CN105844077B - A kind of testability growth test method based on timely correction strategy - Google Patents
A kind of testability growth test method based on timely correction strategy Download PDFInfo
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Abstract
The invention discloses a kind of testability growth test methods based on timely correction strategy, it is therefore an objective to solve the problems, such as the test method for lacking system when carrying out the testability growth test based on timely correction strategy.Technical solution is：Then the testability initial level being had first according to previous information analytical equipment calculates expectancy changes process of the equipment Test index during testability growth test, draw experiment planning curve；Then the testability index situation of change equipped after real-time computed improved during experiment；Finally by testability index actual change process compared with expectation process, so as to provide experiment process control decisions.It can solve the problems, such as that the testability growth test currently based on timely correction strategy lacks experiment planing method using the present invention；Can also effective monitoring system under test (SUT) testability propagation process, by way of adjusting testability growth test scheme in time, Control experiment process reduces empirical risk and cost.
Description
Technical field
The present invention relates to the testability development test methods in equipment preparation stage；It is based especially on the survey of timely correction strategy
Examination property growth test method.
Background technology
Testability is to equip the ability that can be correctly detected under stipulated time and regulation environment with isolated fault, Ke Yiyong
A variety of testability indexes are weighed, including fault detect rate (FDR), Percent Isolated (FIR), false alarm rate (FAR) etc..For large size
For complex equipment, often there is various problems, such as unpredictable failure in the design process for fault diagnosis system, survey
Examination failure, ambiguity group, inappropriate testability tolerance and threshold value etc..The testability level of equipment is made to reach design requirement, just
It needs that testability design defect is gone to differentiate and corrected by various means, so as to improve the testability index of equipment, realizes test
Property increase.
GJB2547A《Equipment Test sex work General Requirement》In clearly give testability growth basic conception：It is producing
During product development and use, by gradually correcting the testability defect of product, product test level is continuously improved, so as to reach
To the process of target.Although testability, which increases, to be realized by the design based on model and other methods, test
Property growth test be still most efficient method, be even more such as all kinds of new systems of grinding for having strong request to system testing
This.Testability growth test realizes the growth of testability index by a series of Test-amend-experiment process, until meeting
The testability index requirement of system.
The consumption of time and resource is can not ignore in experiment, and the especially test period and experimental condition has much not
Determine that the testability growth property experiment of factor is even more so, it is therefore necessary to there is the test method of science, so as to reduce experimentation cost,
Shorten the test period.However, for how specifically to carry out testability growth test, in the relevant criterion announced at present not
Concrete regulation.According to the experience of reliability growth test, growth test work includes experiment planning, experiment is implemented, experiment tracking
With estimated four aspect.It is exactly specifically to provide rational testing program before growth test is embodied, then according to examination
Proved recipe case carries out direct fault location experiment, and exposed design defect is improved, and is then utilized during experiment and tests number
Increase effect, and track and the timely Adjustment Tests scheme of intended result according to increasing according to timely assessment.Use for reference reliability growth examination
Process is tested, timely correction strategy is one of test method that testability growth test uses.For using timely correction strategy
Testability growth test in terms of, only Zhao Chenxu (the Zhao Chenxu et al.A Markov of the National University of Defense technology
Chain-Based Testability Growth Model With a Cost-Benefit Function are i.e. based on Ma Erke
The testability model of growth of husband's chain and cost-effectiveness function is published in ieee transactions on systems, man, and
cybernetics:systems,doi:10,1109/tsmc.2015.2437837) and the Li Tian of engineering college of liberation army Second Artillery Force
Plum (T.M.Li et al.The Assessment and Foundation of Bell-Shaped Testability
Growth Effort Functions Dependent System Testability Growth Models Based on
NHPP is the modeling of testability model of growth and application for increasing Efficiency Function based on NHPP and bell type testability, is specifically shown in
http://dx.doi.org/10.1155/2015/613170) it is studied in correlative theses, but there are bright for these researchs
Aobvious deficiency：1) specific implementation method of the testability growth test based on timely correction strategy is not provided clearly；2) it is carried
Model of growth is parameter model, and relevant parameter needs to obtain using estimation of test data, is difficult to estimate before experiment is carried out
Its value, therefore, it is difficult to be used for the planning and formulation of testability growth test scheme.Increase to more effectively carry out testability
Experiment, it is necessary to for the testability growth test based on timely correction strategy, provide a kind of test method of system.
Invention content
The technical problem to be solved in the present invention：For at present in testability growth test of the development based on timely correction strategy
When, lack the present situation of the test method of system, a kind of testability growth test method is provided.It can be in experiment opening using this method
Before beginning to implement, installation feature, historical data, designer's technical merit factor are considered, provide rational testability and increase
Long testing program, and testing program can in time be adjusted according to the tracking result for increasing effect during experiment,
Process is tested so as to which strictly control is entire, reduces empirical risk and cost.
The technical solution of testability growth test method proposed by the present invention based on timely correction strategy is：
1st step, according to system under test (SUT) fault mode, influence and HAZAN (FMECA) result (GJB1391-2006
《Fault mode, influence and HAZAN guide》) determine fault mode sum N possessed by system under test (SUT)；
2nd step collects testability data early period, including testability prediction result, testability virtual test data, testability
Know the real situation the testability index design requirement value req of test data, expertise, designer's designed capacity and system under test (SUT)；
According to FMECA results and testability data early period collected, all fault modes are set according to testability for 3rd step
Meter updatability is divided into two class of renewable fault mode and non-renewable fault mode, and system under test (SUT) is divided into two sons accordingly
System：The subsystem of renewable fault mode composition and the subsystem of non-renewable fault mode composition, are then estimated using Bayes
Meter method (Wang Chao,《Testability experiment and the comprehensive assessment technology that actual situation combines》, National University of Defense technology's academic dissertation, 2014,
Page 81 page-the 92) calculate non-renewable subsystem with fault detect probability β and renewable subsystem with it is initial therefore
Hinder detection probability α；
4th step utilizes (1) formula to calculate the primary fault undetected probability p (1) that renewable subsystem has；
P (1)=1- α (1)
5th step utilizes (2) formula to calculate the testability index growth goal value σ of renewable subsystem,
Wherein K is that fault mode sum, λ may be updated in renewable subsystemiFor i-th kind of fault mode failure rate, 1≤i
≤N；
6th step, (3) formula is utilized to calculate renewable subsystem needs failure to be achieved undetectable at the end of growth test
Probability pend；
pend=1- σ (3)
Historical experience is increased according to similar similar system testability simultaneously, being determined by system designer and trial person can
The average update coefficient f of fault mode is updated, the direct fault location of failure is allowed to test before 0 ＜ f≤1 and every time design update
(GJB2547A《Equipment Test sex work General Requirement》) number m, 1≤m≤K/2；
7th step, enables k=1；
8th step, being calculated before kth secondary design is improved using (4) formula needs the direct fault location test number (TN) r carried outkExpectation
Value E (rk),
E (p (k)) is the desired value for the failure undetected probability p (k) that subsystem may be updated before kth secondary design is improved；
9th step utilizes (5) formula to calculate the testability index growth factor q that subsystem may be updated when kth secondary design is improved
(k) desired value E (q (k))；
10th step utilizes subsystem may be updated in (6) formula update kth secondary design failure undetected probability after improving it is expected
Value E (p (k+1))；
11st step utilizes (7) formula to calculate experiment and proceeds to direct fault location experiment total degree R required during the kth stagekPhase
Prestige value E (Rk)；
12nd step, if E (p (k+1))≤preq, turn the 13rd step, otherwise enable k=k+1, and go to the 8th step；
13rd step, with E (Rk) it is horizontal axis, drawing testability as shown in Figure 2 for the longitudinal axis with 1-E (p (k)) increases planning song
Line, and renewable subsystem testing growth test scheme is formulated according to the curve；
14th step, enables k=1；
15th step, the simple random sampling side with reference to as defined in GJB2072-94 is " maintainability test and evaluation " national military standard
Method selects fault mode from renewable fault mode concentration and carries out direct fault location experiment, at random until kth step-by-step test failure is total
Number is equal to m；
16th step, in direct fault location after the test, before testability design update, using Bayes methods, according to experiment into
Lose the undetectable rate of failure that type data calculate renewable subsystem(Zhao Chenxu et al.A Markov
Chain-Based Testability Growth Model With a Cost-Benefit Function's, Zhao Chenxu etc.
The second trifle of testability model of growth Part III based on Markov Chain and cost-effectiveness function), ifTurn the
Otherwise 18 steps turn the 17th step；
17th step, ifThat is experiment process deviates preset testing program, turns the 2nd step, no
Then, update is designed to the testability design defect being exposed, after design update terminates, enables k=k+1, turn the 15th
Step；
18th step, off-test.
Following advantageous effect can be obtained using the present invention：
1st, it before carrying out based on the testability growth test of timely correction strategy, can be made using method proposed by the present invention
Fixed rational testability growth test planning, obtains testability growth test planning curve, determines testability growth test scheme,
So as to solve the problems, such as that the testability growth test currently based on timely correction strategy lacks experiment planing method；
2nd, during experiment is carried out, can be increased using method proposed by the present invention with effective monitoring system under test (SUT) testability
Process, by way of adjusting testability growth test scheme in time, Control experiment process reduces empirical risk and cost.
In conclusion the characteristics of testability growing method provided by the invention has considered subjects fault mode,
The technical merit of system designer, the information such as historical data and experience, can be scientific and reasonable using method provided by the invention
Testability growth test of the guidance based on timely correction strategy development, help to improve in current engineering practice testability and increase
The problem of shortage system test method that long experiment faces.
Description of the drawings
Fig. 1 is overview flow chart of the present invention；
Fig. 2 is that the testability that the 14th step of the invention is drawn increases planning curve synoptic diagram.
Specific embodiment
Fig. 1 is overview flow chart of the present invention, is as follows：
1st step, the fault mode sum N according to possessed by system under test (SUT) FMECA results determine system under test (SUT)；
2nd step collects testability data early period, including testability prediction result, testability virtual test data, testability
Know the real situation the testability index design requirement value req of test data, expertise, designer's designed capacity and system under test (SUT)；
3rd step, the testability information obtained using the 1st step and the 2nd step, by system under test (SUT) entirety fault mode according to test
Property design updatability be divided into two class of renewable fault mode and non-renewable fault mode, wherein renewable fault mode sum
For K, non-renewable fault mode sum is N-K, and system under test (SUT) is divided into two subsystems accordingly：Renewable fault mode group
Into subsystem and non-renewable fault mode composition subsystem, then Bayes methods of estimation is utilized to calculate non-renewable son
System with fault detect probability β and renewable subsystem with primary fault detection probability α；
4th step utilizes (1) formula to calculate the primary fault undetected probability that renewable subsystem has；
5th step utilizes (2) formula to calculate the testability index growth goal value σ of renewable subsystem；
6th step, (3) formula is utilized to calculate renewable subsystem needs failure to be achieved undetectable at the end of growth test
Probability pend；It is collected simultaneously similar similar system testability and increases historical information, being determined by system designer and trial person can
Allow the direct fault location test number (TN) of failure before the average update coefficient and each design update of update fault mode；
7th step, enables k=1；
8th step, being calculated before kth secondary design is improved using (4) formula needs the direct fault location test number (TN) desired value E carried out
(rk)；
9th step utilizes (5) formula to calculate the testability index growth factor phase that subsystem may be updated when kth secondary design is improved
Prestige value E (q (k))；
10th step utilizes subsystem may be updated in (6) formula update kth secondary design failure undetected probability after improving it is expected
Value E (p (k+1))；
11st step utilizes (7) formula to calculate the direct fault location that experiment proceeded to needed for the kth stage and tests total degree Rk；
12nd step, if E (p (k+1))≤preq, turn the 13rd step, otherwise enable k=k+1, and go to the 8th step；
13rd step draws testability and increases planning curve, and formulates renewable subsystem testing growth test scheme；
14th step, enables k=1；
15th step carries out direct fault location experiment, until kth step-by-step test failure sum is equal to m；
16th step, the failure for calculating renewable subsystem according to experiment success failure type data using Bayes methods are undetectable
RateIfTurn the 18th step, otherwise turn the 17th step；
17th step, ifTurn the 2nd step, otherwise, the testability design defect being exposed is carried out
Design update after design update terminates, enables k=k+1, turns the 15th step.
18th step, off-test.
Fig. 2 is to increase planning curve synoptic diagram using the testability that the present invention is drawn, wherein the 1st article of horizontal ordinate
Testability index initial value 1-E (p (1)) possessed by equipment before testability growth test is carried out is represented, abscissa starting point is 0,
Terminal is E (R1)；Remaining kth, the horizontal ordinate in k >=2 are that the testability that equipment has before the update of kth secondary design refers to
1-E (p (k)) is marked, abscissa starting point is E (Rk-1)+1, terminal is E (Rk)；The step of adjacent two horizontal linears represents testability
After design improves, equipment Test is risen to.
Claims (1)
- A kind of 1. testability growth test method based on timely correction strategy, it is characterised in that include the following steps：1st step determines that system under test (SUT) is had according to system under test (SUT) fault mode, influence and HAZAN, that is, FMECA results Fault mode sum N；2nd step collects testability data early period, knows the real situation including testability prediction result, testability virtual test data, testability Test data, expertise, designer's designed capacity and system under test (SUT) testability index design requirement value req；3rd step, can according to testability design by all fault modes according to FMECA results and testability data early period collected Update property is divided into two class of renewable fault mode and non-renewable fault mode, and system under test (SUT) is divided into two subsystems accordingly System：The subsystem of renewable fault mode composition and the subsystem of non-renewable fault mode composition, are then estimated using Bayes Method calculate non-renewable subsystem with fault detect probability β and renewable subsystem with primary fault detection probability α；4th step utilizes (1) formula to calculate the primary fault undetected probability p (1) that renewable subsystem has；P (1)=1- α (1)5th step utilizes (2) formula to calculate the testability index growth goal value σ of renewable subsystem,Wherein K is that fault mode sum, λ may be updated in renewable subsystemiFor i-th kind of fault mode failure rate, 1≤i≤N；6th step, (3) formula is utilized to calculate renewable subsystem needs failure undetected probability to be achieved at the end of growth test pend；pend=1- σ (3)Meanwhile historical experience is increased according to similar similar system testability, determine the average update coefficient of renewable fault mode Allow direct fault location test number (TN) m, 1≤m≤K/2 of failure before f, 0 ＜ f≤1 and each design update；7th step, enables k=1；8th step, being calculated before kth secondary design is improved using (4) formula needs the direct fault location test number (TN) r carried outkDesired value E (rk),E (p (k)) is the desired value for the failure undetected probability p (k) that subsystem may be updated before kth secondary design is improved；9th step utilizes (5) formula to may be updated the testability index growth factor q's (k) of subsystem when calculating the improvement of kth secondary design Desired value E (q (k))；10th step utilizes (6) formula update kth secondary design that the failure undetected probability desired value E of subsystem may be updated after improving (p(k+1))；11st step utilizes (7) formula to calculate experiment and proceeds to direct fault location experiment total degree R required during the kth stagekDesired value E (Rk)；12nd step, if E (p (k+1))≤preq, turn the 13rd step, otherwise enable k=k+1, and go to the 8th step；13rd step, with E (Rk) it is horizontal axis, drawing testability for the longitudinal axis with 1-E (p (k)) increases planning curve, and according to the curve Formulate renewable subsystem testing growth test scheme；14th step, enables k=1；15th step, the simple random sampling method with reference to as defined in GJB2072-94 is " maintainability test and evaluation " national military standard, from Renewable fault mode is concentrated selects fault mode development direct fault location experiment at random, until kth step-by-step test failure sum etc. In m；16th step, in direct fault location after the test, before testability design update, using Bayes methods, according to experiment Success-failure Type Data calculate the undetectable rate of failure of renewable subsystemIfTurn the 18th step, otherwise turn the 17th step；17th step, ifThat is experiment process deviates preset testing program, turns the 2nd step, otherwise, right The testability design defect being exposed is designed update, after design update terminates, enables k=k+1, turns the 15th step；18th step, off-test.
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