CN105458363B - The bloom chamfering reworking method of cell phone appearance part - Google Patents
The bloom chamfering reworking method of cell phone appearance part Download PDFInfo
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- CN105458363B CN105458363B CN201510931040.2A CN201510931040A CN105458363B CN 105458363 B CN105458363 B CN 105458363B CN 201510931040 A CN201510931040 A CN 201510931040A CN 105458363 B CN105458363 B CN 105458363B
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- cell phone
- appearance part
- phone appearance
- chamfering
- upper profile
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Abstract
The present invention relates to a kind of bloom chamfering reworking method of cell phone appearance part, including step：Filter out the cell phone appearance part for meeting the condition of doing over again；The default test point of the upper profile of the bloom chamfering of cell phone appearance part described in probe measurement, obtain the upper profile actual Z-direction parameter, X-direction parameter and Y-direction parameter；According to the Z-direction parameter, X-direction parameter and Y-direction parameter, the macro-variable of CNC dia-cutting lathes is set, and copying is carried out to the upper profile；Obtain the cell phone appearance part after copying.The bloom chamfering reworking method of above-mentioned cell phone appearance part, it is determined for compliance with the TP parameter of the upper profile of the bloom chamfering of the cell phone appearance part for the condition of doing over again by probe by presetting the measured value of test point, and then the macro-variable of the TP parameter setting CNC dia-cutting lathes according to the upper profile of gained, the profile side of upper profile is cut using copying, obtains meeting the cell phone appearance part of the non-defective unit requirement after doing over again.
Description
Technical field
The present invention relates to mobile phone bloom chamfer machining field, is done over again more particularly to a kind of bloom chamfering of cell phone appearance part
Method.
Background technology
Protecgulum, center and the bonnet of cell phone appearance part, such as mobile phone, in its production process, it is necessary to mobile phone appearance member
Carry out bloom chamfer machining.And after bloom chamfer machining, during normally turnover logistics and following process, cell phone appearance part
Easily produce high smooth surface touch scuffing or lines it is nonconforming, cause cell phone appearance part to turn into defective products because of open defect.
In the case of normal process, because product had done bloom chamfer machining, it is difficult to detected again with the tapered probe in conventional method
The profile side of the upper profile of cell phone appearance part, therefore, it is difficult to be remedied to these defective products, processing can only be scrapped.So cause
Product yield reduces and production cost increase.
The content of the invention
Based on this, there is provided a kind of bloom chamfering side of doing over again for the cell phone appearance part for improving product yield and reducing production cost
Method.
A kind of bloom chamfering reworking method of cell phone appearance part, including step：
S10：Filter out the cell phone appearance part for meeting the condition of doing over again；
S20：Detect board and drive probe movement, measure the default inspection of the upper profile of the bloom chamfering of the cell phone appearance part
Measuring point, obtain the upper profile actual Z-direction parameter, X-direction parameter and Y-direction parameter；
S30：According to the Z-direction parameter, X-direction parameter and Y-direction parameter, the grand of CNC dia-cutting lathes is set
Variable, and copying is carried out to the upper profile；
S40：Obtain the cell phone appearance part after copying.
The bloom chamfering reworking method of above-mentioned cell phone appearance part, it is by probe by presetting the measured value of test point come really
Surely the TP parameter of the upper profile of the bloom chamfering of the cell phone appearance part for the condition of doing over again is met, and then according to the upper wheel of gained
The macro-variable of wide TP parameter setting CNC dia-cutting lathes, the profile side of upper profile is carried out using copying
Cutting, obtain meeting the cell phone appearance part of the non-defective unit requirement after doing over again.
Brief description of the drawings
Fig. 1 is the FB(flow block) of the bloom chamfering reworking method of the cell phone appearance part of an embodiment of the present invention；
Fig. 2 is a kind of FB(flow block) of embodiment of the step S30 in Fig. 1；
Fig. 3 is a kind of FB(flow block) of embodiment of the step S10 in Fig. 1.
Embodiment
For the feature of the present invention, technological means and the specific purposes reached, function can be further appreciated that, this hair is parsed
The advantages of bright and spirit, the detailed description of the present invention is further understood with embodiment by below in conjunction with accompanying drawing.
As shown in figure 1, the bloom chamfering reworking method of the cell phone appearance part for an embodiment of the present invention.
A kind of bloom chamfering reworking method of cell phone appearance part, including step：
S10：Filter out the cell phone appearance part for meeting the condition of doing over again.Because the upper profile of bloom chamfering touch scuffing or lines be not inconsistent
Close and require and cause bad cell phone appearance part to there may be many different chamferings.Reason is, by milling cutter cut come
The standard value of bloom chamfering, its actual chamfering value and theory will necessarily have deviation.If the height of the bad cell phone appearance part
The actual chamfering value of the upper profile of light chamfering is smaller, or even very close to the limit minimum value of acceptable chamfering value,
Namely default upper profile minimum chamfering value of doing over again., will necessarily if carrying out secondary cutting to the upper profile of this kind of cell phone appearance part
The chamfering value after cutting is caused to be less than the limit minimum value in the range of non-defective unit, that is to say, that after such defective products is done over again and not
Meet non-defective unit requirement.Therefore, it is necessary to first classify before doing over again to bad cell phone appearance part, distinguishing can do over again not
Non-defective unit and can not be by satisfactory defective products of doing over again, to reduce idle work.
S20：Detect board and drive probe movement, measure the default inspection of the upper profile of the bloom chamfering of the cell phone appearance part
Measuring point, obtain the upper profile actual Z-direction parameter, X-direction parameter and Y-direction parameter.As previously mentioned, each mobile phone
The actual chamfering value of the bloom chamfering of appearance member all may be different, therefore, it is necessary to actual measurement are carried out, to determine the reality of upper profile
Border profile side shape, to carry out secondary cutting to it.For example, using cylindrical needle or spherical probes, match somebody with somebody with detection board
Close and use.Detection board drive probe is moved to the profile side of the upper profile of the bloom chamfering of cell phone appearance part, and measurement is distributed in
The default test point of profile on this, these default test points include some sampled points of the Z-directions of the upper profile, X-direction
Some sampled points of some sampled points and Y-direction.After detection measurement, obtain being used for necessary to profiling cell phone appearance part
Z-direction parameter, X-direction parameter and the Y-direction parameter of TP.
S30：According to the Z-direction parameter, X-direction parameter and Y-direction parameter, the grand of CNC dia-cutting lathes is set
Variable, and copying is carried out to the upper profile.The macro-variable of CNC dia-cutting lathes is the cutting rail for setting milling cutter
Mark, after the relevant parameter of TP of the upper profile of bloom chamfering of cell phone appearance part is obtained, this can be gone out with profiling
The realistic model on the profile side of the upper profile of cell phone appearance part, before the chamfering limit minimum value without departing from non-defective unit requirement of doing over again
Put, the realistic model on the profile side of the upper profile of the profiling is modified.According to the parameter of revised realistic model, obtain
To the macro-variable needed for milling cutter cutting., can be to copy the wheel of the actually profile of cell phone appearance part script after macro-variable determines
Wide side, is cut, to ensure that the profile of the upper profile after cutting shape in the profile with the actually profile before cutting connects
Closely.
S40：Obtain the cell phone appearance part after copying.
In certain embodiments, in the step S30, including step：
S31：According to the Z-direction parameter, X-direction parameter and Y-direction parameter, in the milling cutter of CNC dia-cutting lathes
The model on the profile side of the upper profile is constructed in control system.
S32：According to default upper profile minimum chamfering value of doing over again, the model on the profile side is modified.
S33：According to the model on the profile side of revised upper profile, the milling cutter of CNC dia-cutting lathes is set to cut rail
The macro-variable of mark.
S34：The milling cutter of CNC dia-cutting lathes is cut the profile side of the upper profile.
In certain embodiments, in the step S10, including step：
S11：Collect because the upper profile of bloom chamfering touch scuffing or lines it is nonconforming cause bad cell phone appearance part.
S12：The chamfering reference range of default upper profile, profile chamfering reference range is used to judge cell phone appearance on this
Whether part belongs to the scope that can be done over again.
S13：Trial inspection is carried out to the chamfering value of the upper profile of collected bad cell phone appearance part.The preliminary inspection
Look into visually inspect or being checked using survey tool.
S14：The chamfering value for filtering out the upper profile obtained by trial inspection falls into the chamfering reference value of the default upper profile
In the range of cell phone appearance part.
The bloom chamfering reworking method of above-mentioned cell phone appearance part, it is by probe by presetting the measured value of test point come really
Surely the TP parameter of the upper profile of the bloom chamfering of the cell phone appearance part for the condition of doing over again is met, and then according to the upper wheel of gained
The macro-variable of wide TP parameter setting CNC dia-cutting lathes, the profile side of upper profile is carried out using copying
Cutting, obtain meeting the cell phone appearance part of the non-defective unit requirement after doing over again
Each technical characteristic of embodiment described above can be combined arbitrarily, to make description succinct, not to above-mentioned reality
Apply all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, the scope that this specification is recorded all is considered to be.
Embodiment described above only expresses the several embodiments of the present invention, and its description is more specific and detailed, but simultaneously
Can not therefore it be construed as limiting the scope of the patent.It should be pointed out that come for one of ordinary skill in the art
Say, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to the protection of the present invention
Scope.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (6)
1. the bloom chamfering reworking method of a kind of cell phone appearance part, it is characterised in that including step：
S10：Filter out the cell phone appearance part for meeting the condition of doing over again；
S20：Detect board and drive probe movement, measure the default detection of the upper profile of the bloom chamfering of the cell phone appearance part
Point, obtain the upper profile actual Z-direction parameter, X-direction parameter and Y-direction parameter；
S30：According to the Z-direction parameter, X-direction parameter and Y-direction parameter, the macro-variable of CNC dia-cutting lathes is set,
And copying is carried out to the upper profile；
S40：Obtain the cell phone appearance part after copying.
2. the bloom chamfering reworking method of cell phone appearance part according to claim 1, it is characterised in that the step S30
In, including step：
S31：According to the Z-direction parameter, X-direction parameter and Y-direction parameter, controlled in the milling cutter of CNC dia-cutting lathes
The model on the profile side of the upper profile is constructed in system；
S32：According to default upper profile minimum chamfering value of doing over again, the model on the profile side is modified；
S33：According to the model on the profile side of revised upper profile, the milling cutter Cutting trajectory of CNC dia-cutting lathes is set
Macro-variable；
S34：The milling cutter of CNC dia-cutting lathes is cut the profile side of the upper profile.
3. the bloom chamfering reworking method of cell phone appearance part according to claim 1, it is characterised in that the step S10
In, including step：
S11：Collect because the upper profile of bloom chamfering touch scuffing or lines it is nonconforming cause bad cell phone appearance part；
S12：The chamfering reference range of default upper profile, profile chamfering reference range is used to judge that cell phone appearance part is on this
It is no to belong to the scope that done over again；
S13：Trial inspection is carried out to the chamfering value of the upper profile of collected bad cell phone appearance part；
S14：The chamfering value for filtering out the upper profile obtained by trial inspection falls into the chamfering reference range of the default upper profile
Interior cell phone appearance part.
4. the bloom chamfering reworking method of cell phone appearance part according to claim 3, it is characterised in that the trial inspection
To visually inspect or being checked using survey tool.
5. the bloom chamfering reworking method of cell phone appearance part according to claim 1, it is characterised in that the default detection
Put some sampled points of some sampled points of Z-direction for including the upper profile, some sampled points of X-direction and Y-direction.
6. the bloom chamfering reworking method of cell phone appearance part according to claim 1, it is characterised in that the probe is circle
Cylindricality probe or spherical probes.
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| CN201510931040.2A CN105458363B (en) | 2015-12-14 | 2015-12-14 | The bloom chamfering reworking method of cell phone appearance part |
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| CN105458363B true CN105458363B (en) | 2017-11-21 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106626921B (en) * | 2016-09-27 | 2019-07-12 | 宇龙计算机通信科技(深圳)有限公司 | A kind of angle decoration C finishing impression processing method, control device and processing unit (plant) |
| CN107234493B (en) * | 2017-06-29 | 2019-11-01 | 浙江星星科技股份有限公司 | A kind of processing method of handset viewing window perspex panels bloom chamfering |
| CN108319221B (en) * | 2018-01-24 | 2020-04-21 | 东莞长盈精密技术有限公司 | Tool path calculation method and middle frame processing method |
| CN109029327A (en) * | 2018-06-07 | 2018-12-18 | 信利光电股份有限公司 | The production method of the arc profile tolerance test method and 2.5D cover board of 2.5D cover board sample |
| CN109732146B (en) * | 2019-01-03 | 2020-04-07 | 东莞捷荣技术股份有限公司 | CNC (computer numerical control) detection machining assembly for mobile phone rear shell and detection machining method thereof |
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| JPS5511767A (en) * | 1978-07-12 | 1980-01-26 | Shin Etsu Handotai Co Ltd | Mirror finishing method of semiconductor wafer |
| JP2007223005A (en) * | 2006-02-24 | 2007-09-06 | Nakamura Tome Precision Ind Co Ltd | Method of measuring and correcting machining dimensions in plate material chamfering device |
| CN103836067A (en) * | 2014-03-27 | 2014-06-04 | 山东凯美瑞轴承科技有限公司 | Sealed self-aligning roller bearing for high-speed rail and repair method thereof |
| CN203973381U (en) * | 2014-06-30 | 2014-12-03 | 雷震 | Mobile phone shell correction fixture |
| CN104647166A (en) * | 2015-01-30 | 2015-05-27 | 东莞劲胜精密组件股份有限公司 | Repair method for spraying high-glossiness poor-appearance products |
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2015
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5511767A (en) * | 1978-07-12 | 1980-01-26 | Shin Etsu Handotai Co Ltd | Mirror finishing method of semiconductor wafer |
| JP2007223005A (en) * | 2006-02-24 | 2007-09-06 | Nakamura Tome Precision Ind Co Ltd | Method of measuring and correcting machining dimensions in plate material chamfering device |
| CN103836067A (en) * | 2014-03-27 | 2014-06-04 | 山东凯美瑞轴承科技有限公司 | Sealed self-aligning roller bearing for high-speed rail and repair method thereof |
| CN203973381U (en) * | 2014-06-30 | 2014-12-03 | 雷震 | Mobile phone shell correction fixture |
| CN104647166A (en) * | 2015-01-30 | 2015-05-27 | 东莞劲胜精密组件股份有限公司 | Repair method for spraying high-glossiness poor-appearance products |
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