CN105300869A - Device and method for measuring gas permeability of material by virtue of differential vacuum gauge - Google Patents

Device and method for measuring gas permeability of material by virtue of differential vacuum gauge Download PDF

Info

Publication number
CN105300869A
CN105300869A CN201510908556.5A CN201510908556A CN105300869A CN 105300869 A CN105300869 A CN 105300869A CN 201510908556 A CN201510908556 A CN 201510908556A CN 105300869 A CN105300869 A CN 105300869A
Authority
CN
China
Prior art keywords
chamber
vacuum
thin film
reference thin
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201510908556.5A
Other languages
Chinese (zh)
Other versions
CN105300869B (en
Inventor
李军建
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Electronic Science and Technology of China
Original Assignee
University of Electronic Science and Technology of China
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Electronic Science and Technology of China filed Critical University of Electronic Science and Technology of China
Priority to CN201510908556.5A priority Critical patent/CN105300869B/en
Publication of CN105300869A publication Critical patent/CN105300869A/en
Application granted granted Critical
Publication of CN105300869B publication Critical patent/CN105300869B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Abstract

The invention discloses a device and a method for measuring the gas permeability of a material by virtue of a differential vacuum gauge, and is used for solving the problem of low measuring sensitivity existing in the prior art. The device comprises a gas source, a deflation measurement chamber, a reference thin film chamber, a differential amplifier and vacuum gauges, wherein the air source is connected with a gas chamber; the gas chamber is communicated with a permeation chamber; the permeation chamber is provided with a heater and communicated with an accumulation chamber; the accumulation chamber is provided with a heater and connected with the vacuum gauge A; the signal end of the vacuum gauge is electrically connected with one end of the differential amplifier; the deflation measurement chamber is connected with the vacuum gauge B; the signal end of the vacuum gauge B is electrically connected with the other input end of the differential amplifier; the output end of the differential amplifier is electrically connected with the signal input ends of the vacuum gauges; the deflation measurement chamber is also communicated with the reference thin film chamber; the deflation measurement chamber and the reference thin film chamber are provided with heaters; the gas chamber, the accumulation chamber, the deflation measurement chamber and the reference thin film chamber are communicated with a high-vacuum pump; the high-vacuum pump is communicated with a low-vacuum pump.

Description

A kind of difference vacuum meter measures device and the measuring method thereof of material gas permeability
Technical field
The invention belongs to the gas permeability field of measuring technique of the encapsulating material of the objects such as electromechanical device, food, medicine, specifically disclose device and the measuring method thereof that material gas permeability measured by a kind of difference vacuum meter.
Background technology
The article such as electron device, food, medicine need packaging or the encapsulating material with low gas permeability, to prevent in use and storing process, harmful gas enters in device (as organic electroluminescence device), causes the performance of device or life-span to decline; Or prevent harmful gas from entering in food and pharmaceutical packing, cause food and medicine to go bad; Or prevent from, outside the material vapor effusion packaging of food or medicine, causing the quality of food and medicine decline or lost efficacy.
Want Design and manufacture to go out to meet and use and the encapsulation of the electron device of memory requirement, food and medicine or wrappage, just must possess and these be encapsulated or equipment that the gas permeability of wrappage is measured and measuring method.
The method measuring the gas permeability of material has a variety of, and wherein a kind of is utilize mass-spectrometer measurement technology to measure the gas permeability of material, sees US Patent No. 4944180A, Chinese patent ZL200810045129.9 and ZL201310026422.1.It is high that this kind of device has measurement sensistivity, the feature that measuring speed is fast, but price comparison is expensive.Another method utilizes differential pressure conditioner as sensor to measure the permeability of film, as Chinese patent CN104729973A.The venting that this design solves measuring system preferably affects problem to measurement accuracy, but there is following shortcoming:
(1) pressure difference that can measure of the differential pressure pickup-differential pressure conditioner adopted is minimum is 1Pa magnitude, when the gas permeability of film is very little, just cannot measure when the pressure reduction of generation is less than 1Pa magnitude, limit the raising of measurement sensistivity.
(2) do not have to consider how to eliminate the impact of film venting on measurement accuracy, and in real work, tested film is organic material mostly, outgassing rate is higher, larger on the impact of measurement accuracy.
(3) measuring chamber and reference chamber lead to the pump-line of vacuum pump is series connection, middle also have a vacuum valve, the effective pumping speed of vacuum system to measuring chamber and reference chamber is differed greatly, causes in bakeout degassing process, two rooms are unequal by the gas flow extracted, degassing effect is unbalanced, after bakeout degassing process completes, the background pressure of two rooms and discharge quantity must be unequal, enter measuring chamber even without infiltration gas, also can produce pressure reduction, thus produce measuring error.
Summary of the invention
The low problem of measurement sensistivity that the present invention exists to solve prior art, and the device providing a kind of difference vacuum meter to measure material gas permeability and measuring method thereof, overcome the shortcoming that existing pressure differential method is measured, lower pressure reduction can be measured, improve the sensitivity of measuring; Simultaneously can eliminate tested film phenomenon of deflation, and eliminate measuring chamber and reference chamber discharge quantity non-uniform phenomenon to the impact of film permeation rate measurement accuracy, thus improve measuring accuracy.
For solving the problems of the technologies described above, the technical solution adopted in the present invention is:
The device of material gas permeability measured by a kind of difference vacuum meter, it is characterized in that, comprise source of the gas, venting measuring chamber, reference thin film room, differential amplifier and vacuum meter, described source of the gas is connected with gas compartment through pipeline and reduction valve, described gas compartment is communicated with the permeate chamber for placing tested film, described permeate chamber is equipped with permeate chamber well heater, described permeate chamber is communicated with accumulating chamber, described accumulating chamber is equipped with accumulating chamber well heater, described accumulating chamber is connected with vacuum gauge A, the signal end of vacuum gauge A is electrically connected with an input end of differential amplifier, venting measuring chamber is connected with vacuum gauge B, the signal end of vacuum gauge B is electrically connected with another input end of differential amplifier, the output terminal of differential amplifier is electrically connected with the signal input part of vacuum meter, described venting measuring chamber is also communicated with the reference thin film room for placing reference thin film, and described venting measuring chamber and reference thin film room are equipped with venting measuring chamber well heater and reference thin film chamber heater respectively, described gas compartment, accumulating chamber, venting measuring chamber and reference thin film room are communicated with high vacuum pump through gas compartment extraction valve, accumulating chamber extraction valve, venting measuring chamber extraction valve and reference thin film room extraction valve respectively, and described high vacuum pump is communicated with roughing pump through low vacuum valve.
The material of described permeate chamber and reference thin film room, structure and measure-alike; The material of described tested film and reference thin film and measure-alike; Being vacuum seal between the edge of described tested film and the inwall of permeate chamber, is vacuum seal between the edge of described reference thin film and the inwall of reference thin film room.
Described accumulating chamber and the venting material of measuring chamber, structure are all identical with size.
Described vacuum gauge A and vacuum gauge B is one species and is the vacuum gauge of same model.
Described vacuum gauge is the one in High Voltage ionization gauge, Pirani gauge, thermocouple rule or thin-film electro content regulation.
The input end of described differential amplifier is equipped with single-ended-double-width grinding switching device shifter.
Described high vacuum pump is turbomolecular pump, ODP or cryo pump, and described roughing pump is rotary vane mechanical pump.
Described gas compartment extraction valve, accumulating chamber extraction valve, venting measuring chamber extraction valve and reference thin film room extraction valve are high vacuum valve.
A measuring method for the device of the gas permeability of material measured by difference vacuum meter, it is characterized in that, comprises the following steps:
Step 1: by tested diaphragm seal to be measured in permeate chamber, will be sealed in reference thin film room with tested membraneous material and measure-alike reference thin film;
Step 2: open gas compartment extraction valve, accumulating chamber extraction valve, venting measuring chamber extraction valve and reference thin film room extraction valve, opens roughing pump and low vacuum valve takes out low vacuum to whole system;
Step 3: when pressure gauge reading is 0 atmospheric pressure, open vacuum meter, differential amplifier is set to single ended input pattern, vacuum meter independent measurement vacuum gauge A or vacuum gauge B;
Step 4: when gauge reading is less than 100Pa, opens high vacuum pump, to whole system pumping high vacuum;
Step 5: gauge reading is less than 10 -2during Pa magnitude, open permeate chamber well heater, reference thin film chamber heater, accumulating chamber well heater and venting measuring chamber well heater and carry out bakeout degassing;
Step 6: close accumulating chamber well heater and venting measuring chamber well heater; Regulate the heter temperature of permeate chamber well heater and reference thin film chamber heater to specific temperature;
Step 7: accumulating chamber and venting measuring chamber temperature drop to room temperature, and vacuum meter reading is reduced to 10 -4pa magnitude;
Step 8: differential amplifier switches to double-width grinding pattern, vacuum meter carries out difference measurement to the signal of vacuum gauge A and vacuum gauge B simultaneously, the reading P of record vacuum meter 0;
Step 9: close gas compartment extraction valve, accumulating chamber extraction valve, venting measuring chamber extraction valve and reference thin film room extraction valve; Then open reduction valve immediately, source of the gas is filled in gas compartment, make the pressure P in gas compartment 2reduction valve is closed, if be now t=0 when reaching 1 atmospheric pressure;
Step 10: the change of record vacuum meter reading P and the numerical value of time of penetration t;
Step 11: establish P-P 0=P 1, P 1the funtcional relationship of t change is in time:
P = P 2 [ 1 - exp ( - k A d V ) t ]
In above formula: P 2gas pressure intensity in-gas compartment 3;
K-gas is to the infiltration coefficient of tested film 8
The infiltrating area of A-tested film 8
The thickness of d-tested film 8
The volume of V-accumulating chamber 10;
Step 12: obtain k value by the formula in step 11, then go out permeability Q (g/m according to following formulae discovery 2day);
Q = μ k R T d P 2
In above formula: the molal weight of μ-gas
R-gas universal constant
T-temperature.
Compared with prior art, the present invention has following beneficial effect:
The present invention is at the venting measuring chamber end as differential pressure measurement benchmark, a physical dimension and the identical reference thin film room of permeate chamber are set, wherein one and the identical reference thin film of tested film are installed, its gas of releasing introduces venting measuring chamber, the pressure produced becomes a part for pressure reduction benchmark, thus can be cancelled in the measurements, improve the accuracy of measurement.
Permeate chamber and venting measuring chamber are in parallel with the pump-line between vacuum pump, and line size is identical, make the effective pumping speed of vacuum pump to two rooms identical, in permeability survey process, the discharge quantity of two rooms is substantially equal with background pressure, pressure reduction can not be produced, eliminate the impact of two room venting factors to greatest extent, improve the accuracy of permeability survey.
Ionization vacuum ga(u)ge in the present invention adopts High Voltage ionization vacuum ga(u)ge, and the pressure measurement scope of this vacuum gauge is 10 3pa-10 -4pa, with such two vacuum gauges, difference pre-amplifier and ion gauges, forming one can measure 10 -3the high sensitivity differential pressure pickup of Pa magnitude pressure reduction, can significantly improve the sensitivity of permeability survey.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention;
Mark in figure: 1, source of the gas, 2, reduction valve, 3, gas compartment, 4, tensimeter, 5, gas compartment extraction valve, 6, permeate chamber well heater, 7, permeate chamber, 8, tested film, 9, accumulating chamber well heater, 10, accumulating chamber, 11, vacuum gauge A, 12, accumulating chamber extraction valve, 13, vacuum gauge B, 14, venting measuring chamber, 15, venting measuring chamber well heater, 16, reference thin film room, 17, reference thin film, 18, reference thin film chamber heater, 19, reference thin film room extraction valve, 20, venting measuring chamber extraction valve, 21, differential amplifier, 22, vacuum meter, 23, roughing pump, 24, low vacuum valve, 25, high vacuum pump.
Embodiment
Below in conjunction with embodiment, the invention will be further described, and described embodiment is only the present invention's part embodiment, is not whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making other embodiments used obtained under creative work prerequisite, belongs to protection scope of the present invention.
By reference to the accompanying drawings, the device of material gas permeability measured by difference vacuum meter of the present invention, comprises source of the gas 1, venting measuring chamber 14, reference thin film room 16, differential amplifier 21 and vacuum meter 22, wherein, source of the gas of the present invention can for being equipped with the gas cylinder of tested gas, described source of the gas 1 is connected with gas compartment 3 through pipeline and reduction valve 2, gas compartment is equipped with tensimeter 4, for detecting the pressure in gas compartment, described gas compartment 3 is communicated with the permeate chamber 7 for placing tested film 8, described permeate chamber 7 is equipped with permeate chamber well heater 6, described permeate chamber 7 is communicated with accumulating chamber 10, described accumulating chamber 10 is equipped with accumulating chamber well heater 9, described accumulating chamber 10 is connected with vacuum gauge A11, the signal end of vacuum gauge A11 is electrically connected with an input end of differential amplifier 22, venting measuring chamber 14 is connected with vacuum gauge B13, the signal end of vacuum gauge B13 is electrically connected with another input end of differential amplifier 22, the output terminal of differential amplifier 22 is electrically connected with the signal input part of vacuum meter 22, described venting measuring chamber 14 is also communicated with the reference thin film room 16 for placing reference thin film 17, and described venting measuring chamber 14 and reference thin film room 16 are equipped with venting measuring chamber well heater 15 and reference thin film chamber heater 18 respectively, described gas compartment 3, accumulating chamber 10, venting measuring chamber 14 and reference thin film room 16 are communicated with high vacuum pump 25 through gas compartment extraction valve 5, accumulating chamber extraction valve 12, venting measuring chamber extraction valve 20 and reference thin film room extraction valve 19 respectively, and described high vacuum pump 25 is communicated with roughing pump 23 through low vacuum valve 24.
The material of described permeate chamber 7 and reference thin film room 16, structure and measure-alike; The material of described tested film 8 and reference thin film 17 and measure-alike; Being vacuum seal between the edge of described tested film 8 and the inwall of permeate chamber 7, is vacuum seal between the edge of described reference thin film 17 and the inwall of reference thin film room 16.
Described accumulating chamber 10 and the venting material of measuring chamber 14, structure are all identical with size.
Described vacuum gauge A11 and vacuum gauge B13 is one species and is the vacuum gauge of same model.
Wherein, vacuum gauge is the one in High Voltage ionization gauge, Pirani gauge, thermocouple rule or thin-film electro content regulation.
The input end of described differential amplifier 21 is equipped with single-ended-double-width grinding switching device shifter, by arranging single-ended-double-width grinding end-grain cutting changing device, make differential amplifier 21 can carry out single ended input to the signal of vacuum gauge A11 and vacuum gauge B13 separately, also can carry out both-end Differential Input to vacuum gauge A11 and vacuum gauge B13 simultaneously.Wherein, for single-ended-double-width grinding switching device shifter, those skilled in the art understands and understands, and does not repeat them here.
Described high vacuum pump 25 is turbomolecular pump, ODP or cryo pump, and described roughing pump 23 is rotary vane mechanical pump.
Described gas compartment extraction valve 5, accumulating chamber extraction valve 12, venting measuring chamber extraction valve 20 and reference thin film room extraction valve 19 are high vacuum valve.
Using be filled with purity higher than 99% the welding bottle of oxygen as source of the gas; Tested film is PET film, is namely to measure oxygen for the permeability of PET film when T=80 DEG C.Before test, valve used of the present invention is all in closed condition, and be full of air in each container and pipeline, each equipment is not all energized.Certain the present invention can also measure the film permeability under specific temperature (as T=70 DEG C, 75 DEG C etc.) of other sources of the gas for other materials.
Below, to measuring oxygen for the permeability of PET film when T=80 DEG C, step of the present invention is described in further detail.
Step 1: be sealed in permeate chamber 7 by tested film 8 to be measured, will be sealed in reference thin film room 16 with tested film 8 material and measure-alike reference thin film 17;
Step 2: open gas compartment extraction valve 5, accumulating chamber extraction valve 12, venting measuring chamber extraction valve 20 and reference thin film room extraction valve 19, opens roughing pump 23 and low vacuum valve 24 pairs of whole systems take out low vacuum;
Step 3: when tensimeter 4 reading is 0 atmospheric pressure, open vacuum meter 22, differential amplifier 21 is set to single ended input pattern, vacuum meter 22 independent measurement vacuum gauge A or vacuum gauge B;
Step 4: when gauge 22 reading is less than 100Pa, opens high vacuum pump 25, to whole system pumping high vacuum;
Step 5: gauge 22 reading is less than 10 -2during Pa magnitude, open permeate chamber well heater 6 and reference thin film chamber heater 18, make permeate chamber and reference thin film room temperature arrive 100 DEG C; Open accumulating chamber well heater 9 and venting measuring chamber well heater 15, make accumulating chamber 10 and venting measuring chamber 14 temperature reach 200 DEG C, bakeout degassing is carried out to system; Each well heater work 2 hours and more than, reach the object of bakeout degassing;
Step 6: close accumulating chamber well heater 9 and venting measuring chamber well heater 15; Regulate heter temperature to 80 DEG C or other specific temperature of permeate chamber well heater 6 and reference thin film chamber heater 18;
Step 7: when accumulating chamber 10 and venting measuring chamber 14 temperature drop to room temperature, vacuum meter reading should be reduced to 10 -4pa magnitude; Otherwise show that vacuum system somewhere exists small opening, leak detection should be shut down and repair;
Step 8: differential amplifier 21 switches to double-width grinding pattern, vacuum meter 22 carries out difference measurement to the signal of vacuum gauge A11 and vacuum gauge B13 simultaneously, the reading P of record vacuum meter 22 0;
Step 9: close gas compartment extraction valve 5, accumulating chamber extraction valve 12, venting measuring chamber extraction valve 20 and reference thin film room extraction valve 19; Then open reduction valve 2 immediately, the oxygen (source of the gas) in welding bottle is filled in gas compartment 3, makes the pressure P in gas compartment 3 2reduction valve is closed, if be now t=0 when reaching 1 atmospheric pressure;
Step 10: the change of record vacuum meter reading P and the numerical value of time of penetration t, when P value is greater than P 0during value suitable multiple, start to record P value and t value;
Step 11: establish P-P 0=P 1, according to used vacuum gauge for the relative sensitivity characteristic of oxygen to P 1value is revised, and obtains real P 1value; Real P 1the funtcional relationship of t change is in time:
P 1 = P 2 [ 1 - exp ( - k A d V ) t ]
In above formula: P 2gas pressure intensity in-gas compartment 3;
K-gas is to the infiltration coefficient of tested film 8
The infiltrating area of A-tested film 8
The thickness of d-tested film 8
The volume of V-accumulating chamber 10;
Step 12: obtain k value by the formula in step 11, then go out permeability Q (g/m according to following formulae discovery 2day);
Q = μ k R T d P 2
In above formula: the molal weight of μ-gas
R-gas universal constant
T-temperature.
Above formula is applicable to P 2>>P 1condition.In actual measurement, P 2be at least an atmospheric pressure, and P 1for low vacuum, this condition generally can meet.

Claims (9)

1. the device of a difference vacuum meter measurement material gas permeability, it is characterized in that, comprise source of the gas, venting measuring chamber, reference thin film room, differential amplifier and vacuum meter, described source of the gas is connected with gas compartment through pipeline and reduction valve, described gas compartment is communicated with the permeate chamber for placing tested film, described permeate chamber is equipped with permeate chamber well heater, described permeate chamber is communicated with accumulating chamber, described accumulating chamber is equipped with accumulating chamber well heater, described accumulating chamber is connected with vacuum gauge A, and the signal end of vacuum gauge A is electrically connected with an input end of differential amplifier; Venting measuring chamber is connected with vacuum gauge B, and the signal end of vacuum gauge B is electrically connected with another input end of differential amplifier; The output terminal of differential amplifier is electrically connected with the signal input part of vacuum meter; Described venting measuring chamber is also communicated with the reference thin film room for placing reference thin film, and described venting measuring chamber and reference thin film room are equipped with venting measuring chamber well heater and reference thin film chamber heater respectively; Described gas compartment, accumulating chamber, venting measuring chamber and reference thin film room are communicated with high vacuum pump through gas compartment extraction valve, accumulating chamber extraction valve, venting measuring chamber extraction valve and reference thin film room extraction valve respectively, and described high vacuum pump is communicated with roughing pump through low vacuum valve.
2. the device of material gas permeability measured by difference vacuum meter according to claim 1, it is characterized in that, the material of described permeate chamber and reference thin film room, structure and measure-alike; The material of described tested film and reference thin film and measure-alike; Being vacuum seal between the edge of described tested film and the inwall of permeate chamber, is vacuum seal between the edge of described reference thin film and the inwall of reference thin film room.
3. the device of material gas permeability measured by difference vacuum meter according to claim 1, it is characterized in that, material, the structure of described accumulating chamber and measuring chamber of exitting are all identical with size.
4. the device of material gas permeability measured by difference vacuum meter according to claim 1, it is characterized in that, described vacuum gauge A and vacuum gauge B is one species and is the vacuum gauge of same model.
5. the device of material gas permeability measured by difference vacuum meter according to claim 4, it is characterized in that, described vacuum gauge is the one in High Voltage ionization gauge, Pirani gauge, thermocouple rule or thin-film electro content regulation.
6. the device of material gas permeability measured by difference vacuum meter according to claim 1, and it is characterized in that, the input end of described differential amplifier is equipped with single-ended-double-width grinding switching device shifter.
7. the device of material gas permeability measured by difference vacuum meter according to claim 1, and it is characterized in that, described high vacuum pump is turbomolecular pump, ODP or cryo pump, and described roughing pump is rotary vane mechanical pump.
8. the device of material gas permeability measured by difference vacuum meter according to claim 1, it is characterized in that, described gas compartment extraction valve, accumulating chamber extraction valve, venting measuring chamber extraction valve and reference thin film room extraction valve are high vacuum valve.
9. a measuring method for the device of the gas permeability of material measured by difference vacuum meter, it is characterized in that, comprises the following steps:
Step 1: by tested diaphragm seal to be measured in permeate chamber, will be sealed in reference thin film room with tested membraneous material and measure-alike reference thin film;
Step 2: open gas compartment extraction valve, accumulating chamber extraction valve, venting measuring chamber extraction valve and reference thin film room extraction valve, opens roughing pump and low vacuum valve takes out low vacuum to whole system;
Step 3: when pressure gauge reading is 0 atmospheric pressure, open vacuum meter, differential amplifier is set to single ended input pattern, vacuum meter independent measurement vacuum gauge A or vacuum gauge B;
Step 4: when gauge reading is less than 100Pa, opens high vacuum pump, to whole system pumping high vacuum;
Step 5: gauge reading is less than 10 -2during Pa magnitude, open permeate chamber well heater, reference thin film chamber heater, accumulating chamber well heater and venting measuring chamber well heater and carry out bakeout degassing;
Step 6: close accumulating chamber well heater and venting measuring chamber well heater; Regulate the heter temperature of permeate chamber well heater and reference thin film chamber heater to specific temperature;
Step 7: accumulating chamber and venting measuring chamber temperature drop to room temperature, and vacuum meter reading is reduced to 10 -4pa magnitude;
Step 8: differential amplifier switches to double-width grinding pattern, vacuum meter carries out difference measurement to the signal of vacuum gauge A and vacuum gauge B simultaneously, the reading P of record vacuum meter 0;
Step 9: close gas compartment extraction valve, accumulating chamber extraction valve, venting measuring chamber extraction valve and reference thin film room extraction valve; Then open reduction valve immediately, source of the gas is filled in gas compartment, make the pressure P in gas compartment 2reduction valve is closed, if be now t=0 when reaching 1 atmospheric pressure;
Step 10: the change of record vacuum meter reading P and the numerical value of time of penetration t;
Step 11: establish P-P 0=P 1, P 1the funtcional relationship of t change is in time:
P 1 = P 2 [ 1 - exp ( - k A d V ) t ]
In above formula: P 2gas pressure intensity in-gas compartment;
K-gas is to the infiltration coefficient of tested film
The infiltrating area of A-tested film
The thickness of d-tested film
The volume of V-accumulating chamber;
Step 12: obtain k value by the formula in step 11, then go out permeability Q according to following formulae discovery;
Q = μ k R T d P 2
In above formula: the molal weight of μ-gas
R-gas universal constant
T-temperature.
CN201510908556.5A 2015-12-10 2015-12-10 A kind of device and its measuring method of difference vacuum meter measurement material gas permeability Expired - Fee Related CN105300869B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510908556.5A CN105300869B (en) 2015-12-10 2015-12-10 A kind of device and its measuring method of difference vacuum meter measurement material gas permeability

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510908556.5A CN105300869B (en) 2015-12-10 2015-12-10 A kind of device and its measuring method of difference vacuum meter measurement material gas permeability

Publications (2)

Publication Number Publication Date
CN105300869A true CN105300869A (en) 2016-02-03
CN105300869B CN105300869B (en) 2017-12-01

Family

ID=55198381

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510908556.5A Expired - Fee Related CN105300869B (en) 2015-12-10 2015-12-10 A kind of device and its measuring method of difference vacuum meter measurement material gas permeability

Country Status (1)

Country Link
CN (1) CN105300869B (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106290117A (en) * 2016-10-19 2017-01-04 中国科学院光电研究院 A kind of apparatus and method causing gas infiltration for testing material radiation
CN106442214A (en) * 2016-08-31 2017-02-22 兰州空间技术物理研究所 Material outgassing rate measuring device and method based on hot cathode gauges through static pressure rise method
CN107655805A (en) * 2017-08-30 2018-02-02 苏州开洛泰克科学仪器科技有限公司 A kind of permeability measurement systems and method of hypotonic rock ore deposit particle
CN107817200A (en) * 2017-09-19 2018-03-20 兰州空间技术物理研究所 A kind of mixed gas permeability measuring apparatus and method based on mass spectral analysis
CN107870056A (en) * 2017-11-09 2018-04-03 中国工程物理研究院激光聚变研究中心 A kind of device and method for measuring microballoon internal gas pressure
CN109813643A (en) * 2019-01-01 2019-05-28 中国人民解放军63653部队 A kind of gas permeability measurement method of concrete and its surface coating coating material
CN109916467A (en) * 2019-03-19 2019-06-21 苏州开洛泰克科学仪器科技有限公司 A kind of volume determination system and method
CN111551476A (en) * 2020-04-24 2020-08-18 广州西唐机电科技有限公司 Gas permeability testing system and method based on differential pressure method
CN112394761A (en) * 2020-11-26 2021-02-23 北京卫星环境工程研究所 System and method for dynamically simulating temperature and pressure control of terrestrial planet atmospheric environment

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4944180A (en) * 1988-08-26 1990-07-31 The Dow Chemical Company Permeation measurement device
CN101246095A (en) * 2008-01-07 2008-08-20 电子科技大学 Device and method for measuring air permeability of isolation material
CN101275893A (en) * 2008-05-09 2008-10-01 昆明理工大学 Method and apparatus for measuring bamboo lignum permeability
CN101975719A (en) * 2010-11-05 2011-02-16 济南兰光机电技术有限公司 Differential-pressure method gas permeameter with energy utilization monitoring capability and environment detecting capability
CN202486012U (en) * 2012-03-27 2012-10-10 济南兰光机电技术有限公司 Gas permeability test device
CN103115858A (en) * 2013-01-24 2013-05-22 电子科技大学 Measuring device and measuring method for measuring gas permeability of material
CN103471961A (en) * 2013-09-26 2013-12-25 湖南航天机电设备与特种材料研究所 Gas barrier property detection apparatus for aerostat ballonet body material
CN104729973A (en) * 2015-04-15 2015-06-24 合肥工业大学 Thin-film permeameter and measuring method thereof

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4944180A (en) * 1988-08-26 1990-07-31 The Dow Chemical Company Permeation measurement device
CN101246095A (en) * 2008-01-07 2008-08-20 电子科技大学 Device and method for measuring air permeability of isolation material
CN101275893A (en) * 2008-05-09 2008-10-01 昆明理工大学 Method and apparatus for measuring bamboo lignum permeability
CN101975719A (en) * 2010-11-05 2011-02-16 济南兰光机电技术有限公司 Differential-pressure method gas permeameter with energy utilization monitoring capability and environment detecting capability
CN202486012U (en) * 2012-03-27 2012-10-10 济南兰光机电技术有限公司 Gas permeability test device
CN103115858A (en) * 2013-01-24 2013-05-22 电子科技大学 Measuring device and measuring method for measuring gas permeability of material
CN103471961A (en) * 2013-09-26 2013-12-25 湖南航天机电设备与特种材料研究所 Gas barrier property detection apparatus for aerostat ballonet body material
CN104729973A (en) * 2015-04-15 2015-06-24 合肥工业大学 Thin-film permeameter and measuring method thereof

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
杨威 等: "OLED封装材料气体渗透率测试的发展", 《功能材料》 *
王静 等: "阻隔材料的气体渗透率", 《强激光与粒子束》 *

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106442214B (en) * 2016-08-31 2019-06-18 兰州空间技术物理研究所 Static pressurizing method material outgassing rate measuring device and method based on hot cathode rule
CN106442214A (en) * 2016-08-31 2017-02-22 兰州空间技术物理研究所 Material outgassing rate measuring device and method based on hot cathode gauges through static pressure rise method
CN106290117B (en) * 2016-10-19 2023-11-03 中国科学院光电研究院 Device and method for testing radiation induced gas permeation of material
CN106290117A (en) * 2016-10-19 2017-01-04 中国科学院光电研究院 A kind of apparatus and method causing gas infiltration for testing material radiation
CN107655805B (en) * 2017-08-30 2020-02-14 苏州开洛泰克科学仪器科技有限公司 System and method for measuring permeability of low-permeability rock ore particles
CN107655805A (en) * 2017-08-30 2018-02-02 苏州开洛泰克科学仪器科技有限公司 A kind of permeability measurement systems and method of hypotonic rock ore deposit particle
CN107817200B (en) * 2017-09-19 2019-12-10 兰州空间技术物理研究所 mixed gas permeability measuring device and method based on mass spectrometry
CN107817200A (en) * 2017-09-19 2018-03-20 兰州空间技术物理研究所 A kind of mixed gas permeability measuring apparatus and method based on mass spectral analysis
CN107870056A (en) * 2017-11-09 2018-04-03 中国工程物理研究院激光聚变研究中心 A kind of device and method for measuring microballoon internal gas pressure
CN109813643A (en) * 2019-01-01 2019-05-28 中国人民解放军63653部队 A kind of gas permeability measurement method of concrete and its surface coating coating material
CN109813643B (en) * 2019-01-01 2021-06-08 中国人民解放军63653部队 Concrete and gas permeability measuring method of surface coating material thereof
CN109916467A (en) * 2019-03-19 2019-06-21 苏州开洛泰克科学仪器科技有限公司 A kind of volume determination system and method
CN109916467B (en) * 2019-03-19 2020-07-28 苏州开洛泰克科学仪器科技有限公司 Volume measuring system and method
CN111551476A (en) * 2020-04-24 2020-08-18 广州西唐机电科技有限公司 Gas permeability testing system and method based on differential pressure method
CN112394761A (en) * 2020-11-26 2021-02-23 北京卫星环境工程研究所 System and method for dynamically simulating temperature and pressure control of terrestrial planet atmospheric environment

Also Published As

Publication number Publication date
CN105300869B (en) 2017-12-01

Similar Documents

Publication Publication Date Title
CN105300869A (en) Device and method for measuring gas permeability of material by virtue of differential vacuum gauge
CN105547956A (en) Device and method for measuring gas permeability of thin film by using vacuometer
CN103115858B (en) Measuring device and measuring method for measuring gas permeability of material
CN106226000B (en) A kind of vacuum sealing performance measurement device and method
CN104729973B (en) A kind of film permeation instrument and measuring method thereof
AU2015320899B2 (en) Device and method for calibrating a film chamber for leak detection
CN108151961B (en) Extreme high vacuum calibration device and method
AU2015273615B2 (en) Differential pressure measurement with film chamber
US10578513B2 (en) Method for controlling the leaktightness of sealed products and installation for the detection of leaks
CN105531574B (en) Air tightness test when film chamber is evacuated
CN107817200A (en) A kind of mixed gas permeability measuring apparatus and method based on mass spectral analysis
CN111551476B (en) Gas permeability testing system and method based on differential pressure method
AU2016376655B2 (en) Gross leak measurement in an incompressible test item in a film chamber
CN102460111A (en) Hydrogen sensor
CN105004479A (en) Ionization vacuum gauge and mass spectrometer calibration device and method based on standard pressure measurement
CN202075102U (en) Leak detecting device for condenser or evaporator
CN103808458A (en) Device and method for testing suction and vent quantity of vacuum gauge based on dynamic flow method
CN106525683A (en) Thin film permeability measuring device and method
CN106679897A (en) Leakage hole's leakage rate measuring apparatus
CN206208685U (en) A kind of use Dynamic flow methed measures the vacuum measurement system of material outgassing performance
CN103063381A (en) Method and device for vacuum cavity leakage detection for sensors with vacuum reference cavities
CN202853862U (en) System for extending lower limit of gas micro-flow calibration to 10<-14>Pam<3>/s
CN116429342A (en) Positive pressure-vacuum helium mass spectrum leakage detection system and leakage detection method below atmospheric pressure
CN201281644Y (en) Ionization vacuum gauge device with air section valve
CN110702332B (en) Method for evaluating vacuum packaging performance of MEMS

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20171201

Termination date: 20181210

CF01 Termination of patent right due to non-payment of annual fee