CN105513993B - A kind of quality inspection device when being used for double-legged dichromatic LED bending and molding - Google Patents

A kind of quality inspection device when being used for double-legged dichromatic LED bending and molding Download PDF

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Publication number
CN105513993B
CN105513993B CN201610086460.XA CN201610086460A CN105513993B CN 105513993 B CN105513993 B CN 105513993B CN 201610086460 A CN201610086460 A CN 201610086460A CN 105513993 B CN105513993 B CN 105513993B
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China
Prior art keywords
hole
probes
double
inspecting hole
legged
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CN105513993A (en
Inventor
杜思元
顾萍萍
汪扬
杜春荣
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Taicang T&W Electronics Co Ltd
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Taicang T&W Electronics Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/34Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Led Devices (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The present invention relates to double-legged dichromatic LED to assemble field, a kind of more particularly to quality inspection device when being used for double-legged dichromatic LED bending and molding, including main body (1), A probes and B probes, the side of main body (1) is provided with the first inspecting hole (2) and the second inspecting hole (3) that aperture is 2.5mm, the horizontal range of first inspecting hole (2) and the second inspecting hole (3) is 5.5mm, vertical range is 13mm, the top surface of the main body (1) is provided with the hole for the double pin insertions of diode, the hole one of them be connected straight down with the first inspecting hole (2), another is connected with the second inspecting hole (3) straight down;The A probes and B probes can insert from the first inspecting hole (2) and the second inspecting hole (3) respectively.The present invention realizes pin detection of the diode in shaping, and whole test process simple and fast, test is accurate, improves whole production efficiency and quality.

Description

A kind of quality inspection device when being used for double-legged dichromatic LED bending and molding
Technical field
The present invention relates to double-legged dichromatic LED to assemble field, more particularly to one kind is used for the double-legged pole of dual color light emitting two Quality inspection device during pipe bending and molding.
Background technology
At present, double-legged two-color diode uses more and more in Electronic products manufacturing field, similar in color also increasingly It is more, in the double-colored double-legged diode of similar blood orange.If needed in assembling using the pin of mechanical bending diode after the final shaping The quality of diode is detected, but the diode after mechanical deflection aftershaping, can not be to diode and its pin Quality is detected.
The content of the invention
It is an object of the invention to provide it is a kind of be used for double-legged dichromatic LED bending and molding when quality inspection device, solution The problem of can not certainly being detected to the double-legged dichromatic LED quality after bending forming in the prior art.
To solve the above problems, the technical solution used in the present invention is:
A kind of quality inspection device when being used for double-legged dichromatic LED bending and molding, including main body, A probes and B probes, The side of main body is provided with the first inspecting hole and the second inspecting hole that aperture is 2.5mm, the level of first inspecting hole and the second inspecting hole Distance is 5.5mm, and vertical range 13mm, the top surface of the main body is provided with the hole for the double pins insertions of diode, and the hole is wherein One is connected with the first inspecting hole straight down, and another is connected with the second inspecting hole straight down;The A probes and B probes It can be inserted respectively from the first inspecting hole and the second inspecting hole.
Further, the main body is formed for transparent insulation glass.
It is using beneficial effect caused by above-mentioned technical proposal:The present invention realizes pin of the diode in shaping Detection, whole test process simple and fast, test is accurate, improves whole production efficiency and quality.
Brief description of the drawings
The structural representation for the quality inspection device that Fig. 1 is that the present invention is a kind of when being used for double-legged dichromatic LED bending and molding Figure.
Fig. 2 is the view of present invention test defective products.
Fig. 3 is the view of present invention test non-defective unit.
Embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, it is right below in conjunction with drawings and Examples The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and It is not used in the restriction present invention.
One reality of the quality inspection device that Fig. 1 shows that the present invention is a kind of when being used for double-legged dichromatic LED bending and molding Apply example:A kind of quality inspection device when being used for double-legged dichromatic LED bending and molding, including main body 1, A probes and B probes, it is main The side of body 1 is provided with the first inspecting hole 2 and the second inspecting hole 3 that aperture is 2.5mm, the water of the inspecting hole 3 of the first inspecting hole 2 and second Flat distance be 5.5mm, vertical range 13mm, and the top surface of the main body 1 is provided with the hole inserted for the double pins of diode, the hole its In one be connected straight down with the first inspecting hole 2, another is connected with the second inspecting hole 3 straight down;The A probes and B Probe can insert from the first inspecting hole 2 and the second inspecting hole 3 respectively.
According to invent it is a kind of be used for double-legged dichromatic LED bending and molding when another of quality inspection device implement, institute Main body 1 is stated to form for transparent insulation glass.
The occupation mode of the present invention is as follows:
Early-stage preparations
Material type is identified, confirmation belongs to double-legged two-color diode and especially pays attention to the double-colored diode of blood orange, its electrical parameter It is sufficiently close to, in general diode tester None- identified, its long-short foot is needed in more than 2.5MM;
As shown in Fig. 2 test out defective products using the present apparatus
The short pin of double-legged two-color diode is inserted from the top surface of main body 1, visited respectively from first using A probes and B probes The inspecting hole 3 of hole 2 and second inserts, if A probes can touch the pin of diode, and B probes are not exposed to diode Pin, then B probes can not feed back to current signal, then belong to defective products.
As shown in figure 3, test out non-defective unit using the present apparatus
The short pin of double-legged two-color diode is inserted from the top surface of main body 1, visited respectively from first using A probes and B probes The inspecting hole 3 of hole 2 and second inserts, if A probes can touch the pin of diode, and B probes also touch diode simultaneously Pin, then A probes and B probes feed back to current signal, then belong to non-defective unit.
Although reference be made herein to invention has been described for multiple explanatory embodiments of the invention, however, it is to be understood that Those skilled in the art can be designed that a lot of other modifications and embodiment, and these modifications and embodiment will fall in this Shen Please be within disclosed spirit and spirit.More specifically, can in the range of disclosure, drawings and claims A variety of variations and modifications are carried out with the building block to theme combination layout and/or layout.Except to building block and/or layout Outside the modification and improvement of progress, to those skilled in the art, other purposes also will be apparent.

Claims (1)

  1. A kind of 1. quality inspection device when being used for double-legged dichromatic LED bending and molding, it is characterised in that:Including by transparent exhausted Main body (1), A probes and the B probes that edge glass is formed, the side of the main body (1) are provided with the first inspecting hole that aperture is 2.5mm (2) and the second inspecting hole (3), the horizontal range of first inspecting hole (2) and the second inspecting hole (3) is 5.5mm, and vertical range is 13mm, the top surface of the main body (1) are provided with the hole for the double pins insertions of diode, the hole one of them visited straight down with first Hole (2) is connected, and another is connected with the second inspecting hole (3) straight down;The A probes and B probes can be visited from first respectively Hole (2) and the second inspecting hole (3) insertion.
CN201610086460.XA 2016-02-16 2016-02-16 A kind of quality inspection device when being used for double-legged dichromatic LED bending and molding Active CN105513993B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610086460.XA CN105513993B (en) 2016-02-16 2016-02-16 A kind of quality inspection device when being used for double-legged dichromatic LED bending and molding

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610086460.XA CN105513993B (en) 2016-02-16 2016-02-16 A kind of quality inspection device when being used for double-legged dichromatic LED bending and molding

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CN105513993A CN105513993A (en) 2016-04-20
CN105513993B true CN105513993B (en) 2018-01-05

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202661566U (en) * 2012-06-14 2013-01-09 东莞市新泽谷机械制造股份有限公司 Detector for pin of electronic element
CN103091521A (en) * 2013-01-08 2013-05-08 上海交通大学 Method of probe and lead foot automatic aiming and probe station testing system thereof
CN103406290A (en) * 2013-08-15 2013-11-27 重庆市金籁电子科技有限公司 Electronic component foot cutting method
CN203551721U (en) * 2013-11-18 2014-04-16 无锡俊达测试技术服务有限公司 LED light foot polarity detection device
CN104889288A (en) * 2015-05-07 2015-09-09 太仓市同维电子有限公司 Bending formation method of three-foot double-color light-emitting diode

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3463395B2 (en) * 1995-02-22 2003-11-05 株式会社デンソー Optical power measurement device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202661566U (en) * 2012-06-14 2013-01-09 东莞市新泽谷机械制造股份有限公司 Detector for pin of electronic element
CN103091521A (en) * 2013-01-08 2013-05-08 上海交通大学 Method of probe and lead foot automatic aiming and probe station testing system thereof
CN103406290A (en) * 2013-08-15 2013-11-27 重庆市金籁电子科技有限公司 Electronic component foot cutting method
CN203551721U (en) * 2013-11-18 2014-04-16 无锡俊达测试技术服务有限公司 LED light foot polarity detection device
CN104889288A (en) * 2015-05-07 2015-09-09 太仓市同维电子有限公司 Bending formation method of three-foot double-color light-emitting diode

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