CN105654108B - 分类方法、检查方法和检查装置 - Google Patents

分类方法、检查方法和检查装置 Download PDF

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Publication number
CN105654108B
CN105654108B CN201510823163.4A CN201510823163A CN105654108B CN 105654108 B CN105654108 B CN 105654108B CN 201510823163 A CN201510823163 A CN 201510823163A CN 105654108 B CN105654108 B CN 105654108B
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evaluation
image
estimate
group
sample
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CN201510823163.4A
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Chinese (zh)
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CN105654108A (zh
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植村卓典
奥田洋志
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Canon Inc
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Canon Inc
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
    • G06F18/2415—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches based on parametric or probabilistic models, e.g. based on likelihood ratio or false acceptance rate versus a false rejection rate

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Artificial Intelligence (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Evolutionary Biology (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Probability & Statistics with Applications (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
  • Image Analysis (AREA)
CN201510823163.4A 2014-11-28 2015-11-24 分类方法、检查方法和检查装置 Expired - Fee Related CN105654108B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2014-242306 2014-11-28
JP2014242306 2014-11-28
JP2015199723A JP6616645B2 (ja) 2014-11-28 2015-10-07 分類方法、検査方法、検査装置、およびプログラム
JP2015-199723 2015-10-07

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CN105654108A CN105654108A (zh) 2016-06-08
CN105654108B true CN105654108B (zh) 2019-04-12

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CN (1) CN105654108B (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6811645B2 (ja) * 2017-02-28 2021-01-13 株式会社日立製作所 画像検索装置及び画像検索方法
JP2019039727A (ja) * 2017-08-23 2019-03-14 富士通株式会社 画像検査装置、画像検査方法および画像検査プログラム
TWI700129B (zh) * 2019-07-24 2020-08-01 開必拓數據股份有限公司 基於自我學習技術之移動物品分類系統及方法
CN113792201B (zh) * 2021-03-02 2025-08-19 北京沃东天骏信息技术有限公司 用于推送信息的方法和装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1828632A (zh) * 2005-02-28 2006-09-06 株式会社东芝 目标检测装置、学习装置、目标检测系统及目标检测方法
CN101794392A (zh) * 2009-01-09 2010-08-04 索尼公司 对象检测设备、学习设备、对象检测方法和程序
CN102165488A (zh) * 2008-09-24 2011-08-24 佳能株式会社 用于选择用于分类输入数据的特征的信息处理设备
CN103793714A (zh) * 2012-10-26 2014-05-14 卡西欧计算机株式会社 多分类识别器、数据识别装置、多分类识别方法及数据识别方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10254903A (ja) * 1997-03-14 1998-09-25 Omron Corp 画像検索方法および装置
JP4606779B2 (ja) * 2004-06-07 2011-01-05 グローリー株式会社 画像認識装置、画像認識方法およびその方法をコンピュータに実行させるプログラム
JP2009080556A (ja) * 2007-09-25 2009-04-16 Seiko Epson Corp 設定方法、識別方法及びプログラム
JP4629118B2 (ja) * 2008-03-03 2011-02-09 株式会社日立ハイテクノロジーズ 欠陥検査装置およびこの欠陥検査装置に用いるパラメータ調整方法。
JP4670976B2 (ja) * 2008-10-03 2011-04-13 ソニー株式会社 学習装置および方法、認識装置および方法、プログラム、並びに記録媒体

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1828632A (zh) * 2005-02-28 2006-09-06 株式会社东芝 目标检测装置、学习装置、目标检测系统及目标检测方法
CN102165488A (zh) * 2008-09-24 2011-08-24 佳能株式会社 用于选择用于分类输入数据的特征的信息处理设备
CN101794392A (zh) * 2009-01-09 2010-08-04 索尼公司 对象检测设备、学习设备、对象检测方法和程序
CN103793714A (zh) * 2012-10-26 2014-05-14 卡西欧计算机株式会社 多分类识别器、数据识别装置、多分类识别方法及数据识别方法

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JP2016110626A (ja) 2016-06-20
JP6616645B2 (ja) 2019-12-04
CN105654108A (zh) 2016-06-08

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