CN105352400A - Improved structure of PCB high-definition magnifier inspection bench - Google Patents
Improved structure of PCB high-definition magnifier inspection bench Download PDFInfo
- Publication number
- CN105352400A CN105352400A CN201510933809.4A CN201510933809A CN105352400A CN 105352400 A CN105352400 A CN 105352400A CN 201510933809 A CN201510933809 A CN 201510933809A CN 105352400 A CN105352400 A CN 105352400A
- Authority
- CN
- China
- Prior art keywords
- magnifier
- active gage
- rest area
- check
- high definition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length-Measuring Instruments Using Mechanical Means (AREA)
Abstract
The invention discloses an improved structure of a PCB high-definition magnifier inspection bench. The high-definition magnifier inspection bench is provided with a bench surface. The bench surface is provided with a working sheet placing area and size measuring areas arranged on the peripheries of the working sheet placing area. The working sheet placing area is in a rectangular shape. The peripheries of at least one pair of adjacent edges of the rectangular working sheet placing area are provided with the size measuring areas. The size measuring areas are provided with scales, and the scales are arranged along the edges of the working sheet placing area with an intersection of one pair of adjacent edges serving as a common zero scale. The improved structure of the PCB high-definition magnifier inspection bench has the advantages that just by placing the working sheet on the inspection bench, the size of the working sheet can be rapidly measured, and the inspection efficiency is improved.
Description
Technical field
The invention belongs to field of printed circuit board fabrication, be specifically related to a kind of modified node method of the high definition magnifier check-out console for carrying out quality management and control to PCB.
Background technology
After PCB completes or in manufacturing process, need to carry out a series of quality management and control in factory, wherein one is detected is exactly be put on high definition magnifier check-out console by PCB active gage to test, and is mainly used in checking the observation of press quality, printing net-point, angular dimension and printing the projects such as color separation.But because different PCB active gage item numbers is different, size is also different, and the trace routine needed is also different with the setting of parameter.At present, before setting program, staff needs to prepare separately one ruler, measure the length of PCB active gage and wide equidimension respectively, need by least twice measurement, the length of active gage and wide could be determined, then could setting program, this way is not only inconvenient, and efficiency is low, precision is low.
Summary of the invention
In order to solve the problem, the invention provides a kind of PCB high definition magnifier check-out console modified node method, as long as active gage is positioned on check-out console by this PCB high definition magnifier check-out console modified node method, the size of active gage can be measured rapidly, improve checkability.
The present invention in order to the technical scheme solving its technical matters and adopt is:
A kind of PCB high definition magnifier check-out console modified node method, high definition magnifier check-out console has table top, described table top has active gage rest area and is positioned at the dimensional measurement district of periphery, active gage rest area, described active gage rest area is rectangle, the outer of at least one pair of adjacent edge of the active gage rest area of rectangle is arranged with described dimensional measurement district, described dimensional measurement district is provided with rule, and the scale set-up mode of described rule be along the active gage rest area of rectangle edge arrange and be zero common groove with the intersection of a pair adjacent edge.
The present invention in order to the further technical scheme solving its technical matters and adopt is:
Say further, described rule is scale steel ruler.
Say further, described scale steel ruler is screwed in described dimensional measurement district.
Say further, the outer of a pair adjacent edge of the active gage rest area of described rectangle is arranged with described dimensional measurement district.
Say further, the outer of two pairs of adjacent edges of the active gage rest area of described rectangle is arranged with described dimensional measurement district.
Say further, the scale division value of described rule is 1 ㎜.
The invention has the beneficial effects as follows: table top is mainly arranged to active gage rest area and is positioned at the dimensional measurement district of periphery, active gage rest area by PCB high definition magnifier check-out console modified node method of the present invention, described dimensional measurement district is provided with rule, and the scale set-up mode of described rule be along the active gage rest area of rectangle edge arrange and be zero common groove with the intersection of a pair adjacent edge, therefore, before carrying out program setting, as long as active gage be positioned over the active gage rest area of this table top and correspond to zero graduation line by one of active gage jiao, just the size of active gage can be measured rapidly, improve checkability and convenience.
Accompanying drawing explanation
Fig. 1 is principle of the invention schematic diagram.
Embodiment
Below by way of specific instantiation, the specific embodiment of the present invention is described, those skilled in the art can understand advantage of the present invention and effect easily by content disclosed in the present specification.The present invention also can be implemented in further, different ways, that is, not departing under disclosed category, can give different modifications and change.
Embodiment: a kind of PCB high definition magnifier check-out console modified node method, high definition magnifier check-out console has table top 1, described table top has active gage rest area 11 and is positioned at the dimensional measurement district 12 of periphery, active gage rest area, described active gage rest area is rectangle, the outer of a pair adjacent edge of the active gage rest area of rectangle is arranged with described dimensional measurement district, described dimensional measurement district is provided with rule 121, and the scale set-up mode of described rule be along the active gage rest area of rectangle edge arrange and be zero common groove with the intersection of a pair adjacent edge.
Described rule is scale steel ruler.Described scale steel ruler is screwed in described dimensional measurement district.The scale division value of described rule is 1 ㎜.
Claims (6)
1. a PCB high definition magnifier check-out console modified node method, it is characterized in that: high definition magnifier check-out console has table top (1), described table top has active gage rest area (11) and is positioned at the dimensional measurement district (12) of periphery, active gage rest area, described active gage rest area is rectangle, the outer of at least one pair of adjacent edge of the active gage rest area of rectangle is arranged with described dimensional measurement district, described dimensional measurement district is provided with rule (121), and the scale set-up mode of described rule be along the active gage rest area of rectangle edge arrange and be zero common groove with the intersection of a pair adjacent edge.
2. PCB high definition magnifier check-out console modified node method as claimed in claim 1, is characterized in that: described rule is scale steel ruler.
3. PCB high definition magnifier check-out console modified node method as claimed in claim 2, is characterized in that: described scale steel ruler is screwed in described dimensional measurement district.
4. PCB high definition magnifier check-out console modified node method as claimed in claim 1, is characterized in that: the outer of a pair adjacent edge of the active gage rest area of described rectangle is arranged with described dimensional measurement district.
5. PCB high definition magnifier check-out console modified node method as claimed in claim 1, is characterized in that: the outer of two pairs of adjacent edges of the active gage rest area of described rectangle is arranged with described dimensional measurement district.
6. PCB high definition magnifier check-out console modified node method as claimed in claim 1, is characterized in that: the scale division value of described rule is 1 ㎜.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510933809.4A CN105352400A (en) | 2015-12-15 | 2015-12-15 | Improved structure of PCB high-definition magnifier inspection bench |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510933809.4A CN105352400A (en) | 2015-12-15 | 2015-12-15 | Improved structure of PCB high-definition magnifier inspection bench |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105352400A true CN105352400A (en) | 2016-02-24 |
Family
ID=55328413
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510933809.4A Pending CN105352400A (en) | 2015-12-15 | 2015-12-15 | Improved structure of PCB high-definition magnifier inspection bench |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105352400A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106041598A (en) * | 2016-08-09 | 2016-10-26 | 江苏博敏电子有限公司 | Working stand with position marking function |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0814809A (en) * | 1994-06-29 | 1996-01-19 | Kawasaki Steel Corp | Device and method for measuring surface roughness of thin plate |
| CN201497647U (en) * | 2009-08-26 | 2010-06-02 | 姜军强 | Pathologic specimen collecting board |
| CN201662377U (en) * | 2010-03-02 | 2010-12-01 | 浙江盛龙装饰材料有限公司 | Impregnated-paper measuring table |
| CN202678388U (en) * | 2012-05-22 | 2013-01-16 | 河北吉杰太阳能科技有限公司 | Cell quality determining tool |
| CN104634221A (en) * | 2015-02-11 | 2015-05-20 | 竞陆电子(昆山)有限公司 | Defect check card for printed circuit board and defect inspection method using check card |
| CN205352240U (en) * | 2015-12-15 | 2016-06-29 | 竞陆电子(昆山)有限公司 | PCB high definition magnifying glass checkout stand improves structure |
-
2015
- 2015-12-15 CN CN201510933809.4A patent/CN105352400A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0814809A (en) * | 1994-06-29 | 1996-01-19 | Kawasaki Steel Corp | Device and method for measuring surface roughness of thin plate |
| CN201497647U (en) * | 2009-08-26 | 2010-06-02 | 姜军强 | Pathologic specimen collecting board |
| CN201662377U (en) * | 2010-03-02 | 2010-12-01 | 浙江盛龙装饰材料有限公司 | Impregnated-paper measuring table |
| CN202678388U (en) * | 2012-05-22 | 2013-01-16 | 河北吉杰太阳能科技有限公司 | Cell quality determining tool |
| CN104634221A (en) * | 2015-02-11 | 2015-05-20 | 竞陆电子(昆山)有限公司 | Defect check card for printed circuit board and defect inspection method using check card |
| CN205352240U (en) * | 2015-12-15 | 2016-06-29 | 竞陆电子(昆山)有限公司 | PCB high definition magnifying glass checkout stand improves structure |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106041598A (en) * | 2016-08-09 | 2016-10-26 | 江苏博敏电子有限公司 | Working stand with position marking function |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20160224 |