
35 first connect bearing pin
36 first keepers
362 first snap fits
364 first operating surfaces
37 second connect bearing pin
38 second keepers
382 second snap fits
384 second operating surfaces.
Detailed description of the invention
In order to technical characteristic, purpose and the effect of invention are more clearly understood from, the now tool of the comparison accompanying drawing explanation present invention
Body embodiment, the most identical label represents identical part.
In this article, " schematically " expression " serves as example, example or explanation ", " should not show being described herein as
Meaning property " any diagram, embodiment be construed to a kind of preferred or more advantage technical scheme.
For making simplified form, only schematically show part related to the present invention in each figure, they do not represent it
Practical structures as product.It addition, so that simplified form readily appreciates, some figure has identical structure or function
Parts, only symbolically depict one of them, or have only marked one of them.
In this article, " one " not only represents " only this ", it is also possible to represent the situation of " more than one ".
In this article, " first ", " second " etc. are only used for differentiation each other, rather than represent their significance level and order,
And the premise etc. existed each other.
In this article, the restriction in " vertically ", " parallel " the mathematics of non-critical and/or geometry meaning, also comprise ability
Field technique personnel may be appreciated and the error of the permission such as manufacture or use.
Fig. 1 shows the partial structurtes schematic diagram of electronic module.As it is shown in figure 1, electronic module includes shell 10 He
One circuit board 20.Electronic module shown in Fig. 1 is the driving module of motor.Shell 10 is provided with an instrument connection 12.
It is internal that circuit board 20 is packaged in shell 10, is provided with multiple contact 22 for electronic module functional test.Electronic die
Block has a measurement direction as shown in arrow A in Fig. 1, and on measurement direction, instrument connection 12 aligns with contact 22.
Fig. 2 is for illustrating the structural representation of test a kind of exemplary embodiment of device of electronic module.Fig. 3 shows figure
Structural representation after the test device of electronic module assembles in 2.Seeing Fig. 2 and Fig. 3, test device 30 includes one
Support body 32,34, first keeper 36 of multiple probe and second keeper 38.
Supporter 32 includes that a test end face 322, first installs end face 324 and one second installation end face 326.
Wherein, test end face 322 is positioned at supporter 32 one end towards electronic installation, and test end face 322 is perpendicular to arrow in figure
Head measurement direction shown in A.First installation end face 324 and the second installation end face 326 lay respectively at two of supporter 32
Opposite side, and first install end face 324 and second and install end face 326 and be respectively parallel to the measurement direction shown in arrow A in figure.
The quantity of probe 34 is corresponding with the quantity of contact in circuit board, and in the arrangement mode of these probes 34 and circuit board
The arragement direction of contact is identical, so that each probe 34 can contact with corresponding contact.When using test device pair
When electronic module carries out functional test, these probes 34 are inserted into the instrument connection on electronic module shell, and and circuit board
Contact.
First keeper 36 can be rotatably arranged in the first installation end face 324.In the schematic enforcement shown in Fig. 2 and Fig. 3
In mode, test device includes that one first connects bearing pin 35, and it is arranged at the first location end face 324.First keeper 36
Fixing end be connected to the first connection bearing pin 35 so that the free end of the first keeper 36 can with first connect bearing pin
35 rotate relative to the first location end face 324 for axle, i.e. rotate relative to supporter 32.It addition, test device 30 includes
One the first elastic component 31, its one end is resisted against the first installation end face 324, and its other end is resisted against the first keeper 36
Middle part, in the i.e. first keeper 36 between free end and fixing end.First elastic component 31 is a stage clip.
Second keeper 38 can be rotatably arranged in the second installation end face 326.In the schematic enforcement shown in Fig. 2 and Fig. 3
In mode, test device includes that one second connects bearing pin 37, and it is arranged at the second location end face 326.Second keeper 38
Fixing end be connected to the second connection bearing pin 37 so that the free end of the second keeper 38 can with second connect bearing pin
37 rotate relative to the second location end face 326 for axle, i.e. rotate relative to supporter 32.It addition, test device 30 includes
One the second elastic component 33, its one end is resisted against the second installation end face 326, and its other end is resisted against the second keeper 38
Middle part, in the i.e. second keeper 38 between free end and fixing end.Second elastic component 33 is a stage clip.
First keeper 36 has first snap fit 362 and first operating surface 364.First snap fit 362 is arranged at
The free end of positioning piece 36.First operating surface 364 is arranged between the free end of the first keeper 36 and fixing end.Can
With by promoting the first operating surface 364 towards the direction of supporter 32 so that the first keeper 36 entirety is towards supporter 32
Rotate.Under the promotion of the first keeper 36, the first elastic component 31 compresses and produces elastic restoring force to drive the first location
First snap fit 362 of part 36 is away from supporter 32.
Second keeper 38 has second snap fit 382 and second operating surface 384.Second snap fit 382 is arranged at
The free end of two keepers 38.Second operating surface 384 is arranged between the free end of the second keeper 38 and fixing end.Can
With by promoting the second operating surface 384 towards the direction of supporter 32 so that the second keeper 38 entirety is towards supporter 32
Rotate.Under the promotion of the second keeper 38, the second elastic component 33 compresses and produces elastic restoring force to drive the second location
Second snap fit 382 of part 38 is away from supporter 32.
Fig. 4 to Fig. 6 is for illustrating the installation process of the test device of electronic module.As shown in Figure 4, test device 30 edge
In figure, the measurement direction shown in arrow A moves towards electronic module.Now, the first snap fit 362 of the first keeper 36 in
Spacing between second snap fit 382 of the second keeper 38 is more than the size of instrument connection 12.First elastic component 31 and second
Elastic component 33 is uncompressed.
As it is shown in figure 5, by pressing the first operating surface 364 and the second operating surface 384, the first snap fit 362 and second simultaneously
Move towards supporter 32 between snap fit 382, so that the size being smaller than instrument connection 12 between them.Probe
34, the first snap fit 362 and the second snap fit 382 can enter into shell 10 inside.First keeper 36 promotes the first bullet
Property part 31 so that it is compression；Second keeper 38 promotes the second elastic component 33 so that it is compression.
As shown in Figure 6, release is to the first operating surface 364 and pressing of the second operating surface 384, the first elastic component 31 He
Under the promotion of the second elastic component 33, the first snap fit 362 and the second snap fit 382 are connected in instrument connection 12 respectively.Probe 34 points
Do not contact with contact 22.Owing to the first snap fit 362 and the second snap fit 382 are connected in instrument connection 12 so that test device is fixed
Being positioned at instrument connection 12, test device relative to the electronic module changing of the relative positions in the plane being perpendicular to measurement direction, thus will not ensure
Probe 34 is fully contacted with contact 22.
It is to be understood that, although this specification describes according to each embodiment, but the most each embodiment only comprises one
Individual independent technical scheme, this narrating mode of description is only that for clarity sake those skilled in the art should will say
Bright book is as an entirety, and the technical scheme in each embodiment can also be through appropriately combined, and forming those skilled in the art can
With other embodiments understood.
The a series of detailed description of those listed above is only for illustrating of the feasibility embodiment of the present invention, it
And be not used to limit the scope of the invention, all without departing from the skill of the present invention equivalent embodiments made of spirit or change
More, as feature combination, split or repeat, should be included within the scope of the present invention.
Claims (5)
1. the test device of electronic module, wherein said electronic module includes:
One shell (10), it is provided with an instrument connection (12)；With
The circuit board (20) that one is packaged in described shell (10), it includes a contact for described electronic module functional test
(22), and described electronic module has a measurement direction, and on described measurement direction, described instrument connection (12) touches with described
Point (22) aligns,
It is characterized in that described test device (30) including:
One supporter (32), it includes:
One test end face (322),
One the first installation end face (324) being arranged at described supporter (32) side, and
One the second installation end face (326) being arranged at described supporter (32) opposite side；
One probe (34) corresponding with described contact (22), it can along described measurement direction insert described instrument connection (12) and
Contact with described contact (22)；
One can be rotatably arranged in the described first the first keeper (36) installing end face (324), and it can be connected in described survey
Prospect hole (12)；With
One can be rotatably arranged in the described second the second keeper (38) installing end face (326), and it can be connected in described survey
Prospect hole (12).
2. the test device of electronic module as claimed in claim 1, it is characterised in that described test device (30) including:
One the first elastic component (31), its one end is resisted against described first and installs end face (324), and its other end is resisted against described first
Keeper (36)；With
One the second elastic component (33), its one end is resisted against described second and installs end face (326), and its other end is resisted against described second
Keeper (38).
3. the test device of electronic module as claimed in claim 2, it is characterised in that described test device (30) including:
One the first connection bearing pin (35) being arranged at described first location end face (324), fixing of described first keeper (36)
End can be connected to described first and connect bearing pin (35), and the free end of described first keeper (36) can with described first even
Pin axle (35) is that axle rotates relative to described supporter (32)；With
One is arranged at described the and positions the second connection bearing pin (37) of end face (326), described second keeper (38) fixing
End can be connected to described second and connect bearing pin (37), and the free end of described second keeper (38) can with described second even
Pin axle (37) is that axle rotates relative to described supporter (32).
4. the test device of electronic module as claimed in claim 3, it is characterised in that:
Described first keeper (36) has:
First snap fit (362) of one free end being arranged at described first keeper (36), it can be connected in described instrument connection (12),
With
The first operating surface (364) between one free end being arranged at described first keeper (36) and fixing end, towards described
It is described to drive that support body (32) promotes described first operating surface (364) that described first elastic component (31) can be made to produce elastic force
First snap fit (362) is away from described supporter (32)；
Described second keeper (38) has:
Second snap fit (382) of one free end being arranged at described second keeper (38), it can be connected in described instrument connection (12),
With
The second operating surface (384) between one free end being arranged at described second keeper (38) and fixing end, towards described
It is described to drive that support body (32) promotes described second operating surface (384) that described second elastic component (33) can be made to produce elastic force
Second snap fit (382) is away from described supporter (32).
5. the test device of electronic module as claimed in claim 4, it is characterised in that described first elastic component (31) and described second
Elastic component (33) is stage clip.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510085392.0A CN105988047A (en) | 2015-02-16 | 2015-02-16 | Test device of electronic module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510085392.0A CN105988047A (en) | 2015-02-16 | 2015-02-16 | Test device of electronic module |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105988047A true CN105988047A (en) | 2016-10-05 |
Family
ID=57038883
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510085392.0A Pending CN105988047A (en) | 2015-02-16 | 2015-02-16 | Test device of electronic module |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105988047A (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1350325A (en) * | 2000-10-25 | 2002-05-22 | 株式会社鼎新 | Contact structure member and production method thereof, and probe contact assembly using said contact structure member |
| US20030100201A1 (en) * | 2001-11-29 | 2003-05-29 | Kiyokazu Ikeya | Socket |
| CN201663301U (en) * | 2010-04-23 | 2010-12-01 | 张自耀 | Plug with lock catches and socket |
| CN102435927A (en) * | 2010-09-22 | 2012-05-02 | 富士电机株式会社 | Probe unit |
| CN202405534U (en) * | 2011-12-30 | 2012-08-29 | 东莞中探探针有限公司 | Rolling ball limiting connector |
| CN202758023U (en) * | 2012-08-20 | 2013-02-27 | 常州博瑞电力自动化设备有限公司 | Testing tool |
| CN204575764U (en) * | 2015-02-16 | 2015-08-19 | 西门子数控（南京）有限公司 | The proving installation of electronic module |
| CN205921151U (en) * | 2016-07-20 | 2017-02-01 | 深圳市理邦精密仪器股份有限公司 | Anticreep lead wire terminal and medical equipment |
-
2015
- 2015-02-16 CN CN201510085392.0A patent/CN105988047A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1350325A (en) * | 2000-10-25 | 2002-05-22 | 株式会社鼎新 | Contact structure member and production method thereof, and probe contact assembly using said contact structure member |
| US20030100201A1 (en) * | 2001-11-29 | 2003-05-29 | Kiyokazu Ikeya | Socket |
| CN201663301U (en) * | 2010-04-23 | 2010-12-01 | 张自耀 | Plug with lock catches and socket |
| CN102435927A (en) * | 2010-09-22 | 2012-05-02 | 富士电机株式会社 | Probe unit |
| CN202405534U (en) * | 2011-12-30 | 2012-08-29 | 东莞中探探针有限公司 | Rolling ball limiting connector |
| CN202758023U (en) * | 2012-08-20 | 2013-02-27 | 常州博瑞电力自动化设备有限公司 | Testing tool |
| CN204575764U (en) * | 2015-02-16 | 2015-08-19 | 西门子数控（南京）有限公司 | The proving installation of electronic module |
| CN205921151U (en) * | 2016-07-20 | 2017-02-01 | 深圳市理邦精密仪器股份有限公司 | Anticreep lead wire terminal and medical equipment |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20161005 |
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| RJ01 | Rejection of invention patent application after publication |