CN105306310A

CN105306310A - Analysis module automatic testing device

Info

Publication number: CN105306310A
Application number: CN201510843423.4A
Authority: CN
Inventors: 夏百庆; 陈丽梅; 卢冬平
Original assignee: Zhongshan Jiexin Technology Services Co Ltd
Current assignee: Zhongshan Jiexin Technology Services Co Ltd
Priority date: 2015-11-29
Filing date: 2015-11-29
Publication date: 2016-02-03

Abstract

The invention discloses an analysis module automatic testing device, and belongs to the technical field of an automatic testing device. The analysis module automatic testing device comprises a serial port debugging module, a signal conversion module, a storage module, a photoelectric indication module, a test control module, a power module, a DI/DO module, a bus communication module, an AD module and a DA module; the serial port debugging module is connected with the signal converting module through the AD module, the DA module, the DI/DO module and the bus communication module; the signal converting module is connected with the test control module; and the test control module is also respectively connected with the storage module, the photoelectric indication module and the power module. The analysis module automatic testing device has the advantages of relatively high intelligent degree, high success rate, strong pertinence, combination and modularization; and cost is also reduced while the efficiency of the testing device is greatly increased.

Description

A kind of analysis module automatic test device

Technical field

The present invention relates to automatic test device technical field, particularly relate to a kind of analysis module automatic test device.

Background technology

Usually to check as instrument by some instrument in the Internet test job, whether software is applicable to carrying out automatic test in test network, current network test equipment can provide performance test, protocal analysis, security evaluation, Computer Aided Design, failure diagnosis service etc. the function of automation, but, also there is the problem of blindness, high cost, low success rate, the limited data Storage and Processing ability of testing equipment also have impact on the usefulness of its test.

Summary of the invention

The invention provides a kind of analysis module automatic test device, have higher intelligence degree, success rate is high, with strong points, has modularization and modular advantage, also reduces cost in the efficiency greatly improving testing fixture simultaneously.

For solving the problems of the technologies described above, the embodiment of the present application provides a kind of analysis module automatic test device, comprise AccessPort module, signal conversion module, memory module, photoelectricity indicating module, testing control module, power module, DI/DO module and bus communication module, it is characterized in that, also comprise A/D module and D/A module, described AccessPort module passes through A/D module, D/A module, DI/DO module is connected with signal conversion module with bus communication module, signal conversion module is connected with testing control module, testing control module also respectively with memory module, photoelectricity indicating module is connected with power module.

As the preferred embodiment of this programme, described A/D module is multidiameter delay A/D module, the analog signal sent by AD/DA detection mouth collection signal modular converter, and analog signal is converted to digital signal.

As the preferred embodiment of this programme, described D/A module is multidiameter delay D/A module, and digital signal is converted to analog signal, and the analog signal after conversion is sent to signal conversion module by AD/DA detection mouth.

As the preferred embodiment of this programme, described signal conversion module is provided with pulse test interface.

As the preferred embodiment of this programme, described testing control module comprises data processing chip, cache chip and input/output interface.

The one or more technical schemes provided in the embodiment of the present application, at least have following technique effect or advantage:

Have higher intelligence degree, success rate is high, with strong points, has modularization and modular advantage, also reduces cost in the efficiency greatly improving testing fixture simultaneously.

Accompanying drawing explanation

In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.

Fig. 1 is the schematic diagram of the embodiment of the present application.

In Fig. 1,1, AccessPort module, 2, A/D module, 3, D/A module, 4, signal conversion module, 5, memory module, 6, photoelectricity indicating module, 7, testing control module, 8, power module, 9, DI/DO module, 10, bus communication module.

Embodiment

In order to better understand technique scheme, below in conjunction with Figure of description and concrete execution mode, technique scheme is described in detail.

As shown in Figure 1, one analyses module automatic test device, comprise AccessPort module 1, signal conversion module 4, memory module 5, photoelectricity indicating module 6, testing control module 7, power module 8, DI/DO module 9 and bus communication module 10, it is characterized in that, also comprise A/D module 2 and D/A module 3, described AccessPort module 1 is by A/D module 2, D/A module 3, DI/DO module 9 is connected with signal conversion module 4 with bus communication module 10, signal conversion module 4 is connected with testing control module 7, testing control module 7 also respectively with memory module 5, photoelectricity indicating module 6 is connected with power module 8.

Wherein, in actual applications, described A/D module 2 is multidiameter delay A/D module, the analog signal sent by AD/DA detection mouth collection signal modular converter 4, and analog signal is converted to digital signal, and multidiameter delay circuit can improve the test speed of device.

Wherein, in actual applications, described D/A module 3 is multidiameter delay D/A module, and digital signal is converted to analog signal, and the analog signal after conversion is sent to signal conversion module 4 by AD/DA detection mouth, multidiameter delay circuit can improve the test speed of device.

Wherein, in actual applications, described signal conversion module 4 is provided with pulse test interface, can the data interaction of implementation and testing control module.

Wherein, in actual applications, described testing control module 7 comprises data processing chip, cache chip and input/output interface, and wherein, cache chip can store test log and back up.

Last it is noted that the foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, although with reference to previous embodiment to invention has been detailed description, for a person skilled in the art, it still can be modified to the technical scheme described in foregoing embodiments, or carries out equivalent replacement to wherein portion of techniques feature.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.

Claims

1. the automatic test device of an analysis module, comprise AccessPort module (1), signal conversion module (4), memory module (5), photoelectricity indicating module (6), testing control module (7), power module (8), DI/DO module (9) and bus communication module (10), it is characterized in that, also comprise A/D module (2) and D/A module (3), described AccessPort module (1) is by A/D module (2), D/A module (3), DI/DO module (9) is connected with signal conversion module (4) with bus communication module (10), signal conversion module (4) is connected with testing control module (7), testing control module (7) also respectively with memory module (5), photoelectricity indicating module (6) is connected with power module (8).

2. the automatic test device of a kind of analysis module according to claim 1, it is characterized in that, described A/D module (2) is multidiameter delay A/D module, the analog signal sent by AD/DA detection mouth collection signal modular converter (4), and analog signal is converted to digital signal.

3. the automatic test device of a kind of analysis module according to claim 1, it is characterized in that, described D/A module (3) is multidiameter delay D/A module, digital signal is converted to analog signal, and the analog signal after conversion is sent to signal conversion module (4) by AD/DA detection mouth.

4. the automatic test device of a kind of analysis module according to claim 1, is characterized in that, described signal conversion module (4) is provided with pulse test interface.

5. the automatic test device of a kind of analysis module according to claim 1, is characterized in that, described testing control module (7) comprises data processing chip, cache chip and input/output interface.