CN105893195A - Method for optimizing PCI-X card on-line test - Google Patents

Method for optimizing PCI-X card on-line test Download PDF

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Publication number
CN105893195A
CN105893195A CN201610199837.2A CN201610199837A CN105893195A CN 105893195 A CN105893195 A CN 105893195A CN 201610199837 A CN201610199837 A CN 201610199837A CN 105893195 A CN105893195 A CN 105893195A
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China
Prior art keywords
test
usb
pci
card
interface
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Pending
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CN201610199837.2A
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Chinese (zh)
Inventor
信召建
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Inspur Electronic Information Industry Co Ltd
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Inspur Electronic Information Industry Co Ltd
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Application filed by Inspur Electronic Information Industry Co Ltd filed Critical Inspur Electronic Information Industry Co Ltd
Priority to CN201610199837.2A priority Critical patent/CN105893195A/en
Publication of CN105893195A publication Critical patent/CN105893195A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention discloses a method for optimizing the online Test of a PCI-X card, which realizes the automation of the online function Test of the PCI-X card by manufacturing a Test U disk and completing the functions of USB number Check, USB read Test and USB write Test through a software program. According to the invention, by optimizing the PCI-X card online function test method, automatic test can be realized, manual participation operation is avoided, manual test function leakage is effectively reduced, and meanwhile, error rate is effectively reduced by means of QN scanning fool-proofing; by optimizing the PCI-X card online function test method, the test efficiency can be effectively improved, the test time and cost are saved, and the operation of an operator is easy.

Description

A kind of method optimizing PCI-X card on-line testing
Technical field
The present invention relates to board technical field of measurement and test, be specifically related to a kind of method optimizing PCI-X card on-line testing, relate to server hardware PCBA (Printed Circuit Board Assembly) on-line testing field, mainly for PCI-X(Peripheral Components Interconnect-X in server) traditional in-circuit function test method manual test test event of using of card easily misses, error-prone, not fool proof, time-consuming longer problem, it is optimized by PCI-X is stuck in wire testing method, realize automatic test, reduce manual hand manipulation's leakage, improve the efficiency of on-line testing.
Background technology
Pci bus (the Peripheral that PCI-X interface is and connects Components Interconnect) more redaction, still use traditional bussing technique, but with greater number of wiring stitch, meanwhile, foregoing all of attachment means can share all available frequency ranges.
PCI-X card is typically only present on server master board, PCI-X is the most the same with the PCI of 64bit in shape, but they use different standards, the slot of PCI-X can be with the card (being distinguished by stitch) of compatible with PCI, PCI-X is also to share bus, insert multiple devices transfer rate can decline, the most progressively by PCI-E(PCI Express) substitute, the most a lot of servers of configuration are also using PCI-X card.
The in-circuit function test process of traditional PCI-X card:
1) PCI-X is snapped fitted on a piece of server master board, two PCI-USB adapters are inserted on two slots of PCI-X card respectively, USB flash disk is coupled with 10 USB flash disk interfaces of two PCI-USB adapters, and hard disk needs to install operating system, is then attached on mainboard;
2) plug in module, start, enters system.If PCI-X card function is normal, first it can be seen that these 10 USB flash disks under system, and the content of these 10 USB flash disks can be consulted, i.e. complete USB and read functional test;
3) certain file is copied, certain file of hundreds of million under optional system directory, it is individually copied under these 10 USB flash disks, sees if there is and report an error, then confirm function OK without reporting an error, i.e. complete USB and write functional test;
The in-circuit function test process of above PCI-X card is all that manual hand manipulation completes, and needs USB flash disk quantity that artificial judgment reads and USB read-write capability the most normal, and artificial judgment is very easy to cause functional test to be missed, and efficiency is low, not fool proof.
Summary of the invention
The technical problem to be solved in the present invention is: for problem above, for solving manually to participate in judging, being optimized the in-circuit function test method of PCI-X, the present invention proposes a kind of method optimizing PCI-X card on-line testing.
The technical solution adopted in the present invention is:
A kind of method optimizing PCI-X card on-line testing, described method, by making test USB flash disk, completes USB numbers Check, USB read Test, USB write Test function by software program, it is achieved the automatization of PCI-X card in-circuit function test simultaneously.
Described method, by utilizing scanner to scan board label, carries out fool proof by different bar codes.
Described method maneuvering sequence is as follows:
1) making test USB flash disk, test formula comprises USB numbers Check、USB read Test、USB write Test;
2) being inserted in USB interface by 9 USB flash disks, wherein test USB flash disk is inserted on the PCIE-USB adapter of lower section;
3) keyboard and scanner are connected;
4) check errorless after turn on the power switch, start process is pressed F11, at following interface, select " UEFI:Built-in EFI Shell ", carriage return;
5) after entering scanning prompting interface, by the bar code on scanner sweep test board;
6) system is tested automatically;
7) show after having tested that following PASS(passes through) interface or FAIL(failure) interface:
8) shut down by carriage return, after shutdown, assemble another sheet board, continue under test a piece of.
Described scanning prompting interface is scanning backboard QN interface.
The invention have the benefit that
Traditional online function test method of PCI-X card, completes functional test step by step owing to relying primarily on manual operation, certainly exists artificial leakage and surveys risk by mistake, simultaneously because it is more to test used USB flash disk, the longest.And the bright spot of the present invention:
1) by optimizing the online function test method of PCI-X card, it is possible to achieve automatic test, it is to avoid artificial Attended Operation, effectively reduce the leakage of artificial test function, scan fool proof by QN simultaneously, effectively reduce error rate;
2) by optimizing the online function test method of PCI-X card, the efficiency of test be can effectively promote, testing time and cost, and easily operated member operation saved.
Accompanying drawing explanation
Fig. 1 is that QN scans surface chart.
Detailed description of the invention
Below in conjunction with Figure of description, according to detailed description of the invention, the present invention is further described:
Embodiment 1:
A kind of method optimizing PCI-X card on-line testing, described method, by making test USB flash disk, completes USB numbers Check, USB read Test, USB write Test function by software program, it is achieved the automatization of PCI-X card in-circuit function test simultaneously.
Embodiment 2
On the basis of embodiment 1, method described in the present embodiment, by utilizing scanner to scan board label, carries out fool proof by different bar codes.
Embodiment 3
On the basis of embodiment 2, described in the present embodiment, method maneuvering sequence is as follows:
1) making test USB flash disk, test formula comprises USB numbers Check、USB read Test、USB write Test;
2) being inserted in USB interface by 9 USB flash disks, wherein test USB flash disk is inserted on the PCIE-USB adapter of lower section;
3) keyboard and scanner are connected;
4) check errorless after turn on the power switch, start process is pressed F11, at following interface, select " UEFI:Built-in EFI Shell ", carriage return;
5) after entering scanning prompting interface, by the bar code on scanner sweep test board;
6) system is tested automatically;
7) show after having tested that following PASS(passes through) interface or FAIL(failure) interface:
8) shut down by carriage return, after shutdown, assemble another sheet board, continue under test a piece of.
Embodiment 4
As it is shown in figure 1, on the basis of embodiment 3, scanning prompting interface described in the present embodiment is scanning backboard QN interface.
Embodiment of above is merely to illustrate the present invention; and not limitation of the present invention; those of ordinary skill about technical field; without departing from the spirit and scope of the present invention; can also make a variety of changes and modification; the technical scheme of the most all equivalents falls within scope of the invention, and the scope of patent protection of the present invention should be defined by the claims.

Claims (4)

1. the method optimizing PCI-X card on-line testing, it is characterised in that: described method, by making test USB flash disk, completes USB by software program simultaneously Numbers Check, USB read Test, USB write Test function, it is achieved the automatization of PCI-X card in-circuit function test.
A kind of method optimizing PCI-X card on-line testing the most according to claim 1, it is characterised in that: described method, by utilizing scanner to scan board label, carries out fool proof by different bar codes.
A kind of method optimizing PCI-X card on-line testing the most according to claim 2, it is characterised in that described method maneuvering sequence is as follows:
1) making test USB flash disk, test formula comprises USB numbers Check、USB read Test、USB write Test;
2) being inserted in USB interface by 9 USB flash disks, wherein test USB flash disk is inserted on the PCIE-USB adapter of lower section;
3) keyboard and scanner are connected;
4) check errorless after turn on the power switch, start process is pressed F11, at following interface, select " UEFI: Built-in EFI Shell ", carriage return;
5) after entering scanning prompting interface, by the bar code on scanner sweep test board;
6) system is tested automatically;
7) following PASS interface or FAIL interface are shown after having tested:
8) shut down by carriage return, after shutdown, assemble another sheet board, continue under test a piece of.
A kind of method optimizing PCI-X card on-line testing the most according to claim 3, it is characterised in that: described scanning prompting interface is scanning backboard QN interface.
CN201610199837.2A 2016-04-01 2016-04-01 Method for optimizing PCI-X card on-line test Pending CN105893195A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610199837.2A CN105893195A (en) 2016-04-01 2016-04-01 Method for optimizing PCI-X card on-line test

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Application Number Priority Date Filing Date Title
CN201610199837.2A CN105893195A (en) 2016-04-01 2016-04-01 Method for optimizing PCI-X card on-line test

Publications (1)

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CN105893195A true CN105893195A (en) 2016-08-24

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107423175A (en) * 2017-06-29 2017-12-01 郑州云海信息技术有限公司 Server test mounting seat and the measurement jig that server CPU module can be replaced

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2391355A (en) * 2002-05-01 2004-02-04 Sun Microsystems Inc Single chip system-on-a-chip device having a processor, DRAM, an input/output bus and, memory and bus controllers
US20080127347A1 (en) * 2006-11-29 2008-05-29 Farrel David Benton System and Method for Autonomic Peer-to-Peer Virus Inoculation
CN104615522A (en) * 2015-02-02 2015-05-13 浪潮电子信息产业股份有限公司 Method for testing functional integrity of PCI-E adapter card on line
CN105335264A (en) * 2015-11-12 2016-02-17 浪潮电子信息产业股份有限公司 Computer PCIE adapter card function test method based on UEFI

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2391355A (en) * 2002-05-01 2004-02-04 Sun Microsystems Inc Single chip system-on-a-chip device having a processor, DRAM, an input/output bus and, memory and bus controllers
US20080127347A1 (en) * 2006-11-29 2008-05-29 Farrel David Benton System and Method for Autonomic Peer-to-Peer Virus Inoculation
CN104615522A (en) * 2015-02-02 2015-05-13 浪潮电子信息产业股份有限公司 Method for testing functional integrity of PCI-E adapter card on line
CN105335264A (en) * 2015-11-12 2016-02-17 浪潮电子信息产业股份有限公司 Computer PCIE adapter card function test method based on UEFI

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107423175A (en) * 2017-06-29 2017-12-01 郑州云海信息技术有限公司 Server test mounting seat and the measurement jig that server CPU module can be replaced
CN107423175B (en) * 2017-06-29 2021-02-02 苏州浪潮智能科技有限公司 Mounting base for server test and test fixture capable of replacing server GPU module

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Application publication date: 20160824