CN105823555B - 一种连续太赫兹激光功率测试装置 - Google Patents
一种连续太赫兹激光功率测试装置 Download PDFInfo
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- CN105823555B CN105823555B CN201610330610.7A CN201610330610A CN105823555B CN 105823555 B CN105823555 B CN 105823555B CN 201610330610 A CN201610330610 A CN 201610330610A CN 105823555 B CN105823555 B CN 105823555B
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- 238000012360 testing method Methods 0.000 title claims abstract description 33
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
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CN201610330610.7A CN105823555B (zh) | 2016-05-18 | 2016-05-18 | 一种连续太赫兹激光功率测试装置 |
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CN201610330610.7A CN105823555B (zh) | 2016-05-18 | 2016-05-18 | 一种连续太赫兹激光功率测试装置 |
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CN105823555A CN105823555A (zh) | 2016-08-03 |
CN105823555B true CN105823555B (zh) | 2017-11-17 |
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Families Citing this family (2)
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CN106441557A (zh) * | 2016-08-17 | 2017-02-22 | 中国电子科技集团公司第四十研究所 | 一种多用途太赫兹光功率探头 |
CN107144345B (zh) * | 2017-05-16 | 2019-08-13 | 中国电子科技集团公司第四十一研究所 | 一种多波长与宽温度太赫兹激光功率计的校准方法 |
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JP2004191244A (ja) * | 2002-12-12 | 2004-07-08 | Minolta Co Ltd | 分光装置及び補正方法 |
CN101506582B (zh) * | 2006-08-25 | 2012-06-13 | Abb研究有限公司 | 基于照相机的火焰检测器 |
CN104819773B (zh) * | 2015-04-21 | 2016-10-26 | 中国电子科技集团公司第四十一研究所 | 连续窄脉宽激光器峰值光功率的测试装置及方法 |
CN105181153B (zh) * | 2015-09-23 | 2018-09-11 | 西安工程大学 | 基于波形面积的雪崩光探测器增益测量方法 |
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Effective date of registration: 20190228 Address after: 266555 Xiangjiang 98, Huangdao District, Qingdao City, Shandong Province Patentee after: China Electronics Technology Instrument and Meter Co., Ltd. Address before: 266555 No. 98 Xiangjiang Road, Qingdao economic and Technological Development Zone, Shandong Patentee before: The 41st Institute of CETC |
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Address after: 266555 Xiangjiang 98, Huangdao District, Qingdao City, Shandong Province Patentee after: CLP kesiyi Technology Co.,Ltd. Address before: 266555 Xiangjiang 98, Huangdao District, Qingdao City, Shandong Province Patentee before: CHINA ELECTRONIC TECHNOLOGY INSTRUMENTS Co.,Ltd. |
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