CN105790859A - Method and apparatus for testing electronic device - Google Patents
Method and apparatus for testing electronic device Download PDFInfo
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- CN105790859A CN105790859A CN201610113172.9A CN201610113172A CN105790859A CN 105790859 A CN105790859 A CN 105790859A CN 201610113172 A CN201610113172 A CN 201610113172A CN 105790859 A CN105790859 A CN 105790859A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/11—Monitoring; Testing of transmitters for calibration
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
- H04B17/21—Monitoring; Testing of receivers for calibration; for correcting measurements
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Abstract
The embodiment of the invention provides a method and an apparatus for testing an electronic device, wherein the method comprises the following steps: sending configuration information of a first test item of a plurality of test items of the electronic device to a tester and the electronic device, wherein the configuration information of the first test item is used for indicating testing the first test item on multiple frequency bands of the electronic devices; and controlling the tester and the electronic device to test the first test item on the multiple frequency bands. The embodiment of the invention may improve efficiency of testing the electronic device.
Description
Technical field
The present invention relates to production line test field, and more specifically, relate to a kind of method and apparatus testing electronic equipment.
Background technology
In the research and development and production process of electronic product, in order to ensure its function dispatched from the factory and performance, it usually needs adopt test equipment electronic product is calibrated and tests.As shown in Figure 1, tester, Devices to test and computer have collectively constituted and have produced line RF calibration system to realize the calibration of device under test and to combine survey, wherein, computer is connected with tester and terminal to be measured respectively by control line, and terminal to be measured is connected with tester by radio frequency line.When device under test is tested, computer tester and terminal to be measured are carried out parameter configuration and Row control, and record test result.Owing to terminal to be measured is mostly the electronic product supporting multiple frequency ranges, it is therefore desirable to each frequency range of product to be measured is tested.Specifically, as in figure 2 it is shown, when terminal to be measured is tested, first the multiple test items in the frequency range 1 of terminal to be measured are tested, next the more multiple test items in the frequency range 2 of terminal to be measured to frequency range N are tested respectively.Specifically in each frequency range, owing to comprising multiple different test item, therefore will stop before each test item is tested and configure the parameter of this test item for electronic equipment and tester, continuous print can not be tested by each test item, the test item so completing multiple frequency range is accomplished by spending the longer testing time, and testing efficiency is relatively low.
Summary of the invention
This application provides a kind of method that electronic equipment is tested and test device, to improve testing efficiency.
First aspect, provide a kind of method testing electronic equipment, including: to the configuration information of the first test item in multiple test items of tester and the described electronic equipment described electronic equipment of transmission, described first test item is tested by the configuration information of described first test item for indicating in multiple frequency ranges of described electronic equipment；Control described tester and described electronic equipment in the plurality of frequency range, described first test item to be tested.
Prior art is respectively multiple test items to be tested in each frequency range, specifically, different test items is tested in a frequency range, owing to different test items needs differently configured parameter, therefore it was required for this test item configuration parameter could be realized the test to this test item before each test item is tested, thus can not continuous print be tested by each test item.And in the scheme of the application, by the same test item of different frequency range is spliced into a test item, thus can only configure primary parameter before testing and just in multiple frequency ranges, this test item can be carried out follow-on test respectively, save the testing time, improve testing efficiency.
In conjunction with first aspect, in the first implementation of first aspect, controlling before described first test item tested by described tester and described electronic equipment, described method also includes: send the configuration information of the second test item in the plurality of test item to described tester and described electronic equipment, described second test item is tested by the configuration information of described second test item for instruction in the plurality of frequency range；In determining the process of test result of described first test item, control described tester and described electronic equipment and in the plurality of frequency range, described second test item is tested.
It should be understood that, by configuring the first test item and the second test item, making just can to the test of the second test item when the test result of the first test item is calculated, without needing to wait the test that a test item just starts after having calculated next test item as prior art, another test item is tested by Appropriate application of the present invention free time, further reduce the testing time, improve testing efficiency.
The first implementation in conjunction with first aspect, in the second implementation of first aspect, described first test item is the project that the upward signal to described electronic equipment is tested, and described second test item is the project that the downstream signal to described electronic equipment is tested；In determining the process of test result of described first test item, control described tester and described electronic equipment in the plurality of frequency range, described second test item to be tested, including: send downstream signal to described electronic equipment when controlling the test result of described tester described first test item of calculating；Control described electronic equipment and receive described downstream signal, described second test item is tested by the plurality of frequency range.
The first implementation in conjunction with first aspect, in the third implementation of first aspect, described first test item is the project that the downstream signal to described electronic equipment is tested, and described second test item is the project that the upward signal to described electronic equipment is tested；In determining the process of test result of described first test item, control described tester and described electronic equipment in the plurality of frequency range, described second test item to be tested, including: send upward signal to described tester when controlling the test result of described electronic equipment described first test item of calculating；Control described tester and receive described upward signal, described second test item is tested by the plurality of frequency range.
In conjunction with first aspect, and the first of first aspect is to any one in the third implementation, and described method also includes: obtain the test result of described first test item each frequency range the plurality of frequency range from described tester or described electronic equipment.
Second aspect, it is provided that a kind of device testing electronic equipment, described device includes the module of the method for performing first aspect.
In some implementation, described first test item includes ascending power test, upper row index combines survey, error vector magnitude is measured and ascending power calibration test.
In some implementation, described second test item includes descending sensitivity test, descending power test, descending power calibration test and descending power calibration test.
In some implementation, the configuration information of described first test item comprises frequency sequence information, wherein, described frequency sequence information comprises at least one frequency of each frequency range in the plurality of frequency range, and described first test item is tested by described frequency sequence information for indicating described electronic equipment on multiple frequencies.
In some implementation, described first test item is ascending power test, and the configuration information of described first test item includes test frequency points, test frequency sequence, test point length, power statistic length and reference power.
In some implementation, described second test item is descending power test, and the configuration information of described second test item includes launching frequency points, launching the transmitting power of frequency sequence, test point length, transmitting power length, transmitted waveform and each test point.
The application tests by the test item of different frequency range is combined into an entirety, in different frequency ranges, identical test item can be carried out follow-on test, parameter will be reconfigured when different frequency ranges is tested without the test item identical like that to prior art, save the testing time, improve testing efficiency.
Accompanying drawing explanation
In order to be illustrated more clearly that the technical scheme of the embodiment of the present invention, the accompanying drawing used required in the embodiment of the present invention will be briefly described below, apparently, drawings described below is only some embodiments of the present invention, for those of ordinary skill in the art, under the premise not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the schematic block diagram of product line RF calibration system of the prior art.
Fig. 2 is the schematic diagram that multiple test items of multiple frequency ranges of terminal to be measured are tested by product line RF calibration system of the prior art.
Fig. 3 is the method schematic diagram that electronic equipment is tested of the test electronic equipment of the embodiment of the present invention.
Fig. 4 is the method schematic diagram that electronic equipment is tested of the test electronic equipment of the embodiment of the present invention.
Fig. 5 is the schematic block diagram of the device of the test electronic equipment of the embodiment of the present invention.
Fig. 6 is the schematic block diagram of the device of the test electronic equipment of the embodiment of the present invention.
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is a part of embodiment of the present invention, rather than whole embodiments.Based on the embodiment in the present invention, the every other embodiment that those of ordinary skill in the art obtain under not making creative work premise, broadly fall into the scope of protection of the invention.
Electronic equipment is tested essentially according to frequency range by existing product line RF calibration system when electronic equipment is tested, each frequency range has one group of test item, parameter configuration will be carried out before each test item is tested, after testing a frequency range, carry out the test of next frequency range again, be so required for carrying out parameter configuration before each test item is tested.Specifically, when comprising ascending power test and descending power test the two test item in each frequency range of electronic equipment, existing product line RF calibration system is specific as follows to the testing procedure of the test of electronic equipment ascending power and descending power test the two test item in a frequency range:
Ascending power is tested:
101, initialization test instrument, for parameters such as test instrumentation configuration testing frequency points, test frequency sequence, test point length, power statistic length and reference powers；
102, for parameters such as electronic equipment configuration testing frequency points to be measured, test frequency sequence, test point length, power statistic length and transmitting powers；
103, the parameter that electronic equipment to be measured configures according to step 102 launches upward signal；
104, test instrumentation detects the upward signal that electronic equipment to be measured is launched, and carries out power statistic；
105, statistical result by the statistical result of control software design reading instrument and is saved by computer.
After completing ascending power is tested, the descending power of electronic equipment is tested, specifically comprising the following steps that of descending power test
106, initialization test instrument, launches frequency points for test instrumentation configuration, launches frequency sequence, test point length, transmitting power length, transmitted waveform, the transmitting power of each test point；
107, configure power statistic frequency points for electronic equipment to be measured, test the parameters such as frequency sequence, test point length, power statistic length, reference power；
108, the parameter that test instrumentation configures according to step 106 launches downstream signal；
109, the downstream signal that electronic equipment to be measured detection test instrumentation is launched, and this downstream signal is carried out power statistic；
110, test result is reported computer by electronic equipment to be measured, computer test result saved；
Above-mentioned steps 101-110 completes the test in a frequency range to ascending power and descending power, is next switched to next frequency range, repeats step 101-110, until all of frequency range has all been tested.
In view of this, when adopting existing product line RF calibration system that electronic equipment is tested, for ascending power test and two different test items of descending test, it is required for repeat the above steps 101-110 when different frequency ranges is tested, that is often it is required for when ascending power or descending power are tested by a frequency range electronic equipment to be measured and test instrumentation are reconfigured parameter, so will take the substantial amounts of time in the process of test, reduce the speed of test.In addition, existing method of testing tester after some test item is tested needs the cost regular hour to calculate test result, and inner electronic equipment is in idle condition during this period of time, this period of free time is not reasonably utilized to carry out other test, cause waste of time, reduce the efficiency of test.In order to reduce the testing time, improve testing efficiency, the method that electronic equipment is tested of the embodiment of the present invention is the same test item of different frequency range to be combined into an entirety test, only carry out the configuration of primary parameter so before testing, next just the test item of multiple frequency ranges is tested, after all having tested, from tester, obtain test result, thus greatly reduce the time of parameter configuration, improve testing efficiency.Below in conjunction with specific embodiment, the method that electronic equipment is tested of the embodiment of the present invention is described in detail.
Fig. 3 illustrates the schematic diagram that electronic equipment is tested by the method for the test electronic equipment of the embodiment of the present invention.Method shown in Fig. 3 can be performed by computer and tester.
As shown in Figure 3, the same test item (test 1) of multiple frequency ranges is combined into an entirety test, before test, configuration information shown in Fig. 3 is respectively configured to tester and electronic equipment by computer, for tester, configuration information includes the configuration parameter information of the first test item and the sequence information of multiple frequency range to be measured, and for electronic equipment, configuration information includes the sequence information of parameter that the first test item to test and multiple frequency range to be measured.After having configured, the parameter that electronic equipment just to be surveyed according to the first test is launched in each frequency range successively or receives corresponding signal, and electronic equipment is just tested in each frequency range by tester according to the configuration information of the first test, until after completing all tests, from tester, obtain test result, so same test item is had only in the configuration starting to test advance line parameter.And existing product line RF calibration system when electronic equipment is tested in units of frequency range, such as, electronic equipment has 5 frequency ranges, each frequency range has 10 test items, electronic equipment and tester will be carried out parameter configuration for these 10 test items in each frequency range by existing product line RF calibration system, therefore, the test that will complete 5 frequency ranges is accomplished by respectively electronic equipment and tester being carried out 50 subparameter configurations, and parameter configuration occupies the substantial amounts of testing time.And after the method for the test electronic equipment of the examples detailed above employing embodiment of the present invention, have only to respectively electronic equipment and tester be configured primary parameter for each test item, specifically, just 5 frequency ranges, this test item can be tested respectively for having only to configuration primary parameter each test item, so complete the test of whole 10 test items and have only to that respectively electronic equipment and tester are configured 10 subparameters and just can realize the test in 5 frequency ranges respectively of 10 test items.The method of the test electronic equipment of the embodiment of the present invention is tested in units of test item when electronic equipment is tested, each test item has only to configuration primary parameter when different frequency ranges is tested just can realize the test to electronic equipment, decrease the time that parameter configuration takies, improve testing efficiency.
Specifically, when above-mentioned first test item is the test that ascending power is calibrated, before testing, test instrumentation is configured to ascending power align mode by computer, and order information and the reference power point of multiple frequency ranges are allocated to tester together, parameter that simultaneous computer also will be tested and the order information of multiple frequency ranges to test are allocated to electronic equipment, then start test.When test, electronic equipment and tester all carry out transmitting and the measurement of signal according to pre-configured parameter, tester and electronic equipment again can carry out the configuration of the second test item after the first test item is completed to realize the test to the second test item.
Test the two test item for up power test and descending power below, the method for the test electronic equipment of the embodiment of the present invention is described in detail.The method of the test electronic equipment of the embodiment of the present invention is to specifically comprising the following steps that ascending power and descending power are tested
The test of ascending power:
201, initialization test instrument, for test instrumentation configuration testing frequency points (this frequency points is the frequency summation that multiple frequency range is added together), test frequency sequence (this frequency range sequence be multiple frequency range frequency constitute sequence), test point length, power statistic length, the parameter such as reference power；
202, for electronic equipment configuration testing frequency points to be measured (this frequency range number is the frequency summation that multiple frequency range is added together), test frequency sequence (this frequency range sequence be multiple frequency range frequency constitute sequence), test point length, power statistic length, the parameter such as transmitting power；
203, the parameter that electronic equipment to be measured configures according to step 202 launches upward signal；
204, test instrumentation detects the upward signal that electronic equipment to be measured is launched, and carries out power statistic；
205, statistical result by the statistical result of control software design reading instrument and is saved by computer.
Descending power is tested:
206, initialization test instrument, frequency points (this frequency points is the frequency summation that multiple frequency range is added together) is launched for test instrumentation configuration, launch frequency sequence (this frequency range sequence be multiple frequency range frequency constitute sequence), test point length, transmitting power length, transmitted waveform, the transmitting power of each test point；
207, power statistic frequency points (this frequency points is the frequency summation that multiple frequency range is added together) is configured for electronic equipment to be measured, test frequency sequence (this frequency range sequence be multiple frequency range frequency constitute sequence), test point length, power statistic length, the parameter such as reference power；
208, the parameter that test instrumentation configures according to step 206 launches downstream signal；
209, the downstream signal that electronic equipment to be measured detection test instrumentation is launched, and this downstream signal is carried out power statistic；
210, test result is reported computer by electronic equipment to be measured, computer test result saved；
From above-mentioned steps 201-210, when two test items such as ascending power test and descending power test are tested, have only to test instrumentation and electronic equipment to be measured are performed twice at parameter configuration and just can complete the test in multiple frequency ranges of this test item, without repeating the configuration of parameter as prior art in each frequency range, it is greatly saved the testing time.
Additionally, for the efficiency improving test electronic equipment further, it is also possible on the basis of the method for testing shown in Fig. 3, adopt method of testing as described in Figure 4.
As shown in Figure 4, first test item and the second test item are belonging to the test item possessing parallel condition, that is the first test item and the second test item will not engaged test instrument and electronic equipments simultaneously in the process of test, such as, first test item can be the test event that the upward signal to electronic equipment tests to obtain the upper line parameter of electronic equipment, and the second test item can be the downstream signal to electronic equipment tests to obtain the downstream parameter test event of electronic equipment.As shown in Figure 4, for the first test item, tester is after receiving the data of electronic equipment, the cost regular hour is needed to be calculated, to obtain test result, tester can send downstream signal (namely carrying out the test of the second test item) to electronic equipment in the process calculated, and at this moment electronic equipment receives the downstream signal that tester sends the calculating carrying out measurement result.Thus, the while that the method for the test electronic equipment of the embodiment of the present invention can be implemented in the result that tester calculates the first test item, electronic equipment the result of the second test item is calculated.Also can carry out the calculating of the first test item and the second test item with regard to saying in the same time simultaneously, wait tester just starts to calculate the result of the second test item method after completing the calculating of the first test item result is needed to compare relative to existing product line RF calibration system, some test item is achieved concurrent testing, save the time of test, improve the efficiency of test.
Specifically, the first test item shown in Fig. 4 can be that upper row index combines survey (e.g., up peak power, error vector magnitude etc.), and the second test item can be lower line sensitivity (performance of test electronic equipment reception small-signal) test.After electronic equipment has launched upward signal to tester, tester receives upward signal, and this upward signal is analyzed and adds up, this needs the cost regular hour, but now tester can also continue to launch downstream signal to electronic equipment, now electronic equipment is in idle condition, therefore, electronic equipment can at tester at the downstream signal being simultaneously received tester transmission upward signal being analyzed and add up, and add up the bit error rate of downstream signal, make row index combine survey and lower line sensitivity can carry out simultaneously, save the testing time, improve testing efficiency.
Above in association with Fig. 3 and Fig. 4, the detailed method testing electronic equipment described according to embodiments of the present invention, below in conjunction with Fig. 5 and Fig. 6, the device of the test electronic equipment of the embodiment of the present invention is described.Should be understood that Fig. 5 and Fig. 6 device described is capable of each step of the method for the test electronic equipment shown in Fig. 3 and Fig. 4, for sake of simplicity, suitably omit repetitive description.
Fig. 5 is the schematic block diagram of the device of the test electronic equipment of the embodiment of the present invention.Device 500 includes:
Sending module 510, for the configuration information of the first test item in the multiple test items to tester and the described electronic equipment described electronic equipment of transmission, described first test item is tested respectively by the configuration information of described first test item for indicating in multiple frequency ranges of described electronic equipment；
Control module 520, respectively described first test item is tested in the plurality of frequency range for controlling described tester and described electronic equipment.
The embodiment of the present invention is tested by the test item of different frequency range is combined into an entirety, in different frequency ranges, identical test item can be carried out follow-on test, parameter will be reconfigured when different frequency ranges is tested without the test item identical like that to prior art, save the testing time, improve testing efficiency.
Alternatively, as an embodiment, described sending module 510 is additionally operable to controlling before described first test item tested by described tester and described electronic equipment, send the configuration information of the second test item in the plurality of test item to described tester and described electronic equipment, described second test item is tested respectively by the configuration information of described second test item for instruction in the plurality of frequency range；
Described control module 520 is for, in determining the process of test result of described first test item, controlling described tester and described electronic equipment and in the plurality of frequency range, described second test item is tested.
The embodiment of the present invention is by configuring the first test item and the second test item, making just can to the test of the second test item when the test result of the first test item is calculated, without needing to wait the test that the calculating of a test item just starts after completing next test item as prior art, another test item is tested by Appropriate application of the present invention free time, further reduce the testing time, improve testing efficiency.
Alternatively, as an embodiment, described first test item is the project that the upward signal to described electronic equipment is tested, and described second test item is the project that the downstream signal to described electronic equipment is tested, described control module 520 specifically for:
Downstream signal is sent to described electronic equipment when controlling the test result of described tester described first test item of calculating；
Control described electronic equipment and receive described downstream signal, described second test item is tested by the plurality of frequency range.
Alternatively, as an embodiment, described first test item is the project that the downstream signal to described electronic equipment is tested, and described second test item is the project that the upward signal to described electronic equipment is tested, described control module 520 specifically for:
Upward signal is sent to described tester when controlling the test result of described electronic equipment described first test item of calculating；
Control described tester and receive described upward signal, described second test item is tested by the plurality of frequency range.
Alternatively, as an embodiment, described device 500 also includes acquisition module 530, and described acquisition module 530 for obtaining the test result of described first test item each frequency range the plurality of frequency range from described tester or described electronic equipment.
Fig. 6 is the schematic block diagram of the device of the test electronic equipment of the embodiment of the present invention.Device 600 includes:
Memorizer 630, is used for storing program；
Transmitter 610, for the configuration information of the first test item in the multiple test items to tester and the described electronic equipment described electronic equipment of transmission, described first test item is tested by the configuration information of described first test item for indicating in multiple frequency ranges of described electronic equipment；
Processor 620, for performing the program in memorizer 630, when described program is performed, described first test item is tested by described processor 620 for controlling described tester and described electronic equipment in the plurality of frequency range.
The embodiment of the present invention is tested by the test item of different frequency range is combined into an entirety, in different frequency ranges, identical test item can be carried out follow-on test, parameter will be reconfigured when different frequency ranges is tested without the test item identical like that to prior art, save the testing time, improve testing efficiency.
Alternatively, as an embodiment, described transmitter 610 is additionally operable to controlling before described first test item tested by described tester and described electronic equipment, send the configuration information of the second test item in the plurality of test item to described tester and described electronic equipment, described second test item is tested by the configuration information of described second test item for instruction in the plurality of frequency range；
Described processor 620 is for, in determining the process of test result of described first test item, controlling described tester and described electronic equipment and in the plurality of frequency range, described second test item is tested.
The embodiment of the present invention is by configuring the first test item and the second test item, making just can to the test of the second test item when the test result of the first test item is calculated, without needing to wait the test that the calculating of a test item just starts after completing next test item as prior art, another test item is tested by Appropriate application of the present invention free time, further reduce the testing time, improve testing efficiency.
Alternatively, as an embodiment, described first test item is the project that the upward signal to described electronic equipment is tested, and described second test item is the project that the downstream signal to described electronic equipment is tested, described processor 620 specifically for:
Downstream signal is sent to described electronic equipment when controlling the test result of described tester described first test item of calculating；
Control described electronic equipment and receive described downstream signal, described second test item is tested by the plurality of frequency range.
Alternatively, as an embodiment, described first test item is the project that the downstream signal to described electronic equipment is tested, and described second test item is the project that the upward signal to described electronic equipment is tested, described processor 620 specifically for:
Upward signal is sent to described tester when controlling the test result of described electronic equipment described first test item of calculating；
Control described tester and receive described upward signal, described second test item is tested by the plurality of frequency range.
Alternatively, as an embodiment, described processor 620 is additionally operable to obtain the test result of described first test item each frequency range the plurality of frequency range from described tester or described electronic equipment.
Those of ordinary skill in the art are it is to be appreciated that the unit of each example that describes in conjunction with the embodiments described herein and algorithm steps, it is possible to being implemented in combination in of electronic hardware or computer software and electronic hardware.These functions perform with hardware or software mode actually, depend on application-specific and the design constraint of technical scheme.Professional and technical personnel specifically can should be used for using different methods to realize described function to each, but this realization is it is not considered that beyond the scope of this invention.
Those skilled in the art is it can be understood that arrive, for convenience and simplicity of description, and the specific works process of the system of foregoing description, device and unit, it is possible to reference to the corresponding process in preceding method embodiment, do not repeat them here.
In several embodiments provided herein, it should be understood that disclosed system, apparatus and method, it is possible to realize by another way.Such as, device embodiment described above is merely schematic, such as, the division of described unit, being only a kind of logic function to divide, actual can have other dividing mode when realizing, for instance multiple unit or assembly can in conjunction with or be desirably integrated into another system, or some features can ignore, or do not perform.Another point, shown or discussed coupling each other or direct-coupling or communication connection can be through INDIRECT COUPLING or the communication connection of some interfaces, device or unit, it is possible to be electrical, machinery or other form.
The described unit illustrated as separating component can be or may not be physically separate, and the parts shown as unit can be or may not be physical location, namely may be located at a place, or can also be distributed on multiple NE.Some or all of unit therein can be selected according to the actual needs to realize the purpose of the present embodiment scheme.
It addition, each functional unit in each embodiment of the present invention can be integrated in a processing unit, it is also possible to be that unit is individually physically present, it is also possible to two or more unit are integrated in a unit.
If described function is using the form realization of SFU software functional unit and as independent production marketing or use, it is possible to be stored in a computer read/write memory medium.Based on such understanding, part or the part of this technical scheme that prior art is contributed by technical scheme substantially in other words can embody with the form of software product, this computer software product is stored in a storage medium, including some instructions with so that a computer equipment (can be personal computer, server, or the network equipment etc.) perform all or part of step of method described in each embodiment of the present invention.And aforesaid storage medium includes: USB flash disk, portable hard drive, read only memory (ROM, Read-OnlyMemory), the various media that can store program code such as random access memory (RAM, RandomAccessMemory), magnetic disc or CD.
The above; being only the specific embodiment of the present invention, but protection scope of the present invention is not limited thereto, any those familiar with the art is in the technical scope that the invention discloses; change can be readily occurred in or replace, all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should described be as the criterion with scope of the claims.
Claims (15)
1. the method testing electronic equipment, it is characterised in that including:
To the configuration information of the first test item in multiple test items of tester and the described electronic equipment described electronic equipment of transmission, described first test item is tested by the configuration information of described first test item for indicating in multiple frequency ranges of described electronic equipment；
Control described tester and described electronic equipment in the plurality of frequency range, described first test item to be tested.
2. the method for claim 1, it is characterised in that controlling before described first test item tested by described tester and described electronic equipment, described method also includes:
Send the configuration information of the second test item in the plurality of test item to described tester and described electronic equipment, described second test item is tested by the configuration information of described second test item for instruction in the plurality of frequency range；
In determining the process of test result of described first test item, control described tester and described electronic equipment and in the plurality of frequency range, described second test item is tested.
3. method as claimed in claim 2, it is characterised in that described first test item is the project that the upward signal to described electronic equipment is tested, and described second test item is the project that the downstream signal to described electronic equipment is tested；
In determining the process of test result of described first test item, control described tester and described electronic equipment and in the plurality of frequency range, described second test item is tested, including:
Downstream signal is sent to described electronic equipment when controlling the test result of described tester described first test item of calculating；
Control described electronic equipment and receive described downstream signal, described second test item is tested by the plurality of frequency range.
4. method as claimed in claim 2, it is characterised in that described first test item is the project that the downstream signal to described electronic equipment is tested, and described second test item is the project that the upward signal to described electronic equipment is tested；
In determining the process of test result of described first test item, control described tester and described electronic equipment and in the plurality of frequency range, described second test item is tested, including:
Upward signal is sent to described tester when controlling the test result of described electronic equipment described first test item of calculating；
Control described tester and receive described upward signal, described second test item is tested by the plurality of frequency range.
5. the method as according to any one of claim 1-4, it is characterised in that described method also includes:
The test result of described first test item each frequency range the plurality of frequency range is obtained from described tester or described electronic equipment.
6. the device testing electronic equipment, it is characterised in that including:
Sending module, for the configuration information of the first test item in the multiple test items to tester and the described electronic equipment described electronic equipment of transmission, described first test item is tested by the configuration information of described first test item for indicating in multiple frequency ranges of described electronic equipment；
Control module, in the plurality of frequency range, described first test item is tested for controlling described tester and described electronic equipment.
7. device as claimed in claim 6, it is characterised in that described sending module is additionally operable to:
Controlling before described first test item tested by described tester and described electronic equipment, send the configuration information of the second test item in the plurality of test item to described tester and described electronic equipment, described second test item is tested by the configuration information of described second test item for instruction in the plurality of frequency range；
Described control module is for, in determining the process of test result of described first test item, controlling described tester and described electronic equipment and in the plurality of frequency range, described second test item is tested.
8. device as claimed in claim 7, it is characterized in that, described first test item is the project that the upward signal to described electronic equipment is tested, and described second test item is the project that the downstream signal to described electronic equipment is tested, described control module specifically for:
Downstream signal is sent to described electronic equipment when controlling the test result of described tester described first test item of calculating；
Control described electronic equipment and receive described downstream signal, described second test item is tested by the plurality of frequency range.
9. device as claimed in claim 7, it is characterized in that, described first test item is the project that the downstream signal to described electronic equipment is tested, and described second test item is the project that the upward signal to described electronic equipment is tested, described control module specifically for:
Upward signal is sent to described tester when controlling the test result of described electronic equipment described first test item of calculating；
Control described tester and receive described upward signal, described second test item is tested by the plurality of frequency range.
10. the device as according to any one of claim 6-9, it is characterised in that described device also includes:
Acquisition module, for obtaining the test result of described first test item each frequency range the plurality of frequency range from described tester or described electronic equipment.
11. the device testing electronic equipment, it is characterised in that including:
Memorizer, is used for storing program；
Transmitter, for the configuration information of the first test item in the multiple test items to tester and the described electronic equipment described electronic equipment of transmission, described first test item is tested by the configuration information of described first test item for indicating in multiple frequency ranges of described electronic equipment；
Processor, for performing the program in memorizer, when described program is performed, described first test item is tested by described processor for controlling described tester and described electronic equipment in the plurality of frequency range.
12. device as claimed in claim 11, it is characterized in that, described transmitter is additionally operable to controlling before described first test item tested by described tester and described electronic equipment, send the configuration information of the second test item in the plurality of test item to described tester and described electronic equipment, described second test item is tested by the configuration information of described second test item for instruction in the plurality of frequency range；
Described processor is for, in determining the process of test result of described first test item, controlling described tester and described electronic equipment and in the plurality of frequency range, described second test item is tested.
13. device as claimed in claim 12, it is characterized in that, described first test item is the project that the upward signal to described electronic equipment is tested, and described second test item is the project that the downstream signal to described electronic equipment is tested, described processor specifically for:
Downstream signal is sent to described electronic equipment when controlling the test result of described tester described first test item of calculating；
Control described electronic equipment and receive described downstream signal, described second test item is tested by the plurality of frequency range.
14. device as claimed in claim 12, it is characterized in that, described first test item is the project that the downstream signal to described electronic equipment is tested, and described second test item is the project that the upward signal to described electronic equipment is tested, described processor specifically for:
Upward signal is sent to described tester when controlling the test result of described electronic equipment described first test item of calculating；
Control described tester and receive described upward signal, described second test item is tested by the plurality of frequency range.
15. the device as according to any one of claim 11-14, it is characterised in that described processor is additionally operable to obtain the test result of described first test item each frequency range the plurality of frequency range from described tester or described electronic equipment.
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| CN201610113172.9A CN105790859A (en) | 2016-02-29 | 2016-02-29 | Method and apparatus for testing electronic device |
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