CN105896534B - Meter and the transmission system malfunction collection screening technique of circuit importance and the degree of association - Google Patents

Meter and the transmission system malfunction collection screening technique of circuit importance and the degree of association Download PDF

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Publication number
CN105896534B
CN105896534B CN201610327966.5A CN201610327966A CN105896534B CN 105896534 B CN105896534 B CN 105896534B CN 201610327966 A CN201610327966 A CN 201610327966A CN 105896534 B CN105896534 B CN 105896534B
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circuit
degree
factor
association
importance
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CN105896534A (en
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贾燕冰
梁琛
韩肖清
何海丹
王鹏
王英
刘睿琼
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Taiyuan University of Technology
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    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02JCIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J3/00Circuit arrangements for ac mains or ac distribution networks
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02JCIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J2203/00Indexing scheme relating to details of circuit arrangements for AC mains or AC distribution networks
    • H02J2203/20Simulating, e g planning, reliability check, modelling or computer assisted design [CAD]

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Remote Monitoring And Control Of Power-Distribution Networks (AREA)
  • Supply And Distribution Of Alternating Current (AREA)

Abstract

The present invention relates to a kind of malfunction screening technique of technical field of electric power, specially meter and the transmission system malfunction collection screening technique of circuit importance and the degree of association, including Step 1: determine circuit importance and the degree of association;Step 2: determine the probability factor of circuit;Step 3: determine the importance factors of circuit;Step 4: the system of determining single order fault set;Step 5: the system of determiningnRank fault set.The influence of the criticality and reliability double factor of present invention meter and circuit, influences serious fault set to system reliability and screens.Fast convergence rate of the present invention, calculate the time it is short, can more real reaction system reliability level, be a kind of malfunction collection rapid screening method of very promising Model in Reliability Evaluation of Power Systems.

Description

Meter and the transmission system malfunction collection screening technique of circuit importance and the degree of association
Technical field
The present invention relates to a kind of technical field of electric power malfunction collection screening technique, specially meter and circuit importance and pass The transmission system malfunction collection screening technique of connection degree.
Background technology
With constantly expanding for power grid scale, number of elements quickly increases in geometric progression, and random event occurs for electric system The possibility of barrier improves therewith.And with electrified development, electric power has been related to the every aspect of national economy, Random event If part, which causes electric system function to be lost, will bring huge economy and social loss.It is real to assess the reliable of electric system Property it is horizontal, and instruct Electric Power Network Planning on this basis and scheduling be safeguards system reliability service key.
Electric system generally can be divided into electricity generation system, transmission system and distribution system, since power grid is in large scale, Generation System Reliability assessment, Transmission System Reliability Evaluations, reliability evaluation are generally divided into during reliability assessment Deng.Reliability assessment generally comprises the selection of system fault condition collection, fault effects analysis and reliability index and calculates.Wherein in event Hinder state set selection when, generally simplify calculate, be two state models usually by element equivalent, that is, think element only work with 2 states of stoppage in transit, it is assumed that system includes n element, then might have 2nKind system running state, is subject to computing resource and calculating The limitation of time, it is impossible to assess all malfunctions.Can to system therefore, it is necessary to design rational algorithm screening Big malfunction is influenced by property to be assessed, and such as is used failure tuple to limit, is blocked probability, failure modes technology to be to reduce Calculation amount.But influence of the probability of failure generation to reliability is only considered during generic failure condition selecting, and actual power train High-probability event not necessarily causes big influence in system, and some low probability events are but possible to that massive blackout can be caused, very To causing system crash.Only consider that the probability of failure generation to Power System Reliability Analysis, is likely to result in assessment result mistake In optimism.Such as the ultra-high-tension power transmission line of electric system, since its effect in systems is extremely important, usual electric power enterprise meeting Its reliability is improved by various measures, its outage rate is generally relatively low, and probability of malfunction may ignore such if considering merely System fault condition caused by transmission line of electricity, can not consider this influence of partial fault consequence to system reliability.Equally, if Only consider event severity of consequence, it is possible to assessment result can be caused excessively pessimistic, it is defeated especially as super-pressure extra-high voltage The development of power technology, once remote high power transmission circuit failure can cause huge unbalanced power, or even causes system Unstability, if the probability for only considering failure effect at this time and taking no account of event generation is scheduled tactical arrangement, and can substantially reduce The economy of system operation.
For transmission system, how since influence factor is more, and there is complicated non-linear relation between circuit Reliability progress rational assessment of the influence of meter and circuit to system is more difficult, such as capacity of trunk, actual trend, topological position Put, trend component etc..Once after system jam, since electric network composition changes, all circuits are in new electricity Significance level in net will be different from original power grid, and shadow can be also produced for the definite scheme of multiple failure in reliability assessment Ring, the critical role of definite circuit is still ranked up using the significance level of circuit in original power grid, it will effect is lost, and it is every The significance level of circuit is all recalculated after secondary power grid change, and can make it that the calculating time is too long, increases the generation of reliability assessment Valency, even more so that the program is infeasible since computing resource constrains.For the economy and reliability of balanced electric system, need Rational malfunction collection screening technique is designed, really to react the reliability level of electric system as far as possible.Therefore, it is defeated The probability of event generation, and status of the circuit in electric system must be taken into account during electric system reliability assessment at the same time, it is comprehensive Determine transmission system malfunction collection.
The content of the invention
The present invention is single and cause assessment errors big in order to solve existing Model in Reliability Evaluation of Power Systems method Consideration The problem of, there is provided a kind of meter and the transmission system malfunction collection screening technique of circuit importance and the degree of association.This method is adopted Single order failure is determined with circuit importance, multistage failure is determined according to the degree of association, to improve the efficiency of reliability assessment and accurate Degree.
The present invention adopts the following technical scheme that realization:Meter and the transmission system failure of circuit importance and the degree of association State set screening technique, comprises the following steps:
Step 1:Determine circuit importance and the degree of association:
(1) the absolute trend factor of circuit i is determinedI.e. circuit i's is absolute The ratio of trend and the transmission capacity upper limit of circuit i, wherein l is system line way, and q is system unit number,For on circuit i Absolute trend, PimaxFor the transmission capacity upper limit of circuit i, PksThe active power sent for generator k,For generator branch Power distribution factor, i.e., the active power that injection circuit i is sent by generator k account for the ratio of the active power that generator k is sent;
(2) weight factor of circuit i is determinedG be and the direct-connected line set of generator, Pi For the actual effective power flow in circuit i.I.e. for common line, its weight factor is its line load rate;The direct-connected line of generator Road, its weight factor account for the ratio sum of the two of system power generation total amount for line load rate and line transmission power;
(3) the criticality factor of circuit i is determinedThe criticality factor of circuit is bigger, illustrates the absolute trend of circuit The factor is bigger or circuit weight factor is bigger, i.e. the importance of circuit in systems is higher;
(4) degree of association factor between circuit is determined And j≠i.Effect of both bigger explanations of the degree of association factor between any two lines road i, j in terms of transimission power is closer, and one Its simultaneous faults of denier, the power carried thereon are likely to not transmit due to Transmission Capacity Constraints, cause system cutting load, Reduce reliability;
Step 2:Determine the probability factor θ of circuit ii=pdi/pui, wherein pdiFor the stoppage in transit probability of circuit i, puiFor circuit The operation probability of i;
Step 3:Determine the importance factors φ of circuit iiiFi, i.e., with the circuit criticality of circuit probability factor weighting The factor, considers the circuit criticality factor and circuit probability factor, to system after the bigger and more important line fault of probability Reliability effect it is bigger;
Step 4:Determine system single order fault set:System single element failure is known as single order failure, according to circuit importance Factor φiiFiOrder from big to small, sets circuit i failures, the single order malfunction as system successively;
Step 5:Determine system n rank fault sets:The state for having n element fault in system is known as n rank failures, and 1<n<l. On the basis of single order fault set, determine the degree of association factor of remaining circuit and faulty line, by remaining circuit by the degree of association because Son sequence, obtains second order fault set.On the basis of second order fault set, the degree of association of remaining circuit and two faulty lines is determined The factor, and the degree of association fac-tor of the maximum degree of association factor and Second Order state circuit is selected as the three ranks failure The degree of association factor of the circuit of state, malfunction is sorted according to the degree of association factor, obtains three rank fault sets.And so on, In k (k>2) on the basis of rank fault set, determine the degree of association factor of remaining circuit and k bar faulty lines, and select wherein maximum The degree of association factor and kth rank status line degree of association fac-tor associating as the circuit of the state of the k+1 rank failures The factor is spent, malfunction is sorted according to the degree of association factor, obtains k+1 rank fault sets.Using fast sorting technique, determine successively The n rank malfunctions of system, so that it is determined that the n rank fault sets of system, finally obtain single order to n rank fault sets.
The influence of this method meter and circuit criticality and circuit probability factor, it is proposed that circuit importance factors, by right The sequence of circuit importance factors, determines the single order fault set of electric system, and on the basis of single order fault set, according to circuit The degree of association factor determines the n rank malfunction collection of system.The fault set rapid screening method selection on system reliability influence compared with Big state is assessed, can more rational assessment system reliability level, be Power System Planning and management and running Feasible suggestion is provided.
Embodiment
Meter and the transmission system malfunction collection screening technique of circuit importance and the degree of association, comprise the following steps:
Step 1:Determine circuit importance and the degree of association:
(1) the absolute trend factor of circuit i is determinedWherein l is system line Way, q are system unit number,For the absolute trend on circuit i, PimaxFor the transmission capacity upper limit of circuit i, PksFor power generation The active power that machine k is sent,For generator branch power distribution factor.
(2) weight factor of circuit i is determinedG be and the direct-connected line set of generator, Pi For the actual effective power flow in circuit i.
(3) the criticality factor of circuit i is determined
(4) degree of association factor between circuit is determined And j≠i。
Step 2:Determine the probability factor θ of circuit ii=pdi/pui, wherein pdiFor the stoppage in transit probability of circuit i, puiFor circuit The operation probability of i.
Step 3:Determine the importance factors φ of circuit iiiFi
Step 4:According to circuit importance factors φiiFiOrder from big to small, sets circuit i failures, really successively Determine the single order malfunction collection of system.
Step 5:Determine system n rank fault sets:The state for having n element fault in system is known as n rank failures, and 1<n<l. On the basis of single order fault set, determine the degree of association factor of remaining circuit and faulty line, by remaining circuit by the degree of association because Son sequence, obtains second order fault set.On the basis of second order fault set, the degree of association of remaining circuit and two faulty lines is determined The factor, and the degree of association fac-tor of the maximum degree of association factor and Second Order state circuit is selected as the three ranks failure The degree of association factor of the circuit of state, malfunction is sorted according to the degree of association factor, obtains three rank fault sets.Such as 2 rank therefore Barrier include faulty line (1,2), it is determined that during 3 rank failure, selection circuit 3 with it is larger in the degree of association factor of circuit 1 and circuit 2 Person, then the degree of association factor of 3 rank failures (1,2,3) beIn k (k>2) basis of rank fault set On, determine the degree of association factor of remaining circuit and k bar faulty lines, and select the maximum degree of association factor and kth scalariform The degree of association factor of the degree of association fac-tor of state circuit as the circuit of the state of the k+1 rank failures, by malfunction according to The degree of association factor sorts, and obtains k+1 rank fault sets.Using fast sorting technique, the n rank malfunctions of system are determined successively, from And determine the n rank fault sets of system, single order is finally obtained to n rank fault sets.
The meter and the transmission system malfunction collection screening technique of circuit importance and the degree of association of the present invention, considers line The effect of road in systems, and the probability of circuit reliability service, can taking into account maximum probability, matters of aggravation and small probability be not serious Consequential event, the more comprehensively reliability level of assessment electric system, while fast convergence rate, the calculating time is shorter, is A kind of malfunction collection rapid screening method of very promising Model in Reliability Evaluation of Power Systems.

Claims (1)

1. meter and the transmission system malfunction collection screening technique of circuit importance and the degree of association, it is characterised in that including following step Suddenly:
Step 1:Determine circuit importance and the degree of association:
(1) the absolute trend factor of circuit i is determinedWherein l is system line Number, q is system unit number,For the absolute trend on circuit i, PimaxFor the transmission capacity upper limit of circuit i, PksFor generator k The active power sent,For generator branch power distribution factor;
(2) weight factor of circuit i is determinedG be and the direct-connected line set of generator, PiFor line Actual effective power flow in the i of road;
(3) the criticality factor of circuit i is determined
(4) degree of association factor between circuit is determinedJ=1,2 ... ..., l, and j ≠ i;
Step 2:Determine the probability factor θ of circuit ii=pdi/pui:Wherein pdiFor the stoppage in transit probability of circuit i, puiFor circuit i's Run probability;
Step 3:Determine the importance factors φ of circuit iiiFi
Step 4:According to circuit importance factors φiiFiOrder from big to small, sets circuit i failures successively, determines system The single order malfunction collection of system;
Step 5:On the basis of single order malfunction collection, the degree of association factor of remaining circuit and faulty line is determined, by remaining Circuit sorts by the degree of association factor, using fast sorting technique is improved, determines the n rank malfunctions of system successively, determines system N rank malfunction collection, 1<n<L, finally obtains single order to n rank malfunction collection.
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