CN105551526A - Method for detecting yield of RAID card memory particles by sending specific test data - Google Patents
Method for detecting yield of RAID card memory particles by sending specific test data Download PDFInfo
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- CN105551526A CN105551526A CN201510893390.4A CN201510893390A CN105551526A CN 105551526 A CN105551526 A CN 105551526A CN 201510893390 A CN201510893390 A CN 201510893390A CN 105551526 A CN105551526 A CN 105551526A
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- 238000000034 method Methods 0.000 title claims abstract description 28
- 238000012360 testing method Methods 0.000 title claims abstract description 19
- 239000002245 particle Substances 0.000 title abstract description 11
- 238000012216 screening Methods 0.000 claims abstract description 7
- 238000012545 processing Methods 0.000 claims abstract description 6
- 238000001514 detection method Methods 0.000 claims description 10
- 238000004458 analytical method Methods 0.000 claims description 7
- 230000005540 biological transmission Effects 0.000 claims description 5
- 238000010998 test method Methods 0.000 claims description 4
- 238000004364 calculation method Methods 0.000 claims description 3
- 238000004140 cleaning Methods 0.000 claims description 3
- 230000002950 deficient Effects 0.000 claims description 3
- 238000011161 development Methods 0.000 claims description 3
- 230000006870 function Effects 0.000 claims description 3
- 230000000630 rising effect Effects 0.000 claims description 3
- 238000013461 design Methods 0.000 abstract description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C2029/4402—Internal storage of test result, quality data, chip identification, repair information
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- Techniques For Improving Reliability Of Storages (AREA)
Abstract
The invention provides a method for detecting the yield of memory particles of a RAID card by sending specific test data, which comprises the steps of firstly analyzing the error reporting reasons of the memory of the RAID card to find out fault points, secondly developing test software with pertinence to the fault reasons to strengthen data packet sending, checking the accuracy of memory check data and screening the yield of the memory particles; compared with the prior art, the method for detecting the yield of the memory particles of the RAID card by sending the specific test data compares the sent data with the received data by means of the ECC function through the DDR bus of the memory particles, and confirms the bad degree of the particles. Has the characteristics of reasonable design, simple structure, easy processing, convenient use and the like, thereby having good use value.
Description
Technical field
The present invention relates to computer server unit test field, specifically a kind of method by sending fc-specific test FC Data Detection RAID card memory grain yield.
Background technology
Recent market uses certain Raid card product, in the normal course of operation of multiple server product, occur reporting an error of SignalECCError, system after reporting an error appears in Raid card, can be caused to delay machine.
Time this Raid is stuck in and SignalECCError occurs, just occur in the use long period, the use of a period of time just has probabilistic an appearance and reports an error.The shipment detection means of factory is single, the pressurization software of Yes+DD can only be used under an operating system to carry out applied voltage test to Raid card, but cannot cover the problem of bottom particle.
By investigating the analysis of fault Raid card, confirming that Nanya memory grain exists in Data signal and Clock signal Timing Automated generalization and postponing not.Therefore the signal delay for this particle internal memory is needed to test specially, screening Raid card.
Summary of the invention
The object of the invention is to overcome the deficiencies in the prior art, a kind of method by sending fc-specific test FC Data Detection RAID card memory grain yield is provided.
Technical scheme of the present invention realizes in the following manner, its feature is first to report an error reason analysis to Raid card internal memory, find trouble spot, secondly to failure cause development and testing software enhancement Packet Generation targetedly, check the accuracy of Memory Checkout data, the yield of screening memory grain;
Concrete grammar comprises:
(1) Clock and the Data transmission mechanism of memory grain is checked, specify the reason that memory grain reports an error;
(2) utilize software internally to deposit into row to give out a contract for a project and check internal memory process data accuracy with the mode received;
The basic reason of bad Raid card is analyzed:
Contrast from the internal storage data bus Data of non-defective unit Raid card and bad Raid card and clock waveform, Data data are identified when lock signal negative edge; From the wave form analysis of Fail, Clock negative edge and Data rising edge, almost a Timing position, cause Data data not to be correctly validated;
According to the control chip ECC data verifying function on Raid card, by sending the data of specific bit and reading Bit data whether carry out decision data wrong after internal memory process;
The Cleaning Principle of this test procedure: when Raid card Data processing there occurs Data data read errors, that will send an ECC bit errors record, and this record is taken as an ECC that can correct and reports an error and carry out reporting process; If when the shipment of multiple ECC bit, not repairable ECC will be become and report an error and report; Raid card FW is obtained the real-time ECC notice that reports an error and will be printed by testing software in calculation process process, thus finds that Raid card is bad.
Advantage of the present invention is:
A kind of method by sending fc-specific test FC Data Detection RAID card memory grain yield of the present invention compared to the prior art, by memory grain DDR bus, by ECC function, data are received to transmission data & and contrasts, confirm particle undesirable level.Have reasonable in design, structure simple, be easy to processing, the feature such as easy to use, thus, there is good use value.
Embodiment
Below a kind of method by sending fc-specific test FC Data Detection RAID card memory grain yield of the present invention is described in detail below.
A kind of method by sending fc-specific test FC Data Detection RAID card memory grain yield of the present invention, its feature is first to report an error reason analysis to Raid card internal memory, find trouble spot, secondly to failure cause development and testing software enhancement Packet Generation targetedly, check the accuracy of Memory Checkout data, the yield of screening memory grain;
Concrete grammar comprises:
(1) Clock and the Data transmission mechanism of memory grain is checked, specify the reason that memory grain reports an error;
(2) utilize software internally to deposit into row to give out a contract for a project and check internal memory process data accuracy with the mode received.
The present invention proposes a kind of method by sending fc-specific test FC Data Detection Raid card memory grain yield and solve bad Raid card for screening, meet supply of material demand.
The basic reason of the present invention to bad Raid card is analyzed:
Contrast from the internal storage data bus Data of non-defective unit Raid card and bad Raid card and clock waveform, Data data are identified when lock signal negative edge.From the wave form analysis of Fail, Clock negative edge and Data rising edge, almost a Timing position, cause Data data not to be correctly validated.
Carry out the comparison of wave shape of Raid card.
Control chip ECC data verifying function on Raid card, by sending the data of specific bit and reading Bit data whether carry out decision data wrong after internal memory process.
The Cleaning Principle of this test procedure: when Raid card Data processing there occurs Data data read errors, that will send an ECC bit errors record, and this record is taken as an ECC that can correct and reports an error and carry out reporting process.If when the shipment of multiple ECC bit, not repairable ECC will be become and report an error and report.Raid card FW is obtained the real-time ECC notice that reports an error and will be printed by testing software in calculation process process, thus finds that Raid card is bad.
By sending specific test Pattern to DDR.
By building a RAID6, carrying out FIO at RAID6, the ECC of data is detected.
Testing software prompting Pass, represents that particle does not occur internal memory bad.
Increase this method of testing by company entering factory's test phase, effectively can find Raid card particle bad hidden danger, filter out quality and the higher product of stability.
Above Raid card testing authentication means are in company for these Raid card test 2000 many cases, and screening finds the bad parts of example up to a hundred, embodies larger actual application value.
A kind of its processing and fabricating of method by sending fc-specific test FC Data Detection RAID card memory grain yield of the present invention is very simple and convenient, can process to specifications.
Except the technical characteristic described in instructions, be the known technology of those skilled in the art.
Claims (1)
1. the method by transmission fc-specific test FC Data Detection RAID card memory grain yield, it is characterized in that first reporting an error reason analysis to Raid card internal memory, find trouble spot, secondly to failure cause development and testing software enhancement Packet Generation targetedly, check the accuracy of Memory Checkout data, the yield of screening memory grain;
Concrete grammar comprises:
(1) Clock and the Data transmission mechanism of memory grain is checked, specify the reason that memory grain reports an error;
(2) utilize software internally to deposit into row to give out a contract for a project and check internal memory process data accuracy with the mode received;
The basic reason of bad Raid card is analyzed:
Contrast from the internal storage data bus Data of non-defective unit Raid card and bad Raid card and clock waveform, Data data are identified when lock signal negative edge; From the wave form analysis of Fail, Clock negative edge and Data rising edge, almost a Timing position, cause Data data not to be correctly validated;
According to the control chip ECC data verifying function on Raid card, by sending the data of specific bit and reading Bit data whether carry out decision data wrong after internal memory process;
The Cleaning Principle of this test procedure: when Raid card Data processing there occurs Data data read errors, that will send an ECC bit errors record, and this record is taken as an ECC that can correct and reports an error and carry out reporting process; If when the shipment of multiple ECC bit, not repairable ECC will be become and report an error and report; Raid card FW is obtained the real-time ECC notice that reports an error and will be printed by testing software in calculation process process, thus finds that Raid card is bad.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510893390.4A CN105551526B (en) | 2015-12-08 | 2015-12-08 | Method for detecting yield of RAID card memory particles by sending specific test data |
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| CN201510893390.4A CN105551526B (en) | 2015-12-08 | 2015-12-08 | Method for detecting yield of RAID card memory particles by sending specific test data |
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| CN105551526A true CN105551526A (en) | 2016-05-04 |
| CN105551526B CN105551526B (en) | 2019-09-06 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106502855A (en) * | 2016-10-24 | 2017-03-15 | 郑州云海信息技术有限公司 | A kind of test the method for positioning PMC RAID card memory grain problems |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101551767A (en) * | 2009-01-22 | 2009-10-07 | 浪潮电子信息产业股份有限公司 | Method for testing signal integrity of storage subsystem |
| CN103984650A (en) * | 2014-05-15 | 2014-08-13 | 浪潮电子信息产业股份有限公司 | Method for simulating memory ECC (error checking and correcting) ERROR generation device |
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2015
- 2015-12-08 CN CN201510893390.4A patent/CN105551526B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101551767A (en) * | 2009-01-22 | 2009-10-07 | 浪潮电子信息产业股份有限公司 | Method for testing signal integrity of storage subsystem |
| CN103984650A (en) * | 2014-05-15 | 2014-08-13 | 浪潮电子信息产业股份有限公司 | Method for simulating memory ECC (error checking and correcting) ERROR generation device |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106502855A (en) * | 2016-10-24 | 2017-03-15 | 郑州云海信息技术有限公司 | A kind of test the method for positioning PMC RAID card memory grain problems |
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| CN105551526B (en) | 2019-09-06 |
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