CN105758841B - A kind of laser induced breakdown spectroscopy analyzer - Google Patents

A kind of laser induced breakdown spectroscopy analyzer Download PDF

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Publication number
CN105758841B
CN105758841B CN201610217164.9A CN201610217164A CN105758841B CN 105758841 B CN105758841 B CN 105758841B CN 201610217164 A CN201610217164 A CN 201610217164A CN 105758841 B CN105758841 B CN 105758841B
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light
face
filter element
laser induced
breakdown spectroscopy
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CN105758841A (en
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田玉明
马骏骁
杨光
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Suzhou Qixiang Instrument Technology Co Ltd
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Suzhou Qixiang Instrument Technology Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718Laser microanalysis, i.e. with formation of sample plasma
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation

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  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
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  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

The present invention relates to a kind of laser induced breakdown spectroscopy analyzers, can be carried out at the same time the detection and analysis of the characteristic spectral line of at least one ingredient, including a filtering system, be detached to the light of multi-wavelength complex spectrum, filtering system includes:First lens group, diffraction grating and filter element, filter element is that there are five with the prism of upper surface for tool, there is the surface of reflection function including at least the plane of incidence, the first exit facet, the second exit facet and two, after the filtered element of light of required wavelength in incident ray, it is received by the light separate terminal adjacent with the first exit facet, the light of commplementary wave length is emitted from the surface different from the first exit facet from filter element, is not entered corresponding light separate terminal and is formed interference.

Description

A kind of laser induced breakdown spectroscopy analyzer
Technical field
The invention belongs to spectral measurement and technical field of imaging, are related to a kind of laser induced breakdown spectroscopy analyzer, especially It is that multispectral separation and high-resolution imaging are realized based on optical element combination.
Background technology
Laser induced breakdown spectroscopy analyzer needs the complex spectrum generated to laser induced plasma to be divided, inspection The peak intensity for surveying different-waveband carries out qualitative elementary and quantitative analysis, and light-splitting method mostly uses greatly grating and adds in spectrum detection process entirely CCD modes carry out light splitting detection to all band spectrum, however under certain specific applications, without detecting all band spectral intensity, It only needs to detect that the spectral intensity of certain several specific wavelength, mostly uses filtering mode greatly in this case and remove invalid spectrum, However traditional filtering system is filtered beam splitting using filter mirror and speculum, effect is bad, leads to laser induced plasma The light band of light separation that body generates is unclear, is impacted to result of detection.Meanwhile the wave band to have ensured divides in the prior art It from effect, needs to use a large amount of optical element, cost is caused to improve, multiple optical elements also propose assembly higher It is required that.It should be noted that the interference light in separation process can also have an impact test result, do not have in previous technology It proposes light to be filtered out being guided out acquisition light path, thoroughly removes the solution of interference light.
Laser induced breakdown spectroscopy analyzer proposed by the present invention can overcome the above problem in the prior art.
Invention content
The laser induced breakdown spectroscopy analyzer of the present invention, can be carried out at the same time the inspection of the characteristic spectral line of at least one ingredient It surveys and analyzes, including:Laser source system sends out high energy pulse laser and passes through lens focus to sample surfaces;Sample stage, Sample to be tested is carried, ablated sample forms laser induced plasma, emits the light of multi-wavelength complex spectrum around; Ray-collecting terminal, the light of the multi-wavelength complex spectrum for collecting the transmitting, and it is all guided to filtering system; Light separate terminal for acquiring the light through the filtered required wavelength of the filtering system, and directs it to photoelectricity inspection Survey device;It is characterized in that:The filtering system detaches the light of the multi-wavelength complex spectrum of the transmitting, filtering system System includes:First lens group, diffraction grating and filter element, filter element are tool there are five with the prism of upper surface, at least There is the surface of reflection function, the required wave in incident ray including the plane of incidence, the first exit facet, the second exit facet and two After the filtered element of long light, received by the light separate terminal adjacent with the first exit facet, the light of commplementary wave length It is emitted from the surface different from the first exit facet from filter element, does not enter corresponding light separate terminal and form interference.
Preferably, the first lens group has negative diopter, includes at least the first lens with positive diopter and with bearing Second lens of diopter.
Preferably, further include the second lens group, between diffraction grating and filter element, and with positive diopter and non- Spherical face, the second lens group include at least a compound lens.
Preferably, filter element includes at least following surface:First face is the plane of incidence, and the second face is with controllable controlling angle Battle array mirror, third face are the second exit facet, and fourth face is covered with mirror surface, and the 5th face is the first exit facet.
Preferably, the first face is attached with optical filter or is coated with filter coating.
Preferably, after incident ray enters filter element, the mirror surface through fourth face reflexes to the second face, and battle array mirror is controlled System receives light at a certain angle, and the light of required wavelength is reflected the 5th face, the light of required wavelength by with the 5th face Adjacent light separate terminal is received.
Preferably, after incident ray enters filter element, the mirror surface through fourth face reflexes to the second face, adjustment second The angle of the battle array mirror in face, from the part of third face or fourth face not covered with mirror surface after making the light beam of its commplementary wave length be reflected The light beam for projecting filter element or its commplementary wave length directly projects filter element from the second face.
Preferably, light separate terminal is multiple, the corresponding light for collecting different wave length.
Preferably, the first lens object side in first lens group is to the last one lens in the first lens group The distance D1 of image side surface is 0.15 with filtering system total length L ratio<D1/L<0.3.
Preferably, the ratio of the focal length ︱ F2 ︱ of the focal length ︱ F1 ︱ and compound lens of first lens group meets:0.65<︱ F1 ︱/︱ F2 ︱<0.72.
Beneficial effects of the present invention:Laser induced breakdown spectroscopy analyzer proposed by the present invention can overcome in the prior art Filter effect is bad, wave band detaches unclear technical problem, while wavelength to be filtered out being enable to be projected from multiple faces, and control is more It is flexibly simple.
Description of the drawings
Fig. 1 is laser induced breakdown spectroscopy analyzer overall construction drawing.
Fig. 2 is the filtering system composition figure of laser induced breakdown spectroscopy analyzer.
Specific implementation mode
Fig. 1 is laser induced breakdown spectroscopy analyzer overall construction drawing.High energy pulse laser passes through lens focus to sample Product surface carries out calcination to sample, and ablated sample forms laser induced plasma, emits multi-wavelength complex light around Spectrum.The light of transmitting is collected by the ray-collecting terminal of light detectors, is directed to filtering system, to further acquire The light of required wavelength carries out subsequent analysis.Fig. 2 is the filtering system of laser induced breakdown spectroscopy analyzer, including:Have First lens group 1 of negative diopter, the first lens group 1 include at least the first lens L11 with positive diopter and are bent with negative Second lens L12 of luminosity;The multi-wavelength complex spectrum light that ray-collecting terminal is collected forms entirety by the first lens group 1 Beam shaping, wherein light beam is integrally collapsed with the first lens L11 of positive diopter, then via with negative diopter Second lens L12 shapings are spread.Light reaches diffraction grating 2, light of the diffraction grating 2 to different wave length through the second lens L12 With different angle of diffraction, therefore the light of different wave length is dispersed.It the defects of aberration will be brought due to diffraction phenomena, makes At focusing and the problems such as light spot shape defect, the second of chromatic aberration defect is eliminated in the preferred design of diffraction grating rear thoroughly in the present invention Microscope group, the second lens group include at least a compound lens 3.Compound lens at least have one side be it is aspherical, thus can also be into One step corrects outskirt aberration well, compared with without aspherical situation, even if light can if very big by lens bending Aberration is distorted in enough good amendments, so as to realize the simplification of system using less optical lens, to LIBS filtering systems Further realize optimization.The angle that compound lens 3 disperses the light of different wave length is all guided to the filter element at rear 4.Compound lens 3 preferably combines the compound lens with positive light coke formed with a convex lens by a concavees lens.Filter element 4 be to have there are five with the prism of upper surface, is had including at least the plane of incidence, the first exit facet, the second exit facet and two The surface of reflection function, after the filtered element of light of the required wavelength in incident ray, by adjacent with the first exit facet Light separate terminal is received, and the light of commplementary wave length is emitted from the surface different from the first exit facet from filter element, not into Enter corresponding light separate terminal and forms interference.Filter element includes at least following surface:First face 41 is the plane of incidence, the second face 42 have the battle array mirror 6 of controllable controlling angle, and third face 43 is the second exit facet, and fourth face 44 is partially covered with mirror surface 7, and the 5th Face 45 is the first exit facet.The light projected from compound lens 3 is incident to filter element 4 with phase co-wavelength to be a branch of.Incident light After line enters filter element 4, the mirror surface 7 through fourth face 44 reflexes to the second face 42, and the battle array mirror 6 in the second face 42 is controlled to Certain angle receives light, and the light of required wavelength is reflected the first exit facet 41, and the light of required wavelength is by with first The adjacent light separate terminal of exit facet 41 is received, and is guide further to photoelectric detector.Farthest to avoid filtering The light beam of wavelength such as λ 2, λ 3 to be filtered out are reflected into the light separate terminal of required wavelength in optical element 4, can adjust battle array mirror 6 Angle, after so that the light beam of its commplementary wave length is reflected from the second exit facet 43 or fourth face 44 part not covered with mirror surface The light beam for projecting filter element or its commplementary wave length directly projects filter element from the second face 42.To which interference light is by maximum journey The guiding of degree is gone out.It is preferably formed as an at least light separate terminal, the corresponding light for collecting different wave length, on the plane of incidence preferably It is attached with optical filter 5 or is coated with filter coating, to filter out unwanted interference light.
Wherein, in first lens group 1 first lens L11 objects side to the image side surface of the second lens L12 distance D1, It is preferably 0.15 with filtering system total length L ratio<D1/L<0.3, filtering system can be made excessive if it is less than the lower limit, if More than the upper limit value, the incident angle that light is incident on the filter element plane of incidence can be caused too small, influence modulation range.Meanwhile The ratio of the focal length ︱ F1 ︱ of first lens group 1 and the focal length ︱ F2 ︱ of compound lens 3 meet:0.65<︱ F1 ︱/︱ F2 ︱< 0.72, it can get more good incident distribution in the range.
The foregoing is merely present pre-ferred embodiments, are not intended to limit the practical range of the present invention, all according to this hair The same variation and modification that bright the scope of the claims is made, fall within the range that patent of the present invention covers.

Claims (9)

1. a kind of laser induced breakdown spectroscopy analyzer can be carried out at the same time the detection of the characteristic spectral line of at least one ingredient and divide Analysis, including:Laser source system sends out high energy pulse laser and passes through lens focus to sample surfaces;Sample stage, carrying wait for Sample, ablated sample form laser induced plasma, emit the light of multi-wavelength complex spectrum around;Light is received Collect terminal, the light of the multi-wavelength complex spectrum for collecting the transmitting, and it is all guided to filtering system;Light point From terminal, for acquiring the light through the filtered required wavelength of the filtering system, and photoelectric detector is directed it to;Its It is characterized in that:The filtering system detaches the light of the multi-wavelength complex spectrum of the transmitting, and filtering system includes: First lens group, diffraction grating and filter element, it is that there are five with upper table for tool that the first lens group, which has negative diopter, filter element, The prism in face includes at least the plane of incidence, the first exit facet, the second exit facet and two surfaces with reflection function, enters After penetrating the filtered element of light of the required wavelength in light, connect by the light separate terminal adjacent with the first exit facet It receives, the light of commplementary wave length is emitted from the surface different from the first exit facet from filter element, does not enter corresponding light separation Terminal forms interference.
2. laser induced breakdown spectroscopy analyzer according to claim 1 further includes the second lens group, it is located at diffraction grating Between filter element, and there is positive diopter and non-spherical surface, the second lens group includes at least a compound lens.
3. laser induced breakdown spectroscopy analyzer according to claim 1, filter element includes at least following surface:First Face is the plane of incidence, and the second face has the battle array mirror of controllable controlling angle, and third face is the second exit facet, and fourth face is covered with speculum Face, the 5th face are the first exit facet.
4. laser induced breakdown spectroscopy analyzer according to claim 3, the plane of incidence is attached with optical filter or coated with filter Light film.
5. laser induced breakdown spectroscopy analyzer according to claim 3 or 4, incident ray enters filtering member through the first face After part, the mirror surface through fourth face reflexes to the second face, and the battle array mirror in the second face is controlled to certain angle and receives light, and will The light of required wavelength reflects the 5th face, and the light of required wavelength is received by the light separate terminal adjacent with the 5th face.
6. laser induced breakdown spectroscopy analyzer according to claim 5, after incident ray enters filter element, through the 4th The mirror surface in face reflexes to the second face, adjusts the angle of the battle array mirror in the second face, from the after making the light beam of its commplementary wave length be reflected The light beam of filter element or its commplementary wave length is projected directly from the second face in the part of three faces or fourth face not covered with mirror surface Project filter element.
7. laser induced breakdown spectroscopy analyzer according to claim 1, light separate terminal is multiple, corresponding collection institute The light of the different wave length needed.
8. laser induced breakdown spectroscopy analyzer according to claim 1, the first lens object in first lens group Side is 0.15 with filtering system total length L ratio to the distance D1 of the image side surface of the last one lens in the first lens group< D1/L<0.3。
9. laser induced breakdown spectroscopy analyzer according to claim 2, the focal length ︱ F1 ︱ of first lens group with it is multiple The ratio of the focal length ︱ F2 ︱ of lens is closed, is met:0.65<︱ F1 ︱/︱ F2 ︱<0.72.
CN201610217164.9A 2016-04-08 2016-04-08 A kind of laser induced breakdown spectroscopy analyzer Active CN105758841B (en)

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TWI765286B (en) * 2020-06-23 2022-05-21 長庚大學 Spectral analysis device

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202916196U (en) * 2012-11-27 2013-05-01 四川大学 Laser-induced breakdown spectrum analyzing device based on single light beam splitting
CN103308492A (en) * 2013-06-13 2013-09-18 吉林大学 Synchronous machine applied to laser-induced breakdown spectroscopy
EP2677301A1 (en) * 2011-02-18 2013-12-25 Tsinghua University Method and system for improving precision of element measurement based on laser-induced breakdown spectroscopy
CN103743718A (en) * 2013-12-11 2014-04-23 中国科学院西安光学精密机械研究所 Laser spectrum analyzer combining confocal micro-Raman spectrometer with laser-induced breakdown spectrometer
CN204214783U (en) * 2014-11-17 2015-03-18 浙江大学 One is adjustable heats double-pulse laser induced breakdown spectral device again
CN205656134U (en) * 2016-04-08 2016-10-19 苏州启翔仪器科技有限公司 Laser induction punctures spectral analysis appearance

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2677301A1 (en) * 2011-02-18 2013-12-25 Tsinghua University Method and system for improving precision of element measurement based on laser-induced breakdown spectroscopy
CN202916196U (en) * 2012-11-27 2013-05-01 四川大学 Laser-induced breakdown spectrum analyzing device based on single light beam splitting
CN103308492A (en) * 2013-06-13 2013-09-18 吉林大学 Synchronous machine applied to laser-induced breakdown spectroscopy
CN103743718A (en) * 2013-12-11 2014-04-23 中国科学院西安光学精密机械研究所 Laser spectrum analyzer combining confocal micro-Raman spectrometer with laser-induced breakdown spectrometer
CN204214783U (en) * 2014-11-17 2015-03-18 浙江大学 One is adjustable heats double-pulse laser induced breakdown spectral device again
CN205656134U (en) * 2016-04-08 2016-10-19 苏州启翔仪器科技有限公司 Laser induction punctures spectral analysis appearance

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