CN105548830A - High-voltage capacitor voltage withstanding testing method - Google Patents
High-voltage capacitor voltage withstanding testing method Download PDFInfo
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- CN105548830A CN105548830A CN201510893841.4A CN201510893841A CN105548830A CN 105548830 A CN105548830 A CN 105548830A CN 201510893841 A CN201510893841 A CN 201510893841A CN 105548830 A CN105548830 A CN 105548830A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
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Abstract
The invention discloses a high-voltage capacitor voltage withstanding testing method, a voltage withstanding test fixture device, a single-chip microcomputer temperature collection module and a PC temperature collection server are built, each temperature collection MCU collects temperature data, each MCU collects multiple temperature points, the temperature data of the multiple points which are collected by each temperature collection MCU are uploaded to the PC temperature collection server regularly periodically through a collection communication main MCU, and modules of a temperature real-time collection module, temperature record database, temperature point data display, fault temperature indication module and real-time temperature curve display of the PC temperature collection server realize functions of real-time collection, recording, display, fault indication, curve display and the like. The invention provides a high-voltage capacitor voltage withstanding testing method, the method rapidly discriminates a fault capacitor by collecting real-time temperature of a high-voltage capacitor, system hardware and software deployment is easy, and a control structure is simple and complete.
Description
Technical field
The present invention relates to a kind of high-voltage capacitor withstand voltage test method, belong to electromechanical integration, sensing and observation and control technology field.Be applicable to the production industries such as high-voltage capacitor, high voltage frequency converter, new forms of energy equipment.
Background technology
High-voltage capacitor is often referred to the aluminium electrolutic capacitor that operating voltage is greater than DC250V, capacity is greater than 1000uF.In the device fabrications such as industrial automation equipment, power supply, communications and transportation, new forms of energy, be unable to do without high-voltage capacitor.Along with the continuous progress of social productive forces, many industries get more and more to the demand of high-voltage capacitor.
High-voltage capacitor manufacturing enterprise, must carry out voltage-withstand test to each high-voltage capacitor.Traditional high-voltage capacitor withstand voltage test method is: be together in parallel by multiple high-voltage capacitor, be placed in the baking oven of constant temperature, to the logical upper constant current voltage source of high-voltage capacitor, DC voltage 1000V ~ 2000V(is adjustable), electric current 200mA, detect the leakage current situation of each high-voltage capacitor under high pressure resistant state, test time is 3 ~ 4 hours, abnormal products can cause severe self-healing because of inherent vice, phenomenon is product heating, leakage current obviously increases, along with time lengthening, product can lose efficacy because of overheated causing.Each high-voltage capacitor is when high direct voltage voltage-withstand test, and its normal leakage current is 0.5mA ~ 1mA; And the capacitor of continuous high-pressure like this can not be born, its single leakage current sports 10mA ~ 20mA, even higher.Once there be certain high-voltage capacitor can not bear continuous high-pressure like this, leakage current abrupt transients, high voltage obviously declines; High-voltage capacitor pressure resistant testing device is protected automatically, automatically closes high-voltage generator, and whole voltage-withstand test interrupts.The time of one side voltage-withstand test in early stage resets, and is difficult to find inefficacy capacitor on the other hand, and experienced operator examines the external form change of capacitor, the rising of feel temperature or tests the change of insulation resistance.
For the drawback in above-mentioned high-voltage capacitor voltage-withstand test, a kind of high-voltage capacitor withstand voltage test method of patented invention of the present invention.The method is by modern computer detection technique, bus mode is adopted to detect the real time temperature of each high-voltage capacitor, by the temperature raised feature of high-voltage capacitor, can find faulty capacitor fast and accurately, the present invention simultaneously effectively can improve Product checking qualification rate and the enterprises production efficiency of high-voltage capacitor.
Summary of the invention
Goal of the invention: the object of the invention is to solve in high-voltage capacitor test, faulty capacitor is difficult to screen, and a kind of high-voltage capacitor withstand voltage test method is proposed, the method, by gathering the real time temperature of each high-voltage capacitor, screens faulty capacitor fast.The inventive method can improve Product checking qualification rate and the enterprises production efficiency of high-voltage capacitor.
Technical scheme: a kind of high-voltage capacitor withstand voltage test method of the present invention, comprises the steps:
(1) high-voltage capacitor voltage withstanding test fixture device is built;
(2) the Chip Microprocessor Temperature acquisition module with multichannel temperature measurement function is built;
(3) module such as temperature Real-time Collection module, thermographic data storehouse, the display of each temperature spot data, Faulty Temperature indicating module, the display of real time temperature curve of PC temperature acquisition server is built;
(4) Chip Microprocessor Temperature acquisition module is connected with PC temperature acquisition server by communication interface, and Chip Microprocessor Temperature acquisition module and PC temperature acquisition server carry out intercoming mutually in real time;
(5) the main MCU of the collection communication of Chip Microprocessor Temperature acquisition module and each temperature acquisition MCU, is communicated to connect mutually by communication interface;
(6) each temperature acquisition MCU collecting temperature data, each MCU gathers multiple temperature spot, and each temperature spot is equipped with temperature sensor;
(7) the main MCU of the collection communication of Chip Microprocessor Temperature acquisition module, the multi-point temp data clocked period that each temperature acquisition MCU is collected upload to PC temperature acquisition server;
(8) the temperature Real-time Collection module of PC temperature acquisition server, gathers all high-voltage capacitor temperature datas, and temperature data is saved in thermographic data storehouse;
(9) each temperature spot data disaply moudle of PC temperature acquisition server, shows the real time temperature of each high-voltage capacitor;
(10) the Faulty Temperature point indicating module of PC temperature acquisition server, according to the temperature fault threshold values of setting in advance, the particular location of indication fault capacitor;
(11) the real time temperature curve display module of PC temperature acquisition server, shows the temperature curve of each high-voltage capacitor.
Further, high-voltage capacitor voltage withstanding test fixture device described in step comprises condenser terminal post, movable vee-block, flat board, fixing vee-block, wiring cap, torsionspring assembly and temperature sensor fixed support plate, described condenser terminal post is located on described flat board, described condenser terminal post is also provided with capacitor, described capacitor both sides are respectively equipped with movable vee-block and fixing vee-block, described movable vee-block is also connected with fixed block by guide rod, and described guide rod is also provided with spring; Described condenser terminal post top is provided with wiring cap, described wiring cap is connected with temperature sensor fixed support plate by torsionspring component activity, described temperature sensor fixed support plate is provided with temperature sensor, and described wiring cap is also electrically connected with high-voltage power-line.
Further, the contact position of described movable vee-block, fixing vee-block and described capacitor is also provided with thermal insulation board.
Further, described Chip Microprocessor Temperature acquisition module comprises the main MCU of collection communication, four temperature acquisition MCU and 120 each temperature acquisition points, the main MCU of described collection communication and temperature acquisition MCU is communicated to connect by RS485 communication interface, and each temperature acquisition MCU is connected with 30 temperature acquisition points.
Further, the main MCU of described collection communication is single-chip microcomputer STM32F105, temperature acquisition MCU is single-chip microcomputer STM32F105.
Further, described temperature sensor adopts water-proof surface pasting type temperature sensor DS18B20.
Further, the lateral wall close contact of described temperature sensor and capacitor.
Further, described Chip Microprocessor Temperature acquisition module is connected with PC temperature acquisition server by RS232 communication interface, and wherein communication protocol has CRC check function.
Further, the temperature value of described temperature acquisition MCU on each temperature acquisition point temperature sensor below 2-4 gathers second, the temperature value that the main MCU of collection communication preserves on each temperature acquisition MCU below 4-6 gathers second, the main MCU of collection communication uploads once all test point temperature values every 8-12 second simultaneously.
Beneficial effect: the present invention proposes a kind of high-voltage capacitor withstand voltage test method, the method, by gathering the real time temperature of high-voltage capacitor, screens faulty capacitor fast, and system hardware Software deployment is easy, and control structure is concisely complete.
Accompanying drawing explanation
Fig. 1 is high-voltage capacitor voltage withstanding test fixture structural representation of the present invention;
Fig. 2 is the clamped condition structural representation of Fig. 1 high-voltage capacitor voltage withstanding test fixture;
Fig. 3 is high-tension electricity depressor voltage-withstand test temperature acquisition theory structure block diagram of the present invention.
Embodiment
In order to make the object, technical solutions and advantages of the present invention more clear understandable, below in conjunction with drawings and Examples, the present invention is described in further details.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.
The present invention proposes a kind of high-voltage capacitor withstand voltage test method, and each high-voltage capacitor of the present embodiment uses high-tension electricity depressor voltage withstanding test fixture device.As depicted in figs. 1 and 2, this high-voltage capacitor voltage withstanding test fixture device comprises condenser terminal post 1, movable vee-block 3, flat board 8, fixing vee-block 9, wiring cap 10, torsionspring assembly 13 and temperature sensor fixed support plate 11, described condenser terminal post 1 is located on described dull and stereotyped 8, described condenser terminal post 1 is also provided with capacitor 2, described capacitor 2 both sides are respectively equipped with movable vee-block 3 and fixing vee-block 9, described movable vee-block 3 is also connected with fixed block 5 by guide rod 6, and described guide rod 6 is also provided with spring 4; Described condenser terminal post 1 top is provided with wiring cap 10, described wiring cap 10 is connected with temperature sensor fixed support plate 11 by torsionspring assembly 13, described temperature sensor fixed support plate 11 is provided with temperature sensor 14, and described wiring cap 10 is also electrically connected with high-voltage power-line 12.
Further, described movable vee-block 3, fixing vee-block 9 are also provided with thermal insulation board 7 with the contact position of described capacitor 2.
The present embodiment also uses 1 PC temperature acquisition server, 1 sleeving temperature acquisition software, 1 cover MySQL database, uses 1 piece of Chip Microprocessor Temperature acquisition module, 1 high-voltage capacitor test oven, 120 high-voltage capacitors, 120 water-proof surface pasting type temperature sensor DS18B20.
As shown in Figure 3, Chip Microprocessor Temperature acquisition module comprises the main MCU of collection communication, four temperature acquisition MCU and 120 each temperature acquisition points, the main MCU of described collection communication and temperature acquisition MCU is communicated to connect by RS485 communication interface, and each temperature acquisition MCU is connected with 30 temperature acquisition points.Chip Microprocessor Temperature acquisition module is connected with PC temperature acquisition server by RS232 communication interface, and wherein communication protocol has CRC check function.The main MCU of collection communication is single-chip microcomputer STM32F105, temperature acquisition MCU is single-chip microcomputer STM32F105.
A kind of high-voltage capacitor withstand voltage test method of the present invention, its concrete operation step comprises:
Step 1, each high-voltage capacitor are put into voltage withstanding test fixture device, and are in clamped condition, and on each fixture, oneself is equipped with water-proof surface pasting type temperature sensor DS18B20.
Step 2,120 water-proof surface pasting type temperature sensor DS18B20, points 4 groups by bus mode with gather MCU1-MCU4 and be connected, 120 high-voltage capacitors to be tested are installed, connected mode is parallel connection.
The RS232 of step 3, the RS232 connecting Chip Microprocessor Temperature acquisition module 17 by Shielded Twisted Pair and PC temperature acquisition server 18.
Step 4, on PC temperature acquisition server 23, install MySQL database and temperature acquisition software, temperature acquisition software comprises: temperature Real-time Collection module 18, thermographic data storehouse 19, each temperature spot display module 20, Faulty Temperature indicating module 21, real time temperature curve display module 22; Start MySQL database and temperature acquisition software simultaneously.
In step 5, each temperature spot display module, design temperature alarming threshold value is 80 ° of C, and when in test process, high-voltage capacitor side temperature is faulty capacitor more than the high-voltage capacitor of 80 ° of C.
Step 6, to power on to baking oven, and to set oven temperature be 70 ° of C.
Step 7, to power on to Chip Microprocessor Temperature acquisition module.
Step 8, to the logical upper 2000V DC voltage of 120 testing high voltage capacitors.
Step 9, test duration continue 4 hours.
Step 10, test period, gather the temperature value of MCU1-MCU4 on 30 temperature sensor DS18B20 below gathering for 3 seconds, the temperature value that the main MCU of collection communication preserves on 4 collection MCU1-MCU4 below gathering for 5 seconds, the main MCU of collection communication uploaded once all 120 test point temperature values every 10 seconds simultaneously.
Temperature Real-time Collection module 18 on step 11, PC temperature acquisition server 23 receives the temperature data that the main MCU17 of collection communication uploads, CRC check is carried out to temperature data, if data check is correct, temperature Real-time Collection module 18 is saved in temperature data in MySQL database.
Step 12, each temperature spot data disaply moudle 20 show the temperature of each temperature spot.
Step 13, temperature curve display module 22, the temperature curve of each temperature spot of display directly perceived.
In step 14, test process, Faulty Temperature indicating module 21, according to the threshold temperature of earlier set, once the temperature value of high-voltage capacitor exceedes the threshold temperature of setting, the particular location of Faulty Temperature indicating module indication fault high-voltage capacitor.
The present invention proposes a kind of high-voltage capacitor withstand voltage test method, and the method, by gathering the real time temperature of high-voltage capacitor, screens faulty capacitor fast, and system hardware Software deployment is easy, and control structure is concisely complete.The temperature of each high-voltage capacitor and the temperature curve of each high-voltage capacitor of display directly perceived can be shown simultaneously, have succinctly, reliably, advantage intuitively.
The above, it is only preferred embodiment of the present invention, not any pro forma restriction is done to the present invention, although the present invention discloses as above with preferred embodiment, but and be not used to limit the present invention, any those skilled in the art, do not departing within the scope of technical solution of the present invention, make a little change when the technology contents of above-mentioned announcement can be utilized or be modified to the Equivalent embodiments of equivalent variations, in every case be the content not departing from technical solution of the present invention, according to any simple modification that technical spirit of the present invention is done above embodiment, equivalent variations and modification, all still belong in the scope of technical solution of the present invention.
Claims (9)
1. a high-voltage capacitor withstand voltage test method, is characterized in that: comprise the steps:
(1) high-voltage capacitor voltage withstanding test fixture device is built;
(2) the Chip Microprocessor Temperature acquisition module with multichannel temperature measurement function is built;
(3) module such as temperature Real-time Collection module, thermographic data storehouse, the display of each temperature spot data, Faulty Temperature indicating module, the display of real time temperature curve of PC temperature acquisition server is built;
(4) Chip Microprocessor Temperature acquisition module is connected with PC temperature acquisition server by communication interface, and Chip Microprocessor Temperature acquisition module and PC temperature acquisition server carry out intercoming mutually in real time;
(5) the main MCU of the collection communication of Chip Microprocessor Temperature acquisition module and each temperature acquisition MCU, is communicated to connect mutually by communication interface;
(6) each temperature acquisition MCU collecting temperature data, each MCU gathers multiple temperature spot, and each temperature spot is equipped with temperature sensor;
(7) the main MCU of the collection communication of Chip Microprocessor Temperature acquisition module, the multi-point temp data clocked period that each temperature acquisition MCU is collected upload to PC temperature acquisition server;
(8) the temperature Real-time Collection module of PC temperature acquisition server, gathers all high-voltage capacitor temperature datas, and temperature data is saved in thermographic data storehouse;
(9) each temperature spot data disaply moudle of PC temperature acquisition server, shows the real time temperature of each high-voltage capacitor;
(10) the Faulty Temperature point indicating module of PC temperature acquisition server, according to the temperature fault threshold values of setting in advance, the particular location of indication fault capacitor;
(11) the real time temperature curve display module of PC temperature acquisition server, shows the temperature curve of each high-voltage capacitor.
2. a kind of high-voltage capacitor withstand voltage test method according to claim 1, it is characterized in that: step (1) described high-voltage capacitor voltage withstanding test fixture device comprises condenser terminal post (1), movable vee-block (3), dull and stereotyped (8), fixing vee-block (9), wiring cap (10), torsionspring assembly (13) and temperature sensor fixed support plate (11), described condenser terminal post (1) is located on described flat board (8), described condenser terminal post (1) is also provided with capacitor (2), described capacitor (2) both sides are respectively equipped with movable vee-block (3) and fixing vee-block (9), described movable vee-block (3) is also connected with fixed block (5) by guide rod (6), described guide rod (6) is also provided with spring (4), described condenser terminal post (1) top is provided with wiring cap (10), described wiring cap (10) is connected with temperature sensor fixed support plate (11) by torsionspring assembly (13), described temperature sensor fixed support plate (11) is provided with temperature sensor (14), described wiring cap (10) is also electrically connected with high-voltage power-line (12).
3. a kind of high-voltage capacitor withstand voltage test method according to claim 2, is characterized in that: described movable vee-block (3), fixing vee-block (9) are also provided with thermal insulation board (7) with the contact position of described capacitor (2).
4. a kind of high-voltage capacitor withstand voltage test method according to claim 1, it is characterized in that: described Chip Microprocessor Temperature acquisition module comprises the main MCU of collection communication, four temperature acquisition MCU and 120 each temperature acquisition points, the main MCU of described collection communication and temperature acquisition MCU is communicated to connect by RS485 communication interface, and each temperature acquisition MCU is connected with 30 temperature acquisition points.
5. a kind of high-voltage capacitor withstand voltage test method according to claim 4, is characterized in that: the main MCU of described collection communication is single-chip microcomputer STM32F105, temperature acquisition MCU is single-chip microcomputer STM32F105.
6. a kind of high-voltage capacitor withstand voltage test method according to claim 1 and 2, is characterized in that: described temperature sensor adopts water-proof surface pasting type temperature sensor DS18B20.
7. a kind of high-voltage capacitor withstand voltage test method according to claim 6, is characterized in that: the lateral wall close contact of described temperature sensor and capacitor.
8. a kind of high-voltage capacitor withstand voltage test method according to claim 1, is characterized in that: described Chip Microprocessor Temperature acquisition module is connected with PC temperature acquisition server by RS232 communication interface, and wherein communication protocol has CRC check function.
9. a kind of high-voltage capacitor withstand voltage test method according to claim 1, it is characterized in that: the temperature value of described temperature acquisition MCU on each temperature acquisition point temperature sensor below 2-4 gathers second, the temperature value that the main MCU of collection communication preserves on each temperature acquisition MCU below 4-6 gathers second, the main MCU of collection communication uploads once all test point temperature values every 8-12 second simultaneously.
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| CN201510893841.4A CN105548830B (en) | 2015-12-08 | 2015-12-08 | A kind of high-voltage capacitor voltage-withstand test method |
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| EP0012721A1 (en) * | 1978-12-08 | 1980-06-25 | Forschungskommission des SEV und VSE für Hochspannungsfragen (FKH) | High tension testing installation |
| DE4240877A1 (en) * | 1992-12-04 | 1994-06-09 | Hagenuk Telecom Gmbh | Insulation testing of high voltage systems - involves applying high voltage for milliseconds via large capacitance, isolating object and measuring voltage-time characteristic |
| CN201965159U (en) * | 2011-04-06 | 2011-09-07 | 铜陵市文峰电子有限责任公司 | Capacitor voltage withstanding test fixture |
| CN203084014U (en) * | 2013-02-20 | 2013-07-24 | 铜陵市胜达电子器件有限责任公司 | Convenient-to-adjust capacitor withstand voltage test fixture |
| CN204116531U (en) * | 2014-08-07 | 2015-01-21 | 安徽源光电器有限公司 | A kind of capacitor finished product pressure resistant testing device |
| CN204287252U (en) * | 2014-12-25 | 2015-04-22 | 铜陵市新洲电子科技有限责任公司 | Voltage-withstand test holder between capacitor pole |
| CN104597363A (en) * | 2013-10-31 | 2015-05-06 | 南通富士特电力自动化有限公司 | Capacitor testing device and capacitor testing method |
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2015
- 2015-12-08 CN CN201510893841.4A patent/CN105548830B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0012721A1 (en) * | 1978-12-08 | 1980-06-25 | Forschungskommission des SEV und VSE für Hochspannungsfragen (FKH) | High tension testing installation |
| DE4240877A1 (en) * | 1992-12-04 | 1994-06-09 | Hagenuk Telecom Gmbh | Insulation testing of high voltage systems - involves applying high voltage for milliseconds via large capacitance, isolating object and measuring voltage-time characteristic |
| CN201965159U (en) * | 2011-04-06 | 2011-09-07 | 铜陵市文峰电子有限责任公司 | Capacitor voltage withstanding test fixture |
| CN203084014U (en) * | 2013-02-20 | 2013-07-24 | 铜陵市胜达电子器件有限责任公司 | Convenient-to-adjust capacitor withstand voltage test fixture |
| CN104597363A (en) * | 2013-10-31 | 2015-05-06 | 南通富士特电力自动化有限公司 | Capacitor testing device and capacitor testing method |
| CN204116531U (en) * | 2014-08-07 | 2015-01-21 | 安徽源光电器有限公司 | A kind of capacitor finished product pressure resistant testing device |
| CN204287252U (en) * | 2014-12-25 | 2015-04-22 | 铜陵市新洲电子科技有限责任公司 | Voltage-withstand test holder between capacitor pole |
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Effective date of registration: 20210111 Address after: 226300 No.98 Airport Road, Xingdong Town, Tongzhou District, Nantong City, Jiangsu Province Patentee after: NANTONG RUITAI ELECTRONIC Co.,Ltd. Address before: 226000 No. 9 Siyuan Road, Chongchuan District, Nantong City, Jiangsu Province Patentee before: NANTONG University |
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