CN105628524B - IC card distortion testing device - Google Patents
IC card distortion testing device Download PDFInfo
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- CN105628524B CN105628524B CN201410585017.8A CN201410585017A CN105628524B CN 105628524 B CN105628524 B CN 105628524B CN 201410585017 A CN201410585017 A CN 201410585017A CN 105628524 B CN105628524 B CN 105628524B
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- card
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- transmission wheel
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Abstract
The embodiment of the invention provides a kind of IC card distortion testing devices.The device mainly includes two opposite combination units put, it is provided with an IC card testing jig on each combination unit, is provided at least one transmission wheel on each IC card testing jig, the motor that each IC card testing jig passes through transmission shaft respectively and distortion rotates connects；IC card is arranged between the transmission wheel on two IC card testing jigs on two combination units, the motor of two distortion rotations rotates certain angle round about, the motor of two distortion rotations drives two IC card testing jigs to rotate same angle round about by transmission shaft, so that IC card be made to distort identical angle.The device of the embodiment of the present invention realizes the function that IC card is transmitted and IC card distortion test function, both it had been able to achieve to IC card batch testing, flex fatigue pressure test can be carried out to IC card again, by changing motor rotational angle, directioin parameter realizes the twist angle and direction of twist of change IC card.
Description
Technical field
The present invention relates to IC card (Integrated Circuit Card, integrated circuit card) the field of test technology, especially relate to
And a kind of IC card distortion testing device.
Background technique
For IC card using more and more common in our life, usage quantity is increasing, but in use, warp
Often there is the phenomenon that IC card cannot be used continuously after a period of use.The IC card returned after damage is analyzed, people is removed
It is largely that chip virtual connection, rosin joint or winding deformation cause virtual connection between line and line for the IC card of damage, IC card is caused to use one
The phenomenon that cannot be used continuously after the section time.
Currently, a kind of IC card in the prior art distorts test method are as follows: IC card is placed in two card slots, passes through two
Opposite offset forces IC card torsional deformation between card slot, distorts the relative deflection motion between test equipment card slot and determines that IC card distorts
The size of amount.
The shortcomings that above-mentioned IC card distortion test method in the prior art are as follows: card twist angle has determined that not when being design
It can change, testing efficiency is very low, and is destructive testing, cannot become product export after test.This method is to IC card
In process of production be sampled test before factory, but online batch testing cannot be carried out to the IC card of batch production.By
Very big in the daily yield of IC card, this method is no longer satisfied the technical requirements of modern production.
Summary of the invention
The embodiment provides a kind of IC card distortion testing devices, to realize that carrying out effective distortion to IC card surveys
Examination.
The present invention provides following schemes:
A kind of IC card distortion testing device, comprising: two opposite combination units put are provided on each combination unit
One IC card testing jig is provided at least one transmission wheel on each IC card testing jig, and each IC card testing jig passes through biography respectively
Moving axis is connected with the motor of distortion rotation；
IC card is arranged between the transmission wheel on two IC card testing jigs on two combination units, two distortion rotations
Motor rotate certain angle round about, the motors of described two distortion rotations drive two IC card surveys by transmission shaft
Examination frame rotates same angle round about, so that the IC card be made to distort identical angle.
The transport motor for rotating transmission wheel, the biography on two IC card test fixed frames are provided on each IC card testing jig
Power transmission machine is rotated synchronously to the same direction, and the transport motor drives transmission wheel to rotate by transmission device, and the transmission wheel is logical
Crossing frictional force drives IC card to move horizontally.
Transmission device on each IC card testing jig between the transmission wheel installed and transport motor be gear transmission mode or
Belt transmission mode.
The positional structure for the transmission wheel being arranged on described two IC card testing jigs is identical, is arranged on two IC card testing jigs
The transmission wheel of relative position partners transmission wheel pair.
The quantity of the transmission wheel pair be it is multiple, vertically put up and down between each pair of transmission wheel pair.
Having among each transmission wheel can be such that IC card passes through and have the gap of micro- power clamping function to IC card, and the IC card is logical
Cross the gap and transmission wheel contact.
The contact point of IC card and transmission wheel is to distort the motor of rotation as the concentric circles in the center of circle, so that IC card both sides be made to turn round
Song amount is consistent with distortion angle.
Described two combination units, the motor of distortion rotation are all rack-mount.
Described two IC card testing jigs are connected by transmission device with the bracket.
As can be seen from the technical scheme provided by the above-mentioned embodiment of the present invention, the device of the embodiment of the present invention realizes IC
Block the function being transmitted and IC card distortion test function, this method is convenient for integrating in transmitting-receiving card apparatus, and it is practical, it can
It realizes to IC card batch testing, and flex fatigue pressure test can be carried out to IC card, by changing motor rotational angle, direction is joined
Number realizes the twist angle and direction of twist for changing IC card.
Detailed description of the invention
In order to illustrate the technical solution of the embodiments of the present invention more clearly, required use in being described below to embodiment
Attached drawing be briefly described, it should be apparent that, drawings in the following description are only some embodiments of the invention, for this
For the those of ordinary skill of field, without any creative labor, it can also be obtained according to these attached drawings other
Attached drawing.
Fig. 1 is a kind of structural schematic diagram of IC card distortion testing device provided in an embodiment of the present invention；
Fig. 2 is a kind of IC card distortion test dress comprising main view, right side view, top view provided in an embodiment of the present invention
The structural schematic diagram set；
Transmission wheel rotation figure and a distortion turn when Fig. 3 is a kind of realization IC card transmitting function provided in an embodiment of the present invention
The schematic diagram of dynamic motor rotation；
Fig. 4 be it is provided in an embodiment of the present invention it is a kind of realize IC card distortion test when a pair of distortion rotary electric machine rotation show
It is intended to.
Specific embodiment
In order to facilitate understanding of embodiments of the present invention, it is done by taking several specific embodiments as an example below in conjunction with attached drawing further
Explanation, and each embodiment does not constitute the restriction to the embodiment of the present invention.
The structural schematic diagram of IC card distortion testing device provided in an embodiment of the present invention is as depicted in figs. 1 and 2, in Fig. 2
Include main view, right side view and top view.Above-mentioned apparatus includes two combinations with IC card transmitting function and distortion function
Device, two combination units are all mounted on bracket (S101), and are put relatively.An IC is provided on each combination unit
Card testing jig (S104), at least one transmission wheel and one are provided on each IC card testing jig (S104) rotates transmission wheel
Transport motor (S105), and the positional structure for the transmission wheel being arranged on two IC card testing jigs (S104) is identical, two IC card
The transmission wheel for the relative position being arranged on testing jig (S104) partners by rotating the transmission for making IC card realize locomotive function
Wheel pair.For example, transmission wheel (S111) and transmission wheel (S113) form transmission wheel pair, transmission wheel (S114) and transmission wheel in Fig. 1
(S112) transmission wheel pair is formed.
The quantity of the transmission wheel pair can vertically be put between each pair of transmission wheel pair to be multiple up and down.In each transmission
Having among wheel can be such that IC card passes through and have the gap of micro- power clamping function to IC card, and IC card is contacted by the gap and transmission wheel,
The contact point of IC card and transmission wheel is to distort the motor (S102) of rotation and be the concentric circles in the center of circle, so that IC card both sides be made to distort
It measures consistent with distortion angle.
Transmission device on each IC card testing jig (S104) between the transmission wheel installed and transport motor (S105) can be with
For gear transmission mode or belt transmission mode.
The place close to two combination units on bracket (S101) is separately installed with the motor of a distortion rotation
(S102), motor (S102) is connected by transmission shaft (S103) and IC card testing jig (S104).Two IC card testing jigs (S104)
All also connected by transmission device (S109, S107, S108, S109, S110) and bracket (S101).
The embodiment of the present invention is realized carries out IC card distortion test, working method in IC card transmit process, comprising:
1. IC card transmitting function: multiple transmission IC card being put on the IC card testing jig (S104) on two combination units
To between, the motor (S102) for distorting rotation does not rotate wheel in initial position, and the IC card on a pair of combination unit tests fixed frame
On transport motor (S105) to the same direction rotate synchronously, transport motor (S105) by transmission device drive transmission rotate
It is dynamic, make transmission wheel that IC card be driven to realize transfer function to direction of transfer is mobile, transmission wheel rotation drives IC card water by frictional force
Translation is dynamic.
2. IC card distorts test function: transmission wheel rotates when a kind of realization IC card transmitting function provided in an embodiment of the present invention
Figure and the schematic diagram of a distortion rotary electric machine rotation are as shown in figure 3, include following treatment process: IC card is put into two groups
It attaches together between multiple transmission wheels pair on the IC card testing jig (S104) set, the IC card on a pair of combination unit tests fixed frame
On transport motor (S105) do not rotate.The motor (S102) of two distortion rotations rotates certain angle round about, electricity
Machine (S102) drives the IC card testing jig (S104) being connected with motor (S102) to rotate same angle, therefore, above-mentioned two phase
Two IC card testing jigs (S104) are driven to rotate same angle round about by transmission shaft to the motor (S102) of rotation,
To make IC card distort identical angle.Then, the motor (S102) of above-mentioned two distortion rotation can be simultaneously again to Xiang Fanfang
To certain angle is rotated, repeatedly, reaches and return to initial position after the testing time of setting and stop operating.Above-mentioned rotation
Angle, number of twists and direction of twist can be preset in test according to technical requirements.
3. IC card distortion test and transmitting function: a pair of when a kind of realization IC card distortion test provided in an embodiment of the present invention
The schematic diagram for distorting rotary electric machine rotation is as shown in Figure 4.Concrete processing procedure is as follows: distorting the motor (S102) of rotation initial
Position, IC card are transmitted between multiple transmission wheels pair on IC card testing jig (S104), and transport motor (S105) stops operating.Two
The motor (S102) of a distortion rotation rotates towards each other certain angle, and motor (S102) drives the IC card being connected with motor (S102)
Testing jig (S104) rotates same angle, and therefore, above-mentioned two motor (S102) rotated towards each other drives two IC card tests
Frame (S104) rotates towards each other same angle, so that IC card be made to distort identical angle.Then, the electricity of above-mentioned two distortion rotation
Machine (S102) can rotate certain angle simultaneously round about again, repeatedly, return to after reaching the testing time of setting
Initial position stops operating.Angle, number of twists and the direction of twist of above-mentioned rotation can be set in advance in test according to technical requirements
It sets.
Later, the transport motor (S105) on the IC card test fixed frame on a pair of of combination unit is to equidirectional rotation, when
Transmission wheel rotation drives IC card to move horizontally by frictional force, and IC card is continued to transmit backward.Meanwhile subsequent IC card is transmitted to
Between multiple transmission wheels pair on IC card testing jig (S104), according to the distortion test process of above-mentioned IC card, to subsequent IC card
Carry out distortion test.The test process, which is realized, carries out batch distortion test to IC card.
In conclusion the device of the embodiment of the present invention realizes the function that IC card is transmitted and IC card distortion test function
Can, this method be convenient for transmitting-receiving card apparatus in integrate, it is practical, be not only able to achieve to IC card batch testing, but also can to IC card into
Row flex fatigue pressure test, by changing motor rotational angle, directioin parameter realization changes twist angle and the distortion side of IC card
To.
The device of the embodiment of the present invention is adaptable, can be implemented separately IC card distortion test equipment and and its
Its IC card integration of equipments.
The cost of the device of the embodiment of the present invention is low, and the spare and accessory parts for manufacturing equipment with this method are easily fabricated and add
Work, testing expense are few.Production test is high-efficient, can carry out batch testing to IC card, production test efficiency is greatly improved.From
Dynamicization degree is high, and it is high to manufacture automation degree of equipment with this method.
Those of ordinary skill in the art will appreciate that: attached drawing is the schematic diagram of one embodiment, module in attached drawing or
Process is not necessarily implemented necessary to the present invention.
As seen through the above description of the embodiments, those skilled in the art can be understood that the present invention can
It realizes by means of software and necessary general hardware platform.Based on this understanding, technical solution of the present invention essence
On in other words the part that contributes to existing technology can be embodied in the form of software products, the computer software product
It can store in storage medium, such as ROM/RAM, magnetic disk, CD, including some instructions are used so that a computer equipment
(can be personal computer, server or the network equipment etc.) executes the certain of each embodiment or embodiment of the invention
Method described in part.
All the embodiments in this specification are described in a progressive manner, same and similar portion between each embodiment
Dividing may refer to each other, and each embodiment focuses on the differences from other embodiments.Especially for device or
For system embodiment, since it is substantially similar to the method embodiment, so describing fairly simple, related place is referring to method
The part of embodiment illustrates.Apparatus and system embodiment described above is only schematical, wherein the conduct
The unit of separate part description may or may not be physically separated, component shown as a unit can be or
Person may not be physical unit, it can and it is in one place, or may be distributed over multiple network units.It can root
According to actual need that some or all of the modules therein is selected to achieve the purpose of the solution of this embodiment.Ordinary skill
Personnel can understand and implement without creative efforts.
The foregoing is only a preferred embodiment of the present invention, but scope of protection of the present invention is not limited thereto,
In the technical scope disclosed by the present invention, any changes or substitutions that can be easily thought of by anyone skilled in the art,
It should be covered by the protection scope of the present invention.Therefore, protection scope of the present invention should be with scope of protection of the claims
Subject to.
Claims (5)
1. a kind of IC card distortion testing device characterized by comprising two opposite combination units put, each group attaches together
It sets and is provided with an IC card testing jig, at least one transmission wheel, each IC card testing jig are provided on each IC card testing jig
It is connected respectively by transmission shaft with the motor of distortion rotation；
IC card is arranged between the transmission wheel on two IC card testing jigs on two combination units, the electricity of two distortion rotations
Machine rotates certain angle round about, and the motor of described two distortion rotations drives two IC card testing jigs by transmission shaft
Same angle is rotated round about, so that the IC card be made to distort identical angle；
The positional structure for the transmission wheel being arranged on described two IC card testing jigs is identical, is arranged on two IC card testing jigs opposite
The transmission wheel of position partners transmission wheel pair；
The quantity of the transmission wheel pair be it is multiple, vertically put up and down between each pair of transmission wheel pair；
Having among each transmission wheel can be such that IC card passes through and have the gap of micro- power clamping function to IC card, and the IC card is by being somebody's turn to do
Gap and transmission wheel contact；
The contact point of IC card and transmission wheel is to distort the motor of rotation as the concentric circles in the center of circle, to make IC card both sides twist angle
It is consistent with distortion angle.
2. IC card distortion testing device according to claim 1, which is characterized in that being provided on each IC card testing jig makes
The transport motor of transmission wheel rotation, the transport motor that two IC card are tested on fixed frames are rotated synchronously to the same direction, the biography
Power transmission machine drives transmission wheel rotation by transmission device, and the transmission wheel drives IC card to move horizontally by frictional force.
3. IC card distortion testing device according to claim 2, which is characterized in that the biography installed on each IC card testing jig
Sending the transmission device between wheel and transport motor is gear transmission mode or belt transmission mode.
4. IC card distortion testing device according to any one of claims 1 to 3, which is characterized in that described two groups attach together
The motor for setting, distorting rotation is all rack-mount.
5. IC card distortion testing device according to claim 4, which is characterized in that described two IC card testing jigs pass through biography
Dynamic device is connected with the bracket.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410585017.8A CN105628524B (en) | 2014-10-27 | 2014-10-27 | IC card distortion testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410585017.8A CN105628524B (en) | 2014-10-27 | 2014-10-27 | IC card distortion testing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105628524A CN105628524A (en) | 2016-06-01 |
| CN105628524B true CN105628524B (en) | 2019-07-09 |
Family
ID=56043663
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410585017.8A Active CN105628524B (en) | 2014-10-27 | 2014-10-27 | IC card distortion testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105628524B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111257791A (en) * | 2020-01-20 | 2020-06-09 | 深圳市越宏五金弹簧有限公司 | Light bar tester |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202494605U (en) * | 2012-03-24 | 2012-10-17 | 精工伟达科技（深圳）有限公司 | Multifunctional bending detector |
| CN203672729U (en) * | 2013-12-24 | 2014-06-25 | 东莞市锐祥智能卡科技有限公司 | Card torsion and bending test equipment |
-
2014
- 2014-10-27 CN CN201410585017.8A patent/CN105628524B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202494605U (en) * | 2012-03-24 | 2012-10-17 | 精工伟达科技（深圳）有限公司 | Multifunctional bending detector |
| CN203672729U (en) * | 2013-12-24 | 2014-06-25 | 东莞市锐祥智能卡科技有限公司 | Card torsion and bending test equipment |
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| Publication number | Publication date |
|---|---|
| CN105628524A (en) | 2016-06-01 |
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