CN105678789A - Method for intelligently analyzing assembly quality of cabinet standard component - Google Patents

Abstract

The invention discloses a method for intelligently analyzing the assembly quality of a cabinet standard component, and the method comprises the steps: obtaining an image of the cabinet standard component, calibrating a camera, and obtaining the real distances Dx and Dy corresponding to each pixel in the image; supposing that a specified to-be-detected assembly number is Nc and a specified not-to-be-detected assembly number is Nu, segmenting the image, obtaining all assembly samples Si (i=1, 2, 3,...,Nc+Nu), and dividing the image into Nc forced detection regions and Nu non-forced detection regions; obtaining the image of a to-be-detected cabinet standard component, carrying out the matching with the corresponding assembly samples Si in each detection region Ri through employing a low-difference sampling algorithm, and counting the number nc of successfully-matched forced detection regions and the number nu of successfully-matched non-forced detection regions; calculating the yield of various types of required assembly, setting threshold values of yield of various types of required assembly, and carrying out the judgment and analysis of the assembly quality. The method achieves the independent analysis of multiple assembly of the non-contact cabinet standard component and the analysis of the assembly quality.

Description

A kind of cabinet standard component assembling quality intelligent analyzes method

Technical field

The present invention relates to assembling quality testing field, particularly relate to a kind of cabinet standard component assembling quality intelligent and analyze method.

Background technology

In the prior art, the tool and method of assembling detection device, main employing manual operations, contact and contactless highly-mechanized machine pile line operation completely. In general, manual operations is applied more, and operator judges the position of each assembly on detecting device by naked eyes. Adopt the automatic assembly line assembling quality testing of contact, it is possible to test product is caused secondary damage, a kind of assembling detection device automatically as open in patent CN103433736A, adopt frame for movement contact measurement, thus detecting assembling quality; Patent ZL200910101906.1, by whether the parts for testing detecting device are positioned at the sensor of induction region, realizes the detection of assembling in the way of contact measurement; Patent ZL200810063643.5 proposes a kind of instrument for detecting device assembling, and each assembly on detecting device is pasted onto correct position, and the overlap joint between each assembly is tight, uniformity between detecting device. Adopt contactless Automated assembly quality testing, mainly through detecting its size or whether there is the quality judging its assembling, as patent CN102873522A proposes the microminiature parts Fine Boring detecting device based on double; two CCD industrial cameras, by to the characteristic size measurement of finished product after assembling, thus obtaining it to assemble result.

Summary of the invention

For solving above-mentioned Problems existing and defect, it is an object of the invention to provide a kind of cabinet standard component assembling quality intelligent and analyze method, the method achieve independent analysis and the assembling quality analysis of contactless cabinet standard component many places assembling.

The purpose of the present invention is realized by following technical scheme:

A kind of cabinet standard component assembling quality intelligent analyzes method, and the method includes:

A obtains the image of cabinet standard component, and camera is demarcated, and obtaining the distance of each pixel correspondence reality in image is D_x、D_y;

B sets regulation and requires that the assembling quantity of detection is as N_c, do not require detection assembling quantity be N_u, segmentation image obtains each assembling sample S_i, wherein i=1,2,3 ... N_c+N_u, division image is N_cIndividual compulsory test region and N_uIndividual optional detection region;

C obtains cabinet standard component image to be detected, at each detection region R_iAdopt low difference sampling algorithm and corresponding assembling place sample S_iMate, and add up the compulsory test areal n of coupling of succeeding_c, optional detection areal n_u;

The various assembling yields of D calculation requirement, and various assembling yields threshold value is set described assembling quality is carried out discriminatory analysis.

Compared with prior art, one or more embodiments of the invention can have the advantage that

Achieve independent analysis and the assembling quality analysis of the assembling of contactless cabinet standard component many places.

Accompanying drawing explanation

Fig. 1 is that cabinet standard component assembling quality intelligent analyzes method flow diagram.

Detailed description of the invention

For making the object, technical solutions and advantages of the present invention clearly, below in conjunction with embodiment and accompanying drawing, the present invention is described in further detail.

As it is shown in figure 1, assemble quality intelligent for cabinet standard component to analyze method, the method includes:

Step 10 obtains the image of cabinet standard component, and camera is demarcated, and obtaining the distance of each pixel correspondence reality in image is D_x、D_y;

Step 20 sets regulation and requires that the assembling quantity of detection is as N_c, do not require detection assembling quantity be N_u, segmentation image obtains each assembling sample S_i, wherein i=1,2,3 ... N_c+N_u, division image is N_cIndividual compulsory test region and N_uIndividual optional detection region;

N_cIndividual compulsory test region and N_uThe image division method in individual optional detection region is:

If respectively assembling sample S_iPixel count be p_xi×p_yi, it is ± σ owing to vibrating the location of workpiece deviation that may result in_u, the camera position deviation caused is ± σ_c, then region R is respectively detected_iActual size P_xi×P_yi。

$P_{xi}=p_{xi}+\frac{2a({\mathrm{\σ}}_u+{\mathrm{\σ}}_c)}{D_x},P_{yi}=p_{yi}+\frac{2a({\mathrm{\σ}}_u+{\mathrm{\σ}}_c)}{D_y}$

Step 30 obtains cabinet standard component image to be detected, at each detection region R_iAdopt low difference sampling algorithm and corresponding assembling place sample S_iMate, and add up the compulsory test areal n of coupling of succeeding_c, optional detection areal n_u; Low difference sampling algorithm adopts Hammersley low diversity sequence that the sample of known sample point quantity is sampled, and is generated to the sample of predetermined quantity.

The various assembling yields of step 40 calculation requirement, and various assembling yields threshold value is set described assembling quality is carried out discriminatory analysis.

Various assembling yields are: require detection assembling yields, do not require detection assembling yields, general assembly yields; The described compulsory test areal requiring detection assembling yields to be successful match and the ratio requiring detection assembling quantity; The described optional detection areal not requiring detection assembling yields to be successful match and the ratio not requiring detection assembling quantity; Described general assembly yields is the ratio of all successful match numbers and all assembling quantity.

Above-mentioned assembling Quality estimation analyzes method:

When assembling yields higher than the assembling yields threshold value arranged for three, then judge that cabinet standard component quality is excellent;

When only a undesired detection assembling yields or general assembly yields assemble yields threshold value lower than correspondence, then judge that cabinet standard component quality is qualified;

When requiring detection assembling yields or having the assembling yields of more than two lower than correspondence threshold value simultaneously, then judge that cabinet standard component quality is defective.

Although the embodiment that disclosed herein is as above, but described content is only to facilitate the embodiment understanding the present invention and adopt, is not limited to the present invention. Technical staff in any the technical field of the invention; under the premise without departing from the spirit and scope that disclosed herein; any amendment and change can be done in the formal and details implemented; but the scope of patent protection of the present invention, still must be as the criterion with the scope that appending claims defines.

Claims (5)

1. a cabinet standard component assembling quality intelligent analyzes method, it is characterised in that described method includes:

A obtains the image of cabinet standard component, and camera is demarcated, and obtaining the distance of each pixel correspondence reality in image is D_x、D_y;

B sets regulation and requires that the assembling quantity of detection is as N_c, do not require detection assembling quantity be N_u, segmentation image obtains each assembling sample S_i, wherein i=1,2,3 ... N_c+N_u, division image is N_cIndividual compulsory test region and N_uIndividual optional detection region;

C obtains cabinet standard component image to be detected, at each detection region R_iAdopt low difference sampling algorithm and corresponding assembling place sample S_iMate, and add up the compulsory test areal n of coupling of succeeding_c, optional detection areal n_u;

The various assembling yields of D calculation requirement, and various assembling yields threshold value is set described assembling quality is carried out discriminatory analysis.

2. cabinet standard component assembling quality intelligent as claimed in claim 1 analyzes method, it is characterised in that N in described step B_cIndividual compulsory test region and N_uThe image division method in individual optional detection region is:

If respectively assembling sample S_iPixel count be p_xi×p_yi, it is ± σ owing to vibrating the location of workpiece deviation that may result in_u, the camera position deviation caused is ± σ_c, safety coefficient a is set, then respectively detects region R_iActual size P_xi×P_yi; Wherein

。

3. cabinet standard component assembling quality intelligent as claimed in claim 1 analyzes method, it is characterized in that, in described step C, low difference sampling algorithm adopts Hammersley low diversity sequence that the sample of known sample point quantity is sampled, and is generated to the sample of predetermined quantity.

4. cabinet standard component assembling quality intelligent as claimed in claim 1 analyzes method, it is characterised in that in described step D, various assembling yields are: requires detection assembling yields, require detection assembling yields and general assembly yields;

The described compulsory test areal requiring detection assembling yields to be successful match and the ratio requiring detection assembling quantity;

The described optional detection areal not requiring detection assembling yields to be successful match and the ratio not requiring detection assembling quantity;

Described general assembly yields is the ratio of all successful match numbers and all assembling quantity.

5. cabinet standard component assembling quality intelligent as claimed in claim 1 analyzes method, it is characterised in that described assembling quality is carried out discriminatory analysis and includes:

When assembling yields higher than the assembling yields threshold value arranged for three, then judge that cabinet standard component quality is excellent;

When only a undesired detection assembling yields or general assembly yields assemble yields threshold value lower than correspondence, then judge that cabinet standard component quality is qualified;

When requiring detection assembling yields or having the assembling yields of more than two lower than correspondence threshold value simultaneously, then judge that cabinet standard component quality is defective.