CN105957801A - Gallium nitride nanocone and gallium nitride nanorod mixed array manufacturing method - Google Patents

Gallium nitride nanocone and gallium nitride nanorod mixed array manufacturing method Download PDF

Info

Publication number
CN105957801A
CN105957801A CN201610373179.4A CN201610373179A CN105957801A CN 105957801 A CN105957801 A CN 105957801A CN 201610373179 A CN201610373179 A CN 201610373179A CN 105957801 A CN105957801 A CN 105957801A
Authority
CN
China
Prior art keywords
gallium nitride
layer
nanocone
pillar
manufacture method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610373179.4A
Other languages
Chinese (zh)
Inventor
任鹏
张宁
薛斌
刘喆
王军喜
李晋闽
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institute of Semiconductors of CAS
Original Assignee
Institute of Semiconductors of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institute of Semiconductors of CAS filed Critical Institute of Semiconductors of CAS
Priority to CN201610373179.4A priority Critical patent/CN105957801A/en
Publication of CN105957801A publication Critical patent/CN105957801A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • H01L21/02428Structure

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

The invention provides a gallium nitride nanocone and gallium nitride nanorod mixed array manufacturing method, and the method comprises the steps: firstly sequentially depositing a gallium nitride layer, a mask layer and a photoresist layer on a substrate; secondly arranging small polystyrene balls on the photoresist layer in a dense manner, taking the small polystyrene balls as lenses, and carrying out the exposure and development of the photoresist layer, so as to form a circular hole array on the photoresist layer; thirdly transferring the pattern of the photoresist layer to a silicon oxide layer through employing the etching technology, and carrying out etching till the lower gallium nitride layer is exposed, so as to form a circular hole array on the mask layer; and finally growing a gallium nitride nanocone and gallium nitride nanorod mixed array in a circular hole array of the mask layer. The method can produce the gallium nitride nanocone and gallium nitride nanorod mixed array in a large scale, and the sizes of the gallium nitride nanocones and gallium nitride nanorods can be controlled.

Description

Gallium nitride nanocone and the manufacture method of gallium nitride nano-pillar mixing array
Technical field
The invention belongs to technical field of semiconductors, particularly relate to a kind of gallium nitride (GaN) nanocone and The manufacture method of gallium nitride nano-pillar mixing array.
Background technology
Based on the III-V nitride material of GaN and InGaN and AlGaN alloy material it is The most valued novel semiconductor material.GaN base material is direct band gap width Bandgap semiconductor material, has the direct band gap of continuous variable between 0.7-6.2eV, excellent thing Reason, chemical stability, high saturated electron drift velocity, the superiority such as high breakdown field strength and high heat conductance Energy.GaN base LED have energy-saving and environmental protection, cold light source, color rendering index height, fast response time, Volume is little and the outstanding advantages such as long working life, and it is as the green solid light source of a new generation's illumination revolution Demonstrate huge application potential.
GaN material makes One-Dimensional GaN nanostructured as the good characteristic of important semi-conducting material Have wider in fields such as micro-nano photoelectric device, photoelectric detector, electronic device, environment and medical science General potential application foreground, therefore, processability One-Dimensional GaN nano junction excellent, high-quality Structure and characteristic research just become the advanced subject of the current world, studies in China.GaN nano junction at present The mask choosing epitaxial growth method that structure is conventional is the most all the side by electron beam exposure and nano impression Method makes.But both approaches has respective shortcoming: electron beam exposure is difficult to large-scale production, Nano impression then needs the pressure version that preparation is expensive, and the motility for size Control is poor.
Summary of the invention
(1) to solve the technical problem that
It is an object of the invention to provide a kind of gallium nitride nanocone and gallium nitride nano-pillar mixing array Manufacture method, can large-scale production go out gallium nitride nanocone and gallium nitride nano-pillar mixing array, and And the size of gallium nitride nanocone and gallium nitride nano-pillar is controlled.
(2) technical scheme
The gallium nitride nanocone of present invention offer and the manufacture method of gallium nitride nano-pillar mixing array, bag Include:
S1, is sequentially depositing gallium nitride layer, mask layer and photoresist layer on a substrate, it is preferable that lining The end is Sapphire Substrate or silicon substrate, and the material of mask layer is silicon oxide or silicon nitride, described mask The thickness of layer is 20nm~100nm;
S2, arranges one layer of compact arranged polystyrene sphere, wherein, polyphenyl second on photoresist layer A diameter of 200nm of alkene bead~1 μm;
S3, with described polystyrene sphere as lens, is exposed photoresist layer and develops, with Described photoresist layer forms circular opening array;
S4, uses etching technics to transfer on silicon oxide layer by the figure of photoresist layer, and etching is until sudden and violent Expose lower section gallium nitride layer, to form circular opening array at mask layer;
S5, growing gallium nitride nano-pillar and and gallium nitride nanocone in the circular opening array of mask layer Mixing array.
Further, in step S1, deposition process includes MOCVD, MBE, HVPE.
Further, in step S3, use ultraviolet source photoresist layer is exposed and develops, expose The light time is 3s~10s, and developing time is 2s~6s.
Further, etching technics includes inductively coupled plasma (ICP) and reactive ion etching (RIE)。
Further, in step S5, use MOCVD Pulsed growth method growing gallium nitride nano-pillar and With gallium nitride nanocone mixing array, wherein, growth temperature is 1000 DEG C, and carrier gas is nitrogen and hydrogen Mixed gas, ratio is 1: 1, but its flow 2000sccm.Set of time is: ammonia is passed through 6s Rear closedown, is passed through trimethyl gallium (TMGa) 18s, is then shut off, pause 6s.Ammonia is passed through flow It is 70sccm for 500sccm, TMGa flow.
Further, also include after step S3, use stripping technology or ultrasonic technique to remove polyphenyl Ethylene bead.
(3) beneficial effect
The present invention utilizes the characteristic of pipe/polyhenylethylene nano bead, can control gained circular opening easily Diameter and periodic distance, and specific pulsed growth methods gained can be utilized with large-scale production To nano-device comprise the nanostructured of two kinds of patterns, the present invention can be used for GaN base LED, LD, The photoelectric devices such as HEMT, it is also possible to for other semiconductor device epitaxy technology of III/V, II/VI.
Accompanying drawing explanation
Fig. 1 is gallium nitride nanocone and the gallium nitride nano-pillar mixing array of embodiment of the present invention offer The flow chart of manufacture method.
Fig. 2 is to be sequentially depositing plane gallium-nitride layer, mask layer and light in the embodiment of the present invention on substrate Cross-sectional view after photoresist layer.
Fig. 3 is cross section after transparent polystyrene bead of tiling above photoresist layer in the embodiment of the present invention Figure.
Fig. 4 is exposure imaging the cross-sectional view after removing polystyrene sphere in the embodiment of the present invention.
Fig. 5 is cross-sectional view after etch mask layer in the embodiment of the present invention.
Fig. 6 be in the embodiment of the present invention MOCVD growth after cross-sectional view.
Fig. 7 be the embodiment of the present invention prepare nanocone and the mixing array scanning electron microscope (SEM) photograph of nano-pillar Sheet.
Description of reference numerals
10 substrates
11 gallium nitride layers
12 mask layers
13 photoresist layers
20 polystyrene spheres
30 circular openings
40 gallium nitride nano-pillar
41 gallium nitride nanocone
Detailed description of the invention
For making the object, technical solutions and advantages of the present invention clearer, below in conjunction with concrete real Execute example, and referring to the drawings, the present invention is described in more detail.
Fig. 1 is gallium nitride nanocone and the gallium nitride nano-pillar mixing array of embodiment of the present invention offer The flow chart of manufacture method, as it is shown in figure 1, method includes:
S100, is sequentially depositing plane gallium-nitride layer 11, mask layer 12 and photoresist layer over the substrate 10 13.As in figure 2 it is shown, deposition has gallium nitride layer 11 on substrate 10, on gallium nitride layer 11, deposition is covered Mold layer 12, the thickness of mask layer is 20nm~100nm, and on mask layer 12, deposition has photoresist layer 13, wherein, photoresist layer 13 uses positive photoresist, the deposition process of each layer all can use One in MOCVD, MBE, HVPE.
S200, arranges a packed mono-layer polystyrene sphere 20 above photoresist layer 13.Such as Fig. 3 Shown in, close-packed arrays between each polystyrene sphere 20, and this layer be single solid matter polyphenyl Ethylene bead, solid matter polystyrene sphere 20 diameter can as required 200nm~1 μm it Between change, therefore can conveniently control diameter and the periodic distance of follow-up gained circular opening 30.
S300, with polystyrene sphere 20 as lens, uses ultraviolet source expose and develop, is formed Circular opening array;Time of exposure is 3s~10s, and developing time is 2s~6s.
S400, use stripping technology or ultrasonic technique removal polystyrene sphere 20, as shown in Figure 4, After exposure imaging, photoresist layer runs through multiple circular opening 30.
S500, uses etching technics to be transferred to by photoetching offset plate figure on mask layer 12, and etching is until sudden and violent Expose lower section gallium nitride layer 11, as it is shown in figure 5, after over etching, mask layer 12 has also extended through Multiple circular openings 30.
S600, uses mocvd method growing gallium nitride nano-pillar and and nanocone mixing array, growth Temperature is 1000 DEG C, and carrier gas is nitrogen and hydrogen gas mixture, and ratio is 1: 1, but its flow 2000sccm.Set of time is: ammonia is closed after being passed through 6s, is passed through trimethyl gallium (TMGa) 18s, Be then shut off, pause 6s, ammonia be passed through flow be 500sccm, TMGa flow be 70sccm, system Obtain nanocone as shown in Figure 6 and Figure 7 and the mixing array of nano-pillar.
Particular embodiments described above, is carried out the purpose of the present invention, technical scheme and beneficial effect Further describe, be it should be understood that the foregoing is only the present invention specific embodiment and , be not limited to the present invention, all within the spirit and principles in the present invention, that is done any repaiies Change, equivalent, improvement etc., should be included within the scope of the present invention.

Claims (9)

1. gallium nitride nanocone and a manufacture method for gallium nitride nano-pillar mixing array, its feature It is, including:
S1, is sequentially depositing gallium nitride layer, mask layer and photoresist layer on a substrate;
S2, arranges one layer of compact arranged polystyrene sphere on photoresist layer;
S3, with described polystyrene sphere as lens, is exposed described photoresist layer and develops, To form circular opening array at described photoresist layer;
S4, uses etching technics to transfer on silicon oxide layer by the figure of photoresist layer, and etching is until sudden and violent Expose lower section gallium nitride layer, to form circular opening array at described mask layer;
S5, in the circular opening array of described mask layer growing gallium nitride nano-pillar and and gallium nitride receive Rice cone mixing array.
Gallium nitride nanocone the most according to claim 1 and gallium nitride nano-pillar mixing array Manufacture method, it is characterised in that in described step S1 deposition process include MOCVD, MBE, HVPE。
Gallium nitride nanocone the most according to claim 1 and gallium nitride nano-pillar mixing array Manufacture method, it is characterised in that described substrate is Sapphire Substrate or silicon substrate.
Gallium nitride nanocone the most according to claim 1 and gallium nitride nano-pillar mixing array Manufacture method, it is characterised in that the material of described mask layer is silicon oxide or silicon nitride, described in cover The thickness of mold layer is 20nm~100nm.
Gallium nitride nanocone the most according to claim 1 and gallium nitride nano-pillar mixing array Manufacture method, it is characterised in that a diameter of 200nm of described polystyrene sphere~1 μm.
Gallium nitride nanocone the most according to claim 1 and gallium nitride nano-pillar mixing array Manufacture method, it is characterised in that in described step S3, uses ultraviolet source to described photoresist layer Being exposed and develop, time of exposure is 3s~10s, and developing time is 2s~6s.
Gallium nitride nanocone the most according to claim 1 and gallium nitride nano-pillar mixing array Manufacture method, it is characterised in that etching technics includes inductively coupled plasma and reactive ion etching.
Gallium nitride nanocone the most according to claim 1 and gallium nitride nano-pillar mixing array Manufacture method, it is characterised in that in described step S5, uses the growth of MOCVD Pulsed growth method Gallium nitride nano-pillar and and gallium nitride nanocone mixing array.
Gallium nitride nanocone the most according to claim 1 and gallium nitride nano-pillar mixing array Manufacture method, it is characterised in that also include after described step S3, use stripping technology or Ultrasonic technique removes polystyrene sphere.
CN201610373179.4A 2016-05-31 2016-05-31 Gallium nitride nanocone and gallium nitride nanorod mixed array manufacturing method Pending CN105957801A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610373179.4A CN105957801A (en) 2016-05-31 2016-05-31 Gallium nitride nanocone and gallium nitride nanorod mixed array manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610373179.4A CN105957801A (en) 2016-05-31 2016-05-31 Gallium nitride nanocone and gallium nitride nanorod mixed array manufacturing method

Publications (1)

Publication Number Publication Date
CN105957801A true CN105957801A (en) 2016-09-21

Family

ID=56910977

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610373179.4A Pending CN105957801A (en) 2016-05-31 2016-05-31 Gallium nitride nanocone and gallium nitride nanorod mixed array manufacturing method

Country Status (1)

Country Link
CN (1) CN105957801A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106435720A (en) * 2016-09-22 2017-02-22 东莞市联洲知识产权运营管理有限公司 Preparation method of GaN film material
CN110473873A (en) * 2019-07-15 2019-11-19 华南师范大学 A kind of preparation method of orderly ferroelectricity topology domain structure array
CN110690316A (en) * 2019-10-31 2020-01-14 华南理工大学 GaN-MoO based on core-shell structure3Self-powered ultraviolet detector of nano-column and preparation method thereof
CN112531070A (en) * 2020-11-25 2021-03-19 厦门大学 Core-shell nano-pillar array-based deep ultraviolet detector and preparation method thereof
CN114496768A (en) * 2022-04-01 2022-05-13 浙江大学杭州国际科创中心 Preparation method of nano-pillar array
CN115386958A (en) * 2022-08-24 2022-11-25 闽都创新实验室 Gallium nitride nano foam and preparation method thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090169828A1 (en) * 2006-03-10 2009-07-02 Hersee Stephen D PULSED GROWTH OF CATALYST-FREE GROWTH OF GaN NANOWIRES AND APPLICATION IN GROUP III NITRIDE SEMICONDUCTOR BULK MATERIAL
CN101504961A (en) * 2008-12-16 2009-08-12 华中科技大学 Surface emission multi-color LED and its making method
CN103107251A (en) * 2013-02-27 2013-05-15 中国科学院半导体研究所 Light emitting diode manufacturing method with hexagonal pyramid p type gallium nitride

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090169828A1 (en) * 2006-03-10 2009-07-02 Hersee Stephen D PULSED GROWTH OF CATALYST-FREE GROWTH OF GaN NANOWIRES AND APPLICATION IN GROUP III NITRIDE SEMICONDUCTOR BULK MATERIAL
CN101504961A (en) * 2008-12-16 2009-08-12 华中科技大学 Surface emission multi-color LED and its making method
CN103107251A (en) * 2013-02-27 2013-05-15 中国科学院半导体研究所 Light emitting diode manufacturing method with hexagonal pyramid p type gallium nitride

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
BYUNG OH JUNG等: "《Morphology development of GaN nanowires using a pulsed-mode MOCVD growth technique》", 《CRYSTENGCOMM》 *

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106435720A (en) * 2016-09-22 2017-02-22 东莞市联洲知识产权运营管理有限公司 Preparation method of GaN film material
CN110473873A (en) * 2019-07-15 2019-11-19 华南师范大学 A kind of preparation method of orderly ferroelectricity topology domain structure array
CN110473873B (en) * 2019-07-15 2022-04-29 华南师范大学 Preparation method of ordered ferroelectric topological domain structure array
CN110690316A (en) * 2019-10-31 2020-01-14 华南理工大学 GaN-MoO based on core-shell structure3Self-powered ultraviolet detector of nano-column and preparation method thereof
CN112531070A (en) * 2020-11-25 2021-03-19 厦门大学 Core-shell nano-pillar array-based deep ultraviolet detector and preparation method thereof
CN114496768A (en) * 2022-04-01 2022-05-13 浙江大学杭州国际科创中心 Preparation method of nano-pillar array
CN115386958A (en) * 2022-08-24 2022-11-25 闽都创新实验室 Gallium nitride nano foam and preparation method thereof
CN115386958B (en) * 2022-08-24 2024-02-02 闽都创新实验室 Gallium nitride nano foam and preparation method thereof

Similar Documents

Publication Publication Date Title
CN105957801A (en) Gallium nitride nanocone and gallium nitride nanorod mixed array manufacturing method
CN104726845B (en) The preparation method of the upper graphene nanobelts of h-BN
CN107460542A (en) A kind of preparation method of the stretchable crystalline semiconductor nano wire based on plane nano line Alignment Design and guiding
CN103608897B (en) Semiconductor thin film structure with and forming method thereof
Haas et al. Nanoimprint and selective-area MOVPE for growth of GaAs/InAs core/shell nanowires
Chen et al. GaN nanowire fabricated by selective wet-etching of GaN micro truncated-pyramid
CN105895530B (en) Method for manufacturing two-dimensional material structure and two-dimensional material device
CN104766910B (en) A kind of GaN nano wire and preparation method thereof
CN110783167A (en) Preparation method of semiconductor material patterned substrate, material film and device
CN101913907A (en) Method for preparing ZnO nanorod/microrod crystals with accurate controllable growth position on substrate
CN103995435B (en) Nano-patterning Sapphire Substrate and preparation method thereof
CN103762287A (en) Novel patterned substrate and manufacturing method thereof
CN104538449A (en) Graphene field effect transistor structure and large-scale manufacturing process thereof
CN103137812A (en) Light-emitting diode
CN103094078A (en) Gallium nitride extension preparation method for semiconductor device
CN211719593U (en) Three-color Micro/Nano LED array without mass transfer
CN102915929B (en) Method for manufacturing graphene field-effect device
CN103137798A (en) Preparing method of light-emitting diode
CN107731972A (en) A kind of strip array nano luminescent diode and preparation method thereof
CN106784197A (en) A kind of patterned substrate and preparation method thereof and the method using its making epitaxial film
CN107195533B (en) A kind of multiterminal electronic device preparation method based on GaN horizontal nanowire cross knot
CN103137796A (en) Preparing method of light-emitting diode
CN109713099B (en) Graphical sapphire substrate structure and manufacturing process thereof
CN101587830A (en) Large-area NW P-N junction array and manufacture method thereof
US11450747B2 (en) Semiconductor structure with an epitaxial layer

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20160921