CN105810608A - Test fixture - Google Patents

Test fixture Download PDF

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Publication number
CN105810608A
CN105810608A CN201610280831.8A CN201610280831A CN105810608A CN 105810608 A CN105810608 A CN 105810608A CN 201610280831 A CN201610280831 A CN 201610280831A CN 105810608 A CN105810608 A CN 105810608A
Authority
CN
China
Prior art keywords
test
lower platen
measurement jig
lower pressure
connection line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610280831.8A
Other languages
Chinese (zh)
Inventor
刘友富
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to CN201610280831.8A priority Critical patent/CN105810608A/en
Publication of CN105810608A publication Critical patent/CN105810608A/en
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10Measuring as part of the manufacturing process
    • H01L22/14Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67253Process monitoring, e.g. flow or thickness monitoring

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention discloses a test fixture, comprising a fixed frame, wherein two sides of the fixed frame are connected with a lower pressure plate via guide rods, a plurality of lower pressure columns are arranged at the bottom the lower pressure plate, a cover closing pressure lever is arranged in the middle of the lower pressure plate, a quick clamp is arranged at the upper part of the cover closing pressure lever, a pressure handle is arranged at the upper part of the quick clamp, a high-voltage connecting wire is arranged on the lower pressure plate, a high-voltage input end is arranged at the end of the high-voltage connecting wire, a test plate is arranged below the lower pressure plate, a plurality of test pin groups are uniformly arranged on the test plate, the test pin groups are all connected with the high-voltage connecting wire, a safety alarm device for cutting off power is connected to the high-voltage connecting wire, a plurality of bearing columns are arranged on the test plate, and a spring is arranged in each bearing column. Compared with the prior art, the test fixture has the advantages of simple structure, convenience in operation and strong practicability, and can be used for effectively testing the voltage penetrability of insulators such as LED (Light Emitting Diode) copper substrates or metal substrates and the like; and by adopting the safety alarm device, the safety of equipment can be greatly improved, the text fixture is safe in use, the test result is accurate, and the test performance is reliable.

Description

A kind of measurement jig
Technical field
The present invention relates to mechanical equipment technical field, be specifically related to a kind of measurement jig.
Background technology
null" tool " this word is directly to be turned over by the Chinese character of Japanese,It it is the utensil for carrying out less important work,Common tool has: automation equipment class、Tool fixture class、Measurement jig class、SMT crosses furnace tool class、Precision component class、Blade class、DVD reads first-class,It is exactly briefly the one auxiliary production equipment on production line,Measurement jig refers to for carrying out the utensil tested,Testing apparatus is of a great variety,According to different test requests, there is different architectural features,The auxiliary of measurement jig it is accomplished by when voltage penetration test is carried out for insulators such as LED copper base or aluminium bases,In prior art,Penetrate for insulator voltages such as LED copper base or aluminium bases,The tool of test is in use,Structure is comparatively numerous and diverse,It is convenient not to use,Owing to test process often producing high voltage,Traditional measurement jig security performance is not good,For the problems referred to above,The ad hoc meter present invention solves.
Summary of the invention
It is an object of the invention to provide a kind of simple in construction, simple operation, practical, it is possible to the effective voltage penetration testing the insulator such as LED copper base or metal basal board, the use secure side heart, test result is accurate, the reliable measurement jig of test performance.
For achieving the above object, the present invention provides following technical scheme:
A kind of measurement jig, including fixed mount, fixed mount both sides connect lower platen by iron, lower platen bottom is provided with multiple lower compression leg, closing lid depression bar it is provided with in the middle part of lower platen, closing lid depression bar top is provided with quick tong, quick clip portion on hand is provided with pressure handle, lower platen is provided with high-pressure connection line, high-pressure connection line end is provided with high voltage input terminal, lower platen bottom is test board, test board is uniformly provided with some testing needle groups, testing needle group is respectively connected with high-pressure connection line, high-pressure connection line is connected to the safety alarm device for cutting off the electricity supply, test board is provided with some bolster stakes, spring it is provided with in bolster stake.
As the further improvement of above-mentioned technology, described lower platen adopts insulant to make.
As the further improvement of above-mentioned technology, the shape that several testing needle groups described are formed adapts with LED copper base to be tested or metal basal board shape.
As the further improvement of above-mentioned technology, described testing needle group includes two testing needles.
As the further improvement of above-mentioned technology, described test board is provided with some bolster stakes.
As the further improvement of above-mentioned technology, in described bolster stake, it is provided with spring.
Compared with prior art, the invention has the beneficial effects as follows: simple in construction, simple operation, practical, can effectively test the voltage penetration of the insulators such as LED copper base or metal basal board, device security can be greatly improved by arranging safety alarm device, use the secure side heart, test result is accurate, and test performance is reliable.
Accompanying drawing explanation
Fig. 1 is the structural representation of the present invention.
Fig. 2 is the partial structurtes schematic diagram of the present invention.
Fig. 3 is the structural representation of test board.
In figure: compression leg, 5-closing lid depression bar, the quick tong of 6-, 7-high-pressure connection line, 8-test board, 9-testing needle, 10-bolster stake under 1-fixed mount, 2-iron, 3-lower platen, 4-.
Detailed description of the invention
Below in conjunction with detailed description of the invention, the technical scheme of this patent is described in more detail.
nullA kind of measurement jig,Including fixed mount 1,Fixed mount 1 both sides connect lower platen 3 by iron 2,Lower platen 3 adopts insulant to make,Lower platen 3 bottom is provided with multiple lower compression leg 4,Closing lid depression bar 5 it is provided with in the middle part of lower platen 3,Closing lid depression bar 5 top is provided with quick tong 6,Quick tong 6 is for regulating the height of lower platen 3,Quick tong 6 top is provided with pressure handle,Lower platen 3 is provided with high-pressure connection line 7,High-pressure connection line 7 end is provided with high voltage input terminal,Lower platen 3 bottom is test board 8,Test board 8 is uniformly provided with several testing needle groups,Testing needle group includes two testing needles 9,The shape that several testing needle groups are formed adapts with LED copper base to be tested or metal basal board shape,When LED copper base to be measured or metal basal board are circular,It is generally circular in shape that testing needle group is formed,When LED copper base to be measured or metal basal board are triangle,What testing needle group was formed is shaped as triangle,Testing needle group is respectively connected with high-pressure connection line 7,High-pressure connection line 7 is connected to the safety alarm device for cutting off the electricity supply,Test board 8 is provided with some bolster stakes 10 as required or is not provided with bolster stake 10,Bolster stake 10 of the present invention is provided with 4,It is provided with spring in bolster stake 10,The height of bolster stake 10 can be regulated by spring.
nullWhen the present invention works,LED copper base to be tested or metal basal board are positioned on bolster stake 10,LED copper base or metal basal board can be circular or square structure,Due to bolster stake 10 highly higher than testing needle,When LED copper base or metal basal board are positioned on bolster stake 10,Testing needle 9 fails to be connected with the test point on LED copper base or metal basal board,It is in state to be tested,When performing a test,Quick tong 6 on staff operation closing lid depression bar 5,Quick tong 6 drives lower platen 3 to move downward,Lower compression leg 4 on lower platen 3 contacts LED copper base or metal basal board,Along with lower platen 3 continues to move downward,The power that LED copper base or metal basal board are applied by lower platen 3 is transferred on bolster stake 10,It is provided with spring in bolster stake 10,It is compressed after spring stress,And drive LED copper base or metal basal board to continue to move downward,Until testing needle 9 inserts in the test point of LED copper base or metal basal board,Then LED copper base or metal basal board、The loop conducting that testing needle and power supply are formed,Produce bigger voltage,By change magnitude of voltage be sized to test out the voltage penetration of LED copper base or metal basal board,Link circuit of the present invention is provided with safety alarm device,When LED copper base or metal basal board are by voltage breakdown,Safety alarm device starts,Deenergization immediately,Play safety protection function,Reach throught voltage when operator can read LED copper base to be measured on the display apparatus or metal basal board penetrates,Quick tong 6 on staff operation closing lid depression bar 5,Lower platen 3 unclamps and moves upward,Bolster stake 10 upwards return,Complete test,Present configuration is simple,Simple operation,Practical,Can effectively test the voltage penetration of the insulators such as LED copper base or metal basal board,Device security can be greatly improved by arranging safety alarm device,Use the secure side heart,Test result is accurate,Test performance is reliable.
The foregoing is only preferred embodiment of the present invention; not thereby restriction embodiments of the present invention and protection domain; to those skilled in the art; equivalent replacement that all utilizations description of the present invention and diagramatic content make and the obtained scheme of apparent change should be can appreciate that, all should be included in protection scope of the present invention.

Claims (6)

1. a measurement jig, including fixed mount, it is characterized in that, fixed mount both sides connect lower platen by guide rod, lower platen bottom is provided with multiple lower compression leg, closing lid depression bar it is provided with in the middle part of lower platen, closing lid depression bar top is provided with quick tong, quick clip portion on hand is provided with pressure handle, lower platen is provided with high-pressure connection line, high-pressure connection line end is provided with high voltage input terminal, lower platen bottom is test board, test board is uniformly provided with some testing needle groups, testing needle group is respectively connected with high-pressure connection line, high-pressure connection line is connected to the safety alarm device for cutting off the electricity supply.
2. measurement jig according to claim 1, it is characterised in that described lower platen adopts insulant to make.
3. measurement jig according to claim 1, it is characterised in that the shape that several testing needle groups described are formed adapts with LED copper base to be tested or metal basal board shape.
4. measurement jig according to claim 1, it is characterised in that described testing needle group includes two testing needles.
5. measurement jig according to claim 1, it is characterised in that described test board is provided with some bolster stakes.
6. measurement jig according to claim 5, it is characterised in that be provided with spring in described bolster stake.
CN201610280831.8A 2016-04-29 2016-04-29 Test fixture Pending CN105810608A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610280831.8A CN105810608A (en) 2016-04-29 2016-04-29 Test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610280831.8A CN105810608A (en) 2016-04-29 2016-04-29 Test fixture

Publications (1)

Publication Number Publication Date
CN105810608A true CN105810608A (en) 2016-07-27

Family

ID=56457918

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610280831.8A Pending CN105810608A (en) 2016-04-29 2016-04-29 Test fixture

Country Status (1)

Country Link
CN (1) CN105810608A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113125813A (en) * 2021-04-20 2021-07-16 深圳市成蝶科技有限公司 PCB function test fixture and test method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0786384A (en) * 1993-09-17 1995-03-31 Sumitomo Metal Ind Ltd Specimen pad, specimen pad monitoring system, and semiconductor manufacturing equipment
US20120119773A1 (en) * 2010-11-15 2012-05-17 Askey Computer Corporation Testing Auxiliary Apparatus
CN102540031A (en) * 2012-02-08 2012-07-04 四川海英电子科技有限公司 Device and system for testing voltage endurance of aluminum basal plate
CN203965571U (en) * 2014-05-22 2014-11-26 深圳市富翔科技有限公司 A kind of circuit board high-voltage testing device
CN204166012U (en) * 2014-10-20 2015-02-18 深圳市海和电子有限公司 A kind of PCBA board multifunctional efficient measurement jig

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0786384A (en) * 1993-09-17 1995-03-31 Sumitomo Metal Ind Ltd Specimen pad, specimen pad monitoring system, and semiconductor manufacturing equipment
US20120119773A1 (en) * 2010-11-15 2012-05-17 Askey Computer Corporation Testing Auxiliary Apparatus
CN102540031A (en) * 2012-02-08 2012-07-04 四川海英电子科技有限公司 Device and system for testing voltage endurance of aluminum basal plate
CN203965571U (en) * 2014-05-22 2014-11-26 深圳市富翔科技有限公司 A kind of circuit board high-voltage testing device
CN204166012U (en) * 2014-10-20 2015-02-18 深圳市海和电子有限公司 A kind of PCBA board multifunctional efficient measurement jig

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113125813A (en) * 2021-04-20 2021-07-16 深圳市成蝶科技有限公司 PCB function test fixture and test method

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Application publication date: 20160727