CN203858270U - Open-circuit and short-circuit test support of circuit board - Google Patents
Open-circuit and short-circuit test support of circuit board Download PDFInfo
- Publication number
- CN203858270U CN203858270U CN201420249671.7U CN201420249671U CN203858270U CN 203858270 U CN203858270 U CN 203858270U CN 201420249671 U CN201420249671 U CN 201420249671U CN 203858270 U CN203858270 U CN 203858270U
- Authority
- CN
- China
- Prior art keywords
- circuit
- circuit board
- lower bolster
- guide plate
- open
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000523 sample Substances 0.000 claims abstract description 13
- 230000000875 corresponding Effects 0.000 claims description 14
- 230000000694 effects Effects 0.000 description 10
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Abstract
The utility model relates to an open-circuit and short-circuit test support of a circuit board. The open-circuit and short-circuit test support comprises a test switch, an upper template, and a lower template, wherein the upper template is disposed above the lower template, more than two small holes are disposed on a surface, which is close to the upper template, of the lower template, and test probes are fixedly connected on the small holes. With the open-circuit and short-circuit test support, open-circuit and short-circuit tests are allowed to be carried out on to-be-tested circuits on the circuit board rapidly, so that test efficiency is improved greatly, and the problems of long test time and disadvantages for batch tests of fly probe tests are overcome.
Description
Technical field
The utility model relates to circuit board testing field, particularly a kind of circuit board open-short circuit frame.
Background technology
The method of testing of prior art printed circuit board (PCB) (PCB) open circuit or short circuit adopts flying probe, puts testing needle at the end points of circuit that is:, energising, resistance is greater than minimum conducting resistance, be shown as open circuit, resistance is less than minimum insulation resistance, is shown as short circuit.Flying probe is exactly to move to the element in test by programmed control probe, thereby tests.Flying probe will be tested bit by bit, and length consuming time is unfavorable for test in enormous quantities.
Utility model content
Technical problem to be solved in the utility model is: a kind of circuit board open-short circuit frame that is applicable to test in enormous quantities is provided.
In order to solve the problems of the technologies described above, the utility model discloses a kind of circuit board open-short circuit frame, comprise Test Switchboard, also comprise cope match-plate pattern and lower bolster, described cope match-plate pattern is positioned at described lower bolster top, described lower bolster is provided with plural aperture near the one side of cope match-plate pattern, on described aperture, is fixedly connected with testing needle.
Further, be also provided with guide plate between described cope match-plate pattern and lower bolster, described guide plate is fixed on lower bolster, and on described guide plate, hollow out is provided with plural pilot hole, and described pilot hole is corresponding one by one with testing needle.
Further, described lower bolster is provided with reference column, and the position that described guide plate is corresponding with described reference column is provided with through hole, and described reference column penetrates described through hole, and described reference column two ends are bolted to respectively the bottom surface of lower bolster and the end face of guide plate.
Further, described guide plate, for two-layer above multilayer guide plate, is provided with pad between adjacent two guide plates of described multilayer guide plate.
Further, described testing needle is probe.
Further, described Test Switchboard is electrically connected with circuit board by wire.
Principle of the present utility model is: by cope match-plate pattern setting corresponding to lower bolster, lower bolster is provided with plural hole near the one side of cope match-plate pattern simultaneously, on hole, be fixedly connected with the structural design of testing needle, in the time of test, circuit board under test is placed on lower bolster, circuit each to be measured on circuit board under test is corresponding one by one with testing needle, now press Test Switchboard, cope match-plate pattern presses down fast under the effect of air pressure, circuit board is pressed between cope match-plate pattern and lower bolster, thereby is opened a way or the test result of short circuit.
The beneficial effects of the utility model are: by cope match-plate pattern setting corresponding to lower bolster, the structural design of plural testing needle is set simultaneously on lower bolster, can carry out open-short circuit to the circuit each to be measured on circuit board rapidly, greatly promote testing efficiency.Overcome flying probe length consuming time, be unfavorable for problem of testing in enormous quantities.
Brief description of the drawings
Fig. 1 is the structural drawing of circuit board open-short circuit frame of the present utility model;
Fig. 2 is the guide plate of circuit board open-short circuit frame of the present utility model and the johning knot composition of lower bolster.
Label declaration:
1, cope match-plate pattern; 2, lower bolster; 21, testing needle; 211, aperture; 3, guide plate; 311 pilot holes; 4, reference column; 41, bolt.
Embodiment
By describing technology contents of the present utility model, structural attitude in detail, being realized object and effect, below in conjunction with embodiment and coordinate accompanying drawing to be explained in detail.
The design of the utility model most critical is: by cope match-plate pattern setting corresponding to lower bolster, the structural design of plural testing needle is set on lower bolster simultaneously, can tests in enormous quantities the circuit each to be measured on circuit board, and consuming time short.
Refer to Fig. 1 and Fig. 2, the utility model discloses a kind of circuit board open-short circuit frame, comprise Test Switchboard, also comprise cope match-plate pattern 1 and lower bolster 2, described cope match-plate pattern 1 is positioned at described lower bolster 2 tops, described lower bolster 2 is provided with plural aperture 211 near the one side of cope match-plate pattern 1, on described aperture 211, is fixedly connected with testing needle 21.
From foregoing description, the beneficial effects of the utility model are: by cope match-plate pattern 1 setting corresponding to lower bolster 2, the structural design of plural testing needle 21 is set simultaneously on lower bolster 2, can carry out open-short circuit to the circuit each to be measured on circuit board rapidly, greatly promote testing efficiency.Overcome flying probe length consuming time, be unfavorable for problem of testing in enormous quantities.
Further, between described cope match-plate pattern 1 and lower bolster 2, be also provided with guide plate 3, described guide plate 3 is fixed on lower bolster 2, on described guide plate 3, hollow out is provided with plural pilot hole 311, described pilot hole 311 is corresponding one by one with testing needle 21, described lower bolster 2 is provided with reference column 4, the position that described guide plate 3 is corresponding with described reference column 4 is provided with through hole, described reference column 4 penetrates described through hole, and described reference column 3 two ends adopt respectively bolt 41 to be fixed on the bottom surface of lower bolster 2 and the end face of guide plate 3; Guide plate 3 can guarantee that testing needle 21 accurately contacts with the circuit under test on circuit board.
Further, described guide plate 3 is two-layer above multilayer guide plate, between adjacent two guide plates of described multilayer guide plate, is provided with pad; Arranging between adjacent two guide plates that can protect multilayer guide plate of pad do not worn and torn mutually.
Further, described testing needle 21 is probe; That probe has is simple in structure, good test effect and the low beneficial effect of cost.
Further, described Test Switchboard is electrically connected with circuit board by wire; Can make circuit board test more easily.
Principle of the present utility model is: by cope match-plate pattern 1 setting corresponding to lower bolster 2, lower bolster 2 is provided with plural aperture 211 near the one side of cope match-plate pattern 1 simultaneously, on aperture 211, be fixedly connected with the structural design of testing needle 21, in the time of test, circuit board under test is placed on lower bolster 2, circuit each to be measured on circuit board under test is corresponding one by one with testing needle 21, now press Test Switchboard, cope match-plate pattern 1 presses down fast under the effect of air pressure, circuit board is pressed between cope match-plate pattern 1 and lower bolster 2, thereby is opened a way or the test result of short circuit.
The beneficial effect of the circuit board open-short circuit frame that in sum, the utility model provides is:
(1) by cope match-plate pattern 1 setting corresponding to lower bolster 2, the structural design of plural testing needle 21 is set simultaneously on lower bolster 2, can carry out open-short circuit to the circuit each to be measured on circuit board rapidly, greatly promote testing efficiency, overcome flying probe length consuming time, be unfavorable for problem of testing in enormous quantities;
(2) design of guide plate 3 can guarantee that testing needle 21 accurately contacts with the circuit under test on circuit board.
(3) adopt probe as testing needle, there is simple in structure, good test effect and the low beneficial effect of cost.
(4) arranging between adjacent two guide plates that can protect multilayer guide plate of pad do not worn and torn mutually.
The foregoing is only embodiment of the present utility model; not thereby limit the scope of the claims of the present utility model; every equivalent structure or conversion of equivalent flow process that utilizes the utility model instructions and accompanying drawing content to do; or be directly or indirectly used in other relevant technical fields, be all in like manner included in scope of patent protection of the present utility model.
Claims (6)
1. a circuit board open-short circuit frame, comprises Test Switchboard, it is characterized in that, also comprise cope match-plate pattern and lower bolster, described cope match-plate pattern is positioned at described lower bolster top, and described lower bolster is provided with plural aperture near the one side of cope match-plate pattern, on described aperture, is fixedly connected with testing needle.
2. circuit board open-short circuit frame according to claim 1, it is characterized in that, between described cope match-plate pattern and lower bolster, be also provided with guide plate, described guide plate is fixed on lower bolster, described guide plate is provided with plural pilot hole, and described pilot hole is corresponding one by one with testing needle.
3. circuit board open-short circuit frame according to claim 2, it is characterized in that, described lower bolster is provided with reference column, the position that described guide plate is corresponding with described reference column is provided with through hole, described reference column penetrates described through hole, and described reference column two ends are bolted to respectively the bottom surface of lower bolster and the end face of guide plate.
4. according to the circuit board open-short circuit frame described in claim 2 or 3, it is characterized in that, described guide plate is two-layer above multilayer guide plate, between adjacent two guide plates of described multilayer guide plate, is provided with pad.
5. circuit board open-short circuit frame according to claim 1, is characterized in that, described testing needle is probe.
6. circuit board open-short circuit frame according to claim 1, is characterized in that, described Test Switchboard is electrically connected with circuit board by wire.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420249671.7U CN203858270U (en) | 2014-05-15 | 2014-05-15 | Open-circuit and short-circuit test support of circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420249671.7U CN203858270U (en) | 2014-05-15 | 2014-05-15 | Open-circuit and short-circuit test support of circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203858270U true CN203858270U (en) | 2014-10-01 |
Family
ID=51608116
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420249671.7U Expired - Fee Related CN203858270U (en) | 2014-05-15 | 2014-05-15 | Open-circuit and short-circuit test support of circuit board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203858270U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106018890A (en) * | 2016-08-10 | 2016-10-12 | 昆山兢美电子科技有限公司 | Rear connecting plate of flying probe test head |
-
2014
- 2014-05-15 CN CN201420249671.7U patent/CN203858270U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106018890A (en) * | 2016-08-10 | 2016-10-12 | 昆山兢美电子科技有限公司 | Rear connecting plate of flying probe test head |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20141001 Termination date: 20200515 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |