CN105938198A - High-precision absolute distance measurement apparatus and measurement method based on secondary polarization - Google Patents
High-precision absolute distance measurement apparatus and measurement method based on secondary polarization Download PDFInfo
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- CN105938198A CN105938198A CN201610412017.7A CN201610412017A CN105938198A CN 105938198 A CN105938198 A CN 105938198A CN 201610412017 A CN201610412017 A CN 201610412017A CN 105938198 A CN105938198 A CN 105938198A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/08—Systems determining position data of a target for measuring distance only
- G01S17/32—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated
Abstract
The invention discloses a high-precision absolute distance measurement apparatus based on secondary polarization. The apparatus is composed of an optical circuit portion and a circuit portion. A laser beam generated by a 1550nm laser penetrates from a first port of a circulator, is emitted out from a second port, is polarized through a polarization beam splitter, after being modulated by a phase modulator, reciprocates two times past a fiber collimator and a quarter-wave plate, and after being reflected once through a reflector, is subjected to secondary modulation through the phase modulator; optical signals are polarized and interfered on the polarization beam splitter, and the polarization beam splitter outputs light intensity signals; a microcontroller controls modulation frequency output of a high-frequency microwave source, and the microcontroller acquires digital data of an A/D converter; and every time when the modulation frequency output of the high-frequency microwave source is changed, the microcontroller acquires the digital data of the A/D converter once, accordingly, a frequency sweep curve of the output light intensity signals and a modulation frequency is obtained, and a detected distance is obtained by use of modulation frequency extreme points corresponding to two adjacent signal intensity minimum values on the frequency sweep curve.
Description
Technical field
The present invention relates to a kind of Polarization Modulation range-measurement system, this range-measurement system compact conformation, environment resistant interference performance are strong, can answer
For various technical fields such as Aero-Space.
Background technology
Developing rapidly of science and technology, the requirement of measurement technology of adjusting the distance is more and more extensive, especially military, the earth is big
Gas detection, robotics, space flight and aviation, large scientific instrument, manufacture and production, the dress of main equipment of main equipment
The various aspects, all development and application to ranging technology such as join and propose the highest requirement.
During the manufacture and assembly of main equipment scientific instrument, the required precision to laser ranging is higher.This is due to processing
Directly determine by range accuracy with the precision of assembling.The precision of dimensional measurement becomes decision and manufactures one of assembly precision
Important restrictions condition.And now with main equipments such as rocket, steamer, aircrafts, assembly precision requirement is improved constantly, right
The range accuracy of the laser ranging technique of large range high precision it is also proposed higher requirement.As during the assembling of aircraft,
In order to improve the efficiency of assembling, it is all to realize whole assembling process by the way measuring field setting up all directions.Institute
The measurement field of meaning that is, set up the coordinate basis that mutual coordinate the most accurately measures, by measuring all parts and these bases
Accurate relative distance is so that it is determined that relative position information between all parts, and then realizes high-precision assembling.
Traditional laser distance measuring principle is divided into 3 classes: pulse time-of-flight method, phase method and interferometric method.
The application the earliest that the range finding of pulse time-of-flight method is laser in range finding field, make use of laser pulse duration extremely short,
The feature that instantaneous power is the biggest, has the biggest test scope.But its measuring accuracy is the lowest with resolution, limits it
Exhibition application.
Laser Range Finding Based on Phase be utilize that the phase contrast received between light of the modulation light launched and measured target reflection comprises away from
From information, realize the measurement to measured target distance.Its measuring accuracy modulated frequency height and the impact of precision of phase discrimination,
And there is fuzzy distance, need the way using multi-frequency modulation to extend the scope of measurement.
Interferometric method range finding is classical precise distance measurement method, and it is also a kind of ranging phase method in principle, but it is not by survey
The phase contrast of amount laser modulation signal, but the phase interference measuring light wave itself is found range.But traditional interferometric method is being measured
Time can only obtain the relative change of distance, it is impossible to obtain real range information.Wide range absolute distance measurement needs to adopt
By the method for multiple wavelength measurements, i.e. composite wave regular way or frequency modulation Light Source Method.
Wherein Laser Range Finding Based on Phase technology is widely applied to precise distance measurement field due to its certainty of measurement advantages of higher, and phase
The range accuracy of position method laser ranging technique directly depends on the precision of phase demodulation.In the most common phase discriminating technology, precision of phase discrimination
Limited, and there is fuzzy distance problem in ranging phase method, therefore wants the range accuracy promoting Laser Range Finding Based on Phase just sacrificial
The range of domestic animal phase laser distance.This makes Laser Range Finding Based on Phase run into technical barrier at wide range, in high precision aspect.
Summary of the invention
The problem existed for prior art, the present invention proposes a kind of high accuracy absolute distance measurement device based on secondary polarization
And measuring method, the present invention utilizes Polarization Modulation capacity of resisting disturbance strong, and phase discriminator is simple, and it is excellent that additional phase shift noise is little etc.
Gesture, instead of the analogue phase detection process in conventional phase method laser ranging technique by the interferometric demodulation process of polarized light, should simultaneously
By little step-size change modulating frequency, the method for microwave source sweep measurement solves the fuzzy distance problem in phase ranging system.
The compact conformation of range-measurement system of the present invention, volume is little, and precision is high, and capacity of resisting disturbance is strong, and practicality is extensive, for Industrial Measurement
The development of the every field such as control, precision instrument manufacture has certain facilitation.
In order to solve above-mentioned technical problem, a kind of based on secondary Polarization Modulation the high accuracy absolute distance measurement that the present invention proposes
Device, is made up of light path part and circuit part, wherein: light path part includes the 1550nm wavelength laser being sequentially arranged
Light source, circulator, polarization beam apparatus, Polarization Controller, phase-modulator, a fiber optic collimator
Device, a quarter wave plate and a mirror system；Described circuit part includes a photodetector, an A/D conversion
Device, a high-frequency microwave source and a microcontroller；Described circulator includes 1 mouthful, 2 mouthfuls and 3 mouthfuls；Described 1550nm
1 mouthful of wavelength laser source and described circulator is connected, and 2 mouthfuls of described circulator are connected to described polarization beam apparatus, described
Photodetector is connected with described circulator 3 mouthfuls.
Utilizing the measuring method of above-mentioned high accuracy absolute distance measurement device based on secondary polarization, step is as follows:
The laser beam that described 1550nm laser instrument produces is from 1 mouthful of entrance of described circulator, and from 2 mouthfuls of outgoing；Then warp
Cross described polarization beam apparatus to be polarized, control the fast of line polarisation to the rear and described phase-modulator by described Polarization Controller
Axle is 45° angle, and the polarized light after described phase modulator modulation sequentially passes through optical fiber collimator, quarter wave plate and reflecting mirror
After sequentially passing through quarter wave plate, optical fiber collimator again after reflection, carry out secondary Polarization Modulation through phase-modulator；Optical signal is taken
With the phase information relevant to tested distance D polarization interference on polarization beam apparatus so that the phase relevant to tested distance D
Position information becomes intensity signal, described polarization beam apparatus output intensity signal；
The modulating frequency that described microcontroller controls described high-frequency microwave source by SPI communication exports, and described microcontroller gathers institute
State the numerical data of A/D converter；Change the modulating frequency output in high-frequency microwave source with unique step, often change a high frequency micro-
The modulating frequency output of wave source, described microcontroller all gathers the numerical data of the most described A/D converter, thus according under
Formula obtains the frequency sweep curve of output intensity signal and modulating frequency:
In formula (1), I represents signal intensity；K is the modulation degree of phase-modulator (5), and L is tested distance, and unit is (single
Position m；C is the light velocity, unit m；F is modulating frequency, unit Hz；
When tested distance D is modulating frequency f1During N times of corresponding half-wavelength, tested distance D and modulating frequency f1Relational expression
For:
In formula (2), N is half-wavelength integral multiple；λ1It is f for modulating frequency1Time corresponding microwave wavelength, unit m；f1For
The modulating frequency extreme point that signal intensity minimum point is corresponding, unit Hz；
When measured distance D is modulating frequency f2During N+1 times of corresponding half-wavelength, tested distance D and modulating frequency f2Pass
It is that formula is:
In formula (3), λ2It is f for modulating frequency2Time corresponding microwave wavelength, unit m；f2For signal intensity minimum point
Corresponding modulating frequency extreme point, unit Hz.
The modulating frequency extreme point f that on frequency sweep curve, two adjacent signal intensity minimum points are corresponding is obtained by frequency sweep curve1
And f2, by formula (2) and formula (3) simultaneous, thus obtain tested distance D.
Compared with prior art, the invention has the beneficial effects as follows:
(1) present invention utilizes the process of polarized light component interferometric demodulation to realize the simulation in the middle of conventional phase method laser ranging technique
Phase demodulation process.High-frequency input signal all can be changed into low with low-pass filtering by mixing by general analogue phase detection system
The signal of frequency or direct current signal carry out phase demodulation.After the signal that two-way phase information is different first passes through multiplier, can obtain
To the product signal of two paths of signals, namely obtain the two of the difference that frequency is two signal frequency sums and two paths of signals frequency
Individual signal is added or subtracts each other, and by band filter, this signal is leached HFS the most again, obtains in product signal
Low frequency part, the signal of the difference of i.e. two signal frequencies.And the polarization interference in range-measurement system of based on secondary Polarization Modulation
Process is equivalent to the optical mixing process in phase demodulation system, and Low speed photo detector then serves low-pass filtering in analogue phase detection method
Effect.Final output signal is the cosine function relevant to two paths of signals phase contrast.The phase demodulation process that this process is more traditional, letter
Change phase discriminator, reduce the additional phase shift noise that device introduces so that certainty of measurement is greatly improved.
(2) the fuzzy distance problem during the present invention solves conventional phase method laser ranging technique.Laser Range Finding Based on Phase process
In, if the Integer N that tested distance is microwave wavelength times, during N ＞ 1, fuzzy distance problem can be there is, it is impossible to accurately obtain
Range measurement.Present invention incorporates the measuring method of microwave source variable step frequency sweep, solve fuzzy distance problem by algorithm,
Achieve absolute distance measurement technology.
The simple in construction of the present invention, capacity of resisting disturbance is strong, and compact has wide range of applications.Overcoming laser interference range finder should
Harsh with environment, the problem that ranging scope is little.Disclosure satisfy that again the requirement of high range accuracy simultaneously.Can be widely used in
Industry, aerospace field.
(3) operation is simple for the present invention, based on above-mentioned advantage, the composite can be widely applied to industrial measurement and control, precision instrument
The fields such as manufacture, additionally due to this range-measurement system capacity of resisting disturbance is strong, good concealment, also there is fabulous answering in military field
Use prospect.
Accompanying drawing explanation
Fig. 1 is the high accuracy absolute distance measurement apparatus structure block diagram that the present invention polarizes based on secondary.
The frequency sweep result figure obtained in the high accuracy absolute distance measurement method that Fig. 2 is the present invention to be polarized based on secondary.
In figure:
1-laser instrument 2-circulator 3-polarization beam apparatus
4-Polarization Controller 5-phase-modulator 6-telescopic system
7-1/4 wave plate 8-photodetector 9-microwave source
10-A/D transducer 11-microcontroller 12-reflecting mirror
Detailed description of the invention
Being described in further detail technical solution of the present invention with specific embodiment below in conjunction with the accompanying drawings, described is embodied as
The present invention is only explained by example, not in order to limit the present invention.
It is known that optical signal polarization state under each device effect is analyzed whole process use Jones matrix table respectively
It is shown as: crystal photoelectric modulator can modulated microwave signal e on online polarisation Y-axis componentjkcos(ωt), polarization matrix isLight after modulation for the first time is through quarter wave plate, the fast axle of quarter wave plate and the angle of y-axis positive direction
Being 45 °, its polarization matrix isPolarized light reflects through reflecting mirror afterwards, and X-direction polarized component inverts, Y-axis
Direction polarization state keeps, and polarization matrix is represented byThe polarized light reflected again passes by quarter wave plate and phase
Position manipulator, owing to the fast axle of quarter wave plate now becomes-45 ° with X-axis positive direction angle, therefore polarization matrix is
And during phase-modulator carries out secondary modulation, microwave signal has had the advanced of phase place due to the flight time of optical signal,
Modulating a signal in Y-axis polarized component isPolarization matrix is expressed as
Said process can be expressed as with Jones matrix:
The X-axis component of the polarized light finally reflected and Y-axis component carry out polarization interference at PBS, can be formulated
For:
Above formula yet suffers from ω t this, light intensity change the most over time and change, be unable to represent clearly
Relation between light intensity signal and the phase place advanced argument of output.In the case of assuming that index of modulation k is the most little, this formula is entered
Row simplifies:
Owing to the speed of photodetector is the highest, being equivalent to low-pass filtering, signal intensity is done integration, therefore formula can be with table
It is shown as:
WhereinCan be expressed as with the relation of modulating frequency f:
Therefore finally giving photodetector detection light intensity signal is cosine relation with modulating frequency:
Based on above theoretical derivation, a kind of based on secondary Polarization Modulation the high accuracy that the present invention designs as shown in Figure 1 is exhausted
Adjust the distance measurement apparatus, be made up of light path part and circuit part.
Light path part includes a 1550nm wavelength laser source 2, the polarization beam splitting of 1, circulator being sequentially arranged
4, phase-modulator of 3, Polarization Controller of device, 6, quarter wave plate 7 of 5, optical fiber collimator and one are anti-
Penetrate mirror system 12.
Described circuit part includes 10, high-frequency microwave source 9 of 8, A/D converter of a photodetector and one
Microcontroller 11.
Described circulator 2 includes 1 mouthful, 2 mouthfuls and 3 mouthfuls；Described 1550nm wavelength laser source 1 and described circulator 2
1 mouthful be connected, 2 mouthfuls of described circulator 2 are connected to described polarization beam apparatus 3, described photodetector 8 and described annular
Device 23 mouthfuls is connected.
Measurement apparatus of the present invention as shown in Figure 1 is utilized to realize large range high precision absolute distance measurement dress based on secondary polarization
Put, and according to following steps:
The laser beam that described 1550nm laser instrument 1 produces is from 1 mouthful of entrance of described circulator 2, and from 2 mouthfuls of outgoing；So
After be polarized through described polarization beam apparatus 3, controlled line polarisation to the rear and described phase place by described Polarization Controller 4 and adjusted
The fast axle of device 5 processed is 45° angle, it is achieved Polarization Modulation, and wherein the light in line polarized light Y-axis polarized component is adjusted by phase-modulator
System is higher, relatively low to the degree of light modulation in X-axis polarized component.Therefore the phase contrast in two polarized components changes,
Line polarized light is made to become elliptically polarized light, it is achieved Polarization Modulation.
Polarized light after described phase-modulator 5 is modulated sequentially passes through optical fiber collimator 6, quarter wave plate 7 and reflecting mirror 12
After sequentially passing through quarter wave plate 7, optical fiber collimator 6 after reflection again, carry out secondary Polarization Modulation through phase-modulator 5, on
During stating, polarized light twice, through quarter wave plate 7 and once after reflecting mirror 12 reflects, can realize X-axis and Y-axis
The process that polarized component is exchanged.During secondary modulation, it it is phase-modulator 5 X-axis former to line polarized light polarization point
Degree of light modulation in amount is higher, relatively low to the degree of light modulation in former Y-axis polarized component.Optical signal carries and tested distance D
Relevant phase information polarization interference on polarization beam apparatus 3 so that the phase information relevant to tested distance D becomes light intensity
Information, described polarization beam apparatus 3 output intensity signal；
The modulating frequency that described microcontroller 11 controls described high-frequency microwave source 9 by SPI communication exports, described microcontroller
11 numerical datas gathering described A/D converter 10；Change the modulating frequency output in high-frequency microwave source 9 with unique step, often change
Becoming the modulating frequency output in a high-frequency microwave source 9, described microcontroller 11 all gathers the most described A/D converter 10
Numerical data, thus the frequency sweep curve of output intensity signal and modulating frequency is obtained according to following formula.
Measuring method of the present invention, in order to solve fuzzy distance problem, is modulating frequency consecutive variations, i.e. small step during measuring
Long frequency sweep, the modulating frequency in high-frequency microwave source 9 is exported being gradually increased of unique step.Due to high-frequency microwave during frequency sweep
Modulating frequency is different, and corresponding polarized light phase information is different, in the numerical value difference of the present light intensity signal of final body.Fig. 2
Show modulating frequency frequency sweep curve in the range of 4.3G-4.4GHz.
In formula (1), I represents signal intensity；K is the modulation degree of phase-modulator 5, and L is tested distance, unit (unit m；
C is the light velocity, unit m；F is modulating frequency, unit Hz；
Utilizing this frequency sweep curve to obtain tested distance D, particular content is as follows:
During frequency sweep, microwave wavelength λ changes along with modulating frequency f, when measured distance D is modulating frequency f1Corresponding half
During N times of wavelength, signal strength detection is the minimum point of frequency sweep curve shown in Fig. 2, modulating frequency value f1To should be minimum
The extreme point of value point, when measured distance D is modulating frequency f2During N+1 times of corresponding half-wavelength, signal strength detection is frequency sweep
The adjacent minimum point of curve, modulating frequency value f2For to should the extreme point of minimum point.Two frequency sweeps are obtained by measurement
The modulating frequency extreme point f that minimum point adjacent on curve is corresponding1、f2, it may be assumed that
When tested distance D is modulating frequency f1During N times of corresponding half-wavelength, tested distance D and modulating frequency f1Relational expression
For:
In formula (2), N is half-wavelength integral multiple；λ1It is f for modulating frequency1Time corresponding microwave wavelength, unit m；f1For
The modulating frequency extreme point that signal intensity minimum point is corresponding, unit Hz；
When measured distance D is modulating frequency f2During N+1 times of corresponding half-wavelength, tested distance D and modulating frequency f2Pass
It is that formula is:
In formula (3), λ2It is f for modulating frequency2Time corresponding microwave wavelength, unit m；f2For signal intensity minimum point
Corresponding modulating frequency extreme point, unit Hz.
The modulating frequency extreme point f that on frequency sweep curve, two adjacent signal intensity minimum points are corresponding is obtained by frequency sweep curve1
And f2, by formula (2) and formula (3) simultaneous, thus obtain tested distance D.
To sum up, the feature of measuring method of the present invention is: by gained frequency sweep curve, finds two modulating frequency extreme point f1、f2
Measurement distance D can be calculated, and then eliminate the problem that fuzzy distance brings.
In absolute distance measurement device of the present invention and measuring method thereof, by optimizing systematic parameter, improving and improve algorithm, raising
Hardware module noiseproof feature, ultimate measurement accuracy can reach 10-6。
Although above in conjunction with accompanying drawing, invention has been described, but the invention is not limited in above-mentioned detailed description of the invention,
Above-mentioned detailed description of the invention is only schematic rather than restrictive, and those of ordinary skill in the art is in the present invention
Enlightenment under, without deviating from the spirit of the invention, it is also possible to make many variations, these belong to the guarantor of the present invention
Within protecting.
Claims (2)
1. a high accuracy absolute distance measurement device based on secondary Polarization Modulation, it is characterised in that by light path part and electricity
Road part is constituted, wherein:
Light path part includes the 1550nm wavelength laser source (1) being sequentially arranged, circulator (2), a polarization
Beam splitter (3), Polarization Controller (4), phase-modulator (5), optical fiber collimator (6), one 1/4
Wave plate (7) and a mirror system (12)；
Described circuit part includes a photodetector (8), A/D converter (10), a high-frequency microwave source (9)
With a microcontroller (11)；
Described circulator (2) includes 1 mouthful, 2 mouthfuls and 3 mouthfuls；Described 1550nm wavelength laser source (1) and described ring
1 mouthful of shape device (2) is connected, and 2 mouthfuls of described circulator (2) are connected to described polarization beam apparatus (3), described smooth electrical resistivity survey
Survey device (8) to be connected with described circulator (2) 3 mouthfuls.
2. a high accuracy absolute distance measurement method based on secondary polarization, it is characterised in that utilize such as claim 1 institute
State high accuracy absolute distance measurement device based on secondary polarization, and according to following steps:
The laser beam that described 1550nm laser instrument (1) produces is from 1 mouthful of entrance of described circulator (2), and goes out from 2 mouthfuls
Penetrate；It is then passed through described polarization beam apparatus (3) to be polarized, controls line polarisation to the rear by described Polarization Controller (4)
Be 45° angle with the fast axle of described phase-modulator (5), the polarized light after described modulation sequentially pass through optical fiber collimator (6),
After sequentially passing through quarter wave plate (7), optical fiber collimator (6) again after quarter wave plate (7) and reflecting mirror (12) reflection, pass through
Phase-modulator (5) carries out secondary Polarization Modulation；Optical signal carries the phase information relevant to tested distance D at polarization point
The upper polarization interference of bundle device (3) so that the phase information relevant to tested distance D becomes intensity signal, described polarization beam apparatus
(3) output intensity signal；
The modulating frequency that described microcontroller (11) controls described high-frequency microwave source (9) by SPI communication exports, described micro-
Controller (11) gathers the numerical data of described A/D converter (10)；The tune in high-frequency microwave source (9) is changed with unique step
Rate-adaptive pacemaker processed, often changes the modulating frequency output of a high-frequency microwave source (9), and described microcontroller (11) all gathers one
The numerical data of secondary described A/D converter (10), thus the frequency sweep of output intensity signal and modulating frequency is obtained according to following formula
Curve:
In formula (1), I represents signal intensity；K is the modulation degree of phase-modulator (5), and L is tested distance, and unit is (single
Position m；C is the light velocity, unit m；F is modulating frequency, unit Hz；
When tested distance D is modulating frequency f1During N times of corresponding half-wavelength, tested distance D and modulating frequency f1Relational expression
For:
In formula (2), N is half-wavelength integral multiple；λ1It is f for modulating frequency1Time corresponding microwave wavelength, unit m；f1For
The modulating frequency extreme point that signal intensity minimum point is corresponding, unit Hz；
When measured distance D is modulating frequency f2During N+1 times of corresponding half-wavelength, tested distance D and modulating frequency f2Pass
It is that formula is:
In formula (3), λ2It is f for modulating frequency2Time corresponding microwave wavelength, unit m；f2For signal intensity minimum point
Corresponding modulating frequency extreme point, unit Hz；
Two adjacent and f on frequency sweep curve are obtained by frequency sweep curve2, by formula (2) and formula (3) simultaneous, thus obtain
Tested distance D.
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106772415A (en) * | 2017-01-17 | 2017-05-31 | 中国科学院光电研究院 | A kind of phase ranging device and its distance-finding method |
| CN106842227A (en) * | 2017-03-07 | 2017-06-13 | 中国科学院大学 | Precision optics distance-finding method based on zero refractive index Meta Materials |
| CN112180390A (en) * | 2020-09-18 | 2021-01-05 | 常州大学 | Distance measuring device and method |
| CN112383359A (en) * | 2021-01-15 | 2021-02-19 | 中国工程物理研究院激光聚变研究中心 | Multi-stage phase modulation system |
| CN112433221A (en) * | 2020-12-15 | 2021-03-02 | 深圳市中图仪器股份有限公司 | Absolute distance measuring device based on polarization modulation |
| CN114234954A (en) * | 2022-02-28 | 2022-03-25 | 深圳奥斯诺导航科技有限公司 | Double sensitization optical path integrated optical fiber gyroscope |
| CN114659458A (en) * | 2022-04-29 | 2022-06-24 | 天津大学 | Rotor-stator axial clearance online measuring device based on dual-wavelength sweep frequency polarization modulation |
| CN115597489A (en) * | 2020-12-25 | 2023-01-13 | 深圳市中图仪器股份有限公司（Cn） | Distance measuring system |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102012202975A1 (en) * | 2012-02-28 | 2013-08-29 | Robert Bosch Gmbh | Procedure for environment detection and driver assistance system |
-
2016
- 2016-06-12 CN CN201610412017.7A patent/CN105938198A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102012202975A1 (en) * | 2012-02-28 | 2013-08-29 | Robert Bosch Gmbh | Procedure for environment detection and driver assistance system |
Non-Patent Citations (3)
| Title |
|---|
| 肖洋 等: "二次偏振调制测距系统中调制频率与测距精度的关系", 《物理学报》 * |
| 肖洋 等: "干涉解调鉴相测距法", 《光电子.激光》 * |
| 黑克非 等: "基于二次偏振调制的变频测距方法与系统实现", 《物理学报》 * |
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106772415A (en) * | 2017-01-17 | 2017-05-31 | 中国科学院光电研究院 | A kind of phase ranging device and its distance-finding method |
| CN106842227A (en) * | 2017-03-07 | 2017-06-13 | 中国科学院大学 | Precision optics distance-finding method based on zero refractive index Meta Materials |
| CN106842227B (en) * | 2017-03-07 | 2019-04-16 | 中国科学院大学 | Precision optics distance measuring method based on zero refractive index Meta Materials |
| CN112180390A (en) * | 2020-09-18 | 2021-01-05 | 常州大学 | Distance measuring device and method |
| CN112180390B (en) * | 2020-09-18 | 2022-05-06 | 常州大学 | Distance measuring device and method |
| CN112433221A (en) * | 2020-12-15 | 2021-03-02 | 深圳市中图仪器股份有限公司 | Absolute distance measuring device based on polarization modulation |
| CN112433221B (en) * | 2020-12-15 | 2023-06-27 | 深圳市中图仪器股份有限公司 | Absolute distance measuring device based on polarization modulation |
| CN115597489A (en) * | 2020-12-25 | 2023-01-13 | 深圳市中图仪器股份有限公司（Cn） | Distance measuring system |
| CN115597489B (en) * | 2020-12-25 | 2023-08-18 | 深圳市中图仪器股份有限公司 | Distance measuring system |
| CN112383359B (en) * | 2021-01-15 | 2021-04-16 | 中国工程物理研究院激光聚变研究中心 | Multi-stage phase modulation system |
| CN112383359A (en) * | 2021-01-15 | 2021-02-19 | 中国工程物理研究院激光聚变研究中心 | Multi-stage phase modulation system |
| CN114234954A (en) * | 2022-02-28 | 2022-03-25 | 深圳奥斯诺导航科技有限公司 | Double sensitization optical path integrated optical fiber gyroscope |
| CN114659458A (en) * | 2022-04-29 | 2022-06-24 | 天津大学 | Rotor-stator axial clearance online measuring device based on dual-wavelength sweep frequency polarization modulation |
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