CN105631070A - Method used for evaluating probability for space device to generate single event effect - Google Patents

Abstract

The invention discloses a method used for evaluating a probability for a space device to generate a single event effect. The method comprises the following steps: utilizing data which is actually measured by a high-energy proton detector as continuous dynamic input, utilizing a particle transport tool to calculate the firing ranges of different energy particles in a satellite structure material, and combining with the relevant parameters of the space device which needs to be evaluated; then, according to the spatial flux spectrum input by high-energy particles, combining with the depth relationship of the particle in the satellite structure material to calculate the spatial flux spectrum of the high-energy particles on a target position, combining with a relationship among the probabilities for the space device to generate the single event effect under different energies after the spatial flux spectrum of the target position is obtained; and finally, obtaining a total probability for generating the single event effect on the target position in the space device.

Description

A kind of method of the probability for assessing space device generation single event effects

Technical field

The present invention relates to satellite space radiation environment effect protection management field in-orbit, a kind of method particularly relating to probability for assessing the space device generation single event effects that earth low orbit radiation belt proton causes.

Background technology

Satellite all can be caused radiation effect to endanger by the key elements such as the high energy electron of space radiation environment, high energy proton and heavy ion, wherein satellite can be caused radiation dose, charge effects by high energy electron, high energy proton and heavy ion then also can cause an other class radiation effect, are also referred to as single event effects (SingleEventEffect-SEE).

Space Particle can lose energy owing to being subject to the resistance of atomic nucleus and electron outside nucleus formation in the process pass through material, and the energy lost will be transferred to the material blocking it, the energy being transferred to retardance material in unit is referred to as linear energy transfer (LinearEnergyTransfer-LET), this may result in space device generation single event effects when LET value exceedes certain value. Show single event effects according to the harm in the device of space and be divided into single-particle inversion, single-particle locking, single-ion transient state etc. The satellite operating in terrestrial space can be subjected to the irradiation of ultra rays heavy ion and radiation belt proton, heavy ion and proton can cause the single event effects of space device, wherein radiation belt proton by producing heavy ion with satellite material generation nuclear reaction, will in turn result in the space device generation single event effects in satellite.

If the space device generation single event effects in satellite, light then cause the upset of Digital Logic position, such as by " 0 " change " 1 " or by " 1 " change " 0 ", interfere, heavy then cause space device to burn, causing unit fault, even whole star fault, the former is referred to as Single event upset effecf (SingleEventUpset-SEU), and the latter is referred to as single-particle ablation process (SingleEventBurnout-SEB).

Owing to satellite can be interfered harm by satellite generation single event effects, therefore, in satellite development stage, in-orbit management and fault diagnosis stage afterwards, the assessment carrying out the probability to satellite spatial device generation single event effects is the important means of the harm that a kind of reduction causes due to single event effects.

Summary of the invention

It is an object of the invention to, the harm of the single event effects that the space device applied in-orbit in order to avoid satellite causes due to Spacial Proton and assess the probability that this event effect occurs, the present invention provides a kind of method of probability for assessing space device generation single event effects.

For achieving the above object, the present invention proposes a kind of method of probability for assessing space device generation single event effects, the method utilizes data that high-energy proton detector surveys as continuing dynamically to input, PARTICLE TRANSPORT FROM instrument is utilized to calculate different-energy particle range in satellite structural materials, and the relevant parameter of the space device in conjunction with needs assessment, thereafter calculate high energy particle according to the spatial flux spectrum of high energy particle input in conjunction with particle depth relationship in satellite structural materials to compose at the spatial flux of target location, after obtaining the spatial flux spectrum of target location, in conjunction with relation between the probability of space device generation single event effects under different-energy, finally obtain and be in, in target location, the total probability that single event effects occurs in the device of space.

Specifically comprise the following steps that

Step 1: utilize PARTICLE TRANSPORT FROM emulation tool to calculate energy-range relation and the range-energy relation of the Space Particle of the different-energy incident degree of depth in satellite structure material;

Step 2: obtain space device and blocked the degree of depth, refers to the space device degree of depth from satellite surface " by blocking the degree of depth " here;

Step 3: obtain the parameter of space device to be assessed, including ��_sat��L_1/eOr ��_sat��L_th, W, S, space device parameters is obtained by ground experiment or numerical simulation,

Wherein: ��_satFor the saturated cross section of single event effects probability of happening,

L_1/eCorresponding energy point during for the near 1/e in cross section of single event effects probability of happening, e be from

The right logarithm truth of a matter,

L_th, W, S be the coefficient value of probability-distribution function Weibull;

Step 4: the flux data of the Space Particle in one evaluation time section of acquisition is as input space environmental data at predetermined intervals;

Step 5: flux data step 4 obtained is redeveloped into differential energy spectrum according to the power law relation between flux and its energy of particle;

Step 6: according to step 1 obtained different-energy particle energy-depth relationship after penetrating different depth satellite structure material, the degree of depth and the parameter of the given next space device to be assessed of step 3 is blocked according to the given next space device of step 2, and give particle Differential Spectrum out according to step 5, utilize formula below to calculate space device at the probability that single event effects does not occur in the same time:

Wherein, i represents energy point, and E represents particle energy,For the energy vectors of Space Particle,It is vectorial for Space Particle Flux Spectrum,Space Particle flux Differential Spectrum for satellite structure degree of depth x place is vectorial,For particle energy-range relation vector,For the particle energy vectors at satellite structure degree of depth x place,For particle energy-range relation vector,Cross section for space device generation single event effects is vectorial,For the probability of different-energy space of points device generation single event effects, f_SEEThe probability summation of single event effects is at a time there is in (t) for space device,

Wherein,�� by different-energy point_SEEI () forms, the �� of single energy point_SEEI the computational methods of () are determined according to the parameter of the space device obtained:

If obtaining the �� of space device_satAnd L_1/e, then adopt and calculate following equation:

${\mathrm{\σ}}_{\mathrm{SEE}}\left(i\right)={\mathrm{\σ}}_{\mathrm{sat}}\·\exp [-\left(L_{\frac{1}{e}}\right)/E_p\left(i\right))$

If obtaining the �� of space device_sat��L_th, W, S, then adopt calculate following equation:

${\mathrm{\&sigma;}}_{\mathrm{SEE}}\left(i\right)=\left\{\begin{array}{cc}{\mathrm{\&sigma;}}_{\mathrm{sat}}\&CenterDot;\{1-\exp [{\left(\frac{E_p\left(i\right)-L_{\mathrm{th}}}{W}\right)}^s\left]\right\}& E_p\left(i\right)\&GreaterEqual;L_{\mathrm{th}}\\ 0,& E_p\left(i\right)<L_{\mathrm{th}}\end{array}\right..$

Preferably, the method for the present invention also includes step 7: adopt Python or Matlab software result of calculation to be visualized.

According to one embodiment of present invention, described Space Particle is Spacial Proton.

According to still another embodiment of the invention, described Space Particle is space electronic.

As an embodiment of technique scheme, the energy section low side of described space electronic input less than or equal to 500keV, high-end be more than or equal to 2MeV less than 10MeV. Spacial Proton energy section low side is less than or equal to 10MeV, high-end be more than or equal to 10MeV.

According to one embodiment of present invention, the PARTICLE TRANSPORT FROM emulation tool in first step includes Geant4, MCNP and SRIM.

According to one embodiment of present invention, satellite structure material includes metallic aluminium, almag, and space device material includes silicon, germanium and GaAs.

The appraisal procedure of the present invention is suitable for all kinds of spacecrafts that terrestrial space runs, including the satellite of three-axis stabilization and spinning stability.

It is an advantage of the current invention that: for the demand studying the Space Particle harm distribution to satellite devices generation single event effects and prevention policies, method and technology, the appraisal procedure utilizing the probability of the satellite devices generation single event effects of the present invention is calculated and analyzes, according to the data of actual measurement Space Particle, the probability of device generation single event effects can be estimated, consequently facilitating apply at the engineering phase such as satellite engineering design, fault diagnosis, in-orbit management.

Accompanying drawing explanation

Fig. 1 is the flow chart of the method for the probability of the assessment space device generation single event effects of the present invention;

Fig. 2 is the distribution on global scatterplot of the FPGA device generation single-particle inversion probability utilizing appraisal procedure of the present invention to draw.

Detailed description of the invention

Below in conjunction with accompanying drawing and preferred embodiment, the method for a kind of probability for assessing space device generation single event effects of the present invention is described in detail, this embodiment is used as example with satellite structure material aluminum (Al) and illustrates

First, step 1: utilize energy-range relation and the range-energy relation of the Space Particle of the Geant4 computed in software different-energy incident degree of depth in material aluminum (Al), in this embodiment, it is possible to be form as shown in table 1.

Table 1 is Spacial Proton at the energy of metallic aluminum material transport process and degree of depth form pair.

Energy (MeV)	Range (mm)
		1.0	0.01438
2.0	0.04163
		...	...
50.0	10.75
		...	...
275.0	209.58
		300.0	242.04

Step 2: what obtain space device blocks the degree of depth. As demonstration example, in the present embodiment, satellite eyelid covering is using the equivalent thickness of the aluminum of 1mm as sample.

Step 3: choose the Weibull function system of the Single event upset effecf of the FPGA (field programmable gate array) of 1 section 4,000,000, �� as example_sat=3.8 �� 10^-14��L_th=3.0, W=12, S=0.5.

Step 4: choose the flux data of Space Particle of No. three satellites of track wind and cloud of sun-synchronous orbit as input, electronic data including 5 Ge Neng roads, wherein the energy of most mental retardation road electronics is more than 0.15MeV, and the energy of most high energy road electronics more than 2MeV less than 5.7MeV, the proton data in 6 Ge Neng roads, wherein the energy of most mental retardation road proton is more than 3MeV, the energy of most high energy road proton more than 100MeV less than 300MeV. Obtain a flux data at interval of 5 minutes, take 02 day to 2011 December of December in 2011 12 days as evaluation time section. In one embodiment, the energy section low side of described input high energy electron data is less than or equal to 500keV, high-end be more than or equal to 2MeV, and high energy proton energy section low side is less than or equal to 10MeV, high-end be more than or equal to 10MeV.

Step 5: the data obtained according to step 4, according to the relation between particle flux and its energy not being power law in the same time, if the particle flux data obtained are integral spectrum data, being then redeveloped into differential energy spectrum according to power law relation, the power spectrum after reconstruction is no less than 2 Ge Neng roads.

Step 6: the different-energy particle that foundation step 1 obtains energy-depth relationship after penetrating the satellite structure material (Al) of different depth, the parameter blocking space to be assessed device given by the degree of depth and step 3 according to space device given by step 2, and according to the particle differential energy spectrum that step 5 provides, utilize formula below to calculate space device at the probability that single event effects does not occur in the same time:

Wherein, i represents energy point, and E represents particle energy,For the energy vectors of Space Particle,It is vectorial for Space Particle Flux Spectrum,It is vectorial for the Space Particle flux Differential Spectrum at satellite structure material degree of depth x place,For particle energy-range relation vector,Make the energy vectors at degree of depth x place at satellite structure thing for particle,For particle energy-range relation vector,Cross section for space device generation single event effects is vectorial,For the probability of different-energy Dian Chu space device generation single event effects, f_SEEThe summation of the probability of single event effects is at a time there is in (t) for space device.

Wherein,�� by different-energy point_SEEI () forms, the �� of single energy point_SEEI the computational methods of () are determined according to the parameter of the space device obtained:

If obtaining the �� of space device_satAnd L_1/e, then adopt and calculate following equation (5):

${\mathrm{\&sigma;}}_{\mathrm{SEE}}\left(i\right)={\mathrm{\&sigma;}}_{\mathrm{sat}}\&CenterDot;\exp [-\left(L_{\frac{1}{e}}\right)/E_p\left(i\right))$

If obtaining the �� of space device_sat��L_th, W, S, then adopt calculate following equation (6):

${\mathrm{\&sigma;}}_{\mathrm{SEE}}\left(i\right)=\left\{\begin{array}{cc}{\mathrm{\&sigma;}}_{\mathrm{sat}}\&CenterDot;\{1-\exp [{\left(\frac{E_p\left(i\right)-L_{\mathrm{th}}}{W}\right)}^s\left]\right\}& E_p\left(i\right)\&GreaterEqual;L_{\mathrm{th}}\\ 0,& E_p\left(i\right)<L_{\mathrm{th}}\end{array}\right.$

According to one embodiment of present invention, also include step 7: adopt Python or Matlab result of calculation to be visualized, to facilitate analysis.

The appraisal procedure of the present invention is suitable for the assessment of the single event effects probability of happening of inside satellite classes of semiconductors space device. Additionally, the appraisal procedure of the present invention is suitable for terrestrial space runs all kinds of spacecrafts, including three-axis stabilization and spin stabilized satellite.

It should be noted last that, above example is only in order to illustrate technical scheme and unrestricted. Although the present invention being described in detail with reference to embodiment, it will be understood by those within the art that, technical scheme being modified or equivalent replacement, without departure from the spirit and scope of technical solution of the present invention, it all should be encompassed in the middle of scope of the presently claimed invention.

Claims (7)

1. the method for assessing the probability of space device generation single event effects, it is characterised in that including:

Step 1: utilize PARTICLE TRANSPORT FROM emulation tool to calculate energy-range relation and the range-energy relation of the Space Particle of the different-energy incident degree of depth in satellite structure material;

Step 2: obtain space device and blocked the degree of depth, refers to the space device degree of depth from satellite surface " by blocking the degree of depth " here;

Step 3: obtain the parameter of space device to be assessed, including ��_sat��L_1/eOr ��_sat��L_th, W, S, space device parameters is obtained by ground experiment or numerical simulation,

Wherein: ��_satFor the saturated cross section of single event effects probability of happening,

L_1/eCorresponding energy point during for the near 1/e in cross section of single event effects probability of happening, e be from

The right logarithm truth of a matter,

L_th, W, S be the coefficient value of probability-distribution function Weibull;

Step 4: the flux data of the Space Particle in one evaluation time section of acquisition is as input space environmental data at predetermined intervals;

Step 5: flux data step 4 obtained is redeveloped into differential energy spectrum according to the power law relation between flux and its energy of particle;

Step 6: according to step 1 obtained different-energy particle energy-depth relationship after penetrating different depth satellite structure material, the degree of depth and the parameter of the given next space device to be assessed of step 3 is blocked according to the given next space device of step 2, and give particle Differential Spectrum out according to step 5, utilize formula below to calculate space device at the probability that single event effects does not occur in the same time:

Wherein, i represents energy point, and E represents particle energy,For the energy vectors of Space Particle,It is vectorial for Space Particle Flux Spectrum,Space Particle flux Differential Spectrum for satellite structure degree of depth x place is vectorial,For particle energy-range relation vector,For the particle energy vectors at satellite structure degree of depth x place,For particle energy-range relation vector,Cross section for space device generation single event effects is vectorial,For the probability of different-energy space of points device generation single event effects, f_SEEThe probability summation of single event effects is at a time there is in (t) for space device,

Wherein,�� by different-energy point_SEEI () forms, the �� of single energy point_SEEI the computational methods of () are determined according to the parameter of the space device obtained:

If obtaining the �� of space device_satAnd L_1/e, then adopt computing formula following:

${\mathrm{\&sigma;}}_{\mathrm{SEE}}\left(i\right)={\mathrm{\&sigma;}}_{\mathrm{sat}}\&CenterDot;\exp [(L_{\frac{1}{e}}/E_p\left(i\right))$

If obtaining the �� of space device_sat��L_th, W, S, then adopt calculate following equation:

${\mathrm{\&sigma;}}_{\mathrm{SEE}}\left(i\right)=\left\{\begin{array}{cc}{\mathrm{\&sigma;}}_{\mathrm{sat}}\&CenterDot;\{1-\exp [-{\left(\frac{E_p\left(i\right)-L_{\mathrm{th}}}{W}\right)}^s\left]\right\},& E_p\left(i\right)\&GreaterEqual;L_{\mathrm{th}}\\ 0,& E_p\left(i\right)<L_{\mathrm{th}}\end{array}\right..$

2. the method for the probability for assessing space device generation single event effects according to claim 1, it is characterised in that also include:

Step 7: adopt Python or Matlab software result of calculation to be visualized.

3. the method for the probability for assessing space device generation single event effects according to claim 1 and 2, it is characterised in that the energy road number of described reconstruction power spectrum is no less than 2 roads, and namely energy is counted out no less than 2.

4. the method for the probability for assessing space device generation single event effects according to claim 1 and 2, it is characterised in that described input space particle is Spacial Proton, its can section low side less than or equal to 10MeV, high-end be more than or equal to 10MeV.

5. the method for the probability for assessing space device generation single event effects according to claim 1 and 2, it is characterized in that, described input space particle is space electronic, its can section low side less than or equal to 500keV, high-end be more than or equal to 2MeV less than 10MeV.

6. the method for the probability for assessing space device generation single event effects according to claim 1 and 2, it is characterised in that the PARTICLE TRANSPORT FROM emulation tool in step 1 includes Geant4, MCNP and SRIM.

7. the method for the probability for assessing space device generation single event effects according to claim 1 and 2, it is characterised in that satellite structure material includes metallic aluminium, almag, and space device material includes silicon, germanium and GaAs.