CN105629527B - A kind of probe block, detection device and display panel testing method - Google Patents
A kind of probe block, detection device and display panel testing method Download PDFInfo
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- CN105629527B CN105629527B CN201610007315.8A CN201610007315A CN105629527B CN 105629527 B CN105629527 B CN 105629527B CN 201610007315 A CN201610007315 A CN 201610007315A CN 105629527 B CN105629527 B CN 105629527B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention discloses a kind of probe block, detection device and display panel testing method, to solve in the prior art with the detection of the detection mode progress display panel of Drive IC combination COF, higher cost and the undesirable problem of detection effect.The probe block, including flexible circuit board, flexible circuit board includes the signal wire of several transmission detection signals, signal wire includes that the route in one end and liquid crystal display panel bonding wire disk overlaps the first signal wire and second signal line correspondingly, the other end and detection circuit board of first signal wire overlap, and the other end of second signal line is hanging；Flexible circuit board has positioned at the first Chip Area and the second Chip Area of non-end, first signal wire and second signal line are located at the exposure of the line segment in the first Chip Area and the second Chip Area, the line segment that first signal wire and second signal line are exposed is used to paste the patch being electrically connected by connecting line, so as to realize electrical connection between the first signal wire and second signal line of transmission same detection signal.
Description
Technical field
The present invention relates to field of display technology more particularly to a kind of probe blocks, detection device and display panel testing method.
Background technique
In liquid crystal display panel manufacturing process, molding process is that the color film glass that will be completed and array glass paste
It closes, obtains the liquid crystal display panel of specific dimensions after cutting, to reduce cost, most producer's selections are after at box, patch light polarizing film
It is preceding that lighting inspection is carried out to panel, it can detecte out whether liquid crystal display panel has bad point in this stage, such as: bright spot or dim spot.
Existing probe block design combines flip chip (Chip On using special drive integrated circult (Drive IC) at present
Film, COF) realize signal extension.As shown in Figure 1, when lighting checks liquid crystal display panel 100 is fixed on checks on base station first,
The bonding wire disk (not shown) of flip chip 102 and liquid crystal display panel 100 in probe block 121 is overlapped, in such flip chip
Signal line and liquid crystal display panel connection, wherein COF refers to integrated circuit (Integrated Circuit, IC) is solid
Due to the crystal grain mantle in flexible circuit board.It include a plurality of connecting line 111, flexible circuit board (Flexible in COF 102
Printed Circuit Board, FPC) it include a plurality of connecting line 112 in 101, connecting line 111 and connecting line 112 correspond
Connection, when carrying out lighting inspection to liquid crystal display panel, the signal generator 122 connecting with FPC 101 is to each in FPC 101
112 input signal of connecting line lights liquid crystal display panel.
But the detection mode of present technology, specific Drive IC combination COF, therefore higher cost are needed, and
The delicate joint of Drive IC and FPC are unsatisfactory, and influence liquid crystal display panel lights detection effect.
Summary of the invention
The object of the present invention is to provide a kind of probe block, detection device and display panel testing methods, to solve existing skill
Carry out the detection of display panel in art with the detection mode of specific Drive IC combination COF, higher cost and detection effect is paid no attention to
The problem of thinking.
The purpose of the present invention is what is be achieved through the following technical solutions:
The embodiment of the present invention provides a kind of probe block, including flexible circuit board, and the flexible circuit board includes several biographies
The signal wire of defeated detection signal, the signal wire include the first signal wire and second signal line, each first signal wire and each
One end of the second signal line is overlapped with the route in liquid crystal display panel bonding wire disk correspondingly respectively, first signal wire
The other end and detection circuit board overlap, the other end of the second signal line is hanging；
The flexible circuit board have positioned at non-end the first Chip Area and the second Chip Area, first signal wire and
The second signal line be located at the line segment in first Chip Area and second Chip Area exposure, first signal wire and
The line segment that the second signal line is exposed is used to paste the patch being electrically connected by connecting line, so that transmission same detection signal
Electrical connection is realized between first signal wire and the second signal line.
In the present embodiment, by making the flexible circuit board of the probe block that there is exposure first signal wire and described the
First Chip Area of binary signal line and second patch, to make line segment and the institute for first signal wire being exposed
State second signal line line segment can directly paste by pre-provisioning request be electrically connected patch, realize with first signal wire and
At least one matched the second signal line transmits identical detection signal, does not need specific Drive IC combination COF technology, drops
Low cost；Meanwhile being attached with mount technology, there is good conduction, improve detection effect.
Preferably, the probe block further includes equal several first patches and several second patches of quantity, each described
First patch is used to be covered on the exposure of corresponding first signal wire in first Chip Area and/or the second signal line
Line segment on, each second patch is for being covered on corresponding first signal wire in second Chip Area and/or institute
On the line segment for stating the exposure of second signal line；
Each first patch passes through connecting line with each second patch correspondingly and is electrically connected, and by same
First patch and second patch of one connecting line electrical connection respectively correspond first signal wire and
One second signal line；Or first patch and second patch being electrically connected by connecting line described in same
Respectively correspond the second signal line of different two.
In the present embodiment, the line of first signal wire with first Chip Area and second patch exposure is provided
Section patch corresponding with the line segment of the second signal line.
Preferably, all first signal wire is the first signal line group, and all the second signal line is second signal
Line group, first signal line group and the second signal line group are without intersection；
Corresponding all described first signal wire in first Chip Area and all the second signal line, second patch
Area only corresponds to the second signal line；Alternatively, first Chip Area only corresponds to the second signal line, second Chip Area
Corresponding all described first signal wire and all the second signal line.
Preferably, all first signal wire is divided into two the first signal line groups, and all the second signal line is
Second signal line group；The second signal line group is located between two first signal line groups, and with first signal wire
Group is without intersection；
Whole first signal wire in corresponding first signal line group in first Chip Area and described the
The whole of the binary signal line group second signal line, second Chip Area correspond to complete in another described first signal line group
The whole of first signal wire described in portion and the second signal line group second signal line；Alternatively,
Corresponding all described first signal wire in first Chip Area and all the second signal line, second patch
Area only corresponds to all second signal lines.
Preferably, the length of first signal wire and detection circuit board overlapped one end is beyond the second signal line
Hanging one end.
Preferably, the item number of the second signal line is greater than or equal to the item number of first signal wire.
Preferably, the figure of the exposure of signal wire described in each in first Chip Area and second Chip Area is
Rectangle.
Preferably, the material of the signal wire be copper, aluminium, platinum, gold and silver in any one or at least two mixing
Metal.
The embodiment of the present invention has the beneficial effect that: by making the flexible circuit board of the probe block have exposure described first
First Chip Area and second patch of signal wire and the second signal line, to make first letter being exposed
Number line segment of line and the line segment of the second signal line can directly paste the patch being electrically connected by pre-provisioning request, realize with described
First signal wire and the matched at least one second signal line transmit identical detection signal, do not need specific Drive IC
In conjunction with COF technology, reduce costs；Meanwhile being attached with mount technology, there is good conduction, improve detection effect.
The embodiment of the present invention provides a kind of detection device, including providing the detection circuit board of detection signal with as described above
Probe block.
The embodiment of the present invention has the beneficial effect that: by making the flexible circuit board of the probe block have exposure described first
First Chip Area and second patch of signal wire and the second signal line, to make first letter being exposed
Number line segment of line and the line segment of the second signal line can directly paste the patch being electrically connected by pre-provisioning request, realize with described
First signal wire and the matched at least one second signal line transmit identical detection signal, do not need specific Drive IC
In conjunction with COF technology, reduce costs；Meanwhile being attached with mount technology, there is good conduction, improve detection effect.
The embodiment of the present invention provides a kind of display panel testing method, and using detection device as described above, method includes:
It provides quantity equal several first patches and several second patches, each first patch is covered on described
On the line segment of the exposure of corresponding first signal wire in first Chip Area and/or the second signal line, by each described
Two patches are covered on the line segment of the exposure of corresponding first signal wire in second Chip Area and/or the second signal line
On；Wherein, each first patch passes through connecting line with each second patch correspondingly and is electrically connected, and by same
First patch and second patch of one connecting line electrical connection respectively correspond first signal wire and
One second signal line, alternatively, first patch and second patch by the electrical connection of connecting line described in same
Piece respectively corresponds the second signal line of different two；
Detection signal is provided to the first signal wire described in each, transmits the detection signal by first signal wire
Route into overlapped the liquid crystal display panel bonding wire disk of the first signal wire described in this, and the detection signal is transmitted to and the institute
Stating first patch pasted on the first signal wire or second patch has at least the one of direct or indirect connection relationship
Second signal line described in item makes the detection signal be transmitted to this described at least one as at least one second signal line
Route in second signal line overlapped liquid crystal display panel bonding wire disk.
The embodiment of the present invention has the beneficial effect that: by making the flexible circuit board of the probe block have exposure described first
First Chip Area and second patch of signal wire and the second signal line, to make first letter being exposed
Number line segment of line and the line segment of the second signal line can directly paste the patch being electrically connected by pre-provisioning request, realize with described
First signal wire and the matched at least one second signal line transmit identical detection signal, utilize probe block described above
It is detected, is not needed specific Drive IC combination COF technology, reduce costs；Meanwhile the institute being attached with mount technology
The first signal wire and the second signal line are stated, there is good conduction, improves detection effect.
Detailed description of the invention
Fig. 1 is the structural schematic diagram that the probe block that the prior art provides is used for display panel lighting detection；
Fig. 2 is the structural schematic diagram of the first probe block provided in an embodiment of the present invention；
Fig. 3 is the structural schematic diagram of the set patch in the first probe block provided in an embodiment of the present invention；
Fig. 4 is the schematic diagram on the line segment for the exposure that set patch shown in Fig. 3 is covered on probe block shown in Fig. 2；
Fig. 5 is the arrangement mode and Chip Area combination of signal wire in the first probe block provided in an embodiment of the present invention
Schematic diagram；
Fig. 6 is the arrangement mode and Chip Area combination of signal wire in second of probe block provided in an embodiment of the present invention
Schematic diagram；
Fig. 7 provides the flow chart of the detection method of display panel for the embodiment of the present invention；
Fig. 8 is the schematic diagram of detection signal trend in probe block provided in an embodiment of the present invention.
Specific embodiment
The realization process of the embodiment of the present invention is described in detail with reference to the accompanying drawings of the specification.It should be noted that
Same or similar label indicates same or similar element or element with the same or similar functions from beginning to end.Lead to below
It crosses the embodiment being described with reference to the drawings to be exemplary, for explaining only the invention, and be not considered as limiting the invention.
Referring to fig. 2, the embodiment of the present invention provides a kind of probe block, including flexible circuit board, and flexible circuit board includes several
The signal wire of item transmission detection signal, signal wire include the first signal wire 1 and second signal line 2, each first signal wire 1 and Ge
One end of binary signal line 2 is overlapped with the route in liquid crystal display panel bonding wire disk correspondingly respectively, the other end of the first signal wire 1
It is overlapped with detection circuit board, the other end of second signal line 2 is hanging；
Flexible circuit board has positioned at the first Chip Area 3 and the second Chip Area 4 of non-end, the first signal wire 1 and second
Signal wire 2 is located at the exposure of the line segment in the first Chip Area 3 and the second Chip Area.Such as in Fig. 2, the first signal wire 1 is in the first patch
The line segment 11 of the exposure of section 3, line segment 12 of first signal wire 1 in the exposure of the second Chip Area 4；Second signal line 2 is in the first patch
The line segment 21 of the exposure of area 3, line segment 22 of the second signal line 2 in the exposure of the second Chip Area 4；
The line segment that first signal wire 1 and second signal line 2 are exposed is used to paste the patch being electrically connected by connecting line, so that
It transmits and realizes electrical connection between the first signal wire 1 and second signal line 2 of same detection signal.
Since the first signal wire 1 and inspection can be made using the first signal wire 1 as the signal wire of detection signal is provided
The length of slowdown monitoring circuit plate overlapped one end exceeds hanging one end of second signal line 2, can save space-efficient occupancy.
Preferably, the item number of second signal line 2 is greater than or equal to the item number of the first signal wire 1.
Preferably, the figure of each signal line exposure in the first Chip Area 3 and the second Chip Area 4 is rectangle.Certainly,
The figure of each signal line exposure in first Chip Area 3 and the second Chip Area 4 may be other geometric figures, such as circle
Shape, triangle, hexagon, trapezoidal etc., based on purpose easy to accomplish, preferably rectangle.
Preferably, the material of the first signal wire 1 and second signal line 2 be copper, aluminium, platinum, gold and silver in any one or
At least two mixed metal.
In order to cooperate each signal line (such as the first signal wire 1 and second in the first Chip Area 3 and the second Chip Area 4
Signal wire 2) exposure line segment, corresponding set patch is provided.As shown in figure 3, probe block further includes equal several of quantity
One patch 5 and several second patches 6, each first patch 5 for be covered on corresponding first signal wire 1 in the first Chip Area 3 and/
Or on the line segment (such as line segment 11 and/or line segment 21) of the exposure of second signal line 2, each second patch 6 is for being covered on the
The line segment (such as line segment 12 and/or line segment 22) of the exposure of corresponding first signal wire 1 in two Chip Area 4 and/or second signal line 2
On；
Each first patch 5 is electrically connected by connecting line 7 correspondingly with each second patch 6, and passes through same
The first patch 5 and the second patch 6 that the connecting line 7 is electrically connected respectively correspond first signal wire 1 and a second signal
Line 2；Or the first patch 5 being electrically connected by connecting line 7 described in same and the second patch 6 respectively correspond different two articles the
Binary signal line 2.In the present embodiment, the line segment and second of the first signal wire 1 with the first Chip Area 3 and the exposure of the second patch is provided
The corresponding patch of the line segment of signal wire 2, the first patch 5 and the second patch 6 are covered on the of the first Chip Area 3 and the exposure of the second patch
Schematic diagram on the line segment of one signal wire 1 and the line segment of second signal line 2 is as shown in Figure 4.
The present embodiment has the beneficial effect that: by making the flexible circuit board of probe block have the first signal wire 1 of exposure and the
The first Chip Area 3 and the second Chip Area 4 of binary signal line 2, to make the line segment and second signal of the first signal wire 1 being exposed
The line segment of line 2 can directly paste the patch being electrically connected by pre-provisioning request, realize with the first signal wire 1 and matched at least one
Second signal line 2 transmits identical detection signal, does not need specific Drive IC combination COF technology, reduces costs；Meanwhile
It is attached with mount technology, there is good conduction, improve detection effect.
Certainly, the first signal wire 1 and second signal line 2 can be there are many arrangement modes, corresponding first Chip Area 3 and the
Two Chip Areas 4 also have the group matched with arrangement mode:
For example, as shown in figure 5, all the first signal wire 1 is divided into two the first signal line groups 13, whole second signal lines
2 be second signal line group 23；Second signal line group 23 is located between two the first signal line groups 13, and second signal line group 23 with
First signal line group 13 is without intersection；
All the first signal wires 1 in corresponding 1 group of first signal wire in first Chip Area 3 and 2 groups of second signal line
Whole second signal lines 2, the second Chip Area 4 correspond to all the first signal wires 1 and the second letter in 1 group of another first signal wire
Numbers 2 groups of line of whole second signal lines 2；It can certainly corresponding all the first signal wires 1 in the first Chip Area 3 and whole second letters
Number line 2, the second Chip Area 4 only corresponding whole second signal lines 2, details are not described herein.
In another example whole second signal lines 2 are the as shown in fig. 6, all the first signal wire 1 is the first signal line group 13
Binary signal line group 23, the first signal line group 13 is with second signal line group 23 without intersection；First Chip Area 3 only corresponds to second signal line
2, the second Chip Area 4 corresponds to all the first signal wires 1 and whole second signal lines 2；Can certainly the first Chip Area 3 it is corresponding complete
The first signal wire of portion 1 and whole second signal lines 2, the second Chip Area 4 only corresponds to second signal line 2, and details are not described herein.
The arrangement mode of above-mentioned Fig. 5 and the first signal wire 1 and second signal line 2 shown in fig. 6, with 3 He of the first Chip Area
The arrangement mode of second Chip Area 4 can according to need carry out modification, with can the different detection demand of adaptation.
The embodiment of the present invention has the beneficial effect that: by make probe block flexible circuit board have exposure the first signal wire and
The first Chip Area and the second Chip Area of second signal line, to make the line segment and second signal line for the first signal wire being exposed
Line segment can directly paste the patch being electrically connected by pre-provisioning request, realize with the first signal wire and matched at least one the second
Signal wire transmits identical detection signal, does not need specific DriveIC combination COF technology, reduces costs；Meanwhile with patch
Technology is attached, and has good conduction, improves detection effect.
The embodiment of the present invention provides a kind of detection device, including providing the detection circuit board of detection signal with probe as above
Block.
The embodiment of the present invention has the beneficial effect that: by make probe block flexible circuit board have exposure the first signal wire and
The first Chip Area and the second Chip Area of second signal line, to make the line segment and second signal line for the first signal wire being exposed
Line segment can directly paste the patch being electrically connected by pre-provisioning request, realize with the first signal wire and matched at least one the second
Signal wire transmits identical detection signal, does not need specific DriveIC combination COF technology, reduces costs；Meanwhile with patch
Technology is attached, and has good conduction, improves detection effect.
Referring to Fig. 7, the embodiment of the present invention provides a kind of display panel testing method, using detection device as above, method
Include:
201, it provides quantity equal several first patches and several second patches, each first patch is covered on first
On the line segment of the exposure of corresponding first signal wire in Chip Area and/or second signal line, each second patch is covered on second
On the line segment of the exposure of corresponding first signal wire in Chip Area and/or second signal line；Wherein, each first patch and each the
Two patches are electrically connected by connecting line correspondingly, and pass through the first patch and second of the electrical connection of connecting line described in same
Patch respectively corresponds first signal wire and a second signal line, alternatively, passing through the electrical connection of connecting line described in same
First patch and the second patch respectively correspond two different second signal lines；
202, to the first signal wire of each provide detection signal, make detect signal by the first signal wire be transmitted to this first
Route in signal wire overlapped liquid crystal display panel bonding wire disk, and will test signal and be transmitted to and pasted on first signal wire
First patch or the second patch have at least one second signal line of direct or indirect connection relationship, make to detect signal by this extremely
A few second signal line is transmitted at least one second signal line overlapped the route in liquid crystal display panel bonding wire disk.
The set shown in Fig. 4 that is covered with is provided and is pasted for the specific trend of clearer description detection signal referring to Fig. 7
That signal is detected in the probe block of piece moves towards schematic diagram, wherein detection signal is supplied to first signal wire by arrow 90
1, on the one hand through first signal wire 1 along 91 direction of arrow be transmitted to route in overlapped liquid crystal plate bonding wire disk, it is another
Aspect is transmitted to the second signal line 2 being directly electrically connected (it can be appreciated that the first letter along 92 direction of arrow through connecting line 7
The second patch 6 on number line 1 transmits the detection signal through connecting line 7 with the first patch 5 on second signal line 2), the inspection later
Survey the route that signal is transmitted in institute's overlapped liquid crystal plate bonding wire disk along 93 direction of arrow through the second signal line 2, and this
Detection signal is transmitted to another second signal line 2 along 94 direction of arrow and 95 direction of arrow through the second signal line 2, and yet another the
Binary signal line 2 repeats the transmission of above-mentioned second signal line 2.
The embodiment of the present invention has the beneficial effect that: by make probe block flexible circuit board have exposure the first signal wire and
The first Chip Area and the second Chip Area of second signal line, to make the line segment and second signal line for the first signal wire being exposed
Line segment can directly paste the patch being electrically connected by pre-provisioning request, realize with the first signal wire and matched at least one the second
Signal wire transmits identical detection signal, is detected using above-mentioned probe block, does not need specific Drive IC combination COF skill
Art reduces costs；Meanwhile the first signal wire and second signal line being attached with mount technology, there is good conducting
Property, improve detection effect.
Obviously, various changes and modifications can be made to the invention without departing from essence of the invention by those skilled in the art
Mind and range.In this way, if these modifications and changes of the present invention belongs to the range of the claims in the present invention and its equivalent technologies
Within, then the present invention is also intended to include these modifications and variations.
Claims (10)
1. a kind of probe block, including flexible circuit board, the flexible circuit board includes the signal wire of several transmission detection signals,
It is characterized by:
The signal wire includes the first signal wire and second signal line, each first signal wire and each second signal line
One end is overlapped with the route in liquid crystal display panel bonding wire disk correspondingly respectively, the other end and detection electricity of first signal wire
Road plate overlap joint, the other end of the second signal line are hanging；
The flexible circuit board has positioned at the first Chip Area and the second Chip Area of non-end, first signal wire and described
Second signal line is located at the exposure of the line segment in first Chip Area and second Chip Area, first signal wire and described
The line segment that second signal line is exposed is used to paste the patch being electrically connected by connecting line, so that transmission same detection signal is described
Electrical connection is realized between first signal wire and the second signal line.
2. probe block as described in claim 1, which is characterized in that the probe block further includes equal several first patches of quantity
Piece and several second patches, each first patch is for being covered on corresponding first signal wire in first Chip Area
And/or on the line segment of the exposure of the second signal line, each second patch is for being covered on second Chip Area pair
On the line segment of the exposure of first signal wire and/or the second signal line answered；
Each first patch passes through connecting line with each second patch correspondingly and is electrically connected, and passes through same
First patch and second patch of the connecting line electrical connection respectively correspond first signal wire and one
The second signal line；Or first patch being electrically connected by connecting line described in same and second patch are distinguished
Corresponding two different second signal lines.
3. probe block as claimed in claim 1 or 2, which is characterized in that all first signal wire is the first signal line group,
All the second signal line is second signal line group, and first signal line group and the second signal line group are without intersection；
Corresponding all described first signal wire in first Chip Area and all the second signal line, second Chip Area is only
The corresponding second signal line；Alternatively, first Chip Area only corresponds to the second signal line, second Chip Area is corresponding
All first signal wire and all the second signal line.
4. probe block as claimed in claim 1 or 2, which is characterized in that all first signal wire is divided into two first
Signal line group, all the second signal line is second signal line group；The second signal line group is located at two first letters
Between number line group, and with first signal line group without intersection；
Whole first signal wire and second letter in corresponding first signal line group in first Chip Area
The whole second signal line of number line group, second Chip Area corresponds to the whole institute in another described first signal line group
State the whole second signal line of the first signal wire and the second signal line group；Alternatively,
Corresponding all described first signal wire in first Chip Area and all the second signal line, second Chip Area is only
The corresponding all described second signal line.
5. probe block as described in claim 1, which is characterized in that first signal wire and detection circuit board overlapped one end
Length exceed the second signal line hanging one end.
6. probe block as described in claim 1, which is characterized in that article number of the second signal line is greater than or equal to described the
The item number of one signal wire.
7. probe block as described in claim 1, which is characterized in that every in first Chip Area and second Chip Area
The shape of the line segment of one signal wire exposure is rectangle.
8. probe block as described in claim 1, which is characterized in that the material of the signal wire is in copper, aluminium, platinum, gold and silver
Any one or at least two mixed metal.
9. a kind of detection device, including providing the detection circuit board of detection signal, which is characterized in that the detection device further includes
Probe block as described in any claim of claim 1-8.
10. a kind of display panel testing method, using detection device as claimed in claim 9, which is characterized in that method packet
It includes:
It provides quantity equal several first patches and several second patches, each first patch is covered on described first
On the line segment of the exposure of corresponding first signal wire in Chip Area and/or the second signal line, by each second patch
Piece is covered on the line segment of the exposure of corresponding first signal wire in second Chip Area and/or the second signal line；
Wherein, each first patch passes through connecting line with each second patch correspondingly and is electrically connected, and by same
First patch and second patch of the electrical connection of connecting line described in item respectively correspond first signal wire and one
Second signal line described in item, alternatively, passing through first patch and second patch of the electrical connection of connecting line described in same
Respectively correspond the second signal line of different two；
Detection signal is provided to the first signal wire described in each, the detection signal is made to be transmitted to this by first signal wire
Route in first signal wire overlapped liquid crystal display panel bonding wire disk, and the detection signal is transmitted to and described in this
First patch or second patch pasted on one signal wire has at least one institute of direct or indirect connection relationship
State second signal line, make the detection signal by at least one second signal line be transmitted to this at least one described second
Route in signal wire overlapped liquid crystal display panel bonding wire disk.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610007315.8A CN105629527B (en) | 2016-01-06 | 2016-01-06 | A kind of probe block, detection device and display panel testing method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610007315.8A CN105629527B (en) | 2016-01-06 | 2016-01-06 | A kind of probe block, detection device and display panel testing method |
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| Publication Number | Publication Date |
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| CN105629527A CN105629527A (en) | 2016-06-01 |
| CN105629527B true CN105629527B (en) | 2019-01-08 |
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| CN103582296A (en) * | 2012-08-10 | 2014-02-12 | 乐金显示有限公司 | Flexible printed circuit film and display device using the same |
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| JP3751775B2 (en) * | 1999-08-26 | 2006-03-01 | 鹿児島日本電気株式会社 | Liquid crystal drive tape carrier package |
| US6433414B2 (en) * | 2000-01-26 | 2002-08-13 | Casio Computer Co., Ltd. | Method of manufacturing flexible wiring board |
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| CN1152721A (en) * | 1995-01-13 | 1997-06-25 | 精工爱普生株式会社 | Liquid crystal display and making method |
| CN1263280A (en) * | 1999-01-18 | 2000-08-16 | 精工爱普生株式会社 | Connection wiring base board of electro-optical board, electro-optical device and electronic device |
| JP2002171031A (en) * | 2000-11-30 | 2002-06-14 | Optrex Corp | Flexible wiring board and liquid crystal display |
| CN103582296A (en) * | 2012-08-10 | 2014-02-12 | 乐金显示有限公司 | Flexible printed circuit film and display device using the same |
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