CN105717438A - Current signal testing device and method - Google Patents

Current signal testing device and method Download PDF

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Publication number
CN105717438A
CN105717438A CN201610061027.0A CN201610061027A CN105717438A CN 105717438 A CN105717438 A CN 105717438A CN 201610061027 A CN201610061027 A CN 201610061027A CN 105717438 A CN105717438 A CN 105717438A
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CN
China
Prior art keywords
led
circuit board
test
test device
board under
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Pending
Application number
CN201610061027.0A
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Chinese (zh)
Inventor
马全江
路晓东
任加华
刘上
赵树磊
钱之政
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HUANHONG ELECTRONIC (KUNSHAN) Co Ltd
Original Assignee
HUANHONG ELECTRONIC (KUNSHAN) Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by HUANHONG ELECTRONIC (KUNSHAN) Co Ltd filed Critical HUANHONG ELECTRONIC (KUNSHAN) Co Ltd
Priority to CN201610061027.0A priority Critical patent/CN105717438A/en
Publication of CN105717438A publication Critical patent/CN105717438A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention provides a current signal testing device. The current signal testing device is used to test current states of multiple pins of a circuit board to be tested, and comprises a light bar array, a detection unit and a processing unit, wherein the light bar array comprises multiple LED light bars corresponding to the different pins of the circuit board to be tested; and the detection unit comprises multiple light detection circuits for detecting ON/OFF of the LED light bars, and transmits a detection result to the processing unit, so that the processing unit determines whether the circuit board to be tested passes test. Thus, whether the circuit board to be tested passes the test is detected and determined automatically, and possibility of manual mistakes is reduced.

Description

The test device of current signal and method of testing thereof
Technical field
The present invention relates to a kind of test device measuring output electric current, specifically refer to that a kind of mode by electro-optic conversion and optical detection circuit detects the test device of the current status of circuit board under test, it is possible to whether effective the and circuit board under test that correctly judges passes through to test.
Background technology
Display screen, such as back light use the liquid crystal display of LED light bar (LEDlightbar), and whether the LED of its LED light bar normal operation can have significant impact for the final display characteristic of liquid crystal display.Traditionally, production line generally uses the output electric current of the panel testing the LED light bar that optical wand (1ightbar) carrys out detection LCD monitor.LED on test optical wand is usually single-row arrangement, and by manually checking that the mode of the light on and off of LED judges that whether the output electric current of panel each foot position normal.But, different model typically requires from the detection of the panel of specification and uses different test optical wands, and not only test process is loaded down with trivial details, and automaticity is poor.Additionally, checked the light on and off of LED by manual type, also it is susceptible to wrongheaded situation.
Summary of the invention
In view of this, it is an object of the invention to, make improvements for traditional test optical wand, it is provided that the test device of a kind of current signal, it can detect the light on and off of LED automatically such that it is able to reduces the probability of artificial judgment mistake.
In order to reach above-mentioned purpose, the invention provides the test device of a kind of current signal for testing circuit board under test, this test device includes optical wand array, detection unit and processing unit.Wherein, optical wand array includes the first link and multiple multiple foot positions the second link one to one with circuit board under test, and, it is connected between the first link and each the second link and is joined, by multiple LED strip, the LED light bar formed.Detection unit includes multiple optical detection circuit, wherein, each optical detection circuit all has a photoconductive resistance, each photoconductive resistance is arranged with a LED one_to_one corresponding in multiple LED of multiple LED light bars respectively, further, each optical detection circuit can the light on and off of each LED corresponding to above-mentioned photoconductive resistance and produce multiple detection signal.Processing unit is electrically connected with this detection unit to receive this detection signal, and according to above-mentioned detection signal, processing unit judges that whether circuit board under test is by testing.
The present invention also provides for a kind of method of testing for testing circuit board under test, the step of this method of testing includes: optical wand array a) is correspondingly connected to the different foot positions of circuit board under test, wherein, optical wand array includes the first link and multiple multiple foot positions the second link one to one with circuit board under test, further, between the first link and each the second link, it is connected to the LED light bar formed by multiple LED strip connection;B) above-mentioned circuit board under test and optical wand array are energized;C) judging that whether first LED of each LED light bar be all luminous, if the determination result is YES, then circuit board under test is by testing, and otherwise circuit board under test is not over test.
Thus, the test device of the present invention automatically detects the light on and off of the LED of optical wand array by its internal detection unit, and the testing result of current status is sent to processing unit to carry out follow-up test action and warning action, whole judge process is artificial without relying on, and can reduce the probability of artificial judgment mistake.
An aspect wherein, optical wand array is optionally made to further include multiple jumper wire device, and the negative electrode of the LED that the two ends making each jumper wire device are respectively connecting in multiple LED of each second link and multiple LED light bar, so that operating personnel can adjust the quantity of the LED of required use according to the actual specification of circuit board under test and type.
In yet another aspect, optical detection circuit includes divider resistance, divider resistance and photoconductive resistance are connected in series, and divider resistance and photoconductive resistance are connected between power supply unit and earth terminal, make each optical detection circuit can produce detection signal accordingly according to the magnitude of voltage being connected in series end between divider resistance and photoconductive resistance, and this detection signal is sent to processing unit.
Accompanying drawing explanation
Fig. 1 is the functional block diagram of the test device of presently preferred embodiments of the present invention.
Fig. 2 is the schematic diagram of the main functional modules principle of the optical wand array of presently preferred embodiments of the present invention.
Fig. 3 is the equivalent circuit diagram of the optical detection circuit of presently preferred embodiments of the present invention.
Fig. 4 is the test flow chart of the test device of presently preferred embodiments of the present invention.
(symbol description)
1 test device
10 optical wand arrays
12 first links
14 second links
16LED Rhizoma Dioscoreae (peeled)
18 link positions
20 detection unit
21 optical detection circuits
211 photoconductive resistance
212 divider resistances
213 phase inverters
VCC1 voltage end
U0 is connected in series end
30 processing units
40 alarm unit
42 buzzers
44 first warning LED
46 second warning LED
50 power supply units
52 power supplys
54 first relays
56 second relays
70 circuit board under test
71 foot positions
80 external equipments
Detailed description of the invention
In order to become more apparent upon the feature place of the present invention, the invention provides a preferred embodiment and accompanying drawings is as follows.Please with reference first to Fig. 1, the test device 1 of the current signal of the present invention is for testing the current status of multiple foot positions 71 of circuit board under test 70.In the following description, the panel being a liquid crystal display for circuit board under test 70, the right present invention is not limited thereto.The main element of the test device 1 of the present invention includes optical wand array 10, detection unit 20 and processing unit 30, and details are as follows for the technology contents of the present invention and feature and effect thereof.
Please then refer to Fig. 2.Optical wand array 10 comprises eight row and is joined the LED light bar 16 formed by multiple LED strip, first link 12 is connected with the anode of first LED of above-mentioned LED light bar 16, eight the second links 14 lay respectively at the negative electrode of last LED of above-mentioned LED light bar 16, each second link 14 can be electrically connected in each foot position 71, the present embodiment of circuit board under test 70 respectively correspondingly for 2 to foot position, foot position 9, thus the electric current output state of each foot position 71 of detection circuit board under test 70 by such as flat cable.
In addition, the optical wand array 10 of the present embodiment is also optionally provided with multiple jumper wire device (not shown), the two ends of each jumper wire device are electrically connected with on the negative electrode of second LED to penultimate LED and the second link 14 of each LED light bar 16 above-mentioned (link position 18 of jumper wire device as shown in Figure 2), the LED quantity that each LED light bar 16 of thus controlling and adjust in optical wand array 10 is actually used, coordinates the testing requirement of different circuit board under test 70.
Please coordinate with reference to Fig. 1 and Fig. 3.Detection unit 20 includes multiple optical detection circuit 21, and the quantity of this optical detection circuit 21 is corresponding with the quantity of LED light bar 16.The equivalent circuit diagram of each optical detection circuit 21 is as shown in Figure 3, wherein, optical detection circuit 21 is including at least there being a photoconductive resistance 211, the position that arranges of photoconductive resistance 211 is accordingly near first LED of each LED light bar 16, for being correspondingly generated detection signal according to the light on and off of above-mentioned first LED.
Each optical detection circuit 21 of the present embodiment is to judge that LED is lit or in closed mode, right the present embodiment is not limited thereto by the size of the partial pressure value in such as bleeder circuit.Illustrating further, the optical detection circuit 21 of the present embodiment includes divider resistance 212, photoconductive resistance 211 and phase inverter 213 (hex inverter of 74LS05 open collector output).Divider resistance 212 and photoconductive resistance 211 are connected in series, and one end of divider resistance 212 is connected to voltage end VCC1, have and be connected in series end U0 between divider resistance 212 and photoconductive resistance 211, and, the other end of photoconductive resistance 211 is connected to earth terminal.The input of phase inverter 213 is connected to be connected in series end U0, and the outfan of phase inverter 213 is connected to the P3.5 end of microprocessor of processing unit 30 described later.
When the LED corresponding to above-mentioned photoconductive resistance 211 is in the state closed, the resistance value of photoconductive resistance 211 is about 2.3M (ohm), and when LED is lit, the resistance value of photoconductive resistance 211 then reduces to about 270 (ohms).Therefore, if the resistance value that the magnitude of voltage of voltage end VCC1 is 5 (volts) and divider resistance 212 is 47K (ohm), then when LED is in the state closed, the partial pressure value being connected in series end U0 is 4.9 (volts), when LED is lit, the partial pressure value being connected in series end U0 is 0.0286 (volt).Afterwards, when the input of phase inverter 213 is high voltage signal (such as 4.9 volts), correspondence is exported the detection signal of low-voltage to processing unit 30, otherwise, when the input of phase inverter 213 is low voltage signal (such as 0.0286 volt), by the detection signal of corresponding output HIGH voltage to processing unit 30, make processing unit 30 can pass through to detect unit 20 and automatically judge the light on and off of each LED light bar 16.
Processing unit 30 is microprocessor (specifications and models: AT89C2051), and it is in order to receive detection unit 20 produced detection signal, and according to above-mentioned detection signal so as to after the alarm unit 40 that illustrates be operated.
Additionally, processing unit 30 is also optionally electrically connected to optical wand array 10, thus detects and judge that whether optical wand array 10 is in "on" position.
The present embodiment is also optionally provided with alarm unit 40, for showing and remind the test result of circuit board under test 70 to operating personnel.The alarm unit 40 that the present embodiment uses includes buzzer 42, first and warns LED44 (to be successfully tested for display, LEDPASS) and second warning LED46 (be used for showing test crash, LEDFAIL), right the present embodiment is not limited thereto, and its usage quantity and kind are changed also dependent on actual state.
In addition, the present embodiment is also selectively provided with power supply unit 50 in the inside of test device, power supply unit 50 includes power supply 52, and for providing direct current power to each parts within test device 1, above-mentioned each parts include optical wand array 10, detection unit 20 and processing unit 30.
Power supply unit 50 has also been selectively included the first relay 54 and the second relay 56.The input of the first relay 54 is connected to power supply 52, and outfan is connected to voltage end VCC1, thus controls the "on" position of detection unit 20.The input of the second relay 56 is electrically connected to processing unit 30, and its outfan can be electrically connected to external equipment 80, for test result is such as sent to external equipment 80.
About the testing process of the present embodiment, please coordinate with reference to Fig. 4 and Fig. 1.Each step of the testing process of the present embodiment illustrates as follows.
Step S1: carry out installing and being connected with optical wand array 10 by circuit board under test 70, makes each second link 14 of optical wand array 10 be electrically connected to each output pin position 71 of circuit board under test 70.
Then perform step S2, circuit board under test 70 is energized, and then in step s3, processing unit 30 judges whether circuit board under test 70 is energized, if the determination result is YES, then enter step S4, if judged result is no, then return to step S2.
In step s 4, make the first relay 54 connect, so that detection unit 20 is energized, enter step S5 afterwards.In step s 5, detection unit 20 begins through optical wand array 10 and detects the current status of circuit board under test 70, and produce detection signal accordingly and detection signal is sent to processing unit 30, whether first LED that processing unit 30 judges in each LED light bar 16 of optical wand array 10 is all lit.If first LED of its corresponding LED light bar 16 is not lit to have any one photoconductive resistance 211 to detect, then it represents that circuit board under test 70, not over test, enters step S6 afterwards.Whereas if all photoconductive resistance 211 detects that first LED of its corresponding LED light bar 16 is lit, then it represents that circuit board under test 70, by testing, enters step S8 afterwards.
In step s 6, processing unit 30 makes the second warning LED46 light.Then in the step s 7, processing unit 30 makes buzzer 42 be operated, in order to notify that operating personnel's circuit board under test 70 is not over test, finally enters step S11, cuts off the electricity supply by sound and light signal, completes test.
On the other hand, in step s 8, processing unit 30 makes the first warning LED44 light.Subsequently enter step S9, make the second relay 56 connect, and in step slo, the signal being successfully tested is transmitted to external equipment 80 by processing unit 30.Finally likewise enter step S11, cut off the electricity supply, complete test.
The test device 1 that the present embodiment provides, the light on and off of the LED light bar 16 of optical wand array 10 are automatically detected by its internal detection unit 20, and testing result is sent to processing unit 30 to carry out follow-up test judgement and warning action, whole judge process is artificial without relying on, and therefore can reduce the probability of artificial judgment mistake.On the other hand, by the test device 1 of the present embodiment, it is possible to promote the automaticity of whole test process, the carrying out of whole test is made more efficiently.
Finally, it is necessary to again illustrate, the disclosed in the above-described embodiments composed component of the present invention by way of example only, is not used for limiting scope of the present application, the alternate variation of other equivalence elements such as, also should be included in the scope of patent protection of the application.

Claims (11)

1. a test device for current signal, it is for testing circuit board under test, and the test device of described current signal is characterised by, including:
Optical wand array, it includes multiple foot positions second link one to one of the first link and multiple and described circuit board under test, is connected to and is joined, by multiple LED strip, the LED light bar formed between described first link and each described second link;
Detection unit, it includes multiple optical detection circuit, each described optical detection circuit is respectively provided with a photoconductive resistance, each described photoconductive resistance is arranged with a LED one_to_one corresponding in multiple LED of LED light bar each described respectively, and each described optical detection circuit can the light on and off of described LED corresponding to described photoconductive resistance and produce multiple detection signal;And
Processing unit, it is electrically connected with described detection unit to receive described detection signal, and judges that whether described circuit board under test is by testing according to described detection signal.
2. test device as claimed in claim 1, it is characterised in that
Described optical wand array also includes multiple jumper wire device, and the two ends of each described jumper wire device are connected with the negative electrode of a LED in multiple LED of the second link each described and each described LED light bar respectively.
3. test device as claimed in claim 1, it is characterised in that
Each described optical detection circuit includes divider resistance respectively, described divider resistance and described photoconductive resistance are connected in series, described divider resistance and described photoconductive resistance are connected between voltage end and earth terminal, and each described optical detection circuit produces described detection signal according to the magnitude of voltage being connected in series end between described divider resistance and described photoconductive resistance.
4. test device as claimed in claim 3, it is characterised in that
Each described optical detection circuit also includes phase inverter, and the input of described phase inverter is connected with the described end that is connected in series, and outfan and described processing unit are electrically connected.
5. the test device as described in claim 3 or 4, it is characterised in that
Described test device also comprises power supply unit, and said supply unit includes the first relay, and, described divider resistance and described photoconductive resistance are connected between outfan and the described earth terminal of described first relay.
6. test device as claimed in claim 5, it is characterised in that
Said supply unit also includes the second relay, and the input of described second relay is electrically connected to described processing unit, and the outfan of described second relay is electrically connected to external equipment.
7. test device as claimed in claim 1, it is characterised in that
Described test device also comprises the alarm unit being electrically connected with described processing unit.
8. test device as claimed in claim 7, it is characterised in that
Described alarm unit includes the first warning LED and the second being respectively and electrically connected to described processing unit and warns LED.
9. test device as claimed in claim 7 or 8, it is characterised in that
Described alarm unit also includes the buzzer being electrically connected to described processing unit.
10. a method of testing for current signal, it is for testing circuit board under test, and the method for testing of described current signal is characterised by, comprises the following steps:
A) optical wand array is correspondingly connected to the different foot positions of described circuit board under test, wherein, described optical wand array includes multiple foot positions second link one to one of the first link and multiple and described circuit board under test, is connected to and is joined, by multiple LED strip, the LED light bar formed between described first link and each described second link;
B) described circuit board under test and described optical wand array are energized;
C) by being respectively provided with multiple optical detection circuits of a photoconductive resistance, judge that whether a LED corresponding with described photoconductive resistance in multiple LED of multiple described LED light bar is all luminous, if the determination result is YES, then described circuit board under test is by testing, otherwise described circuit board under test is not over test, wherein, each described photoconductive resistance is corresponding with a LED in multiple LED of multiple described LED light bars respectively and arrange.
11. method of testing as claimed in claim 10, it is characterised in that
In step c), if the determination result is YES, then light the first warning LED, otherwise light the second warning LED and make buzzer be operated.
CN201610061027.0A 2016-01-29 2016-01-29 Current signal testing device and method Pending CN105717438A (en)

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Publication number Priority date Publication date Assignee Title
CN107091981A (en) * 2017-06-15 2017-08-25 深圳市沃特沃德股份有限公司 Indicator lamp controls the test system of drive circuit
CN109857024A (en) * 2019-02-01 2019-06-07 京微齐力(北京)科技有限公司 The unit performance test method and System on Chip/SoC of artificial intelligence module
CN113391201A (en) * 2021-07-01 2021-09-14 丁克冰 Detection device and detection method for power transformation line breaker

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CN103280190A (en) * 2013-05-20 2013-09-04 深圳市华星光电技术有限公司 Backlight driving circuit, liquid crystal display device and backlight driving method
CN103672538A (en) * 2013-12-19 2014-03-26 深圳市华星光电技术有限公司 Backlight adjusting circuit and electronic device
CN203606463U (en) * 2013-11-19 2014-05-21 上海博泰悦臻电子设备制造有限公司 Automatic detection device for LED array

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Publication number Priority date Publication date Assignee Title
US20090033612A1 (en) * 2007-07-31 2009-02-05 Roberts John K Correction of temperature induced color drift in solid state lighting displays
CN202275586U (en) * 2011-09-22 2012-06-13 惠州学院 Light-emitting diode (LED) energy-saving display control device
CN103093714A (en) * 2011-11-01 2013-05-08 天津三星电子有限公司 Detecting device and detecting method of light emitting diode (LED) display screen driving board
CN103185869A (en) * 2011-12-30 2013-07-03 北京谊安医疗系统股份有限公司 Device and method of monitoring scrapping of light emitting diode (LED) light source on line
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107091981A (en) * 2017-06-15 2017-08-25 深圳市沃特沃德股份有限公司 Indicator lamp controls the test system of drive circuit
CN109857024A (en) * 2019-02-01 2019-06-07 京微齐力(北京)科技有限公司 The unit performance test method and System on Chip/SoC of artificial intelligence module
CN109857024B (en) * 2019-02-01 2021-11-12 京微齐力(北京)科技有限公司 Unit performance test method and system chip of artificial intelligence module
CN113391201A (en) * 2021-07-01 2021-09-14 丁克冰 Detection device and detection method for power transformation line breaker

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Application publication date: 20160629