CN105302365A - Electronic device, broken screen detection circuit, detection method and apparatus - Google Patents
Electronic device, broken screen detection circuit, detection method and apparatus Download PDFInfo
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- CN105302365A CN105302365A CN201510632037.0A CN201510632037A CN105302365A CN 105302365 A CN105302365 A CN 105302365A CN 201510632037 A CN201510632037 A CN 201510632037A CN 105302365 A CN105302365 A CN 105302365A
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Abstract
An electronic device broken screen detection circuit is provided. An electronic device comprises a processor and a capacitance screen in a connection with the processor via a signal. A detection circuit comprises a sensing electrode arranged on the capacitance screen in a parallel way and forming sensing capacitance with the capacitance screen, a conduction line arranged along the capacitance screen and connected with the sensing electrode, the processor receiving the sensing capacitance and determining whether the area of the capacitance screen, where the conduction line passes is broken according to strength of the sensing capacitance signal. The sensing electrode is arranged on the capacitance screen in the parallel way and the sensing capacitance can be formed between the capacitance screen, so when the capacitance screen is broken, the electric wire arranged along the capacitance screen is broken and sensing capacitance changes; and according to the changes of the sensing capacitance, the processor can determine whether the capacitance screen is broken or not. The invention further discloses a broken screen detection method, an apparatus and the electronic device.
Description
Technical field
The present invention relates to electronic equipment detection field, be specifically related to a kind of electronic equipment and broken screen testing circuit thereof and detection method, device.
Background technology
Along with the fast development of mobile device and improving constantly of people's living standard, the use of various mobile terminals as mobile phone, panel computer etc. is more and more universal, and mobile phone has become indispensable means of communication in people's life.
Along with smart mobile phone screen is increasing, the probability of fragmentation is increasing because of falling for screen, because the mobile devices such as smart mobile phone generally adopt touch-screen to carry out the input operations such as induction input command or text, when screen is broken because falling, touch-screen input fault can be caused, the phenomenon of input error occurs.Panel computer is because size, generally more than 7 cun, easily falls broken screen especially.
Whether exist in prior art and such as fallen by built-in gravity sensor detection of handset, and carry out corresponding pose adjustment to the mobile phone fallen, to prevent screen broken, but this can not guarantee that mobile phone screen can not be broken.Certainly, also the detection of screen fragmentation is there is in prior art, but usually all adopt complicated circuit and sensor transmissions, gather corresponding detection signal to realize, for example: arrange a lot of sensor in the surrounding of display screen component and middle position, and on screen, arrange many continuous print signaling paths, the sensor signal of diverse location is connected, the signal then gathered according to each sensor carries out complicated logical operation and judges that whether display screen is broken, existing detection scheme not only increases testing cost, complicated circuit structure too increases the power consumption of electronic equipment, cause the operational efficiency dragging down electronic equipment.Therefore, how to realize whether fragmentation detects to screen by simple circuit and method, become problem demanding prompt solution.
Summary of the invention
Therefore, the technical problem to be solved in the present invention is, how by the fragmentation of the simple electric circuit inspection electronic equipment of structure, to reduce the power consumption of electronic equipment as far as possible, thus provides a kind of electronic equipment and broken screen testing circuit thereof and detection method, device.
According to first aspect, a kind of invention provides a kind of electronic equipment broken screen testing circuit in implementing:
Electronic equipment comprises: the processor that signal connects and capacitance plate, and testing circuit comprises: induction electrode, and it is set in parallel on capacitance plate, for forming inductance capacitance between capacitance plate; Conducting wire, it is arranged along capacitance plate, also forms closed-loop path with induction electrode; Processor, for receiving the signal of inductance capacitance, and according to the signal intensity of inductance capacitance judge conducting wire institute through capacitance plate region whether broken screen.
Preferably, conducting wire is arranged along capacitance plate surrounding.
Preferably, induction electrode is arranged within the scope of the window area of capacitance plate.
Preferably, induction electrode and conducting wire are prepared by transparent material.
Preferably, induction electrode and capacitance plate glued joint.
According to second aspect, a kind of broken screen detection method adopting above-mentioned broken screen testing circuit is provided in a kind of invention enforcement, comprises:
Obtain the inductance capacitance formed between capacitance plate and induction electrode; Judge that whether capacitance plate is broken according to the size of inductance capacitance.
Preferably, judge whether fragmentation comprises capacitance plate according to the size of inductance capacitance: inductance capacitance size and preset value are compared, if induced electricity capacitance is less than preset value, be then judged as that capacitance plate is broken.
According to the third aspect, a kind of broken screen pick-up unit adopting above-mentioned broken screen testing circuit is provided in a kind of invention enforcement, comprises:
Inductance capacitance acquisition module, for obtaining the inductance capacitance formed between capacitance plate and induction electrode; Shield broken judge module, be connected with inductance capacitance acquisition module, for judging that whether capacitance plate is broken according to the size of inductance capacitance.
Preferably, shielding broken judge module for inductance capacitance size and preset value being compared, if induced electricity capacitance is less than preset value, being then judged as that capacitance plate is broken.
According to fourth aspect, a kind of invention provides a kind of electronic equipment in implementing, and comprising: the processor that signal connects and capacitance plate, also comprise: above-mentioned broken screen testing circuit, and/or above-mentioned broken screen pick-up unit.
The broken screen testing circuit of electronic equipment provided by the invention and detection method, because induction electrode is set in parallel on capacitance plate, can and capacitance plate between form inductance capacitance, when capacitance plate is broken, can make the conducting wire fracture of arranging along capacitance plate, the fracture of conducting wire can have influence on the conduction of closed-loop path, and conduction changes and inductance capacitance can be made to change, according to the change of this inductance capacitance, processor can judge that whether capacitance plate is broken.Because present invention applicant finds that electronic equipment is when falling ground, the first broken position of display screen is usually located at its edge, and display screen zone line is generally difficult to fragmentation, whether fragmentation does not need to be covered with sensor across the screen to detect screen, the present invention utilizes conducting wire to form closed-loop path at induction electrode dexterously, and the position that the display screen being arranged in electronic equipment is easily first broken, when display screen is broken, conducting wire is caused to rupture, thus cause the change of inductance capacitance, then judge that whether display screen is broken.Relative to prior art, without the need to being covered with the detection that complicated circuitous pattern and sensor just can realize display screen fragmentation on a display screen, broken screen testing circuit of the present invention have circuit structure simple, be easy to the advantage that realizes, cost is low, circuit power consumption is low.
As preferred technical scheme, conducting wire is arranged along capacitance plate surrounding, thus Safety check-up can be carried out to capacitance plate surrounding.
Accompanying drawing explanation
In order to be illustrated more clearly in the specific embodiment of the invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is the broken screen testing circuit of a kind of electronic equipment disclosed in the embodiment of the present invention 1 structure principle chart;
Fig. 2 is broken screen detection method process flow diagram a kind of disclosed in the embodiment of the present invention 2.
Embodiment
Be clearly and completely described technical scheme of the present invention below in conjunction with accompanying drawing, obviously, described embodiment is the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
In addition, if below in the described different embodiment of the present invention involved technical characteristic do not form conflict each other and just can be combined with each other.
Embodiment 1
Please refer to Fig. 1, the broken screen testing circuit of a kind of electronic equipment disclosed in the present embodiment, this electronic equipment comprises: the processor (not shown) that signal connects and capacitance plate 1, and this testing circuit comprises: induction electrode 2 and conducting wire 3, wherein,
Induction electrode 2 is set in parallel on capacitance plate 1, for forming inductance capacitance between capacitance plate 1.In a particular embodiment, induction electrode 2 can be arranged on capacitance plate 1 by the mode of glueing joint, such as, adopt the insulation colloids such as AB glue to glued joint.Particularly, induction electrode 2 should be positioned on the trigger point of capacitance plate 1, responds to trigger point is up and down corresponding, and alleged trigger point is that capacitance plate perception user can touch the point of triggering, in a preferred embodiment, induction electrode 2 is arranged within the scope of the window area of capacitance plate.In a preferred embodiment, induction electrode 2 is prepared from by transparent material, thus does not affect the content in user's observation window region.In a particular embodiment, the number of induction electrode 2 can be one or more.
Conducting wire 3 is arranged along capacitance plate, is also connected conducting with induction electrode 2, and particularly, conducting wire 3 and induction electrode 2 form a closed loop.In a preferred embodiment, conducting wire 3 is arranged along capacitance plate 1 surrounding.When conducting wire 3 occur broken through the somewhere in capacitance plate 1 region time, the conducting wire 3 at this place can be made to rupture, thus inductance capacitance is changed.In a preferred embodiment, conducting wire 3 is prepared from by transparent material, thus does not affect the content in user's observation window region.
According to the signal intensity of inductance capacitance, processor for receiving the signal of inductance capacitance, and judges that conducting wire institute is through the whether broken screen in capacitance plate 1 region.In the present embodiment, the inductance capacitance signal that processor receives can gather transmission by capacitance plate 1; In other embodiments, processor also can be connected with capacitance plate 1, induction electrode 2 signal respectively, directly receives the inductance capacitance signal formed between capacitance plate 1 and induction electrode 2.In a particular embodiment, when there is broken screen through capacitance plate 1 region in conducting wire, the conducting wire 3 at this place can be caused to rupture, thus inductance capacitance is changed, according to the size of inductance capacitance signal intensity, processor can judge that whether capacitance plate 1 is broken, such as, can arrange reference value, when the inductance capacitance signal intensity that processor receives is less than this reference value, then judge that fragmentation has appearred in capacitance plate.Need to illustrate time, the reference value of different model electronic equipment may be different, and this reference value can determine the size of reference value according to the data of the induction amount under the normal condition of electronic equipment, certainly, also can rule of thumb come to preset.
Because present invention applicant finds that electronic equipment is when falling ground, the first broken position of display screen is usually located at its edge, and display screen zone line is generally difficult to fragmentation.The present invention utilizes conducting wire to form closed-loop path at induction electrode dexterously, and the position that the display screen being arranged in electronic equipment is easily first broken, when display screen is broken, cause conducting wire to rupture, thus cause the change of inductance capacitance, then judge that whether display screen is broken.Relative in prior art, whether being covered with complicated circuitous pattern and sensor on a display screen, to carry out detection display screen broken, the broken screen testing circuit of electronic equipment disclosed in the present embodiment, because induction electrode is set in parallel on capacitance plate, can and capacitance plate between form inductance capacitance, when capacitance plate is broken, the conducting wire fracture of arranging along capacitance plate can be made, the fracture of conducting wire can have influence on the conduction of closed-loop path, conduction changes and inductance capacitance can be made to change, according to the change of this inductance capacitance, processor can judge that whether capacitance plate is broken, it is simple that this broken screen testing circuit has circuit structure, be easy to realize, cost is low, the advantage that circuit power consumption is low.
Embodiment 2
Present embodiment discloses a kind of broken screen detection method of the broken screen testing circuit adopting above-described embodiment to provide, please refer to Fig. 2, this detection method comprises the steps:
Step S100, obtains the inductance capacitance formed between capacitance plate and induction electrode.In a particular embodiment, inductance capacitance data are gathered by collector, particularly, can be gathered by the collector that capacitance plate 1 is built-in and obtain inductance capacitance data, also can collector be coupled in processor, and be connected with capacitance plate 1, induction electrode 2 signal, directly gathered by processor and obtain inductance capacitance data.
According to the size of inductance capacitance, step S200, judges that whether capacitance plate is broken.Because induction electrode 2 is arranged along capacitance plate, when capacitance plate is broken, the electric line that arrives of arranging along capacitance plate can be made to rupture, thus inductance capacitance is changed, according to the size variation of this inductance capacitance, can judge that whether capacitance plate is broken.
Particularly, inductance capacitance size and preset value are compared, if induced electricity capacitance is less than preset value, be then judged as that capacitance plate is broken.Owing to arrange induction electrode 2 on capacitance plate 1 after, the electric capacity amplitude that capacitance plate 1 is responded to can change, and usual capacitance becomes large.It should be noted that, when capacitance variations scope under the normal condition of electronic equipment is a1 ~ a2, after capacitance plate 1 arranges induction electrode 2, the capacitance variations scope of electronic equipment is a3 ~ a4, wherein, a3 > a2, and when fragmentation appears in capacitance plate 1, then the capacitance variations scope of electronic equipment is a5 ~ a6, wherein, a6 is much smaller than a3, and therefore, preset value can be arranged between a6 and a3.
Need to illustrate time, the preset value of different model electronic equipment may be different, and this preset value can determine the size of preset value according to the data of the induction amount under the normal condition of electronic equipment, certainly, also can rule of thumb come to preset.Understand for ease of those skilled in the art, as an example, presetting a preset value A is stored in the storage unit of electronic equipment, in actual job process, continuous acquisition obtains the inductance capacitance numerical value B in induction electrode region, and the inductance capacitance numerical value B and preset value A that often gather acquisition are compared, as B≤A, can judge that capacitance plate is state of rupture.In a preferred embodiment, when judging capacitance plate for breaking, judged result can also be reported and sending to background server.
Relative in prior art, be covered with complicated circuitous pattern and sensor on a display screen, whether brokenly detection display screen is carried out by complex calculations logic, the disclosed detection method for the broken screen testing circuit of above-described embodiment electronic equipment of the present embodiment, due to when capacitance plate is broken, the conducting wire fracture of arranging along capacitance plate can be made, then make inductance capacitance change, by with preset numeric ratio comparatively, effectively can judge that whether display screen broken.Because the object detected is the comparison of capacitance size, therefore, the broken screen detection method of the present embodiment has simply, advantage fast.
The present embodiment also discloses the broken screen pick-up unit of a kind of electronic equipment, and this electronic equipment broken screen pick-up unit comprises: inductance capacitance acquisition module and the broken judge module of screen, wherein:
Inductance capacitance acquisition module is for obtaining the inductance capacitance formed between capacitance plate and induction electrode.
Shield broken judge module for judging that whether capacitance plate is broken according to the size of inductance capacitance.Preferably, shielding broken judge module for inductance capacitance size and preset value being compared, if induced electricity capacitance is greater than preset value, being then judged as that capacitance plate is broken.
Relative in prior art, be covered with complicated circuitous pattern and sensor on a display screen, whether brokenly detection display screen is carried out by complex calculations logic, the disclosed pick-up unit for the broken screen testing circuit of above-described embodiment electronic equipment of the present embodiment, due to when capacitance plate is broken, the conducting wire fracture of arranging along capacitance plate can be made, then make inductance capacitance change, by with preset numeric ratio comparatively, effectively can judge that whether display screen broken.Because the object detected is the comparison of capacitance size, therefore, the broken screen pick-up unit of the present embodiment has simply, advantage fast.
Embodiment 3
Present embodiment discloses a kind of electronic equipment, comprising: the processor that signal connects and capacitance plate, also comprise: above-mentioned broken screen testing circuit and/or above-mentioned broken screen pick-up unit.Wherein, this broken screen pick-up unit can be realized by DLC (digital logic circuit), also can be realized by processor, certainly, can also be mimic channel.
It should be noted that, electronic equipment disclosed in the present embodiment can be the mobile device that mobile phone, panel computer, PDA etc. have capacitance plate.
Those skilled in the art should understand, embodiments of the invention can be provided as method, system or computer program.Therefore, the present invention can adopt the form of complete hardware embodiment, completely software implementation or the embodiment in conjunction with software and hardware aspect.And the present invention can adopt in one or more form wherein including the upper computer program implemented of computer-usable storage medium (including but not limited to magnetic disk memory, CD-ROM, optical memory etc.) of computer usable program code.
The present invention describes with reference to according to the process flow diagram of the method for the embodiment of the present invention, equipment (system) and computer program and/or block scheme.Should understand can by the combination of the flow process in each flow process in computer program instructions realization flow figure and/or block scheme and/or square frame and process flow diagram and/or block scheme and/or square frame.These computer program instructions can being provided to the processor of multi-purpose computer, special purpose computer, Embedded Processor or other programmable data processing device to produce a machine, making the instruction performed by the processor of computing machine or other programmable data processing device produce device for realizing the function of specifying in process flow diagram flow process or multiple flow process and/or block scheme square frame or multiple square frame.
These computer program instructions also can be stored in can in the computer-readable memory that works in a specific way of vectoring computer or other programmable data processing device, the instruction making to be stored in this computer-readable memory produces the manufacture comprising command device, and this command device realizes the function of specifying in process flow diagram flow process or multiple flow process and/or block scheme square frame or multiple square frame.
These computer program instructions also can be loaded in computing machine or other programmable data processing device, make on computing machine or other programmable devices, to perform sequence of operations step to produce computer implemented process, thus the instruction performed on computing machine or other programmable devices is provided for the step realizing the function of specifying in process flow diagram flow process or multiple flow process and/or block scheme square frame or multiple square frame.
Obviously, above-described embodiment is only for clearly example being described, and the restriction not to embodiment.For those of ordinary skill in the field, can also make other changes in different forms on the basis of the above description.Here exhaustive without the need to also giving all embodiments.And thus the apparent change of extending out or variation be still among the protection domain of the invention.
Claims (10)
1. the broken screen testing circuit of electronic equipment, described electronic equipment comprises: the processor that signal connects and capacitance plate, and it is characterized in that, described testing circuit comprises:
Induction electrode, it is set in parallel on described capacitance plate, for forming inductance capacitance between described capacitance plate;
Conducting wire, it is arranged along described capacitance plate, also forms closed-loop path with described induction electrode;
Processor for receiving the signal of described inductance capacitance, and according to the signal intensity of described inductance capacitance judge described conducting wire institute through capacitance plate region whether broken screen.
2. broken screen testing circuit as claimed in claim 1, is characterized in that, described conducting wire is arranged along described capacitance plate surrounding.
3. broken screen testing circuit as claimed in claim 1, it is characterized in that, described induction electrode is arranged within the scope of the window area of described capacitance plate.
4. the broken screen testing circuit as described in claim 1-3 any one, is characterized in that, described induction electrode and described conducting wire are prepared by transparent material.
5. the broken screen testing circuit as described in claim 1-4 any one, is characterized in that, described induction electrode and described capacitance plate glued joint.
6. adopt a broken screen detection method for the broken screen testing circuit as described in claim 1-5 any one, it is characterized in that, comprising:
Obtain the inductance capacitance formed between capacitance plate and induction electrode;
Judge that whether described capacitance plate is broken according to the size of described inductance capacitance.
7. broken screen detection method as claimed in claim 6, is characterized in that, the described size according to described inductance capacitance judges whether fragmentation comprises described capacitance plate:
Described inductance capacitance size and preset value are compared, if described induced electricity capacitance is less than described preset value, is then judged as that capacitance plate is broken.
8. adopt a broken screen pick-up unit for the broken screen testing circuit as described in claim 1-5 any one, it is characterized in that, comprising:
Inductance capacitance acquisition module, for obtaining the inductance capacitance formed between described capacitance plate and described induction electrode;
Shield broken judge module, be connected with described inductance capacitance acquisition module, for judging that whether described capacitance plate is broken according to the size of described inductance capacitance.
9. broken screen pick-up unit as claimed in claim 8, is characterized in that, the broken judge module of described screen is used for described inductance capacitance size and preset value to compare, if described induced electricity capacitance is less than described preset value, is then judged as that capacitance plate is broken.
10. an electronic equipment, comprising: the processor that signal connects and capacitance plate, is characterized in that, also comprise: the broken screen testing circuit as described in claim 1-5 any one; And/or broken screen pick-up unit as claimed in claim 8 or 9.
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| CN201510632037.0A CN105302365B (en) | 2015-09-29 | 2015-09-29 | Electronic equipment and its broken screen detection circuit and detection method, device |
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| CN201510632037.0A CN105302365B (en) | 2015-09-29 | 2015-09-29 | Electronic equipment and its broken screen detection circuit and detection method, device |
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| CN105302365A true CN105302365A (en) | 2016-02-03 |
| CN105302365B CN105302365B (en) | 2018-05-15 |
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| CN101846712A (en) * | 2010-04-01 | 2010-09-29 | 苏州崴展电子科技有限公司 | ITO (Indium Tin Oxide) electrical characteristic detecting method and detecting system of capacitance type touch screen |
| CN102376140A (en) * | 2010-08-18 | 2012-03-14 | 允翔科技股份有限公司 | Antitheft security system and mounting method thereof |
| CN203324610U (en) * | 2013-07-25 | 2013-12-04 | 京东方科技集团股份有限公司 | Display device |
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2015
- 2015-09-29 CN CN201510632037.0A patent/CN105302365B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060152360A1 (en) * | 2004-12-23 | 2006-07-13 | Lockheed Martin Corporation | Anti-tamper apparatus |
| CN201007763Y (en) * | 2007-03-01 | 2008-01-16 | 北京京东方光电科技有限公司 | LCD glass substrates crash detection circuit |
| CN101846712A (en) * | 2010-04-01 | 2010-09-29 | 苏州崴展电子科技有限公司 | ITO (Indium Tin Oxide) electrical characteristic detecting method and detecting system of capacitance type touch screen |
| CN102376140A (en) * | 2010-08-18 | 2012-03-14 | 允翔科技股份有限公司 | Antitheft security system and mounting method thereof |
| CN203324610U (en) * | 2013-07-25 | 2013-12-04 | 京东方科技集团股份有限公司 | Display device |
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| CN105302365B (en) | 2018-05-15 |
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Effective date of registration: 20160427 Address after: 518000, A District, two floor, D building, Wanfeng Industrial Zone, Wanfeng District, Gongming office, Guangming District, Shenzhen, Guangdong, China Applicant after: Shenzhen city Ruijieen Technology Co. Ltd. Address before: Shenzhen, Guangdong, Baoan District, Xixiang, two road forward, Taoyuan, 501, 12, 13, 4 units Applicant before: Zhao Yue |
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