CN105277399A - Preparation method of TiAl penetrating layer metallographic specimen - Google Patents
Preparation method of TiAl penetrating layer metallographic specimen Download PDFInfo
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- CN105277399A CN105277399A CN201410312657.1A CN201410312657A CN105277399A CN 105277399 A CN105277399 A CN 105277399A CN 201410312657 A CN201410312657 A CN 201410312657A CN 105277399 A CN105277399 A CN 105277399A
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Abstract
The invention belongs to the technical field of metallographic preparation and provides a preparation method of a TiAl penetrating layer metallographic specimen, comprising: the specimen is placed in a thermal pointing machine, the TiAl surface of the specimen is perpendicular to the bottom of the thermal pointing machine, inlay is poured into the thermal pointing machine, the thermal pointing machine combines the specimen and the inlay into a whole by thermal compression; the inlaid specimen is placed in a specimen clamping disc; the lower surface of the specimen is parallel to the lower surface of the specimen clamping disc; the specimen and the specimen clamping disc are fastened; the lower surface of the specimen is coarsely ground by using the metallographic sand paper to remove the irregular and damaged cutting plane and attachments; the lower surface of the specimen is polished by using a short-fur polishing fabric and diamond polishing liquid and water to remove the residual grinding marks caused by the metallographic sand paper; the specimen surface is cleaned and dried.
Description
Technical field
The invention belongs to metallography preparation field, relate to a kind of preparation method of TiAl infiltration layer metallographic specimen.
Background technology
After DZ40M material surface oozes TiAl, the manual method for making sample of the common metallographic of usual employing prepares metallographic specimen, but owing to very easily causing peeling off or ftractureing of diffusion layer organization in manual preparation process, greatly reduce the accuracy to the evaluation of its tissue, even can cause and judge by accident and cause unnecessary loss.Therefore, obtain rational surface to ooze TiAl sample making technology and have extremely important meaning.
After manual preparation DZ40M material surface oozes TiAl metallographic specimen process in, because human factor accounts for leading role, in preparation process, the stability of sample, the dynamics that sample holds in operator's hand, the time of abrasive paper for metallograph or polishing disk grinding, throwing, time prepared by sample, sample is all decide to all factors such as the selections of polishing fluid or antiscuffing paste and prepare final quality.The uncertainty of above-mentioned factor then have impact on the formulation of reasonable sample preparation program greatly.
Summary of the invention
The technical problem to be solved in the present invention: a kind of preparation method of TiAl infiltration layer metallographic specimen, can prevent diffusion layer organization in preparation process from producing and peel off or ftracture.
Technical scheme of the present invention: a kind of preparation method of TiAl infiltration layer metallographic specimen, comprising:
Sample to be detected is put into hot edge machine, described sample to be detected ooze TiAl interface and pointing machine bottom vertical, inject inlay, it is integral that sample to be detected and inlay are passed through hot binding by hot edge machine;
The sample to be detected inlayed is put into sample holder dish, ensures that sample lower plane to be detected is parallel with sample holder dish lower plane, by sample to be detected and sample holder dish fastening;
Treat test samples lower surface with abrasive paper for metallograph to roughly grind, remove flour milling irregular, damage cut surface, attachment;
Use diamond polishing liquid and water, undercoat polishing fabric is treated test samples lower surface and carries out polishing, remove the polishing scratch that specimen surface abrasive paper for metallograph to be detected is residual;
Treat test samples surface to carry out cleaning and drying.
Preferably, treat the step of carrying out cleaning in test samples surface and adopt alcohol washes.
Beneficial effect of the present invention: simple, operability is extremely strong.By using the automatic sample machine equipment of domestic or import, avoid the phenomenon such as uneven that the manual specimen cross section produced when preparing sample is stressed.
Embodiment
The technical scheme of the preparation method of a kind of TiAl infiltration layer of the present invention metallographic specimen, comprising:
Step 1, sample to be detected is put into hot edge machine, described sample to be detected ooze TiAl interface and pointing machine bottom vertical, inject inlay, it is integral that sample to be detected and inlay are passed through hot binding by hot edge machine;
Step 2, the sample to be detected inlayed is put into sample holder dish, ensures that sample lower plane to be detected is parallel with sample holder dish lower plane, by sample to be detected and sample holder dish fastening;
Step 3, treat test samples lower surface with abrasive paper for metallograph and roughly grind, remove cut surface, the attachment of irregular, the damage of flour milling;
Step 4, use diamond polishing liquid and water, undercoat polishing fabric is treated test samples lower surface and carries out polishing, removes the polishing scratch that specimen surface abrasive paper for metallograph to be detected is residual;
Step 5, treat test samples surface and carry out cleaning and drying.
Preferably, treat the step of carrying out cleaning in test samples surface in step 5 and adopt alcohol washes.Use alcohol washes evaporation fast, the organism of easy cleaning specimen surface.
Below in conjunction with embodiment, the invention will be further described:
Embodiment:
Choosing of 1 sample
Representative region is chosen as treating metallographic specimen according to testing requirements.
The mark of 2 samples
Use marking pen or label, specimen surface is marked, so that the differentiation of sample.
Inlaying of 3 samples
Square coupons (being of a size of 10 × 10 × 10mm) is adopted model be SimpliMet3000 heat edge machine, model is that the special inlay of metallographic of HMR1 is inlayed sample.What make sample surrounding in mosaic process to ooze bottom TiAl interface and pointing machine in vertical state, pours in pointing machine by suitable inlay, hot edge machine by sample to be detected and inlay integral by hot binding.
The clamping of 4 samples
The metallographic specimen inlayed is put into sample blessing dish, sample lower plane to be detected is parallel with sample blessing dish lower plane, uses sample screeder to carry out levelling and fastening.
The corase grind of 5 samples
Use 80#, 180#, 320#, 500#/600#, 800#, 1000#/1200#, SiC abrasive paper for metallograph to roughly grind sample respectively, corase grind require remove flour milling irregular, damage cut surface, attachment etc.
Sample corase grind device parameter:
Pressure: 20N (also can choose 10N, 30N, 40N pressure);
Time: often open sand paper in 30 seconds;
Speed of grinding plate: 300r/m.
The polishing of 6 samples
Use 1 μm of diamond polishing liquid and water, softer and restorative higher undercoat polishing fabric carries out polishing, remove the polishing scratch that specimen surface abrasive paper for metallograph is residual, make it reach desirable polishing effect.
Sample polissoir parameter:
Select restorative better fabric
Pressure: 20N (also can choose 10N, 30N, 40N pressure);
Time: essence is thrown 3 minutes;
Speed of grinding plate: 300r/m;
Polishing fluid: essence throws use 1 μ diamond polishing liquid+water.
The cleaning of 7 samples
Alcohol is used to clean specimen surface and dry.
In the process preparing sample, the application of different model abrasive paper for metallograph in corase grind, mill, the choosing of fabric in throwing process are all to make sample wait to evaluate surface to reach desirable effect to meet the requirement of metallographic evaluation.Specimen surface applied pressure in preparation process, time prepared by sample, the utilization of sample preparation mill, polishing fluid, the tachometer value of mill, polishing disk is and obtains desirable specimen surface face and provide sound assurance, for the evaluation of TiAl layer microstructure is oozed on DZ40M surface, provide corresponding technical support.
Claims (2)
1. a preparation method for TiAl infiltration layer metallographic specimen, is characterized in that, comprising:
Sample to be detected is put into hot edge machine, described sample to be detected ooze TiAl interface and pointing machine bottom vertical, inject inlay, it is integral that sample to be detected and inlay are passed through hot binding by hot edge machine;
The sample to be detected inlayed is put into sample holder dish, ensures that sample lower plane to be detected is parallel with sample holder dish lower plane, by sample to be detected and sample holder dish fastening;
Treat test samples lower surface with abrasive paper for metallograph to roughly grind, remove flour milling irregular, damage cut surface, attachment;
Use diamond polishing liquid and water, undercoat polishing fabric is treated test samples lower surface and carries out polishing, remove the polishing scratch that specimen surface abrasive paper for metallograph to be detected is residual;
Treat test samples surface to carry out cleaning and drying.
2. preparation method as claimed in claim 1, is characterized in that, treats the step of carrying out cleaning in test samples surface and adopts alcohol washes.
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CN201410312657.1A CN105277399A (en) | 2014-07-02 | 2014-07-02 | Preparation method of TiAl penetrating layer metallographic specimen |
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CN201410312657.1A CN105277399A (en) | 2014-07-02 | 2014-07-02 | Preparation method of TiAl penetrating layer metallographic specimen |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN113702133A (en) * | 2021-09-13 | 2021-11-26 | 西安汉唐分析检测有限公司 | Pressing block for metallographic hot-pressing sample embedding device and using method thereof |
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JPH0435868A (en) * | 1990-05-31 | 1992-02-06 | Mitsubishi Materials Corp | Polishing method for rock sample |
CN101692026A (en) * | 2009-10-14 | 2010-04-07 | 承德建龙特殊钢有限公司 | Process method for manufacturing metallographic specimen |
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CN103759999A (en) * | 2014-01-26 | 2014-04-30 | 国家电网公司 | Metallographic sample preparation method for brittle and hard oxide layer on inner wall of heating surface tube |
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2014
- 2014-07-02 CN CN201410312657.1A patent/CN105277399A/en active Pending
Patent Citations (5)
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JPH0435868A (en) * | 1990-05-31 | 1992-02-06 | Mitsubishi Materials Corp | Polishing method for rock sample |
CN101692026A (en) * | 2009-10-14 | 2010-04-07 | 承德建龙特殊钢有限公司 | Process method for manufacturing metallographic specimen |
CN103822804A (en) * | 2011-08-30 | 2014-05-28 | 沈阳黎明航空发动机(集团)有限责任公司 | Preparation method for metallographic specimen of plasma-sprayed tungsten carbide coating |
CN103308355A (en) * | 2012-11-12 | 2013-09-18 | 西安航空动力股份有限公司 | Metallographic test sample preparation method of aluminum-based ceramic mould core and silicon-based ceramic mould core |
CN103759999A (en) * | 2014-01-26 | 2014-04-30 | 国家电网公司 | Metallographic sample preparation method for brittle and hard oxide layer on inner wall of heating surface tube |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113702133A (en) * | 2021-09-13 | 2021-11-26 | 西安汉唐分析检测有限公司 | Pressing block for metallographic hot-pressing sample embedding device and using method thereof |
CN113702133B (en) * | 2021-09-13 | 2024-02-20 | 西安汉唐分析检测有限公司 | Briquetting for metallographic hot-pressing sample-inserting device and use method thereof |
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