CN105352708A - Measurement device of diffused light reduced luminance coefficient of auto-darkening welding filter - Google Patents
Measurement device of diffused light reduced luminance coefficient of auto-darkening welding filter Download PDFInfo
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- CN105352708A CN105352708A CN201510615308.1A CN201510615308A CN105352708A CN 105352708 A CN105352708 A CN 105352708A CN 201510615308 A CN201510615308 A CN 201510615308A CN 105352708 A CN105352708 A CN 105352708A
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- diffused light
- darkening welding
- welding filter
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- photodetector
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
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Abstract
The present invention discloses a measurement device of a diffused light reduced luminance coefficient of an auto-darkening welding filter. The measurement device comprises a measuring light source, a triggering light source, a sample, a sample holder, a composite diaphragm, a diaphragm support, an imaging lens and a photoelectric detector, the measuring light source, the sample, the composite diaphragm, a convex lens and the photoelectric detector are located at the same optical axis. The measurement device of a diffused light reduced luminance coefficient of an auto-darkening welding filter is characterized in that: a composite diaphragm is employed to simultaneously measure optical signals of different regions of a space formed by different structure modes of the same diaphragm, so that measurement steps and measurement time are decreased, influences of external disturbances on measurement results are reduced and automatic measurement precision of the diffused light reduced luminance coefficient of the auto-darkening welding filter is improved; and moreover, the measurement device of the diffused light reduced luminance coefficient of the auto-darkening welding filter is small in size, simple in structure and easy to adjust.
Description
Technical field
The present invention relates to a kind of for protective gear during weld job, particularly one
automatic darkening welding filter lens diffused light reduction luminance factor measurement mechanism.
Background technology
When weld job, a large amount of ultraviolet, infrared ray, high light injury eyes can be produced.Therefore people develop automatic darkening welding filter lens to protect welder.Automatic darkening welding filter lens is made up of infrared sensor, light valve, control circuit, power supply, framework, inside and outside screening glass etc.; by the initiation of arc light with extinguish the shade number conversion automatically controlling optical filtering; realize dark and bright states conversion, thus the protection effectively improved laborer and work efficiency.
as Fig. 1shown in, when a branch of directional light front illuminated automatic darkening welding filter lens, the emergent light that direction changes is called diffused light.If represent the intensity of diffused light with LS, E represents the illumination of incident light, and l=LS/E represents the characteristic of diffusion.Because l is relevant with transmittance τ V, in order to the characteristic of direct representation diffusion, definition l*=l/ τ V, is called the reduction luminance factor of diffused light.The diffused light that most automatic darkening welding filter lens produces is symmetrical relative to optical axis, therefore usually measures and optical axis included angle is that diffusion light intensity between α to Δ α is to represent the average level of reduction luminance factor.Generally we select to measure between α=1.5 ° to α+Δ α=2 ° between solid angle diffusion light intensity.
China exists
countrythe examination criteria about automatic darkening welding filter lens has been proposed in standard GB/T3609.2-2009, for diffused light index, give measuring method and device example, but due to this measuring system more complicated, build with adjustment System and inconvenience, therefore not widespread use, this diffused light surveying instrument that result also in the market is little.And for example Chinese Patent Application No. is that same test macro not only adopts circular iris but also adopt annular diaphragm disclosed in the patented claim of 2013106367058
automatic darkening welding filter lens diffused light reduction luminance factor measurement mechanism, need during test repeatedly to change diaphragm, bring operational inconvenience to experimenter, also affect the accuracy of measurement.
Summary of the invention
Technical matters to be solved by this invention be to provide a kind of can the device of measurement automatic darkening welding filter lens diffused light reduction luminance factor of simplified measurement process.
The technical solution adopted in the present invention is: a kind of
automatic darkening welding filter lens diffused light reduction luminance factor measurement mechanismcomprise: path-splitting optical signal reception system, data acquiring control circuit, embedded computer, also comprise the measurement light source, sample, sample clamping frame, compound diaphragm, apertured bracket, the first imaging len, the second imaging len, the first photodetector and the second photodetector that arrange on same optical axis in turn, the region path-splitting that sample is irradiated with a laser is imaged on the first photodetector and the second photodetector by described first imaging len and the second imaging len respectively simultaneously.Before making the present invention, the effect of compound diaphragm will be realized when implementing experiment, need first to use circular iris, after then changing circular iris, change annular diaphragm, installation repeatedly/unload circular iris/annular diaphragm, user one tests straight through loaded down with trivial details operation, very inconvenient, and owing to being that different time is measured, Measuring Time is long, whole system is made easily to be subject to the impact of noise and temperature drift, thus the accuracy of impact measurement and measuring accuracy.
Described compound diaphragm is circular concentric diaphragm integrated at grade and annular diaphragm.Circular iris and annular diaphragm are designed to compound diaphragm, utilize two lens and two photodetectors to measure simultaneously by the present invention, solve the use problem perplexing user's troublesome operation for a long time measuring principle with system apparatus arrangements.
Compound diaphragm center is circular iris, and logical light diameter is 10mm; Outside is annular diaphragm, annular diameters 21.0 ± 0.1mm, outer annular diameter 28.0 ± 0.1mm.
The output signal of described photodetector by embedded computer through data acquiring control circuit collection.
Also comprise triggering light source, described triggering light source is triggered through data acquiring control circuit by embedded computer.
Described sample distance compound diaphragm is 400 ± 2mm.
Described acquisition control circuit comprises path-splitting I/V translation circuit, gain control circuit, low-pass filter circuit, A/D converter, embedded computer, current-limiting resistance and triggering light circuit for generating.
Described embedded computer circuit is connected with I/V translation circuit by described gain control circuit; Described path-splitting I/V translation circuit comprises 2 photodetectors, 4 feedback networks and Low-bias Current amplifier.
Described measurement light source is semiconductor laser, comprises semiconductor cooler (TEC) and negative tempperature coefficient thermistor sensor (NTC).The temperature control system that measurement light source forms through semiconductor cooler (TEC) and negative tempperature coefficient thermistor sensor (NTC) realizes stable-power output, and said apparatus improves the rejection ability of system to noise and drift.
The invention has the beneficial effects as follows: the light signal of the space zones of different that the different structure pattern utilizing compound diaphragm simultaneously to measure same diaphragm is formed, simplified measuring process, decrease the measurement used time, reduce the impact of external interference on measurement result; By the stable-power output adopting measurement light source temperature control system to realize luminous power; Said apparatus improves the measuring accuracy of the brightness reduction coefficient of the diffused light measuring automatic darkening welding filter lens; And have the advantages that volume is little, structure is simple, easy to adjust.
Accompanying drawing explanation
fig. 1illustrated by the scattered light of automatic darkening welding filter lens
figure;
fig. 2it is the structural representation of measurement mechanism of the present invention
figure;
fig. 3it is measuring system structural representation of the present invention
figure;
fig. 4it is sample clamping shelf structure of the present invention signal
figure;
fig. 5it is triggering light-source structure of the present invention signal
figure;
fig. 6it is acquisition control circuit frame of the present invention
figure;
fig. 7it is I/V translation circuit frame of the present invention
figure;
fig. 8it is gain control circuit frame of the present invention
figure;
fig. 9it is compound diaphragm of the present invention structural representation
figure.
Embodiment
Below in conjunction with
accompanying drawingwith embodiment, the present invention is described in further detail:
as Fig. 2,
fig. 3shown in, be automatic darkening welding filter lens diffused light proving installation structure of the present invention
figure, comprising: measurement light source 1 is set in turn, triggering light source 2, the sample 3 with holding frame 4, the compound diaphragm 5 with apertured bracket 7, convex lens 8, first photodetector 9, convex lens 13, second photodetector 14, acquisition control circuit 10, embedded computer 11, device base plate 12 and casing 15 are formed; Wherein, LASER Light Source 1, sample 3, compound diaphragm 5, convex lens 8, first photodetector 9, convex lens 13, second photodetector 14, be fixed on device base plate 12 by its support respectively, be on same optical axis; Sample 3 is clamped by sample clamping frame 4; Trigger light source 2 to be pressed on the infrared sensor of sample 3 its own band, the pulsed infrared light sent can make sample 3 be in dark-state; Compound diaphragm 5 is arranged on apertured bracket 7.Described measurement light source 1 comprises laser instrument 1-1, support 1-2, power supply 1-3, laser instrument 1-1 comprises semiconductor cooler (TEC) and negative tempperature coefficient thermistor sensor (NTC), and the temperature control system that measurement light source forms through semiconductor cooler (TEC) and negative tempperature coefficient thermistor sensor (NTC) realizes stable-power output; Laser instrument 1-1 used is 532nm semiconductor laser, emergent light spot is 2.5mm, the angle of divergence is less than 1mrad, power is 6mw, power supply 1-3 used is 5V power supply, laser instrument 1-1 is fixed on support 1-2, and support 1-2 is fixed by screws on device base plate 12, and sample 3 is 400 ± 2mm apart from compound diaphragm; Compound diaphragm 5 is circular concentric diaphragm 5-1 integrated at grade and annular diaphragm 5-2.The center of compound diaphragm 5 is circular iris, and logical light diameter is 10mm, outside is annular diaphragm, the annular diameters 21.0 ± 0.1mm of the logical photo structure of annular, outer annular diameter 28.0 ± 0.1mm, and uncertainty is no more than 0.01mm, and compound diaphragm is placed in diaphragm frame; Convex lens 8 by the region that sample 3 is irradiated with a laser by the circular configuration of diaphragm, convex lens 13 by region that sample 3 the is irradiated with a laser loop configuration by diaphragm, be imaged on respectively on the first photodetector 9 and the second photodetector 14, lens and photodetector are placed in lens and photodetector support respectively simultaneously; The output signal of the first photodetector 9, second photodetector 14 is gathered through data acquiring control circuit 10 by computing machine 11; Trigger light source 2 to be triggered through data acquiring control circuit 9 by computing machine 11.
as Fig. 4shown in, described sample clamping frame 4 comprises column 4-1, reed 4-2 and pedestal 4-3, the lower end of column 4-1 and reed 4-2 is separately fixed on described pedestal 4-3, and the sample 3 of different-thickness can be pressed on column 4-1 by the top of reed 4-2, and pedestal 4-3 is fixed by screws on device base plate 12.
as Fig. 5shown in, described triggering light source 2 comprises screw rod 2-1, slide block 2-2, slide bar 2-3 and infrared LED lamp 2-4, slide bar 2-3 and is bolted on the pedestal 2-3 of sample clamping frame 4, and slide block 2-2 is arranged on slide bar 2-3; Screw rod 2-1 and slide block 2-2 is linked together by threaded engagement, there is shoulder hole screw rod 2-1 inside, infrared LED lamp 2-4 fills in shoulder hole the front end be fixed in screw rod 2-1 inside, rotating rod 2-3 sliding slider 2-2 can adjust the position of infrared LED lamp 2-4, and rotary screw 2-1 can make infrared LED lamp 2-4 be pressed on the detector of sample 3.
as Fig. 6shown in, described acquisition control circuit 10 comprises I/V translation circuit 10-1, gain control circuit 10-2, low-pass filter circuit 10-3, A/D converter 10-4, embedded computer 10-5, current-limiting resistance 10-6.
as Fig. 7shown in, described I/V translation circuit 10-1 Low-bias Current amplifier, four road feedback networks, every road feedback network comprises resistance, electric capacity, resistance is connected with Capacitance parallel connection, every road resistance and electric capacity select different values as required, feedback network one end, every road is connected to the negative input end of Low-bias Current amplifier, the other end connects the Chang Kaiduan of the relay of gain control circuit 10-2, Low-bias Current amplifier positive input terminal ground connection, positive input terminal is also connected with the positive pole of the first photodetector 9, Low-bias Current amplifier negative input end is connected with the negative pole of the first photodetector 9, Low-bias Current amplifier out is connected with the common port of the relay of gain control circuit 10-2, also be connected with low-pass filter circuit 10-3.
as Fig. 8shown in, described gain control circuit 10-2 comprises 4 gain control path, tunnel, every road gain path controls to comprise current-limiting resistance, triode, relay, described embedded computer 10-5I/O mouth is by current-limiting resistance connecting triode ground level, relay coil termination enters transistor collector, the Chang Kaiduan of relay connects the feedback network of I/V translation circuit 10-1, and the common port of relay is connected with the output terminal of the Low-bias Current amplifier of I/V translation circuit 10-1.Embedded computer 10-5, by arranging the height of the output level of 4 I/O mouths, selects corresponding relay opening and closing, thus makes I/V translation circuit 10-1 select different feedback network, namely different resistance values, realizes different gain selections.When starting to measure, embedded computer 10-5 selects lowest gain by gain control circuit 10-2, the light intensity signal received is converted to current signal by photodetector 9,14, voltage signal is transformed into again by I/V translation circuit 10-1, after low-pass filter circuit 10-3, send into A/D converter 10-4 carry out A/D conversion, transformation result is sent in embedded computer 10-5, embedded computer 10-5 selects suitable gain according to surveyed magnitude of voltage, remeasure again, obtain voltage results feeding computing machine 11 accurately and carry out data processing and display.
The PWM delivery outlet that embedded computer 10-5 carries can realize exporting PWM ripple by software programming, and the PWM delivery outlet that the present invention uses embedded computer 10-5 to carry connects current-limiting resistance 10-6 and controls infrared LED lamp 2-4.When needing the dark-state shade number arranging sample, embedded computer 10-5 can export PWM ripple control infrared LED lamp 2-4 and send pulsed light, triggers and transfers dark-state to.
The present invention adopts the first photodetector 9, light intensity signal is converted to current signal, then current signal is converted to voltage signal by photodetector 14, represents with surveyed magnitude of voltage the light intensity that the first photodetector 9, second photodetector 14 receives.The circular configuration of diaphragm only allows the light near by optical axis, the light intensity of what now the first photodetector 9 received is non-diffused light; The loop configuration of diaphragm only allows by the light in the solid angle of annular, and the light intensity that now the second photodetector 14 receives is diffusion light intensity.By the light intensity using the circle of diaphragm 5 and loop configuration can obtain diffusion light intensity and non-diffuse light respectively simultaneously.
Measuring process is as follows: first, is carried by sample 3
'sthe shade number of button settings sample 3, if setting dark-state shade number, acquisition control circuit 10 controls to trigger light source 2 and opens; Secondly, open measurement light source 1, acquisition control circuit 10 measures the light intensity received by the first photodetector 9, second photodetector 14, obtains measurement mechanism and magnitude of voltage U corresponding to the total diffusion light intensity of sample simultaneously
1Rwith measurement mechanism and magnitude of voltage U corresponding to the total non-diffuse light intensity of sample
1L; Reduction luminance factor l*g=(1/ ω) * (U of computation and measurement device and the total diffused light of sample
1R/ U
1L), wherein: ω is the solid angle determined by annular diaphragm, generally get the solid angle between α=1.5 ° to α+Δ α=2 °; Then, remove sample 3, acquisition control circuit 10 measures the light intensity received by the first photodetector 9, second photodetector 14, obtains the magnitude of voltage U that the non-diffuse light intensity of measurement mechanism self is corresponding
2Lthe magnitude of voltage U corresponding with the diffusion light intensity of measurement mechanism self
2R; Reduction luminance factor l*a=(1/ ω) the * U of the diffused light of computation and measurement device self
2R/ U
2L, wherein: ω is the solid angle determined by annular diaphragm, generally get the solid angle between α=1.5 ° to α+Δ α=2 °; Finally, the brightness reduction coefficient l*=l*g-l*a that self produce of sample 3 under this shade number is calculated.
Because the strong variation range of bright half-light of automatic darkening welding filter lens is very big, reach 10
7although the dynamic range of the first photodetector 9, second photodetector 14 can reach, and the dynamic range of amplifier does not reach.Therefore, the scheme selecting Low-bias Current amplifier to add multichannel gain control in the first order realizes I-V conversion and gain control circuit.During each measurement, first select the minimum gear of gain to measure, then adjust gain selection according to the size of surveyed voltage, until the gain shift selected is suitable.It should be noted that the magnitude of voltage recorded could must be substituted into aforementioned formula divided by yield value calculates.
The present invention also uses RS232 line to realize and the communication of computing machine 11, realizes the further expanding functionally such as the control of measuring process and result display.
Claims (9)
1. an automatic darkening welding filter lens diffused light reduction luminance factor measurement mechanism, comprise: path-splitting optical signal reception system (1-14), data acquiring control circuit (10), embedded computer (11), it is characterized in that: also comprise the measurement light source (1) arranged on same optical axis in turn, sample (3), sample clamping frame (4), compound diaphragm (5), apertured bracket (7), first imaging len (8), second imaging len (13), first photodetector (9) and the second photodetector (14), the region path-splitting that sample (3) is irradiated with a laser is imaged on the first photodetector (9) and the second photodetector (14) by described first imaging len (8) and the second imaging len (13) respectively simultaneously.
2. automatic darkening welding filter lens diffused light reduction luminance factor measurement mechanism according to claim 1, is characterized in that: described compound diaphragm (5) is circular concentric diaphragm (5-1) integrated at grade and annular diaphragm (5-2).
3. automatic darkening welding filter lens diffused light reduction luminance factor measurement mechanism according to claim 2, is characterized in that: compound diaphragm (5) center is circular iris, and logical light diameter is 10mm; Outside is annular diaphragm, annular diameters 21.0 ± 0.1mm, outer annular diameter 28.0 ± 0.1mm.
4. automatic darkening welding filter lens diffused light reduction luminance factor measurement mechanism according to claim 1, is characterized in that: the output signal of described first photodetector (9) and the second photodetector (14) is gathered through data acquiring control circuit (10) by embedded computer (11).
5. automatic darkening welding filter lens diffused light reduction luminance factor measurement mechanism according to claim 1, it is characterized in that: also comprise and trigger light source (2), described triggering light source (2) is triggered through data acquiring control circuit (10) by embedded computer (11).
6. automatic darkening welding filter lens diffused light reduction luminance factor measurement mechanism according to claim 1, is characterized in that: described sample (3) distance compound diaphragm (5) is 400 ± 2mm.
7. automatic darkening welding filter lens diffused light reduction luminance factor measurement mechanism according to claim 1, is characterized in that: described acquisition control circuit (10) comprises path-splitting I/V translation circuit (10-1,10-6), gain control circuit (10-2), low-pass filter circuit (10-3), A/D converter (10-4), embedded computer (10-5), current-limiting resistance (10-6) and triggers light circuit for generating (10-7).
8. automatic darkening welding filter lens diffused light reduction luminance factor measurement mechanism according to claim 7, it is characterized in that, described embedded computer (10-5) circuit is connected with I/V translation circuit (10-1,10-6) by described gain control circuit (10-2); Described path-splitting I/V translation circuit (10-1,10-6) comprises 2 photodetectors, 4 feedback networks and Low-bias Current amplifier.
9. automatic darkening welding filter lens diffused light reduction luminance factor measurement mechanism according to claim 1, it is characterized in that: described measurement light source (1) is semiconductor laser, comprise semiconductor cooler (TEC) and negative tempperature coefficient thermistor sensor (NTC).
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510615308.1A CN105352708A (en) | 2015-09-22 | 2015-09-22 | Measurement device of diffused light reduced luminance coefficient of auto-darkening welding filter |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201510615308.1A CN105352708A (en) | 2015-09-22 | 2015-09-22 | Measurement device of diffused light reduced luminance coefficient of auto-darkening welding filter |
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| CN105352708A true CN105352708A (en) | 2016-02-24 |
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| CN201510615308.1A Pending CN105352708A (en) | 2015-09-22 | 2015-09-22 | Measurement device of diffused light reduced luminance coefficient of auto-darkening welding filter |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109186962A (en) * | 2018-11-05 | 2019-01-11 | 天津大学 | A kind of automatic beam change welding goggles clamping device |
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| JPH11320095A (en) * | 1998-05-11 | 1999-11-24 | Nippon Steel Corp | Method and device for imaging held zone |
| CN102445325A (en) * | 2010-10-13 | 2012-05-09 | 上海市安全生产科学研究所 | Device and method for measuring shade number of automatic darkening welding filter |
| CN103674491A (en) * | 2013-11-29 | 2014-03-26 | 天津大学 | Device of measuring diffused light reduced luminance coefficient for auto-darkening welding filter |
| CN103792072A (en) * | 2014-02-18 | 2014-05-14 | 深圳市瑞凌焊接科技有限公司 | System and method for testing light diffusion value of automatic variable light welding goggles |
| CN104655397A (en) * | 2013-11-19 | 2015-05-27 | 中国标准化研究院 | Device for detecting shading number and response time of auto-darkening welding filter |
-
2015
- 2015-09-22 CN CN201510615308.1A patent/CN105352708A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1096604A (en) * | 1995-12-25 | 1998-04-14 | Calsonic Corp | Seam part detector for seam welded pipe |
| JPH11320095A (en) * | 1998-05-11 | 1999-11-24 | Nippon Steel Corp | Method and device for imaging held zone |
| CN102445325A (en) * | 2010-10-13 | 2012-05-09 | 上海市安全生产科学研究所 | Device and method for measuring shade number of automatic darkening welding filter |
| CN104655397A (en) * | 2013-11-19 | 2015-05-27 | 中国标准化研究院 | Device for detecting shading number and response time of auto-darkening welding filter |
| CN103674491A (en) * | 2013-11-29 | 2014-03-26 | 天津大学 | Device of measuring diffused light reduced luminance coefficient for auto-darkening welding filter |
| CN103792072A (en) * | 2014-02-18 | 2014-05-14 | 深圳市瑞凌焊接科技有限公司 | System and method for testing light diffusion value of automatic variable light welding goggles |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109186962A (en) * | 2018-11-05 | 2019-01-11 | 天津大学 | A kind of automatic beam change welding goggles clamping device |
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