CN105699752A - Sampling device - Google Patents
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- CN105699752A CN105699752A CN201610110877.5A CN201610110877A CN105699752A CN 105699752 A CN105699752 A CN 105699752A CN 201610110877 A CN201610110877 A CN 201610110877A CN 105699752 A CN105699752 A CN 105699752A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of dc power input into dc power output
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Abstract
The present invention provides a sampling device. The sampling device comprises: a sampling unit configured to collect current signals and/or voltage signals of a main circuit; a processor unit configured to receive the current signals and/or voltage signals collected by the sampling unit; a storage unit configured to receive sampling data and program data transmitted by the processor unit, and start and store operation data; a power supply unit configured to supply electric energy to the sampling unit, the processor unit and the storage unit; the power supply unit includes a main power circuit and a sampling reference circuit, and the main power circuit includes a low dropout regulator, a first processing circuit connected with the input end of the low dropout regulator and a second processing circuit connected with the output end of the low dropout regulator; and the sampling reference circuit includes a band-gap reference voltage source chip, a third processing circuit connected with the band-gap reference voltage source chip and a fourth processing circuit connected with the band-gap reference voltage source chip. The accuracy of the sampling device is guaranteed due to the high stability of the output voltage of a main power circuit and a sampling reference circuit.
Description
Technical field
The present invention relates to signal of telecommunication Sampling techniques field, be specifically related to a kind of sampling apparatus。
Background technology
Signal of telecommunication sampling is by all continuous print analog current signal or analog voltage signal in upper for the time, amplitude, in the effect of sampling pulse, converts the time upper discrete (having fixed interval on the time) to but still continuous print discrete analog signal in amplitude。
In computer control device, often to use electrical signal collection module, be used for being converted to analog electrical signal the digital signal that microprocessor is capable of identify that, control reaction accordingly to make according to the current/voltage situation in main circuit。Therefore, the degree of accuracy of sampled signal is most important, directly affects the judgement of microprocessor and follow-up action。Except the reliability of sample circuit itself, the power circuit powered to sample circuit and the reliability and stability of sampling reference circuit also can affect the degree of accuracy of sampled signal。
D.C. regulated power supply, owing to having efficiency height, volume feature little, lightweight, obtains in recent years and develops rapidly。Current signal of telecommunication sample circuit is also use D.C. regulated power supply as power supply and sampling reference circuit, but existing D.C. regulated power supply is difficult to ensure that the stability of output DC voltage。
Summary of the invention
Therefore, the technical problem to be solved in the present invention is in that the degree of accuracy of the power supply of existing sampling apparatus and the not high sampled signal causing being input in processor of stability of sampling reference circuit output voltage is difficult to ensure that。
For this, embodiments provide following technical scheme:
A kind of sampling apparatus, including:
Sampling unit, gathers current signal and/or the voltage signal of main circuit；
Processor unit, current signal and/or the voltage signal of reception sampling unit collection also process, and send the sampled data of correspondence, routine data and startup optimization data；
Memory element, receives the processor unit sampled data, routine data and the startup optimization data that send and stores；
Power subsystem, provides electric energy for sampling unit, processor unit and storage element；
Power subsystem includes main power circuit and sampling reference circuit, main power circuit includes the first process circuit that low dropout voltage regulator is connected and the second process circuit being connected with low dropout voltage regulator outfan with low dropout voltage regulator input, first processes circuit includes the first filter circuit, and second processes circuit includes the first mu balanced circuit；Sampling reference circuit includes the 3rd process circuit that bandgap voltage reference chip is connected and the fourth process circuit being connected with bandgap voltage reference chip output with bandgap voltage reference chip input, 3rd processes circuit includes the second filter circuit, and fourth process circuit includes the second mu balanced circuit。
Preferably, first filter circuit includes inductance B3, electric capacity C77 and C75, first end of inductance B3 connects external power supply, the second end is connected with the input of low dropout voltage regulator, first end of electric capacity C77 and first end of electric capacity C75 are connected with second end of inductance B3 respectively, second end of electric capacity C77 and the second end common ground of electric capacity C75。
Preferably, first mu balanced circuit includes diode D1 and electric capacity C78, C76, the negative electrode of diode D1 is connected with the outfan of low dropout voltage regulator, plus earth, first end of electric capacity C78, electric capacity C76 the first end be connected with the outfan of low dropout voltage regulator respectively, second end of electric capacity C78, electric capacity C76 the second end common ground, the junction of first end of electric capacity C78 and first end of electric capacity C76 is as the outfan of main power circuit。
Preferably, second filter circuit includes electric capacity C85, C86, first end of electric capacity C85, electric capacity C86 the first end be connected with the input of bandgap voltage reference chip respectively, second end of electric capacity C85, electric capacity C86 the second end common ground, the input of bandgap voltage reference chip connects the outfan of main power circuit。
Preferably, second mu balanced circuit includes diode D3 and electric capacity C88, C89, first end of electric capacity C88, electric capacity C89 the first end be connected with the outfan of bandgap voltage reference chip respectively, second end of electric capacity C88, electric capacity C89 the second end common ground, the negative electrode of diode D3 is connected with the outfan of bandgap voltage reference chip, the plus earth of diode D3。
Preferably, memory element includes ferroelectric memory, synchronous DRAM and erasable nonvolatile memory (NORFLASH), ferroelectric memory is for storing data when sampled data and power down, synchronous DRAM is used for storage system service data, and erasable nonvolatile memory (NORFLASH) is for storing startup data and the routine data of processor unit。
Preferably, sampling unit includes voltage sampling circuit and/or current sampling circuit, and voltage sampling circuit is for gathering the voltage signal of main circuit, and current sampling circuit is for gathering the current signal of main circuit。
Preferably, voltage sampling circuit includes voltage sample modulate circuit。
Preferably, current sampling circuit includes current sample modulate circuit。
Preferably, also including the automatic reset circuit with function for monitoring, automatic reset circuit is connected with processor unit。
Technical solution of the present invention, has the advantage that
A kind of sampling apparatus that the embodiment of the present invention provides, main power circuit adopts the low dropout voltage regulator TPS73250DBVR of 5V, it is possible to still stably exporting in OCL output capacitance-less situation, load transient response performance is good, and reverse leakage current is low, and noise is low。Solve owing to DC power supplier exists noise, indirectly cause the problem that output voltage is unstable。The input of low dropout voltage regulator is provided with the first filter circuit, for being filtered external input power processing to eliminate alternating component therein, improves the stability of input voltage。The outfan of low dropout voltage regulator is provided with the first mu balanced circuit, improves the stability of main power circuit output voltage further。Its sampling reference circuit adopts the superhigh precision bandgap voltage reference AD780BR of 2.5V, there is high accuracy, low noise, low initial error, low quiescent current, the advantages such as wide input, Low Drift Temperature and output voltage stabilization, solve and indirectly cause the problem of output voltage instability and owing to the temperature of electronic component floats the problem causing that greatly output voltage is unstable owing to DC power supplier exists noise。The input of bandgap voltage reference chip is provided with the second filter circuit, for being filtered external input power processing to eliminate the alternating component in input power, improve the stability of input voltage, solve the technical problem owing to input voltage instability causes sampling reference circuit output voltage unstable。The outfan of bandgap voltage reference chip is provided with the second mu balanced circuit, improves the stability of sampling reference circuit output voltage further。
Accompanying drawing explanation
In order to be illustrated more clearly that the specific embodiment of the invention or technical scheme of the prior art, the accompanying drawing used required in detailed description of the invention or description of the prior art will be briefly described below, apparently, accompanying drawing in the following describes is some embodiments of the present invention, for those of ordinary skill in the art, under the premise not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings。
Fig. 1 is the theory diagram of a kind of sampling apparatus in the embodiment of the present invention；
Fig. 2 is the main power circuit figure in Fig. 1；
Fig. 3 is the sampling reference circuit figure in Fig. 1；
Fig. 4 is the electrical block diagram of a kind of sampling apparatus (not including power subsystem) in the embodiment of the present invention。
Detailed description of the invention
Below in conjunction with accompanying drawing, technical scheme is clearly and completely described, it is clear that described embodiment is a part of embodiment of the present invention, rather than whole embodiments。Based on the embodiment in the present invention, the every other embodiment that those of ordinary skill in the art obtain under not making creative work premise, broadly fall into the scope of protection of the invention。
In describing the invention, it should be noted that, orientation or the position relationship of the instruction such as term " " center ", " on ", D score, "left", "right", " vertically ", " level ", " interior ", " outward " be based on orientation shown in the drawings or position relationship; be for only for ease of the description present invention and simplifying and describe; rather than instruction or imply indication device or element must have specific orientation, with specific azimuth configuration and operation, be therefore not considered as limiting the invention。Additionally, term " first ", " second ", " the 3rd " are only for descriptive purposes, and it is not intended that indicate or hint relative importance。
In describing the invention, it is necessary to explanation, unless otherwise clearly defined and limited, term " installation ", " being connected ", " connection " should be interpreted broadly, for instance, it is possible to it is fixing connection, it is also possible to be removably connect, or connect integratedly；Can be mechanically connected, it is also possible to be electrical connection；Can be joined directly together, it is also possible to be indirectly connected to by intermediary, it is also possible to be the connection of two element internals, it is possible to be wireless connections, it is also possible to be wired connection。For the ordinary skill in the art, it is possible to concrete condition understands above-mentioned term concrete meaning in the present invention。
As long as just can be combined with each other additionally, technical characteristic involved in invention described below difference embodiment does not constitute conflict each other。
Embodiment 1
As it is shown in figure 1, originally execute example to provide a kind of sampling apparatus, including:
Sampling unit 1, gathers current signal and/or the voltage signal of main circuit；
Processor unit 2, current signal and/or the voltage signal of reception sampling unit 1 collection also process, and send the sampled data of correspondence, routine data and startup optimization data；
Memory element 3, receives processor unit 2 sampled data, routine data and the startup optimization data that send and stores；
Power subsystem 4, provides electric energy for sampling unit 1, processor unit 2 and storage element；
Power subsystem 4 includes main power circuit 41 and sampling reference circuit 42, main power circuit 41 includes the first process circuit 411 that low dropout voltage regulator 412 is connected and the second process circuit 413 being connected with low dropout voltage regulator 412 outfan with low dropout voltage regulator 412 input, first processes circuit 411 includes the first filter circuit, and second processes circuit 413 includes the first mu balanced circuit；Sampling reference circuit 42 includes the 3rd process circuit 421 that bandgap voltage reference chip 422 is connected and the fourth process circuit 423 being connected with bandgap voltage reference chip 422 outfan with bandgap voltage reference chip 422 input, 3rd processes circuit 421 includes the second filter circuit, and fourth process circuit 423 includes the second mu balanced circuit。
The sampling apparatus that the present embodiment provides, main power circuit 41 adopts the low dropout voltage regulator 412 (TPS73250DBVR) of 5V, it is possible to still stably exporting in OCL output capacitance-less situation, load transient response performance is good, and reverse leakage current is low, and noise is low。Solve owing to DC power supplier exists noise, indirectly cause the problem that output voltage is unstable。The input of low dropout voltage regulator 412 is provided with the first filter circuit, for being filtered external input power processing to eliminate alternating component therein, improves the stability of input voltage。The outfan of low dropout voltage regulator 412 is provided with the first mu balanced circuit, improves the stability of main power circuit 41 output voltage further。
The sampling apparatus that the present embodiment provides, its sampling reference circuit 42 adopts the superhigh precision bandgap voltage reference AD780BR of 2.5V, there is high accuracy, low noise, low initial error, low quiescent current (less than 1mA), the advantages such as wide input (4V-36V), Low Drift Temperature (lower than 3ppm/ DEG C) and output voltage stabilization, solve and indirectly cause the problem of output voltage instability and owing to the temperature of electronic component floats the problem causing that greatly output voltage is unstable owing to DC power supplier exists noise。The input of bandgap voltage reference chip 422 is provided with the second filter circuit, for being filtered external input power processing to eliminate the alternating component in input power, improve the stability of input voltage, solve the technical problem owing to input voltage instability causes sampling reference circuit 42 output voltage unstable。The outfan of bandgap voltage reference chip 422 is provided with the second mu balanced circuit, improves the stability of sampling reference circuit 42 output voltage further。
Above-mentioned sampling apparatus can be used for the collection of power quality analysis data, the i.e. electric current of each phase and voltage signal in Real-time Collection three-phase alternating current electrical network, then add up with carrying out electric energy according to IEC61000-4-30 criterion calculation power quality index, be also carried out Power Quality Transient simultaneously and transient affair judges。First sampling module carries out 10 cycle data and calculates, and is then calculated 3 number of seconds evidences by 10 cycle data。The effect of sampling apparatus is just by the calculating of power quality indexes and electric energy adds up, it is ensured that the accuracy of measurement and the reliability of metering。
As specific embodiment, as shown in Figure 2, first filter circuit includes inductance B3, electric capacity C77 and C75, first end of inductance B3 connects external power supply, the second end is connected with the input of low dropout voltage regulator 412 (i.e. U12 in Fig. 2), first end of electric capacity C77 and first end of electric capacity C75 are connected with second end of inductance B3 respectively, second end of electric capacity C77 and the second end common ground of electric capacity C75。This first filter circuit uses the inductance B3 of series connection, electric capacity C77 and C75 in parallel, is filtered input power processing, eliminated alternating component therein before low dropout voltage regulator 412。
As specific embodiment, as shown in Figure 2, first mu balanced circuit includes diode D1 and electric capacity C78, C76, the negative electrode of diode D1 is connected with the outfan of low dropout voltage regulator 412 (i.e. U12 in Fig. 2), plus earth, first end of electric capacity C78, electric capacity C76 the first end be connected with the outfan of low dropout voltage regulator 412 respectively, second end of electric capacity C78, electric capacity C76 the second end common ground, the junction of first end of electric capacity C78 and first end of electric capacity C76 is as the outfan of main power circuit 41。Diode D1 is Zener diode; can ensure that to export at main power circuit 41 keeps output voltage to be basically unchanged when electric current in very large range changes; additionally diode D1 is also used as electrostatic protection device, carries out noise processed and autoprotection after low dropout voltage regulator 412 output voltage。Electric capacity C78, C76 in parallel can improve the stability of main power circuit 41 output voltage further。
Specifically, above-mentioned main power circuit 41 also includes electric capacity C82, one end of electric capacity C82 is connected with the NR/FB pin of low dropout voltage regulator 412 (TPS73250DBVR) (i.e. U12 in Fig. 2), other end ground connection, and this electric capacity C82 can filter the noise that internal band gap produces。
In other implementations, above-mentioned second process circuit 413 also includes first end of inductance B4, inductance B4 and is connected with the junction of first end of electric capacity C78 and first end of electric capacity C76, and second end of inductance B4 is as the outfan of main power circuit 41。
It addition, for the duty indicating this main power circuit 41 in real time, this main power circuit 41 also includes LED 3, the anode of LED 3 is connected by second end of current-limiting resistance R28 and inductance B4, minus earth。
As specific embodiment, as shown in Figure 3, second filter circuit includes electric capacity C85, C86, first end of electric capacity C85, electric capacity C86 the first end be connected with the input of bandgap voltage reference chip 422 (i.e. U14 in Fig. 3) respectively, second end of electric capacity C85, electric capacity C86 the second end common ground, the input of bandgap voltage reference chip 422 connects the outfan of main power circuit 41。Before this second filter circuit is arranged on bandgap voltage reference chip 422, electric capacity C85, C86 of parallel connection is used to be filtered input power processing to eliminate the alternating component in input power。
It addition, the 3rd process circuit 421 also includes the electric capacity C87 for voltage stabilizing noise reduction, its one end is connected with the TEMP pin of bandgap voltage reference chip 422 (i.e. U14 in Fig. 3), other end ground connection。
As specific embodiment, as shown in Figure 3, second mu balanced circuit includes diode D3 and electric capacity C88, C89, first end of electric capacity C88, electric capacity C89 the first end be connected with the outfan of bandgap voltage reference chip 422 (i.e. U14 in Fig. 3) respectively, second end of electric capacity C88, electric capacity C89 the second end common ground, the negative electrode of diode D3 is connected with the outfan of bandgap voltage reference chip 422 (i.e. U14 in Fig. 3), the plus earth of diode D3。Wherein, diode D3 is Zener diode, it is ensured that the stability of output voltage when the output electric current of sampling reference circuit 42 in very large range changes。It addition, diode D3 is also electrostatic protection device, after bandgap voltage reference chip 422 output voltage, carry out noise processed and autoprotection。Electric capacity C88, C89 in parallel can improve the stability of sampling reference circuit 42 output voltage further。
Specifically, as shown in Figure 4, memory element 3 includes ferroelectric memory, synchronous DRAM and erasable nonvolatile memory (NORFLASH), ferroelectric memory is for storing data when sampled data and power down, synchronous DRAM is used for storage system service data, and erasable nonvolatile memory (NORFLASH) is for storing startup data and the routine data of processor unit 2。
In the present embodiment, this sampling apparatus processor adopts the dsp chip TMS320C6747 of TI。This device accesses host computer by the UART1 serial ports of dsp chip, it is achieved with the communication of host computer。Dsp chip TMS320C6747 is double-core low power processor, dominant frequency can reach 300MHz, per second perform 2,400,000,000 fixed point instruction, per second perform 1,800,000,000 floating point instructions, it is possible to realize processing in real time and completing corresponding Industry Control according to result of sampled data。The mass data being mainly used in sampling unit 1 is gathered in this device carries out real-time operation, when for the collection of power quality analysis data, specifically complete the electric current of A, B, C three-phase, voltage acquisition, and the computing of active power, reactive power and power quality index。
Above-mentioned ferroelectric memory adopts the FM25V10RAM chip of ferrum electricity, is connected with dsp chip by SPI serial ports。The advantage such as non-volatile storage character and the unlimited read-write of RAM, high speed and low-power consumption of ROM is combined by ferroelectric memory。This device adopts ferroelectric memory FM25V10 based on spi bus technology, and spi bus has at a high speed and reliable advantage。It is applicable to deposit the data needing storage when sampling the mass data and device power down that obtain。
Synchronous DRAM (i.e. SDRAM) adopts MT48LC16M16A2TG chip, is connected by the parallel port of the 16Bit of EMIFB and dsp chip。This device is big due to the current and voltage data amount gathered, and the amount of storage therefore required in system is run is big, and the SDRAM of high-speed high capacity disclosure satisfy that the requirement of handling up to mass data of this device, is that dsp chip is rely the internal memory run。
The erasable nonvolatile memory (NORFLASH) of 8Bit is connected by high-speed parallel port and the dsp chip of the 8Bit of EMIFA。
As specific embodiment, sampling unit 1 includes voltage sampling circuit and/or current sampling circuit, and voltage sampling circuit is for gathering the voltage signal of main circuit, and current sampling circuit is for gathering the current signal of main circuit。Voltage sampling circuit specifically includes voltage sample modulate circuit。Current sampling circuit specifically includes current sample modulate circuit。It addition, that AD conversion chip in the present embodiment adopts is the ADS8365 of TI, this chip is the modulus conversion chip that a kind of high speed, low-power consumption, 6 Channel Synchronous samplings are powered with conversion, single+5V。Change maximum sampling throughput and may be up to 5MHz, and with the fully differential input channel of common mode inhibition of 80dB and 6 difference sampling holders。Pin inner portions is also with the reference voltage of 2.5V and high-speed parallel port。Therefore the ADS8365 of TI is adopted, the precision of this A/D chip and port number, fully meet the sampling request of this system electric current to three-phase electricity and voltage。ADS8365 is connected by 8Bit parallel port and the dsp chip of EMIFA, the voltage and current of six passages of ADS8365 sampling three-phase electricity respectively, being converted to digital signal and input a signal into dsp chip by high-speed parallel port, the computing through dsp chip can obtain the data such as the electric current of A, B, C three-phase, voltage, active power, reactive power and power quality index。
As preferred embodiment, this device also includes the automatic reset circuit with function for monitoring, and automatic reset circuit is connected with processor unit 2。DSP6747 processes chip needs system to provide the reset pulse of a 100-200ms to reset when powering on for it, owing to DSP6747 processes when the operating frequency of chip reaches more than 300MHz it may happen that interference and disturbed phenomenon, cause system in case of system halt, so needing to be equipped with the automatic reset circuit with function for monitoring to play the effect of house dog。The present embodiment adopts the MAX706 reset chip that Maxim company produces, and this chip has reliability and the capacity of resisting disturbance that peripheral circuit is simple, can effectively improve this device。
It addition, the sampling apparatus that the present embodiment provides also includes the crystal oscillator of the 24M that the CLKIN interface with dsp chip is connected。
Obviously, above-described embodiment is only for clearly demonstrating example, and is not the restriction to embodiment。For those of ordinary skill in the field, can also make other changes in different forms on the basis of the above description。Here without also cannot all of embodiment be given exhaustive。And the apparent change thus extended out or variation are still among the protection domain of the invention。
Claims (10)
1. a sampling apparatus, it is characterised in that including:
Sampling unit (1), gathers current signal and/or the voltage signal of main circuit；
Processor unit (2), receives current signal and/or voltage signal that described sampling unit (1) gathers and processes, and sends corresponding sampled data, routine data and startup optimization data；
Memory element (3), receives sampled data, routine data and startup optimization data that described processor unit (2) sends and stores；
Power subsystem (4), provides electric energy for described sampling unit (1), described processor unit (2) and described storage element；
Described power subsystem (4) includes main power circuit (41) and sampling reference circuit (42), described main power circuit (41) includes the first process circuit (411) that low dropout voltage regulator (412) is connected and the second process circuit (413) being connected with described low dropout voltage regulator (412) outfan with described low dropout voltage regulator (412) input, described first processes circuit (411) includes the first filter circuit, and described second processes circuit (413) includes the first mu balanced circuit；Described sampling reference circuit (42) includes the 3rd process circuit (421) that bandgap voltage reference chip (422) is connected and the fourth process circuit (423) being connected with described bandgap voltage reference chip (422) outfan with described bandgap voltage reference chip (422) input, described 3rd processes circuit (421) includes the second filter circuit, and described fourth process circuit (423) includes the second mu balanced circuit。
2. sampling apparatus as claimed in claim 1, it is characterized in that, described first filter circuit includes inductance B3, electric capacity C77 and C75, first end of described inductance B3 connects external power supply, the second end is connected with the input of described low dropout voltage regulator (412), first end of described electric capacity C77 and first end of described electric capacity C75 are connected with second end of described inductance B3 respectively, second end of described electric capacity C77 and the second end common ground of described electric capacity C75。
3. sampling apparatus as claimed in claim 1 or 2, it is characterized in that, described first mu balanced circuit includes diode D1 and electric capacity C78, C76, the negative electrode of described diode D1 is connected with the outfan of described low dropout voltage regulator (412), plus earth, first end of described electric capacity C78, first end of described electric capacity C76 is connected with the outfan of described low dropout voltage regulator (412) respectively, second end of described electric capacity C78, the second end common ground of described electric capacity C76, the junction of first end of first end of described electric capacity C78 and described electric capacity C76 is as the outfan of described main power circuit (41)。
4. the sampling apparatus as according to any one of claim 1-3, it is characterized in that, described second filter circuit includes electric capacity C85, C86, first end of described electric capacity C85, described electric capacity C86 the first end be connected with the input of described bandgap voltage reference chip (422) respectively, second end of described electric capacity C85, described electric capacity C86 the second end common ground, the input of described bandgap voltage reference chip (422) connects the outfan of described main power circuit (41)。
5. the sampling apparatus as according to any one of claim 1-4, it is characterized in that, described second mu balanced circuit includes diode D3 and electric capacity C88, C89, first end of described electric capacity C88, described electric capacity C89 the first end be connected with the outfan of described bandgap voltage reference chip (422) respectively, second end of described electric capacity C88, described electric capacity C89 the second end common ground, the negative electrode of described diode D3 is connected with the outfan of described bandgap voltage reference chip (422), the plus earth of described diode D3。
6. the sampling apparatus as according to any one of claim 1-5, it is characterized in that, described memory element (3) includes ferroelectric memory, synchronous DRAM and erasable nonvolatile memory (NORFLASH), described ferroelectric memory is for storing data when sampled data and power down, described synchronous DRAM is used for storage system service data, and described erasable nonvolatile memory (NORFLASH) is used for storing startup data and the routine data of described processor unit (2)。
7. the sampling apparatus as according to any one of claim 1-6, it is characterized in that, described sampling unit (1) includes voltage sampling circuit and/or current sampling circuit, described voltage sampling circuit is for gathering the voltage signal of main circuit, and described current sampling circuit is for gathering the current signal of main circuit。
8. the sampling apparatus as according to any one of claim 1-7, it is characterised in that described voltage sampling circuit includes voltage sample modulate circuit。
9. the sampling apparatus as according to any one of claim 1-8, it is characterised in that described current sampling circuit includes current sample modulate circuit。
10. sampling apparatus as claimed in any one of claims 1-9 wherein, it is characterised in that also including the automatic reset circuit with function for monitoring, described automatic reset circuit is connected with described processor unit (2)。
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