CN105389971A - High-interference-resistant infrared pair-transistor detection circuit - Google Patents
High-interference-resistant infrared pair-transistor detection circuit Download PDFInfo
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- CN105389971A CN105389971A CN201510842757.XA CN201510842757A CN105389971A CN 105389971 A CN105389971 A CN 105389971A CN 201510842757 A CN201510842757 A CN 201510842757A CN 105389971 A CN105389971 A CN 105389971A
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Abstract
The invention discloses a high-interference-resistant infrared pair-transistor detection circuit. The high-interference-resistant infrared pair-transistor detection circuit comprises a transmitting circuit, a receiving circuit, an RC differential circuit and a detection circuit, wherein the output end of the transmitting circuit is connected with the input end of the receiving circuit, the output end of the receiving circuit is connected with the input end of the differential circuit, and the output end of the differential circuit is connected with the input end of the detection circuit. The high-interference-resistant infrared pair-transistor detection circuit is simple in circuit structure, stable in performance, convenient to install, good in performance through long-term application and capable of accurately identifying whether a substance exists between a transmitting tube and a receiving tube or not in the condition whether the illumination of an operation environment is changed from night to daytime or from indoor to outdoor sunlight; and moreover, when the high-interference-resistant pair-transistor detection circuit is used for feed detection in automatic gem processing equipment, errors can be avoided.
Description
Technical field
The high anti-interference infrared receiving/transmission of one of the present invention, to pipe testing circuit, belongs to technical field of automation in industry.
Background technology
Infrared tube is a kind of infrared tube is infrared emission tube and photosensitive receiving tube, or infrared receiver tube, or infrared receiving terminal is combined together general name when use, the change producing obvious low and high level is exported according to peripheral circuit, the change of low and high level input single-chip microcomputer just can be made it to identify, thus realize Based Intelligent Control, and at present at counting, the revolution of the number of note liquid dropping, the number of note glass pellet, note dolly wheel.
As Fig. 1, current infrared transmitting circuit is made up of resistance R2, triode Q2, resistance R3 and infrared-emitting diode D1, and receiving circuit is made up of infrared receiving tube and amplifying circuit.After Q4 receives infrared signal, carry out first order amplification through triode Q1, the signal after amplification is sent into triode Q3 and is carried out second level amplification, the received IR signal after just can being amplified by Rx.RX will process low level state, and when the workpiece gear needing to detect is between D1 and Q4, because Q4 can not can not receive infrared signal, Q4 is in high-impedance state, and RX exports high level.Judge whether that the workpiece needing to detect exists with the level state that RX exports, but due to the impact of natural lighting, the internal resistance of Q4 can along with change, after intensity of illumination exceedes some strength, process is roared conjunction state by Q1, circuit exports and will lose efficacy, and existing infrared tube testing circuit, produce and use very complicated, add the labile factor of equipment, by its be when send out thank pipe needs the distance of separating larger with receiving tube time, affect the most seriously, so existing infrared tube testing circuit is still perfect not.
Summary of the invention
Goal of the invention of the present invention is: provide a kind of circuit structure simple, stable performance, easy for installation, good through Long-Time Service performance, working environment illumination is from evening to tomorrow, indoor under outdoor solar light, can identify accurately to send out and thank to the high anti-interference infrared tube testing circuit of the one having empty value to exist between pipe and receiving tube, to overcome the deficiencies in the prior art.
The present invention is achieved in that a kind of high anti-interference infrared tube testing circuit, this high anti-interference infrared tube testing circuit comprises radiating circuit, receiving circuit, RC differentiating circuit and testing circuit, the output terminal of described radiating circuit is connected with the input end of receiving circuit, the output terminal of receiving circuit is connected with the input end of differentiating circuit, and the output terminal of differentiating circuit is connected with the input end of testing circuit.
Described radiating circuit is connected to form by resistance R1 and infrared-emitting diode D1.
Described receiving circuit is connected to form by infrared receiving tube Q1 and resistance R11, is provided with A point current potential between infrared receiving tube Q1 and resistance R11.
Described RC differentiating circuit is connected to form by electric capacity C5 and resistance R10, is provided with B point current potential between electric capacity C5 and resistance R10.
Described testing circuit is connected to form by LM358 amplifier, resistance R8 and resistance R9, and testing circuit is provided with C point current potential.
The output terminal of described testing circuit is connected with processor.
Described processor is 51 single-chip microcomputer microcomputer chips.
Owing to have employed technique scheme, circuit structure of the present invention is simple, stable performance, easy for installation, good through Long-Time Service performance, working environment illumination is from evening to tomorrow, indoor under outdoor solar light, can identify accurately to send out to thank between pipe and receiving tube has empty value to exist, and uses this circuit to detect for the charging in automatic gem stone process equipment, can not produce the advantages such as error.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of traditional over-voltage detection circuit;
Fig. 2 is the schematic diagram of testing circuit of the present invention;
Fig. 3 is each signal sequence corresponding relation of whole overvoltage testing process of the present invention;
Fig. 4 is the structural representation that the present invention is connected with processor;
Description of reference numerals.
Embodiment
Below in conjunction with drawings and Examples, the present invention is described in further detail, but not as limitation of the present invention.
Embodiments of the invention: a kind of high anti-interference infrared tube testing circuit, this high anti-interference infrared tube testing circuit comprises radiating circuit 1, receiving circuit 2, RC differentiating circuit 3 and testing circuit 4, the output terminal of described radiating circuit 1 is connected with the input end of receiving circuit 2, the output terminal of receiving circuit 2 is connected with the input end of differentiating circuit 3, and the output terminal of differentiating circuit 3 is connected with the input end of testing circuit 4.
Described radiating circuit 1 is connected to form by resistance R1 and infrared-emitting diode D1.
Described receiving circuit 2 is connected to form by infrared receiving tube Q1 and resistance R11, is provided with A point current potential between infrared receiving tube Q1 and resistance R11.
Described RC differentiating circuit 3 is connected to form by electric capacity C5 and resistance R10, is provided with B point current potential between electric capacity C5 and resistance R10.
Described testing circuit 4 is connected to form by LM358 amplifier, resistance R8 and resistance R9, and testing circuit 4 is provided with C point current potential.
The output terminal of described testing circuit 4 is connected with processor 5.
Described processor 5 is 51 single-chip microcomputer microcomputer chips.
As described in Figure 2, during work, TX0 adds the square wave that 10KHZ dutycycle is 50%, in circuit, C5 and R10 forms RC differentiating circuit, the signal that B point current potential is received is only relevant with the pulse change of input, not by the impact of A point current potential DC working potential, the square-wave signal that B point potential pulse is reduced to 10KHZ after LM358 amplifier amplifies is sent in the counter of single-chip microcomputer, for counting the pulse number recorded and receive, during work, after TX0 inputs certain pulse number, check the pulse number once received, if identical, put and export as high level, otherwise output low level, continue for coming by oneself according to the height of output level voluntarily by rear establishing, without the need to mode after whole Circuit assembly completes, work is with reliable.
Processor 5 adopts band high precision clock in STC15W201S, and do not need external crystal-controlled oscillation and reset circuit, circuit is simple, and according to STC official website price, 1.2 yuan 1, whole circuit cost is no more than 5 yuan.And a chip can process 4 detections at most simultaneously, cost is lower.
Circuit of the present invention is simple, stable performance, easy for installation, good through Long-Time Service performance, working environment illumination is from evening to tomorrow, and indoor under outdoor solar light, can identify accurately to send out to thank between pipe and receiving tube has empty value to exist, this circuit is used to detect for the charging in automatic gem stone process equipment, accurately efficiently.
Claims (7)
1. one kind high anti-interference infrared tube testing circuit, it is characterized in that: this high anti-interference infrared tube testing circuit comprises radiating circuit (1), receiving circuit (2), RC differentiating circuit (3) and testing circuit (4), the output terminal of described radiating circuit (1) is connected with the input end of receiving circuit (2), the output terminal of receiving circuit (2) is connected with the input end of differentiating circuit (3), and the output terminal of differentiating circuit (3) is connected with the input end of testing circuit (4).
2. the anti-interference infrared tube testing circuit of height according to claim 1, is characterized in that: described radiating circuit (1) is connected to form by resistance R1 and infrared-emitting diode D1.
3. the anti-interference infrared tube testing circuit of height according to claim 1, is characterized in that: described receiving circuit (2) is connected to form by infrared receiving tube Q1 and resistance R11, is provided with A point current potential between infrared receiving tube Q1 and resistance R11.
4. the anti-interference infrared tube testing circuit of height according to claim 1, is characterized in that: described RC differentiating circuit (3) is connected to form by electric capacity C5 and resistance R10, is provided with B point current potential between electric capacity C5 and resistance R10.
5. the anti-interference infrared tube testing circuit of height according to claim 1, is characterized in that: described testing circuit (4) is connected to form by LM358 amplifier, resistance R8 and resistance R9, and testing circuit (4) is provided with C point current potential.
6. the anti-interference infrared tube testing circuit of height according to claim 1, is characterized in that: the output terminal of described testing circuit (4) is connected with processor (5).
7. the anti-interference infrared tube testing circuit of height according to claim 6, is characterized in that: described processor (5) is 51 single-chip microcomputer microcomputer chips.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510842757.XA CN105389971A (en) | 2015-11-29 | 2015-11-29 | High-interference-resistant infrared pair-transistor detection circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510842757.XA CN105389971A (en) | 2015-11-29 | 2015-11-29 | High-interference-resistant infrared pair-transistor detection circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105389971A true CN105389971A (en) | 2016-03-09 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510842757.XA Pending CN105389971A (en) | 2015-11-29 | 2015-11-29 | High-interference-resistant infrared pair-transistor detection circuit |
Country Status (1)
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| CN (1) | CN105389971A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106639744A (en) * | 2016-11-29 | 2017-05-10 | 南京集羽电子科技有限公司 | Intelligent window |
| CN107370543A (en) * | 2016-05-11 | 2017-11-21 | 广州日铨电子有限公司 | Infrared ray anti-jamming circuit |
-
2015
- 2015-11-29 CN CN201510842757.XA patent/CN105389971A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107370543A (en) * | 2016-05-11 | 2017-11-21 | 广州日铨电子有限公司 | Infrared ray anti-jamming circuit |
| CN106639744A (en) * | 2016-11-29 | 2017-05-10 | 南京集羽电子科技有限公司 | Intelligent window |
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| C06 | Publication | ||
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| WD01 | Invention patent application deemed withdrawn after publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20160309 |