CN105676115A - Circuit board fault detection system - Google Patents
Circuit board fault detection system Download PDFInfo
- Publication number
- CN105676115A CN105676115A CN201610163774.5A CN201610163774A CN105676115A CN 105676115 A CN105676115 A CN 105676115A CN 201610163774 A CN201610163774 A CN 201610163774A CN 105676115 A CN105676115 A CN 105676115A
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- unit
- circuit
- detection system
- circuit card
- test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
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- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a circuit board fault detection system, comprising an image acquisition unit used for collecting circuit board surface image information; a signal collection unit used for collecting circuit board signal information; an analysis unit used for analyzing circuit board faults and obtaining analytical data based on the image information and the signal information; and a generation unit used for generating a detection report based on the analytical data. The circuit board fault detection system realizes a reasonable system design, automatically completes circuit board detection, and obtains higher detection efficiency.
Description
Technical field
The present invention relates to circuit card field of fault detection, specifically, it relates to circuit card malfunction detection system.
Background technology
The reason of circuit board damage, the overwhelming majority is on plate in numerous components and parts, has badly indivedual. The maintenance process of circuit card is exactly indivedual components and parts damaged on trouble-shooting plate, and the lower bad part of weldering, has changed the process of part.
In the prior art, the components and parts on circuit card are manually detected by main employing one by one, and detection efficiency is lower.
In sum, present inventor is in the process realizing inventive technique scheme in the embodiment of the present application, it has been found that above-mentioned technology at least exists following technical problem:
In the prior art, there is the lower technical problem of detection efficiency in existing circuit card failure testing.
Summary of the invention
The present invention provides circuit card malfunction detection system, solves existing circuit card failure testing and there is the lower technical problem of detection efficiency, it is achieved that system design is reasonable, the detection of automatic completing circuit plate, the technique effect that detection efficiency is higher.
For solving the problems of the technologies described above, the embodiment of the present application provides circuit card malfunction detection system, and described system comprises:
Image acquisition units, described image acquisition units is used for Acquisition Circuit plate surface image information;
Signal gathering unit, described signal gathering unit is used for Acquisition Circuit partitioned signal information;
Analytical unit, described analytical unit is used for based on described graphic information and described signal information, the fault of described circuit card is analyzed, and obtains analytical data;
Generating unit, described generation unit is used for generating examining report based on described analytical data.
Wherein, described system also comprises maintenance unit, and described maintenance unit is used for generating maintenance program based on described analytical data, and is keeped in repair by faulty circuit plate based on described maintenance program.
Wherein, described system also comprises: digital logic device performance test unit, and described digital logic device performance test unit is used for input leakage current and output driving current direct current parameter to digital integrated circuit to be tested.
Wherein, described system is also included in off-line test unit, described is used for being carried out by many logic-level digital logical device on-line/off-line effect test at off-line test unit.
Wherein, described system also comprises simulation feature analytical test element, described simulation feature analytical test element for the characteristic curve Difference test fault by comparing corresponding device pin on normal circuit plate and faulty circuit plate, localization of fault to circuit node.
Wherein, described system also comprises curve two rod Dynamic comparison test cell, and the respective nodes in two pieces of same circuit board is carried out Dynamic comparison test for visiting rod based on two-way by described curve two rod Dynamic comparison test cell.
The one or more technical schemes provided in the embodiment of the present application, at least have following technique effect or advantage:
Being designed to comprise by circuit card malfunction detection system owing to have employed: image acquisition units, described image acquisition units is used for Acquisition Circuit plate surface image information; Signal gathering unit, described signal gathering unit is used for Acquisition Circuit partitioned signal information; Analytical unit, described analytical unit is used for based on described graphic information and described signal information, the fault of described circuit card is analyzed, and obtains analytical data; Generate unit, described generation unit is used for generating the technical scheme of examining report based on described analytical data, so, efficiently solve existing circuit card failure testing and there is the lower technical problem of detection efficiency, and then it is reasonable to achieve system design, the detection of automatic completing circuit plate, the technique effect that detection efficiency is higher.
Accompanying drawing explanation
Fig. 1 is the composition schematic diagram of circuit card malfunction detection system in the embodiment of the present application one.
Embodiment
The present invention provides circuit card malfunction detection system, solves existing circuit card failure testing and there is the lower technical problem of detection efficiency, it is achieved that system design is reasonable, the detection of automatic completing circuit plate, the technique effect that detection efficiency is higher.
Technical scheme in the application's enforcement is for solving the problems of the technologies described above. General thought is as follows:
Have employed and be designed to comprise by circuit card malfunction detection system: image acquisition units, described image acquisition units is used for Acquisition Circuit plate surface image information; Signal gathering unit, described signal gathering unit is used for Acquisition Circuit partitioned signal information; Analytical unit, described analytical unit is used for based on described graphic information and described signal information, the fault of described circuit card is analyzed, and obtains analytical data; Generate unit, described generation unit is used for generating the technical scheme of examining report based on described analytical data, so, efficiently solve existing circuit card failure testing and there is the lower technical problem of detection efficiency, and then it is reasonable to achieve system design, the detection of automatic completing circuit plate, the technique effect that detection efficiency is higher.
In order to better understand technique scheme, below in conjunction with Figure of description and concrete enforcement mode, technique scheme is described in detail.
Embodiment one:
In embodiment one, it provides circuit card malfunction detection system, please refer to Fig. 1, described system comprises:
Image acquisition units, described image acquisition units is used for Acquisition Circuit plate surface image information;
Signal gathering unit, described signal gathering unit is used for Acquisition Circuit partitioned signal information;
Analytical unit, described analytical unit is used for based on described graphic information and described signal information, the fault of described circuit card is analyzed, and obtains analytical data;
Generating unit, described generation unit is used for generating examining report based on described analytical data.
Wherein, in the embodiment of the present application, described system also comprises maintenance unit, and described maintenance unit is used for generating maintenance program based on described analytical data, and is keeped in repair by faulty circuit plate based on described maintenance program.
Wherein, in the embodiment of the present application, described system also comprises: digital logic device performance test unit, and described digital logic device performance test unit is used for input leakage current and output driving current direct current parameter to digital integrated circuit to be tested.
Wherein, in the embodiment of the present application, described system is also included in off-line test unit, described is used for being carried out by many logic-level digital logical device on-line/off-line effect test at off-line test unit.
Wherein, in the embodiment of the present application, described system also comprises simulation feature analytical test element, described simulation feature analytical test element for the characteristic curve Difference test fault by comparing corresponding device pin on normal circuit plate and faulty circuit plate, localization of fault to circuit node.
Wherein, in the embodiment of the present application, described system also comprises curve two rod Dynamic comparison test cell, and the respective nodes in two pieces of same circuit board is carried out Dynamic comparison test for visiting rod based on two-way by described curve two rod Dynamic comparison test cell.
Technical scheme in above-mentioned the embodiment of the present application, at least has following technique effect or advantage:
Being designed to comprise by circuit card malfunction detection system owing to have employed: image acquisition units, described image acquisition units is used for Acquisition Circuit plate surface image information; Signal gathering unit, described signal gathering unit is used for Acquisition Circuit partitioned signal information; Analytical unit, described analytical unit is used for based on described graphic information and described signal information, the fault of described circuit card is analyzed, and obtains analytical data; Generate unit, described generation unit is used for generating the technical scheme of examining report based on described analytical data, so, efficiently solve existing circuit card failure testing and there is the lower technical problem of detection efficiency, and then it is reasonable to achieve system design, the detection of automatic completing circuit plate, the technique effect that detection efficiency is higher.
Although having described the preferred embodiments of the present invention, but those skilled in the art once the substantially creative concept of cicada, then these embodiments can be made other change and amendment. Therefore, it is intended that the appended claims shall be construed comprise preferred embodiment and fall into all changes and the amendment of the scope of the invention.
Obviously, the present invention can be carried out various change and modification and not depart from the spirit and scope of the present invention by the technician of this area. Like this, if these amendments of the present invention and modification belong within the scope of the claims in the present invention and equivalent technologies thereof, then the present invention also is intended to comprise these change and modification.
Claims (6)
1. circuit card malfunction detection system, it is characterised in that, described system comprises:
Image acquisition units, described image acquisition units is used for Acquisition Circuit plate surface image information;
Signal gathering unit, described signal gathering unit is used for Acquisition Circuit partitioned signal information;
Analytical unit, described analytical unit is used for based on described graphic information and described signal information, the fault of described circuit card is analyzed, and obtains analytical data;
Generating unit, described generation unit is used for generating examining report based on described analytical data.
2. circuit card malfunction detection system according to claim 1, it is characterised in that, described system also comprises maintenance unit, and described maintenance unit is used for generating maintenance program based on described analytical data, and is keeped in repair by faulty circuit plate based on described maintenance program.
3. circuit card malfunction detection system according to claim 1, it is characterized in that, described system also comprises: digital logic device performance test unit, and described digital logic device performance test unit is used for input leakage current and output driving current direct current parameter to digital integrated circuit to be tested.
4. circuit card malfunction detection system according to claim 1, it is characterised in that, described system is also included in off-line test unit, described is used for being carried out by many logic-level digital logical device on-line/off-line effect test at off-line test unit.
5. circuit card malfunction detection system according to claim 1, it is characterized in that, described system also comprises simulation feature analytical test element, described simulation feature analytical test element for the characteristic curve Difference test fault by comparing corresponding device pin on normal circuit plate and faulty circuit plate, localization of fault to circuit node.
6. circuit card malfunction detection system according to claim 1, it is characterized in that, described system also comprises curve two rod Dynamic comparison test cell, and the respective nodes in two pieces of same circuit board is carried out Dynamic comparison test for visiting rod based on two-way by described curve two rod Dynamic comparison test cell.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610163774.5A CN105676115A (en) | 2016-03-22 | 2016-03-22 | Circuit board fault detection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610163774.5A CN105676115A (en) | 2016-03-22 | 2016-03-22 | Circuit board fault detection system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105676115A true CN105676115A (en) | 2016-06-15 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610163774.5A Withdrawn CN105676115A (en) | 2016-03-22 | 2016-03-22 | Circuit board fault detection system |
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| CN (1) | CN105676115A (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106990343A (en) * | 2017-04-25 | 2017-07-28 | 邵敏 | The method of testing and system of electronic component |
| CN107390069A (en) * | 2017-08-17 | 2017-11-24 | 西安北方光电科技防务有限公司 | A kind of fault rapid detecting method and detecting system |
| CN107765171A (en) * | 2017-12-01 | 2018-03-06 | 邵敏 | The detection method and system of electronic component |
| CN108716988A (en) * | 2018-05-29 | 2018-10-30 | 北京平高清大科技发展有限公司 | A kind of high-tension switch gear machine performance monitoring method and device |
| CN108802064A (en) * | 2018-07-16 | 2018-11-13 | 安徽世林照明股份有限公司 | A kind of LED lamp IC design debugging circuit board system and adjustment method |
| CN113791337A (en) * | 2021-11-16 | 2021-12-14 | 江西卓驰商业运营管理有限公司 | Data processing-based quality analysis monitoring system for circuit board |
| CN118376864A (en) * | 2024-06-21 | 2024-07-23 | 深圳市曜通科技有限公司 | System and method for diagnosing faults of tubing mechanism based on semiconductor punching equipment |
-
2016
- 2016-03-22 CN CN201610163774.5A patent/CN105676115A/en not_active Withdrawn
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106990343A (en) * | 2017-04-25 | 2017-07-28 | 邵敏 | The method of testing and system of electronic component |
| CN107390069A (en) * | 2017-08-17 | 2017-11-24 | 西安北方光电科技防务有限公司 | A kind of fault rapid detecting method and detecting system |
| CN107765171A (en) * | 2017-12-01 | 2018-03-06 | 邵敏 | The detection method and system of electronic component |
| CN108716988A (en) * | 2018-05-29 | 2018-10-30 | 北京平高清大科技发展有限公司 | A kind of high-tension switch gear machine performance monitoring method and device |
| CN108802064A (en) * | 2018-07-16 | 2018-11-13 | 安徽世林照明股份有限公司 | A kind of LED lamp IC design debugging circuit board system and adjustment method |
| CN113791337A (en) * | 2021-11-16 | 2021-12-14 | 江西卓驰商业运营管理有限公司 | Data processing-based quality analysis monitoring system for circuit board |
| CN113791337B (en) * | 2021-11-16 | 2022-03-04 | 吉安县鑫盛电子有限公司 | Data processing-based quality analysis monitoring system for circuit board |
| CN118376864A (en) * | 2024-06-21 | 2024-07-23 | 深圳市曜通科技有限公司 | System and method for diagnosing faults of tubing mechanism based on semiconductor punching equipment |
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Application publication date: 20160615 |
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| WW01 | Invention patent application withdrawn after publication |