CN105738673A - Measuring range switching method and measuring range switching circuit - Google Patents

Measuring range switching method and measuring range switching circuit Download PDF

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Publication number
CN105738673A
CN105738673A CN201610079961.5A CN201610079961A CN105738673A CN 105738673 A CN105738673 A CN 105738673A CN 201610079961 A CN201610079961 A CN 201610079961A CN 105738673 A CN105738673 A CN 105738673A
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range
current value
circuit
test
target current
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CN201610079961.5A
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CN105738673B (en
Inventor
刘锐
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Beijing Jingwei Hirain Tech Co Ltd
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Beijing Jingwei Hirain Tech Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/08Circuits for altering the measuring range
    • G01R15/09Autoranging circuits

Abstract

The application provides a measuring range switching method and a measuring range switching circuit. The method is applied to the measuring range switching circuit, and comprises the steps of obtaining a target current value of a tested circuit; determining a section in a preset switching section set to which the target current value belongs; when the target current value belongs to a hysteresis section in the preset switching section set, controlling a large measuring range test loop and a small measuring range test loop to be conducted simultaneously; wherein the smallest current value of the hysteresis section is not greater than the smallest current value of a burr current in the tested circuit and interfering the measuring range switching circuit, and the largest current value of the hysteresis section is not less than the largest current value of the burr current in the tested circuit. According to the present invention, the problems that a target current is influenced by the burr current, and the measuring range switching circuit is switched repeatedly between the large measuring range test loop and the small measuring range test loop continuously, so that a current sensor in the small measuring range test loop is burnt out, and the service life of an electronic device in the measuring range switching circuit is reduced, are prevented.

Description

A kind of range changing method and range switch circuit
Technical field
The present invention relates to electric signal measurement circuit engineering field, be specifically related to a kind of range changing method and range switch circuit.
Background technology
Range switch circuit is in automatic range switching process, the single-chip microcomputer size according to measured current value, open-minded, turn off corresponding relay in range switch circuit, thus realizing selecting corresponding range test loop according to the size of tested current value, the interference of the unexpected burr electric current produced in measuring circuit can be subject in the course of the work due to described single-chip microcomputer, cause single-chip microcomputer that the generation of the real current value of tested electric current is judged by accident, thus causing the maloperation of relay circuit, described tested electric current is measured by the range test loop selecting mistake, tested electric current can be caused not measure in suitable range test loop, can not get authentic testing result, damage the current sensor in small-range test loop.It addition, by the interference of described burr electric current, now described large and small range test loop can frequently be switched over by described single-chip microcomputer, badly influences the service life of the circuit components such as relay.
Summary of the invention
In view of this, the embodiment of the present invention provides a kind of range changing method and range switch circuit, repeatedly being switched between described wide range test loop and small-range test loop by burr current interference solving range switch circuit of the prior art, the current sensor in the small-range test loop caused is burned out, the problem of electronic device service life reduction in range switch circuit.
For achieving the above object, the embodiment of the present invention provides following technical scheme:
A kind of range changing method, is applied in range switch circuit, and described range switch circuit includes wide range test loop and small-range test loop, including:
Obtain the target current value of circuit-under-test;
Judging the interval that the default impulsive belonging to described target current value is concentrated, described default impulsive collection at least includes back between dead zone;
When described target current value belongs between time dead zone that default impulsive is concentrated, control described wide range test loop and small-range test loop simultaneously turns on;
Wherein, the minimum current value of the burr electric current that the minimum current value between described time dead zone is not more than in described circuit-under-test, described range switch circuit is interfered, the maximum current value of the burr electric current that the maximum current value between described time dead zone is not less than in described circuit-under-test.
Preferably, in above-mentioned range changing method, after the target current value of described acquisition circuit-under-test, it is judged that include before the interval belonging to described target current value:
The jacking condition of described target current value is judged according to described target current value;
Obtain the impulsive collection corresponding with the jacking condition of described target current value as default impulsive collection.
Preferably, in above-mentioned range changing method, also include:
When described target current value belongs to the large range measuring interval that described default impulsive is concentrated, control the conducting of described wide range test loop;
When described target current value belongs to the small-range surveying range that described default impulsive is concentrated, control the conducting of described small-range test loop;
Wherein, described default impulsive is concentrated and is also included large range measuring interval and small-range surveying range, between described time dead zone, large range measuring is interval and small-range surveying range forms a continuous print surveying range, and any one value in described continuous surveying range can be only positioned at described return between dead zone, large range measuring is interval and in an interval in small-range surveying range.
Preferably, in above-mentioned range changing method, the target current value of described acquisition circuit-under-test, including:
Obtain the current sensor in described wide range test loop and obtain the target current value of circuit-under-test.
A kind of range switch circuit, including:
For testing wide range test loop and the small-range test loop of the target current value of circuit-under-test;
Controller, for obtaining the target current value of circuit-under-test, judge the interval that the default impulsive belonging to described target current value is concentrated, described default impulsive collection at least includes back between dead zone, when described target current value belongs between time dead zone that default impulsive is concentrated, control described wide range test loop and small-range test loop simultaneously turns on;
Wherein, the minimum current value of the burr electric current that the minimum current value between described time dead zone is not more than in described circuit-under-test, described range switch circuit is interfered, the maximum current value of the burr electric current that the maximum current value between described time dead zone is not less than in described circuit-under-test.
Preferably, in above-mentioned range switch circuit, described controller, including:
Current sample module, for obtaining the target current value of circuit-under-test;
Jacking condition judge module, for judging the jacking condition of described target current value according to described target current value;
Impulsive chooses module, and the impulsive collection being used for selecting the judged result of the jacking condition judge module with described target current value to match is as default impulsive collection;
Interval judgement module, the interval that the default impulsive for judging belonging to described target current value is concentrated;
First control signal output module, for when described target current value belongs between time dead zone that default impulsive is concentrated, output is for controlling described wide range test loop and the control signal of small-range test loop conducting.
Preferably, in above-mentioned range switch circuit, described default impulsive is concentrated and is also included large range measuring interval and small-range surveying range, described controller, also includes:
Second control signal output module, for when described target current value belongs to the large range measuring interval that described default impulsive is concentrated, control the conducting of described wide range test loop, when described target current value belongs to the small-range surveying range that described default impulsive is concentrated, control the conducting of described small-range test loop;
Wherein, between described time dead zone, large range measuring is interval and small-range surveying range forms a continuous print surveying range, and any one value in described continuous surveying range can be only positioned at described return between dead zone, large range measuring is interval and in an interval in small-range surveying range.
Preferably, in above-mentioned range switch circuit, described wide range test loop, including:
For testing the first current sensor of the target current value of described circuit-under-test;
For controlling the first switching device of the conducting state of described wide range test loop;
Described small-range test loop, including:
For testing the second current sensor of the target current value of described circuit-under-test;
For controlling the second switch device of the conducting state of described small-range test loop.
Preferably, in above-mentioned range switch circuit, first end of described first current sensor is connected with described circuit-under-test, second end is connected with the first end of described first switch controller, second end of described first switch controller is connected with the power cathode of described circuit-under-test, when described first switch controller conducting, between described circuit-under-test, the first current sensor and the first switch controller, form path;
First end of described second switch controller is connected with the second end of described first current sensor, second end of described second switch controller is connected with the first end of described second current sensor, second end of described second switch controller is connected with the power cathode of described circuit-under-test, when described second switch controller turns on, between described circuit-under-test, the first current sensor, second switch controller and the second current sensor, form path.
Preferably, in above-mentioned range switch circuit, the input of described controller is connected with the signal output part of described first current sensor, is used for controlling described first current sensor and obtains described target current value;
First outfan of described controller is connected with the control end of described first switch controller, for exporting the control signal of the duty controlling described first switch controller;
Second outfan of described controller is connected with the control end of described second switch controller, for exporting the control signal of the duty controlling described second switch controller.
Based on technique scheme, the said method of embodiment of the present invention offer and circuit are by returning between dead zone at described default impulsive concentrated setting, when target current value belongs to described returning between dead zone, control described wide range test loop and small-range test loop simultaneously turns on, now, described small-range test loop is tapped by described wide range test loop, therefore target current is prevented to be affected by burr electric current, described range switch circuit constantly repeatedly switches between described wide range test loop and small-range test loop, current sensor in the small-range test loop caused is burned out, the problem of the electronic device service life reduction in range switch circuit.
Accompanying drawing explanation
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, the accompanying drawing used required in embodiment or description of the prior art will be briefly described below, apparently, accompanying drawing in the following describes is only embodiments of the invention, for those of ordinary skill in the art, under the premise not paying creative work, it is also possible to obtain other accompanying drawing according to the accompanying drawing provided.
Fig. 1 is the schematic flow sheet of a kind of range changing method disclosed in the embodiment of the present application;
Fig. 2 is the schematic flow sheet of a kind of range changing method disclosed in another embodiment of the application;
Fig. 3 is the structural representation of a kind of range switch circuit disclosed in the embodiment of the present application;
Fig. 4 is the structural representation of range switch circuit middle controller disclosed in the embodiment of the present application;
Fig. 5 is the structural representation of a kind of range switch circuit disclosed in another embodiment of the application.
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is only a part of embodiment of the present invention, rather than whole embodiments.Based on the embodiment in the present invention, the every other embodiment that those of ordinary skill in the art obtain under not making creative work premise, broadly fall into the scope of protection of the invention.
It is directed to technical problem disclosed in the above embodiments of the present application, on basis based on stabilization technology, this application discloses a kind of range changing method and range switch circuit, so that when burr electric current occurs in circuit-under-test, described range switch circuit frequently will not switch between large and small range test loop, and then prevent the current sensor in small-range test loop to be burned out, extend the service life of circuit components in range switch circuit.
Disclosed in the embodiment of the present application, range changing method is applied in range switch circuit, and described range switch circuit includes wide range test loop and small-range test loop, and referring to Fig. 1, the method may include that
Step S101: obtain the target current value of circuit-under-test;
Wherein, described circuit-under-test is generally the circuit that curent change amplitude is bigger, namely it can be operated in the state of big electric current, the state of small area analysis can also be operated in, when it is operated in current state, in order to obtain the target current value flowed through in described circuit-under-test, need to adopt wide range test loop that described target current value is measured, when it is operated in small area analysis state, if adopting wide range test loop that described target current value measurement can be produced bigger measurement error, have a strong impact on certainty of measurement, therefore need to adopt small-range test loop that described target current value is measured, so that when the electric current that flows through described circuit-under-test is less, the precision of measurement result is higher;
Step S102: judging the interval that the default impulsive belonging to described target current value is concentrated, wherein, described default impulsive collection at least includes back between dead zone;
In order to prevent the mistake switching between described wide range test loop and the small-range test loop that the burr electric current in described circuit-under-test causes, the fluctuation range of described target current value has been carried out interval division by the application, size according to described target current value, it is divided into different intervals, these intervals are included in described default impulsive and concentrate, when described target current belong to different interval time, the conducting state of described wide range test loop and small-range test loop is different;
Step S103: when described target current value belongs between time dead zone that default impulsive is concentrated, control described wide range test loop and small-range test loop simultaneously turns on;
It is understandable that, described user can pass through to measure the fluctuation range of the burr electric current affecting range switch circuit work obtaining described circuit-under-test, can arrange according to the fluctuation range of described burr electric current and reasonably be returned between dead zone, wherein, the minimum current value of the burr electric current that the minimum current value between described time dead zone is not more than in described circuit-under-test, described range switch circuit is interfered, the maximum current value of the burr electric current that the maximum current value between described time dead zone is not less than in described circuit-under-test.
Visible by method disclosed in the above embodiments of the present application, said method is by returning between dead zone at described default impulsive concentrated setting, when described circuit-under-test occurs burr electric current, now described burr electric current is as described target current, target current value is fluctuation in described time dead zone, now control described wide range test loop and small-range test loop simultaneously turns on, now, described small-range test loop is tapped by described wide range test loop, therefore target current is prevented to be affected by burr electric current, described range switch circuit constantly repeatedly switches between described wide range test loop and small-range test loop, current sensor in the small-range test loop caused is burned out, the problem of the electronic device service life reduction in range switch circuit.
nullTime understandable,When the electric current in described circuit-under-test is electric current (electric current of similar steamed bread ripple) being continually changing,It is different that it affects the fluctuation range of the burr electric current that journey switching circuit the works fluctuation range when rising or falling,For the quiescent current variation in vehicle electrical signal testing,Described quiescent current fluctuation range of its burr electric current affecting journey switching circuit work when rising is generally 5-10A,Described quiescent current fluctuation range of its burr electric current affecting journey switching circuit work when declining is generally 4-8A,Therefore,When being directed to this situation,When can rise for described target current, a switching Interval Set is set,It is directed to when described target current declines and one switching Interval Set is set,Can pass through to judge the current jacking condition of described target current,Select suitable impulsive as described default impulsive with the jacking condition of current goal electric current,Namely referring to Fig. 2,Technical scheme disclosed in the above embodiments of the present application is after described step S101,Before step S102,Can also include:
Step S101a: judge the jacking condition of described target current value according to described target current value;
Such as, when judging the jacking condition of described target current, can by the mode that the target current value of current goal current value Yu a upper moment carries out contrasting being judged the jacking condition of presently described target current value, of course for preventing from being subject to burr current interference, can adopting the average current in current slot, the mode carrying out contrasting with the average current in the upper time period judges the current jacking condition of described target current value;
Step S101b: obtain the impulsive collection corresponding with the jacking condition of described target current value as default impulsive collection.
It is understandable that, described default impulsive disclosed in the above embodiments of the present application is concentrated except between described time dead zone, also there is large range measuring interval and small-range surveying range, between described time dead zone, large range measuring is interval and small-range surveying range forms a continuous print surveying range, and any one value in described continuous surveying range can be only positioned at described return between dead zone, large range measuring is interval and in an interval in small-range surveying range.
When in said method, judge when described target current value belongs to the large range measuring interval that described default impulsive is concentrated, now need to adopt wide range test loop that the target current value of described circuit-under-test is measured, therefore control the conducting of described wide range test loop;When presetting the small-range surveying range that impulsive is concentrated described in described target current value, now need to adopt small-range test loop that the target current value of described circuit-under-test is measured, therefore control the conducting of described small-range test loop.
It is understandable that, when above-mentioned steps obtains the target current value of circuit-under-test, in order to reduce the production cost of circuit, can directly adopt the current sensor in described wide range test loop as the sampler of target current value, that is, above-mentioned steps S101 is particularly as follows: the current sensor controlled in described wide range test loop obtains the target current value of circuit-under-test.
It is understood that be directed to said method, disclosed herein as well is a kind of range switch circuit, referring to Fig. 3, this circuit includes:
For testing wide range test loop 100 and the small-range test loop 200 of the target current value of circuit-under-test;
The controller 300 being connected with described wide range test loop 100 and small-range test loop 200, described controller 300 is for obtaining the target current value of circuit-under-test, judge the interval that the default impulsive belonging to described target current value is concentrated, described default impulsive collection at least includes back between dead zone, when described target current value belongs between time dead zone that default impulsive is concentrated, control described wide range test loop and small-range test loop simultaneously turns on;
Wherein, the minimum current value of the burr electric current that the minimum current value between described time dead zone is not more than in described circuit-under-test, described range switch circuit is interfered, the maximum current value of the burr electric current that the maximum current value between described time dead zone is not less than in described circuit-under-test.
Wherein, described controller 300 can be the single-chip microcomputer with above-mentioned functions.
Concrete, referring to Fig. 4, disclosed in the above embodiments of the present application, described controller 300 specifically may include that
Current sample module 310, for obtaining the target current value of circuit-under-test, wherein, described circuit-under-test can be the interlock circuit in Full Vehicle System;
The jacking condition judge module 320 being connected with described current sample module 310, for judging the jacking condition of described target current value according to described target current value, when described target current value is propradation, choose module 330 to described impulsive and export the first selection signal, when described target current value is lower falling-rising state, choose module output the second selection signal to described impulsive;
The impulsive being connected with described jacking condition judge module 320 chooses module 330, for selecting impulsive collection that the judged result of the jacking condition judge module with described target current value matches as default impulsive collection, concrete, after selecting signal when get the output of described jacking condition judge module 320 first, select the first impulsive collection as described default impulsive collection, after selecting signal when get the output of described jacking condition judge module 320 second, select the second impulsive collection as described default impulsive collection;
The memory element 340 that module 330 is connected is chosen, for being stored in the first impulsive collection corresponding when being in propradation with described target current value and the second impulsive collection corresponding when described target current value is in decline state with described impulsive;
The interval judgement module 350 that module 330 is connected is chosen, the interval that the default impulsive for judging belonging to described target current value is concentrated with described impulsive;
The the first control signal output module 360 being connected with described interval judgement module 350, for when described target current value belongs between time dead zone that default impulsive is concentrated, output is for controlling described wide range test loop and the control signal of small-range test loop conducting.
Time understandable, corresponding with said method, described default impulsive is concentrated and is also included large range measuring interval and small-range surveying range, described controller 300, it is also possible to including:
Second control signal output module, for when described target current value belongs to the large range measuring interval that described default impulsive is concentrated, output is for controlling the control signal of described wide range test loop conducting, when described target current value belongs to the small-range surveying range that described default impulsive is concentrated, output is for controlling the control signal of described small-range test loop conducting;
Wherein, between described time dead zone, large range measuring is interval and small-range surveying range forms a continuous print surveying range, and any one value in described continuous surveying range can be only positioned at described return between dead zone, large range measuring is interval and in an interval in small-range surveying range.
When described target device is vehicle circuitry, described target current is vehicle-mounted quiescent current signal, according to vehicle electrical performance quiescent current test event feature, the span of the small-range surveying range that described first impulsive is concentrated can be: I<5A, described I is target current value, span between described time dead zone can be: 5A≤I≤10A, the span in described large range measuring interval can be: I>10A, the span of the small-range measurement zone that described second impulsive is concentrated can be: I<4A, described I is target current value, span between described time dead zone can be: 4A≤I≤8A, the span in described large range measuring interval can be: I>8A.If described target current is in ascent stage, when I is<during 5A, described small-range test loop turns on, as 5A≤I≤10A, the conducting of described wide range test loop and small-range test loop simultaneously turn on, when: during I>10A, described wide range test loop turns on, if described target current is in the decline stage: when: during I>8A, described wide range test loop turns on, and as 4A≤I≤8A, the conducting of described wide range test loop and small-range test loop simultaneously turn on, as I,<during 4A, described small-range test loop turns on.
Referring to Fig. 5, described wide range test loop 100, including:
For testing the first current sensor 120 of the target current value of described circuit-under-test;
For controlling the first switching device 110 of the conducting state of described wide range test loop 100, when described first switching device 110 turns on, described wide range test loop 100 is in channel status;
Described small-range test loop 200, including:
For testing the second current sensor 220 of the target current value of described circuit-under-test;
For controlling the second switch device 210 of the conducting state of described small-range test loop 200, when described second switch device 210 turns on, described small-range test loop 200 is in channel status.
Wherein, the type of described first switching device 110 and second switch device 210 can be chosen voluntarily according to user's request, it is preferred that, it is contemplated that the value of the electric current of required measurement is bigger, therefore, above-mentioned first switching device 110 and second switch device 210 can adopt relay.Referring to Fig. 5, when described controller 300 needs to control the conducting of described wide range test loop, output control signal, make the magnetic induction coil in the first switching device 110 charged, make to turn between the contact 1,3 of described first relay, the control mode of second switch device 210 is similar, does not too much illustrate at this.
Referring to Fig. 5, in range switch circuit disclosed in the above embodiments of the present application, the concrete structure of described wide range test loop 100 can be:
First end of described first current sensor 120 is connected with described circuit-under-test, second end is connected with the first end of described first switch controller 110, described second end of the first switch controller 110 is connected with the power cathode of described circuit-under-test, so that described wide range test loop 100 forms loop, when described first switch controller 110 turns on, described circuit-under-test, formation path between the first current sensor 120 and the first switch controller 110;
The concrete structure of small-range test loop 200 can be: the first end of described second switch controller 210 is connected with the second end of described first current sensor 120, second end of described second switch controller 210 is connected with the first end of described second current sensor 220, described second end of the second current sensor 220 is connected with the power cathode of described circuit-under-test, when described second switch controller 210 turns on, described circuit-under-test, the second current sensor 220, formation path between second switch controller 210 and the second current sensor 220.
Corresponding with said method, described controller 300 can be collected by described first current sensor 120 for the target current value comparing judgement, namely, the input of described controller 300 is connected with the signal output part of described first current sensor 120, is used for controlling described first current sensor 120 and obtains described target current value;
First outfan of described controller 300 is connected with the control end of described first switch controller 110, for exporting the control signal of the duty controlling described first switch controller 110;
Second outfan of described controller 300 is connected with the control end of described second switch controller 210, for exporting the control signal of the duty controlling described second switch controller 210.
It is understandable that, in order to facilitate the wiring between described range switch circuit and described circuit-under-test, binding post can be adopted between the two to be connected, described node terminal includes input terminal and outlet terminal, described input terminal is arranged between described first current sensor 120 and described circuit-under-test, and described second binding post is arranged between the power cathode of described circuit-under-test and described wide range test loop and small-range test loop.
It is understandable that, when adopt small-range test loop 200 test circuit-under-test by electric current time, the precision of measurement result is required higher (when such as required precision is microampere order) by user, and therefore this just requires that described second current sensor 220 is required to be high accuracy, small-range current sensor also or current acquisition board.
In this specification, each embodiment adopts the mode gone forward one by one to describe, and what each embodiment stressed is the difference with other embodiments, between each embodiment identical similar portion mutually referring to.For device disclosed in embodiment, owing to it corresponds to the method disclosed in Example, so what describe is fairly simple, relevant part illustrates referring to method part.
Described above to the disclosed embodiments, makes professional and technical personnel in the field be capable of or uses the present invention.The multiple amendment of these embodiments be will be apparent from for those skilled in the art, and generic principles defined herein can without departing from the spirit or scope of the present invention, realize in other embodiments.Therefore, the present invention is not intended to be limited to the embodiments shown herein, and is to fit to the widest scope consistent with principles disclosed herein and features of novelty.

Claims (10)

1. a range changing method, is applied in range switch circuit, and described range switch circuit includes wide range test loop and the small-range test loop of the target current value of test circuit-under-test, it is characterised in that including:
Obtain the target current value of circuit-under-test;
Judging the interval that the default impulsive belonging to described target current value is concentrated, described default impulsive collection at least includes back between dead zone;
When described target current value belongs between time dead zone that default impulsive is concentrated, control described wide range test loop and small-range test loop simultaneously turns on;
Wherein, the minimum current value of the burr electric current that the minimum current value between described time dead zone is not more than in described circuit-under-test, described range switch circuit is interfered, the maximum current value of the burr electric current that the maximum current value between described time dead zone is not less than in described circuit-under-test.
2. range changing method according to claim 1, it is characterised in that after the target current value of described acquisition circuit-under-test, it is judged that include before the interval belonging to described target current value:
The jacking condition of described target current value is judged according to described target current value;
Obtain the impulsive collection corresponding with the jacking condition of described target current value as default impulsive collection.
3. range changing method according to claim 1, it is characterised in that also include:
When described target current value belongs to the large range measuring interval that described default impulsive is concentrated, control the conducting of described wide range test loop;
When described target current value belongs to the small-range surveying range that described default impulsive is concentrated, control the conducting of described small-range test loop;
Wherein, described default impulsive is concentrated and is also included large range measuring interval and small-range surveying range, between described time dead zone, large range measuring is interval and small-range surveying range forms a continuous print surveying range, and any one value in described continuous surveying range can be only positioned at described return between dead zone, large range measuring is interval and in an interval in small-range surveying range.
4. range changing method according to claim 1, it is characterised in that the target current value of described acquisition circuit-under-test, including:
Obtain the current sensor in described wide range test loop and obtain the target current value of circuit-under-test.
5. a range switch circuit, it is characterised in that including:
For testing wide range test loop and the small-range test loop of the target current value of circuit-under-test;
Controller, for obtaining the target current value of circuit-under-test, judge the interval that the default impulsive belonging to described target current value is concentrated, described default impulsive collection at least includes back between dead zone, when described target current value belongs between time dead zone that default impulsive is concentrated, control described wide range test loop and small-range test loop simultaneously turns on;
Wherein, the minimum current value of the burr electric current that the minimum current value between described time dead zone is not more than in described circuit-under-test, described range switch circuit is interfered, the maximum current value of the burr electric current that the maximum current value between described time dead zone is not less than in described circuit-under-test.
6. range switch circuit according to claim 5, it is characterised in that described controller, including:
Current sample module, for obtaining the target current value of circuit-under-test;
Jacking condition judge module, for judging the jacking condition of described target current value according to described target current value;
Impulsive chooses module, and the impulsive collection being used for selecting the judged result of the jacking condition judge module with described target current value to match is as default impulsive collection;
Interval judgement module, the interval that the default impulsive for judging belonging to described target current value is concentrated;
First control signal output module, for when described target current value belongs between time dead zone that default impulsive is concentrated, output is for controlling described wide range test loop and the control signal of small-range test loop conducting.
7. range switch circuit according to claim 6, it is characterised in that described default impulsive is concentrated and also included large range measuring interval and small-range surveying range, described controller, also includes:
Second control signal output module, for when described target current value belongs to the large range measuring interval that described default impulsive is concentrated, control the conducting of described wide range test loop, when described target current value belongs to the small-range surveying range that described default impulsive is concentrated, control the conducting of described small-range test loop;
Wherein, between described time dead zone, large range measuring is interval and small-range surveying range forms a continuous print surveying range, and any one value in described continuous surveying range can be only positioned at described return between dead zone, large range measuring is interval and in an interval in small-range surveying range.
8. range switch circuit according to claim 6, it is characterised in that described wide range test loop, including:
For testing the first current sensor of the current value of described circuit-under-test;
For controlling the first switching device of the conducting state of described wide range test loop;
Described small-range test loop, including:
For testing the second current sensor of the target current value of described circuit-under-test;
For controlling the second switch device of the conducting state of described small-range test loop.
9. range switch circuit according to claim 8, it is characterized in that, first end of described first current sensor is connected with described circuit-under-test, second end is connected with the first end of described first switch controller, second end of described first switch controller is connected with the power cathode of described circuit-under-test, when described first switch controller conducting, between described circuit-under-test, the first current sensor and the first switch controller, form path;
First end of described second switch controller is connected with the second end of described first current sensor, second end of described second switch controller is connected with the first end of described second current sensor, second end of described second switch controller is connected with the power cathode of described circuit-under-test, when described second switch controller turns on, between described circuit-under-test, the first current sensor, second switch controller and the second current sensor, form path.
10. range switch circuit according to claim 9, it is characterised in that the input of described controller is connected with the signal output part of described first current sensor, is used for controlling described first current sensor and obtains described target current value;
First outfan of described controller is connected with the control end of described first switch controller, for exporting the control signal of the duty controlling described first switch controller;
Second outfan of described controller is connected with the control end of described second switch controller, for exporting the control signal of the duty controlling described second switch controller.
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