CN105527564B - Fpga内部功能自诊断方法与系统 - Google Patents
Fpga内部功能自诊断方法与系统 Download PDFInfo
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- CN105527564B CN105527564B CN201511006206.6A CN201511006206A CN105527564B CN 105527564 B CN105527564 B CN 105527564B CN 201511006206 A CN201511006206 A CN 201511006206A CN 105527564 B CN105527564 B CN 105527564B
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- 230000006870 function Effects 0.000 title claims abstract description 33
- 238000000034 method Methods 0.000 title claims abstract description 24
- 238000004092 self-diagnosis Methods 0.000 title abstract description 8
- 230000002159 abnormal effect Effects 0.000 claims abstract description 46
- 238000012937 correction Methods 0.000 claims description 24
- 238000012795 verification Methods 0.000 claims description 8
- 238000012360 testing method Methods 0.000 claims description 4
- 238000012545 processing Methods 0.000 claims description 3
- 230000002045 lasting effect Effects 0.000 claims description 2
- 230000008569 process Effects 0.000 abstract description 5
- 125000004122 cyclic group Chemical group 0.000 abstract description 2
- 238000005516 engineering process Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000007493 shaping process Methods 0.000 description 2
- 230000006641 stabilisation Effects 0.000 description 2
- 238000011105 stabilization Methods 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3187—Built-in tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318516—Test of programmable logic devices [PLDs]
- G01R31/318519—Test of field programmable gate arrays [FPGA]
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Detection And Prevention Of Errors In Transmission (AREA)
- Detection And Correction Of Errors (AREA)
Abstract
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Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201511006206.6A CN105527564B (zh) | 2015-12-25 | 2015-12-25 | Fpga内部功能自诊断方法与系统 |
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CN201511006206.6A CN105527564B (zh) | 2015-12-25 | 2015-12-25 | Fpga内部功能自诊断方法与系统 |
Publications (2)
Publication Number | Publication Date |
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CN105527564A CN105527564A (zh) | 2016-04-27 |
CN105527564B true CN105527564B (zh) | 2017-07-04 |
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CN201511006206.6A Active CN105527564B (zh) | 2015-12-25 | 2015-12-25 | Fpga内部功能自诊断方法与系统 |
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CN (1) | CN105527564B (zh) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108267683A (zh) * | 2017-01-04 | 2018-07-10 | 中兴通讯股份有限公司 | 一种fpga自测的方法及装置 |
CN110069366B (zh) * | 2018-01-24 | 2023-09-26 | 阿里巴巴集团控股有限公司 | 一种重加载方法、装置及服务器 |
CN109597765A (zh) * | 2018-12-11 | 2019-04-09 | 郑州云海信息技术有限公司 | 一种fpga的处理器指令调试方法、装置及电子设备 |
CN111896865B (zh) * | 2020-07-30 | 2021-06-25 | 电子科技大学 | 信号采集系统故障部位检测方法 |
CN112199323A (zh) * | 2020-10-12 | 2021-01-08 | 南方电网数字电网研究院有限公司 | 电力系统继电保护SoC芯片 |
CN114928465B (zh) * | 2022-03-22 | 2023-08-29 | 广州汽车集团股份有限公司 | 报文校验方法、装置、交通工具以及存储介质 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6237124B1 (en) * | 1998-03-16 | 2001-05-22 | Actel Corporation | Methods for errors checking the configuration SRAM and user assignable SRAM data in a field programmable gate array |
US6874107B2 (en) * | 2001-07-24 | 2005-03-29 | Xilinx, Inc. | Integrated testing of serializer/deserializer in FPGA |
CN1536486A (zh) * | 2003-04-04 | 2004-10-13 | 上海华园微电子技术有限公司 | 可自测试的带微处理器的智能卡芯片 |
US7409594B2 (en) * | 2004-07-06 | 2008-08-05 | Intel Corporation | System and method to detect errors and predict potential failures |
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- 2015-12-25 CN CN201511006206.6A patent/CN105527564B/zh active Active
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Effective date of registration: 20210810 Address after: 510663 3 building, 3, 4, 5 and J1 building, 11 building, No. 11, Ke Xiang Road, Luogang District Science City, Guangzhou, Guangdong. Patentee after: China South Power Grid International Co.,Ltd. Patentee after: BEIJING SIFANG AUTOMATION Co.,Ltd. Patentee after: ELECTRIC POWER SCIENCE & RESEARCH INSTITUTE OF GUANGXI POWER GRID Corp. Patentee after: ELECTRIC POWER RESEARCH INSTITUTE, GUIZHOU POWER GRID Co.,Ltd. Address before: 13-21 / F, West Tower, Yuedian building, No.6 and 8 shuijungang, Dongfeng East Road, Yuexiu District, Guangzhou, Guangdong 510000 Patentee before: POWER GRID TECHNOLOGY RESEARCH CENTER. CHINA SOUTHERN POWER GRID Patentee before: China South Power Grid International Co.,Ltd. Patentee before: BEIJING SIFANG AUTOMATION Co.,Ltd. Patentee before: ELECTRIC POWER SCIENCE & RESEARCH INSTITUTE OF GUANGXI POWER GRID Corp. Patentee before: ELECTRIC POWER RESEARCH INSTITUTE, GUIZHOU POWER GRID Co.,Ltd. |