CN105678789B - A kind of cabinet standard component assembling quality intelligent analysis method - Google Patents
A kind of cabinet standard component assembling quality intelligent analysis method Download PDFInfo
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- CN105678789B CN105678789B CN201610093451.3A CN201610093451A CN105678789B CN 105678789 B CN105678789 B CN 105678789B CN 201610093451 A CN201610093451 A CN 201610093451A CN 105678789 B CN105678789 B CN 105678789B
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- assembly
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- 238000004458 analytical method Methods 0.000 title claims abstract description 22
- 238000001514 detection method Methods 0.000 claims abstract description 53
- 238000012360 testing method Methods 0.000 claims abstract description 13
- 238000005070 sampling Methods 0.000 claims abstract description 6
- 238000000034 method Methods 0.000 claims description 8
- 238000012797 qualification Methods 0.000 claims description 2
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012372 quality testing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Abstract
The invention discloses a kind of cabinet standard component assembling quality intelligent analysis methods, including：The image for obtaining cabinet standard component, demarcates camera, and it is D to obtain each pixel in image and correspond to the distance of realityx、Dy；If the assembly quantity of prescribed requirement detection is Nc, do not require detection assembly quantity be Nu, divide image and obtain each assembly sample Si(the N of i=1,2,3 ...c+Nu), division image is NcA compulsory test region and NuA optional detection zone；Cabinet standard component image to be detected is obtained, in each detection zone RiUsing low difference sampling algorithm and sample S at corresponding assemblyiIt is matched, and counts the matched compulsory test areal n that succeedsc, optional detection zone number nu；Calculating requires various assembly yields, and various assembly yields threshold values are arranged and carry out discriminatory analysis to the assembling quality.The independent analysis that the present invention realizes the assembly of contactless cabinet standard component many places is analyzed with assembling quality.
Description
Technical field
The present invention relates to assembling quality detection field more particularly to a kind of cabinet standard component assembling quality intellectual analysis sides
Method.
Background technology
In the prior art, the tool and method of assembling detection device, it is main using manual operations completely, contact with it is non-
The machine pile line operation of contact high mechanization.In general, manual operations is applied more, and operator is by visually sentencing
The position of various components in disconnected detection device.It is detected using the automatic assembly line assembling quality of contact, it may be to tested production
Product cause secondary damage, if patent CN 103433736A disclose a kind of automatic assembling detection device, using mechanical structure contact
Detection, to detect assembling quality；Whether the component that patent ZL200910101906.1 is used to test detection device by one
Positioned at the sensor of induction region, the detection of assembly is realized in a manner of contact measurement；Patent ZL200810063643.5 is carried
Go out a kind of tool for detection device assembly, the various components in detection device is pasted in correct position, various components
Between overlap joint it is close, uniformity between detection device.Using contactless Automated assembly quality testing, mainly pass through inspection
It surveys its size or is proposed based on double CCD industrial cameras with the presence or absence of the quality for judging its assembly, such as 102873522 A of patent CN
Microminiature parts precision assembly detection device, measured by the characteristic size to finished product after assembling, to obtain it
Assemble result.
Invention content
To solve the problems, such as above-mentioned and defect, the object of the present invention is to provide a kind of cabinet standard component assembling quality intelligence
Energy analysis method, the method achieve the independent analyses of contactless cabinet standard component many places assembly and assembling quality analysis.
The purpose of the present invention is realized by technical solution below：
A kind of cabinet standard component assembling quality intelligent analysis method, this method include：
A obtains the image of cabinet standard component, is demarcated to camera, obtains the distance that each pixel corresponds to reality in image and is
Dx、Dy；
B sets the assembly quantity of prescribed requirement detection as Nc, do not require detection assembly quantity be Nu, divide image and obtain respectively
Assemble sample Si, the N of wherein i=1,2,3 ...c+Nu, division image is NcA compulsory test region and NuA optional detection zone；
C obtains cabinet standard component image to be detected, in each detection zone RiUsing low difference sampling algorithm and corresponding dress
With place sample SiIt is matched, and counts the matched compulsory test areal n that succeedsc, optional detection zone number
nu；
D calculating requires various assembly yields, and various assembly yields threshold values are arranged and sentence to the assembling quality
Disconnected analysis.
Compared with prior art, one or more embodiments of the invention can have the following advantages that：
The independent analysis for realizing the assembly of contactless cabinet standard component many places is analyzed with assembling quality.
Description of the drawings
Fig. 1 is cabinet standard component assembling quality intelligent analysis method flow chart.
Specific implementation mode
To make the object, technical solutions and advantages of the present invention clearer, below in conjunction with embodiment and attached drawing to this hair
It is bright to be described in further detail.
As shown in Figure 1, being cabinet standard component assembling quality intelligent analysis method, this method includes：
Step 10 obtains the image of cabinet standard component, is demarcated to camera, obtains each pixel in image and corresponds to reality
Distance is Dx、Dy；
Step 20 sets the assembly quantity of prescribed requirement detection as Nc, do not require detection assembly quantity be Nu, divide image and obtain
To each assembly sample Si, the N of wherein i=1,2,3 ...c+Nu, division image is NcA compulsory test region and NuA optional detection zone
Domain；
NcA compulsory test region and NuThe image division methods of a optional detection zone are：
If respectively assembly sample SiPixel number be pxi×pyi, since location of workpiece deviation caused by vibration possibility is ± σu,
Caused camera position deviation is ± σc, then each detection zone RiActual size Pxi×Pyi。
Step 30 obtains cabinet standard component image to be detected, in each detection zone RiUsing low difference sampling algorithm with it is corresponding
Assembly at sample SiIt is matched, and counts the matched compulsory test areal n that succeedsc, optional detection zone
Number nu；Low difference sampling algorithm samples the sample of known sample point quantity using the low diversity sequences of Hammersley, raw
At the sample to predetermined quantity.
Step 40 calculating require various assembly yields, and be arranged various assembly yields threshold values to the assembling quality into
Row discriminatory analysis.
Various assembly yields are：It is required that detection assembles yields, does not require detection assembly yields, general assembly non-defective unit
Rate；It is described that detection assembly yields is required to be the compulsory test areal of successful match and require the ratio of detection assembly quantity
Value；It is described that detection assembly yields is not required to be the optional detection zone number of successful match and do not require to detect assembly quantity
Ratio；The general assembly yields is the ratio of all successful match numbers and all assembly quantity.
Above-mentioned assembling quality discriminatory analysis method is：
When three assembly yields threshold values for assembling yields higher than setting, then judge cabinet standard component quality to be excellent；
When only a undesired detection assembly yields or general assembly yields are less than corresponding assembly yields threshold value,
Then judge cabinet standard component quality for qualification；
When requiring detection assembly yields or there are two or more assembly yields to be less than corresponding threshold value simultaneously, then judge
Cabinet standard component quality is unqualified.
Although disclosed herein embodiment it is as above, the content is only to facilitate understanding the present invention and adopting
Embodiment is not limited to the present invention.Any those skilled in the art to which this invention pertains are not departing from this
Under the premise of the disclosed spirit and scope of invention, any modification and change can be made in the implementing form and in details,
But the scope of patent protection of the present invention, still should be subject to the scope of the claims as defined in the appended claims.
Claims (4)
1. a kind of cabinet standard component assembling quality intelligent analysis method, which is characterized in that the method includes：
A obtains the image of cabinet standard component, is demarcated to camera, and it is D to obtain each pixel in image and correspond to the distance of realityx、
Dy；
B sets the assembly quantity of prescribed requirement detection as Nc, do not require detection assembly quantity be Nu, divide image and obtain each assembly
Sample Si, the N of wherein i=1,2,3 ...c+Nu, division image is NcA compulsory test region and NuA optional detection zone；
C obtains cabinet standard component image to be detected, in each detection zone RiUsing low difference sampling algorithm and sample at corresponding assembly
This SiIt is matched, and counts the matched compulsory test areal n that succeedsc, optional detection zone number nu；
D calculating requires various assembly yields, and various assembly yields threshold values are arranged and carry out judging to divide to the assembling quality
Analysis；
N in the step BcA compulsory test region and NuThe image division methods of a optional detection zone are：
If respectively assembly sample SiPixel number be pxi×pyi, wherein pxiTo assemble sample SiHorizontal number of pixels, pyiTo assemble sample
This SiVertical number of pixels；Since location of workpiece deviation caused by vibration possibility is ± σu, caused camera position deviation be ±
σc, safety coefficient a is set, then each detection zone RiActual size Pxi×Pyi；Wherein, detection zone RiHorizontal number of pixels Pxi
For：
Detection zone RiVertical number of pixels PyiFor：
2. cabinet standard component assembling quality intelligent analysis method as described in claim 1, which is characterized in that in the step C
Low difference sampling algorithm samples the sample of known sample point quantity using the low diversity sequences of Hammersley, is generated to pre-
The sample of fixed number amount.
3. cabinet standard component assembling quality intelligent analysis method as described in claim 1, which is characterized in that in the step D
Various assembly yields are：It is required that detection assembles yields, does not require detection assembly yields and general assembly yields；
It is described that detection assembly yields is required to be the compulsory test areal of successful match and require the ratio of detection assembly quantity
Value；
It is described that detection assembly yields is not required to be the optional detection zone number of successful match and do not require to detect assembly number
The ratio of amount；
The general assembly yields is the ratio of all successful match numbers and all assembly quantity.
4. cabinet standard component assembling quality intelligent analysis method as described in claim 1, which is characterized in that the assembly matter
Amount carries out discriminatory analysis：
When three assembly yields threshold values for assembling yields higher than setting, then judge cabinet standard component quality to be excellent；
When only a undesired detection assembly yields or general assembly yields are less than corresponding assembly yields threshold value, then sentence
Off line case standard component quality is qualification；
When requiring detection assembly yields or there are two or more assembly yields to be less than corresponding threshold value simultaneously, then cabinet is judged
Standard component quality is unqualified.
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| CN109060799A (en) * | 2018-05-23 | 2018-12-21 | 嘉兴微芒科技有限公司 | A kind of assembling line finished product detection determination method |
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Denomination of invention: An intelligent analysis method for assembly quality of chassis standard parts Effective date of registration: 20201215 Granted publication date: 20180817 Pledgee: Bank of China Limited Guangzhou Development Zone Branch Pledgor: GUANGZHOU HUAJIE ELECTRONIC TECHNOLOGY Co.,Ltd. Registration number: Y2020440000403 |
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Denomination of invention: An intelligent analysis method for assembly quality of chassis standard parts Effective date of registration: 20211229 Granted publication date: 20180817 Pledgee: Bank of China Limited Guangzhou Development Zone Branch Pledgor: GUANGZHOU HUAJIE ELECTRONIC TECHNOLOGY Co.,Ltd. Registration number: Y2021980017049 |
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Date of cancellation: 20230720 Granted publication date: 20180817 Pledgee: Bank of China Limited Guangzhou Development Zone Branch Pledgor: GUANGZHOU HUAJIE ELECTRONIC TECHNOLOGY Co.,Ltd. Registration number: Y2021980017049 |
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Denomination of invention: An Intelligent Analysis Method for Assembly Quality of Chassis Standard Parts Effective date of registration: 20230724 Granted publication date: 20180817 Pledgee: Bank of Guangzhou branch of the Bank of Guangzhou Science City Branch Pledgor: GUANGZHOU HUAJIE ELECTRONIC TECHNOLOGY Co.,Ltd. Registration number: Y2023980049514 |
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