CN105203149B - Integrated Measurement System and method - Google Patents

Integrated Measurement System and method Download PDF

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CN105203149B
CN105203149B CN201510578125.7A CN201510578125A CN105203149B CN 105203149 B CN105203149 B CN 105203149B CN 201510578125 A CN201510578125 A CN 201510578125A CN 105203149 B CN105203149 B CN 105203149B
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information
sensor
energy
calibration
measurement system
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CN105203149A (en
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陈文强
蔡超
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Wuhan Taili Meixin Medical Science & Technology Co Ltd
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Wuhan Taili Meixin Medical Science & Technology Co Ltd
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Abstract

The present invention provides an Integrated Measurement System and methods, for measuring and calibrating parameter related with object or environment.Integrated Measurement System includes the memory of a storage calibration equation, a retrieval communication module, a retrieval information and the arithmetic center for subsequently generating calibration information from sensor information.

Description

Integrated Measurement System and method
Technical field
The present invention relates to an Integrated Measurement System and methods.More particularly it relates to measure and correct object Or the integrated system and method for environmental correclation variable.
Background technique
More and more research work are dedicated to the status monitoring to environment or object.Above-mentioned object may wrap It includes, for example, the mankind.In order to track or detect the certain characteristics or parameter of ambient enviroment or object, need to dispose or Person uses an even more sensor.These sensors both may be simulation, it is also possible to digital.
The equipment by containing microcontroller or other complicated circuits is needed to carry out from the collected information of sensor Pretreatment or correction.The energy supply of the sensor (or equipment) is a problem in need of consideration, for example, for portable Sensor or equipment for power supply should small and exquisite and lightweight.Therefore, develop one can measure it is one or more with Environment or the relevant parameter of object, and the system for measuring parameter can be calibrated or method is rather beneficial.Equally, possess one It is a light-weighted, and the integral measuring chip that energy supply can be obtained from ambient enviroment will bring many benifits.
Summary of the invention
The present invention proposes a kind of device, which includes: sensor, can be used for detecting target information;Memory, wherein Store calibration equation and calibration parameter;Communication module can be used for acquiring the information from sensor;Calculating center, can be with Calibration equation and calibration parameter are selected from library based on collected information, and utilize selected calibration equation and parametric calibration Collected information.
Further, the device includes the energy collection module for collecting energy from ambient enviroment.
Further, energy collected by the energy collection module includes thermal energy, solar energy, vibrational energy, frequency modulation Energy, bioenergy or electromagnetic energy.
Further, the communication module includes a radio frequency interface or a sensor interface.
Further, the device, which carries out wireless communication, can be based on near-field communication (NFC) agreement or a radio Frequency identification (RFID) agreement.
Further, the device includes that the information retrieved described in being configured to based upon selects calibration from library The control unit of formula.
Further, the control unit can control the access to data stored in memory.
Further, the control unit is for setting different access authority to different terminal users.
Further, the calibration equation for including is thought highly of in the storage can be Steinhart-Hart formula, Qie Bixue Husband's fitting of a polynomial, look-up table (LUT), polynomial equation, exponential polynomials, Fourier's multinomial, Gauss polynomial, interpolation are more Item formula, power exponent multinomial, rational polynominal, smoothing spline multinomial, sinusoidal polynomial series, Weibull multinomial, or Similar formula and their any combination.
Detailed description of the invention
Fig. 1 shows the exemplary diagrams of measuring system 100 according to some embodiments of the present invention.
Fig. 2 shows the exemplary block diagram at calculating center 104 according to some embodiments of the present invention.
The example process for handling the information received from external sensor is illustrated in Fig. 3.
Fig. 4 shows the storage organization of measuring system according to some embodiments of the present invention.
Fig. 5 A shows the corresponding calibration parameter of Steinhart-Hart formula according to some embodiments of the present invention Example format.
Fig. 5 B shows showing for the corresponding calibration parameter of chebyshev approximating polynomial according to some embodiments of the invention Example personality formula.
Fig. 5 C shows the example format of the corresponding calibration parameter of look-up table according to some embodiments of the invention.
Fig. 6 shows the structure chart using register as control unit 400 according to some embodiments of the present invention.
Fig. 7 shows the block diagram of oscillating circuit according to some embodiments of the invention.
Fig. 8 shows the example of oscillating circuit according to some embodiments of the invention.
Fig. 9 is another example of oscillating circuit according to some embodiments of the invention.
Figure 10 shows another example of oscillating circuit according to some embodiments of the invention.
Figure 11 shows the circuit of ring oscillator according to some embodiments of the invention.
Figure 12 illustrates the circuit of schmidt trigger oscillator according to some embodiments of the invention.
Figure 13 illustrates the circuit of calculating thermistor according to some embodiments of the invention.
Figure 14 and Figure 15 illustrates the curve that capacitor charging voltage according to some embodiments of the invention changes over time.
Specific embodiment
Upon reading the present specification, those skilled in the art will be readily susceptible to imagine how to implement it is each in the present invention Kind alternate embodiment and application.However, simultaneously all embodiments of non-present invention are all described in detail herein.It is appreciated that herein Embodiment is suggested by way of example, and the form being in no way limiting of is presented.Just because of this, various substitutions as described below are real The detailed description for applying example is not necessarily to be construed as limiting the scope of the invention or range.
It should be understood that various aspects described below are not limited to specific system, the manufacturing method and purposes of this kind of system are all It is various.It can also be appreciated that term used herein is only used for describing specific aspect, limited without being intended to Property.
According to the specification and claims of present patent application, unless state otherwise in terms of content, such as "one", and/ Or the articles such as " this " might not singular, and also include plural form.In general, the expression of "comprising" and " comprising " The step of being only used for number or original part.However, these steps and original part list are not unique, method (or equipment) may packet Other steps (or original part) is contained.
Present invention can apply to many fields, for example, remote sensing, nondestructive evaluation, monitoring, the monitoring of physiological characteristic, environment prison Survey, smart home, wearable device or other similar fields and any combination thereof.For example, the present invention relates to systems, instrument Device, and to measurement environmental correclation or relevant with people parameter, for example, temperature, noise factor, particulate matter 2.5 (PM2.5), Density, blood pressure of harmful substance etc..By measuring the real time temperature of the production site of food or food for example produced, this Invention can be used for the food quality monitoring of food producing plants.Present invention may also apply to cargo transport fields, for example, by using Monitoring instrument provided in the present invention monitors the state of cargo.It should be understood that the description above and example are merely to illustrate that For the sake of, the range that is not intended to limit the invention.The method of measurement parameter in the present invention contains a collimation technique.It sends Parameter can be calibrated, to improve the accuracy of result.In some embodiments, calibration can be with off-line execution.Calibration can be with Come according to the demand of user using different calibration methods.System, instrument and method in the present invention contain an energy and receive The component and method of collection.Description referring to calibration relevant with measuring system, instrument and method is mentioned with the purpose illustrated For the range being not intended to limit the invention.
Fig. 1 shows the exemplary diagrams of measuring system 100 according to some embodiments of the present invention.Measuring system 100 can be with It is configured or for collecting energy.The energy harvested can provide power supply for the operation of at least part measuring system 100.Example Such as, the energy of harvest can be obtained for measuring system 100 information or data from external sensor, processing information or data, with External device communication or similar operations and their any combination provide power supply.The information or data may include and object Or the related one or more parameters of environment.The external equipment can be mobile phone, personal computer (PC), intelligent hand Table, tablet computer, Intelligent bracelet etc., or the like or any combination of them.The external sensor may include light Electric transducer, conductivity sensor, thermocouple, resistance temperature detector (RTD), positive temperature coefficient (PTC) or negative temperature coefficient Or the like and their combination (NTC),.As shown, measuring system 100 may include energy collection module 101, mould is communicated Block 102, memory 103, and calculate center 104.
Energy collection module 101 can be configured or for collection of energy and management.Above-mentioned energy may be used to provide dynamic The operation of power or at least part of measuring system 100 of driving.Illustrative operation includes such as communication module 102, storage Device 103, the operation for calculating circuit in center 104 or other any measuring systems 100.Energy collection module 101 can also be with It is operated to receive and come from, for example, one or more other modules of measuring system 100 or the information of external equipment, with And information distributes energy collected based on the received.It should be pointed out that energy collection module 101 can be received independently Collection energy cooperates with collection energy with the energy acquisition interface in communication module 102.Energy collection module 101 is used to the energy collected Amount can be thermal energy, solar energy, vibrational energy, frequency modulation energy, bioenergy or electromagnetic energy.
Communication module 102 may include radio frequency interface, sensor interface, energy acquisition interface, command signal interfaces, clock Input interface, or similar interface and their any combination.In some embodiments, radio frequency interface can be configured for and one A external device communication or collect from ambient enviroment energy.Sensor interface can be configured for and external sense Device or the communication of onboard sensor.Communication module 102 can obtain energy from environment.Communication module 102 can be configured or For receiving information from one or more external equipments or external sensor.Information from external equipment contains control letter Breath, command information, initial information, configuration information, end message or similar information and their any combination.Communication module 102 It can also be configured or for receiving the information from one or more 100 components of measuring system, for example, memory 103, calculating Center 104 or similar assembly.Communication module 102 can send information to external equipment or the sensor of outside, such as from measurement The information that the component of system 100 receives.For another example, communication module 102 can output information to external equipment, or output control letter Cease external sensor.In addition, communication module 102 can be configured to for external sensor, external equipment and measuring system into Row information exchange.
In some embodiments, communication module 102 may include crosspoint (not shown), for analyzing from outside The information of equipment and/or external sensor, and by the information structuring of the parsing at external equipment readable format.For example, handing over Changing unit can parse the information from external equipment and external sensor, allow to generate memory 103 and calculating center 104 readable information.For another example, crosspoint can also be configured to encode information onto for external equipment and/or external sensor As desired format.For example, information can be become the frame of RFID protocol by binding and layout when external equipment is RFID reader Format.When there are the multiple external equipments based on different agreements, crosspoint is configured to become information binding and layout simultaneously Different frame formats.The frame format of exemplary partial agreement is described in Fig. 9.
In some embodiments, in order to establish the connection with external sensor or external equipment, communication module 102 can be through matching It sets for connecting calculating center 104.In addition, some parameter settings can be configured for external sensor by calculating center 104, such as sample Rate, range or precision.
Memory 103 can be configured or for storing information for measuring system 100.The information may include calibration ginseng Number, format information, communication protocol, command information, configuration information, programme information, the information received from external sensor, from outer Information that portion's equipment receives, the information received from calculating center 104 or similar information and any combination of them.Measurement The memory of system 100 may include the dynamic memory for being configured as storage information and instruction, and the instruction is on piece System (SOC, for example, one include processor chipset) processor, other processors (or arithmetic element), or the like and The pending instruction such as any combination thereof.The memory can be also used for storage temporary variable or other processors execute instruction the phase Between average information.It is slow that part or whole memory may be implemented as dual inline memory module (DIMM), flash memory, high speed Deposit, buffer, ROM, RAM, register, disk, CD, hard disk, floppy disk, Electronic saving, film memory, phase transition storage, Cloud disk, nand flash memory, NOR flash memory memory etc..Wherein RAM can be one or more following kind of memories: it is static with Machine memory (SRAM)/burst type SRAM, synchronization burst formula SRAM (BSRAM), dynamic RAM (DRAM), quick page are cut Mold changing formula DRAM (FPM DRAM), enhanced DRAM (EDRAM), growth data output RAM (EDO RAM), growth data output DRAM (EDO DRAM), Burst Extended Data export DRAM (BEDO DRAM), enhanced DRAM (EDRAM), synchronous dram (SDRAM), JEDECSRAM, PCIOO SDRAM, Double Data Rate synchronous SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronization links DRAM (SLDRAM), direct rambus DRAM (DRDRAM), ferroelectric RAM (FRAM) or any Other types of memory device.The memory can also include read-only memory (ROM) and/or be configured to store static letter Breath and another static storage device of SOC and/or other processors (or arithmetic element) instruction.In addition, memory or electronics are deposited Storage media may include disk, CD or flash memory device to store information and instruction.
Calculating center 104 can be configured or come from for handling to receive, for example, the information of communication module 102.In calculating The heart 104 can also execute various operations, including such as sampled analogue signals, initialization sample information, calculating initiation parameter, school Quasi- initiation parameter, etc. similar operations or any combination of them.It can be with the group of measuring system 100 in addition, calculating center 104 Part (for example, memory 103), external equipment, external sensor or similar devices and any combination thereof carry out information exchange. The process of information exchange can be realized via communication module 102.
Feature described in the present invention is not in detail, particularly in view of many supplementary features in drawing and description Those skilled in the art will be apparent from.For example, the external sensor can also be one or more plates Carry the sensor of (or built-in).In some embodiments, such a onboard sensor can be supplied by energy collection module 101 Electricity.Onboard sensor can be configured or for monitoring or measuring one or more parameters about object or environment.Institute Stating parameter can be handled by communication module 102 or calculating center 104.
Fig. 2 shows the exemplary block diagram at calculating center 104 according to some embodiments of the present invention.As shown in the drawing, Calculating center 104 may include processing unit 201, calibration unit 202 and arithmetic element 203.Each of calculating center 104 Unit can be communicated with other units at one or more calculating centers 104.
Processing unit 201 can be configured or for handling the information received from arithmetic element 203.These information can be with Including the heat transfer agent received from external sensor or onboard sensor, the control information received from external equipment and life Enable information, the information being stored in memory 103 or similar information and their any combination.In some embodiments, it handles Unit 201 can be configured or for establishing connection (as shown in Figure 1) with external sensor.In some embodiments, processing is single Member 201 can provide information to that parameter, such as sample rate, range or accuracy is arranged for external sensor.In addition, processing unit Other modules of 201 configuration informations that can be sent to one or more measuring systems 100.Which includes for example, memory 103, for selecting calibration parameter.Processing unit 201 can transmit data to calibration unit 202 and/or arithmetic element 203.Place Reason unit 201 can output data to communication module 102, memory 103 or energy collection module 101.In some embodiments In, when the heat transfer agent from external sensor is analog signal, processing unit 201 can be configured or for that will simulate letter Number be converted to digital signal.The conversion can be executed by ADC or other devices.In addition, the conversion can be based on from outside The control information of sensor or external equipment is realized.In addition, processing unit 201 can be configured or for generating calibration unit 202 initial value, and calibration unit 202 is sent by initial value.In some embodiments, processing unit 201 can be configured Or heat transfer agent is handled for receiving multiple heat transfer agents, and with batch mode.Processing unit 201 under batch mode can To be configured or for concurrently or sequentially handling heat transfer agent.
Calibration unit 202 can be configured or for verifying the information from processing unit 201 or arithmetic element 203.Example Such as, when calibration unit 202 is received from the initial value of processing unit 201, by handling initial value, it be can produce finally Value simultaneously sends arithmetic element 203 for end value.It should be pointed out that end value may be identical as initial value.Calibration unit 202 It can receive the information from communication module 102, such as calibration parameter or calibration equation.Calibration unit 202 can also be based on calibration Parameter or calibration equation verify initial value.
Arithmetic element 203 can be configured or that user is more likely to or more for transforming into calibration value or initial value Understandable value or form.Arithmetic element 203, which can run a mapping function, becomes significant value for value mapping , such as the electric signal mapping for indicating luminous intensity, calorific intensity, sound intensity degree is become into the value that user is understood that.Arithmetic element 203 It can connect or communicate with processing unit 201 and/or calibration unit 202.
The description as described in calculating center 104 is the range being not intended to be limiting of the invention for explanation.For this The those skilled in the art in field, many alternatives, modifications, and variations will be apparent.For example, storage unit (is not shown in Fig. 1 It can be added to calculating center 104 out), for storing pretreated information, processed information or calibration value.For another example, locate Reason unit 201 and calibration unit 202 it is implementable can be divided into for individual unit or processing unit 201 it is two or more Isolated unit.
The example process for handling the information received from external sensor is illustrated in Fig. 3.In step 301, Information can be received by, for example, sensor interface.In some embodiments, the information received from analog sensor can be with It is sampled or is quantified, and be converted into digital signal.Sampled value is used as the initial value for calculating calibration value.In addition, one A little control information can be via, for example, communication module 102 receives.And the control information can be configured or for selecting Calibration parameter.
In step 302, based on sample information or control information, one or more calibration equations or calibration parameter can be chosen It selects for calculating calibration value.Calibration equation may include Steinhart-Hart formula, chebyshev approximating polynomial, look-up table (LUT), polynomial equation, exponential polynomials, Fourier's multinomial, Gauss polynomial, interpolation polynomial, power exponent multinomial, Rational polynominal, smoothing spline multinomial, sinusoidal polynomial series, Weibull multinomial, or similar formula and their times Meaning combination.It is for selection that user can also provide various calibration equations.In addition, the selection of calibration equation can be by register Middle setting one or more bits execute.Calibration parameter can be selected based on selected calibration equation and/or control information It selects.
In step 303, calibration value can be based on selected calibration equation and/or calibration parameter.Calibration parameter can by from Line is determined and stored in measuring system 100, such as in the storage unit of measuring system 100.The storage format meeting of calibration parameter Change with the change of calibration equation.Calibration value can based on calibration equation, calibration parameter and from sensor (for example, External sensor or onboard sensor) information (for example, about object or parameter information of ambient enviroment) calculate.
In step 304, calibration value can be output to, for example, user or external device (ED).For example, calibration value can quilt It is directly output to visual displays, one or more users is allowed to check or manipulate calibration value.Calibration value can be stored In measuring system 100, so that calibration value can be read when measuring system 100 is linked to one or more external equipments Out.
It should be noted that flow chart described above is proposed with the purpose of explanation, it is not intended to be limiting of the invention Range.Various modifications may be carried out in guidance of the invention.However, these modifications are without departing from the scope.For example, Calibration equation can be utilized when carrying out high-precision measurement.In some cases, high-precision measurement may be unnecessary 's.In this case, step 302 and 303 can be skipped, and step 304 can be directly executed after step 301, and Calibration value may be identical as initial value.
As shown in figure 4, the memory of measuring system 100 may include user information storage unit 401, processing data storage Unit 402, parameter storage unit 403, program storage unit (PSU) 404, log unit 405 or other analogs and any combination thereof. In addition, control unit 400 can be configured or for controlling access storage unit.
When user information storage unit 401 can be configured or be applied to different fields for storing measuring system 100 The different information needed.For example, user information storage unit 401 can be used for when measuring system is applied in medical field Store measurement object relevant information, such as patient ID information, patient care card id information, information about doctor, Bing Renji Contact details, medical history, the information for hospital of patient assessment, the reservation information of doctor, the authentication information of doctor, medical treatment of doctor Insurance information, biological characteristics, the identification of system for acquiring biological characteristics and manufacture information etc. or their any group It closes.For another example, if measuring system is applied to internet of things field, user information storage unit 401 can be used to storage sensor Some coefficients, station address, user preference, the timestamp etc. for sensing external environment or their any combination.In logistics, User information storage unit 401 can store, for example, address, contact details, the type of delivery, Delivery time or similar Information and their any combination.User information storage unit 401 can be configured or for storing and applied field phase The information of pass.
Processing data storage cell 402 can be used for storing processed information in measuring system 100.The information can wrap Include the information, storage that are received from sensor interface information, the information received from radio frequency interface or other similar informations and Any combination thereof.For example, when measuring system 100 be used for medical field when, processing data storage cell 402 can store body temperature, PPG, electrocardiogram (ECG), blood pressure, body fat and blood oxygen saturation etc..For another example, processing data storage cell 402 can store and ring The relevant information in border, including, for example, temperature, humidity, PM2.5, radiation, air pressure or similar information and or their any group It closes.
Parameter storage unit 403 can be configured or can be used for handling one or more and object or environment for storing Relevant parameter, reception comes from, for example, the parameter of sensor structure or radio frequency interface.Exemplary parameter may include calibration Parameter, such as Steinhart-Hart coefficient, Chebyshev polynomials coefficient, LUT value, polynomial equation coefficient, exponential polynomials It is coefficient, Fourier's multinomial coefficient, Gauss polynomial coefficient, interpolation polynomial coefficient, power exponent multinomial coefficient, reasonable multinomial Formula coefficient, smoothing spline multinomial coefficient, the sum of sinusoidal multinomial coefficient, Weibull, fast Fourier variation (FFT) table, remaining String or sine table, averaging window lengths, finite impulse response (FIR) coefficient and/or degree, offset etc., or any combination thereof. In addition, exemplary parameter may include other parameters, such as with the physiology coefficient that userspersonal information changes.
Program storage unit (PSU) 404 can be configured or for storing formula.The formula illustratively stored may include school Quasi- formula or RF communication protocol etc..Calibration equation can be used to calibrate the following message from sensor interface, such as wrap Include temperature value, physical descriptor, humidity, pulse, pressure, or the like and their combination.RF communication protocol can be configured or For supporting the communication between measuring system 100 and external equipment or external sensor.RF communication protocol may include following logical Believe agreement, such as NFC standard agreement, RFID standard agreement etc. or their any combination.
Log unit 405 can be configured or for storing redundancy, such as trace log.Trace log may include with Track label, number of sensors, monitoring system number, Multimedia Message state, error message, timestamp, transmission time, system version Sheet, reading data frequency, data read time or similar information and any combination thereof.Log unit 405 can also be configured or For being packaged trace log, timestamp and identification information are added, trace log is then stored.In addition, log unit 405 can wrap Include multiple structures is used as cyclic buffer to cache trace log.The data structure of log unit 405 may include first entering elder generation (FIFO) structure, priority query, custom queuing, Weighted Fair Queuing, class-based queue, real-time transport protocol or class out Like structure and their any combination.Log unit 405 can be provided to developer or other types of user.Based on program Output or Debugging message, developer can find and find mistake.User can also check some additional information, such as time Stamp, error message, system version or similar information and their any combination.
Control unit 400 can be configured or the access for controlling the different types of information of storage on a memory, Or selection is stored in the formula of program storage unit (PSU) 404.Different users can have different permissions access memory into The read/write of row information.For example, processing data storage cell 402 can be set to the Permission Levels of highest (for example, minimum), and And being closer or can be accessed when correct password is provided when measuring system 100 and external equipment.User information Second (for example, next to the lowest) Permission Levels can be set in storage unit 401.The user that access authority is awarded can be with read/write It is stored in the information of user information storage unit 401.Parameter storage unit 403 and program storage unit (PSU) 404 can be set as Three (for example, most stringent of) Permission Levels.Only developer or accessible (such as changing, the read or write information) parameter of administrator are deposited Storage unit 403 and program storage unit (PSU) 404.However, developer or administrator cannot access user information storage unit 401 or place Manage data storage cell 420.Control unit 400 can be used for selecting or retrieving communication protocol or calibration equation.Communication protocol can be with It is selected based on the following factors: the communication between the type of external equipment, measuring system 100 and external sensor or external equipment Message format.Calibration equation can select based on the following factors: user's operation, the information received from sensor interface, life The type of relationship, sensor between object characteristic and chip number, or the like and their any combination.
Fig. 5 A shows a format sample of the calibration parameter corresponding to Steinhart-Hart formula.
Steinhart-hart formula shown in formula 1 can be used for calculating calibration.
T-1=A+BlnR+C (lnR)3Formula 1
In formula, A, B and C are the coefficients of Steinhart-hart formula, and R indicates the resistance of measurement.Steinhart-hart Storage format such as Fig. 5 A of the coefficient of formula in parameter storage unit 403.The format of the storage can be divided into first part 501 and second part 502.Wherein first part may include lower limit α, upper limit β and segmentation parameter γ.Lower limit α and upper limit value β can With definition from, for example, sensor received information measurement range.Segmentation parameter γ measurement range can be evenly dividing for γ sections, each section of measurement range is (β-α)/γ.Second part may include γ segmentation.First segmentation can be configured to deposit Storage corresponds to initial coefficients A, B and C of the first segmentation.Remaining segmentation can be configured or for storing based on the first segmentation system Several difference values.When the difference value that one is segmented is timing, then the coefficient of the segmentation is initial coefficients plus difference value.On the contrary, When the difference value of segmentation is negative, the coefficient of this section is that initial coefficients subtract difference value.
The example format of calibration parameter when Fig. 5 B is shown using chebyshev approximating polynomial.Chebyshev is multinomial Formula can be used for calculating calibration value, according to formula 2.
Formula 2
In formula, αiIt is coefficient to be solved, the order n of Chebyshev polynomials can be up to 12 ranks.
As shown in Figure 5 B, the format may include two parts.The first part of format may include lower limit α and upper limit value β.The second part of format includes polynomial order and multinomial coefficient.
Fig. 5 C shows the example format of the parameter used in LUT method.It is calibrated when using LUT method When, lower and upper limit can be set.Format may include upper limit value, lower limit value, segmentation parameter, corresponding to upper and lower bound it Between be segmented the resistance value of each regional cycle that parameter is divided.In addition to above description, when format does not include resistance value, Calibration can also be executed based on the resistance value using interpositioning (for example, method of linear interpolation or cubic spline).
In addition to the format for storing calibration parameter described in present specification, format disclosed in present specification Other storage units or other structures (for example, part of different queue or storage information) can also be stored in.
Fig. 6 shows the structure chart using register as control unit 400 according to some embodiments of the present invention.It should Register can be used to control measurement chip/system memory.As shown, register 601 is an eight bit register, Wherein C0 is least significant bit.C0 and C1 can be configured or for selecting calibration mode.Calibration mode may include Steinhart-Hart formula, chebyshev approximating polynomial, look-up table (LUT), polynomial equation, exponential polynomials, Fu Li Leaf multinomial, Gauss polynomial, interpolation polynomial, power exponent multinomial, rational polynominal, smoothing spline multinomial, sine are more Series, the Weibull multinomial of item formula, or similar formula and their any combination.Or their any combination.Each calibration The corresponding specific value of mode can configure.For example, can be shown that LUT is selected if C1 and C0 are arranged to " 00 " In or Steinhart-hart formula is selected or Chebyshev's equation is selected.Alternatively, " 01 ", " 10 " or " 11 " can by with To indicate that LUT mode is selected.REF can be configured or for controlling whether starting ADC offset.TYPE can be matched It sets or is arranged for control interface, for example, being using analog temperature sensor or digital temperature sensor.AVG can be by It is configured to control whether using averaging filter.Remaining 3 can retain for further configuration.For example, remaining 3 It can be used to store the offset voltage when ADC imbalance is opens, store the window phase of a sampling period or average filter Deng.Alternatively, offset voltage, sampling period and window phase is respectively configured using three different registers.
It should be understood that the configuration of register shown in Fig. 6 is exemplary, and can change.It is describe above The function of register will not be limited by the quantity of the position of register and position.Register can be located at calculating center 104 or Memory 103.
Fig. 7 illustrates measuring system 100 exemplary diagram according to an embodiment of the present invention using oscillating circuit thermometric.Measurement system System 100 can be configured as or integrate one or more oscillating circuits 701.Oscillating circuit 701 may be mended with one or more Repay circuit and one or more sensors coupling.Oscillating circuit 701 may be a certain circuit in diagram 8,9,10,11,12 Form.Sensor 703 should include at least a kind of temperature-sensitive device, and the resistance value of this temperature-sensitive device can become with the variation of temperature Change, temperature-sensitive device includes such as the temperature-sensitive device (PTC) of positive temperature coefficient or the temperature-sensitive device (NTC) of negative temperature coefficient.Compensation electricity Road 703 may include a kind of circuit composition of parallel connection, such as the resistance or at least one fixation capacitance of fixed resistance value Capacitor.
In addition, oscillating circuit 701 itself can also compensate.The combination of oscillating circuit 701 and compensation circuit 703 can be with Better compensation effect is provided.
The oscillating circuit embodiment of the present invention that Fig. 8 is shown.As shown in figure 8, oscillating circuit includes a temperature-sensitive electricity Resistance 801, capacitor 802, two reversers 803A and 803B.The effect of oscillating circuit is that temperature signal is converted into frequency signal, Convenient for measuring circuit measurement.
Relationship shown in Fig. 8 example between temperature and frequency can be expressed with formula 3:
Formula 3
F indicates that the rate-adaptive pacemaker of oscillating circuit, R are the resistance value of thermistor 801 at a certain temperature in formula, and C is one The capacitor 802 of fixed capacitance.
As long as measuring system 100 has measured the output frequency of oscillating circuit, then the resistance value of thermistor 801 can lead to Formula 3 is crossed to calculate.
Fig. 9 is another way of realization of the oscillating circuit of heretofore described embodiment.Described in comparison diagram 8 Oscillating circuit, oscillating circuit described in Fig. 9 increase a resistance, and the output frequency of such circuit can be more stable.
Figure 10 is the way of realization of another oscillating circuit of heretofore described embodiment.Vibration described in Figure 10 Two parts can be divided by swinging circuit, and a portion may be integrated into measuring system 100, and another part passes through certain Form and the circuit connection of first part are got up.The outside of measuring circuit 110 includes a reference resistance 1001, a capacitor 1002, a thermistor 1003 and/or a compensation resistance 1004.Reference resistance 1001 is known quantity.Measuring system is first Measurement is then measured by reference resistance 1001, capacitor 1002, and/or the frequency of oscillation F1 that compensation resistance 1004 generates by heat Quick resistance 1003, capacitor 1002, and/or the frequency of oscillation F2 that compensation resistance 1004 generates, then the electricity of thermistor 1003 Resistance can be calculated by expression formula 4.
Formula 4
In formula 4, RoIndicate the resistance value of thermistor, RfIndicate the resistance value of reference resistance.
The resistance value of thermistor can then be obtained according to expression formula 5:
Formula 5
After the resistance value of thermistor is determined, measuring system 100 can be found out currently according to the relationship between temperature and resistance value The temperature value of measurement.
Figure 11 illustrates the circuit diagram of the ring oscillator of embodiment according to the present invention.Figure 12 is illustrated according to the present invention Embodiment Schmidt trigger oscillator circuit diagram.Circuit described in Figure 11 and Figure 12 may include one or more Thermistor, one or more reversers, the resistance of one or more fixed resistance values, one or more capacitors.The circuit quilt It is configured as output to the frequency with thermistor resistance value in certain relationship.
It should be pointed out that foregoing description is description-based purpose and is suggested, it is not intended to be limiting of the invention Range.For those of ordinary skill in the art, the variation of multiplicity can be implemented after being reasonably understood that the contents of the present invention And modification.However, these change and modification are without departing from the spirit and scope of the present invention.For example, reference resistance 1001 may quilt It is integrated into measuring system shown in Fig. 10 and oscillating circuit can also be wien bridge oscillator, be made of 555 timers Oscillating circuit, positive feedback oscillating circuit.In addition, for more accurate measurement, oscillating circuit can also be exported with duty Than the signal of information.Such as.These substitutions, change and modification are without departing from the scope of the invention.
Figure 13, which is illustrated, according to an embodiment of the present invention calculates thermistor resistance value using resistance capacitance charge and discharge form Circuit.As shown, circuit includes a microcontroller (MCU) 1301, a thermistor 1302, a reference resistance 1303, a capacitor 1304.The resistance Rs of thermistor 1303 changes according to the variation of temperature.Reference resistance 1303 is fixed Resistance value is R0Resistance, capacitor 1304 be fixed capacitance be C0Capacitor.The inside of microcontroller 1301 may include a ratio Compared with device 1305, one end of comparator is extracted by external pin AN0, one reference voltage V of another terminationref, reference voltage Vref It can be provided by external voltage or internal reference source.Microcontroller 1301 passes through pin GP1, GP2 and AN0 and thermistor 1302, the capacitance-resistance charge-discharge circuit connection that reference resistance 1303, capacitor 1304 form.
The circuit of foregoing description is configured as solving the resistance value of thermistor 1302 at a certain temperature.Method for solving is logical Cross the difference for comparing the time value by thermistor 1302 or reference resistance 1303 to capacitor charging or when discharging into certain voltage To solve the resistance value of thermistor.The charging of capacitor 1304 or capacitor 1304 have been filled when applying voltages on RC combinational circuit Expire when starting electric discharge, rising or falling for exponential form can be presented in the voltage at capacitor both ends, by matching with comparator 1305 It closes, c.The resistance value of thermistor 1302 can be by comparing the time meter of the charge and discharge of thermistor 1302 and reference resistance 1303 It calculates.
Only example way, when calculating ramping time to the charging of capacitor 1304, GP1 is configured as output mould Formula, and be logic high, GP2 is configured as the simulation input of high-impedance state.Port AN0 is configured as input to mode, in micro-control It is one end of analog comparator inside device 1301 processed, is connect with external capacitive.The time of capacitor charging to reference voltage can To measure (not shown) by hardware or software timer.When the measurement is completed, GP1 foot may be configured as patrolling Low level is collected to discharge to capacitor.And then, it can reverse the configuration of GP1 and GP2 to measure reference resistance 1303 ramping time.Measurement ramping time may also used to the discharge process of capacitor 1304.
Figure 14 and Figure 15 illustrates the capacitor charging voltage of embodiment according to the present invention and the relationship of time.Thermistor 1302 resistance value RsIt can be found out and by equation 6,7,8.
Formula 6
And formula 7
Formula 8
Wherein, VDDIt is added to the voltage of RC combinational circuit, VCIt is the voltage at capacitor both ends, resistance RrefIt is reference resistance Resistance value.
When capacitor 1304 is charged to a specific voltage VohWhen, and when being discharged, calculate the resistance value of thermistor Rs can be acquired by expression formula 9,10,11.
Formula 9
And formula 10
Formula 11
Wherein VrefIt is added to the reference voltage of comparator 1305, RrefIt is the resistance value of reference resistance.
It should be pointed out that foregoing description is description-based purpose and is suggested, it is not intended to be limiting of the invention Range.For those of ordinary skill in the art, the variation of multiplicity can be implemented after being reasonably understood that the contents of the present invention And modification.However, these change and modification are without departing from the spirit and scope of the present invention.Therefore, the present invention is not limited in this institute The content of description.For example, microcontroller 1301 may be comprising comparator 1305, it is therefore desirable to which an external comparator is matched It closes I/O interrupt and timer completes measurement process.It for another example says, an additional I/O port may direct or one electricity of concatenation The influence on capacitor 1304 for electric current heat production when eliminating charge and discharge is connected to after resistance.

Claims (10)

1. a kind of Integrated Measurement System characterized by comprising
Sensor, for detecting target information;
Memory, wherein storing calibration equation and calibration parameter;
Communication module, for receiving information from sensor or from the information of external equipment;
Calculating center selects school from the memory based on the information from sensor or the information from external equipment Quasi- formula selects calibration parameter based on the calibration equation and the information from sensor, and utilizes the calibration equation The information from sensor is calibrated with calibration parameter,
Wherein the calibration parameter of the memory storage includes:
First part, including
The lower and upper limit of the measurement range of the received information of sensor;And
The measurement range is uniformly divided into two or more segmentations by segmentation parameter, the segmentation parameter;
Second part, including the described two or above segmentation, wherein the first fragmented storage initial coefficients, remaining fragmented storage are based on The difference value of the initial coefficients.
2. Integrated Measurement System according to claim 1, which is characterized in that further include energy acquisition module, for from Energy is collected in ambient enviroment, the system is driven using the energy of the energy acquisition module collection.
3. Integrated Measurement System according to claim 2, which is characterized in that the energy of the energy acquisition module collection Including thermal energy, solar energy, vibrational energy, frequency modulation energy, bioenergy or electromagnetic energy.
4. Integrated Measurement System according to claim 1, which is characterized in that the communication module includes that a radio frequency connects Mouth or a sensor interface.
5. Integrated Measurement System according to claim 1, which is characterized in that the communication module is based on near-field communication NFC protocol or a radio frequency identify RFID protocol.
6. Integrated Measurement System according to claim 1, it is characterised in that the external equipment includes Wien bridge vibration Device is swung, the oscillating circuit being made of 555 timers, positive feedback oscillating circuit compensates oscillating circuit, ring oscillator, Schmidt One or more of trigger oscillator.
7. Integrated Measurement System according to claim 1, which is characterized in that further include control unit, be configured as base The calibration equation is selected from the memory in the information from sensor or the information from external equipment.
8. Integrated Measurement System according to claim 7, which is characterized in that described control unit is configured to Control the access of the data to storage in the memory.
9. Integrated Measurement System according to claim 7, which is characterized in that described control unit is configured as to difference Terminal user set different access authority.
10. Integrated Measurement System according to claim 1, which is characterized in that the school stored in the memory Quasi- formula includes that Steinhart-Hart formula, chebyshev approximating polynomial, look-up table (LUT), polynomial equation, index are more Item formula, Fourier's multinomial, Gauss polynomial, interpolation polynomial, power exponent multinomial, rational polynominal, smoothing spline are multinomial Formula, sinusoidal polynomial series, Weibull multinomial or their any combination.
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