CN105788524A - Gamma adjusting device and gamma adjusting method - Google Patents
Gamma adjusting device and gamma adjusting method Download PDFInfo
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- CN105788524A CN105788524A CN201410830850.4A CN201410830850A CN105788524A CN 105788524 A CN105788524 A CN 105788524A CN 201410830850 A CN201410830850 A CN 201410830850A CN 105788524 A CN105788524 A CN 105788524A
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Abstract
The invention discloses a gamma adjusting device and a gamma adjusting method. The gamma adjusting device comprises a detection pattern (TFG), a storage module used for pre-storage of gamma data, a signal processing module, and a driving chip. One end of the signal processing module is electrically connected with the storage module, and the other end is respectively electrically connected with the detection pattern and the driving chip. The signal processing module is used to transmit the detection signal to the detection pattern, and is used to process the electric signal returned by the detection pattern, and then is used to burn the gamma data of the storage module corresponding to the processing result in the driving chip. The gamma curve corresponding to the screen body can satisfy the requirement on the specification, and therefore the point-by-point adjustment can be prevented, and the operation efficiency can be improved.
Description
Technical field
The present invention relates to Display Technique field, particularly relate to a kind of gamma adjusting device and method.
Background technology
The brightness of display screen is subject to P silicon TFT electric current and controls (Fig. 1), including ELVDD power supply 2001, OLED2002, storage electric capacity 2003, switch TFT2004, data wire 2005 and scanning line 2006, P silicon TFT is formed figure (Fig. 2) by the P silicon of certain wide cut (w) He length (l), electric current is subject to the ratio w/l of P silicon wide cut (w) and length (l) to be affected, when w/l changes, the driving electric current of its TFT will change with executing alive relation curve, the brightness of screen body also can produce change simultaneously, particularly the ELVDD voltage deviation of the correspondence on 255 rank is maximum.
Manufacture due to actual at display floater, the w/l value of P silicon there will be skew in the scope of certain technique, in order to make up this skew, TFT is driven electric current and the impact executing alive relation curve, a kind of good method is that correspondence adjusts the voltage of video data to compensate process deviation when producing change, namely adjusts gamma (Gamma) curve.
Gamma adjustment mode now for display screen is a lot, adjustment mode for the process deviation of display screen is confined to the single independent testing and debugging of screen body, generally minutes more than 9, the adjustment point position of one gamma curve of each screen body, in adjustment process, each some position for each screen body is measured one by one, then corresponding brightness adjustment requiring in specification, according to the result adjusted in corresponding data recording to corresponding depositor, gamma curve is made to meet demand.It is relatively slow that this kind adjusts mode operating speed, when shielding body homogeneity and being poor, produces the line activity duration longer.
Therefore, it is necessary to improve to overcome drawbacks described above to prior art.
Summary of the invention
It is an object of the invention to provide one and avoid pointwise adjustment, promote gamma adjusting device and the method for working performance.
For realizing object defined above, the present invention adopts the following technical scheme that a kind of gamma adjusting device, including test pattern, in order to store the memory module of gamma data in advance, signal processing module and driving chip, described signal processing module one end electrically connects described memory module, the other end is electrically connected described test pattern and described driving chip, detection signal is sent to described test pattern by described signal processing module, and the signal of telecommunication that described test pattern returned processes, then gamma data corresponding with result in memory module is burnt in driving chip.
As a further improvement on the present invention, described gamma adjusting device also includes signal transmission module, and described signal transmission module one end connects described signal processing module, and the other end is electrically connected described test pattern and described driving chip.
As a further improvement on the present invention, described signal processing module includes detection processing unit and the signal transmitting unit, signal receiving unit and the data recording unit that electrically connect respectively with described detection processing unit, described signal transmitting unit and signal receiving unit electrically connect described test pattern respectively through described signal transmission unit, and described data recording unit electrically connects described driving chip by described signal transmission unit.
As a further improvement on the present invention, described gamma adjusting device also includes a computer, and described memory module is arranged in described computer, and described computer electrically connects described detection processing unit.
As a further improvement on the present invention, described in be applied to the voltage signal in test pattern be fixed voltage, voltage is at below 12V.
As a further improvement on the present invention, described test pattern quantity is more than 1.
For realizing object defined above, the present invention also can adopt the following technical scheme that a kind of method described in gamma adjustment method includes:
Step one: described signal processing module sends detection signal to described test pattern；
Step 2: the signal of telecommunication that described test pattern is returned by described signal processing module processes；
Step 3: gamma data corresponding with result in memory module is burnt in driving chip by described signal processing module.
As a further improvement on the present invention, above-mentioned steps one detailed process is that described detection processing unit controls described signal transmitting unit transmission detection signal, and described detection signal is transferred to described test pattern by signal transmission module.
As a further improvement on the present invention, above-mentioned steps two is specially described test pattern and sends the corresponding signal of telecommunication by described signal transmission module to described signal receiving unit, described signal receiving unit receives the signal of telecommunication that described test pattern returns and is transferred to described detection processing unit and processes, namely compare and lookup with the data in memory module, obtain the gamma data of correspondence.
As a further improvement on the present invention, above-mentioned steps three is specially described detection processing unit and controls described data recording unit and corresponding gamma data be burnt in driving chip.
The present invention is by the signal of telecommunication by applying detection in described test pattern, described signal processing module receives the signal of telecommunication of test pattern transmission, and be analyzed calling with the data in memory module, by in the data recording after calling to source drive chip, so arrange, meeting gamma curve corresponding to screen body in requirement specification, thus avoiding pointwise adjustment, promoting working performance.
Accompanying drawing explanation
Fig. 1 is AMOLED circuit diagram in prior art；
Fig. 2 is P silicon TFT pictorial diagram in prior art；
Fig. 3 is the structural representation of gamma adjusting device specific embodiment of the present invention；
Fig. 4 is test pattern image equivalent circuit of the present invention；
Fig. 5 is test pattern structural representation of the present invention.
Detailed description of the invention
Describe the present invention below with reference to specific embodiment shown in the drawings.What deserves to be explained is, hereafter described embodiment is not limiting as the present invention, and those of ordinary skill in the art is all contained in protection scope of the present invention according to the made structure of these embodiments, method or conversion functionally.
Please join shown in Fig. 3, gamma adjusting device of the present invention includes test pattern 1007, in order to store the memory module 111 of gamma data in advance, signal processing module 12 and driving chip 1011, described signal processing module 12 one end electrically connects described memory module 111, the other end is electrically connected described test pattern 1007 and described driving chip 1011, in the present embodiment, described signal processing module 12 includes detection processing unit 1201 and the signal transmitting unit 1202 electrically connected respectively with described detection processing unit 1201, data recording unit 1203 and signal receiving unit 1204.
Concrete, gamma adjusting device of the present invention also includes signal substrate 1001, array base palte 1002 and in order to electrically connect the flexible joint material 1003 of signal substrate 1001 and array base palte 1002.Described test pattern 1007 and described driving chip 1011 are positioned on described array base palte 1002, and the input being provided with to electrically connect signal substrate 1001 and array base palte 1002 in described flexible joint material 1003 connects cabling 1006, output connects cabling 1008 and data recording cabling 1010.Described signal substrate 1001 is provided with signal input port 1004, signal output port 1005 and data recording port 1009.In the present embodiment, signal input port 1004 connects cabling 1006 by described input and electrically connects with described test pattern 1007 and signal transmitting unit 1202 respectively, described signal output port 1005 connects cabling 1008 by described output and electrically connects with described test pattern 1007 and signal receiving unit 1204 respectively, and described data recording port 1009 is electrically connected with described driving chip 1011 and data recording unit 1203 respectively by described data recording cabling 1010.
In the present embodiment, described gamma adjusting device also includes a computer 11, and described memory module 111 is positioned at described computer 11, and described detection processing unit 1201 is electrically connected with described memory module 111 by connecting line 13.
In the present embodiment, described test pattern 1007 is identical with the length-width ratio of P silicon TFT channel and manufactures with P silicon TFT simultaneously, and so, the impact of the raceway groove w/l of P silicon TFT can be shown in test pattern by process deviation equally.So arrange, the voltage signal of detection is connected cabling 1006 via signal input port 1004 by described input and is applied in test pattern 1007 by detection processing unit 1201, the current signal that test pattern 1007 produces connects cabling 1008 via signal output port 1005 transmission to detection processing unit 1201 by described output, and gamma curve data corresponding in memory module 111 are burnt in driving chip 1011 by data recording cabling 1010 after being processed by described current signal by described detection processing unit 1201 via data recording port 1009.So arrange, gamma curve corresponding to screen body can being met in requirement specification, thus avoiding pointwise adjustment, promoting working performance.
In a specific embodiment, described detection processing unit 1201 connects cabling 1006 to test pattern 1007 in order to the voltage signal that detects via input by what signal transmitting unit 1202 sent correspondence after receiving the instruction that computer 11 sends, the current signal that test pattern 1007 produces connects cabling 1008 arriving signal via output and receives unit 1204, signal receiving unit 1204 is by described current signal transfer to detection processing unit 1201, detection processing unit 1201 is burnt to gamma curve data corresponding in computer 11 in driving chip 1011 via data recording cabling 1010 by data recording unit 1203 according to result after being processed by described current signal.
Please joining shown in Fig. 4, for test pattern 1007 image equivalent circuit, test pattern 1007 shape is entirely identical to P silicon TFT, and quantity is more than more than 1, so arranges, and detection acquired results is comparatively accurately with obvious.In other embodiments, test pattern 1007 shape is not limited to be entirely identical to TFT, and the P silicon graphics of other similar breadth length ratios is all passable.
Please join shown in Fig. 5, for the test pattern structural representation that the embodiment of the present invention provides, including pixel cell (Plxel) 3001, supporter (Spacer) 3002, pixel confining layers (PDL) 3003, source-drain electrode (SD) 3004, grid (Gate) 3005, storage electric capacity (CST) 3006, PMOS3007 and interlayer dielectric layer (ILD) 3008.Described test pattern 1007 is positioned at same layer with PMOS3007.Test pattern 1007 is in screen body position, and the making of test pattern 1007 is identical with P silicon TFT, is namely make together, and is electrically connected to test pattern 1007 test point by through hole (not shown).So arranging, the impact of the raceway groove w/l of P silicon TFT can be shown in test pattern 1007 by process deviation equally.
The specific embodiment of the invention provides a kind of method that the P of making up silicon raceway groove process deviation in process of production causes AMOLED screen luminance deviation.
In the present embodiment, test pattern 1007 makes and makes entirely by reference to P silicon TFT, is electrically connected to test pattern 1007 test point by through hole, and test pattern 1007 amount of images is more than 1.
Figure is not limited only to identical with TFT, and the figure of difform width (w) and long (l) all can meet, and size grades is um.The impedance that each independent TFT channel figure is corresponding is a, and quantity is n, because parallel relationship, total impedance information can be understood as b, then b=a/n.
Computer 11 is communicated with signal processing module 12 by connecting line 13, carries out data exchange by the agreement such as serial ports, I2CU, and connected mode is that the mode such as Serial Port Line, USB line connects.
The gamma adjustment method that the present invention is concrete comprises the following steps:
Computer 11 sends instruction by agreement, after detection processing unit 1201 receives instruction, sends detection signal to signal transmitting unit 1202, and signal transmitting unit 1202 sends detection signal: fixing magnitude of voltage.
Signal transmitting unit 1202 and signal input port 1004 are corresponding, are sent to, by inputting connection cabling 1006 detection signal, the test pattern 1007 needing test.Test pattern 1007 is the test TEG figure of making, and described test pattern 1007 is started working by applying the signal of telecommunication.Test pattern 1007 operation principle is equal to the P silicon TFT within array base palte 1002.
Test pattern 1007 sends the current signal of correspondence through applying voltage, and output signal connects cabling 1008 to signal output port 1005 by described output, the corresponding signal receiving unit 1204 of signal output port 1005.
After signal receiving unit 1204 detects signal, signal is delivered to detection processing unit 1201, because test pattern 1007 is as P in process of production, silicon TFT makes together, so the impact of the raceway groove w/l of P silicon TFT can be shown in test pattern 1007 by process deviation equally, corresponding different deviations, different resistance values can be shown, because the detecting voltage signal being applied to test pattern 1007 by input connection cabling 1006 is identical, so when the resistance of test pattern 1007 is different, different current values can be produced and deliver to signal output port 1005 by exporting connection cabling 1008, detection processing unit 1201 is delivered to thus being received by signal receiving unit 1204.
Detection processing unit 1201 can be sent to computer 11 corresponding data by connecting line 13 after receiving corresponding signal, computer 11 is according to the result fed back, by Data Comparison and lookup, corresponding gamma curve data are sent to detection processing unit 1201 by connecting line 13.
Detection processing unit 1201 transmits data to data recording unit 1203 after receiving gamma curve data.
After data recording port 1009 receives the data that data recording unit 1203 sends, described data recording port 1009 is burnt in driving chip 1011 by the gamma data that data recording cabling 1010 is corresponding.
When the raceway groove w/l of P silicon TFT is produced to affect by process deviation, being embodied in test pattern 1007 different for resistance, by pressing, voltage signal can produce different electric currents.Process deviation can fluctuate within the specific limits, simultaneously different deviations can be that gamma point position adjusts by corresponding different data value, deviation is there is, by testing different current signals, it is possible in corresponding gamma curve direct burning to the depositor of driving chip 1011 when detecting.
The detection signal of one is generally fixing voltage, and voltage is at below 12V, and voltage signal is applied in test pattern 1007.
When w/l becomes big, test pattern 1007 overall impedance diminishes, and can produce bigger current signal, the luminance raising of corresponding screen body；When w/l diminishes, test pattern 1007 overall impedance becomes big, can produce less current signal, the luminance-reduction of corresponding screen body, be modified gamma value, adjust corresponding video data output, control gamma curve in satisfied scope.The present invention is used in AMOLED field, and detecting object is P silicon raceway groove, and the electrical characteristic final result corresponding with illuminating OLED is electric current.
Gamma curve corresponds to the brightness of different GTG, shows as picture display effect, and the different gamma curve of same picture can show different effects, gamma curve is usually set to 2.2, error is positive 0.2 and negative 0.2, by adjusting, curve ranges is controlled in specification.
Computer 11 of the present invention needs the software support of correspondence, and this software is individually exploitation, and containing certain memory module 111, memory module 111 is mainly used in the gamma curve data that the different detection signal of storage is corresponding.
The data arranged for early stage of memory module 111 storage of computer 11, the data value obtained for different process test bias is pre-stored in the inherent subsequent calls of memory module 111.In other embodiments, computer 11 can be cancelled, replaced by other memory module 111 storage devices, concrete, namely can preserve the data of correspondence equally by increasing memorizer at signal processing module 12, signal processing module 12 increases single-chip microcomputer as the equally possible satisfied process demand of processor.
Those skilled in the art are it should be appreciated that embodiments of the invention can be provided as method, system or computer program.Therefore, the present invention can adopt the form of complete hardware embodiment, complete software implementation or the embodiment in conjunction with software and hardware aspect.And, the present invention can adopt the form at one or more upper computer programs implemented of computer-usable storage medium (including but not limited to disk memory and optical memory etc.) wherein including computer usable program code.
It is to be understood that, although this specification is been described by according to embodiment, but not each embodiment only comprises an independent technical scheme, this narrating mode of description is only for clarity sake, description should be made as a whole by those skilled in the art, technical scheme in each embodiment through appropriately combined, can also form other embodiments that it will be appreciated by those skilled in the art that.
The a series of detailed description of those listed above is only for illustrating of the feasibility embodiment of the present invention; they also are not used to limit the scope of the invention, and all should be included within protection scope of the present invention without departing from the skill of the present invention equivalent implementations made of spirit or change.
Claims (10)
1. a gamma adjusting device, it is characterized in that: include test pattern (TEG), in order to store the memory module of gamma data, signal processing module and driving chip in advance, described signal processing module one end electrically connects described memory module, and the other end is electrically connected described test pattern and described driving chip；Detection signal is sent to described test pattern by described signal processing module, and the signal of telecommunication that described test pattern is returned processes, and then gamma data corresponding with result in memory module is burnt in driving chip.
2. gamma adjusting device according to claim 1, it is characterized in that: described gamma adjusting device also includes signal transmission module, described signal transmission module one end connects described signal processing module, and the other end is electrically connected described test pattern and described driving chip.
3. gamma adjusting device according to claim 1, it is characterized in that: described signal processing module includes detection processing unit and the signal transmitting unit, signal receiving unit and the data recording unit that electrically connect respectively with described detection processing unit, described signal transmitting unit and signal receiving unit electrically connect described test pattern respectively through described signal transmission unit, and described data recording unit electrically connects described driving chip by described signal transmission unit.
4. gamma adjusting device according to claim 3, it is characterised in that: described gamma adjusting device also includes a computer, and described memory module is arranged in described computer, and described computer electrically connects described detection processing unit.
5. gamma adjusting device according to claim 1, it is characterised in that: being applied to the voltage signal in described test pattern is fixed voltage, and voltage is at below 12V.
6. gamma adjusting device according to claim 1, it is characterised in that: described test pattern quantity is more than 1.
7. a kind of gamma adjustment method according to any one of claim 1-6, it is characterised in that: described method includes:
Step one: described signal processing module sends detection signal to described test pattern；
Step 2: the signal of telecommunication that described test pattern is returned by described signal processing module processes；
Step 3: gamma data corresponding with result in memory module is burnt in driving chip by described signal processing module.
8. a kind of gamma adjustment method according to claim 7, it is characterized in that: step one detailed process is that described detection processing unit controls described signal transmitting unit transmission detection signal, and described detection signal is transferred to described test pattern by signal transmission module.
9. a kind of gamma adjustment method according to claim 7, it is characterized in that: step 2 is specially described test pattern and sends the corresponding signal of telecommunication by described signal transmission module to described signal receiving unit, described signal receiving unit receives the signal of telecommunication that described test pattern returns and is transferred to described detection processing unit and processes, namely compare and lookup with the data in memory module, obtain the gamma data of correspondence.
10. a kind of gamma adjustment method according to claim 7, it is characterised in that: step 3 is specially the described detection processing unit described data recording unit of control and corresponding gamma data is burnt in driving chip.
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Application publication date: 20160720 |