CN105425156A - Cycle life testing method for power battery - Google Patents

Abstract

The invention belongs to the technical field of automobile testing, and provides a cycle testing method for a power battery. The method comprises the steps: testing capacity initial values Q0 during the temperature 25 DEG C, 0.5C charging, 1C discharge and the discharge depth of 100%; testing a temperature impact value on a capacity attenuation rate from different temperatures, the charging current impact value on the capacity attenuation rate from different charging currents, the discharge current impact on the capacity attenuation rate from different discharging currents, and the discharge depth impact value on the capacity attenuation rate from different discharge depths; determining the capacity target value of the capacity attenuation of the power battery; building a model of the capacity attenuation of the power battery; and calculating the cycle number of the power battery during charging and the cycle number of the power battery during discharging. The method can accurately calculate the cycle life of the power battery of an electric car during operation through building power battery capacity attenuation rate models of different temperatures, charging currents, discharge currents, and discharge depths, and is high in testing effectiveness.

Description

A kind of electrokinetic cell cycle life method of testing

Technical field

The invention belongs to Automobile Measuring Techniques field, be specifically related to a kind of electrokinetic cell cycle life method of testing.

Background technology

Under the active demand that economic globalization development and social energy conservation reduce discharging, the center of gravity of World Auto Industry development shifts.Current, development has environmental protection, the new-energy automobile of the feature such as energy-conservation has become the common recognition of automotive field, and the common technique of electric automobile just in this developing direction.Electric automobile is a kind of vehicle being provided energy to run by electrokinetic cell, and electrokinetic cell is as the vitals in electric automobile, and the quality of its performance will directly have influence on development and the application prospect of electric automobile.

At present, the life-span of electrokinetic cell is the important performance indexes of electrokinetic cell, and generally believes in electrokinetic cell field and can not be used on electric automobile again after battery capacity drops to 80% of rated capacity.In order to study the life-span of electrokinetic cell, currently generally to be tested by modelling, in particular by arranging extreme condition, as big current, high temperature, low temperature, carry out accelerating lifetime testing to battery, the situation that should be installed on when electric automobile runs with electrokinetic cell is quite different, testing result is inaccurate, differ greatly with the electrokinetic cell life-span of reality, therefore, the validity of test is poor.

Summary of the invention

The object of this invention is to provide a kind of electrokinetic cell cycle life method of testing, by setting up the electrokinetic cell capacity attenuation Rate Models of different temperatures, charging current, discharge current and depth of discharge, can calculate the electrokinetic cell cycle life of electric automobile running status exactly, the validity of test is high.

To achieve these goals, the invention provides following technical scheme:

A kind of electrokinetic cell cycle life method of testing, comprising:

Step S1: capacity initial value Q when probe temperature 25 DEG C, 0.5C charging, 1C electric discharge, depth of discharge are 100% ₀;

Step S2: different temperatures T is to the temperature influence value f (T) of capacity attenuation speed in test;

Step S3: test different charging current I ₁to the charging current influence value f of described capacity attenuation speed ₁(I ₁);

Step S4: test different discharge current I ₂to the discharge current influence value f of described capacity attenuation speed ₂(I ₂);

Step S5: test the depth of discharge influence value f (DOD) of different depth of discharge DOD to described capacity attenuation speed;

Step S6: the capacity target value Q determining electrokinetic cell capacity attenuation;

Step S7: the model setting up described electrokinetic cell capacity attenuation,

Q＝Q ₀×f(T)×f(I)×f(DOD)×C(cycle)

; Calculate the cycle index C of electrokinetic cell during charging ₁(cycle),

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

Calculate the cycle index C of described electrokinetic cell during electric discharge ₂(cycle),

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$ 。

Preferably, described step S2 comprises:

Step S21: based in described step S7

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

With

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$

Setting C ₁(CYCLE)=C ₂(cycle)=1000;

Step S22: test 0.5C charges to described electrokinetic cell and is full of completely, and 1C is discharged to described electrokinetic cell and discharges completely, the temperature influence value f (T) that different temperatures T is corresponding;

Step S23: according to the test result in described step S22, with temperature T for independent variable, its corresponding temperature influence value f (T) is dependent variable, obtains the change function of temperature influence value f (T) with temperature T.

Preferably, described step S3 comprises:

Step S31: based in described step S7

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

With

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$

Setting C ₁(cycle)=C ₂(cycle)=1000;

Step S32: test 25 DEG C, 0.5C is discharged to described electrokinetic cell and discharges completely, different charging current I ₁charge to the complete full state of described electrokinetic cell, each self-corresponding charging current influence value f ₁(I ₁);

Step S33: according to the test result in described step S32, with charging current I ₁for independent variable, its corresponding discharge current influence value f ₁(I ₁) be dependent variable, obtain charging current influence value f ₁(I ₁) with charging current I ₁change function.

Preferably, described step S4 comprises:

Step S41: based in described step S7

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

With

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$

Setting C ₁(cycle)=C ₂(cycle)=1000;

Step S42: test 25 DEG C, 0.5C charges to described electrokinetic cell and be full of completely, different discharge current I ₂be discharged to the complete discharge condition of described electrokinetic cell, each self-corresponding discharge current influence value f ₂(I ₂);

Step S43: according to the test result in described step S42, with discharge current I ₂for independent variable, its corresponding discharge current influence value f ₂(I ₂) be dependent variable, obtain discharge current influence value f ₂(I ₂) with discharge current I ₂change function.

Preferably, described step S5 comprises:

Step S51: based in described step S7

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

With

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$

Setting C ₁(CYCLE)=C ₂(cycle)=1000;

Step S52: test 25 DEG C, 0.5C charges to described electrokinetic cell and be full of completely, when 1C is discharged to the different depth of discharge DOD of described electrokinetic cell, corresponding depth of discharge influence value f (DOD);

Step S53: according to the test result in described step S52, with depth of discharge DOD for independent variable, its corresponding depth of discharge influence value f (DOD) is dependent variable, obtains the change function of depth of discharge influence value f (DOD) with depth of discharge DOD.

Preferably, in described step S23 temperature influence value f (T) with charging current influence value f in the change function of temperature T, described step S33 ₁(I ₁) with charging current I ₁change function, discharge current influence value f in described step S43 ₂(I ₂) with discharge current I ₂change function and described step S53 in depth of discharge influence value f (DOD) obtain with the logical curve of all crossing of change function of depth of discharge DOD.

Preferably, the method for described curve is least square method.

Preferably, described temperature T is controlled by the insulation can placing described electrokinetic cell.

Preferably, described charging current I ₁, described discharge current I ₂, described depth of discharge DOD and described capacity target value Q by discharge and recharge instrument designing, described discharge and recharge instrument is connected with described electrokinetic cell signal.

Beneficial effect of the present invention is:

The present invention is by testing different temperatures, charging current, discharge current and depth of discharge to the impact of electrokinetic cell capacity attenuation speed, set up the model of electrokinetic cell capacity attenuation speed, according to this model, the electrokinetic cell cycle life under different operating mode can be calculated, electrokinetic cell cycle life when electric automobile runs can be calculated, the model that this kind of detection mode obtains is accurate, and result validity is high.

Accompanying drawing explanation

Fig. 1 is the process flow diagram of a kind of embodiment of electrokinetic cell cycle life method of testing provided by the present invention.

Embodiment

In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.

Please refer to Fig. 1, in a kind of embodiment, electrokinetic cell cycle life method of testing provided by the present invention, is characterized in that, comprising:

Step S1: the capacity initial value Q that probe temperature 25 DEG C, 0.5C charge, 1C discharges, depth of discharge is 100% ₀;

Step S2: different temperatures T is to the temperature influence value f (T) of capacity attenuation speed in test;

Step S3: test different charging current I ₁to the charging current influence value f of capacity attenuation speed ₁(I ₁);

Step S4: test different discharge current I ₂to the discharge current influence value f of capacity attenuation speed ₂(I _.);

Step S5: test the depth of discharge influence value f (DOD) of different depth of discharge DOD to capacity attenuation speed;

Step S6: the capacity target value Q determining electrokinetic cell capacity attenuation;

Step S7: set up electrokinetic cell capacity attenuation model,

Q＝Q ₀×f(T)×f(I)×f(DOD)×C(cycle)

; Obtained by above-mentioned fortran, calculate the cycle index C of electrokinetic cell during charging ₁(cycle),

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

Calculate the cycle index C of electrokinetic cell during electric discharge ₂(cycle),

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$ 。

Above-described embodiment is by testing different temperatures, charging current, discharge current and depth of discharge to the impact of electrokinetic cell capacity attenuation speed, set up the model of electrokinetic cell capacity attenuation speed, according to this model, the electrokinetic cell cycle life under different operating mode can be calculated, electrokinetic cell cycle life when electric automobile runs can be calculated, the model that this kind of detection mode obtains is accurate, and result validity is high.

Step S2 comprises:

Step S21: based in described step S7

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

With

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$

Setting C ₁(cycle)=C ₂(cycle)=1000;

Step S22: test 0.5C charges to described electrokinetic cell and is full of completely, and 1C is discharged to electrokinetic cell and discharges completely, the temperature influence value f (T) that different temperatures T is corresponding;

Step S23: according to the test result in step S22, with temperature T for independent variable, its corresponding temperature influence value f (T) is dependent variable, obtains the change function of temperature influence value f (T) with temperature T.

Said method only arranges an independent variable, just obtains the function of temperature influence value f (T), and test mode is simple, is easy to the foundation of whole electrokinetic cell capacity attenuation model, and parameter can be made independent separately, and accuracy is high.

Said temperature T can elect-10 DEG C, 0 DEG C, 10 DEG C, 25 DEG C, 45 DEG C and 60 DEG C respectively as, and test obtains corresponding temperature influence value f (T); Temperature T can certainly be selected to be-15 DEG C ,-9 DEG C, 5 DEG C, 20 DEG C, 35 DEG C, 65 DEG C, and the choosing value of temperature T is more, and the electrokinetic cell capacity attenuation model obtained is more accurate.

Charging current I ₁also can by setting different temperature T and other variate-value as charging current I ₁, discharge current I ₂obtain with the one in depth of discharge DOD or both or three, but the temperature influence value f (T) that obtains of this kind of method and temperature influence value f (T) or charging current influence value f ₁(I ₁), discharge current influence value f ₂(I ₂) or depth of discharge influence value f (DOD) then there is coupled relation, not easily set up whole electrokinetic cell capacity attenuation model.

Step S3 comprises:

Step S31: based in described step S7

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

With

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$

Setting C ₁(cycle)=C ₂(cycle)=1000;

Step S32: test 25 DEG C, 0.5C is discharged to described electrokinetic cell and discharges completely, different charging current I ₁charge to the complete full state of described electrokinetic cell, each self-corresponding charging current influence value f ₁(I ₁);

Step S33: according to the test result in described step S32, with charging current I ₁for independent variable, its corresponding discharge current influence value f ₁(I ₁) be dependent variable, obtain charging current influence value f ₁(I ₁) with charging current I ₁change function.

Said method only arranges an independent variable, just obtains charging current influence value f ₁(I ₁) function, test mode is simple, is easy to the foundation of whole electrokinetic cell capacity attenuation model, and parameter can be made independent separately, and accuracy is high.

Above-mentioned charging current I ₁can elect 0.3C, 0.5C, 1C as respectively, test obtains corresponding charging current influence value f ₁(I ₁); Charging current I can certainly be selected ₁for 0.2C, 0.8C, 1.2C etc., charging current I ₁choosing value more, the electrokinetic cell capacity attenuation model obtained is more accurate.

Charging current influence value f ₁(I ₁) also can by setting different charging current I ₁with other variate-value as temperature T, discharge current I ₂obtain with the one in depth of discharge DOD or both or three, but the charging current influence value f that this kind of method obtains ₁(I ₁) and temperature influence value f (T), discharge current influence value f ₂(I ₂) or depth of discharge influence value f (DOD) then there is coupled relation, not easily set up whole electrokinetic cell capacity attenuation model.

Step S4 comprises:

Step S41: based in described step S7

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

With

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$

Setting C ₁(cycle)=C ₂(cycle)=1000;

Step S42: test 25 DEG C, 0.5C charges to described electrokinetic cell and be full of completely, different discharge current I ₂be discharged to the complete discharge condition of described electrokinetic cell, each self-corresponding discharge current influence value f ₂(I ₂);

Step S43: according to the test result in described step S42, with discharge current I ₂for independent variable, its corresponding discharge current influence value f ₂(I ₂) be dependent variable, obtain discharge current influence value f ₂(I ₂) with discharge current I ₂change function.

Said method only arranges an independent variable, just obtains discharge current influence value f ₂(I ₂) function, test mode is simple, is easy to the foundation of whole electrokinetic cell capacity attenuation model, and parameter can be made independent separately, and accuracy is high.

Above-mentioned discharge current I ₂can elect 0.5C, 1C, 1.5C, 2C as respectively, test obtains corresponding discharge current influence value f ₂(I ₂); Discharge current I can certainly be selected ₂for 0.2C, 0.8C, 1.2C, 2.2C etc., discharge current I ₂choosing value more, the electrokinetic cell capacity attenuation model obtained is more accurate.

Discharge current influence value f ₂(I ₂) also can by setting different discharge current I ₂with other variate-value as temperature T, charging current I ₁obtain with the one in depth of discharge DOD or both or three, but the discharge current influence value f that this kind of method obtains ₂(I ₂) and temperature influence value f (T), charging current influence value f ₁(I ₁) or depth of discharge influence value f (DOD) then there is coupled relation, not easily set up whole electrokinetic cell capacity attenuation model.

Step S5 comprises:

Step S51: based in described step S7

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

With

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$

Setting C ₁(cycle)=C ₂(cycle)=1000;

Step S52: test 25 DEG C, 0.5C charges to described electrokinetic cell and be full of completely, when 1C is discharged to the different depth of discharge DOD of described electrokinetic cell, corresponding depth of discharge influence value f (DOD);

Step S53: according to the test result in described step S52, with depth of discharge DOD for independent variable, its corresponding depth of discharge influence value f (DOD) is dependent variable, obtains the change function of depth of discharge influence value f (DOD) with depth of discharge DOD.

Said method only arranges an independent variable, just obtains depth of discharge influence value f (DOD), and test mode is simple, is easy to the foundation of whole electrokinetic cell capacity attenuation model, and parameter can be made independent separately, and accuracy is high.

Above-mentioned depth of discharge DOD can elect 70%, 80%, 90% and 100% as respectively, and test obtains the function of corresponding depth of discharge influence value f (DOD); Depth of discharge can certainly be selected to be 95%, 85%, 79%, 68% etc.

Depth of discharge influence value f (DOD) also can by setting different depth of discharge DOD and other variate-value as temperature T, charging current I ₁, discharge current I ₂in one or both or three obtain, the depth of discharge influence value f (DOD) obtained when this kind of method and temperature influence value f (T) or charging current influence value f ₁(I ₁) then there is coupled relation, not easily set up whole electrokinetic cell capacity attenuation model.

In step S23, temperature influence value f (T) is with charging current influence value f in the change function of temperature T, step S33 ₁(I ₁) with charging current I ₁change function, discharge current influence value f in step S43 ₂(I ₂) with discharge current I ₂change function and step S53 in depth of discharge influence value f (DOD) with depth of discharge DOD change function can only one or both obtain separately through corresponding said method, be not defined as simultaneously use said method obtain.

In step S23, temperature influence value f (T) is with charging current influence value f in the change function of temperature T, step S33 ₁(I ₁) with charging current I ₁change function, discharge current influence value f in step S43 ₂(I ₂) with discharge current I ₂change function and step S53 in depth of discharge influence value f (DOD) obtain with the logical curve of all crossing of change function of depth of discharge DOD.The function that this kind of method curve obtains, only needs to substitute into function and can calculate electrokinetic cell cycle life, can be convenient to the calculating of follow-up driving force battery cycle life.

Temperature influence value f (T) is with change function, the charging current influence value f of temperature T ₁(I ₁) with charging current I ₁change function, discharge current influence value f ₂(I ₂) with discharge current I ₂change function and depth of discharge influence value f (DOD) also can by setting up form with the change function of depth of discharge DOD, or test obtains discrete function and realizes, but this mode is inconvenient for setting up electrokinetic cell cycle life, tables look-up or calculates all more loaded down with trivial details.

The method of curve is least square method.The approximating method of least square method, is easily realized by computer program, and a lot of software carries this program, and matching is convenient, simplifies calculation process.Can certainly obtain function by method of interpolation, approximatioss, but the accuracy rate of this kind of method is low.

Particularly, elect-10 DEG C, 0 DEG C, 10 DEG C, 25 DEG C, 45 DEG C and 60 DEG C respectively as by temperature T, test obtains corresponding temperature influence value f (T), obtains the formula of temperature influence value f (T) through least square fitting:

F (T)=0.012%/time × [1+ (T-25)/60];

By different charging current I ₁elect 0.3C, 0.5C, 1C as respectively, test obtains corresponding charging current influence value f ₁(I ₁), obtain charging current influence value f through least square fitting ₁(I ₁) formula:

f ₁(I ₁)＝0.5＋(I ₁-0.5)；

By different discharge current I ₂elect 0.5C, 1C, 1.5C, 2C as respectively, test obtains corresponding discharge current influence value f ₂(I ₂), obtain discharge current influence value f through least square fitting ₂(I ₂) formula:

f ₂(I ₂)＝1＋0.4×(I ₁-1)；

Elect 70%, 80%, 90% and 100% respectively as by different depth of discharge DOD, test obtains corresponding depth of discharge influence value f (DOD), obtains the formula of depth of discharge influence value f (DOD) through least square fitting:

f(DOD)＝100％×1.5 ^(DOD-1)/0.1。

Temperature T in said method is controlled by the insulation can placing electrokinetic cell, puts into insulation can by electrokinetic cell, is controlled the temperature of electrokinetic cell by the temperature controlling insulation can.By insulation can control temperature, temperature is easy to control, and can ensure the temperature value in test process, to obtain more accurate electrokinetic cell capacity attenuation model.Certain temperature T also can be obtained by direct heated power battery or refrigeration electrokinetic cell, but this kind of mode, temperature T is stable not.

Charging current I ₁, discharge current I ₂, depth of discharge DOD and capacity target value Q by discharge and recharge instrument designing, discharge and recharge instrument is connected with electrokinetic cell signal.The setting of each parameter is carried out by discharge and recharge instrument, easy to operate.Device when can certainly be used by actual electrokinetic cell or be charged realizes, but this kind of mode cost is too high.

Particularly, electrokinetic cell is connected with discharge and recharge instrument signal, is all connected with computing machine by control card simultaneously, is ordered by the computing machine number of sending out, to realize the control of electrokinetic cell parameter; Electrokinetic cell simultaneously marine site low-tension supply connects, to provide power supply.

Although the present invention is described in conjunction with above embodiment, but the present invention is not limited to above-described embodiment, and only by the restriction of claim, those of ordinary skill in the art can easily modify to it and change, but do not leave essential idea of the present invention and scope.

Claims (9)

1. an electrokinetic cell cycle life method of testing, is characterized in that, comprising:

Step S1: capacity initial value Q when probe temperature 25 DEG C, 0.5C charging, 1C electric discharge, depth of discharge are 100% ₀;

Step S2: different temperatures T is to the temperature influence value f (T) of capacity attenuation speed in test;

Step S3: test different charging current I ₁to the charging current influence value f of described capacity attenuation speed ₁(I ₁);

Step S4: test different discharge current I ₂to the discharge current influence value f of described capacity attenuation speed ₂(I ₂);

Step S5: test the depth of discharge influence value f (DOD) of different depth of discharge DOD to described capacity attenuation speed;

Step S6: the capacity target value Q determining electrokinetic cell capacity attenuation;

Step S7: the model setting up described electrokinetic cell capacity attenuation,

Q＝Q ₀×f(T)×f(I)×f(DOD)×C(cycle)；

Calculate the cycle index C of electrokinetic cell during charging ₁(cycle),

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

; Calculate the cycle index C of described electrokinetic cell during electric discharge ₂(cycle),

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}.$

2. electrokinetic cell cycle life method of testing according to claim 1, it is characterized in that, described step S2 comprises:

Step S21: based in described step S7

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

With

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$

Setting C ₁(cycle)=C ₂(cycle)=1000;

Step S22: test 0.5C charges to described electrokinetic cell and is full of completely, and 1C is discharged to described electrokinetic cell and discharges completely, the temperature influence value f (T) that different temperatures T is corresponding;

Step S23: according to the test result in described step S22, with temperature T for independent variable, its corresponding temperature influence value f (T) is dependent variable, obtains the change function of temperature influence value f (T) with temperature T.

3. electrokinetic cell cycle life method of testing according to claim 2, it is characterized in that, described step S3 comprises:

Step S31: based in described step S7

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

With

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$

Setting C ₁(cycle)=C ₂(cycle)=1000;

Step S32: test 25 DEG C, 0.5C is discharged to described electrokinetic cell and discharges completely, different charging current I ₁charge to the complete full state of described electrokinetic cell, each self-corresponding charging current influence value f ₁(I ₁);

Step S33: according to the test result in described step S32, with charging current I ₁for independent variable, its corresponding discharge current influence value f ₁(I ₁) be dependent variable, obtain charging current influence value f ₁(I ₁) with charging current I ₁change function.

4. electrokinetic cell cycle life method of testing according to claim 3, it is characterized in that, described step S4 comprises:

Step S41: based in described step S7

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

With

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$

Setting C ₁(cycle)=C ₂(cycle)=1000;

Step S42: test 25 DEG C, 0.5C charges to described electrokinetic cell and be full of completely, different discharge current I ₂be discharged to the complete discharge condition of described electrokinetic cell, each self-corresponding discharge current influence value f ₂(I ₂);

Step S43: according to the test result in described step S42, with discharge current I ₂for independent variable, its corresponding discharge current influence value f ₂(I ₂) be dependent variable, obtain discharge current influence value f ₂(I ₂) with discharge current I ₂change function.

5. electrokinetic cell cycle life method of testing according to claim 4, it is characterized in that, described step S5 comprises:

Step S51: based in described step S7

$C_1\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_1\left(I_1\right)\×f\left(DOD\right)}$

With

$C_2\left(cycle\right)=\frac{Q}{Q_0\×f\left(T\right)\×f_2\left(I_2\right)\×f\left(DOD\right)}$

Setting C ₁(cycle)=C ₂(cycle)=1000;

Step S52: test 25 DEG C, 0.5C charges to described electrokinetic cell and be full of completely, when 1C is discharged to the different depth of discharge DOD of described electrokinetic cell, corresponding depth of discharge influence value f (DOD);

Step S53: according to the test result in described step S52, with depth of discharge DOD for independent variable, its corresponding depth of discharge influence value f (DOD) is dependent variable, obtains the change function of depth of discharge influence value f (DOD) with depth of discharge DOD.

6. electrokinetic cell cycle life method of testing according to claim 5, is characterized in that, in described step S23, temperature influence value f (T) is with charging current influence value f in the change function of temperature T, described step S33 ₁(I ₁) with charging current I ₁change function, discharge current influence value f in described step S43 ₂(I ₂) with discharge current I ₂change function and described step S53 in depth of discharge influence value f (DOD) obtain with the logical curve of all crossing of change function of depth of discharge DOD.

7. electrokinetic cell cycle life method of testing according to claim 6, is characterized in that, the method for described curve is least square method.

8. the electrokinetic cell cycle life method of testing according to any one of claim 1-7, is characterized in that, described temperature T is controlled by the insulation can placing described electrokinetic cell.

9. the electrokinetic cell cycle life method of testing according to any one of claim 1-7, is characterized in that, described charging current I ₁, described discharge current I ₂, described depth of discharge DOD and described capacity target value Q by discharge and recharge instrument designing, described discharge and recharge instrument is connected with described electrokinetic cell signal.