CN105789005A - Split-type transmission electron microscope sample rod - Google Patents
Split-type transmission electron microscope sample rod Download PDFInfo
- Publication number
- CN105789005A CN105789005A CN201610285487.1A CN201610285487A CN105789005A CN 105789005 A CN105789005 A CN 105789005A CN 201610285487 A CN201610285487 A CN 201610285487A CN 105789005 A CN105789005 A CN 105789005A
- Authority
- CN
- China
- Prior art keywords
- shaft
- functional head
- plug
- electron microscope
- socket
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005540 biological transmission Effects 0.000 title claims abstract description 22
- 239000000463 material Substances 0.000 claims description 20
- 239000004696 Poly ether ether ketone Substances 0.000 claims description 12
- 229920002530 polyetherether ketone Polymers 0.000 claims description 12
- 229920003002 synthetic resin Polymers 0.000 claims description 12
- 239000000057 synthetic resin Substances 0.000 claims description 12
- 239000003822 epoxy resin Substances 0.000 claims description 6
- 229920000647 polyepoxide Polymers 0.000 claims description 6
- 229910000562 Gilding metal Inorganic materials 0.000 claims description 3
- 229910001069 Ti alloy Inorganic materials 0.000 claims description 3
- 238000003032 molecular docking Methods 0.000 claims description 3
- 239000011028 pyrite Substances 0.000 claims description 3
- NIFIFKQPDTWWGU-UHFFFAOYSA-N pyrite Chemical compound [Fe+2].[S-][S-] NIFIFKQPDTWWGU-UHFFFAOYSA-N 0.000 claims description 3
- 229910052683 pyrite Inorganic materials 0.000 claims description 3
- JUPQTSLXMOCDHR-UHFFFAOYSA-N benzene-1,4-diol;bis(4-fluorophenyl)methanone Chemical compound OC1=CC=C(O)C=C1.C1=CC(F)=CC=C1C(=O)C1=CC=C(F)C=C1 JUPQTSLXMOCDHR-UHFFFAOYSA-N 0.000 claims 2
- 238000012546 transfer Methods 0.000 abstract description 6
- 238000003780 insertion Methods 0.000 abstract 1
- 230000037431 insertion Effects 0.000 abstract 1
- 210000001503 joint Anatomy 0.000 abstract 1
- 238000007789 sealing Methods 0.000 abstract 1
- 239000000523 sample Substances 0.000 description 12
- 238000013461 design Methods 0.000 description 9
- 238000012360 testing method Methods 0.000 description 6
- 238000011065 in-situ storage Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 230000008859 change Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000006101 laboratory sample Substances 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 239000002086 nanomaterial Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 238000004627 transmission electron microscopy Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/261—Details
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
A split-type transmission electron microscope sample rod comprises a rod body and a function head. A center position of a shell of the rod body is provided with a plug. A center position in the function head is provided with a socket matching with the plug. Vacuum sealing components are filled between the socket and the shell of the rod body and between the plug and a shell of the function head. Through mutually inserting of the plug and the socket, butt joint of the rod body and the function head is realized. A shell end portion of the function head, which is connected to the rod body, is provided with a connection head. During connection, the connection head is inserted into the rod body shell. A connection head end portion is provided with a positioning pin. A corresponding position in the shell of the rod body is provided with a positioning groove. Through the positioning pin and the positioning groove, the rod body and the function head realize circumferential alignment and insertion ends of the rod body and the function head are provided with external threads. A casing pipe sleeves an outer portion of the function head. An internal thread which matches with the external threads of the rod body and the function head is arranged in the casing pipe. The function head of sample rod is detachable and replaceable so that problems that a common sample rod has one function, transport cost and a risk are high and sample transfer is difficult are solved.
Description
Technical field
The invention belongs to transmission electron microscope in-situ testing technique field, be specifically related to a kind of split type example of transmission electron microscope bar.
Background technology
Transmission electron microscope is the research direction currently developed rapidly for the in-situ test of nano material, and the improvement of example of transmission electron microscope bar is always up the hot issue in in-situ test field, is also the major impetus promoting in-situ testing technique.The i.e. real-time change observing the character such as physics and chemistry that material occurs under given conditions in ultramicroscope of in-situ test, the factors such as high vacuum environment special in transmission electron microscope, electromagnetic environment and less pole shoe size, add the design of transmission electron microscopy specimen holder and the difficulty of processing, therefore sample for use in transmitted electron microscope bar is generally of higher price, and most specimen holder needs import to purchase.
Existing sample for use in transmitted electron microscope bar is not split design, the corresponding a kind of fixing function of each specimen holder, as used other functions, it is necessary to again purchase new specimen holder, this greatly improves the economy of on-spot study and time cost.And, it is general in the fast and safely transfer between equipment and transmission electron microscope such as focused ion bundle, scanning electron microscope and functional device that existing specimen holder is difficult to sample, the such as lithium battery material sample of easily oxidation transfer between multiple sign equipment, it is always up the technology that Materials Research Laboratories is badly in need of, but due to sample for use in transmitted electron microscope bar up to the shaft of 350mm so as to be difficult to.Additionally, the specimen holder volume with fine structure is excessive, also transport is proposed significantly high requirement, after breaking down particularly in specimen holder during depot repair, pack the improper damage very easily causing specimen holder.
Therefore the existing specimen holder not possessing split function has the obvious disadvantage that in function, transport and sample transfer party face.
Summary of the invention
In order to solve above-mentioned prior art Problems existing, it is an object of the invention to provide a kind of split type example of transmission electron microscope bar, the functional head of this specimen holder can be conveniently replaced, solve the function singleness of common sample bar, freight and have a big risk, sample transfer difficulty problem.
In order to achieve the above object, the present invention adopts the following technical scheme that
nullA kind of split type example of transmission electron microscope bar，Including shaft 1 and functional head 2，It is provided centrally with plug 3 in the housing of described shaft 1，Vacuum seal 7 it is filled with between the housing of plug 3 and shaft 1，The socket 4 suitable with plug 3 it is provided centrally with in described functional head 2，Vacuum seal 7 it is also filled with between the housing of socket 4 and functional head 2，By plug 3 and socket 4 to inserting，Realize shaft 1 and the docking of functional head 2，The shell end that described functional head 2 is connected with shaft 1 is provided with union joint 9，The external diameter of described union joint 9 is less than or equal to the housing inner diameter of shaft 1，During connection, union joint 9 inserts in shaft 1 housing，It is provided with in union joint 9 end and positions slightly 8-1，In the housing of shaft 1, correspondence position is provided with locating slot 8-2，Shaft 1 and functional head 2 circumferential alignment is realized by positioning slightly 8-1 and locating slot 8-2，At shaft 1 and functional head 2, spigot is provided with external screw thread 5，Sleeve pipe 6 it is cased with outside functional head 2，The female thread suitable with the external screw thread 5 of shaft 1 and functional head 2 it is provided with in described sleeve pipe 6，Shaft 1 and functional head 2 are to after inserting，By revoling tube 6，Sleeve pipe 6 is made to be anchored on shaft 1 and the periphery of functional head 2.
The contact pin of described plug 3 is four, and accordingly, the jack of described socket 4 is also four.
The material of described plug 3 and socket 4 adopts epoxy resin synthetic resin material or polyether-ether-ketone (PEEK) synthetic resin material.
The material of described vacuum seal 7 adopts epoxy resin synthetic resin material or polyether-ether-ketone (PEEK) synthetic resin material.
The contact pin of described plug 3 and the jack of socket 4 adopt gilding metal or pyrite.
The housing of described shaft 1 and functional head 2 adopts titanium alloy.
Compared to the prior art relatively, the present invention possesses following advantage:
1, the split type specimen holder of the present invention, it is easy to dismounting specimen holder functional head part, it is not necessary to take off laboratory sample, it is possible to fast and safely realize the sample transfer at many equipment rooms.
2, the split type specimen holder of the present invention, owing to the integral type specimen holder before abandoning designs, becomes detachable functional head, it is possible to by the volume-diminished about 60% of funtion part by Front-end Design, weight be only before 30%, reduce greatly the risk and cost of transport.
3, the split type specimen holder of the present invention, it is possible to when selecting specimen holder, only change functional head, it is not necessary to purchase whole shaft, acquisition cost can be reduced at most cases.
4, the split type specimen holder of the present invention, can the functional development process of specification specimen holder further, using the functional head of front end as function body, need not consider that when design sample bar external dimensions coordinates, only need change functional head inner function module, the original position specimen holder of specific function can be designed, such as double; two function specimen holders that incline, heating function specimen holder, electrical testing function specimen holder etc..
5, threaded sleeve design described in detail in the present invention, it is ensured that specimen holder has high mechanical coupling strength and higher axiality in the axial direction, coordinates location and plugs and sockets, it is easy to dismantle and install.
Accompanying drawing explanation
Fig. 1 is the shaft structures schematic diagram of the split type example of transmission electron microscope bar of the present invention.
Fig. 2 is the functional head structural representation of the split type example of transmission electron microscope bar of the present invention.
The shaft of the split type example of transmission electron microscope bar of Fig. 3 present invention and functional head connected by plug and socket after schematic diagram.
After the shaft of the split type example of transmission electron microscope bar of Fig. 4 present invention and functional head are connected by plug and socket and sleeve pipe be anchored on shaft and the schematic diagram of functional head periphery.
Detailed description of the invention
Below in conjunction with the drawings and specific embodiments, the present invention is described in detail.
nullAs depicted in figs. 1 and 2，A kind of split type example of transmission electron microscope bar of the present invention，Including shaft 1 and functional head 2，It is provided centrally with plug 3 in the housing of described shaft 1，Vacuum seal 7 it is filled with between the housing of plug 3 and shaft 1，The socket 4 suitable with plug 3 it is provided centrally with in described functional head 2，Vacuum seal 7 it is also filled with between the housing of socket 4 and functional head 2，By plug 3 and socket 4 to inserting，Realize shaft 1 and the docking of functional head 2，The shell end that described functional head 2 is connected with shaft 1 is provided with union joint 9，The external diameter of described union joint 9 is less than or equal to the housing inner diameter of shaft 1，During connection, union joint 9 inserts in shaft 1 housing，It is provided with in union joint 9 end and positions slightly 8-1，In the housing of shaft 1, correspondence position is provided with locating slot 8-2，Shaft 1 and functional head 2 circumferential alignment is realized by positioning slightly 8-1 and locating slot 8-2，At shaft 1 and functional head 2, spigot is provided with external screw thread 5，Sleeve pipe 6 it is cased with outside functional head 2，The female thread suitable with the external screw thread 5 of shaft 1 and functional head 2 it is provided with in described sleeve pipe 6，Shaft 1 and functional head 2 are to after inserting，Its structure is as shown in Figure 3.By revoling tube 6, sleeve pipe 6 is made to be anchored on shaft 1 and the periphery of functional head 2, as shown in Figure 4.
As the preferred embodiment of the present invention, the contact pin of described plug 3 is four, and accordingly, the jack of described socket 4 is also four.
As the preferred embodiment of the present invention, the material of described plug 3 and socket 4 adopts the synthetic resin material such as epoxy resin synthetic resin material or polyether-ether-ketone (PEEK)
As the preferred embodiment of the present invention, the material of described vacuum seal 7 adopts the synthetic resin material such as epoxy resin synthetic resin material or polyether-ether-ketone (PEEK).
As the preferred embodiment of the present invention, the jack of described plug 3 contact pin and socket 4 adopts gilding metal or pyrite.
As the preferred embodiment of the present invention, the shell of described shaft 1 and functional head 2 adopts titanium alloy.
The present invention adopts split type design, reduce the volume of the functional areas of sample for use in transmitted electron microscope bar precise structure, plug and socket can realize stablizing and electrically connect easily, location slightly with the design of locating slot, can ensure that connection procedure is directed at, internally threaded sleeve design is used for connecting split type specimen holder, it is ensured that coaxially connected between shaft and functional head, the axiality meeting sample for use in transmitted electron microscope bar requires and mechanical bonding strength requirement, and disassembly process is also easy to implement.
Claims (6)
- null1. a split type example of transmission electron microscope bar，It is characterized in that: include shaft (1) and functional head (2)，Plug (3) it is provided centrally with in the housing of described shaft (1)，Vacuum seal (7) it is filled with between the housing of plug (3) and shaft (1)，The socket (4) suitable with plug (3) it is provided centrally with in described functional head (2)，Vacuum seal (7) it is also filled with between the housing of socket (4) and functional head (2)，By plug (3) and socket (4) to inserting，Realize shaft (1) and the docking of functional head (2)，The shell end that described functional head (2) is connected with shaft (1) is provided with union joint (9)，The external diameter of described union joint (9) is less than or equal to the housing inner diameter of shaft (1)，During connection, union joint (9) inserts in shaft (1) housing，Location it is provided with slightly (8-1) in union joint (9) end，In the housing of shaft (1), correspondence position is provided with locating slot (8-2)，By positioning, slightly (8-1) and locating slot (8-2) realize shaft (1) and functional head (2) circumferential alignment，At shaft (1) and functional head (2), spigot is provided with external screw thread (5)，Sleeve pipe (6) it is cased with outside functional head (2)，The female thread suitable with the external screw thread (5) of shaft (1) and functional head (2) it is provided with in described sleeve pipe (6)，Shaft (1) and functional head (2) are to after inserting，By revoling tube (6)，Sleeve pipe (6) is made to be anchored on shaft (1) and the periphery of functional head (2).
- 2. the split type example of transmission electron microscope bar of one according to claim 1, it is characterised in that: the contact pin of described plug (3) is four, and accordingly, the jack of described socket (4) is also four.
- 3. the split type example of transmission electron microscope bar of one according to claim 1, it is characterised in that: the insulant of described plug (3) and socket (4) adopts epoxy resin synthetic resin material or polyether-ether-ketone PEEK synthetic resin material.
- 4. the split type example of transmission electron microscope bar of one according to claim 1, it is characterised in that: the material of described vacuum seal (7) adopts epoxy resin synthetic resin material or polyether-ether-ketone PEEK synthetic resin material.
- 5. the split type example of transmission electron microscope bar of one according to claim 1, it is characterised in that: the contact pin of described plug (3) and the jack of socket (4) adopt gilding metal or pyrite.
- 6. the split type example of transmission electron microscope bar of one according to claim 1, it is characterised in that: the housing of described shaft (1) and functional head (2) adopts titanium alloy.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610285487.1A CN105789005B (en) | 2016-04-29 | 2016-04-29 | A kind of split type example of transmission electron microscope bar |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610285487.1A CN105789005B (en) | 2016-04-29 | 2016-04-29 | A kind of split type example of transmission electron microscope bar |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105789005A true CN105789005A (en) | 2016-07-20 |
| CN105789005B CN105789005B (en) | 2017-06-20 |
Family
ID=56400406
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610285487.1A Active CN105789005B (en) | 2016-04-29 | 2016-04-29 | A kind of split type example of transmission electron microscope bar |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105789005B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107315020A (en) * | 2017-07-31 | 2017-11-03 | 中国科学院宁波材料技术与工程研究所 | A kind of chip fixing structure in situ of example of transmission electron microscope bar |
| CN111272549A (en) * | 2020-01-31 | 2020-06-12 | 浙江大学 | Sample loading method and sample clamp for transmission electron microscope in-situ pressure test |
| CN111272548A (en) * | 2020-01-31 | 2020-06-12 | 浙江大学 | In-situ pressure experiment system for transmission electron microscope and sample preparation method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006042154A1 (en) * | 2004-10-08 | 2006-04-20 | Fling William F | Collapsible liquid level measurement device with attachments |
| CN103000480A (en) * | 2012-11-29 | 2013-03-27 | 中国科学院物理研究所 | Transmission electron microscope sample rod capable of being added with optical fibers |
| CN205645751U (en) * | 2016-04-29 | 2016-10-12 | 西安交通大学 | Split type transmission electron microscope sample rod structure |
-
2016
- 2016-04-29 CN CN201610285487.1A patent/CN105789005B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006042154A1 (en) * | 2004-10-08 | 2006-04-20 | Fling William F | Collapsible liquid level measurement device with attachments |
| CN103000480A (en) * | 2012-11-29 | 2013-03-27 | 中国科学院物理研究所 | Transmission electron microscope sample rod capable of being added with optical fibers |
| CN205645751U (en) * | 2016-04-29 | 2016-10-12 | 西安交通大学 | Split type transmission electron microscope sample rod structure |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107315020A (en) * | 2017-07-31 | 2017-11-03 | 中国科学院宁波材料技术与工程研究所 | A kind of chip fixing structure in situ of example of transmission electron microscope bar |
| CN107315020B (en) * | 2017-07-31 | 2023-08-04 | 中国科学院宁波材料技术与工程研究所 | In-situ chip fixing structure of transmission electron microscope sample rod |
| CN111272549A (en) * | 2020-01-31 | 2020-06-12 | 浙江大学 | Sample loading method and sample clamp for transmission electron microscope in-situ pressure test |
| CN111272548A (en) * | 2020-01-31 | 2020-06-12 | 浙江大学 | In-situ pressure experiment system for transmission electron microscope and sample preparation method |
| CN111272548B (en) * | 2020-01-31 | 2022-03-11 | 浙江大学 | In-situ pressure experiment system for transmission electron microscope and sample preparation method |
| CN111272549B (en) * | 2020-01-31 | 2022-04-22 | 浙江大学 | Sample loading method and sample clamp for transmission electron microscope in-situ pressure test |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105789005B (en) | 2017-06-20 |
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Effective date of registration: 20221208 Address after: 712046 Floor 2, Building 7, Incubation Park, Gaoke Second Road, Xianyang Hi tech Industrial Development Zone, Shaanxi Province Patentee after: Xianyang Gazelle Valley New Material Technology Co.,Ltd. Address before: 710049 No. 28, Xianning Road, Xi'an, Shaanxi Patentee before: XI'AN JIAOTONG University |