CN1055781C - Electronic deflection lens system for image tube - Google Patents
Electronic deflection lens system for image tube Download PDFInfo
- Publication number
- CN1055781C CN1055781C CN94103868A CN94103868A CN1055781C CN 1055781 C CN1055781 C CN 1055781C CN 94103868 A CN94103868 A CN 94103868A CN 94103868 A CN94103868 A CN 94103868A CN 1055781 C CN1055781 C CN 1055781C
- Authority
- CN
- China
- Prior art keywords
- utmost point
- lens
- deflection
- eccentric
- picture tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Abstract
The present invention relates to design aiming at a main focusing lens of a kinescope electron gun, and a scanning system thereof. The present invention is characterized in that a static main lens area of a kinescope electron gun, and a magnetic deflecting magnetic field of a deflecting yoke are superposed on space; two groups of dynamic eccentric compensating lenses are used for compensating a focusing image difference due to the eccentricity of electron beam tracks. Because a deflecting electron lens largely moves forward from a kinescope main lens to the direction of a screen along a shaft for increasing the caliber of the main lens, the focusing performance of the main lens is largely enhanced. Simultaneously, the deflecting electron lens can also increase the deflecting efficiency of an integral kinescope system for reducing consumed energy due to deflection.
Description
The present invention relates to a kind of picture tube electron gun main focusing lens and scanning system, especially refer to a kind of in the picture tube of deflection electron lens, the main lens position of electron gun generation focussing force is extended to the magnetic deflection field zone of deflection yoke to the phosphor screen direction, make the electrostatic field focal zone of its main lens and the magnetic deflection field district of deflection yoke spatially take identical position, and it is overlapped, make it when electron beam when being focused on and being deflected the magnetic field deviation by electrostatic field, its focusing and deflecting action not only take place in the same space, and finish in the same time.
In the design of conventional picture tube (CRT) electron gun, the focal zone of electron gun static main lens necessarily must distinguish with the magnetic deflection field of deflection yoke (Yoke), and two zones must be independent separately, and do not disturb mutually.Generally speaking, its electron beam forms district (BeamForming Region, or BFR) emission by the electronics of electron gun, after the shaping, focus on, enter the magnetic deflection field district again through main lens, through level, vertical scanning effect, on phosphor screen, form complete " picture " and show.In some picture tube systems, its magnetic deflection field can be extended to the infiltration of electron gun zone, when this situation takes place, the electron gun design engineer can use magnetic material to make the body of a gun assembly of electron gun, make electron beam in the electron gun zone, be subjected to shielding action, thereby make the not reason magnetic field seepage effect and depart from the lens axle center of its track, cause aberration.
Consult Fig. 1, this figure is the generalized section of traditional picture tube system.This conventional picture tube system 10 mainly comprises the deflection yoke 18 of phosphor powder layer 16, glass tube neck 13a, electron gun 11, electron gun of glass screen 14, the inside pipe wall of taper glass bulb 13b, the picture tube of picture tube and anode button 30 etc.Its electron gun 11 is made of negative electrode K, control utmost point G1, anode G2, focusing electrode G3 and anode G4 etc.The electron beam that produces when electron gun 11 should penetrate along the path of electron gun central axis A-A ' direction without electron beam 12 of deviation during without deviation; When deviation takes place through deflection yoke 18 effects in the electron beam that produces when electron gun 11, this electron beam 12 ' will deflect in the deflection center line D-D ' position in the magnetic deflection field district of deflection yoke 18.
In this conventional picture tube system,, finish focusing so its electron beam is first at this, and then enter the magnetic deflection field district because the focussing force of electron gun main lens occurs between focusing electrode G3 and anode G4 two electrodes.The electrostatic field focal zone of this kind conventional picture tube electron gun main lens and the magnetic deflection field district of deflection yoke, spatially belong to and separating fully, and there are not two overlapping zones fully, so, the focusing that electron beam is finished in picture tube and be deflected two kinds of effects again, belong to spatially respectively do not disturb mutually, event in regular turn in time.
The electronic deflection lens system for image of picture tube of the present invention, mainly be the magnetic deflection field regions of the static main lens district of picture tube electron gun and deflection yoke spatially overlapping, utilize two groups of dynamic eccentricity compensation lens again, it is defocused aberration because of what electron beam trace off-centre caused to come revisal.
Main purpose of the present invention, be significantly to move forward toward phosphor screen vertically by main lens with picture tube, the taper glass bulb length of picture tube is dwindled, and its main lens bore is increased, making it not only, the volume of whole picture tube can dwindle, and because the main lens object distance is increased image distance reduces, so can not change under its operating voltage situation, make its magnification ratio reduce, and then the electron beam after the focusing is diminished, thereby fluoroscopic resolution is improved, and it is careful that image more becomes.In addition, because in the present invention, the reach of main lens position, with the electric field region of these lens is significantly extended to the phosphor screen direction, therefore, can significantly reduce no electric field electronics drift region as existing in the conventional picture tube, reduce the repulsive interaction between its space charge, increase the analytic ability of electron beam, especially, more remarkable using under the big current conditions.In addition, because in the present invention, its anode is in a very open space, formed electronics main lens diameter, much larger than the main lens diameter of conditional electronic rifle, its spherical aberration coefficient will be therefore littler than conditional electronic rifle, therefore, the present invention also can significantly reduce electron beam in main lens because of the blooming effect that spherical aberration produced, the resolution of image is improved more.
Another object of the present invention when being to make electron beam to enter the magnetic deflection field district, still is in the state of not finishing by static focusing, in other words, the kinetic energy that its electron institute has is still much smaller than anode voltage, so its deflection sensitivity is higher, and the required power of its upper deflecting yoke also can therefore and significantly reduce.In addition, because the refraction angle of electron beam can increase because of the effect of lens,, main lens is positioned at foreign side's (promptly close cathode direction) that focus that focusing electrode surveys is placed on deflection center so the present invention utilizes this principle.So that therefore the electron beam that is deflected can increase deflection sensitivity, therefore, under same deflection distance condition, can save about deflection power of 30% to 40% than traditional approach according to design of the present invention.
Another purpose of the present invention, be that owing to main lens and magnetic deflection field area overlapping, electron beam is when magnetic core logical circuit deflection with revisal by install two groups of eccentric utmost point porose areas additional in electron gun, what produce in lens focuses on from axle, makes electron beam still can form a circular picture point on screen.In addition, because the more general traditional main lens of main lens diameter of the present invention be big, so as if being when setting at focus voltage, will become focusing during little current status, thereby the focusing drop point that forms little electric current is bigger than normal at current state.The present invention borrows the spacing that reduces anode and focusing electrode, and the lens strength that makes electronics form the district increases, thereby makes little electric current increase the phenomenon of poor focusing during with the little electric current of effective revisal to the incidence angle of main lens.
For achieving the above object, the invention provides a kind of electronic deflection lens system for image of picture tube, this system comprises the taper glass bulb of picture tube, the glass screen of picture tube, glass tube neck, deflection yoke and electron gun etc., its electron gun is by negative electrode, the control utmost point, anode, formation such as focusing electrode and anode, described anode is made of the coating that is positioned at the inwall appropriate position coating conduction between glass tube neck and glass screen at picture tube, and the mid point between described focusing electrode and anode is arranged in the magnetic deflection field zone that the set deflection yoke of glass tube neck outer wall produces, make the electrostatic field focal zone of the main lens that described electron gun forms and the magnetic deflection field district of deflection yoke spatially take identical space, and it is overlapped, so that electron beam is when being focused on and being deflected the magnetic field deviation by electrostatic field, its focusing and deflecting action take place in the same space, and in the same time, finish, it is characterized in that, add two groups of eccentric utmost point porose areas in the described electron gun, one group is the eccentric utmost point porose area of being made up of several pole pieces of level, the vertical eccentric utmost point porose area of another group for forming by several pole pieces, in these pole pieces of the eccentric utmost point porose area of this level and vertical eccentric utmost point porose area, a part is for having the pole piece in concentric utmost point hole, be connected on the fixing focus voltage, have the pole piece that has vertical eccentric utmost point hole in the pole piece in the eccentric utmost point of level hole and this vertical eccentric utmost point porose area in the eccentric utmost point porose area of this level and then be connected on the dynamic electric voltage.
Fig. 1 is the generalized section of traditional picture tube system;
Fig. 2 is the generalized section of deflection electron lens picture tube system one embodiment of the present invention;
Fig. 3 is that the object distance and the image distance position of electron lens in the electron gun concerns schematic diagram;
Fig. 4 a, 4b and 4c are for point-source of light O lays respectively at the electron lens one optical focus outside, it is gone up and during the inboard, the position of its focus point and lens concerns schematic diagram;
Fig. 5 a and 5b be electron beam when magnetic core logical circuit deflection, what produced in lens focuses on from axle, and this focuses on a kind of axial hangover comet formula that electron beam is produced from axle and defocuses the picture point schematic diagram;
Eccentric utmost point porose area of the level that Fig. 6 a and 6b are respectively in the electron gun to be installed additional and vertical eccentric utmost point porose area schematic diagram;
Fig. 7 is for when doing the level correction, and the voltage waveform of electron beam on screen changes schematic diagram;
Fig. 8 a, 8b, 8c and 8d defocus the mode schematic diagram for the compensation off-axis;
Fig. 9 is the generalized section of another embodiment of deflection electron lens picture tube system of the present invention.
See also shown in Figure 2ly, this figure is an embodiment of deflection electron lens picture tube system 40 of the present invention.This system 40 mainly comprises phosphor powder layer 48, the electron gun 42 of glass screen 46, the inside pipe wall of taper glass bulb 62b, glass tube neck 62a, the picture tube of picture tube, dope layer 54, deflection yoke 50 and the anode button 58 etc. of high impedance.Its electron gun 42 mainly is made of negative electrode K, control utmost point G1, anode G2, focusing electrode G3 and anode G4 etc.Especially must note, anode G4 is coated on the electron tube inwall by electrically-conducting paint to constitute among the present invention, the electron beam that produces when electron gun is during without deviation, this not the electron beam 44 of deviation penetrate along the path of electron gun central axis A-A ' direction, and the electron beam that produces when electron gun, in when, through deflection yoke 50 effect deviation taking place, this electron beam 44 ' will deflect in the deflection center line D-D ' position in the magnetic deflection field district of deflection yoke 50.
In deflection electron lens picture tube of the present invention, the main lens focussing force of its electron gun 42 occurs between focusing electrode G3 and anode G4, different with traditional picture tube be in, boundary mid point between this focusing electrode G3 and anode G4 extends to forward in the magnetic deflection field zone of deflection yoke 50, the transformation of this main lens focussing force position, make the electrostatic field focal zone of main lens of the present invention and the magnetic deflection field district of deflection yoke spatially take identical position, and it is overlapped, so, when electron beam is focused on and is deflected the magnetic field deviation by electrostatic field, its focusing and deflecting action not only take place in the same space, and belong to the incident of finishing in the same time.
Because extend to teletron glass screen 46 directions electronics main lens of the present invention position, therefore not only because of the electron gun contraction in length, can make the more traditional person of glass tube neck 62a length of cathode ray tube taper glass bulb 62b shorten X, as shown in Figure 2, and, because the transformation of electronics main lens position has produced the multinomial condition that helps focusing performance.But, also produced the multinomial situation that is unfavorable for focusing performance, revisal in addition.For ease of understanding technology contents of the present invention, sincerely various situations are described in detail as follows:
I. electron beam is focused on advantageous conditions:
A) in the present invention, because main lens DFL shifts near to screen orientation, so consult shown in Figure 3, the light of the point-source of light O emission of this main lens DFL one side can be by lens focus to 1 I of other side, and wherein object distance P can strengthen between main lens and point-source of light O, and image distance q can reduce between main lens and focus point I, at this moment, calculate as the principle formula according to following electron gun enlarge-effect, its magnification ratio M is
Wherein p, q are respectively object distance and image distance, and Vo is a focus voltage, and Va is an anode voltage.
By (1) formula as can be known, when image distance q reduced if object distance p increases, under focus voltage Vo and the constant situation of anode voltage Va, its magnification ratio M can reduce, thereby the electron beam after the focusing is diminished, and makes the resolution of screen improve, and it is careful that image more becomes.
B) main lens among the present invention, though formed by focusing electrode G3 and anode G4, but because its anode G4 is in a very open space, so formed electronics main lens diameter will be big more than the main lens of conditional electronic rifle, spherical aberration owing to lens is inversely proportional to lens diameter again, therefore its spherical aberration coefficient Cs will be therefore and little more than the conditional electronic rifle, at this moment, by the formula that defocuses diameter d s of the electron beam that spherical aberration produced is:
d
s＝Csθ
3 (2)
Wherein θ is the incidence angle of electron beam.
By (2) formula as can be known, the present invention can significantly reduce simultaneously electron beam in main lens because of the blooming effect that spherical aberration produced, make the resolution of image improve more.
C) in the present invention, extend to the phosphor screen direction main lens position, except that making image distance q reduces, and the electric field region of these lens will significantly be extended to screen orientation, therefore, can significantly reduce as existing no electric field electronics drift region in the conventional picture tube.And in conventional picture tube, in the no electric field electronics of this kind drift region, because of there not being focusing electric field to keep within bounds, repulsive interaction between electric charge (being called space charge effect again) easily make the fluoroscopic electron beam of directive when passing through this zone to outdiffusion, thereby increased beam diameter, its resolution is reduced.
Because the present invention makes the focusing electric field of main lens extend to screen orientation, and significantly reduce space charge freely repel distance, so can reduce its repulsive interaction, thereby increased the analytic ability of electron beam, this is using under the big current conditions, and effect will be more remarkable, and have importance.
By the comprehensive effect of above-mentioned three kinds of factors as can be known, under identical anode voltage and identical current condition, the present invention can make the diameter of its electron beam reduce 25% to 35% than conditional electronic survivor that rifle produces.
II. increase deflection sensitivity, power demand during with minimizing deflection:
A) general traditional picture tube, as previously mentioned, it focuses on and deflecting action is a kind of continuous incident, so when electron beam enters the magnetic deflection field district, electron beam has all been finished focusing, therefore and the kinetic energy of its electronics has all accelerated to anode voltage, and when utilizing magnetic field to the electron beam deflecting, its deflection capacity is that the square root with the voltage of electronic kinetic energy is inversely proportional to.
But in picture tube of the present invention, because when electron beam enters the magnetic deflection field district, its electron beam still is in the state of not finishing by static focusing, in other words, the kinetic energy that its electron institute has is still much smaller than anode voltage, so its deflection sensitivity is higher, and the required also spoke reduction therefore and greatly of power of its upper deflecting yoke.
B) the described effect that increases deflection sensitivity of preceding paragraph can be illustrated shown in Fig. 4 a, 4b and 4c.
See also Fig. 4 a, this illustrates an optical lens DFL, at these lens an optical focus F1 and F2 are arranged each side, if disregard the spherical aberration effect of lens, the light that position point-source of light O in optical focus F1 left side is launched can be focused on 1 I outside focal point F 2 right sides by lens DFL.
Again, consult shown in Fig. 4 b, this illustrates an identical optical lens DFL, but its point-source of light O is sitting on this lens left focal point F1, and according to optical principle as can be known, all are through the light of lens, all becomes directional light after being come out by the lens right side.
In addition, consult shown in Fig. 4 c, this illustrates an identical optical lens DFL, when its point-source of light O is positioned at the inboard of lens left focal point F1 when (near lens), according to optical principle as can be known, all see through the reverse line stretcher of the light of lens, can form a virtual image on the VL point of lens left side optical axis.
At this moment, by shown in Fig. 4 c as can be known, be positioned at the light source of lens focus inboard, behind the process lens, its refraction angle can increase because of the effect of lens, the present invention then utilizes this principle, and main lens DFL left focal point is placed on foreign side's (near cathode direction) of deflection center, makes the electron beam that is deflected increase deflection sensitivity because of principle shown in Fig. 4 c.
By A) and B) described resultant effect see, under same deflection distance condition,, can save about deflection power of 30% to 40% according to the solution of the present invention.
III. be unfavorable for the situation and the revisal measure thereof of deflection electron lens:
A) deflecting action influence and correction method thereof that electron beam is defocused from axle:
In the present invention, because main lens and magnetic deflection field area overlapping,, will in lens DFL, produce from axle focusing, as A, B among Fig. 5 a or three kinds of situations of C when electron beam during through magnetic core logical circuit deflection.Thisly focus on, can make electron beam produce a kind of comet formula and defocus picture point, as shown in Fig. 5 b, defocus picture point Pa, Pb or Pc to the hangover of picture tube central axis direction from axle.
But, this defocus to borrow from axle in electron gun, install two groups of eccentric utmost point porose areas additional and give revisal.Shown in Fig. 6 a and 6b, one group is the eccentric utmost point porose area (being made up of three pole pieces such as G3E, G3D and G3C) of level, and another group is a vertical eccentric utmost point porose area (being made up of three pole pieces such as G3C, G3B and G3A).Pole piece G3A, G3C and G3E are the pole piece with concentric utmost point hole 70, are connected on the focus voltage VF who fixes; And pole piece G3D is the pole piece with the eccentric utmost point of level hole 71, this pole piece is connected on the dynamic electric voltage Vdyn-h (t), this dynamic electric voltage and horizontal sweep magnetic field synchronous change (comprise its frequency and amplitude, all synchronous with horizontal sweep magnetic field, unique difference is behind the mid point of scanning element leap level, and the relative pressure of it and adjacent electrode must change direction,, decide to bearing or bear by just) on design to just; G3B is the pole piece with vertical eccentric utmost point hole 72, this pole piece is connected on the dynamic electric voltage Vdyn-v (t), this dynamic electric voltage then (comprises its frequency and amplitude with vertical scanning magnetic field synchronous change, all synchronous with vertical scanning magnetic field, unique difference is after crossing over vertical mid point when scanning element, and the relative pressure of it and adjacent voltage must change direction, by just to negative or by negative to just, decide on design).
See also shown in Figure 7ly, be the schematic diagram of Vdyn-h (t) and time relationship.When electron beam is begun to scan by the screen left end, its magnitude of voltage is V1, during by the horizontal sweep central point, its magnitude of voltage V2=0, when electron beam by the horizontal sweep center during to the scanning of scanning screen right endpoint, its relative pressure must change direction, and when being scanned up to the screen right endpoint, its magnitude of voltage becomes V3.This dynamic electric voltage Vdyn-h (t) becomes the V3 required time by V1 and just equals horizontal scanning period t1, wherein a t1=t2-t1=t3-t2.So when carrying out next bar horizon scan line again, this dynamic electric voltage Vdyn-h (t) becomes V3 by V1 again, so goes round and begins again, provide the eccentric utmost point porose area of level required voltage.
In addition, consult shown in Figure 8ly, this figure mainly the present invention is directed to aforementioned off-axis in order to explanation and defocuses the compensation method of being done.Wherein, Fig. 8 a is illustrated in when not having magnetic deflection field, and electron beam is through lens DFL centre focus, and forming on screen does not have the circular picture point P that defocuses; Fig. 8 b then shows, if electron beam is deflected the magnetic field deviation and to main lens DFL top, then in the focusing process, the comet formula that produces to the hangover of picture tube central axis direction is defocused, and is revealed as picture point p ' on the screen; Again, consult shown in Fig. 8 c, (near the negative electrode place) adds an eccentric utmost point porose area if at the main lens rear, and axle center that should off-centre utmost point hole is positioned at the top in main lens axle center, then be deflected under the situation at the electron beam shown in Fig. 8 b, if the more adjacent pole piece of voltage of the eccentric utmost point is for negative, then form a positive lens PL, this positive lens will produce upwards blooming effect to the electron beam that passes through, if when voltage difference therebetween is adjusted to a desired value, and the blooming effect that this makes progress, just can compensate the downward blooming effect that is produced by main lens DFL, thereby make electron beam after deflection, still can on screen, form a circular picture point P, shown in Fig. 8 c.
Again, shown in Fig. 8 d, if electron beam is deflected the magnetic field deviation to main lens DFL below, then in the focusing process, defocus and up (to point to the axle center forever) through the comet formula that main lens produced to the hangover of picture tube central axis direction, in the case, the voltage of the eccentric utmost point must more adjacent pole piece for just, to form a negative lens NL, the electron beam that passes through is produced downward blooming effect, just in time compensate the upwards blooming effect that produces by main lens, make electron beam can on screen, form a circular picture point P, shown in Fig. 8 d.
From the above, the present invention is by install two groups of eccentric utmost point porose areas additional in electron gun, shown in Fig. 6 a and 6b, make the dynamic electric voltage Vdyn-h (t) that is connected on the pole piece G3D of the eccentric utmost point porose area of level, and the dynamic electric voltage Vdyn-v (t) that is connected on the pole piece G3B of vertical eccentric utmost point porose area is respectively with horizontal sweep magnetic field and vertical scanning magnetic field synchronous change, make electron beam be deflected the action of a magnetic field and when making level and/or vertical segregation, the size of energy Synchronization Control dynamic electric voltage, thereby in eccentric utmost point porose area, form electronics positive lens and/or negative lens, the comet formula that adequate compensation produced defocuses picture point, makes electron beam still can form a normal circular picture point with the tram on screen.
B) under different current conditions, the optimum focusing voltage difference is apart from too big:
Main lens diameter of the present invention is big because of more general traditional main lens, so under the current strength change conditions, because different electric currents are to the incident angle difference of main lens (during usually big electric current, incident angle is bigger, during little electric current, incident angle is less), when the setting of focus voltage is during at big electric current, then when little electric current, will become focusing, thereby the focusing drop point that forms little electric current is bigger than normal.
The present invention is this defective of revisal, borrow the distance that reduces between anode G2 and focusing electrode G3, increase, make it when little electric current, to produce twice intersection with the lens strength that electronics is formed the district, so that little electric current increases the incidence angle of main lens, thus poor focusing phenomenon when correcting little electric current.
In addition, consult shown in Figure 9ly, this figure is the generalized section of another specific embodiment of deflection electron lens picture tube system of the present invention.Wherein the focusing electrode G3 of deflection lens is also for forming by electrically-conducting paint is coated on the picture tube inwall, and between the coating of this focusing electrode G3 and the coating of anode G4, other is coated with the coating 54 of one deck high impedance, with as between the two insulated barriers thing, and define the position relation of main lens two electrodes by the last lower periphery of this high impedance coating.Last embodiment of the present invention shown in Fig. 2, its anode G4 is defined by electrically-conducting paint and high impedance coating 54, and focusing electrode G3 then is a columnar metal electrode, so both are different.
The above only is preferred embodiment of the present invention, and scope of the present invention is not limited thereto, and the personage of skilled according to the disclosed technology contents of the present invention, can do equivalence easily and change, but all should not break away from protection category of the present invention.
Claims (7)
1. the electronic deflection lens system for image of a picture tube, the taper glass bulb that comprises picture tube, the glass screen of picture tube, glass tube neck, deflection yoke and electron gun, its electron gun is by negative electrode, the control utmost point, anode, focusing electrode and anode constitute, described anode is made of the coating that is positioned at the inwall appropriate position coating conduction between glass tube neck and glass screen at picture tube, and the mid point between described focusing electrode and anode is arranged in the magnetic deflection field zone that the set deflection yoke of glass tube neck outer wall produces, make the electrostatic field focal zone of the main lens that described electron gun forms and the magnetic deflection field district of deflection yoke spatially take identical space, and it is overlapped, so that electron beam is when being focused on and being deflected the magnetic field deviation by electrostatic field, its focusing and deflecting action take place in the same space, and in the same time, finish, it is characterized in that, add two groups of eccentric utmost point porose areas in the described electron gun, one group is the eccentric utmost point porose area of being made up of several pole pieces of level, the vertical eccentric utmost point porose area of another group for forming by several pole pieces, in these pole pieces of the eccentric utmost point porose area of this level and vertical eccentric utmost point porose area, a part is for having the pole piece in concentric utmost point hole, be connected on the fixing focus voltage, have the pole piece that has vertical eccentric utmost point hole in the pole piece in the eccentric utmost point of level hole and this vertical eccentric utmost point porose area in the eccentric utmost point porose area of this level and then be connected on the dynamic electric voltage.
2. the electronic deflection lens system for image of picture tube as claimed in claim 1 is characterized in that, the focus that described main lens is positioned at the focusing electrode side is located at deflection center foreign side, promptly near the direction of negative electrode, makes the electron beam that is deflected can therefore increase its deflection sensitivity.
3. the electronic deflection lens system for image of picture tube as claimed in claim 1, it is characterized in that, described dynamic electric voltage is made synchronous change with level and vertical scanning magnetic field, and to be adjusted to more adjacent pole piece be plus or minus, to form a negative lens or positive lens, make it to defocusing of producing of the electron beam that passes through with defocus on direction just in time on the contrary by main lens produced, to compensate, make electron beam can on screen, form a circular picture point by the blooming effect that main lens was produced.
4. as the electronic deflection lens system for image of claim 1 or 3 described picture tubes, it is characterized in that the frequency of described dynamic electric voltage and amplitude are all made synchronous change with level and vertical scanning magnetic field, and after crossing over the mid point of screen when scanning element, its relative pressure changes direction.
5. the electronic deflection lens system for image of picture tube as claimed in claim 1 is characterized in that, the pole piece that has concentric utmost point hole in the described eccentric utmost point porose area is arranged to being staggered along the central shaft of this cathode-ray tube with the pole piece with eccentric utmost point hole.
6. as the electronic deflection lens system for image of claim 1,2,3 or 5 described picture tubes, it is characterized in that described focusing electrode is made of the electrically-conducting paint that is positioned at the coating of glass tube neck inwall appropriate position at picture tube.
7. the electronic deflection lens system for image of picture tube as claimed in claim 6 is characterized in that, is coated with one deck high impedance coating between described focusing electrode and anode, with as between the two insulated barriers thing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN94103868A CN1055781C (en) | 1994-05-14 | 1994-05-14 | Electronic deflection lens system for image tube |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN94103868A CN1055781C (en) | 1994-05-14 | 1994-05-14 | Electronic deflection lens system for image tube |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1112284A CN1112284A (en) | 1995-11-22 |
| CN1055781C true CN1055781C (en) | 2000-08-23 |
Family
ID=5031303
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN94103868A Expired - Fee Related CN1055781C (en) | 1994-05-14 | 1994-05-14 | Electronic deflection lens system for image tube |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1055781C (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4710672A (en) * | 1981-04-16 | 1987-12-01 | U.S. Philips Corporation | Picture display device |
-
1994
- 1994-05-14 CN CN94103868A patent/CN1055781C/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4710672A (en) * | 1981-04-16 | 1987-12-01 | U.S. Philips Corporation | Picture display device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1112284A (en) | 1995-11-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1050439C (en) | Color braun tube apparatus | |
| KR950001842A (en) | Cathode ray tube with reduced dynamic correction voltage | |
| US5449983A (en) | Color cathode ray tube apparatus | |
| JPS63105440A (en) | Electron gun for color cathode-ray tube | |
| CN1155046C (en) | Cathode-ray tube | |
| CN1055781C (en) | Electronic deflection lens system for image tube | |
| CN1029380C (en) | Electron gun of colour display tube | |
| CN1058103C (en) | Color cathode ray tube having improved focus | |
| CN1157753C (en) | Electron gun for color cathode ray tubes | |
| CN1123043C (en) | Colour kinescope device | |
| KR910007801B1 (en) | Cathode ray tube | |
| CN1130302A (en) | Colour display system by using quadrupole lens | |
| CN1316543C (en) | Cathode ray tube | |
| CN1141730C (en) | Cathode ray tube | |
| US4368405A (en) | Electron gun for a cathode ray tube | |
| CN1165069C (en) | Cathode-ray tube device | |
| KR870000281B1 (en) | Electron-gun for a c.r.t. | |
| US4866337A (en) | Image pick-up tube with electrostatic deflecting electrode structure | |
| GB2146171A (en) | Cathode ray tubes | |
| US4701668A (en) | Cylindrical image pickup tube having electrostatic deflection electrodes formed of straight line pattern yokes | |
| KR890003729B1 (en) | Electron gun for brown tube | |
| GB2294582A (en) | Electron gun for color cathode ray tube | |
| JPH043057B2 (en) | ||
| CN1034824A (en) | The electron gun that is used for chromoscope | |
| CN1334585A (en) | Cathode ray tube device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| EE01 | Entry into force of recordation of patent licensing contract |
Assignee: CPT (Fuzhou) Co., Ltd. Assignor: CPT (Bermuda) Co., Ltd. Contract fulfillment period: In October 31, 2007, 5 years Contract record no.: 200210156 Denomination of invention: Deflection electron lens system of picture tube Granted publication date: 20000823 License type: Jiao Cha Record date: 20021231 |
|
| LIC | Patent licence contract for exploitation submitted for record |
Free format text: LICENCE; TIME LIMIT OF IMPLEMENTING CONTACT: 2007.10.31, 5 YEARS Name of requester: CHUNGHWA PICTURE TUBES (FUZHOU) CO., LTD. Effective date: 20021231 |
|
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20000823 Termination date: 20130514 |