CN105842650B - Electric energy meter calibrating method - Google Patents
Electric energy meter calibrating method Download PDFInfo
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- CN105842650B CN105842650B CN201610187273.0A CN201610187273A CN105842650B CN 105842650 B CN105842650 B CN 105842650B CN 201610187273 A CN201610187273 A CN 201610187273A CN 105842650 B CN105842650 B CN 105842650B
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- 238000000034 method Methods 0.000 title claims abstract description 22
- 238000011990 functional testing Methods 0.000 claims abstract description 63
- 238000004364 calculation method Methods 0.000 claims abstract description 17
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- RVCKCEDKBVEEHL-UHFFFAOYSA-N 2,3,4,5,6-pentachlorobenzyl alcohol Chemical compound OCC1=C(Cl)C(Cl)=C(Cl)C(Cl)=C1Cl RVCKCEDKBVEEHL-UHFFFAOYSA-N 0.000 claims abstract 3
- 238000012360 testing method Methods 0.000 claims description 28
- 230000005611 electricity Effects 0.000 claims description 7
- 238000012937 correction Methods 0.000 claims description 5
- 230000001939 inductive effect Effects 0.000 claims description 4
- 230000006870 function Effects 0.000 claims description 3
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- 241000208340 Araliaceae Species 0.000 claims 1
- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 claims 1
- 235000003140 Panax quinquefolius Nutrition 0.000 claims 1
- 235000008434 ginseng Nutrition 0.000 claims 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/04—Testing or calibrating of apparatus covered by the other groups of this subclass of instruments for measuring time integral of power or current
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- Testing Electric Properties And Detecting Electric Faults (AREA)
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Abstract
The invention discloses a kind of electric energy meter calibrating methods, the present invention is using intrusive test method, the measuring parameter of the first computation chip is directly configured around the control of first singlechip using probe, FCT functional tests machine completes the error calculation of the power of voltage source and current source, voltage, electric current, and calculate the calibration parameter of corresponding PCBA, the position of corresponding calibration parameter in the bin programs of microcontroller is replaced with calibration parameter, finally in the bin code online burnings to microcontroller with calibration parameter.The present invention has the characteristics of calibration is efficient, calibration precision is high, stability is good, reduces production cost.
Description
Technical field
The present invention relates to electric energy meter technical field, more particularly, to a kind of calibration is efficient, calibration precision is high, stability is good
Electric energy meter calibrating method.
Background technology
When usually producing electric energy meter, needing can by the way that whether FCT functional tests machine test PCBA (printed circuit board) welds
It leans on, PCBA carries out calibration and error-detecting by being assembled into whole table after FCT test passes.Conventional correction method is by calibration parameter
It is stored in external EEPROM or ferroelectricity (FRAM), has the possibility for being read and distorting, lead to the accuracy of calibration to reduce, go out
Factory's electric energy meter qualification rate reduces, and causes by changing the problem of calibration parameter is sneaked current.
Invention content
The goal of the invention of the present invention is to overcome prior art FCT test functions single, and follow-up PCBA is assembled into whole table
Calibration is also needed to afterwards and makes a call to the deficiency of an inspection error, provides the electricity that a kind of calibration is efficient, calibration precision is high, stability is good
It can table correction method.
To achieve these goals, the present invention uses following technical scheme：
A kind of electric energy meter calibrating method waits the PCBA circuit boards of the first electric energy meter of meter to be corrected to be equipped with the first computation chip
And first singlechip；The PCBA circuit boards of standard electric energy meter include second singlechip and the second computation chip；It is surveyed including FCT functions
Test-run a machine, current source, voltage source and current divider；FCT functional tests machine respectively with current source, voltage source, first singlechip, second single
Piece machine, the first computation chip, the electrical connection of the second computation chip, current source, current divider, the first computation chip, the second computation chip
It is sequentially connected electrically, the first computation chip is electrically connected with first singlechip, and the second computation chip is electrically connected with second singlechip, voltage
Source is electrically connected respectively with first singlechip, the first computation chip, second singlechip and the second computation chip；First electric energy meter and mark
Quasi- electric energy meter is 3 phase electric energy meters；
The correction method includes the following steps：
(1-1) is powered on using voltage source to first singlechip, and FCT functional tests machine completes each test point of first singlechip
Voltage tester and testing current；
(1-2) FCT functional test machines make first singlechip be in reset states；
(1-3) FCT functional tests machine obtains the source voltage U1 of voltage source, and the ource electric current of current source is I1, according to U1, I1 and
The angular difference θ of U1, I1 are calculated that active power is P1=U1*I1*cos θ, reactive power is Q1=U1*I1*sin θ；；
(1-4) FCT functional tests machine obtain voltage U2, electric current I2, active power that the first computation chip measures for P2 and
Reactive power is Q2；
(1-5) FCT functional tests machine calculate active power error e rrP, reactive power error errQ, active calibration value GP,
Idle calibration value GQ, voltage calibration coefficient GU and current calibration coefficient GI；
It is stored with bin codes in (1-6) FCT functional test machines, FCT functional tests machine GP, GQ, the GU being calculated,
GI replaces GP, GQ, GU, GI in bin codes；
(1-7) FCT functional tests machine is burnt to bin codes in first singlechip；
The first computation chip of (1-8) FCT functional tests machine testing, the pulse parameter of the second computation chip output, make the
One electric energy meter calibrating successfully judges.
Whether the present invention also leads to other than reliably being tested in the completion PCBA welding of FCT test phases directly to current divider
Upper certain voltage and current signal using intrusive test method, is directly matched using probe around the control of first singlechip
Put the measuring parameter of the first computation chip, FCT functional tests machine completes the mistake of the power of voltage source and current source, voltage, electric current
Difference calculates, and calculates the calibration parameter of corresponding PCBA, and corresponding calibration parameter in the bin programs of microcontroller is replaced with calibration parameter
Position, finally in the bin code online burnings to microcontroller with calibration parameter.
The present invention reduces the production procedures of electric energy meter, reduce production cost；The present invention is by calibration parameter direct compilation
Into program, electric energy meter, which powers on, directly to be run, and do not need to read from external memory, accelerate the startup of electric energy meter
Speed.The external memory for preserving calibration parameter is avoided because calibration parameter caused by maloperation or voltage instability is accidentally wiped
It removes, the risk of mistakenly rewritten.
Therefore, the present invention has the characteristics of calibration is efficient, calibration precision is high, stability is good, reduces production cost.
Preferably, the step (1-8) comprises the following specific steps that：
FCT functional test machines make first singlechip be detached from reset states and enter normal operating conditions, control current source and electricity
Potential source exports several groups of combination parameters being made of electric current, voltage and power factor；FCT functional tests the first metering core of machine testing
Piece, the pulse of the second computation chip output；The time interval T1 between the first computation chip adjacent pulse is calculated, calculates the second meter
The time interval T between chip by chip pulse is measured, whenFCT functional test machines make the first electric energy meter calibrating into
The judgement of work(.
Preferably, the combination parameter is 6 groups, 6 groups of combination parameters are respectively Un, IB, 1.0；Un, Imax, 1.0；Un,
Imin, 1.0；Un, TB, 0.5L；Un, Imax, 0.5L；Un, Imin, 0.5L；Wherein, Un is electric energy meter rated voltage, and IB is electricity
Energy table rated current, Imax are electric energy meter maximum current, and Imin is lightly loaded electric current for electric energy meter, and L is inductive load.1.0 be for
Quality factor, 0.5L are the quality factor of 60 ° of inductive load current signal lag voltage signal.
Preferably, the calculation formula of the active power error e rrP isThe active calibration value
The calculation formula of GP is GP=errP215。
Preferably, the calculation formula of the reactive power error errQ isThe idle calibration
The calculation formula of value GQ is GQ=errQ215。
Preferably, the calculation formula of the voltage calibration coefficient GU is
Preferably, the calculation formula of the current calibration coefficient GI is
Preferably, (1-1) includes the following steps：FCT functional tests machine is given by voltage signal terminal A, B, C, N probe
Microcontroller adds rated voltage, passes through the voltage and current of each test each test point of probe test；Wherein, n-th of voltage test points
The voltage threshold of Un is [Unmin, Unmax], and the current threshold of n-th of current test point In is [Inmin, Inmax].
Preferably, alarm lamp is further included, alarm lamp and FCT functional test mechatronics；In step (1-3) and step
The first computation chip failure detection steps are further included between (1-4)：
The standard signal curve of the first computation chip is equipped in FCT functional test machines；
(6-1) FCT functional tests machine obtains the signal curve S (t) of the first computation chip, FCT functional tests machine extraction S
(t) in the corresponding signal value M of each time interval1..., Mn；The serial number i, i=1 ..., n of setting signal value；
(6-2) FCT functional tests machine utilizes formulaCalculate each signal value MiSteady rate
ratioi；
As S (t) and ratio of the normal temperature signal curve without intersection point and each signal valueiIt is respectively positioned on [1-A1,1+A1]
Except range, then FCT functional tests machine control alarm lamp flicker.
When alarm lamp flickers, staff can have found that the first computation chip is faulty, can be in time using replacement and repair etc.
Method solves failure.
Therefore, the present invention has the advantages that：Calibration is efficient, calibration precision is high, stability is good, reduces production
Cost.
Description of the drawings
Fig. 1 is a kind of functional block diagram of the present invention；
Fig. 2 is a kind of flow chart of the present invention.
In figure：First computation chip 1, first singlechip 2, FCT functional tests machine 3, current source 4, voltage source 5, current divider
6th, second singlechip 7, the second computation chip 8, alarm lamp 10.
Specific embodiment
The present invention will be further described with reference to the accompanying drawings and detailed description.
Embodiment 1
Embodiment as shown in Figure 1 is a kind of electric energy meter calibrating method, waits the PCBA circuits of the first electric energy meter of meter to be corrected
Plate is equipped with the first computation chip 1 and first singlechip 2；The PCBA circuit boards of standard electric energy meter include second singlechip 7 and the
Two computation chips 8；Including FCT functional tests machine 3, current source 4, voltage source 5 and current divider 6；FCT functional tests machine respectively with electricity
Stream source, voltage source, first singlechip, second singlechip, the first computation chip, the electrical connection of the second computation chip, current source, shunting
Device, the first computation chip, the second computation chip are sequentially connected electrically, and the first computation chip is electrically connected with first singlechip, the second meter
Amount chip be electrically connected with second singlechip, voltage source respectively with first singlechip, the first computation chip, second singlechip and second
Computation chip is electrically connected；First electric energy meter and standard electric energy meter are 3 phase electric energy meters；
As shown in Fig. 2, correction method includes the following steps：
Step 100, voltage, current detecting
It is powered on using voltage source to first singlechip, FCT functional tests machine is given by voltage signal terminal A, B, C, N probe
Microcontroller adds rated voltage, passes through voltage, the electric current of each test each test point of probe test；Wherein, n-th of voltage test points
The voltage threshold of Un is [Unmin, Unmax], and the current threshold of n-th of current test point In is [Inmin, Inmax].
Step 200, first singlechip is set to reset states
FCT functional test machines make the reset pins of first singlechip be low level, so as to be in first singlechip
Reset states；
Step 300, U1, I1, P1, Q1, angular difference θ are obtained
FCT functional tests machine obtains the source voltage U1 of voltage source, and the ource electric current of current source is I1, according to U1, I1 and U1, I1
Angular difference θ be calculated that active power is P1=U1*I1*cos θ, reactive power is Q1=U1*I1*sin θ；
Step 400, U2, I2, P2, Q2 are obtained
FCT functional tests machine obtain the first computation chip measure voltage U2, electric current I2, active power be P2 and idle work(
Rate is Q2；
Step 500, active calibration value, idle calibration value, voltage calibration coefficient and current calibration coefficient are calculated
FCT functional tests machine calculates active power error e rrP, reactive power error errQ, active calibration value GP, idle
Calibration value GQ, voltage calibration coefficient GU and current calibration coefficient GI：
The calculation formula of active power error e rrP isThe calculation formula of reactive power error errQ
ForThe calculation formula of active calibration value GP is GP=errP.215, the calculation formula of idle calibration value GQ
For GQ=errQ.215, the calculation formula of voltage calibration coefficient GU isThe calculation formula of current calibration coefficient GI is
Step 600, the respective value of bin codes is replaced with calibration parameter
Bin codes, the FCT functional tests machine GP, GQ, GU being calculated, GI replacement are stored in FCT functional test machines
GP, GQ, GU, GI in bin codes；
Step 700, burning bin codes
FCT functional tests machine is burnt to bin codes in first singlechip；
Step 800, judge whether calibration succeeds
FCT functional tests machine discharges the reset pins of first singlechip, and first singlechip is detached from reset states and enters just
Normal working condition controls current source and voltage source to export 6 groups of combination parameters being made of electric current, voltage and power factor；
6 groups of combination parameters are respectively Un, IB, 1.0；Un, Imax, 1.0；Un, Imin, 1.0；Un, IB, 0.5L；Un,
Imax, 0.5L；Un, Imin, 0.5L；Wherein, Un is electric energy meter rated voltage, and IB is electric energy meter rated current, and Imax is electric energy
Table maximum current, Imin are lightly loaded electric current for electric energy meter, and L is inductive load.
The first computation chip, the second computation chip that FCT functional tests machine is detected respectively under 6 kinds of combination parameters export
Pulse；It calculates the time interval T1 between the first computation chip adjacent pulse, calculates between the second computation chip adjacent pulse
Time interval T, when under 6 kinds of combination parameters, being satisfied byThen FCT functional tests machine makes the first electric energy meter school
Table successfully judges.
Embodiment 2
Embodiment 2 includes all structures of embodiment 1 and step part, and embodiment 2 further includes alarm lamp as shown in Figure 1
10, alarm lamp and FCT functional test mechatronics；The inspection of the first computation chip failure is further included between step 300 and step 400
Survey step：
The standard signal curve of the first computation chip is equipped in FCT functional test machines；
Step 310, FCT functional tests machine obtains the signal curve S (t) of the first computation chip, the extraction of FCT functional tests machine
In S (t) with the corresponding signal value M of each time interval1..., Mn；The serial number i, i=1 ..., n of setting signal value；
Step 320, FCT functional tests machine utilizes formulaCalculate each signal value MiSteady rate
ratioi；
As S (t) and ratio of the normal temperature signal curve without intersection point and each signal valueiIt is respectively positioned on [1-A1,1+A1]
Except range, then FCT functional tests machine control alarm lamp flicker.A1 is 0.1, and when alarm lamp flickers, staff can be to first
Computation chip carries out malfunction elimination and maintenance.
It should be understood that this embodiment is only used to illustrate the invention but not to limit the scope of the invention.In addition, it should also be understood that,
After having read the content of the invention lectured, those skilled in the art can make various modifications or changes to the present invention, these etc.
Valency form is also fallen within the scope of the appended claims of the present application.
Claims (9)
1. a kind of electric energy meter calibrating method waits the PCBA circuit boards of the first electric energy meter of meter to be corrected to be equipped with the first computation chip
(1) and first singlechip (2)；The PCBA circuit boards of standard electric energy meter include second singlechip (7) and the second computation chip (8)；
It is characterized in that including FCT functional tests machine (3), current source (4), voltage source (5) and current divider (6)；FCT functional tests machine point
It is not electrically connected with current source, voltage source, first singlechip, second singlechip, the first computation chip, the second computation chip, electric current
Source, current divider, the first computation chip, the second computation chip are sequentially connected electrically, and the first computation chip is electrically connected with first singlechip,
Second computation chip is electrically connected with second singlechip, voltage source respectively with first singlechip, the first computation chip, second singlechip
It is electrically connected with the second computation chip；First electric energy meter and standard electric energy meter are 3 phase electric energy meters；
The correction method includes the following steps：
(1-1) is powered on using voltage source to first singlechip, and FCT functional tests machine completes the electricity of each test point of first singlechip
Pressure test and testing current；
(1-2) FCT functional test machines make first singlechip be in reset states；
(1-3) FCT functional tests machine obtains the source voltage U1 of voltage source, and the ource electric current of current source is I1, according to U1, I1 and U1,
The angular difference θ of I1 is calculated that active power is P1=U1*I1*cos θ, reactive power is Q1=U1*I1*sin θ；
It is P2 and idle that (1-4) FCT functional tests machine, which obtains the voltage U2, electric current I2, active power that the first computation chip measures,
Power is Q2；
(1-5) FCT functional tests machine calculates active power error e rrP, reactive power error errQ, active calibration value GP, idle
Calibration value GQ, voltage calibration coefficient GU and current calibration coefficient GI；
Bin codes, FCT functional tests the machine GP, GQ, GU that are calculated, GI generations are stored in (1-6) FCT functional test machines
For GP, GQ, GU, GI in bin codes；
(1-7) FCT functional tests machine is burnt to bin codes in first singlechip；
The first computation chip of (1-8) FCT functional tests machine testing, the pulse parameter of the second computation chip output, make the first electricity
Energy table calibration successfully judges.
2. electric energy meter calibrating method according to claim 1, it is characterized in that, the step (1-8) includes following specific step
Suddenly：
FCT functional test machines make first singlechip be detached from reset states and enter normal operating conditions, control current source and voltage source
Export several groups of combination parameters being made of electric current, voltage and power factor；The first computation chip of FCT functional tests machine testing,
The pulse of second computation chip output；The time interval T1 between the first computation chip adjacent pulse is calculated, calculates the second metering
Time interval T between chip by chip pulse, whenFCT functional test machines make the success of the first electric energy meter calibrating
Judgement.
3. electric energy meter calibrating method according to claim 2, it is characterized in that, the combination parameter is 6 groups, 6 groups of combination ginsengs
Number is respectively Un, IB, 1.0；Un, Imax, 1.0；Un, Imin, 1.0；Un, IB, 0.5L；Un, Imax, 0.5L；Un, Imin,
0.5L；Wherein, Un is electric energy meter rated voltage, and IB is electric energy meter rated current, and Imax is electric energy meter maximum current, and Imin is electricity
Energy table underloading electric current, L is inductive load.
4. electric energy meter calibrating method according to claim 1, it is characterized in that, the calculating of the active power error e rrP is public
Formula isThe calculation formula of the active calibration value GP is GP=errP215。
5. electric energy meter calibrating method according to claim 1, it is characterized in that, the calculating of the reactive power error errQ is public
Formula isThe calculation formula of the idle calibration value GQ is GQ=errQ215。
6. electric energy meter calibrating method according to claim 1, it is characterized in that, the calculation formula of the voltage calibration coefficient GU
For
7. electric energy meter calibrating method according to claim 1, it is characterized in that, the calculation formula of the current calibration coefficient GI
For
8. electric energy meter calibrating method according to claim 1, it is characterized in that, (1-1) includes the following steps：FCT functions are surveyed
Test-run a machine adds rated voltage by voltage signal terminal A, B, C, N probe to microcontroller, passes through each test each test of probe test
Voltage, the electric current of point；Wherein, the voltage threshold of n-th of voltage test points Un be [Unmin, Unmax], n-th of current test point
The current threshold of In is [Inmin, Inmax].
9. according to the electric energy meter calibrating method described in claims 1 or 2 or 3 or 4 or 5 or 6 or 7 or 8, alarm lamp is further included
(10), alarm lamp and FCT functional test mechatronics；It is characterized in that is further included between step (1-3) and step (1-4)
One computation chip failure detection steps：
The standard signal curve of the first computation chip is equipped in FCT functional test machines；
(6-1) FCT functional tests machine obtains the signal curve S (t) of the first computation chip, and FCT functional tests machine is extracted in S (t)
With the corresponding signal value M of each time interval1..., Mn；The serial number i, i=1 ..., n of setting signal value；
(6-2) FCT functional tests machine utilizes formulaCalculate each signal value MiSteady rate ratioi；
As S (t) and ratio of the normal temperature signal curve without intersection point and each signal valueiIt is respectively positioned on [1-A1,1+A1] range
Except, then FCT functional tests machine control alarm lamp flicker.
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| CN201610187273.0A CN105842650B (en) | 2016-03-28 | 2016-03-28 | Electric energy meter calibrating method |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109901099B (en) * | 2019-03-04 | 2022-04-26 | 宁波三星医疗电气股份有限公司 | Automatic voltage change compensation method for electric energy meter |
| CN109738849A (en) * | 2019-03-08 | 2019-05-10 | 威胜集团有限公司 | Universal quick calibration method for single-phase electric energy meter |
| CN113064114B (en) * | 2020-03-30 | 2022-09-20 | 深圳友讯达科技股份有限公司 | High-precision quick meter calibration method for multi-core electric energy meter |
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