CN105467452B - A kind of method and device that static correction is carried out to transitional region - Google Patents
A kind of method and device that static correction is carried out to transitional region Download PDFInfo
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Abstract
The application provides a kind of method and device that static correction is carried out to transitional region, wherein, methods described includes：According to the result for carrying out chromatographing modeling and refracted wave models to region to be measured, the transitional region of chromatography modeling and refracted wave modeling in the region to be measured is determined；Determine the low velocity layer thickness and top layer average speed of the transitional region；According to the low velocity layer thickness and top layer average speed of determination, the static correction value of the transitional region is determined.A kind of method and device that static correction is carried out to transitional region that the embodiment of the present application provides, can accurately determine static correction value corresponding to transitional region, so as to be accurately imaged to region to be measured.
Description
Technical field
The application is related to geophysical exploration method, more particularly to a kind of method and dress that static correction is carried out to transitional region
Put.
Background technology
In geophysical exploration, first arrival refraction static correction method is the main method for solving the problems, such as complex area static correction.
At present, first arrival refraction static correction method mainly has：Refractive wave static correction method and tomographic statics method.Wherein, refracted wave
Static correcting method is suitable for, known to top layer speed or thickness and with the area for stablizing refracting layer, especially having what is be substantially layered
Massif area, the massif area significant effect of particularly old stratum exposure；Tomographic statics method is not limited by surface conditions, is adapted to
Near-surface model invertings are carried out in various complicated terrain areas, particularly in the huge thick gobi gravel area of weathered layer, in solution, long wavelength
Static correction problem positive effect.
However, it is complex for surface conditions, cover the exploration area of various geologic structures, above-mentioned first arrival refraction static correction
Method is all difficult to the near-surface model for solving the problems, such as whole, and especially in the adjacent transitional region of multiple geologic structures, above-mentioned is first
Can not accurately it be imaged to ripple static correcting method.
It should be noted that the introduction to technical background above be intended merely to the convenient technical scheme to the application carry out it is clear,
Complete explanation, and facilitate the understanding of those skilled in the art and illustrate.Can not merely because these schemes the application's
Background section is set forth and thinks that above-mentioned technical proposal is known to those skilled in the art.
The content of the invention
The purpose of the embodiment of the present application is to provide a kind of method and device for carrying out transitional region static correction, with accurate
Ground determines static correction value corresponding to transitional region, so as to be accurately imaged to region to be measured.
What a kind of method and device that static correction is carried out to transitional region that the embodiment of the present application provides was realized in：
A kind of method that static correction is carried out to transitional region, including：
According to the result for carrying out chromatographing modeling and refracted wave models to region to be measured, determine to chromatograph in the region to be measured and build
Mould and the transitional region of refracted wave modeling；
Determine the low velocity layer thickness and top layer average speed of the transitional region；
According to the low velocity layer thickness and top layer average speed of determination, the static correction value of the transitional region is determined.
A kind of device that static correction is carried out to transitional region, including：
Transitional region determining unit, to region to be measured chromatograph the result of modeling and refracted wave modeling for basis, really
The transitional region of chromatography modeling and refracted wave modeling in the fixed region to be measured；
Transitional region parameter determination unit, for the average speed of low velocity layer thickness and top layer for determining the transitional region
Degree；
Static correction value determining unit, for the low velocity layer thickness and top layer average speed according to determination, determine institute
State the static correction value of transitional region.
A kind of method and device that static correction is carried out to transitional region that the embodiment of the present application provides, is built by combining chromatography
Mould and the result of refracted wave modeling, are determined in region to be measured after the scope of transitional region, to the sinking in the transitional region
Speed belt thickness and top layer average speed are analyzed, and may thereby determine that out the static correction value in the transitional region.Further
Ground, by distinguishing in transitional region second corresponding to the first weight coefficient corresponding to calculating computed tomography modeling and refracted wave modeling
Weight coefficient, so as to be determined exactly to the low velocity layer thickness in transitional region and top layer average speed, so as to
The imaging precision in transitional region can be improved.
With reference to following explanation and accompanying drawing, the particular implementation of the application is disclose in detail, specifies the original of the application
Reason can be in a manner of adopted.It should be understood that presently filed embodiment is not so limited in scope.In appended power
In the range of the spirit and terms that profit requires, presently filed embodiment includes many changes, modifications and is equal.
The feature for describing and/or showing for a kind of embodiment can be in a manner of same or similar one or more
Used in individual other embodiment, it is combined with the feature in other embodiment, or substitute the feature in other embodiment.
It should be emphasized that term "comprises/comprising" refers to the presence of feature, one integral piece, step or component when being used herein, but simultaneously
It is not excluded for the presence or additional of one or more further features, one integral piece, step or component.
Brief description of the drawings
Included accompanying drawing is used for providing being further understood from the embodiment of the present application, which constitutes one of specification
Point, for illustrating presently filed embodiment, and come together with word description to explain the principle of the application.Under it should be evident that
Accompanying drawing in the description of face is only some embodiments of the present application, for those of ordinary skill in the art, is not paying wound
On the premise of the property made is laborious, other accompanying drawings can also be obtained according to these accompanying drawings.In the accompanying drawings：
Fig. 1 is a kind of method flow diagram that static correction is carried out to transitional region that the embodiment of the present application provides；
Fig. 2 is the schematic diagram that transition zone area is determined in the embodiment of the present application；
Fig. 3 is a kind of apparatus function module map that static correction is carried out to transitional region that the embodiment of the present application provides.
Embodiment
In order that those skilled in the art more fully understand the technical scheme in the application, it is real below in conjunction with the application
The accompanying drawing in example is applied, the technical scheme in the embodiment of the present application is clearly and completely described, it is clear that described implementation
Example only some embodiments of the present application, rather than whole embodiments.It is common based on the embodiment in the application, this area
All other embodiment that technical staff is obtained under the premise of creative work is not made, it should all belong to the application protection
Scope.
Inventor gradually drive ons complex prospecting area boldly in view of current seismic prospecting, and surface conditions are typically complex, contains
Various geologic structures are covered, this make it that using single preliminary wave modeling method be difficult to solve the problems, such as whole near-surface models, especially
In the adjacent transitional region of multiple geologic structures, the method modeled using single preliminary wave can not be accurately imaged.
Therefore the method that can be modeled by combining chromatography modeling with refracted wave, is accurately imaged to transitional region.
Fig. 1 is a kind of method flow diagram that static correction is carried out to transitional region that the embodiment of the present application provides.Although hereafter
Multiple operations that flow includes occurring with particular order are described, but it should be clearly understood that these processes can include it is more or
Less operation, these operations sequentially can be performed or performed parallel (such as using parallel processor or multi-thread environment).Such as
Shown in Fig. 1, methods described can include：
S1：According to the result for carrying out chromatographing modeling and refracted wave models to region to be measured, the region middle level to be measured is determined
Analysis modeling and the transitional region of refracted wave modeling.
, all can not be accurate using only chromatography modeling or refracted wave modeling for the region to be measured with complicated geological structure
Really reflect the true geologic structure in region to be measured.The embodiment of the present application can combine the chromatography modeling and the refracted wave
The result of modeling, the region to be measured is imaged exactly.The embodiment of the present application can pass through chromatography and refraction respectively
Ripple method is modeled to the region to be measured, corresponding so as to obtain the first modeling result corresponding to chromatography and refraction wave
The second modeling result.Here it is that this area is ripe that the chromatography and refraction wave used is modeled to region to be measured
Technological means, just repeat no more here.
After first modeling result and second modeling result is obtained, actual geologic structure can be combined,
First modeling result and second modeling result are analyzed.Specifically, can by reality geologic structure with
First modeling result and second modeling result are contrasted, may thereby determine that out first modeling result with
And the difference between the geologic structure of second modeling result and reality.When difference is smaller, illustrate modeling result and reality
Geologic structure is close, and when difference is larger, then illustrate that modeling result is not inconsistent with actual geologic structure.The difference obtained according to contrast
Not, it may thereby determine that out that the imaging precision of the chromatography modeling meets the first area scope of predetermined threshold and the refraction
The imaging precision of ripple modeling meets the second area scope of predetermined threshold.The first area scope and the second area model
Advantage scope can be considered as by enclosing.Wherein, the advantage scope for chromatographing modeling can be understood as within the range, chromatographing the knot of modeling
Fruit is better than the result of refracted wave modeling；And the advantage scope of refracted wave modeling then can be understood as within the range, refracted wave
The result of modeling is better than the result of chromatography modeling.So, for same region to be measured, chromatography modeling and refracted wave modeling
Different advantage scopes can be corresponded respectively to.For example, the region to be measured includes massif area and gobi gravel area, then to this
Region to be measured is carried out after chromatographing modeling and refracted wave modeling, can be with by the way that modeling result and actual geologic structure are carried out into contrast
It was found that relatively being coincide with actual geologic structure using the result that chromatography is modeled to massif area, and utilize refraction wave pair
The result that gobi gravel area is modeled relatively is coincide with actual geologic structure, and this just illustrates advantage scope corresponding to chromatography modeling
Can be massif area, and advantage corresponding to refracted wave modeling may range from gobi gravel area.
, can be according to the described excellent of determination after chromatography modeling and each self-corresponding advantage scope of refracted wave modeling is determined
Gesture scope, the line of demarcation delimited between the chromatography modeling and refracted wave modeling.Equally with massif area and gobi gravel area
Exemplified by, the massif line of demarcation of massif area and gobi gravel area intersection can think that described chromatography modeling and refracted wave model it
Between line of demarcation.The line of demarcation can be located between chromatography modeling and refracted wave model each self-corresponding advantage scope, when crossing
During the line of demarcation, the modeling result for having one in both chromatography modeling and refracted wave modeling can substantially be deteriorated, and another
Modeling result can then better conform to actual geologic structure.In actual applications, the line of demarcation can be according to earth's surface elevation, DEM
The top layer data such as altitude data body, satellite remote sensing photo and geological plane maps delimited.
Because different modeling results can truly reflect different geologic structures, then changed in geologic structure
Transitional region, its modeling result is often not accurate enough.Therefore, in the embodiment of the present application can be according to the boundary of delimitation
Line, the scope of the transitional region of the area inner layer analysis modeling to be measured and refracted wave modeling is determined, to be carried out to the scope
The calculating of static correction value.Specifically, the embodiment of the present application can along perpendicular to the direction in the line of demarcation to the first area
Scope extends pre-determined distance, obtain the first boundary line and along perpendicular to the direction in the line of demarcation to the second area scope
Extension pre-determined distance obtains the second boundary line.It should be noted that because line of demarcation is not necessarily straight line, in the embodiment of the present application
In the line of demarcation can be divided into some junior units, so each junior unit so as to be considered as straight line, so as to
Extended in parallel in the vertical direction of the straight line.Fig. 2 is the schematic diagram that transition zone area is determined in the embodiment of the present application.Such as
Shown in Fig. 2, the advantage scope 1 for chromatographing modeling is located at Fig. 2 lower left corner, and the advantage scope 2 of refracted wave modeling is located at Fig. 2 upper right
Angle, line of demarcation 3 is between the advantage scope 1 of the chromatography modeling and the advantage scope 2 of refracted wave modeling.So, just
The line of demarcation 3 can abreast be translated respectively to the left and to the right, so as to obtain the first boundary line 31 and the second boundary line 32,
Wherein, first boundary line 31 is adjacent with the advantage scope 1 of chromatography modeling, the second boundary line 32 and refracted wave modeling
Advantage scope 2 is adjacent.The scope so limited by first boundary line 31 with the second boundary line 32 can be to be defined as
The scope of the transitional region of chromatography modeling and refracted wave modeling in the region to be measured.
S2：Determine the low velocity layer thickness and top layer average speed of the transitional region.
Because geologic structure is often presented diversified feature in the transitional region, thus individually using chromatography modeling or
Person individually accurately can not be imaged using refracted wave modeling to the region.Therefore, in the embodiment of the present application, it is necessary to right
Low velocity layer thickness and top layer average speed in the transitional region re-start determination, it is therefore intended that so that the transition region
Low velocity layer thickness and top layer average speed in domain can meet actual geologic structure.Specifically, the embodiment of the present application can be with
Determine the second power corresponding to the first weight coefficient corresponding to chromatography modeling and refracted wave modeling respectively in the transitional region
Weight coefficient, first weight coefficient and the second weight coefficient may indicate that chromatography modeling or refracted wave are modeled in transitional region
Interior influence power.First weight coefficient is to taper into during being moved from the first boundary line to the second boundary line
, show, when the advantage scope that model to refracted wave of advantage scope from chromatography modeling moves, to chromatograph the influence power of modeling by
Gradual change is small.Correspondingly, second weight coefficient is gradually to become during being moved from the first boundary line to the second boundary line
Big.
In the embodiment of the present application, the first weight coefficient and the second weight coefficient can be carried out using linear function true
It is fixed.Specifically, the distance between physical points to be measured and the second boundary line in the transitional region are represented with x, institute is represented with L
The distance between the first boundary line and the second boundary are stated, wherein, 0≤x≤L.So described first weight coefficient nTWith
Two weight coefficient nRIt can be expressed as respectively：
nT=x/L
nR=(L-x)/L
So, with transitional region physical points to be measured it is gradually close to the second boundary line, x also can gradually become 0 from L,
So the first weight coefficient gradually will be changed into 0 from 1, and correspondingly, the second weight coefficient then gradually can be changed into 1 from 0.
However, represent that the first weight coefficient and the second weight coefficient often have following drawback using linear function：
Near the high speed top interface both ends of transitional region, mutation can be presented by pushing up the change of interface elevation at a high speed, this and height
Speed top interface elevation should be continuous in smaller range, the geologic rule of gradual change is disagreed.
Therefore, in the preferred embodiment of the application one, the first weight coefficient and can be represented using nonlinear function
Two weight coefficients, to solve the defects of mutation is presented in top interface elevation at a high speed.
Specifically, the embodiment of the present application can determine chromatography modeling pair respectively according to following formula in the transitional region
Second weight coefficient corresponding to the first weight coefficient and the refracted wave modeling answered：
nR=1-nT
Wherein, nTRepresent first weight coefficient, nRSecond weight coefficient is represented, x is represented in the transitional region
The distance between physical points to be measured and the second boundary line and 0≤x≤L, L are first boundary line and second side
The distance between boundary.
So, the change procedure of the first weight coefficient and the second weight coefficient is nonlinear, thereby may be ensured that height
Speed top interface elevation is continuous, gradual change in smaller range.
, can be with chromatography modeling and refraction after first weight coefficient and second weight coefficient is determined
On the basis of the result of ripple modeling, using first weight coefficient and second weight coefficient, the transitional region is determined
Interior low velocity layer thickness and top layer average speed.Specifically, the embodiment of the present application can determine the mistake according to following formula
The low velocity layer thickness and top layer average speed crossed in region：
hC=hT·nT+hR·nR
vC=vT·nT+vR·nR
Wherein, hCRepresent the low velocity layer thickness in the transitional region, hTRepresent the low velocity layer in chromatography modeling result
Thickness, hRRepresent the low velocity layer thickness in refracted wave modeling result, vCThe top layer average speed in the transitional region is represented,
vTRepresent the top layer average speed in chromatography modeling result, vRRepresent the top layer average speed in refracted wave modeling result, nTRepresent
First weight coefficient, nRRepresent second weight coefficient.
So, with the change of physical points to be measured in transitional region, its corresponding first weight coefficient and the second weight system
Number can also change therewith, and the proportion shared by result modeled so as to the result for causing chromatography to model with refracted wave changes, this
Sample can be with according to actual geologic structure, preferably the low velocity layer thickness and top layer average speed in reflection transitional region.
S3：According to the low velocity layer thickness and top layer average speed of determination, the static correction of the transitional region is determined
Amount.
Low velocity layer thickness and top layer average speed in the transitional region are being determined, can be with according to the sinking
Speed belt thickness and top layer average speed, determine the static correction value in the transitional region.In practical application scene, the transition
Region is divided into some dielectric layers, and so each dielectric layer can be analyzed, so as to obtain whole transitional region
Static correction value.In the embodiment of the present application, the static correction value in the transitional region can be determined according to following formula：
Wherein, T represents the static correction value in the transitional region, hiCRepresent in the transitional regioniLayer medium it is low
Reduction of speed tape thickness, ViCRepresent in the transitional regioniThe top layer average speed of layer medium, n represent to be situated between in the transitional region
Total number of plies of matter, τ represent the time of well depth or wave detector buried depth, HdRepresent the datum elevation in the transitional region, HgTable
Show the high-speed layer top interface elevation in the transitional region, VsRepresent the base-level correction speed in the transitional region.
So, after the static correction value in transitional region is determined, can with according to the static correction value to transitional region
It is imaged, thereby may be ensured that the result of imaging is consistent with actual geologic structure.
Therefore a kind of method that static correction is carried out to transitional region that the embodiment of the present application provides, pass through stratum conjunctum
Analysis modeling and the result of refracted wave modeling, are determined in region to be measured after the scope of transitional region, in the transitional region
Low velocity layer thickness and top layer average speed are analyzed, and may thereby determine that out the static correction value in the transitional region.Enter
One step, by distinguishing in transitional region corresponding to the first weight coefficient corresponding to calculating computed tomography modeling and refracted wave modeling
Second weight coefficient, so as to be determined exactly to the low velocity layer thickness in transitional region and top layer average speed,
So as to improve the imaging precision in transitional region.
The embodiment of the present application also provides a kind of device that static correction is carried out to transitional region.Fig. 3 carries for the embodiment of the present application
A kind of apparatus function module map that static correction is carried out to transitional region supplied.As shown in figure 3, described device includes：
Transitional region determining unit 100, to region to be measured chromatograph the result of modeling and refracted wave modeling for basis,
Determine the transitional region of chromatography modeling and refracted wave modeling in the region to be measured；
Transitional region parameter determination unit 200, low velocity layer thickness and top layer for determining the transitional region are averaged
Speed；
Static correction value determining unit 300, for the low velocity layer thickness and top layer average speed according to determination, it is determined that
The static correction value of the transitional region.
In the preferred embodiment of the application one, the transitional region determining unit 100 specifically includes：
First area range determination module, for according to the result for region to be measured chromatograph modeling, determining the layer
The imaging precision of analysis modeling meets the first area scope of predetermined threshold；
Second area range determination module, the result of refracted wave modeling is carried out to region to be measured for basis, it is determined that described
The imaging precision of refracted wave modeling meets the second area scope of predetermined threshold；
Module delimited in line of demarcation, for the first area scope and second area scope according to determination, delimit the chromatography
Line of demarcation between modeling and refracted wave modeling；
Boundary line determining module, for default along extending perpendicular to the direction in the line of demarcation to the first area scope
Distance, obtain the first boundary line and extend pre-determined distance to the second area scope along perpendicular to the direction in the line of demarcation
Obtain the second boundary line；
Area determination module, for the region limited between first boundary line and the second boundary line to be defined as
The transitional region of chromatography modeling and refracted wave modeling in the region to be measured.
In another preferred embodiment of the application, the transitional region parameter determination unit 200 specifically includes：
Weight coefficient determining module, for determining the first weight system corresponding to chromatography modeling respectively in the transitional region
Second weight coefficient corresponding to number and refracted wave modeling；
Parameter determination module, on the basis of the result of chromatography modeling and refracted wave modeling, utilizing the described first power
Weight coefficient and second weight coefficient, determine the low velocity layer thickness and top layer average speed of the transitional region.
The specific implementation process of above-mentioned each functional module and the calculation formula that is related to step S1 into S3 it is consistent,
Here just repeat no more.
Therefore a kind of device that static correction is carried out to transitional region that the embodiment of the present application provides, pass through stratum conjunctum
Analysis modeling and the result of refracted wave modeling, are determined in region to be measured after the scope of transitional region, in the transitional region
Low velocity layer thickness and top layer average speed are analyzed, and may thereby determine that out the static correction value in the transitional region.Enter
One step, by distinguishing in transitional region corresponding to the first weight coefficient corresponding to calculating computed tomography modeling and refracted wave modeling
Second weight coefficient, so as to be determined exactly to the low velocity layer thickness in transitional region and top layer average speed,
So as to improve the imaging precision in transitional region.
In this manual, first and second, adjective as left and right, top and bottom etc. can be only used for
By an element or action with another element or act make a distinction, without require or imply any actual this relation or
Sequentially.Environment allow in the case of, with reference to element or part or step (s) should not be interpreted as limited to only element, part,
Or one in step, and can be one or more of element, part or step etc..
The description to the various embodiments of the application is supplied to those skilled in the art with the purpose described above.It is not
Be intended to exhaustion or it is not intended to and limits the invention to single disclosed embodiment.As described above, the application's is various
Substitute and change will be apparent for above-mentioned technology one of ordinary skill in the art.Therefore, although specifically begging for
Some alternative embodiments have been discussed, but other embodiment will be apparent, or those skilled in the art are relative
Easily draw.The application is intended to be included in this all replacement of the invention discussed, modification and change, and falls
Other embodiment in the spirit and scope of above-mentioned application.
Each embodiment in this specification is described by the way of progressive, identical similar portion between each embodiment
Divide mutually referring to what each embodiment stressed is the difference with other embodiment.It is real especially for system
For applying example, because it is substantially similar to embodiment of the method, so description is fairly simple, related part is referring to embodiment of the method
Part explanation.
The application can be used in numerous general or special purpose computing system environments or configuration.Such as：Personal computer, clothes
Business device computer, handheld device or portable set, laptop device, multicomputer system, the system based on microprocessor, put
Top box, programmable consumer-elcetronics devices, network PC, minicom, mainframe computer including any of the above system or equipment
DCE etc..
The application can be described in the general context of computer executable instructions, such as program
Module.Usually, program module includes performing particular task or realizes routine, program, object, the group of particular abstract data type
Part, data structure etc..The application can also be put into practice in a distributed computing environment, in these DCEs, by
Task is performed and connected remote processing devices by communication network.In a distributed computing environment, program module can be with
In the local and remote computer-readable storage medium including storage device.
Although depicting the application by embodiment, it will be appreciated by the skilled addressee that the application have it is many deformation and
Change is without departing from spirit herein, it is desirable to which appended claim includes these deformations and changed without departing from the application's
Spirit.
Claims (2)
- A kind of 1. method that static correction is carried out to transitional region, it is characterised in that including：The result modeled according to region to be measured chromatograph modeling and refracted wave, determine in the region to be measured chromatography modeling and The transitional region of refracted wave modeling；Determine the low velocity layer thickness and top layer average speed of the transitional region；According to the low velocity layer thickness and top layer average speed of determination, the static correction value of the transitional region is determined；Wherein, according to the result for carrying out chromatographing modeling and refracted wave models to region to be measured, determine to chromatograph in the region to be measured The transitional region of modeling and refracted wave modeling specifically includes：According to the result for region to be measured chromatograph modeling, determine that the imaging precision of the chromatography modeling meets predetermined threshold First area scope；According to the result that refracted wave modeling is carried out to region to be measured, determine that the imaging precision of the refracted wave modeling meets predetermined threshold The second area scope of value；According to the first area scope and second area scope of determination, the chromatography modeling and refracted wave modeling delimited Between line of demarcation；Along perpendicular to the direction in the line of demarcation to the first area scope extend pre-determined distance, obtain the first boundary line and Along perpendicular to the direction in the line of demarcation the second boundary line is obtained to second area scope extension pre-determined distance；The region limited between first boundary line and the second boundary line is defined as chromatographing in the region to be measured and built Mould and the transitional region of refracted wave modeling；Wherein it is determined that the low velocity layer thickness and top layer average speed of the transitional region specifically include：Determined respectively in the transitional region the corresponding to the first weight coefficient corresponding to chromatography modeling and refracted wave modeling Two weight coefficients；On the basis of the result of chromatography modeling and refracted wave modeling, first weight coefficient and the second weight system are utilized Number, determine the low velocity layer thickness and top layer average speed of the transitional region；Wherein, the first weight coefficient and folding according to corresponding to the determination chromatography modeling respectively in the transitional region of following formula Second weight coefficient corresponding to ejected wave modeling：<mrow> <msub> <mi>n</mi> <mi>T</mi> </msub> <mo>=</mo> <mfrac> <mrow> <mn>2</mn> <mi>a</mi> <mi>r</mi> <mi>c</mi> <mi>t</mi> <mi>a</mi> <mi>n</mi> <mrow> <mo>(</mo> <mn>2</mn> <mi>x</mi> <mo>/</mo> <mi>L</mi> <mo>-</mo> <mn>1</mn> <mo>)</mo> </mrow> </mrow> <mi>&pi;</mi> </mfrac> <mo>+</mo> <mn>0.5</mn> </mrow>nR=1-nTWherein, nTRepresent first weight coefficient, nRSecond weight coefficient is represented, x represents to be measured in the transitional region The distance between physical points and the second boundary line and 0≤x≤L, L are first boundary line and the second boundary line The distance between；Wherein, the low velocity layer thickness and top layer average speed of the transitional region are determined according to following formula：hC=hT·nT+hR·nRvC=vT·nT+vR·nRWherein, hCRepresent the low velocity layer thickness of the transitional region, hTThe low velocity layer thickness in chromatography modeling result is represented, hRRepresent the low velocity layer thickness in refracted wave modeling result, vCRepresent the top layer average speed in the transitional region, vTRepresent Chromatograph the top layer average speed in modeling result, vRRepresent the top layer average speed in refracted wave modeling result, nTRepresent described One weight coefficient, nRRepresent second weight coefficient；Wherein, the static correction value of the transitional region is determined according to following formula：<mrow> <mi>T</mi> <mo>=</mo> <mo>-</mo> <mrow> <mo>(</mo> <munderover> <mo>&Sigma;</mo> <mrow> <mi>i</mi> <mo>=</mo> <mn>1</mn> </mrow> <mi>n</mi> </munderover> <mfrac> <msub> <mi>h</mi> <mrow> <mi>i</mi> <mi>C</mi> </mrow> </msub> <msub> <mi>V</mi> <mrow> <mi>i</mi> <mi>C</mi> </mrow> </msub> </mfrac> <mo>-</mo> <mi>&tau;</mi> <mo>/</mo> <mn>1000</mn> <mo>-</mo> <mfrac> <mrow> <msub> <mi>H</mi> <mi>d</mi> </msub> <mo>-</mo> <msub> <mi>H</mi> <mi>g</mi> </msub> </mrow> <msub> <mi>V</mi> <mi>s</mi> </msub> </mfrac> <mo>)</mo> </mrow> <mo>&times;</mo> <mn>1000</mn> </mrow>Wherein, T represents the static correction value of the transitional region, hiCRepresent the low velocity layer of i-th layer of medium in the transitional region Thickness, ViCRepresent the top layer average speed of i-th layer of medium in the transitional region, n represents the total of medium in the transitional region The number of plies, τ represent the time of well depth or wave detector buried depth, HdRepresent the datum elevation in the transitional region, HgDescribed in expression High-speed layer top interface elevation in transitional region, VsRepresent the base-level correction speed in the transitional region.
- A kind of 2. device that static correction is carried out to transitional region, it is characterised in that including：Transitional region determining unit, for according to the result for region to be measured chromatograph modeling and refracted wave modeling, determining institute State the transitional region of chromatography modeling and refracted wave modeling in region to be measured；Transitional region parameter determination unit, for determining the low velocity layer thickness and top layer average speed of the transitional region；Static correction value determining unit, for the low velocity layer thickness and top layer average speed according to determination, determine the mistake Cross the static correction value in region；Wherein, the transitional region determining unit specifically includes：First area range determination module, for according to the result for region to be measured chromatograph modeling, determining that the chromatography is built The imaging precision of mould meets the first area scope of predetermined threshold；Second area range determination module, for according to the result that refracted wave modeling is carried out to region to be measured, determining the refraction The imaging precision of ripple modeling meets the second area scope of predetermined threshold；Module delimited in line of demarcation, for the first area scope and second area scope according to determination, delimit the chromatography modeling Line of demarcation between the refracted wave modeling；Boundary line determining module, for along perpendicular to the direction in the line of demarcation to the first area scope extend it is default away from From, obtain the first boundary line and along perpendicular to the direction in the line of demarcation to the second area scope extension pre-determined distance obtain To the second boundary line；Area determination module, it is described for the region limited between first boundary line and the second boundary line to be defined as The transitional region of chromatography modeling and refracted wave modeling in region to be measured；Wherein, the transitional region parameter determination unit specifically includes：Weight coefficient determining module, in the transitional region respectively determine chromatography modeling corresponding to the first weight coefficient with And the second weight coefficient corresponding to refracted wave modeling；Parameter determination module, on the basis of the result of chromatography modeling and refracted wave modeling, utilizing the first weight system Number and second weight coefficient, determine the low velocity layer thickness and top layer average speed of the transitional region；Wherein, the first weight coefficient and folding according to corresponding to the determination chromatography modeling respectively in the transitional region of following formula Second weight coefficient corresponding to ejected wave modeling：<mrow> <msub> <mi>n</mi> <mi>T</mi> </msub> <mo>=</mo> <mfrac> <mrow> <mn>2</mn> <mi>a</mi> <mi>r</mi> <mi>c</mi> <mi>t</mi> <mi>a</mi> <mi>n</mi> <mrow> <mo>(</mo> <mn>2</mn> <mi>x</mi> <mo>/</mo> <mi>L</mi> <mo>-</mo> <mn>1</mn> <mo>)</mo> </mrow> </mrow> <mi>&pi;</mi> </mfrac> <mo>+</mo> <mn>0.5</mn> </mrow>nR=1-nTWherein, nTRepresent first weight coefficient, nRSecond weight coefficient is represented, x represents to be measured in the transitional region The distance between physical points and the second boundary line and 0≤x≤L, L are first boundary line and the second boundary line The distance between；Wherein, the static correction value of the transitional region is determined according to following formula：<mrow> <mi>T</mi> <mo>=</mo> <mo>-</mo> <mrow> <mo>(</mo> <munderover> <mo>&Sigma;</mo> <mrow> <mi>i</mi> <mo>=</mo> <mn>1</mn> </mrow> <mi>n</mi> </munderover> <mfrac> <msub> <mi>h</mi> <mrow> <mi>i</mi> <mi>C</mi> </mrow> </msub> <msub> <mi>V</mi> <mrow> <mi>i</mi> <mi>C</mi> </mrow> </msub> </mfrac> <mo>-</mo> <mi>&tau;</mi> <mo>/</mo> <mn>1000</mn> <mo>-</mo> <mfrac> <mrow> <msub> <mi>H</mi> <mi>d</mi> </msub> <mo>-</mo> <msub> <mi>H</mi> <mi>g</mi> </msub> </mrow> <msub> <mi>V</mi> <mi>s</mi> </msub> </mfrac> <mo>)</mo> </mrow> <mo>&times;</mo> <mn>1000</mn> </mrow>Wherein, T represents the static correction value of the transitional region, hiCRepresent the low velocity layer of i-th layer of medium in the transitional region Thickness, ViCRepresent the top layer average speed of i-th layer of medium in the transitional region, n represents the total of medium in the transitional region The number of plies, τ represent the time of well depth or wave detector buried depth, HdRepresent the datum elevation in the transitional region, HgDescribed in expression High-speed layer top interface elevation in transitional region, VsRepresent the base-level correction speed in the transitional region.
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