CN105651173A - 3D measuring method and system - Google Patents

3D measuring method and system Download PDF

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Publication number
CN105651173A
CN105651173A CN201610113222.3A CN201610113222A CN105651173A CN 105651173 A CN105651173 A CN 105651173A CN 201610113222 A CN201610113222 A CN 201610113222A CN 105651173 A CN105651173 A CN 105651173A
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testee
information
view data
tested view
data
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题晶
杜青琳
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

Abstract

The invention discloses a 3D measuring method and system. The method can include the steps that measured image data of the surface of a measured object is de-noised, and phase information of the measured image data is obtained; based on reference image data, the phase information of the measured image data is corrected, and corrected phase information is obtained; the corrected phase information is subjected to phase analysis, and 3D data of the surface of the measured object is obtained; based on the 3D data of the surface of the measured object, surface information of the measured object is obtained and analyzed.

Description

3D measuring method and system
Technical field
The present invention relates to a kind of 3D measuring method, more particularly, to 3D measuring method and the system of a kind of high speed.
Background technology
Along with the quick growth of the total length in road, bridge, railway and tunnel, need to spend increasing human and material resources and financial resources to the measurement of damaged condition of road and bridge etc. and maintenance accordingly. Current measurement technology mainly has manual measurement and automatically measures, and the speed of manual measurement is slow, gathers data and does not have seriality, and precision also can not meet demand, it is impossible to is enough well adapted for increasing need; And automatic measurement technology, especially 3D measures technology, is continuously developed in recent years. Traditional 3D measurement has contact, laser scanning, Probing pen contactant surface to measure, or the 3d space information etc. with the comprehensive scanning testee of laser scanner.
Inventor have found that, existing 3D measures technology and quickly measuring of large area object (such as road and bridge etc.) is existed limitation, and speed is subject to very big constraint. Therefore, it is necessary to develop 3D measuring method and the system of a kind of high speed.
The information being disclosed in disclosure background section is merely intended to deepen the understanding of general background technology of this disclosure, and is not construed as admitting or imply in any form that this information structure is for prior art known in those skilled in the art.
Summary of the invention
Present disclosure proposes a kind of 3D measuring method and system, it can gather the view data on testee surface and carry out processing and analyzing, it is achieved that the high speed of large area body surface is measured.
One side according to the disclosure, it is proposed that a kind of 3D measuring method, described method may include that the tested view data to testee surface carries out denoising, it is thus achieved that the phase information of tested view data; Based on reference image data, it is corrected processing to the phase information of tested view data, it is thus achieved that calibrated phase information; Calibrated phase information is carried out Phase-Resolved Analysis, it is thus achieved that the 3D data on testee surface; And the 3D data based on testee surface, it is thus achieved that the surface information of testee, and the surface information of testee is analyzed.
According to another aspect of the present disclosure, it is proposed that a kind of 3D measures system, and described system may include that transmitter unit, and it is by the surface of project structured light to testee; Collecting unit, it gathers the tested view data that the surface from testee is reflected; And processing unit, described tested view data is processed and analyzes by it.
Disclosed method and device have other characteristic and advantage, these characteristics and advantage will be apparent from from the accompanying drawing being incorporated herein and specific embodiment subsequently, or stating in detail in the accompanying drawing being incorporated herein and specific embodiment subsequently, these the drawings and specific embodiments are provided commonly for explaining the certain principles of the disclosure.
Accompanying drawing explanation
In conjunction with the drawings disclosure exemplary embodiment is described in more detail, above-mentioned and other purpose, feature and the advantage of the disclosure will be apparent from, wherein, in disclosure exemplary embodiment, identical reference number typically represents same parts.
Fig. 1 illustrates the flow chart of the step of the 3D measuring method according to the disclosure.
Fig. 2 illustrates the schematic diagram of the frequency domain information of the tested view data of an embodiment according to the disclosure.
Fig. 3 illustrates the schematic diagram that frequency domain information is filtered of an embodiment according to the disclosure.
Fig. 4 illustrates that the 3D according to the disclosure measures the schematic diagram of system.
Detailed description of the invention
It is more fully described the disclosure below with reference to accompanying drawings. Although accompanying drawing shows preferred embodiment of the present disclosure, however, it is to be appreciated that may be realized in various forms the disclosure and should do not limited by embodiments set forth here. On the contrary, it is provided that these embodiments are to make the disclosure more thorough and complete, and the scope of the present disclosure can intactly convey to those skilled in the art.
Embodiment 1
Fig. 1 illustrates the flow chart of the step of the 3D measuring method according to the disclosure.
As it is shown in figure 1, according to embodiment of the disclosure, it is provided that a kind of 3D measuring method, the method may include that step 101, the tested view data on testee surface is carried out denoising, it is thus achieved that the phase information of tested view data; Step 102, based on reference image data, is corrected processing to the phase information of tested view data, it is thus achieved that calibrated phase information; Step 103, carries out Phase-Resolved Analysis to calibrated phase information, it is thus achieved that the 3D data on testee surface; And step 104, based on the 3D data on testee surface, it is thus achieved that the surface information of testee, and the surface information of testee is analyzed.
This embodiment is by carrying out denoising, correction and Phase-Resolved Analysis to tested view data, thus obtaining and analyze the surface information of testee, it is achieved the high speed 3D on testee surface measures.
Concrete steps the following detailed description of the 3D measuring method according to the disclosure.
Denoising
In one example, it is possible to the tested view data on testee surface is carried out denoising, it is thus achieved that the phase information of tested view data.
In one example, denoising may include that and described tested view data is carried out Fourier transformation, it is thus achieved that the frequency domain information of described tested view data; Described frequency domain information is filtered, it is thus achieved that through the frequency domain information of denoising; And the frequency domain information through denoising is carried out inversefouriertransform, it is thus achieved that the time-domain information of tested view data, and then obtain the phase information of tested view data. Wherein, the phase information of described tested view data can be expressed as:
Ω ( x , y ) = arctan { i m a g [ c ( x , y ) ] r e a l [ c ( x , y ) ] } - - - ( 1 )
Wherein, (x, y) can represent the time-domain information of tested view data to c, imag [c (x, y)] c (x, imaginary part y) can be represented, real [c (x, y)] c (x, real part y) can be represented.
Specifically, it is possible to by project structured light to testee surface, such that it is able to gather the view data with interference fringe from the reflection of testee surface, it can be used as tested view data, described structured light can be the fringe light after optical grating diffraction. Wherein, point in tested view data (x, y) light intensity at place can be expressed as:
I (x, y)=Ib(x,y)+Ic(x,y)*cos(2��fx0x+2��fy0y+��(x,y)(2)
Wherein, (x, y) can represent point (x, y) light intensity at place to I;Ib(x, y) can represent the brightness (brightness) of background; Ic(x, y) can represent the contrast of interference fringe; (x, y) can represent phase information to ��, and it can represent the three-dimensional information of object; fx0And fy0Can represent in the x and y direction carry frequency (carrierfrequency).
Euler's formula (Euler ' sformula :) is adopted to convert formula (1), it is possible to obtain:
I ( x , y ) = I b ( x , y ) + C ( x , y ) e i ( 2 πf x 0 x + 2 πf y 0 y ) + C * ( x , y ) e - i ( 2 πf x 0 x + 2 πf y 0 y ) - - - ( 3 )
C ( x , y ) = 1 2 I c ( x , y ) e iΩ ( x , y ) - - - ( 4 )
Wherein, C*(x y) can represent plural number C (x, conjugate function y).
Fig. 2 illustrates the schematic diagram of the frequency domain information of the tested view data of an embodiment according to the disclosure, and wherein transverse axis is for carrying frequency f, and the longitudinal axis is amplitude A. As shown in Figure 2, it is possible to adopt fast Fourier transform, tested view data is converted to frequency domain from time domain, it is thus achieved that the frequency domain information of tested view data, wherein C*(f+f0,y)��C(f-f0, y) (f y) can represent the function corresponding to each waveform respectively with A. Formula (3) is carried out fast Fourier transform, it is possible to obtain:
I ~ ( f x , f y ) = I ~ b ( f x , f y ) + C ~ ( f x - f x 0 , f y - f y 0 ) + C * ( f x + f x 0 , f y + f y 0 ) - - - ( 5 )
Wherein,And C*(fx+fx0,fy+fy0) can represent respectively the I after being fourier transformed (x, y), Ib(x, y), C (x, y) and C*(x, y), fx,fyThe frequency f component in x and y direction can be represented respectively.
It is then possible to described frequency domain information is filtered, it is thus achieved that through the frequency domain information of denoisingFig. 3 illustrates the schematic diagram that frequency domain information is filtered of an embodiment according to the disclosure, H (f-f0, the y) threshold function table of the wave filter that expression is set. As shown in Figure 3, the distribution situation (as shown in Figure 2) of the frequency domain according to testee and the function of formula (5), can according to required final technical parameter (reserved high-frequency or low-frequency information), design corresponding filter function, the object information that to be retained in frequency domain useful, removes the noise components in frequency domain.
In one example, frequency domain information being filtered may include that, employing is looked for automatically and takes peak value formula wave filter and automatically look for the number and position that take peak value in frequency domain, retain effective frequency domain information. With reference to Fig. 3, can adopt automatically to look for and take peak value formula wave filter, it can look for the number and position that take peak value in frequency domain automatically, position (middle crest) according to D/C power produces a mask (mask), this mask can cover in the invalid noise on the middle crest left side, only retain the frequency domain information of the effective object in right side, to use as follow-up parsing. Automatically look for the use taking peak value formula wave filter to greatly facilitate the process of video image, compare and independent wave filter is manually set to facilitate a lot.
It is then possible to the frequency domain information through denoising is carried out inversefouriertransform, it is thus achieved that through the tested view data of denoising. Adopt inversefouriertransform, it is possible to by the frequency domain information through denoisingAgain be converted to time-domain information c (x, y), then can obtain the phase information of tested view data:
Ω ( x , y ) = arctan { i m a g [ c ( x , y ) ] r e a l [ c ( x , y ) ] } - - - ( 1 )
Wherein, (x, y) can represent the phase information of tested view data to ��, imag [c (x, y)] c (x, imaginary part y) can be represented, real [c (x, y)] c (x, real part y) can be represented.
It practice, phase information �� in formula (5) (x, y) also includes other the phase information except object phase information simultaneously, and this brings very big inconvenience for Phase-Resolved Analysis. In order to only comprised the three-dimensional information of object self better, it is necessary to it is corrected.
Correction process
In one example, it is possible to based on reference image data, be corrected processing to the phase information of tested view data, it is thus achieved that calibrated phase information.
Specifically, before gathering the tested view data of object, the height according to object, at the extraction reference image data of acquisition plane, this reference image data can be used to be corrected, and removes the phase information beyond object.Through phase information �� (x, correction process y), it is possible to obtain calibrated phase information �� to formula (1)w(x,y)��
In addition it is also possible to by correcting anamorphose or the off-axis that the camera oneself factor removing a part brings, and photograph angular deflection etc.
Phase-Resolved Analysis
In one example, it is possible to calibrated phase information is carried out Phase-Resolved Analysis, it is thus achieved that the 3D data on testee surface.
In one example, Phase-Resolved Analysis may include that and adopts Unwrap method to carry out continuous treatment calibrated tested view data, it is thus achieved that continuous print phase information; Based on estriate tested view data, continuous print phase information is carried out phase transition, it is thus achieved that the 3D data on testee surface.
It practice, calibrated phase information ��w(x, y) is phase place discontinuous (wrapped), and its phase place is between [-��, ��], in order to remove the discontinuity of 2 ��, it is necessary to carry out continuous treatment, by phase information ��w(x y) converts continuous print (Unwrapped) phase information �� tou(x, y), as shown in formula (6):
��u(x, y)=��w(x,y)+2��k(6)
Wherein, k can be the integer quotient calculating 2 ��.
The unwrap algorithm that can adopt autonomous Design obtains continuous print phase information. It is to be understood by those skilled in the art that various serialization algorithm known in the art can be adopted to obtain continuous print phase information.
Then, based on estriate tested view data, continuous print phase information being changed, it is possible to obtain the 3D data on testee surface, these 3D data can include the quality information on testee surface. It is then possible to add the GPS coordinate information of testee in 3D data, in order to realize the location of testee.
In one example, it is possible to the measurement unit of continuous print phase information is converted to by rad radians the metric measure of standard.
Analytical table surface information
In one example, it is possible to based on the 3D data on testee surface, it is thus achieved that the surface information of testee, and the surface information of testee is analyzed.
In one example, the surface information analyzing described testee may include that the surface information based on described testee, it is judged that the degree of impairment of described testee, positions the damage position of described testee, and carries out result displaying. Wherein, the surface information of testee may include that the flexibility on testee surface; The quality on testee surface; The flatness on testee surface; The slight crack degree of depth on testee surface, length and volume information; And the damaged degree etc. on testee surface.
It practice, based on the 3D data on testee surface, it is possible to obtain the various surface informations of testee. Then can analyze the surface information of testee according to user's request, and carry out result displaying. Such as, when testee is road, bridge or track etc., it is possible to analyze the flexibility on testee surface; The quality on testee surface; The flatness on testee surface; The slight crack degree of depth on testee surface, length and volume information; And the damaged degree etc. on testee surface, thus judging the degree of impairment of road, bridge or track, orientated damage position, and the demand according to user carries out result displaying, thus reparation or maintenance for follow-up road, bridge or track provide reference.
It is to be understood by those skilled in the art that be only above the example of the surface information to testee, it is not restricted to this, it is possible to the various surface informations of testee known in the art are analyzed and are shown.
In one example, it is also possible to the 3D data on testee surface are carried out post analysis process, for instance, it is possible to 3D data and GPS based on testee surface position information, formulate the class information of maintenance plan level evaluation;The road conditions in one or more region or the management data base of state owned property can be set up, it is achieved data sharing and data retrieval etc.
It will be understood by those skilled in the art that the description of embodiment of this disclosure above only for the purpose of the beneficial effect that embodiment of the disclosure exemplarily is described, be not intended to be limited to given any example by embodiment of the disclosure.
Embodiment 2
Fig. 4 illustrates that the 3D according to the disclosure measures the schematic diagram of system.
As shown in Figure 4, according to embodiment of the disclosure, it is provided that a kind of 3D measures system, and described system may include that transmitter unit 401, collecting unit 402 and processing unit 403. Transmitter unit 401 can by the surface of project structured light to testee; Collecting unit 402 can gather the tested view data reflected from the surface of testee; Tested view data can be processed and analyze by processing unit 403.
This embodiment can to the collection of the view data of testee and process, it is thus achieved that the surface information of testee, it is achieved the high speed 3D on testee surface measures.
In one example, transmitter unit 401 can include light source, grating assembly and support (Support) assembly. The light that light source sends is via the structured light produced after grating assembly with interference fringe, and projects on the surface of testee; Support light source and described grating assembly described in modular support. Preferably, when adopting non-visible light, this light source can be infrared ray, it is possible to regulate the parameter such as brightness and contrast of light source by regulating the intensity of light source; The light sent from light source is via the structured light produced after grating assembly with interference fringe, and projects on the surface of testee: a support component can support light source and grating assembly, it is possible to regulate the position of light source and grating assembly by regulating a support component. When adopting visible ray, transmitter unit 401 can include DLP projecting subassembly and control assembly. Wherein, the light with interference fringe can be projected on the surface of testee by DLP projecting subassembly; Control assembly and can regulate the density etc. of background luminance, light intensity and interference fringe, to ensure certainty of measurement.
In one example, collecting unit 402 can gather the tested view data reflected from the surface of testee. After transmitter unit 401 projects light onto on the surface of testee, collecting unit 402 can be passed through and gather the tested view data of the interference fringe with deformation reflected from the surface of testee, that is, the view data of structured light that testee surface deforms upon according to the planform of object. Collecting unit 402 can include CCD or CMOS camera, it is possible to adopts the dynamic industrial camera of high definition.
In one example, 3D according to the disclosure measures system can also include lock unit, the frequency acquisition of collecting unit 402 can be adjusted to the function of tranmitting frequency of transmitter unit 401 by it, and the transmitting of transmitter unit 401 and the collection of collecting unit 402 are synchronized.
Specifically, it is possible to by lock unit, the frequency acquisition of collecting unit 402 is adjusted to the function of the tranmitting frequency of transmitter unit 401, for instance, frequency acquisition is 2 times of tranmitting frequency, and makes the transmitting of transmitter unit 401 and collecting unit 402 and gather synchronization. So so that after collecting unit 402 often gathers the frame tested view data with interference fringe, it is possible to collecting a frame does not have the tested view data of interference fringe.The tested view data not having interference fringe gathered can retain the 2D information of testee (such as well, by the quality of altimetric image, color etc.), it is possible in follow-up process, use the conversion not having the tested view data of interference fringe to realize 3D data; Reference image data can be obtained, it is possible to use reference image data to be corrected processing in follow-up process based on the tested view data not having interference fringe. Additionally, arrange lock unit to may also operate as the effect of power and energy saving.
It will be appreciated by those skilled in the art that the disclosure is not restricted to this, it is possible to frequency acquisition is set as the arbitrary function of tranmitting frequency, thus gather with interference fringe and the tested view data not having interference fringe simultaneously.
In one example, tested view data can be processed and analyze by processing unit 403. Wherein, tested view data is processed and analyzes and may include that the tested view data to testee surface carries out denoising by processing unit, it is thus achieved that the phase information of tested view data; Based on reference image data, it is corrected processing to the phase information of tested view data, it is thus achieved that calibrated phase information; Calibrated phase information is carried out Phase-Resolved Analysis, it is thus achieved that the 3D data on testee surface; And the 3D data based on testee surface, it is thus achieved that the surface information of testee, and the surface information of testee is analyzed.
In one example, it is also possible to 3D of this disclosure measures system and carries out hardware corrected. The hardware corrected correction that can include camera itself, removes the anamorphose that brings of camera oneself factor or off-axis etc. The hardware corrected 3D that can also include measures the correction of system, for example, it is possible to transmitter unit 401 and collecting unit 402 are exchanged, it is possible to adjust transmitting and the acquisition angles of transmitter unit 401 and collecting unit 402, reversible to guarantee the light path launched and gather, reduce issuable anamorphose.
Further, it is also possible to set the various parameters of the 3D measurement system of the disclosure by processing unit 403, various parameters may include that systematic parameter, such as light path design parameter, machinery design parameter; Hardware parameter, such as, the transmitting of the camera parameter of collecting unit 402, the proj ector parameters of transmitter unit 401, transmitter unit 401 and collecting unit 402 and collection angle parameter etc.; And software parameter, such as GUI etc.
It will be understood by those skilled in the art that the description of embodiment of this disclosure above only for the purpose of the beneficial effect that embodiment of the disclosure exemplarily is described, be not intended to be limited to given any example by embodiment of the disclosure.
Being described above the presently disclosed embodiments, described above is illustrative of, and non-exclusive, and it is also not necessarily limited to disclosed each embodiment. When not necessarily departing from the scope and spirit of illustrated each embodiment, many modifications and changes will be apparent from for those skilled in the art. The selection of term used herein, it is intended to explain the principle of each embodiment, practical application or the improvement to the technology in market best, or make other those of ordinary skill of the art be understood that each embodiment disclosed herein.

Claims (10)

1. a 3D measuring method, including:
The tested view data on testee surface is carried out denoising, it is thus achieved that the phase information of tested view data;
Based on reference image data, it is corrected processing to the phase information of tested view data, it is thus achieved that calibrated phase information;
Calibrated phase information is carried out Phase-Resolved Analysis, it is thus achieved that the 3D data on testee surface; And
3D data based on testee surface, it is thus achieved that the surface information of testee, and the surface information of testee is analyzed.
2. 3D measuring method according to claim 1, wherein, denoising includes:
Described tested view data is carried out Fourier transformation, it is thus achieved that the frequency domain information of described tested view data;
Described frequency domain information is filtered, it is thus achieved that through the frequency domain information of denoising; And
Frequency domain information through denoising is carried out inversefouriertransform, it is thus achieved that the time-domain information of tested view data, and then obtains the phase information of tested view data,
Wherein, the phase information of described tested view data is expressed as:
Ω ( x , y ) = arctan { i m a g [ c ( x , y ) ] r e a l [ c ( x , y ) ] } ,
Wherein, (x, y) represents the time-domain information of tested view data to c, and imag [c (x, y)] represents that (real [c (x, y)] represents c (x, real part y) to c for x, imaginary part y).
3. 3D measuring method according to claim 2, wherein, is filtered including to described frequency domain information: adopts automatically to look for and takes peak value formula wave filter and automatically look for the number and position that take peak value in frequency domain, retains effective frequency domain information.
4. 3D measuring method according to claim 1, wherein, Phase-Resolved Analysis includes:
Unwrap method is adopted to carry out continuous treatment calibrated tested view data, it is thus achieved that continuous print phase information;
Based on estriate tested view data, continuous print phase information is carried out phase transition, it is thus achieved that the 3D data on testee surface.
5. 3D measuring method according to claim 1, wherein, the surface information analyzing described testee includes:
Surface information based on described testee, it is judged that the degree of impairment of described testee, positions the damage position of described testee, and carries out result displaying.
6. 3D measuring method according to claim 1, wherein, the surface information of described testee includes: the flexibility on testee surface; The quality on testee surface; The flatness on testee surface; The slight crack degree of depth on testee surface, length and volume information; And the damaged degree on testee surface.
7. 3D measures a system, including:
Transmitter unit, it is by the surface of project structured light to testee;
Collecting unit, it gathers the tested view data that the surface from testee is reflected; And
Processing unit, described tested view data is processed and analyzes by it.
8. 3D according to claim 7 measures system, also includes:
Lock unit, the frequency acquisition of described collecting unit is adjusted to the function of tranmitting frequency of described transmitter unit and launching of described transmitter unit is synchronized with the collection of described collecting unit by it.
9. 3D according to claim 7 measures system, and wherein, described transmitter unit includes:
Light source;
Grating assembly, the light that described light source sends is via the structured light produced after described grating assembly with interference fringe, and projects on the surface of testee; And
Prop up support component, support described light source and described grating assembly.
10. 3D according to claim 7 measures system, and wherein, described tested view data is processed described processing unit and analysis includes:
The tested view data on testee surface is carried out denoising, it is thus achieved that the phase information of tested view data;
Based on reference image data, it is corrected processing to the phase information of tested view data, it is thus achieved that calibrated phase information;
Calibrated phase information is carried out Phase-Resolved Analysis, it is thus achieved that the 3D data on testee surface; And
3D data based on testee surface, it is thus achieved that the surface information of testee, and the surface information of testee is analyzed.
CN201610113222.3A 2016-02-29 2016-02-29 3D measuring method and system Pending CN105651173A (en)

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Publication number Priority date Publication date Assignee Title
CN107221025A (en) * 2017-05-31 2017-09-29 天津大学 A kind of synchronous system and method for obtaining body surface three-dimensional colour point clouds model
CN107221025B (en) * 2017-05-31 2020-01-03 天津大学 System and method for synchronously acquiring three-dimensional color point cloud model of object surface
CN112381731A (en) * 2020-11-12 2021-02-19 四川大学 Single-frame stripe image phase analysis method and system based on image denoising

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Application publication date: 20160608